OTRONA ATTACHE User manual
OTRONA
ATTACHE
Portable Computer
Service Guide
Published by Otrona Advanced Systems Corporation
Copyright
1983
by
Otrona Advanced Systems Corporation
Pub. No. 92-051206 Version
1.0
March
1983
Copyright
Copyright ©
1983
by
Otrona
Advanced Systems
Corpora-
tion. All rights reserved. No
part
of
this publication may
be reproduced, transmitted, transcribed, stored in a retriev-
al system,
or
translated into any language
or
computer
language, in any form or by any means, electronic, me-
chanical, magnetic, optical, chemical, manual,
or
other-
wise, without the
prior
written permission
of
Otrona
Advanced Systems Corporation, 4755 Walnut St., Boulder,
Colorado, 80301.
Disclaimer
Otrona
Advanced Systems Corporation makes no repre-
sentations
or
warranties with respect to the contents hereof
and
especially disclaims any implied warranties
of
mer-
chantabilities
or
fitness for any particular purpose.
Further,
Otrona
Advanced Systems Corporation reserves
the right to revise this publication and to make changes
from time to time in the content without obligation
of
Otrona
Advanced Systems
Corporation
to notify any per-
son of such revisions
or
changes.
Trademarks
A
TT
ACHE
is
a trademark
of
Otrona
Advanced Systems
Corporation, 4755 Walnut St., Boulder, Colorado,
80301.
TABLE OF CONTENTS
Introduction
.................................
1
Using This Guide
.............................
2
1.
Service Overview
.............................
3
General Maintenance Procedures
...............
4
Environmental Considerations
.................
4
2.
Diagnostic Programs . . . . . . . . . . . . . . . . . . . . . . .
..
5
Running the Diagnostic Programs
..............
6
Individual Tests
..............................
7
G Display Pattern Test
..................
7
H - Display RAM Test
...................
7
I - Input Test
.......•...................
8
J - Jump to Address Test
.................
9
K - Keyboard Test
.......................
9
L - Continuous Loop Tests
..............
10
M - Map Test
..........................
10
o - Output Test
........................
II
P - Format Test
...................•....
II
Q - CMOS RAM Test
...................
12
R Main RAM Test
....................
13
S Select Output Tests
..................
13
T Real-Time Clock Test
................
14
U United Tests
........................
15
V Read Disk Sector Test
...............
15
W - Write Disk Sector Test
...............
17
X -
I/O
Port Transmit Test
..............
18
Y -
I/O
Port Receive Test
................
19
Z - Automatic Disk Test
.................
20
Status Register
ID
Tables
....................
22
TABLE
OF
CONTENTS
3.
Module Removal and Installation . . . . . . . . . . .
..
25
Cabinet
....................................
26
Processor Board
..
. . . . . . . . . . . . . . . . . . . . . . . .
..
28
Power Supply
...............................
30
CRT
Display
...............................
32
Keyboard
..................................
34
Disk Drives
................................
36
Clock Battery 40
4.
Service Maps
...............................
41
How to
Use
the Service Maps
.................
42
Individual Maps
...
. . . . . . . . . . . . . . . . . . . . . . .
..
43
Preliminary Problem Analysis
...............
43
Power Up Not Normal
.....................
45
Diagnostic Test Failure
....................
49
Unit Does Not Boot
.......................
54
CRT
Display Not Functioning
..............
56
Keyboard Not Functioning
.................
59
Sound Not Functioning
....................
61
Clock Not Functioning
.....................
63
Disk Drives Not Functioning
...............
65
Problem Resolution
.......................
69
Index
......................................
70
Introduction
This service guide
is
intended for use by Attache owners
and by service personnel in the
Otrona
dealer network.
Complete instructions for servicing Attache are included
here.
For
qualified dealer service personnel:
This guide can
be
used to run diagnostics, assemble and
disassemble the unit, swap modules, and troubleshoot each
component through the entire system until the problem
is
resolved.
For
the Attache user:
This guide can be used to
run
diagnostics and perform
preliminary troubleshooting procedures.
We
say "prelimi-
nary" troubleshooting procedures because problem analy-
sis may require swapping modules from a different unit to
isolate the problem, and most users will typically not have
ready access to spare modules for testing purposes.
When using the service maps,
do
not attempt to perform
steps
that
are shaded on the maps. These steps are for
qualified dealer service personnel only.
If
you are in doubt or have any questions
about
servicing
the unit, contact your dealer FIRST.
Using This Guide
This service guide
is
divided into four major sections:
I. Service Overview - A component-level introduction
to
the Attache modules, general maintenance and
cleaning procedures, and environmental considerations
for effective operation
of
the machine are found in Sec-
tion
I.
Read this introduction before you attempt to
service the unit.
