Agilent Technologies EasyEXPERT User manual

Agilent Technologies
Agilent EasyEXPERT
Application Library Reference

Notices
© Agilent Technologies, Inc. 2006 - 2013
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Manual Part Number
B1500-90050
Edition
Edition 1, August 2006
Edition 2, June 2007
Edition 3, November 2007
Edition 4, October 2008
Edition 5, June 2009
Edition 6, November 2009
Edition 7, September 2012
Edition 8, June 2013
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In This Document
Agilent EasyEXPERT software contains the application library which supports the
characteristic measurements of CMOS devices, TFT, BJT, diode, resistor, capacitor,
varactor, memory, nanotechnology devices such as CNT FET, and so on. The application
library includes more than one hundred test definitions. And they are classified into the
following categories.
•BJT
•CMOS
•Discrete
• GenericTest
•MCSMU_IV
•Memory
• MixedSignal
• NanoTech
•Organic
• PwrDevice
• Reliability
•Sample
•SolarCell
• SPGU_PLSDIV
• Structure
•TFT
• Utility
•WGFMU
• WGFMU Utility
•WGFMU_IV
•GaNDiode
•GaNFET
•IGBT
• Interconnection
•MISCAP
•PowerBJT
• PowerDiode
• PowerMOSFET
•PMIC
•SiC

What is described in the reference sections
Reference section contains detailed description of test definitions. The test definitions are
listed in alphabetical order. Each entry explains one test definition and provides the
information following to the next terms. Some sections may not follow to some terms and
may follow to the terms not in this table.
Term Description
Description Brief explanation of the test definition.
Device Under Test DUT name. The number of terminals, the connection
information, and the other information may be included.
Required Modules and
Accessories Lists the required accessories, modules, and/or equipment. The connection information may be included.
Required Test Definition Lists the test definitions if they are used in this test
definition.
Device Parameters Lists the parameters changeable in the Device Parameters
area of the EasyEXPERT Application Test screen.
Test Parameters Lists the parameters changeable in the Test Parameters
area of the EasyEXPERT Application Test screen.
Extended Test Parameters Lists the parameters changeable in the dialog box opened
by clicking the Extended Setup button.
Measurement Parameters Lists the parameters measured by this test definition.
User Function and
Analysis Function Lists the parameters used for the user function or the analysis function.
X-Y Plot or X-Y Graph Lists the parameters to be displayed in the X-Y Graph Plot
area, List Display area, or Parameters area on the Data
Display window.
List Display
Parameters Display Area
Auto Analysis Lists the parameters used for the auto analysis function.
Test Output: X-Y Graph Lists the parameters defined in the Test Output tab screen
of the Test Definition window. The parameters will be
displayed in the X-Y Graph Plot area, List Display area, or
Parameters area on the Data Display window.
Test Output: List Display
Test Output: Parameters

Revision number
The test definitions are managed by using the revision number shown below.
NOTE Application Library
The application library is a set of test definitions effective for the EasyEXPERT application
test execution mode. The application test can be performed by selecting a test definition
and setting the test condition for the actual DUT (device under test). And the setup can be
saved as the dedicated test setup for the DUT.
All test definitions are just sample. If the samples damage your devices, Agilent
Technologies is NOT LIABLE for the damage.
NOTE If you delete a test definition
Application library should be recovered. Import the test definition by using the Import Test
Definition... function of the Library button. The original test definitions are stored in the
following folders.
<program folder>\Agilent\B1500\EasyEXPERT\Application Tests
<program folder>\Agilent\B1500\EasyEXPERT\Contribution\Application Tests
Revision Number Description
A.01.xx Test definitions supported by EasyEXPERT A.01.xx and later.
A.01.20 Test definitions updated from A.01.xx or supported by
EasyEXPERT A.02.00 and later.
A.02.00 This number is used by the Subsite move test definition only.
A.03.00 Test definitions supported by EasyEXPERT A.03.00 and later.
A.03.10 Test definitions supported by EasyEXPERT A.03.10 and later.
A.03.11 Test definitions supported by EasyEXPERT A.03.11 and later.
A.03.20 Test definitions supported by EasyEXPERT A.03.20 and later.
A.04.00 Test definitions supported by EasyEXPERT A.04.00 and later.
A.05.00 Test definitions supported by EasyEXPERT A.05.00 and later.
A.05.01 Test definitions supported by EasyEXPERT A.05.01 and later.
A.05.02 Test definitions supported by EasyEXPERT A.05.02 and later.
A.05.03 Test definitions supported by EasyEXPERT A.05.03 and later.
A.05.50 Test definitions supported by EasyEXPERT A.05.50 and later.

