Anrtisu Lightning 37000D User manual

Lightning™
37000D
Vector Network Analyzers
40 MHz to 65 GHz
Technical Datasheet and Configuration Guide
37000D Series
Network Analysis Solutions for Design and Manufacturing

2
System Description
The Lightning D series microwave and millimeter-wave Vector
Network Analyzers encompass a wide range of high performance
component and system test tools designed to address the growing
needs of defense, satellite, radar, broadband communication, and
optoelectronic component markets. The Lightning D series represents
the latest improvements to the ever-popular Lightning VNAs to
formulate a new range of Network Analyzers with more application
features and added options for higher levels of measurement
capability. These include Time Domain, Gain Compression, IMD,
Frequency Translation, Multiport, Embedding/De-embedding and
E/O and O/E measurements, in addition to fast and accurate S-
parameter measurements. Complete measurement solutions to 20,
40, 50 and 65 GHz are available in microwave models 37x47D,
37x69D, 37x77D, and 37x97D, respectively.
Standard Features
Measurement Parameters: S11, S21, S22, S12
User-defined combinations of a1, a2, b1, and b2.
Domains: Frequency Domain, CW Draw, and optional High Speed
Time (Distance) Domain.
Graph Types: Log Magnitude, Phase, Log Magnitude and Phase,
Smith Chart (Impedance), Smith Chart (Admittance), Linear Polar,
Log Polar, Group Delay, Linear Magnitude, Linear Magnitude and
Phase, Real, Imaginary, Real and Imaginary, SWR and Power Out.
Data Points: 1601 maximum or N discrete data points
where 2 ≤N ≤1601.
Limits Lines: Either single or segmented limit lines can be displayed.
Two limit lines are available for each trace.
Single Limit Readouts: Interpolation algorithm determines the exact
intersection frequencies of test data and limit lines.
Segmented Limits: A total of 20 segments (10 upper and 10 lower)
can be generated per data trace. Complete segmented traces can
be offset in both frequency and amplitude.
Test Limits: Both single and segmented limits can be used for
PASS/FAIL testing. The active channel's PASS or FAIL status is
indicated on the display after each sweep. In addition, PASS/FAIL
status is output through the rear panel I/O connector as selectable
TTL levels (PASS = 0V, FAIL = +5V or PASS = +5V, FAIL = 0V).
Tune Mode: Tune Mode optimizes sweep speed in tuning
applications by updating forward S-parameters more frequently
than reverse ones. This mode allows the user to select the ratio of
forward sweeps to reverse sweeps after a full 12-term calibration.
The ratio of forward sweeps to reverse sweeps can be set
anywhere between 1:1 and 10,000:1.
Data Averaging: Point-by-point (default) {up to 4096}
Sweep-by-Sweep
IF Bandwidth: 10 kHz – 10 Hz
Reference Plane: Can be entered in time or in distance (when the
dielectric constant is entered). Automatic reference plane feature
adds the correct electrical length (delay) compensation. Software
compensation for the electrical length difference between reference
and test is always accurate and stable since measurement
frequencies are always synthesized. In addition, the system
compensates reference phase delay for dispersive transmission
media, such as waveguide and microstrip.
Measurement Frequency Range: Frequency range of the
measurement can be narrowed within the calibration range without
recalibration. CW mode permits single frequency measurements,
also without recalibration.
Group Delay Aperture: Defined as the frequency span over which
the phase change is computed at a given frequency point. The
aperture can be changed without recalibration. The minimum
aperture is the frequency range divided by the number of points in
calibration and can be increased to 20% of the frequency range
without recalibration.
Measurement Channels: Four independent channels are available
to display any S-parameter or user defined parameter, in any
format, with up to two traces per channel for a maximum of eight
traces simultaneously. A single channel, two channels (1 and 3, or
2 and 4), or all four channels can be displayed simultaneously.
Channels 1 and 3, or channels 2 and 4 can be overlaid.
Display: Color LCD, 8.5" diagonal.
Display Colors: The color of data traces, memory, text, markers
and limit lines are all user definable.
Trace Overlay: Displays two data traces on the active channel's
graticule simultaneously.
Trace Memory: A separate memory for each channel can be used
to store measurement data for later display or subtraction,
addition, multiplication or division with current measurement data.
Group Delay Range: The maximum delay range is limited to
measuring no more than +180° of phase change within the
aperture set by the number of frequency points.
Scale Resolution (minimum per division):
Log Magnitude 0.001 dB
Linear Magnitude 1 pU
Phase 0.01°
Group Delay 0.001 ps
Time 0.001 ms
Distance 0.1 µm
SWR 1 pU
Power 0.01 dB
Markers: Six independent markers can be used to read out
measurement data.
Delta Marker: One marker can be selected as the reference for
the other five.
Enhanced Markers: Marker search feature can be used for
finding a level or bandwidth on the active channel.
Marker Sweep: Sweeps upward in frequency between any two
markers. Recalibration is not required during the marker sweep.

