KETEK SiPM User manual

Silicon Photomulplier
Evaluaon Kit
Quick Start Guide
SiPM
Eval Kit
www.ketek.net
[e-mail]
Hofer Str. 3
81737 Munich
Germany
phone [phone]
fax [phone]
KETEK GmbH
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]

Revision history:
Rev. 1.0, August 2016 - Inial release
This quick start guide covers the KETEK SiPM Evaluaon Kit only.
For other products please refer to www.ketek.net.
Table of Contents
1 Introducon..........................................................................................................................3
2 Setup Example......................................................................................................................3
3 Single Photon Measurements ..............................................................................................4
3.1 Dark Count Spectrum....................................................................................................................... 4
3.2 Single Photon Spectrum .................................................................................................................. 4
3.3 Using the Full Dynamic Range.......................................................................................................... 4
4 Measurements with Scinllator ...........................................................................................5
4.1 Energy Spectrum.............................................................................................................................. 5
4.2 Coincidence Time Resoluon........................................................................................................... 6
5 Appendix ..............................................................................................................................7
5.1 Variant for Opcal Bench Mount ..................................................................................................... 7
5.2 SiPM Bias Source.............................................................................................................................. 7
SiPM
Eval Kit
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]

08/2016 Rev. 1.0 Page 3
SiPM
Eval Kit
1 Introducon
The KETEK SiPM Evaluaon Kit allows an easy operaon and evaluaon of any KETEK SiPM. It can be used
for a wide range of applicaons which require e.g. single photon counng or measurements with scinlla-
tors. Two of the Evaluaon Kits can be mounted face to face for coincidence measurements.
The SiPM Evaluaon Kit is equipped with a preamplier and set up modularly so that the PCBs with the
presoldered SiPMs can be swapped to a dierent SiPM model.
For the operaon of the Evaluaon Kit only a +12 V DC power supply, a bias source and an oscilloscope are
required.
For full technical details of the SiPMs and the Evaluaon Kit, please refer to the KETEK SiPM Datasheet and
the KETEK SiPM Evaluaon Kit Datasheet.
Addionally, KETEK provides a SiPM Bias Source which can be directly connected to the Evaluaon Kit.
Please refer to the KETEK SiPM Bias Source Datasheet for further informaon.
2 Setup Example
• The signal and bias connectors are SMA type, the preamplier is equipped with solder pins. An over-
view is shown in gure 1. Signal lines need to be be terminated with 50 Ω.
• Preamplier power: +12V DC, 150 mA
• Bias: posive with max. + 40 V, typical current limit 2 mA
• Signal: connected to the preamplier
• Note: Signal corresponds to 90% of the SiPM signal
• Monitor: connected to an oscilloscope (50 Ω DC)
• Note: Monitor corresponds to 10% of the SiPM signal
• Amplied Signal: connected to an oscilloscope (50 Ω DC)
• Since the SiPM is a highly sensive photodetector, it must be operated under dark condions.
• Aer biasing the SiPM with e.g. 4 V above the breakdown voltage, dark counts should be visible at the
Amplied Signal path, using e.g. a mebase of 100 ns/div and a vercal resoluon of 20 mV/div. The
Monitor is used for higher photon uxes for which the preamplier saturates (e.g. when coupling a
bright scinllator).
• Note: The procedure may vary depending on the used readout electronics. For the examples shown here, a
digital oscilloscope is used.
Fig. 1 SiPM Evaluaon Kit Connecon Scheme
Amplied
Signal
+12 V DC GND
Preamplier PCB with SiPM
Bias
Monitor
Signal
Mounng Holes for
Coincidence Setup
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]

SiPM Evaluaon Kit Quick Start Guide
SiPM
Eval Kit
3 Single Photon Measurements
3.1 Dark Count Spectrum
• At the oscilloscope, set the trigger to the amplied SiPM signal at 0.5 pe amplitude (1 pe is the smallest
occurring pulse height, corresponding to a photoelectron pe).
• Note: This measurement has to be done under dark condions without illuminang the SiPM.
• Measure the area respecvely the charge of the signal at the posion of the trigger point in e.g. a 25 ns
wide gate. Best results are obtained by integrang the whole posive pulse area.
• Histogramming of the integrated charge is the resulng dark count spectrum.
• Note: E.g. crosstalk probability can be extracted from the dark count spectrum.
3.2 Single Photon Spectrum
• For this measurement, a pulsed light source is needed. This can be e.g. a pulsed LED or a pulsed laser.
Connect the electrical trigger output of the pulser to the oscilloscope and set the trigger to it.
• Note: In case a synchronized electrical trigger output is not provided by the pulser, a second SiPM Evaluaon
Kit can be used to generate the trigger signal. This second SiPM should be fully illuminated by the same opcal
pulse e.g. with an opcal beam splier. The other path for the single photon measurement can be aenuate
e.g. with neutral density lters.
• Measure the area respecvely the charge of the SiPM signal in e.g. a 25 ns wide gate. The histogram of
the measured charge is the single photon spectrum (cf. g. 2).
• Note: E.g. the relave gain, breakdown voltage and photo detecon eciency can be extracted.
3.3 Using the Full Dynamic Range
• The amplied SiPM signal output and the Monitor output can be connected and used simultaneously.
Typically for low light levels down to single photons, the measurement is done with the amplied out-
put. For higher light levels, the preamplier will saturate at 0.5 V signal amplitude. Aer this point, the
Monitor output is measured. This allows to exploit the the full dynamic range of the SiPM.
Fig. 2 Example of a Single Photon Spectrum
Measured with PM3350 at 4 V overvoltage
SiPM Signal
Histogram
Laser Trigger SiPM Signal
20 mV/divCounts [a.u.]
5 ns/div
Integrated Charge [nVs]
End Integraon Gate
Start Integraon Gate
pedestal
1 pe
2 pe
3 pe
4 pe
5 pe
6 pe
7 pe
8 pe
9 pe
10 pe
11 pe
12 pe
13 pe
14 pe
15 pe
16 pe
17 pe
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]