Supported Analyzer and Required Equipment
Each test definition (Library) supports the following analyzer, and requires the following
accessories, modules, and/or equipment.
Category Test definition name Supported analyzer Required equipment and quantity
BJT BC Diode Fwd B1500A,4155B/C,4156B/C SMU 2
BC Diode Rev B1500A,4155B/C,4156B/C SMU 2
BVcbo B1500A,4155B/C,4156B/C SMU 2
BVcei B1500A,4155B/C,4156B/C SMU 3
BVceo B1500A,4155B/C,4156B/C SMU 2
BVebo B1500A,4155B/C,4156B/C SMU 2
CS Diode Fwd B1500A,4155B/C,4156B/C SMU 2
CS Diode Rev B1500A,4155B/C,4156B/C SMU 2
Ctc-Freq Log B1500A MFCMU 1
Ctc-Vc B1500A MFCMU 1
Cte-Ve B1500A MFCMU 1
Cts B1500A MFCMU 1
EB Diode Fwd B1500A,4155B/C,4156B/C SMU 2
EB Diode Rev B1500A,4155B/C,4156B/C SMU 2
G-Plot ConstVce Pulse B1500A,4155B/C,4156B/C SMU 4
G-Plot ConstVce Pulse[3] B1500A,4155B/C,4156B/C SMU 3
G-Plot ConstVce B1500A,4155B/C,4156B/C SMU 4
G-Plot ConstVce[3] B1500A,4155B/C,4156B/C SMU 3
G-Plot Vbc=0V Pulse B1500A,4155B/C,4156B/C SMU 4
G-Plot Vbc=0V Pulse[3] B1500A,4155B/C,4156B/C SMU 3
G-Plot Vbc=0V B1500A,4155B/C,4156B/C SMU 4
G-Plot Vbc=0V[3] B1500A,4155B/C,4156B/C SMU 3
hfe-Vbe ConstVce B1500A,4155B/C,4156B/C SMU 4
hfe-Vbe Vbc=0V B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Ib B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Ib[3] B1500A,4155B/C,4156B/C SMU 3
Ic-Vc Pulse Ib B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Pulse Ib[3] B1500A,4155B/C,4156B/C SMU 3
Ic-Vc Pulse Vb B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Pulse Vb[3] B1500A,4155B/C,4156B/C SMU 3

BJT Ic-Vc Vb B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Vb[3] B1500A,4155B/C,4156B/C SMU 3
Rb B1500A,4155B/C,4156B/C SMU 4
Re+Rc B1500A,4155B/C,4156B/C SMU 4
Re B1500A,4155B/C,4156B/C SMU 4
Simple Gummel Plot B1500A,4155B/C,4156B/C SMU 3
Vbe-Le B1500A SMU 4, B2200A/B2201A 1
Vbe-We B1500A SMU 4, B2200A/B2201A 1
CMOS BVdss B1500A,4155B/C,4156B/C SMU 4
BVgso B1500A,4155B/C,4156B/C SMU 3
Cgb-AC Level B1500A MFCMU 1, SMU 1
Cgb-Freq Log B1500A MFCMU 1, SMU 1
Cgb-Vg HighVoltage B1500A MFCMU 1, SMU 3, SCUU 1, GSWU 1
Cgb-Vg B1500A MFCMU 1, SMU 1
Cgc-Freq Log B1500A MFCMU 1, SMU 1
Cgc-Vg B1500A MFCMU 1, SMU 1
Cgg-Freq Linear B1500A MFCMU 1
Cgg-Freq Log B1500A MFCMU 1
Cgg-Vg 2Freq B1500A MFCMU 1
Cgg-Vg B1500A MFCMU 1
IdRdsGds B1500A,4155B/C,4156B/C SMU 4
Id-Vd pulse B1500A,4155B/C,4156B/C SMU 4
Id-Vd pulse[3] B1500A,4155B/C,4156B/C SMU 3
Id-Vd B1500A,4155B/C,4156B/C SMU 4
Id-Vd[3] B1500A,4155B/C,4156B/C SMU 3
Id-Vg pulse B1500A,4155B/C,4156B/C SMU 4
Id-Vg Vpulse[3] B1500A,4155B/C,4156B/C SMU 3
Id-Vg B1500A,4155B/C,4156B/C SMU 4
Id-Vg[3] B1500A,4155B/C,4156B/C SMU 3
IonIoffSlope B1500A,4155B/C,4156B/C SMU 4
Isub-Vg B1500A,4155B/C,4156B/C SMU 4
QSCV[4] B1500A SMU 5
QSCV C Offset Meas B1500A SMU 2
Simple Cgb B1500A MFCMU 1
Simple Vth B1500A,4155B/C,4156B/C SMU 4
Category Test definition name Supported analyzer Required equipment and quantity