3
Blank Frequency Information: Blanking function removes all
references to frequencies on the display. Frequency references can
only be restored through a system reset or GPIB command.
Vector Error Correction:
There are six built-in methods of calibration:
Short-Open-Load-Thru (SOLT): This calibration method uses
short circuits, open circuits, and terminations (fixed or sliding).
Offset-Short (waveguide): This calibration method uses short
circuits and terminations.
LRL/LRM: The Line-Reflect-Line (LRL) or Line-Reflect-Match
(LRM) calibration uses transmission lines and a reflective
device
or termination (LRM).
TRM: The Thru-Reflect-Match calibration uses short circuits
and
fixed termination.
Three Offset-Short (SSST): This calibration method uses three
short circuits with different offset lengths to calculate all the
calibration terms.
Autocal: This calibration method uses an automatic calibrator
module.
There are four vector error correction models available for
calibration:
1) Full 12-Term
2) One Path/Two Port
3) Frequency Response
4) Reflection Only
Merged Calibrations: In addition, the Lightning D series VNAs have
a Merged Calibration feature that allows the user to merge
calibrations performed under different conditions (such as a low
frequency SOLT with a band-limited LRL) to cover different
frequency bands, provided the total number of points does not
exceed 1601.
AutoCal®:The VNA can internally control an external AutoCal
module to perform a 2-port OSLT calibration. AutoCal is a single
two port calibration module with built-in, switched, and
characterized OSLT standards. AutoCal provides quick, reliable,
and accurate calibrations that exceed the performance of a
standard broadband load OSLT calibration.
Calibration Standards: For coaxial calibrations the user can select
between SMA, 3.5 mm, GPC-7, Type N, 2.4 mm, TNC, K, V, W1
connector or special type from the calibration menu. Use of fixed
or sliding loads can be selected for each connector type. User
defined calibration standards allow for entry of open capacitance,
load and short inductances, load impedance, and reflection
standard offset lengths.
Reference Impedance: It is possible to modify the reference
impedance of the measurement to other than 50Ω (but not 0).
Adapter Removal Calibration: Built-in Adapter Removal application
software accurately characterizes and "removes" any adapter
used during calibration that will not be used for subsequent device
measurements. This technique allows for accurate measurement
of non-insertable devices.
Dispersion Compensation: Selectable as Coaxial (nondispersive),
Waveguide, or Microstrip (dispersive).
Power Meter Correction: Power meter correction is available at a
user-selectable power level, if it is within the power adjustment
range of the internal source. This is performed using an external
power meter over the Dedicated GPIB port
Multiple Source Control Capability: Multiple Source Control
capability allows a user to independently control the frequencies of
two sources and the receiver without the need for an external
controller PC. The frequency sweep may be comprised of up to
five separate bands, each with independent source and receiver
settings, for convenient testing of mixers, multipliers and other
frequency translated devices.
Set-On Receiver Mode: For applications that require Harmonics or
Intermodulation measurement, the 37000D can be configured to
measure the relative harmonic level of test devices with Set-On
Receiver Mode capability. The 37000D's unique phase locking
scheme allows it to operate as a tuned receiver by locking all of its
local oscillators to its internal crystal reference oscillator.
Embedding/De-embedding: All 37000D are equipped with an
Embedding/De-embedding feature. De-embedding is generally
used for removal of test fixture contributions and other S2P
networks from measurements. The de-embedding can be applied
to a calibration and then stored for future measurements. Similarly,
the Embedding function can be used to simulate matching circuits
for optimizing amplifier designs or simply adding effects of a
known structure to a measurement.
Electro-Optical Measurements
The 37000D series incorporated a de-embedding function that
simplifies VNA calibration when measuring E/O and O/E devices.
Characterize the transfer function, group delay, and return loss of
optical modulators (E/O) and photoreceivers (O/E) using the built-
in application.
E/O Measurements: The application menus guide the user through
the entire calibration and setup. A characterized photodiode (O/E)
reference and a laser source are required to complete the test
setup. The internal VNA application de-embeds the response of
the photodiode reference to allow direct measurement of the
bandwidth and return loss of the modulator.
O/E Measurements: Photoreceiver measurements can be made by
characterizing a modulator first and then using it as a transfer
standard for the O/E measurement. The internal application de-
embeds the response of the modulator to allow characterization of
the photoreceiver.
Gain Compression Measurements (37300D models only)
The 37300D series provide a user-intuitive Gain Compression and
AM/PM measurement application. The following two methods are
available for making gain compression measurements.
Swept Power Gain Compression: The VNA displays traditional
Power out vs. Power in or Phase vs. Power in, at one of up to 10
selectable CW frequencies. A separate screen will easily show
Power out and Power in at 1 dB or selected Gain compression for
all entered frequencies.
Swept Frequency Gain Compression: Once Gain is measured at
the starting power, the user increments Power in, observing
Normalized Gain vs. Frequency. This aids in analyzing the most
critical compression frequencies of a broadband amplifier.

4
Throughput Times (ms) without Correction (typical)
Data Format 3 Points1101 Points 401 Points 1601 Points
32 Bit 40 400 1000 3000
64 Bit 40 400 1000 3000
ASCII 40450 1200 3600
1: 3 data point sweeps taken at 2, 4, and 6 GHz.
Throughput Times (ms) with 12-Term Correction (typical)
Data Format 3 Points1101 Points 401 Points 1601 Points
32 Bit 80 800 1900 5800
64 Bit 80 800 1900 5800
ASCII 80 850 2100 6300
1: 3 data point sweeps taken at 2, 4, and 6 GHz.
Fast CW Typical Performance
Trigger Mode Measurement Speed
(ms/point)
GPIB 1.5
External TTL 1.2
Internal 0.8
Calibration
Type
Data Points
3 51 101 401 1601
1 Port (3 Term) 75 270 350 920 3000
2Port (12 Term) 60 250 340 920 3000
Sweep Mode Time (ms)
Linear 350
List 350
CW 190
IF Bandwidth Time (ms)
10 kHz 180
1 kHz 270
100 Hz 1100
10 Hz 7300
Frequency Span Time (ms)
40 MHz to 65 GHz 900
40 MHz to 40 GHz 450
20 GHz to 40 GHz 340
10 GHz to 11 GHz 220
Measurement Time vs. Sweep Mode for 101 Data Points (typical)
Measurement Time vs. IF BW for 101 Data Points (typical)
Measurement Time vs. Span for 101 Data Points (typical)
Connectivity
GPIB: 2 Ports, system GPIB and dedicated GPIB
System GPIB (IEEE-488.2): Connects to an external controller for
use in remote programming of the network analyzer. Address can
be set from the front panel and can range from 1 to 30.
Dedicated GPIB: Connects to external peripherals for network
analyzer controlled operations (e.g., GPIB plotters, frequency
counters, frequency synthesizers and power meters).
GPIB Data Transfer Formats: ASCII, 32-bit floating point, or 64-bit
floating point. 32-bit and 64-bit floating point data can be
transferred with LSB or MSB first.
Measurement Throughput: Measurement times are based on a
single 40 MHz to 20 GHz sweep with 10 kHz IF bandwidth (no
averages) after a full 12-term calibration. Sweep times include
retrace and band switch times.
Measurement Time (ms) vs. 101 Data Points (typical)
GPIB Data Transfer Speed (with or without cal): 240 kB/sec
GPIB Data Throughput Time: Throughput measurements for both
tables were made as follows: start the timer, trigger a sweep, wait
for a full sweep, transfer data across the GPIB and stop the timer.
Data throughput times are shown separately for measurements
made without calibration and with full two-port, 12-Term calibration.
Measurement conditions: 40 MHz to 20 GHz sweep, single
channel, log magnitude display, 10 kHz IF bandwidth, and output
final data.
Fast CW Operation: Fast CW is an ideal mode of operation for
rapid data taking over GPIB. To achieve a fast measurement rate
the display is not updated and only the raw S-parameter or user-
defined parameter of the active channel is measured.
Internal Buffer Data Collection: Internal Buffer Data Collection is
provided to allow saving active channel measurement data from
multiple sweeps without having to synchronize and collect data at
the end of each sweep. The 37000D can store up to 50,000 data
point measurements, each consisting of two (real and imaginary)
IEEE 754 4-byte floating point numbers. GPIB transfer speed for
the 50,000 data points is typically 2.2 seconds.
Ethernet Port: 10/100 Base T
Ethernet Data transfer speed (with or without cal):
850 kB/s (typical)
Printer Port: Parallel port, 25 pin
Serial Port: Control Signals +5V TTL, also used for AutoCal® control
External I/O: Connects to external test sets, 25 pin DSUB connector

