Tektronix 308 User manual

lIIIIlI
n
COMMITTEDTO EXCELLENCE
WARNING
THE FOLLOWING SERVICING INSTRUCTIONS
ARE FOR USE BYQUALlFIEO PERSONNELONLY.
TO AVOIO PERSONAL INJURY, DO NOT
PER FORM ANY SERVICING OTHER THAN THAT
CONTAINED IN OPERATING INSTRUCTIONS
UNLESS YOU ARE QUALlFIEO TO DO SO.
INSTRUCTION MANUAL
Tektronix, Inc.
P.O.
Box 500
Beaverton,
Oregon 97077
070-2662-00
Serial Number _
First Printing aCT 1979

TABLE Fe
308 Service
TENTS
SECTION 1 INTRODUCTION AND
SPECIFICATION
INTRODUCTION
........
1-1
SPECIFICATION
........ 1-2
SECTION 2OPERATING
INSTRUCTIONS
INSTALLATION ......... 2-1
Power Requirements .... 2-1
Power Cord .......... 2-1
CONTROLS, CONNECTORS,
AND
INDICATORS ....... 2-2
Acquisition Controis .... 2-2
Instrument and Display SECTION 4
Mode Controis ........ 2-4
Entry
Controls ........ 2-5
Signature Controls .....
2-6
Input Controls and
Connectors .......... 2-6
OPERATORS
CHECKOUT
PROCEDURE ...........
2-9
I
ntroduction .......... 2-9
Diagnostics
.......... 2-9
OPERATORS
FAMILlARIZATION ....... 2-10
The
Controi Function
Access Chart
......... 2-10
The Next State Table
...
2-10
Basic Operating
Information .......... 2-10
Typical Application
..... 2-19
Page
LIST OF ILLUSTRATIONS ii
LIST OF TABLES iv
OPERATOR'S SAFETY SUMMARY v
SERVICE SAFETY SUMMARY vii
@
SECTION 3THEORY OF OPERATION Page
INTRODUCTION 3-1
SYSTEM ARCHITECTURE. 3-1
GENERAL SYSTEM
DESCRIPTION 3-4
DETAILED
CIRCUIT
DESCRIPTION 3-7
ParalIei Data
Input {i;> 3-7
Word Recognizer 03-11
ParalIei
Acquisition
Memory and Trigger
Delay <2> 3-15
Time Base 03-19
Serial/Signature
Input 0' 3-19
SignatureGenerator 03-22
Serial Data
Acquisition {f> 3-25
Keyboard 0and
MPU
-0 3-29
Display Controi 0 .. 3-31
CRT
~ 3-34
Power Supply
<{P 3-37
CALlBRATION
PERFORMANCE CHECK 4-3
Power-on Diagnostics .
.. 4-4
Operator-Initiated
Diagnostics ........
.. 4-4
Threshold Voltages
.... ,4-7
Minimum Externai Clock
Period ,4-8
Minimum Sample Interval
and
Minimum Data Pulse
Width 4-10
Word Recognizer
Filter.. 4-12
Minimum Word Recognizer
Pulse Width . . . . . . . .
.. 4-14
Trigger Delay Counter .. 4-16
Signature Acquisition .
.. 4-19
Serial Acquisition .... .. 4-20

