
10 CAMELIACOL 4M Color Digital Camera 5302C–IMAGE–03/04
Specification in darkness
Note: Adjacent columns in darkness are tolerated.
Specification Under
Illumination The test is carried out under illumination so that the most sensitive channel is at 80% of
the saturation level.
Blemishes are tested under white light and column defects are tested under green light
(P20).
Notes: 1. A maximum of 100 blemishes with an area between 1 x 1 and 2 x 2 is accepted but
the total number of pixels affected by blemishes is below 140.
2. Inside an area of 3 x 3 pixels, there is a maximum of 5 defective pixels.
3. There are no specifications on column linearity. Two defective columns must be sepa-
rated by a minimum number of two good pixels.
Table 6. Specifications in Darkness
Type Defects
Blemish threshold 90 ADU > α> 45 ADU α> 90 ADU
Maximum number of pixels
affected by blemishes
Area maximum (in pixels)
150
3 x 3
20 (among the 150)
1 x 1
Column threshold 45 ADU > α> 12 ADU α> 45 ADU
Maximum number of column
defects 10 0
Table 7. Specifications under Illumination
Type (White or Black Defects at 80% x VSAT
Blemish threshold [α] > 50%
Maximum number of pixels affected by
blemishes 140
Maximum number of blemishes
Area maximum (in pixels) 100(1)
2 x 2 4
3 x 3(2) or 2(X) x 4(Y)
Column threshold 1 [α] > 50%
Maximum number of column defects
(columns greater than threshold 1) 25(3)
Column threshold 2 [α] > 4%
Maximum number of column defects
(columns greater than threshold 2) 50 (including the 25)