5
GPIB
Printer Port
Serial Port
Ethernet Port External I/O Connector
IF Inputs
Interface to
Broadband
Test Set
Storage
Internal Hard Disk Drive: 0.5 GB, used to store and recall
measurement and calibration data and front-panel setups. File
names can be 1 to 8 characters long, and must begin with a
character, not a number. Extensions are automatically assigned.
Internal Memory: Ten front panel states (no calibration) can be
stored and recalled from non-volatile memory locations. The current
front panel setup is automatically stored in non-volatile memory at
instrument power-down. When power is applied, the instrument
returns to its last front panel setup.
External SCSI Interface: Option 4 deletes the internal hard disk
drive, and adds a SCSI Interface connector to the rear panel for
connecting a SCSI-2 formatted storage drive (available as an
accessory).
Internal Floppy Disk Drive: A 3.5-inch diskette drive with 1.44 Mbytes
formatted capacity is used to load measurement programs and to
store and recall measurement and calibration data and front-panel
setups. Measurement data can be stored in text, S2P or bitmap
format. File names can be 1 to 8 characters long and must begin
with a character, not a number. Extensions are automatically
assigned.
Measurement Data: 102.8 kB per 1601 point S-parameter data file.
Calibration Data: 187.3 kB per 1601 point S-parameter data file
(12-Term cal plus setup).
Trace Memory File: 12.8 kB per 1601 point channel.
Interfaces
Front Panel Connectors and Controls:
Keyboard Input: Any PS-2 keyboard can be connected to the
front panel for navigating through front panel menus, annotation
of data files and display labels, printing displays and pausing
instrument sweeps.
Test Ports: Universal K male test ports are standard on the
37X47D and 37X69D models, and the Universal V male test
ports are standard on the 37X77D and 37X97D models. For
additional configurations check Test Port Converters (Option 7).
Bias Inputs, Port 1 and 2 (37300D): 0.5 amps maximum through
BNC connectors.
Option 15 ports: K-female provided on the 37X47D and
37X69D models, and V-female ports provided on the 37X77D
and 37X97D models. Please refer to Flexible test set option
section for power ratings of ports.
Rear Panel Connectors and Controls:
VGA Out: Provides VGA output of 37000D video display.
Serial: 9-Pin male D-SUB connector. Provides RS-232 serial
port control for an AutoCal®module (3658 series).
10 MHz REF In: Connects to external reference frequency
standard, 10 MHz, +5 to –5 dBm, 50Ω, BNC female.
10 MHz REF Out: Connects to internal reference frequency
standard, 10 MHz, 0 dBm, 50Ω, BNC female.
Ext Analog Out: –10V to +10V with 5 mV resolution, varying in
proportion to user-selected data (e.g., frequency, amplitude).
BNC female.
Ext Analog In: ±50 volt input for displaying external signals on
the LCD. BNC female.
Line Selection: Power supply automatically senses 100V, 120V,
220V or 240V lines.
External Trigger: External TTL triggering for 37000D
measurement. 10 kΩ input impedance, BNC female.
Printer Port: A standard parallel port interfaces to most printers
for printing full screen graphical and tabular data.

Options
Time (Distance) Domain Measurement Capability (Option 2A)
High Speed Time (Distance) Domain option allows the conversion
of reflection or transmission measurements from the frequency
domain to the time domain. Measured S-parameter data is
converted to the time domain by application of a Fast Fourier
Transform (FFT) using the Chirp Z-Transform technique. Prior to
conversion, any one of several selectable windowing functions may
be applied. Once the data is converted to the time domain, a
gating function may be applied to select the data of interest. The
processed data may then be displayed in the time domain with
display start and stop times selected by the user or in the distance
domain with display start and stop distance selected by the user.
The data may also be converted back to the frequency domain
with a time gate to view the frequency response of the gated data.
The following modes are available within the Time Domain option:
Lowpass Mode: This mode displays a response equivalent to the
classic "TDR" (Time Domain Reflectometer) response of the device
under test and provides the best resolution. Lowpass response
may be displayed in either the Impulse or Step mode. This type of
processing requires a sweep over a harmonic series of frequencies
and an extrapolated or user-entered DC value.
Bandpass Mode: This mode displays a response equivalent to the
time response of the device under test to a band limited impulse.
This type of processing may be used with any arbitrary frequency
sweep range, limited only by the test set range or device under test
response.
Phasor Impulse Mode: This mode displays a response similar to
the Lowpass impulse response, using data taken over an arbitrary
(band limited) sweep range. Detailed information, similar to that
contained in the lowpass impulse response may be used to identify
the nature of impedance discontinuities in the device under test.
Now, with Phasor Impulse, it is possible to characterize complex
impedances on band-limited devices.
The following windows may be applied to the frequency data in the
time domain mode.
Windowing: Any one of four window functions may be applied to
the initial frequency data, to counteract the effects of processing
data with a finite bandwidth. These windows provide a range of
trade offs of main lobe width versus side lobe level (ringing). The
general type of function used is the Blackman-Harris window with
the number of terms being varied from one to four. Typical
performance follows:
Gating: A selective gating function may be applied to the time domain
data to remove unwanted responses, either in a pass-band or reject-
band (mask). This gating function may be chosen as the convolution
of any of the above window types with a rectangular gate of user
defined position and width. The gate may be specified by entering start
and stop times or center and span. The gated data may be displayed
in the time domain, or converted back to the frequency domain.
Range:
The unaliased (non-repeating) time range is given by the formula:
Unaliased Range (ns) = Number of Frequency Data Points
Frequency Sweep Range (GHz)
The resolution is given by the formula:
Main Lobe Width (null–null) in ns = kW
Frequency Sweep Range (GHz)
where kW is two times the number of window terms
(for example, four for a two-term window)
Frequency with Time Gate: Data that has been converted to time
domain and selected by the application of gating function may be
converted back to the frequency domain. This allows the display of the
frequency response of a single element contained in the device under
test. Frequency response accuracy is a function of window and gate
type, and gate width. For a full reflection, minimum gate and window
accuracy is within 0.2 dB of the un-gated response over a 40 GHz range.
Flexible Test Set (Option 15)
This option provides direct access to all the non-ratioed channels,
namely a1 (Ref. A), a2 (Ref. B), b1 (Test A), and b2 (Test B), from
the front panel. This is useful for antenna measurements, frequency
translated device measurements (mixers, multipliers) and external
test set additions (such as for multiport applications).
This option also adds an auxiliary source loop on each port to allow
the addition of external devices. Thus, an amplifier or attenuator
can be added to either boost the available power from each port or
to further extend the ALC range of the instrument.
6
Type of Window
(Number of Terms)
First Side Lobe
Relative to Peak Impulse Width1
Rectangle (1) –13 dB 1.2W
Nominal-Hamming (2) –43 dB 1.8W
Low Side Lobe,
Blackman-Harris (3) –67 dB 2.1W
Minimum Side Lobe,
Blackman-Harris (4) –92 dB 2.7W
1: W (Bin Width) = 1/2∆f sweep width.
(see pages 11–12 for block diagrams)
Port Max. Signal Into Port
(dBm)
a1 27
a2 27
b1 20
b2 20
Src. 1 30
Src. 2 30