08/2016 Rev. 1.0 Page 5
SiPM
Eval Kit
4 Measurements with Scinllator
• With bright scinllators typically the charge released by the SiPM exceeds the dynamic range of the
preamplier. In this case, the Monitor output is used. The charge released by the SiPM is a measure
for the detected number of scinllang photons and thus a measure for the deposited energy in the
scinllator.
• Note: Alternavely the preamplier can be disconnected to connect the Signal output directly to the oscillo-
scope (50 Ω DC). This is an opon in case ming is not measured.
• For simultaneous measurements of ming and energy, the Amplied Signal is used for ming and the
Monitor output for the energy measurement.
• Note: Even though the preamplier may be in saturaon, ming can sll be measured at the steep rising edge
of the Amplied Signal close to the baseline.
• Usually the monitor output is used to measure the charge released by the SiPM corresponding to the
deposited energy in the scinllator.
• Evaluaon Kits can be ordered either with unmounted or premounted LYSO crystals on the SiPMs:
• For PM11 (1.2 x 1.2 mm² acve area) LYSO with 1.2 x 1.2 x 4.0 mm³
• For PM33 (3.0 x 3.0 mm² acve area) LYSO with 3.0 x 3.0 x 5.0 mm³
• For PM66 (6.0 x 6.0 mm² acve area) LYSO with 5.0 x 5.0 x 5.0 mm³
4.1 Energy Spectrum
• In analogy to secon 3.1, at the oscilloscope the trigger has to be set to the SiPM signal above the base-
line and the pulse area as a measure for the energy is histogrammed.
• Figure 3 shows an example energy spectrum of a ²²Na source measured with the Monitor output. The
used scinllator is LYSO with 3 x 3 x 5 mm³.
Fig. 3 Example of an Energy Spectrum
Measured with PM3350 at 4 V overvoltage, ²²Na source and LYSO 3.0 x 3.0 x 5.0 mm³
0
50
100
150
200
250
300
350
0 250 500 750 1000 1250
Energy [keV]
Counts [a.u.]
Energy Resoluon
11.9% FWHM at 511 keV
(corrected for saturaon)
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]

SiPM Evaluaon Kit Quick Start Guide
SiPM
Eval Kit
4.2 Coincidence Time Resoluon
• Two Evaluaon Kits are mounted facing each other
• Note: Two M6 mounng bolts are supplied for alignment when ordering two Evaluaon Kits, they are screwed
to one of the Evaluaon Kits, the second Evaluaon Kit is slid on the mounng bolts
• This example uses two PM3350, each equipped with 3.0 x 3.0 x 5.0 mm³ LYSO with a ²²Na source placed
exactly in between the SiPMs
• Note: ²²Na has two decay branches. It emits two 511 keV annihilaon γ rays in opposing direcons, originang
from a β+ decay. The second decay emits a single 1.27 MeV γ ray. Of interest here are the two 511 keV γ rays for
the coincidence measurement.
• Monitor outputs are connected to a coincidence logic, e.g. realized by the oscilloscope
• Lower threshold of the coincidence logic denes the lower energy cut-o. The thresholds for both
Monitor outputs are set to the minimum between Compton edge and 511 keV photopeak to lter
for the energy respecvely coincident events.
• The Coincidence Timing can then be measured by the me dierence of both Amplied Signals. The
output of the coincidence logic triggers the measurement of the mestamps of both Amplied Signals.
• Note: Best minig is achieved with a ming measurement close to the baseline. Typically with LYSO the op-
mum is around 2 - 3 pe.
• The me stamps of both Amplied Signals can be measured e.g. with a leading edge discriminator,
a constant fracon discriminator or using an oscilloscope.
• The me dierence between both me stamps is then histogrammed as shown in gure 4. The Coinci-
dence Time Resoluon is the FWHM of the Gaussian distribuon.
Fig. 4 Example of a CTR Histogram
Measured with two PM3350 at 4 V overvoltage, ²²Na source and LYSO 3.0 x 3.0 x 5.0 mm³
0
500
1000
1500
2000
2500
-1 -0.5 0 0.5 1
Time Dierence [ns]
Counts [a.u.]
CTR
180 ps FWHM
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]

08/2016 Rev. 1.0 Page 7
SiPM
Eval Kit
5 Appendix
5.1 Variant for Opcal Bench Mount
The SiPM Evaluaon Kit as also available in a dierent form factor for opcal bench mount including the
preamplier (cf. g. 5). The PCB with the SiPM is premounted to a Thorlabs® CP02/M Frame (SM1-Threaded
30 mm Cage Plate, 0.35” Thick, 2 Retaining Rings, M4 Tap). The SiPM is centered on the opcal axis. The
cables are MCX to SMA and are supplied together with the Evaluaon Kit.
5.2 SiPM Bias Source
As an addon to both Evaluaon Kits, a SiPM Bias Source is available (cf. g. 5). It oers an adjustable bias
voltage from 20 to 40 V with either posive or negave polarity. Current limit can be set to either 2 or 20
mA. For full technical specicaons please refer to the KETEK SiPM Bias Source Datasheet.
Fig. 5 SiPM Evaluaon Kit for Opcal Bench Mount with SiPM Bias Source
Preamplier
SiPM Bias Source SiPM premounted in optomechanic frame
www.aptechnologies.co.uk
A
P
Technologies Limited The Coach House Watery Lane Bath BA2 1RL
T: [phone] F: [phone] E: [e-mail]