308 Service
TABLE
F CONTENTS (cont)
SECTION 4CALlBRATION (cont) Page SECTION 5 MAINTENANCE (cont) Page
:%'
ADJUSTMENT PROCEDURE4-23 CORRECTIVE
Power Supplies
.......
4-24
MAINTENANCE .........
5-11
CRT Circuit ..........
4-25
Obtaining Replacement
Clock Delay ..........
4-26
Parts: ..............
5-11
Externai
Trigger Delay 4-29
Soldering Techniques ...
5-11
..
DC Balance and Bias ... 4-31 Removal and Replacement
Input Capacitance
4-32 I
nstructions ..........
5-12
.....
Signature Data Delay ... 4-35 Recalibration
.........
5-20
Instrument Repackaging .5-21
SECTION 5
MAINTENANCE
STATIC SENSITIVE
SECTION 6
OPTIONS
COMPONENTS .........
5-1
PREVENTIVE
SECTION 7
REPlACEABlE
MAINTENANCE .........
5-2
ElECTRICAl PARTS
Cleaning ............
5-2
Inspection ...........
5-2
SECTION 8DIAGRAMS
TROUBLESHOOTING
.... 5-4
SECTION 9
REPlACEABlE
Troubleshooting Aids ...
5-4
MECHANICAl PARTS
Troubleshooting
Equipment ...........
5-6 ACCESSORIES
Troubleshooti ng
Techniques .......... 5-9 CHANGE INFORMATION
LIST
F ILLUSTRATIONS
Figure
No. Page Figure
No. Page
308 dimensional drawing . . . . . . . . . .. 1-13
Location of the Ii ne-voltage i ndicator .. 2-1
Connecting the power cord. ...... .. 2-1
Optional power cords for the 308 "2-2
Acquisition controls and i ndicators 2-3
Instrument and display mode controls 2-4
Entry controls 2-5
Signature controls 2-6
Right side panel controls and connectors 2-7
1-1
2-1
2-2
2-3
2-4
2-5
2-6
2-7
2-8
ii
308 Data Analyzer
viii 2-9
2-10
2-11
2-12
2-13
2-14
2-15
2-16
2-17
Data
transition s, filter adjustment, and
triggering 2-8
Next state
table 2-11
Basic 308
acquisition and display system 2-11
Positive
logic with number assignments to
voltage inputs 2-12
ParalIei
acquisition menu 2-14
Serial
acquisition menu 2-14
Typical signature data sequences 2-18
Data
to signature sequence . . . . . . . .. 2-19
Test
schematic for the 308 application
example 2-20
@

LIST
F ILLUSTRATIONS (cont)
308 Service
Figure
No.
3-1
3-2
3-3
3-4
3-5
3-6
3-8
3-10
3-11
3-12
3-13
3-14
3-15
3-16
7
8
3-19
3-20
3-21
8-22
3-23
3-24
3-25
3-26
3-27
3-28
Example
of block-structured routines in
the 308 .
Memory allocation map for the 308 .
Simplified diagram of the 308 .
Simplified diagram of the paralIei data
input circuit .
Equivalent
circuit of one channel of the
P6451 data acquisition probe .
Simplified diagram for one channel of the
sample/latch stage .
Simplified timing diagram of sample/latch
stage .
Simplified diagram of the word recognizer
circuit .
Async filter timing diagram .
Simplified diagram of the paralIei
acquisition memory and trigger delay
circuits .
Simplified timing diagram for data
acquisition sequence .
Simplified diagram of the time base circuit
Simplified diagram of the serial/signature
input, signature generator, and serial data
acquisition circuits .
Simplified diagram of the variable delay
circuit and its timing .
Timing diagram of the gating logic stage
Simplified diagram of the CRC generator
stage .
Asynchronous mode instruction format
Synchronous mode instruction format
Status i nformation format .
Typical data
block for a USART .
USART
command instruction format ..
Simplified diagram of the MPU and key
board
circuits .
Simplified diagram of the display controi
circuit .
Timing diagram of the display timing
generator stages .
Simplified diagram of the CRT circuit ..
Simplified diagram and waveforms of the
horizontal sweep generator .
Simplified diagram of the power supply
circuit .
Representation
of inverter stage and
idealized waveforms .
Page
3-2
3-3
3-5
3-8
3-9
3-9
3-10
3-12
3-14
3-16
3-17
3-20
3-21
3-23
3-24
3-26
3-27
3-27
3-28
3-28
3-29
3-30
3-32
3-33
3-35
3-36
3-38
3-40
Figure
No.
4-1
4-2
4-3
4-4
4-5
4-6
4-7
4-8
4-9A
4-98
4-10
4-11
4-12
4-13
4-14
4-15
4-16
4-17
5-1
5-2
5-3
5-4
5-5
5-6
5-7
5-8
5-9
5-10
5-11
Page
Diagnostic 0keyboard code 4-5
Diagnostic test setup 4-6
Test
setupfor checking minimum external
clock period. ................. .. 4-8
Test waveform
for minimum externai
clock period. ................. .. 4-9
Test waveforms
for minimum sample
interval and
minimum data pulse width. 4-11
Test waveforms
for word recognizer filter 4-13
Test waveforms
for minimum word
recognizer pulse width .......... .. 4-15
Test setup
for trigger delay counter . .. 4-17
Adjusting pulse generators outputs for
trigger delay counter check 4-18
Adjusting pulse generators outputs for
checking clock qualifiers 4-18
Adjusting pulse generator outputs for
signature acquisition check. ...... .. 4-19
Test setup
for serial acquisition check 4-22
Test setup
for adjusting clock delay and
signature data delay ,4-27
Test waveforms
for clock delay
adjustment, externai trigger, and
signature data delay ............ .. 4-28
Test setup
for adjusting externai trigger
delay. . . . . . . . . . . . . . . . . . . . . . . .. 4-30
Test
setupfor adjusting input capacitance 4-33
Test waveforms
for adjusting input
capacitance .................. .. 4-34
Test setup
for adjusting signature data
delay. ...................... .. 4-36
Diagnostic 5reference pattern ..... .. 5-4
Circuit board locations .......... .. 5-5
Color code for resistors and capacitors 5-7
Semiconductor lead configurations ... 5-8
Multi-connector holder orientation . . .. 5-9
Keyboard removal 5-13
Side panel and
circuit board removal 5-14
308
top view 5-15
Power
switch actuation linkage 5-16
CRT
circuit board removal details 5-17
Pin
connector replacement . . . . . . . .. 5-21
REV AAPR 1980
iii