7
Reflection Magnitude Uncertainty
37x47D/3652/Reflection Only
Uncertainty (dB)
10
1
0.1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz
2 GHz
20 GHz
Device S11 (dB)
37X47D (40 MHz – 20 GHz)
System Dynamic Range is defined as the difference between the available power from Port 1 incident on Port 2 in a through line connection and
the noise floor.
VNA settings: 10 Hz I.F. Bandwidth, 101 pts, 12-term SOLT calibration, 512 averages
Corrected Specifications
Test Port Characteristics3
Connector Frequency1
(GHz)
Directivity
(dB)
Source Match
(dB)
Load Match
(dB)
Reflection Tracking
(dB)
Transmission Tracking
(dB)
Isolation
(dB)
K(2.92 mm)
0.04 >42 >40 >42 ±0.005 ±0.030 >105
20 >42 >38 >42 ±0.006 ±0.070 >110
The graphs give measurement uncertainty after 12-Term vector error correction. The errors are worst case contributions of residual directivity,
load and source match, frequency response, isolation, network analyzer dynamic accuracy, and connector repeatability.
Reflection Phase Uncertainty
37x47D/3652/Reflection Only
Device S11 (dB)
Uncertainty (Degrees)
100
10
1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz
2 GHz
20 GHz
Uncertainty (dB)
Device S21 (dB)
Transmission Magnitude Uncertainty
37x47D/3652/Transmission Only
10
1
0.1
0.01
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
0.04 GHz
2 GHz
20 GHz
Transmission Phase Uncertainty
37x47D/3652/Transmission Only
Uncertainty (Degrees)
100
10
1
0.1
Device S21 (dB)
-80 -70 -60 -50 -40 -30 -20 -10 0 10
Reflection Measurements
Transmission Measurements
Model Frequency1
(GHz)
Port 1 Power, Typical (dBm) Noise Floor at Port 2 (dBm)2System Dynamic Range (dB)
37347D
0.04 10 –82 92
211–104 115
208–100 108
37247D
0.04 10–82 92
211–104 115
20 7 –101 108
Measurement Uncertainty
10
11
7
10
11
6
With Option 15
–82
–104
–99
–82
–104
–100
With Option 15 With Option 15
92
115
106
92
115
106
2 >42 >40 >42 ±0.005 ±0.030 >105
NOTES: 1. Specifications between the stated frequencies are to be linearly interpolated as typical values.
2. RMS values – compensated for loss in available source power from test port cable connected between Port 1 and Port 2.
3. The specifications for Test Port Characteristics apply when the VNA Universal Test Port Adapters are connected, with or without
phase equal insertables, to the test set ports and calibrated with the appropriate calibration kit at 23°C ±3°C using the SOLT
calibration method with a sliding load to achieve 12-term error correction. (90 min. warm-up time is recommended.)

8
37X69D (40 MHz – 40 GHz)
Connector Frequency1
(GHz)
Directivity
(dB)
Source Match
(dB)
Load Match
(dB)
Reflection Tracking
(dB)
Transmission Tracking
(dB)
Isolation
(dB)
K (2.92 mm)
0.04 >42 >40 >42 ±0.005 ±0.030 >105
20 >42 >38 >42 ±0.006 ±0.070 >110
Test Port Characteristics3
40>38 >34 >38 ±0.006 ±0.080 >100
Reflection Magnitude Uncertainty
37x69D/3652/Reflection Only
Device S11 (dB)
Uncertainty (dB)
10
1
0.1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz
2 GHz
20 GHz
40 GHz
Reflection Phase Uncertainty
37x69D/3652/Reflection Only
Device S11 (dB)
Uncertainty (Degrees)
100
10
1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz 
2 GHz
20 GHz
40 GHz
Transmission Magnitude Uncertainty
37x69D/3652/Transmission Only
Device S21 (dB)
Uncertainty (dB)
10
1
0.1
0.01
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
40 GHz
Transmission Phase Uncertainty
37x69D/3652/Transmission Only
Device S21 (dB)
Uncertainty (Degrees)
100
10
1
0.1
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
40 GHz
Reflection Measurements
Transmission Measurements
Model Frequency1
(GHz)
Port 1 Power, Typical (dBm) Noise Floor at Port 2 (dBm)2System Dynamic Range (dB)
37369D
0.04 10–85 95
2 8 –107 115
20 3 –103 106
40 2 –95 97
37269D
0.04 10–85 95
2 8 –107 115
202–104 106
402–97 99
The graphs give measurement uncertainty after 12-Term vector error correction. The errors are worst case contributions of residual directivity,
load and source match, frequency response, isolation, network analyzer dynamic accuracy, and connector repeatability.
Measurement Uncertainty
10
8
2
1
10
8
1
1
With Option 15
–85
–107
–102
–94
–85
–107
–103
–96
With Option 15
95
115
104
95
95
115
104
97
With Option 15
2 >42 >40 >42 ±0.005 ±0.030 >105
NOTES: 1. Specifications between the stated frequencies are to be linearly interpolated as typical values.
2. RMS values – compensated for loss in available source power from test port cable connected between Port 1 and Port 2.
3. The specifications for Test Port Characteristics apply when the VNA Universal Test Port Adapters are connected, with or without
phase equal insertables, to the test set ports and calibrated with the appropriate calibration kit at 23°C ±3°C using the SOLT
calibration method with a sliding load to achieve 12-term error correction. (90 min. warm-up time is recommended.)