CMOS Vth Const Id B1500A,4155B/C,4156B/C SMU 4
Vth gmMax B1500A,4155B/C,4156B/C SMU 4
Vth gmMax and Id B1500A,4155B/C,4156B/C SMU 4
VthAndCgg-Vg ASU B1500A MFCMU 1, SMU 1, ASU+SMU 2
VthAndCgg-Vg SCUU B1500A MFCMU 1, SMU 3, SCUU 1, GSWU 1
Vth-Lg B1500A SMU 4, B2200A/B2201A 1
Vth-Wg B1500A SMU 4, B2200A/B2201A 1
Discrete BJT GummelPlot B1500A,4155B/C,4156B/C SMU 3
BJT Ic-Vc Ib B1500A,4155B/C,4156B/C SMU 3
Diode IV Fwd B1500A,4155B/C,4156B/C SMU 2
Diode IV Rev B1500A,4155B/C,4156B/C SMU 2
FET Id-Vd B1500A,4155B/C,4156B/C SMU 3
FET Id-Vg B1500A,4155B/C,4156B/C SMU 3
GenericTest Generic C-f B1500A,B1505A MFCMU 1
Generic C-t B1500A,B1505A MFCMU 1
MCSMU_IV Id-Vds MCSMU B1500A [[MCSMU 1 and MP/HP/HRSMU 1] or
MCSMU 2] and [MP/HP/HRSMU 2 or
[MP/HP/HRSMU 1 and GNDU]]
Id-Vgs MCSMU B1500A
Id-Vgs MCSMU 2-stage B1500A
Memory Flash Ccf-V B1500A MFCMU 1
Flash Cfb-V B1500A MFCMU 1
Flash Cgg-Vcg B1500A MFCMU 1
NandFlash2 Endurance
3devices B1500A SMU 3, B2200A/B2201A 1, 81110A (2
outputs) 1
NandFlash2 Endurance B1500A ASU+SMU 3, 81110A (2 outputs) 1
NandFlash2 IV-Erase-IV B1500A SMU 1, ASU+SMU 2, 81110A (2 outputs) 1
NandFlash2 IV-Write-IV B1500A SMU 2, ASU+SMU 1, 81110A (2 outputs) 1
NandFlash2
Retention(ErasedCell) B1500A SMU 1, ASU+SMU 2, 81110A (2 outputs) 1
NandFlash2
Retention(WrittenCell) B1500A SMU 2, ASU+SMU 1, 81110A (2 outputs) 1
NandFlash2
Vth(ErasingTimeDependence
)
B1500A SMU 1, ASU+SMU 2, 81110A (2 outputs) 1
NandFlash2
Vth(WritingTimeDependence
)
B1500A SMU 2, ASU+SMU 1, 81110A (2 outputs) 1
NandFlash2
WordDisturb(ErasedCell) B1500A ASU+SMU 3, 81110A (2 outputs) 1
Category Test definition name Supported analyzer Required equipment and quantity

Memory NandFlash2
WordDisturb(WrittenCell) B1500A SMU 2, ASU+SMU 1, 81110A (2 outputs) 1
NandFlash3 Endurance B1500A [SPGU 1, ASU+SMU 3] or 
[SPGU 1, SMU 3, 16440A/16445A 2]
NandFlash3 IV-Erase-IV B1500A [SPGU 1, SMU 1, ASU+SMU 2] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3 IV-Write-IV B1500A [SPGU 1, SMU 2, ASU+SMU 1] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Retention(ErasedCell) B1500A [SPGU 1, SMU 1, ASU+SMU 2] or [SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Retention(WrittenCell) B1500A [SPGU 1, SMU 2, ASU+SMU 1] or [SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Vth(ErasingTimeDependence
)
B1500A [SPGU 1, SMU 1, ASU+SMU 2] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Vth(WritingTimeDependence
)
B1500A [SPGU 1, SMU 2, ASU+SMU 1] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
WordDisturb(ErasedCell) B1500A [SPGU 1, ASU+SMU 3] or 
[SPGU 1, SMU 3, 16440A/16445A 2]
NandFlash3
WordDisturb(WrittenCell) B1500A [SPGU 1, SMU 2, ASU+SMU 1] or [SPGU 1, SMU 3, 16440A/16445A 1]
NorFlash Endurance B1500A [SPGU 2, SMU 1, ASU+SMU 3] or
[SPGU 2, SMU 4, 16440A/16445A 2]
NorFlash IV-Erase-IV B1500A [SPGU 1, SMU 2, ASU+SMU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash IV-Write-IV B1500A [SPGU 1, SMU 2, ASU+SMU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
Retention(ErasedCell) B1500A [SPGU 1, SMU 2, ASU+SMU 2] or [SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
Retention(WrittenCell) B1500A [SPGU 1, SMU 2, ASU+SMU 2] or [SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
Vth(ErasingTimeDependence
)
B1500A [SPGU 1, SMU 2, ASU+SMU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
Vth(WritingTimeDependence
)
B1500A [SPGU 1, SMU 2, ASU+SMU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
WordDisturb(ErasedCell) B1500A [SPGU 1, SMU 2, ASU+SMU 2] or [SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
WordDisturb(WrittenCell) B1500A [SPGU 1, SMU 2, ASU+SMU 2] or [SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
DataDisturb(ErasedCell) B1500A [SPGU 2, SMU 1, ASU+SMU 3] or [SPGU 2, SMU 4, 16440A/16445A 2]
Category Test definition name Supported analyzer Required equipment and quantity