308 Service
LIST FILLUSTRATI S (cont)
Figure
No.
8-1
8-2
8-3
8-4
8-5
8-6
8-7
8-8
8-9
NOTE
The following illustrations appear
in the Diagrams
foldout section.
Semiconductor lead configurations
A1Data
input boardcomponentlocations
A2
Trigger board component locations
A3 Serial &signature data acquisition
board component locations
A5 Key board component locations
A4 MPU board component locations
A6
CRT board component locations
A7 Primary power
supply board
component locations
A8 Secondary power
supply board
component locations
Figure
No.
8-10
8-11
8-12
8-13
8-14
8-15
8-17
A1 Data input board test point and
adjustment locations
A2 Trigger board test point and
adjustment locations
A3 Serial &signature data
acquisition
board test point and adjustment locations
A4 MPU board test point and adjustment
locations
A6 CRT board test point and adjustment
locations
A8 Secondary power supply board test
point and adjustment locations
Controi Function Access Chart
LIST FTABLES NOTE
Table Table Thefollowingtables appear
in the Diagramsfoldout
No. Page No. section.
1-1
Electrical Characteristics ........... 1-2
8-1 Troubleshooting Tree to Signature List
1-2 Environmental Characteristics
....... 1-12 Cross-Reference
1-3 Physical Characteristics .............
""" ..
1-13 8-2 Device Error List
8-3 308 Power-Up Diagnostic Errors
2-1
Power-up Error Codes
.................. " .... 2-9 8-4 Signature List and Setup Conditions for
2-2 ParalIei and Serial Acquisition Parameters 2-13 ROM Check
2-3 Signature List
.................................... 2-21
8-5 Signature List and Setup
Conditions for
Kernel Check
3-1
Truth Table for Setting Parameters 8-6 Signature List and Setup
Conditions for
... 3-11
Chip Select Test
3-2
Truth Table for the Clock Gate ...... ".... 3-18 8-7 Signature List and Setup
Conditions for
3-3 Sample Interval Selection
.................... 3-19
Chip Select Test (Write Only)
3-4 Programmable Bit-Rate Generator 8-8 Signature List and Setup
Conditions for
Outputs .......................
3-25 Address
Counter
3-5 Data Bus Buffer Controi
...........
3-27 8-9 Signature List and Setup
Conditions for
3-6 USART Read/Write Contral
Logic
........ 3-29 Delay Counter
8-10 Signature List and Setup
Conditions for
4-1
Test Equipment Required ..........
4-1
Data Paths
4-2 Serial Acquisition Data
............
4-21
8-11 Signature List and Setup Conditions for
4-3 Power Supply Tolerances
..........
4-24 Display
Column Counter
8-12 Signature List and Setup Conditions for
Display Row-Line Counter
5-1
Relative Susceptibilityto StaticDischarge 8-13 Signature List and Setup
Conditions for
Damage .......................
5-1
Display Character Row Counter
5-2 Externai Inspection Checklist
..............
5-3 8-14 Baud Rate Test
One
5-3
Intemal Inspection Checklist .•...... 5-3 8-15 Baud Rate Test
Two
REV AAPR 1980