9
37X77D (40 MHz – 50 GHz)
Connector Frequency1
(GHz)
Directivity
(dB)
Source Match
(dB)
Load Match
(dB)
Reflection Tracking
(dB)
Transmission Tracking
(dB)
Isolation
(dB)
V (1.85 mm)
0.04 >40 >36 >40 ±0.050 ±0.050 >115
20 >40 >36 >40 ±0.060 ±0.070 >110
40 >36 >32 >36 ±0.060 ±0.080 >100
50>34 >30 >34 ±0.080 ±0.100 >90
Test Port Characteristics3
Reflection Magnitude Uncertainty
37x77D/3654B/Reflection Only
Device S11 (dB)
Uncertainty (dB)
10
100
1
0.1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
Reflection Phase Uncertainty
37x77D/3654B/Reflection Only
Device S11 (dB)
Uncertainty (Degrees)
100
10
1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
Device S21 (dB)
Uncertainty (dB)
Transmission Magnitude Uncertainty
37x77D/3654B/Transmission Only
10
1
0.1
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
Transmission Phase Uncertainty
37x77D/3654B/Transmission Only
Device S21 (dB)
Uncertainty (Degrees)
100
10
1
0.1
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
Reflection Measurements
Transmission Measurements
Model Frequency1
(GHz)
Port 1 Power, Typical (dBm) Noise Floor at Port 2 (dBm)2System Dynamic Range (dB)
37377D
0.04 10–88 98
2 5 –110 115
20 2 –106 108
40 1 –98 99
50–1–94 93
37277D
0.04 10–88 98
2 5 –110 115
201–107 108
40 1 –100 101
50 –1 –96 95
The graphs give measurement uncertainty after 12-Term vector error correction. The errors are worst case contributions of residual directivity,
load and source match, frequency response, isolation, network analyzer dynamic accuracy, and connector repeatability.
Measurement Uncertainty
10
5
1
0
–3
10
5
0
0
–3
–88
–110
–105
–97
–93
–88
–110
–106
–99
–95
98
115
106
97
90
98
115
106
99
92
With Option 15 With Option 15 With Option 15
2 >40 >36 >40 ±0.050 ±0.050 >115
NOTES: 1. Specifications between the stated frequencies are to be linearly interpolated as typical values.
2. RMS values – compensated for loss in available source power from test port cable connected between Port 1 and Port 2.
3. The specifications for Test Port Characteristics apply when the VNA Universal Test Port Adapters are connected, with or without
phase equal insertables, to the test set ports and calibrated with the appropriate calibration kit at 23°C ±3°C using the SOLT
calibration method with a sliding load to achieve 12-term error correction. (90 min. warm-up time is recommended.)

10
37X97D (40 MHz – 65GHz)
Connector Frequency1Directivity
(dB)
Source Match
(dB)
Load Match
(dB)
Reflection Tracking
(dB)
Transmission Tracking
(dB)
Isolation
(dB)
V (1.85 mm)
0.04 >40 >36 >40 ±0.050 ±0.050 >115
20 >40 >36 >40 ±0.060 ±0.070 >110
40>36 >32 >36 ±0.060 ±0.080 >100
50 >34 >30 >34 ±0.080 ±0.100 >90
Test Port Characteristics3
65 >34 >28 >34 ±0.100 ±0.120 >80
Device S11 (dB)
Uncertainty (dB)
100
10
1
0.1
-40 -35 -30 -25 -20 -15 -10 -5 0
Reflection Magnitude Uncertainty
37x97D/3654B/Reflection Only
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
65 GHz
Reflection Phase Uncertainty
37x97D/3654B/Reflection Only
Device S11 (dB)
Uncertainty (Degrees)
100
10
1
-40 -35 -30 -25 -20 -15 -10 -5 0
0.04 GHz
2GHz
20 GHz
40 GHz
50 GHz
65 GHz
Transmission Magnitude Uncertainty
37x97D/3654B/Transmission Only
Device S21 (dB)
Uncertainty (dB)
10
1
0.1
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
65 GHz
Transmission Phase Uncertainty
37x97D/3654B/Transmission Only
Device S21 (dB)
Uncertainty (Degrees)
100
10
1
0.1
-70 -60 -50 -40 -30 -20 -10 0 10-80
0.04 GHz
2 GHz
20 GHz
40 GHz
50 GHz
65 GHz
Reflection Measurements
Transmission Measurements
Model Frequency1
(GHz)
Port 1 Power, Typical (dBm) Noise Floor at Port 2 (dBm)2System Dynamic Range (dB)
37397D
0.04 10–88 98
2 5 –110 115
202–106 108
40 1 –98 99
50 –1 –94 93
65 –2 –82 80
37297D
0.04 10–88 98
2 5 –110 115
201–107 108
401–100 101
50 –1 –96 95
65 –1 –84 83
Measurement Uncertainty
The graphs give measurement uncertainty after 12-Term vector error correction. The errors are worst case contributions of residual directivity,
load and source match, frequency response, isolation, network analyzer dynamic accuracy, and connector repeatability.
10
5
1
0
–3
–4
10
5
0
0
–3
–3
–88
–110
–105
–97
–93
–80
–88
–110
–106
–99
–95
–82
98
115
106
97
90
76
98
115
106
99
92
79
With Option 15 With Option 15 With Option 15
2 >40 >36 >40 ±0.050 ±0.050 >115
NOTES: 1. Specifications between the stated frequencies are to be linearly interpolated as typical values.
2. RMS values – compensated for loss in available source power from test port cable connected between Port 1 and Port 2.
3. The specifications for Test Port Characteristics apply when the VNA Universal Test Port Adapters are connected, with or without
phase equal insertables, to the test set ports and calibrated with the appropriate calibration kit at 23°C ±3°C using the SOLT
calibration method with a sliding load to achieve 12-term error correction. (90 min. warm-up time is recommended.)

11
Frequency Flatness (dB)
40 MHz – 13.5 GHz ±1.5
13.5 GHz – 20 GHz ±2.0
20 GHz – 40 GHz ±3.0
40 GHz – 65 GHz ±5.0
Power Flatness
Frequency Typical
(at default power)
40 MHz – 20 GHz <–40 dBc
20 GHz – 40 GHz <–20 dBc
40 GHz – 65 GHz <–20 dBc
Frequency Magnitude (dB) Phase (degrees)
40 MHz – 20 GHz <0.04 <0.5
20 GHz – 40 GHz <0.08 <1.0
40 GHz – 65 GHz <0.25 <2.5
Model Rated Power (dBm) Minimum Power (dBm) Resolution (dB)
37247D 5–20 0.05
37269D –7–27 0.05
37277D –7–27 0.05
37297D –7–19 0.05
37347D 5 –90 0.05
37369D –7 –97 0.05
37377D –7 –87 0.05
37397D –7 –79 0.05
Power Range
Signal Source Specifications
Resolution: 1 Hz
Frequency Stability:
Temperature: < 5x10–9 over 0° to 55°C range
Aging: <1 x 10–9/day
Source Power Level: The source power (dBm) may be set from the
front panel menu or via GPIB. In addition, on 37300D models, the
port 1 power may be attenuated in 10 dB steps, using the internal
70 dB (60 dB for 37377D and 37397D) step attenuator. Similarly,
high input signals into port 2, not exceeding 1 watt, can be
attenuated up to 40 dB, using the internal port 2 step attenuator.
Sweep Type: Linear, CW, Marker, or N-Discrete point sweep
Phase Noise:
>60 dBc/Hz at 10 kHz offset and 20 GHz center frequency
Spurious Response (Harmonics)
Spurious Response (Non-harmonics):
<–35 dBc at maximum rated power
Receiver Noise Floor and System Dynamic Range into Direct Access Ports (Option 15 only)
*RMS values measured at 10 Hz IF BW with NO averaging applied)
High Level Noise (pk – pk typical at 1 kHz I.F. BW)
Model Frequency
(GHz)
Typical Noise Floor*
(dBm)
Power into b1 or b2 Ports at
0.2 dB Compression (dBm)
Typical System
Dynamic Range (dB)
372XXD
0.04 –130 –12 >118
2 –123 –10 >113
20 –121 –7 >114
40 –111 –8 >103
50 –102 –3 >99
65 –92 –3 >89
373XXD
0.04 –130 –12 >118
2 –123 –9 >114
20 –120 –6 >114
40 –110 –6 >104
50 –100 0 >100
65 –90 0 >90