2.
Diagnostic Test Programs -Each
of
the test programs
that
are used for Attache performance verification are
found in Section
2.
Use this section to
run
diagnostic
tests.
3.
Module Removal and Installation -Procedures for
removing and installing each Attache module are found
in Section
3.
Use this section to swap modules.
4.
Troubleshooting and Service Maps -Problem analy-
sis maps are provided in Section 4 to help step you
through the problem determination process. Use this
section
to
isolate and correct problems.
2
Disk
Drives
Power
Supply
Board
Processor
Keyboard
CRT
Display
Attache
Modules
Service Overview Section 1
Attache
is
designed for durability and reliable perfor-
mance.
It
is
also designed for easy service if a problem
occurs.
Attache hardware consists
of
five components housed in a
high impact metal cabinet. These components
or
modules
include the processor board, display screen, disk drives,
keyboard, and power supply.
Attache's diagnostic programs are contained in ROM.
Tests can be performed even if one
or
both disk drives are
not functioning.
These diagnostic programs help you determine which
module
is
not functioning properly. After identifying the
faulty module, you simply remove
that
module
and
install
a replacement part.
3
General Maintenance Procedures
Clean the unit with a mild non-abrasive household cleans-
ing product.
Be
gentle-do
not scrub. Do not spray the
cleansing agent into the drive area
or
keyboard.
Use a
cotton
swab to clean
around
the drives
and
key-
board. Do not attempt to clean inside
of
the drive
mechanism.
Use a commercial solvent-type disk head cleaning kit to
clean the drive heads. These kits contain a special cleaning
diskette and are available from your dealer.
Do
not attempt to manually clean the drive heads.
Environmental Considerations
Even the best computer designs can malfunction if envi-
ronmental specifications are exceeded. Improper power
cords, fuses, and voltage selection can cause the machine
to malfunction.
Use only those voltage selections, fuse sizes, and power
cords
that
are recommended in the Attache Operator's
Guide.
Temperature extremes can also cause problems. Diskettes,
for example, will only function properly in the tempera-
ture range
50
to
125
degrees F and
10
to
51
degrees
C.
If diskettes are exposed to temperatures outside
of
these
ranges for extended periods, let them acclimate
at
room
temperature for a short time prior to using them.
While Attache
is
not as temperature sensitive as the
diskettes, the unit may not boot following exposure to
extreme temperatures. If this occurs, let the unit acclimate
at
room temperature for a short time prior to booting the
system.
4
Diagnostic Programs Section 2
All diagnostic programs for troubleshooting and perfor-
mance verification are contained in the Attache Resident
Monitor, which
is
built into ROM.
Commands for running diagnostic programs are as
follows:
G
-Display
Pattern Test R
-Main
Memory Test
H
-Display
RAM Test S
-Select
Output
Port
I
-Input
Test T
-Clock
Test
J
-Jump
U - United Tests
K - Keyboard Test V - Read Disk Sector*
L - Loop Tests W- Write Disk Sector*
M-Memory
Map Test X
-I/O
Transmit Test
o
-Output
Test Y
-I/O
Receive Test
P
-Format
Test* Z
-Disk
Drive Test*
Q
-CMOS
Memory Test
*
**
This test requires a diskette. Note that disk tests are
only as reliable as the media being used.
Be
sure
that
the diskette being used in the test
is
function-
ing properly.
WARNING: P,
W,
and Z tests alter diskette con-
tents. Do not use diskettes containing valuable
data
or
programs when running these tests.
The Q test will set default Set-up Mode parameters
on
some processor board versions. After the diag-
nostics have run to completion, you may have to
reset the clock and activate the Set-up Mode to
reset these parameters. Refer to the Q Test in this
section for additional information.
5
Running the Diagnostic Programs
1.
Power up the unit.
2.
Insert diskettes in both drives.
Use
only blank diskettes
or diskettes that do not contain important information
that you wish to keep. The P,
W,
Z, and lZ tests will
destroy the contents ofthe diskettes.
3.
Open the Drive A door so
that
the system will not boot
the diskette.
4.
Press the RESET key
at
the same time as the
SHIFT
key on the right side ofthe keyboard.
5.
The system will attempt to boot the diskette, sense that
the drive door
is
open, and revert to terminal mode (No
System on Disk -Now in Terminal Mode
is
displayed).
6.
Close the Drive A door so that the drive tests will exe-
cute properly.
7.
Press CTRLand LINE
FEED
simultaneously. @ on the
screen indicates that monitor mode
is
active.
8.
With monitor mode activated, type the letter for the
individual test that you wish
to
run,
or
type U and press
RETURN to run the United Tests.