Memory NorFlash
DataDisturb(WrittenCell) B1500A [SPGU 1, SMU 2, ASU+SMU 2] or [SPGU 1, SMU 4, 16440A/16445A 1]
MixedSignal BJT Varactor CV Mismatch B1500A MFCMU 1
Diff-R Mismatch B1500A SMU 8
Diode IV Fwd Mismatch B1500A SMU 3
Diode IV Rev Mismatch B1500A SMU 3
G-Plot ConstVce Mismatch B1500A SMU 6
G-Plot ConstVce
Mismatch[3] B1500A SMU 5
G-Plot Vbc=0V Mismatch B1500A SMU 6
G-Plot Vbc=0V Mismatch[3] B1500A SMU 5
Ic-Vc Ib Mismatch B1500A SMU 6
Ic-Vc Ib Mismatch[3] B1500A SMU 5
Ic-Vc Vb Mismatch B1500A SMU 6
Ic-Vc Vb Mismatch[3] B1500A SMU 5
Id-Vd Mismatch B1500A SMU 5
Id-Vd Mismatch[3] B1500A SMU 4
Id-Vg Mismatch B1500A SMU 5
Id-Vd Mismatch[3] B1500A SMU 4
MIM CV Mismatch B1500A MFCMU 1
MOS Varactor CV Mismatch B1500A MFCMU 1
Poly-R Mismatch B1500A SMU 7
NanoTech CNT Differential R[AC] B1500A MFCMU 1
CNT Gate Leak B1500A,4155B/C,4156B/C SMU 2
CNT Id-Time B1500A,4156B/C SMU 4
CNT Id-Vd B1500A,4155B/C,4156B/C SMU 4
CNT Id-Vg B1500A,4155B/C,4156B/C SMU 4
CNT Id-Vg-Time B1500A,4156B/C SMU 4
CNT IV Sweep B1500A,4155B/C,4156B/C SMU 2
CNT R-I Kelvin 2SMU B1500A,4155B/C,4156B/C SMU 2
CNT R-V Kelvin 2SMU B1500A,4155B/C,4156B/C SMU 2
CNT Vth gmMax B1500A,4155B/C,4156B/C SMU 4
Organic 2-terminal dual Vsweep B1500A [SMU 1 and GNDU] or SMU 2
PwrDevice BVdss[3] PwrDevice B1500A SMU 3
BVgso[3] PwrDevice B1500A SMU 2
Id-Vd pulse[3] PwrDevice B1500A SMU 3
Category Test definition name Supported analyzer Required equipment and quantity

PwrDevice Id-Vd[3] PwrDevice B1500A SMU 3
Id-Vg pulse[3] PwrDevice B1500A SMU 3
Id-Vg[3] PwrDevice B1500A SMU 3
Vth Const Id[3] PwrDevice B1500A SMU 3
Vth gmMax[3] PwrDevice B1500A SMU 3
Reliability BJT EB RevStress 3devices B1500A SMU 6, B2200A/B2201A 1
BJT EB RevStress
3devices[3] B1500A SMU 5, B2200A/B2201A 1
BJT EB RevStress B1500A SMU 4
BJT EB RevStress2 B1500A SMU 4
BJT EB RevStress[3] B1500A SMU 3
BJT EB RevStress2[3] B1500A SMU 3
BTI 3devices B1500A SMU 5, B2200A/B2201A 1
BTI 3devices[3] B1500A SMU 5, B2200A/B2201A 1
BTI B1500A SMU 4
BTI2 B1500A SMU 4
BTI[3] B1500A SMU 3
BTI2[3] B1500A SMU 3
Charge Pumping B1500A SMU 2, 81110A (2 outputs) 1
Charge Pumping2 B1500A SMU 2, SPGU 1
EM Istress B1500A SMU 4
EM Istress2 B1500A SMU 4
EM Istress[2] B1500A SMU 2
EM Istress2[2] B1500A SMU 2
EM Istress[6] B1500A SMU 6
EM Istress2[6] B1500A SMU 6
EM Vstress B1500A SMU 4
EM Vstress2 B1500A SMU 4
EM Vstress[2] B1500A SMU 2
EM Vstress2[2] B1500A SMU 2
EM Vstress[6] B1500A SMU 6
EM Vstress2[6] B1500A SMU 6
HCI 3devices B1500A SMU 8
HCI B1500A SMU 4
HCI2 B1500A SMU 4
J-Ramp B1500A SMU 2
Category Test definition name Supported analyzer Required equipment and quantity