12
Source
Transfer
Switch
ALC
Port 1
ALC
Port 2
Sampler/Buffer
Amplifier
Coupler Coupler
Port 1 Port 2
a1 (Ra) a2 (Rb)
b1 (Ta) b2 (Tb)
Source
Transfer
Switch
ALC
Port 1
ALC
Port 2
Sampler/Buffer
Amplifier
Coupler Coupler
Port 1 Port 2
a1 (Ra) a2 (Rb)
b1 (Ta) b2 (Tb)
Input
Output
External
Source
Loop
Input
Output
External
Source
Loop
Port 2
b1 Out b1 In b2 In b2 Out
a1 Out
a1 In
a2 Out
a2 In
37200D Block Diagram
37200D Block Diagram with Option 15

Source
Transfer
Switch
ALC
Port 1
ALC
Port 2
Sampler/Buffer
Amplifier
Coupler Coupler
Port 1 Port 2
Port 2
a1 (Ra) a2 (Rb)
b1 (Ta) b2 (Tb)
Bias
Te e
Bias
Port 1 Bias
Te e
Bias
Port 2
Step
Attenuator
Step
Attenuator
Source
Transfer
Switch
ALC
Port 1
ALC
Port 2
Sampler/Buffer
Amplifier
Coupler Coupler
Port 1 Port 2
a1 (Ra) a2 (Rb)
b1 (Ta) b2 (Tb)
Input
Output
External
Source
Loop
Input
Output
External
Source
Loop
Port 2
b1 Out b1 In
a1 Out
a1 In
a2 Out
a2 In
Bias
T
ee
Bias
Port 1 Bias
T
ee
Bias
Port 2
Step
Attenuator
Step
Attenuator
b2 In b2 Out
37300D Block Diagram
37300D Block Diagram with Option 15
13
General
Power Requirements: 85-240 volts, 48-63 Hz, 540 VA maximum
Dimensions: 267 H x 432 W x 585 D mm
(10.5 H x 17 W x 23 D in.)
Weight: 27 kg (60 lb)-(2-man lift required)
Environmental: Conforms to MIL-PRF-28800F (Class 3)
Storage Temperature Range: –40°C to +75°C
Operating Temperature Range: 0°C to +50°C
Relative Humidity: 5% to 95% at +40°C
EMI: Meets the emissions and immunity requirements of
EN55011/1991 Class A/CISPR-11 Class A
EN50082-1/1993
IEC 801-2/1984 (4 kV CD, 8 kV AD)
IEC 1000-4-3/1995 (3 V/m, 80-1000 MHz)
IEC 801-4/1988 (500V SL, 1000V PL)
IEC 1000-4-5/1995 (2 kV L-E, 1 kV L-L)

14
Ordering Information
Models
37200D Economy Vector Network Analyzers
(see page 11 for block diagram)
The 37200D series is a high performance VNA designed to measure
S-parameters for mainly passive devices.
nn37247D, 40 MHz to 20 GHz
nn37269D, 40 MHz to 40 GHz
nn37277D, 40 MHz to 50 GHz
nn37297D, 40 MHz to 65 GHz
37300D Premium Vector Network Analyzers
(see page 12 for block diagram)
The 37300D series is a VNA optimized to measure S-parameters for both
active and passive devices. It offers the full suite of Lightning features,
including gain compression, power sweep capability, internal bias tees
and step attenuators, which are not available on the 37200D models.
nn37347D, 40 MHz to 20 GHz
nn37369D, 40 MHz to 40 GHz
nn37377D, 40 MHz to 50 GHz
nn37397D, 40 MHz to 65 GHz
System Options
nnOption 1, Rack Mount Kit with Slides
Rack mount kit containing a set of track slides (90° tilt capability),
mounting ears, and front panel handles to let the instrument be mounted
in a standard 19-inch equipment rack.
nnOption 1A, Rack Mount Kit with Handles Only (No Slides)
Rack mount kit containing a set of mounting ears and hardware to
permanently mount the instrument in a standard 19-inch equipment rack.
nnOption 2A, Time Domain Measurement Capability
Analyze impedance discontinuities as a function of time or distance with
Lightning’s high speed time domain capability.
nnOption 4A, External SCSI-2 Hard Disk Drive Compatibility
Provides SCSI-2 rear panel connector for connection of an external SCSI
Hard Disk. Removes internal Hard Disk Drive.
nnOption 7A, Replaces K test port connectors with GPC-7 connectors
nnOption 7N, Replaces K test port connectors with N(m) connectors
nnOption 7NF, Replaces K test port connectors with N(f) connectors
nnOption 7S, Replaces K test port connectors with 3.5mm-(m) connectors
nnOption 7K, Replaces V test port connectors with Universal K(m) connectors
nnOption 15, Flexible test set
Provides direct access to all four reference and test channels and adds
two auxiliary source loops for each port for connecting amplifiers etc.
nnOption 98, Z540/Guide 25 Calibration
nnOption 99, Premium Calibration
Calibration Kits
Using Anritsu’s precision calibration kits ensures accurate operation of your
37000D series VNA. These kits include precision components required to
perform full 12 term calibrations. The AutoCal®modules are automatic
precision calibrators that provide fast, repeatable, and accurate coaxial
calibrations up to 40 GHz. The AutoCal system includes the module, serial
cable, power supply, power cord, software disk, and operation manual.
Coaxial
Mechanical
nn3650 SMA/3.5 mm Calibration Kit
nn3650-1 SMA/3.5 mm Calibration Kit with Sliding Terminations
nn3651 GPC-7 Calibration Kit
nn3651-1 GPC-7 Calibration Kit with Sliding Terminations
nn3652 KConnector Calibration Kit
nn3652-1 K Connector Calibration Kit with Sliding Terminations
nn3653 Type N Calibration Kit
nn3654B V Connector Calibration Kit with Sliding Terminations
nn3656 W1 Connector Calibration/Verification Kit
AutoCal®
nn36581NNF N(m) to N(f), 40 MHz to 18 GHz
nn36581KKF K(m) to K(f), 40 MHz to 20 GHz
nn36582KKF K(m) to K(f), 40 MHz to 40 GHz
nn760-208 Transit Case for AutoCal
Waveguide
nn3655V WR-15 Waveguide Calibration Kit
nn3655V-1 WR-15 Waveguide Calibration Kit with sliding terminations
nn3655E WR-12 Waveguide Calibration Kit
nn3655E-1 WR-12 Waveguide Calibration Kit with sliding terminations
nn3655W WR-10 Waveguide Calibration Kit
nn3655W-1 WR-10 Waveguide Calibration Kit with sliding terminations
Verification Kits
Anritsu offers a complete line of coaxial verification kits to confirm your
system’s performance. All verification kits contain precision components with
characteristics traceable to the US National Institute of Standards and
Technology (NIST).
nn3663 Type N Verification Kit
nn3666 SMA/3.5 mm Verification Kit
nn3667 GPC-7 Verification Kit
nn3668 K Connector Verification Kit
nn3669BV Connector Verification Kit
Test Port Cable Converters
Test port cable converters are high precision, phase equal adapters,
which can be used with K Connector AutoCal to adapt to either SMA or
3.5 mm connectors. Each set consists of four adapters, two of each
sex that can be substituted for each other without affecting calibration
accuracy.
nn36583S Test Port Cable Converter Set, SMA type
nn36583L Test Port Cable Converter Set, 3.5 mm type
nn36583K Test Port Cable Converter Set, K type