@
308 Service
OP RATORS SAFETY SUMMARY
The general safety i nformation in this part of the summary is for both operating and servici ng
personnel. Specific warnings and cautions will be found throughout the manual where they
apply and do not appear in this summary.
TERMS
In This Manual
CAUTION statements identify conditions or practices that could result in damage to the
equipment or other property.
WARNING statements identify conditions or practices that could result in personal injury or
loss of life.
As
Marked on Equipment
CAUTION indicates apersonal injury hazard not immediately accessible as one reads the
marking, or ahazard to propert y inciuding the equipment itself.
DANGER indicates apersonal injury hazard immediately accessibleas one reads the marking.
SYMBOLS
As Marked on Equipment
~ DANGER - High voltage.
@Protective ground (earth) terminal.
Power
Source
This product is intendedto operatefrom a power sourcethat will not apply morethan 250volts
rms between the supply conductors or between either supply conductor and ground. A
protective
ground connection by way of the grounding conductor in the power cord is
essentiai for safe operation.
v

308 Service
Grounding the Product
This product is grounded through the grounding conductor of the power cord. To avoid
electrical shock, piug the power cord i nto a properly wired receptacle betore connecti ng tothe
product input or output terminals. A protective ground connection by way of the grounding
conductor in the power cord is essentiai for sate operation.
Danger Arising From Loss of Ground
Upon loss ot the protective-ground connection, all accessible conductive parts (including
knobs and controls that may appear to be insulating) can render an electric shock.
Use
the Proper Power Cord
Use only the power cord and connector specified for your product.
Use
only a power cord that is in good condition.
For detailed information on power cords and connectors, see Section 2 ot the manual.
Refer
cord and connector changes to qualitied service personnel.
Use
the Proper Fuse
To avoid fire hazard, use only the fuse of correct type, voltage rating and current rating as
specified in the parts list for your product.
Reter tuse replacement to qualitied service personnel.
Do Not Operate in Explosive Atmospheres
To avoid explosion, do not operatethis product in an explosive atmosphere uniessit has been
specifically certitied for such operation.
Do Not Remove Covers or Panels
To avoid personal injury, do not remove the product covers or panels. Do not operate the
product without the covers and panels properly installed.
vi @

@
308 Service
SERVICING SAFETY SUMMARY
FOR QUAL/F/ED SERVICE PERSONNEL ONL y
Refer a/so to the preceding Operators Safety Summary.
Do Not Service Alone
Do not perform internai service or adjustment of this product uniessanother person capable of
rendering first aid and resuscitation is present.
Use Care When Servicing With Power On
Dangerous voltages exist at severalpoints in this product. To avoid personal injury, do not
touch exposed connections and components while power is on.
Disconnect power before removing protective panels, soldering, or replacing components.
Power Source
This product is intended to operatefrom a power sourcethat will not apply morethan 250volts
rms between the supply conductors or between either supply conductor and ground. A
protective ground connection by way of the grounding conductor in the power cord is
essentiai for safe operation.
vii