Reliability TDDB Istress 3devices B1500A SMU 4
TDDB Istress2 3devices B1500A SMU 4
TDDB Istress B1500A SMU 2
TDDB Istress2 B1500A SMU 2
TDDB Vstress 3devices B1500A SMU 4
TDDB Vstress2 3devices B1500A SMU 4
TDDB Vstress B1500A SMU 2
TDDB Vstress2 B1500A SMU 2
Timing On-the-fly NBTI B1500A SMU 4
Timing On-the-fly NBTI
-Mch B1500A SMU 4 or SMU 7
TZDB B1500A SMU 2
V-Ramp B1500A SMU 2
Sample Vth gmMax and Id B1500A,4155B/C,4156B/C SMU 4
Solar Cell Solar Cell IV B1500A [SMU 1 and GNDU] or SMU 2
Solar Cell IV Fwd B1500A [SMU 1 and GNDU] or SMU 2
Solar Cell IV Rev B1500A [SMU 1 and GNDU] or SMU 2
Solar Cell Cp-V B1500A MFCMU 1
Solar Cell Nc-W B1500A MFCMU 1
Solar Cell Cp-Freq Log B1500A MFCMU 1
Solar Cell Nyquist Plot B1500A MFCMU 1
Solar Cell Cp-AC Level B1500A MFCMU 1
Solar Cell DLCP B1500A MFCMU 1
SPGU_
PLSDIV SPGU PLSDIV B1500A SPGU 1
SPGU PLSDIV Id-Vd B1500A SPGU 1
SPGU PLSDIV Id-Vg B1500A SPGU 1
Structure BVgb ThinOx B1500A,4155B/C,4156B/C SMU 2
BVgb B1500A,4155B/C,4156B/C SMU 2
Cgb-Freq[2] Log B1500A MFCMU 1
Cgb-Vg 2Freq B1500A MFCMU 1
Cgb-Vg[2] B1500A MFCMU 1
Cj-Freq Log B1500A MFCMU 1
Cj-V B1500A MFCMU 1
Diode BVAndCj-V ASU B1500A MFCMU 1, ASU+SMU 2
Diode BVAndCj-V SCUU B1500A MFCMU 1, SMU 2, SCUU 1, GSWU 1
Ig-Vg Iforce B1500A,4155B/C,4156B/C SMU 2
Category Test definition name Supported analyzer Required equipment and quantity

Structure Ig-Vg Vforce B1500A,4155B/C,4156B/C SMU 2
Interconnect CouplingCap B1500A MFCMU 1
Interconnect OverlapCap B1500A MFCMU 1
Junction BV B1500A,4155B/C,4156B/C SMU 2
Junction DcParam B1500A,4155B/C,4156B/C SMU 2
Junction IV Fwd B1500A,4155B/C,4156B/C SMU 2
Junction IV Rev B1500A,4155B/C,4156B/C SMU 2
QSCV[2] B1500A,B1505A,4155B/C,
4156B/C SMU 3
QSCV C Offset Meas SMU 2
Rdiff-I kelvin B1500A SMU 5
Rdiff-I B1500A,4155B/C,4156B/C SMU 3
Rdiff-V kelvin B1500A SMU 5
Rdiff-V B1500A,4155B/C,4156B/C SMU 3
R-I DVM B1500A SMU 2, 3458A 1
R-I kelvin B1500A,4155B/C,4156B/C SMU 4
R-I B1500A,4155B/C,4156B/C SMU 2
R-V DVM B1500A SMU 2, 3458A 1
R-V kelvin B1500A,4155B/C,4156B/C SMU 4
R-V B1500A,4155B/C,4156B/C SMU 2
VanDerPauw Square B1500A,4155B/C,4156B/C SMU 4
TFT TFT Id-Vd B1500A,4155B/C,4156B/C SMU 3
TFT Id-Vg B1500A,4155B/C,4156B/C SMU 3
Utility CV Curve Parameter
Calculator B1500A,B1505A,4155B/C, 4156B/C
CVSweep4284_a 4284A 1or E4980A 1
ForcePG1 81110A (2 outputs) 1
ForcePG2 81110A (2 outputs) 1
ForcePG2P 81110A (2 outputs) 1
ForcePG12 81110A (2 outputs) 1
ForcePG 81110A (2 outputs) 1
ForcePGC 81110A (2 outputs) 1
Measure Diff-V 3458A 1
QSCV C Offset Meas SMU 2
ResetPG 81110A (2 outputs) 1
Subsite move Wafer prober 1
Category Test definition name Supported analyzer Required equipment and quantity