15
Test Port Cables
Flexible, High Performance, Phase Stable
nn3671A50-1 K(f) - GPC-7 Cables, 63.5 cm (25 in.), one pair
nn3671A50-2 K(f) - GPC-7 Cable, 96.5 cm (38 in.)
nn3671S50-1 K(f) - 3.5 mm(m) Cables, 63.5 cm (25 in.), one pair
nn3671S50-2 K(f) - 3.5 mm(m) Cable, 96.5 cm (38 in.)
nn3671K50-1 K(f) - K(m) Cables, 63.5 cm (25 in.), one pair
nn3671K50-2 K(f) - K(m) Cable, 96.5 cm (38 in.)
nn3671K50-3 K(f) - K(f) Cable and K(f) - K(m) Cable, 63.5 cm (25 in.)
nn3671V50B-1 V(f) - V(m) Cable, 63.5 cm (25 in.), one pair
nn3671V50B-2 V(f) - V(m) Cable, 96.5 cm (38 in.)
Semi-Rigid, Economy
nn3670A50-1 GPC-7 Cable, 30.5 cm (12 in.)
nn3670A50-2 GPC-7 Cable, 61 cm (24 in.)
nn3670N50-1 N(f) - N(m) Cable, 30.5 cm (12 in.)
nn3670N50-2 N(f) - N(m) Cable, 61 cm (24 in.)
nn3670NN50-1 N(m) - N(m) Cable, 30.5 cm (12 in.)
nn3670NN50-2 N(m) - N(m) Cable, 61 cm (24 in.)
nn3670K50-1 K(f) - K(m) Cable, 30.5 cm (12 in.)
nn3670K50-2 K(f) - K(m) Cable, 61 cm (24 in.)
nn3670KF50-1 K(f) - K(f) Cable, 30.5 cm (12 in.)
nn3670KF50-2 K(f) - K(f) Cable, 61 cm (24 in.)
nn3670V50-1 V(f) - V(m) Cable, 30.5 cm (12 in.)
nn3670V50-2 V(f) - V(m) Cable, 61 cm (24 in.)
Precision Adapters
Coaxial
nnK220B Adapter, DC to 40 GHz, 50Ω, K(m) to K(m)
nnK222B Adapter, DC to 40 GHz, 50Ω, K(f) to K(f)
nnK224B Adapter, DC to 40 GHz, 50Ω, K(m) to K(f)
nn34VK50 Adapter, DC to 46 GHz, 50Ω, V(m) to K(m)
nn34VKF50 Adapter, DC to 46 GHz, 50Ω, V(m) to K(f)
nn34VFK50 Adapter, DC to 46 GHz, 50Ω, V(f) to K(m)
nn34VFKF50 Adapter, DC to 46 GHz, 50Ω, V(f) to K(f)
nn34VV50 Adapter, DC to 65 GHz, 50Ω, V(m) to V(m)
nn34VVF50 Adapter, DC to 65 GHz, 50Ω, V(m) to V(f)
nn34VFVF50 Adapter, DC to 65 GHz, 50Ω, V(f) to V(f)
Waveguide to Coax
nn35WR15V Waveguide to Coax Adapter, 50 to 65 GHz
(Usable to 67 GHz), WR15-V(m)
nn35WR15VF Waveguide to Coax Adapter, 50 to 65 GHz
(Usable to 67 GHz), WR15-V(f)
nn35WR19K, Waveguide to Coax Adapter, 40 to 50 GHz
(Usable to 54 GHz), WR19-K(m)
nn35WR19KF Waveguide to Coax Adapter, 40 to 50 GHz,
(Usable to 54 GHz), WR19-K(f)
nn35WR19V Waveguide to Coax Adapter, 40 to 60 GHz, WR19-V(m)
nn35WR19VF Waveguide to Coax Adapter, 40 to 60 GHz, WR19-V(f)
nn35WR22K Waveguide to Coax Adapter, 33 to 50 GHz, WR22-K(m)
nn35WR22KF Waveguide to Coax Adapter, 33 to 50 GHz, WR22-K(f)
nn35WR22V Waveguide to Coax Adapter, 33 to 50 GHz, WR22-V(m)
nn35WR22VF Waveguide to Coax Adapter, 33 to 50 GHz, WR22-V(f)
nn35WR28K Waveguide to Coax Adapter, 26.5 to 40 GHz, WR28-K(m)
nn35WR28KF Waveguide to Coax Adapter, 26.5 to 40 GHz, WR28-K(f)
nn35WR42K Waveguide to Coax Adapter, 18 to 26.5 GHz, WR42-K(m)
nn35WR42KF Waveguide to Coax Adapter, 18 to 26.5 GHz, WR42-K(f)
nn35WRD180K Waveguide to Coax Adapter, 18 to 40 GHz, WRD180
(Double Ridge Waveguide) to K(m)
nn35WRD180KF Waveguide to Coax Adapter, 18 to 40 GHz, WRD180
(Double Ridge Waveguide) to K(f)
Measurement Accessories
nnMN4765A O/E Calibration Module (40 MHz-65 GHz)
Unamplified photodiode module. Characterized to 65 GHz in
both magnitude and phase using a NIST traceable standard.
Used for electro-optical and opto-electrical measurements
with the VNA.
GPIB Cables
nn2100-5 GPIB Cable, 0.5 m (1.6 ft.)
nn2100-1 GPIB Cable, 1 m (3.3 ft.)
nn2100-2 GPIB Cable, 2 m (6.6 ft.)
nn2100-4 GPIB Cable, 4 m (13.2 ft.)
Test Port Converters
Test port converters allow you to change the connector type on the VNA test ports.
20 and 40 GHz Test Sets
nn34UA50 Universal Test Port Connector to GPC-7 Converter
nn34UK50 Universal Test Port Connector to K(m) Converter
nn34UN50 Universal Test Port Connector to N(m) Converter
nn34UNF50 Universal Test Port Connector to N(f) Converter
nn34US50 Universal Test Port Connector to 3.5 mm(m) Converter
50 and 65 GHz Test Sets
nn34YA50 Universal Test Port Connector to GPC-7 Converter
nn34YK50B Universal Test Port Connector to K(m) Converter
nn34YSS50 Universal Test Port Connector to SSMA(m) Converter
nn34YV50B Universal Test Port Connector to V(m) Converter
Universal Test Fixtures (UTF)
Anritsu’s UTF accommodates measurements in microstrip and coplanar
waveguide. An optional MMIC attachment and substrate launchers help you
test integrated circuits.
nn3680-20 20 GHz Universal Test Fixture
nn3680K 40 GHz Universal Test Fixture
nn3680V 60 GHz Universal Test Fixture
UTF Accessories
nn36801K 40 GHz Right-Angle Launcher
nn36801V 60 GHz Right-Angle Launcher
nn36802 MMIC Attachment
nn36803 Bias Probe
nn36805-10M Four 10 mil Substrate Launchers for the
36802 MMIC Attachment
nn36805-15M Four 15 mil Substrate Launchers for the
36802 MMIC Attachment
nn36805-25M Four 25 mil Substrate Launchers for the
36802 MMIC Attachment