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2662-33
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The 308 Data Analyzer.
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viii
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Section 1-308 Service
INTR
UCTI SPE IFl ATI
INTRODUCTION
DESCRIPTION
The Sony/Tektronix 308 is akeyboard-controlled,
multifunctional, portable data analyzer, intended
to meet
the need for aportable and inexpensive service aid. The
308 can also be used
as adigital design instrument and as
o production-line checkout tool for in-circuit tests. Four
J1'lodes of operation provide the user with avariety of data-
analyzing methods. This instrument can be used
for
timing analysis of paralIei signals, stateanalysis of paralIei
signals, state analysis of serial transmissions
(including
data communications), and signature analysis.
ParalIei Timing Analyzer Function
When used as aParalIei Timing analyzer, the 308
provides an eight-channel input, a20 MHz clock speed,
and 252 bitsichannei
memory size. The eight-channel
paralIei
word recognizer triggers upon recognition of a
preset digital word. This
word-recognition capability is
expandable
to 24 channels with an accessory word
recognizer pro be. If no preset data is specified, the 308
software immediately generates
an internai trigger at the
start of an acquisition. The digital delay counts up
to
65,535 clocks. Data sampied before or after the delayed
trigger can be stored either at sample intervals ranging
from
50 ns to 200 ms or synchronously with an externai
clock. The latch input allows the 308 to capture glitches
narrower than the sample interval. Stored data is dis-
played on the
crt in digitized timing format representing
he high and low levels of the stored data, but not the
actual waveform.
@
ParalIei State Analyzer Function
The ParalIei State Analyzer function is identical to the
ParalIei Timing Analyzer
function except for the display.
Data is displayed in binary, octal, and hexadecimal
formats.
Serial State Analyzer Function
When operated as aSerial State analyzer, the 308
receives serial datawhich conforms
to EIASTD RS-232-C.
Data of five, six, seven,
or eight bits per character may be
inputted using either synchronous or asynchronous tim-
ing. Atwo-character word recognizer provides internai
triggering upon recognition of apreset digital word. The
digital delay counts up
to 65,535 words. Data sampied
before
or afterthe delayed trigger can be stored, using an
internai clock, at baud rates of
50 Hzto 9.6 kHz or usingan
externai clock. Stored data is displayed on the
crt readout
in binary, hexadecimal, and ASCII formats.
Signature Analyzer Function
The Signature Analyzer function provides data inputs,
start-stop gating inputs, and a
20 MHz clock input. A
sequence of data between the start and stop gates is
converted
to a four-digit word and displayed as a four-
digit signature.
1-1

Introduction and Specification-308 Service
SPECIFICATION
Tables 1-1,1-2, and 1-3 listthe electrical, environmen-
tal, and physical characteristics of the 308. The electrical
characteristics are valid for the 308 whenthe308 has been
adjusted as described in the Service Manual (Calibration)
at an am bient temperature between +20° to +30° C(+68°
to +86° F), is operating in an ambient temperature
between 0°
to +50°C (+32° to +122°F) and has warmed
up for at least 15 minutes.
Table 1-1
Electrical Characteristics
Characteristics Performance Requirements
PARALLEL TIMING ANALYZER FUNCTION
Supplemental Information
Inputs
to P6451 Data Acquisition
Probe (Clock and data)
Input Rand C1
MO ±5%. Paralleled by =5 pF.
Threshold Voltage at the
MONITOR Jack
VAR At least
-12 V to +12 V.
TTL
+1.4 V±0.2 V.
Logic Swing
Minimum
500 mV p-p +2% of threshold voltage. Centered on the threshold voltage.
Maximum
-40V.
Athreshold voltage of at least +10 V.
Nondestructive Input
Voltage (Maximum) At least
-40 V to +40 V.
Latch Mode Any transition that occurs between
two
sampleclocksis displayed as one clock-
period-wide data during the next clock
interval.
Width of Data Input (Minimum)
400mV Overdrive 10 ns.
250 mV Overdrive
15 ns.
550 mV Overdrive 5
ns.
Externai Clock Mode
Clock Period (Minimum) 50
ns.
Clock Pulse Width (Minimum)
High-Logic Level 24.5
ns.
Low-Logic Level 24.5
ns.
Data Setup Time (Minimum) 25 ns.
Data must precede clock transition by
this amount of time.
Data Hold Time (Minimum) O
ns.
7 ns when clock qualifier
is active.
1-2 REV AAPR 1980