The United Tests automatically execute the diagnostics
that test the unit's main functions. These tests are as
follows: H (Display RAM), Q (CMOS RAM), T
(clock), M (memory map), R (main RAM), Z (drive-
A), and
lZ
(drive
B).
These tests run in approximately
20
minutes.
9.
Refer to the individual tests in this section
of
the ser-
vice guide for run times and errors that may be
reported.
Note that the Q test will set default Set-up Mode
parameters on some processor board versions. After
the diagnostics have run
to
completion, you may have
to reset the clock and activllte the Set-up Mode
to
reset
these parameters. Refer to the QTest in this section for
additional information.
6
Individual Tests
Any two
or
more diagnostic tests
can
be
run
sequentially
as United tests by specifying the tests when the U Test
is
activated. You may also
run
the tests in a continuous loop
by activating the L Test as the first letter in
the
command.
Refer
to
the L Test and U Test discussions in this section
of
the Service Guide.
G - Display Pattern Test
Format:
G (no parameters)
Function: Tests the display by filling the screen with the
character
"+"
in each position except the
cursor position (lower right corner).
Run
Time: Less
than
3 seconds.
Exit: Press any key.
Reports: None.
Failures: Suspect
(l)
loose cables,
(2)
CRT
display
module,
(3)
processor board module.
H - Display
RAM
Test
Format:
H (no parameters)
Function: Tests all
data
bits in all locations
of
the
alphanumeric, graphic,
and
attribute display
memories.
Run
Time: Less than 3 seconds.
Exit: Automatic
at
end
of
test.
7
Reports: Errors are reported in the format "lIccddff',
where:
'11
= the line containing the
error
cc
= the character position
of
the
error
dd = the bit position(s) in
error
(in binary ones)
ff
= the frame in which the
error
is
found.
Frame
00-80 = graphics
RAM
CO=
alphanumeric
RAM
EO = attribute
RAM
Note: The frame code corresponds directly
to
the display memory IC's
on
the processor
board as follows:
00-U704
20-U705 40-U706
60-U707 80-U708 EO-U432
CO-U433
Failures: Suspect
(I)
loose cables,
(2)
processor board
module.
I -Input Test
Format:
ppI
Function: Reads one byte
of
data
from the
port
specified
in "pp". This test can be used in conjunction
with the ouput command
to
read status
or
data
from a port.
Run Time: Less
than
3 seconds.
Exit: Automatic after byte is read.
Reports: One byte
of
data
is
displayed.
Failures: Suspect (I)
operator
error, (2) loose cables, (3)
processor board module.
8
J - Jump
Format:
addrJ
Function: Jumps to the specified address and begins
program execution. Control returns to Moni-
tor
Mode if a
RETURN
is
encountered and
the stack has not been altered and the
EPROM
is
still enabled.
If
no address
is
specified
and
a system diskette
is
inserted in drive A, a system boot occurs.
Otherwise the system enters Terminal Mode.
Run Time: Less than 3 seconds.
Exit: None.
Reports: None.
Failures: Suspect
(I)
operator error,
(2)
loose cables,
(3)
processor board module.
K - Keyboard Test
Format:
K (no parameters)
Function: Displays each key
that
is
pressed, followed by
its hexadecimal value. Note
that
both upper
and lower case codes may be returned.
Run Time Less
than
3 seconds.
Exit: Type the character
~
to exit.
Reports: None.
Failures: Suspect
(I)
loose cables,
(2)
keyboard module,
(3)
processor board module.
9
L -Loop Tests
Format:
L (test)
Function: Runs the test entered after "L" continuously.
Run Time: Runs the test continuously until you exit.
Exit: Press any key.
Reports: The test being "looped" reports as normal.
Failures: Refer to the failed test.
M -Memory Map Test
Format:
Maps the memory in the reverse
of
standard
order, with the numbers
7-1
written in the first
location
of
virtual blocks
1-7
respectively.
Memory
is
then remapped to the standard
configuration and the numbers are read back.
Read-back values should then be
1-7
for the
corresponding blocks.
Run Time: Less
than
3 seconds.
Exit: Automatic
at
end
of
test.
Reports: Any virtual block
that
returns an erroneous
number
is
reported in the format vn, where "v"
is
the virtual block number and "n"
is
the
number returned.
Failures: Suspect
(I)
loose cables,
(2)
processor board
module,
(3)
power supply module.
10
o -Output Test
Format: ppddO
("0"
not "0")
Function: Outputs one
data
byte
to
a port, where "pp"
is
the port and "dd"
is
the
data
to send. Can be
used in conjunction with the input command
to send data to a port and then read status
or
data from the port.
For
example: F2440 sends ASCII character
"D"
to the printer port.
Run Time: Less than 3 seconds.
Exit: Automatic after byte
is
sent.
Reports: None.