Discover What’s Possible®
©Anritsu, September 2005. All trademarks are registered trademarks of their respective companies.
Data subject to change without notice. For most recent specifications, visit www.us.anritsu.com.
11410-00350, Rev. B
SALES CENTERS:
United States (800) ANRITSU Europe 44 (0) 1582-433433 Microwave Measurement Division
Canada (800) ANRITSU Japan 81 (46) 223-1111 490 Jarvis Drive, Morgan Hill, CA 95037-2809
South America 55 (21) 2527-6922 Asia-Pacific (65) 6282-2400 http://www.us.anritsu.com
UTF Calibration/Verification Kits
nn36804B-10M 10 mil Microstrip Calibration/Verification Kit, DC to 60 GHz
nn36804B-15M 15 mil Microstrip Calibration/Verification Kit, DC to 40 GHz
nn36804B-25M 25 mil Microstrip Calibration/Verification Kit, DC to 20 GHz
nn36804B-25C 25 mil Coplanar Waveguide (CPW) Calibration/Verification
Kit (Includes CPW Jaws for UTF), DC to 20 GHz
Fixed Attenuators
Precision
nn41KB-3 Fixed Attenuator, 3 dB, DC to 26.5 GHz, 50Ω, K(m) to K(f)
nn41KB-6 Fixed Attenuator, 6 dB, DC to 26.5 GHz, 50Ω, K(m) to K(f)
nn41KB-10 Fixed Attenuator, 10 dB, DC to 26.5 GHz, 50Ω , K(m) to K(f)
nn41KB-20 Fixed Attenuator, 20 dB, DC to 26.5 GHz, 50Ω, K(m) to K(f)
nn41KC-3 Fixed Attenuator, 3 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn41KC-6 Fixed Attenuator, 6 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn41KC-10 Fixed Attenuator, 10 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn41KC-20 Fixed Attenuator, 20 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn41V-3 Fixed Attenuator, 3 dB, DC to 60 GHz, 50Ω, V(m) to V(f)
nn41V-6 Fixed Attenuator, 6 dB, DC to 60 GHz, 50Ω, V(m) to V(f)
nn41V-10Fixed Attenuator, 10 dB, DC to 60 GHz, 50Ω, V(m) to V(f)
nn41V-20 Fixed Attenuator, 20 dB, DC to 60 GHz, 50Ω, V(m) to V(f)
Economy
nn43KB-3 Fixed Attenuator, 3 dB, DC to 26.5 GHz, 50Ω, K(m) to K(f)
nn43KB-6 Fixed Attenuator, 6 dB, DC to 26.5 GHz, 50Ω, K(m) to K(f)
nn43KB-10 Fixed Attenuator, 10 dB, DC to 26.5 GHz, 50Ω , K(m) to
K(f)
nn43KB-20 Fixed Attenuator, 20 dB, DC to 26.5 GHz, 50Ω, K(m) to K(f)
nn43KC-3 Fixed Attenuator, 3 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn43KC-6 Fixed Attenuator, 6 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn43KC-10 Fixed Attenuator, 10 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
nn43KC-20 Fixed Attenuator, 20 dB, DC to 40 GHz, 50Ω, K(m) to K(f)
Other Accessories and Tools
nn760-231 Lightning Transit Case
nn01-201 5/16” Torque Wrench, 8 ft-lbs, for SMA, 3.5 mm, and
KConnectors
nn01-202 Universal Test Port Connector Wrench
nn01-204 Anritsu Stainless Steel Connector Wrench
Printer
nn2000-1214 Desk Jet Printer (Includes Printer Cable, 2000-1216 Black
Print Cartridge, 2000-1215 Color Print Cartridge, and
US Power Cord)
nn2000-1228 Printer Extension Cable, 6 ft.
nn2000-1216 Black Print Cartridge
nn2000-1215 Color Print Cartridge
nn2000-1217 Rechargeable Battery for Desk Jet Printer
nn2000-663 Power Cord for Desk Jet Printer (Europe)
nn2000-664 Power Cord for Desk Jet Printer (Australia)
nn2000-1218 Power Cord for Desk Jet Printer (UK)
nn2000-666 Power Cord for Desk Jet Printer (Japan)
nn2000-667 Power Cord for Desk Jet Printer (South Africa)
Extended Service Options
On-Site Support Plans
nnOption ES31 3Year On-Site Repair
nnOption ES37 3Year On-Site Standard Calibration
nnOption ES38 3 Year On-Site Premium Calibration
Return-to-Service Center Support Plans
nnOption ES32 3 Year Return-to-Service Center Standard Calibration
nnOption ES34 3 Year Return-to-Service Center Premium Calibration
nnOption ES50 5 Year Return-to-Service Center Repair Only
nnOption ES52 5 Year Return-to-Service Center Standard Calibration
nnOption ES54 5 Year Return-to-Service Center Premium Calibration
nnOption ES55 5 Year Return-to-Service Center Repair plus
Standard Calibration
nnOption ES56 5 Year Return-to-Service Center Repair plus
Premium Calibration
Upgrade Options
nn37200D to a Higher Frequency 37200D
nn37200C to an Equivalent 37200D
nn37300D to a Higher Frequency 37300D
nn37300C to an Equivalent 37300D