Introduction and Specification-308 Service
Table 1-1 (cont)
Electrical Characteristics
Characteristics Performance Requirements
PARALLEL TIMING ANALYZER FUNCTION (cont)
Supplemental Information
Internai Clock Mode
Sample Interval (Minimum) 50
ns.
Data Pulse Width to ensure
sampling (Minimum) 1sample interval plus
10 ns.
Input Delay between Channels
Channels
0-7 15 ns or less.
Frequency of Crystal Oscillator 100 MHz ±0.005 MHz. 0.0025% from 0° C to 50° Cambient,
0.0015% at 25°C
±3° Cambient.
Aging: 5ppm per year.
Sample Intervals 50 ns
to 200 ms/sample in
1,2,5 sequence.
Clock Qualifier Function is enabled when Qualifier
S171 set to position T(Trigger
Input switch (S171) on side panel Qualifier function) at factory.
is set
to C.
Input Threshold +1.4 V ±0.2 V (TTL level).
Input Impedance
10 kO or morefor TTL signal.
Setup Time 5
ns or less.
Hold Time
30 ns or less.
Safe Peak Input Voltage +10 V to -5 V.
Memory Size
Acquisition 8 x
252 (bits).
Reference 8 x
252 (bits).
Trigger
Data Word Recognizer Programmable
to set 8bits of
recognition pattern.
Input 8-channel data input from P6451
Data Acquisition Pro be.
Asynchronous Mode Internai sample interval requires asyn-
chronous word recognition.
Input Pulse Width (Minimum) 20 ns for any single channel.
35 ns for any combination of
channels.
Filter Continuously variable
to at least Matchingcombinations of narrowerwidth
300
ns. than filter setting are not recognized.
REV AAPR 1980 1-3

Introduction and Specification-308 Service
Table 1-1
(cont)
Electrical Characteristics
Characteristics Performance Requirements
PARALLEL
TIMING ANALYZER FUNCTION (cont)
Supplementsl
Information
Trigger (cont)
Synchronous Mode Externai sample interval requires
synchronous word recognition.
Setup Time
35 ns.
Hold Time O ns.
With reference to seleeted (rising
or falling) el ock edge.
Externai Qualifier Programmable
to set 1-bit qualifier.
Input Threshold
+1.4 V ±0.2 V (TTL level).
Input Impedance 10 kO or more for TTL signal.
Asynchronous Mode
Pulse Width (Minimum)
20 ns for qualifier input only.
Synchronous Mode
Setup Time Ons
or less. With reference to seleeted (rising
or falling) clock edge.
Hold Time 40
ns or less.
Safe Peak
Input Voltage
+10 V to -5 V.
Externai Word Recognizer Programmable
to set 16-bit
(Optional P6406 Probe) recognition paUern.
Input Channels 16 channels of
input data from
P6406.
Input Threshold
+1.4 V ±0.2 V (TTL level).
Input Current
High-Logic Level 40
tJA maximum at +2.7 V.
Low-Logic Level
-400 tJA maximum at 0.4 V.
Safe Peak Input Voltage
+15 V to -1 Vpeak.
Asynchronous Mode
Pulse Width (Minimum)
20 ns for any si ngle channel.
45 ns for any combination of the 24
channel inputs from P6451 and
P6406.
Synchronous Mode
Setup Time 45
ns.
Hold Time O
ns. With reference to seleeted (rising
or falling)
clock edge.
1-4
@