WGFMU
(needs test
definitions of
WGFMU
Utility)
Fast BTI(ACstress
Id-Sampling) B1500A WGFMU 1, RSU 2
Fast BTI(DCstress
Id-Sampling) B1500A WGFMU 1, RSU 2
Fast BTI(ACstress Id-Vg) B1500A WGFMU 1, RSU 2
Fast BTI(DCstress Id-Vg) B1500A WGFMU 1, RSU 2
TRANSIV DC IdVd B1500A SMU 2, WGFMU 1, RSU 2
TRANSIV DC IdVg B1500A SMU 2, WGFMU 1, RSU 2
WGFMU Pattern Editor B1500A WGFMU 1, RSU 2
WGFMU
Utility
(cannot be
executed
directly)
Fast BTI Id-Sampling child B1500A WGFMU 1, RSU 2
Fast BTI Id-Sampling child2 B1500A WGFMU 1, RSU 2
Fast BTI Id-Vg child B1500A WGFMU 1, RSU 2
Fast BTI Id-Vg child2 B1500A WGFMU 1, RSU 2
Fast BTI Pattern Editor Child
DataDisplay B1500A WGFMU 1, RSU 2
WGFMU_IV WGFMU DCIV B1500A WGFMU 1, RSU 2
WGFMU PLSDIV B1500A WGFMU 1, RSU 2
WGFMU Id-Vd (DC) B1500A WGFMU 1, RSU 2
WGFMU Id-Vg (DC) B1500A WGFMU 1, RSU 2
WGFMU Id-Vd pulse B1500A WGFMU 1, RSU 2
WGFMU Id-Vg pulse B1500A WGFMU 1, RSU 2
GaN Diode Diode Current Collapse IV-t
Sampling B1505A N1267A 1, HVSMU 1, HCSMU 1, MCSMU 1
Diode Current Collapse
Signal Monitor B1505A N1267A 1, HVSMU 1, HCSMU 1, MCSMU 1
GaN FET FET Current Collapse IV-t
Sampling (I Force) B1505A N1267A 1, HVSMU 1, HCSMU 1, MCSMU 2, SMU 1
FET Current Collapse IV-t
Sampling B1505A N1267A 1, HVSMU 1, HCSMU 1, MCSMU 2, SMU 1
FET Current Collapse Signal
Monitor (I Force) B1505A N1267A 1, HVSMU 1, HCSMU 1, MCSMU 2, SMU 1
FET Current Collapse Signal
Monitor B1505A N1267A 1, HVSMU 1, HCSMU 1, MCSMU 2, SMU 1
Id-Vds Current Collapse B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 2, SMU 1
IGBT Cce B1505A MFCMU 1, HVSMU 1, Bias-T 1
Cgc B1505A MFCMU 1, HVSMU 1, Bias-T 1
Cge B1505A MFCMU 1, Bias-T 1 or N1259A with 020
Cge-Vge B1505A MFCMU 1
Category Test definition name Supported analyzer Required equipment and quantity