Failures: Suspect
(I)
operator error, (2) loose cables, (3)
processor board module.
P -Format Diskette Test
Format:
Pen)
where "n"
is
the drive number (P =
A,
IP
=B).
Warning: This test will alter diskette contents. Do not
use diskettes containing valuable
data
or pro-
grams when running this test.
Function: Formats the diskette in the specified drive.
Run Time: Less than
35
seconds.
Exit: Immediately by pressing any key, or auto-
matically when formatting
is
complete.
Reports: None.
II
Note: The format produced
is
not the same op-
timized format that FORMAT.
COM pro-
duces with
CP/M.
Use
this routine for test
purposes only.
Failures: Suspect
(1)
write-protect tab,
(2)
bad diskette,
(3)
dirty drive heads,
(4)
disk drive module,
(5)
processor board module,
(6)
power supply
module.
Q- CMOS
RAM
Test
Format: Q(no parameters)
Function: Tests all CMOS RAM locations with a test of
each data bit.
Run Time: Less than 3 seconds.
Exit: Automatic at end oftest.
Reports: Any bad location
is
reported in the format
"aadd", where "aa"
is
the address (0-3F) and
"dd"
is
the failed bits (0-F).
Note: This test may reset CMOS RAM
to
its default
values, depending upon the
EPROM
version
ofthe system.
If
the Terminal Mode header
is
"Otrona Attache," the Set-up Mode parame-
ters will reset to their default settings.
If
the
header
is
"Otrona Attache x" (where "x"
is
any
letter), the parameters will remain
at
their cur-
rent settings.
Failures: Suspect
(1)
loose cables,
(2)
clock batteries,
(3)
processor board module,
(4)
power supply
module.
12
R - Main
RAM
Test
Format: nR, where "n"
is
the RAM row number (0-3).
Function: Main RAM consists
offour
rows (0-3) of
16K
RAM chips. R Test maps the block under to
virtual memory area 8000-BFFF hex
and
checks all locations with every data bit.
Run
Time: Less than 3 minutes.
Exit: Automatic at end oftest.
Reports: The first nine errors found are reported as
aaaa-dd, where
"aaaa"
is
the relative address
of the bad location (from the beginning
of
the
row) and "dd" indicates the
data
bits in error.
Failures: Suspect (I) loose cable connections, (2) pro-
cessor board module, (3) power supply mod-
ule.
S - Select Output Ports
Format: bbpcS
IIII
Comm",,,,,tio", Port
Pnnter
Port
Comm Port Baud-Rate
Printer
Port
Baud Rate
0=
deselect
Baud Rate Table:
o= not changed
1=
110
Baud
2 =
150
Baud
3 =
300
Baud
4 =
600
Baud
13
I = select
5 =
1200
Baud
6 = 2400 Baud
7 = 4800 Baud
8 =
9600
Baud
9 =
19200
Baud
Function: Selects the printer and communications ports
to print test commands and results. Selections
made here will also apply to input and output
via the X and Y (transmit and receive) com-
mands.
If
terminal mode
is
then entered from monitor
mode, the selections will remain in force.
If
neither port
is
selected, default is to the
communications port. If both ports are se-
lected, input
is
accepted from either and out-
put
is
sent to both.
Run
Time: Less than 3 seconds.
Exit: Automatic after setting ports.
Reports: None.
Failures: Suspect
(I)
operatorerror,
(2)
loose cables,
(3)
processor board module.
T - Real-Time Clock Test
Format: T (no parameters)
Function: Tests the real-time clock for basic function
without disturbing the current clock setting.
Run
Time: Less than 3 seconds.
Exit: Automatic at end
of
test.
Reports: A question mark
is
displayed ifthe clock fails.
Failures: Suspect
(l)
clock not set,
(2)
clock batteries,
(3)
processor board module,
(4)
power. supply
module.
14
U - United Tests
Format: V (test [s])
RETVRN
Function: Runs specified tests in sequence.
For
example,
VHQT
runs the Display RAM,
CMOS RAM, and Real-Time Clock Tests in
sequence.
If no test
is
specified, H, Q, M, T, R, IR, 2R,
3R, Z, and IZ are run sequentially.
Note that the V command may be preceded by
the L command to cause a continuous loop
of
tests (LV
...
).
Run
Time: Refer to individual tests.
Exit: Automatic
at
end
of
tests,
or
immediately by
pressing any key.
Reports: Each test reports as normal.
Failures: Refer to failed test.
v - Read a Sector from a Disk
Format:
cchsV
sector number
surface
o=drive
0,
head 0
I = drive I, head 0
4 = drive
0,
head I
5 = drive I, head 1
1..1-
___
cylinder number
(0-27
hex)
15
Other manuals for ATTACHE
1
Table of contents