Introduction and Specification-308 Service
Table 1-1 (conl)
Electrical Characteristics
PARALLEL
TIMING ANALYZER FUNCTION (cont)
Trigger
Output of Word Recognizer
Output Level TTL leve!. 0.5 V
or less for low-Ievel output;
2.4 V
or more for high-Ievel output.
Voltage (Maximum)
+6 Vpeak.
Current (Maximum)
High-Logic Level
-1 mA.
Low-Logic Level 2mA.
Typical Propagation Delay 60 ns.
(Probe
tip to word recognizer
output with filter set to minimum)
'\rigger Delay Programmable
to set the delay count.
Delay Count
Up to 65,535 count. Delayed by clock.
Data Position
PRE
Positions the Delayed Trigger at the
240th position
in the 252-byte
Data Memory.
POST Positions
the Delayed Trigger at the
13th position
in the 252-byte
Data Memory.
Full Valid Data Display/First Seleetable by internai jumper. Instrument is shipped in Full Valid Data
Trigger Mode Selection Mode. Under certain circumstances a
fraction of display is indicated as invalid
data
to indicate unusedstorage location.
Full Valid Data Display Produces afull valid data display.
First
Trigger Mode Accepts first
trigger after start of
adata acquisition.
START Controi Starts data acquisition when START
key is pressed in.
--
TOP Controi Stops data acquisition and switches
to display mode when STOP key is
pressed in.
RE-ST
ART Controi Repeats acquisition
if valid new Data
Memory matches data in Reference
Memory. If not equal, stops data
acquisition and switches
to display
mode.
@1-5

Introduction and Specification-308 Service
Table 1-1
(cont)
Electrical Characteristics
Characteristics Performance Requirements
PARALLEL
TIMING ANALYZER FUNCTION (cont)
Supplementailnformation
Display
Data Format
Timing Diagram.
Window Size
42,84, or 168 bitsichanneI.
Display Mode
MENU Displays all setting information
for
acquisition.
WINDOW
Window position and size are
displayed on screen.
CURSOR Displays position of cursor line
and word at cursor line.
PARALLEL STATE ANALYZER FUNCTION
Characteristics, Performance Requirements and Supplemental Information
for ParalIei State Analyzer Function are
identical
to the ParalIei Timing Function except for the Display format.
Display
Data Format Binary, octal, and hexadecimal.
Data Table Size
12 rows.
Display Mode
MENU Displays all setting information
for
acquisition.
CURSOR Displays the cursor position and
12 bytes of data beginning at the
cursor point and the cursor position.
SEARCH Displays data which matches search
word setting. Data is displayed on
top of the table in inverse video.
Programmable
to set asearch word
pattern.
COMPARE
Highlights data different from data
in Reference Memory. Data is
displayed in inverse video.
1-6 @

Introduction and Specification-308 Service
Table 1-1
(cont)
Electrical Characteristics
Characteristics Performance Requirements
SERIAL STATE ANALYZER FUNCTION
Supplementailnformation
Data Input (via P6107 Probe)
Input Rand C10 MO ±3%, paralleled
by approxi-
mately
13 pF at probe tip.
1MO paralleled
by 40 pF ±1 pF
at
bnc input connector.
Threshold Voltage
at
MONITOR Jack
VAR
-12 V to +12 V.
TTL
+1.4 V ±0.2 V.
Logic Swing
Minimum
500 mV p-p +2% of threshold voltage. Centered on the threshold voltage.
Maximum
±30 Vpeak.
Nondestructive Peak
Input
±500 Vat probe ti p.
Voltage
±250 Vat bnc input connector.
Externai
Clock and Trigger Input
(via P6451 Probe)
Clock
Input
Clock input from P6451.
Trigger Input
CH O input from P6451.
Input Rand C1MO ±5%, paralleled by about 5pF.
Threshold Voltage
at
MONITOR Jack
VAR
-12 V to +12 V.
Sets threshold voltage at OV for
measurement of RS-232-C Interface
signal.
TTL
+1.4 V ±0.2 V.
Logic Swing
Minimum
500 mV p-p +2% of threshold voltage. Centered on the threshold voltage.
Maximum Peak
Input Voltage
±30 V.
Nondestructive Input Voltage At least
-40 V to +40 V.
(Maximum)
Data Sampling Timing Synchronous and asynchronous.
Bits per Character
5, 6, 7, or 8.
Includes paritybit if parityis active.
@1-7