IGBT Ic(off)-Vce B1505A SMU 2
Ic-Vce B1505A [HCSMU 1 and SMU 1] or SMU 2
Ic-Vge B1505A [HCSMU 1 and SMU 1] or SMU 2
Vce(sat) B1505A [HCSMU 1 and SMU 1] or SMU 2
Vth Vge(off) B1505A [HCSMU 1 and SMU 1] or SMU 2
Vce-Vge B1505A HCSMU 1, SMU 1
Ic-Vge for Expanders B1505A N1265A 1, MC/HCSMU 2, SMU 1
Interconnection Residual R B1505A HCSMU 1 or SMU 1
MISCAP BV B1505A SMU 1
C(MISCAP) B1505A MFCMU 1
Ileak-V B1505A SMU 1
PowerBJT Ic-Vcbo B1505A SMU 1
Ic-Vce(PowerBJT) B1505A [HCSMU 1 and SMU 1] or SMU/HCSMU 2
Ic-Vceo B1505A SMU 1
Ic-Vces B1505A SMU 2
Ie-Vebo B1505A SMU 1
Vce(sat)-Ic B1505A [HCSMU 1 and SMU 1] or SMU/HCSMU 2
G-Plot for Expanders B1505A N1265A 1, MC/HCSMU 2, SMU 1
Ic-Ib for Expanders B1505A N1265A 1, MC/HCSMU 2, SMU 1
PowerDiode Cj-Vr B1505A MFCMU 1, HVSMU 1, Bias-T 1
If-Vf B1505A HCSMU 1 or SMU 1
Ir-Vr B1505A SMU 1
Vf B1505A HCSMU 1 or SMU 1
Power
MOSFET Vds-Vgs B1505A HCSMU 1, SMU 1
Id-Vgs for Expanders B1505A N1265A 1, MC/HCSMU 2, SMU 1
See Note 1 Cds B1505A MFCMU 1, HVSMU 1, Bias-T 1
Cgd B1505A MFCMU 1, HVSMU 1, Bias-T 1
Cgs B1505A MFCMU 1, Bias-T 1 or N1259A with 020
Cgs-Vgs B1505A MFCMU 1
Id(off)-Vds B1505A SMU 2
Id-Vds B1505A [HCSMU 1 and SMU 1] or SMU 2
Id-Vgs B1505A [HCSMU 1 and SMU 1] or SMU 2
Rds-Id B1505A [HCSMU 1 and SMU 1] or SMU 2
Vth Vgs(off) B1505A [HCSMU 1 and SMU 1] or SMU/HCSMU 2
See Note 2 TDDB Constant V B1505A SMU 1
Category Test definition name Supported analyzer Required equipment and quantity

NOTE Note 1
These test definitions belong to the categories PMIC, PowerMOSFET, and SiC.
NOTE Note 2
This test definition belongs to the categories IGBT, MISCAP, PMIC, PowerMOSFET, and
SiC.

1BJT

1 BJT
1. BC Diode Fwd: Base-Collector junction forward characteristics (A.01.20)
2. BC Diode Reverse: Base-Collector junction reverse characteristics (A.01.20)
3. BVcbo: Base-Collector junction breakdown voltage (A.01.20)
4. BVcei: Emitter-Collector breakdown voltage (A.01.20)
5. BVceo: Emitter-Collector breakdown voltage, opened base (A.01.20)
6. BVebo: Emitter-Base breakdown voltage (A.01.20)
7. CS Diode Fwd: Collector-Substrate junction forward characteristics (A.01.20)
8. CS Diode Reverse: Collector-Substrate junction reverse characteristics (A.01.20)
9. Ctc-Freq Log: Ctc-f characteristics (A.01.20)
10. Ctc-Vc: Ctc-Vcb characteristics (A.01.20)
11. Cte-Ve: Cte-Veb characteristics (A.01.20)
12. Cts: Cts-Vsc characteristics (A.01.20)
13. EB Diode Fwd: Emitter-Base junction forward characteristics (A.01.20)
14. EB Diode Rev: Emitter-Base junction reverse characteristics (A.01.20)
15. G-Plot ConstVce Pulse: Ic-Vb characteristics, Vce=const, SMU Pulse (A.01.11)
16. G-Plot ConstVce Pulse[3]: Ic-Vb characteristics, Vce=const, 3-terminal, SMU Pulse (A.01.11)
17. G-Plot ConstVce: Gummel characteristics, Vce=constant (A.01.20)
18. G-Plot ConstVce[3]: Gummel characteristics, Vce=constant, 3-terminal (A.01.20)
19. G-Plot Vbc=0V Pulse: Ic-Ve characteristics, Vbc=0, SMU Pulse (A.01.11)
20. G-Plot Vbc=0V Pulse[3]: Ic-Ve characteristics, Vbc=0, 3-terminal, SMU Pulse (A.01.11)
21. G-Plot Vbc=0V: Gummel characteristics, Vbc=0 (A.01.20)
22. G-Plot Vbc=0V[3]: Gummel characteristics, Vbc=0, 3-terminal (A.01.20)
23. hfe-Vbe ConstVce: hfe-Ic characteristics, Vce=constant (A.01.20)
24. hfe-Vbe Vbc=0V: hfe-Ic characteristics, Vbc=0 (A.01.20)
25. Ic-Vc Ib: Ic-Vc characteristics, Ib sweep (A.01.20)
26. Ic-Vc Ib[3]: Ic-Vc characteristics, 3-terminal, Ib sweep (A.01.20)
27. Ic-Vc Pulse Ib: Ic-Vc characteristics, Ib sweep, SMU Pulse (A.01.11)
28. Ic-Vc Pulse Ib[3]: Ic-Vc characteristics, 3-terminal, Ib sweep, SMU Pulse (A.01.11)
29. Ic-Vc Pulse Vb: Ic-Vc characteristics, Vb sweep, SMU Pulse (A.01.11)
30. Ic-Vc Pulse Vb[3]: Ic-Vc characteristics, 3-terminal, Vb sweep, SMU Pulse (A.01.11)
31. Ic-Vc Vb: Ic-Vc characteristics, Vb sweep (A.01.20)
32. Ic-Vc Vb[3]: Ic-Vc characteristics, 3-terminal, Vb sweep (A.01.20)
33. Rb: Base resistance (flyback method, 4-terminal) (A.01.20)
34. Re+Rc: Collector resistance (including Emitter resistance, flyback method, 4-terminal)
(A.01.20)
35. Re: Emitter resistance (flyback method, 4-terminal) (A.01.20)
36. Simple Gummel Plot: Evaluation of Gummel characteristics (Vce=const) (A.01.10)
37. Vbe-Le: hfe,Vbe-Le characteristics (A.01.20)
38. Vbe-We: hfe,Vbe-Le characteristics (A.01.20)
Agilent EasyEXPERT Application Library Reference, Edition 8
1-2