Introduction and Specification-308 Service
Table 1-1
(cont)
Electrical Characteristics
SERIAL STATE ANALYZER FUNCTION (cont)
Data Sampling Rates
Internai Clock
for
50,75,110,134.5,150,200,300,600,
Asynchronous Mode 1200,1800,2400,4800, and 9600
bits per second.
Accuracy
of Internai Clock ±0.02%.
Externai Clock
for
Up to 9600 bits per second.
Asynchronous Mode
Externai Clock
for
Up to 9600 bits per second.
Synchronous Mode
Input Logic Negative or positive.
ParityOdd, even,
or none.
Synchronizing Word Programmable
to require two equal The ASCII SYN word is
binary
(Synchronous Mode Only) words. If not programmed, defaults 00010110.
to ASCII SYN word.
Hunt Word (Synchronous Programmable
to require one word. In this particular case, xxxxxxxx means
Mode Only) If not programmed, defaults
to not used (normally xequals don't care).
xxxxxxxx.
Setup and Hold Time
for
Synchronous Mode
Setup Time 3JlS maximum
with respect to
external elock edge.
Hold Time 3JlS maximum
with respect to
externai clock edge.
Stop Bits (Asynchronous Mode Responds
to one or more stop bits.
Not adjustable.
Only)
Trigger
Data Word Recognizer Programmable
to require asequence
of two words (eharacters).
Externai Trigger Programmable
to require one bit.
Trigger Delay Programmable
to set delay eount.
Delay Count Up
to 65,635. Count delayed by word.
Data Position
PRE
Positions the Delayed Trigger at the
240th position in the 252-byte
Data Memory.
POST Positions the Delayed Trigger at
the
13th position in the 252-byte
Data Memory.
-,--~
1-8 @

Introduction and Specification-308 Service
Table 1-1
(cont)
Electrical Characteristics
SERIAL STATE ANALYZER FUNCTION (cont)
START Controi Switches
to acquisition mode and
prepares
to recognize acquisition
start signal when START key is
pressed.
Acquisition Start Signal
Asynchronous Mode Recognition
of start bit.
Synchronous Mode Recognition
of two equal SYNC
characters.
STOP Controi Stops data acquisition and switches
to display mode when STOP key is
pressed.
RE-START Controi Repeats acquisition if valid data in
Data
Memory matches data in
Reference Memory. If there is no
match, stops acquisition and display
mode is enabled.
Framing Error Detection When avalid stop bit is not detected, This allows acquiring
data acquisition is stopped and data from a
continuous
switched to display mode, uniess data stream
in asynchronous
fewer than 9bytes have been protocol.
received. In that case, acquisition
is restarted.
Display
Data Format Binary, hexadecimal, and ASCII.
Data Table Size 12 rows.
ParityError Parity
error is indicated beside If paritY is programmed.
ASCII character.
Framing Error (Asynchronous Framing
error point is marked with
Mode Only) IFESTI.
Mode
MENU Identical
to Parailei State Function.
EXTENDED MENU Identical
to ParalIei State Function. Additional programming capabilities are
provided
through the Extended Menu.
CURSOR Identical
to ParalIei State Function.
SEARCH Identical
to Parailei State Function.
COMPARE Identical
to ParalIei State Function.
@1-9

Introduction and Specification-308 Service
Table 1-1
(cont)
Electrical Characteristics
Characteristics Performance Requirements
SIGNATURE ANALYZER FUNCTION
Supplemental
Information
Data Input (via P6107 Probe)
Setup
Time
15 ns maximum. Data
to be valid at least 15 ns before
selected
dock edge.
Hold Time Ons. With reference
to selected (rising
or falling) clock edge.
Input Rand C10 MO ±3%, paralleled
by approxi-
mately 13 pF at probe tip.
1MO paralleled by
40 pF ±1 pF
at
bnc input connector.
Threshold Voltage at
MONITOR Jack
VAR
-12 V to +12 V.
TTL
+1.4 V to ±0.2 V.
Logic Swing
Minimum 500 mV
p-p +2% of threshold voltage. Centered on the threshold voltage.
Maximum
±30 Vpeak.
Nondestructive Peak
±500 Vat probe ti p.
Input Voltage
±250 Vat bnc input connector.
Clock
Input (via Clock Input Input
performance requirements
of
P6451 Probe) are same
as data input requirements
for ParalIei Timing Analyzer Function.
Clock Period (Minimum) 50 ns.
Clock Pulse Width (Minimum)
High-Logic Level 24.5
ns.
Low-Logic Level 24.5 ns.
1-10 @