1 BJT
1.1 BC Diode Fwd: Base-Collector junction forward characteristics (A.01.20)
[Supported Analyzer]
B1500A, 4155B, 4155C, 4156B, 4156C
[Description]
Measures the Base-Collector junction forward characteristics of BJT. Emitter and Substrate are opened.
[Device Under Test]
Bipolar transistor
[Device Parameters]
Polarity: NPN (SMUs force the specified value) or PNP (SMUs force the negative specified value).
Lb: Base length
Wb: Base width
Temp: Temperature
Imax: Current compliance
[Test Parameters]
IntegTime: Integration time
Collector: SMU connected to Collector terminal, primary sweep voltage output
VcStart: Sweep start voltage for Collector terminal
VcStop: Sweep stop voltage for Collector terminal
VcStep: Sweep step voltage for Collector terminal
Base: SMU connected to Base terminal, constant voltage output
[Extended Test Parameters]
Vb: Base voltage
HoldTime: Hold time
DelayTime: Delay time
BaseMinRng: Minimum range for the base current measurement
CollectorMinRng: Minimum range for the collector current measurement
[Measurement Parameters]
Collector current Icollector
Base current Ibase
[User Function]
IcPerArea=Icollector/Lb/Wb
IbPerArea=Ibase/Lb/Wb
[X-Y Plot]
X axis: Collector voltage Vcollector (LINEAR)
Y1 axis: Collector current Icollector (LOG)
Y2 axis: Collector current Icollector (LINEAR)
Y3 axis: Base current Ibase (LOG)
Y4 axis: Base current Ibase (LINEAR)
Agilent EasyEXPERT Application Library Reference, Edition 8 1-3

1 BJT
1.2 BC Diode Reverse: Base-Collector junction reverse characteristics (A.01.20)
[Supported Analyzer]
B1500A, 4155B, 4155C, 4156B, 4156C
[Description]
Measures the Base-Collector junction reverse characteristics of BJT. Emitter and Substrate are opened.
[Device Under Test]
Bipolar transistor
[Device Parameters]
Polarity: NPN (SMUs force the specified value) or PNP (SMUs force the negative specified value).
Lb: Base length
Wb: Base width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
Collector: SMU connected to Collector terminal, primary sweep voltage output
VcStart: Sweep start voltage for Collector terminal
VcStop: Sweep stop voltage for Collector terminal
VcStep: Sweep step voltage for Collector terminal
IcLimit: Collector current compliance
Base: SMU connected to Base terminal, constant voltage output
[Extended Test Parameters]
Vb: Base voltage
HoldTime: Hold time
DelayTime: Delay time
BaseMinRng: Minimum range for the base current measurement
CollectorMinRng: Minimum range for the collector current measurement
[Measurement Parameters]
Collector current Icollector
Base current Ibase
[User Function]
IcPerArea=Icollector/Lb/Wb
IbPerArea=Ibase/Lb/Wb
[X-Y Plot]
X axis: Collector voltage Vcollector (LINEAR)
Y1 axis: Collector current Icollector (LOG)
Y2 axis: Base current Ibase (LOG)
Agilent EasyEXPERT Application Library Reference, Edition 8
1-4