Albedo Telecom AT-2048 Ether.Genius User manual

User’s Manual
AT-2048
E1 / Datacom Testing Guide
Ether.Genius

i
Copyright
The information contained in this document is the property of ALBEDO Telecom S.L.
and is supplied without liability for errors and omissions.
No part of this document may be reproduced or used except as authorised by contract
or other written permission from ALBEDO Telecom S.L. The copyright and all
restrictions on reproduction and use apply to all media in which this information may be
placed.
ALBEDO Telecom S.L. pursues a policy of continual product improvement and
reserves the right to alter without notice the specification, design, price or conditions of
supply of any product or service.
© ALBEDO Telecom S.L. 2013
All rights reserved
Issue 7, 10/13
For any query or requirement regarding the AT-2048 E1 / Datacom tester or the
Ether.Genius GbE / E1 / Datacom / Jitter & Wander tester, contact with ALBEDO
Telecom using the following contact details:
ALBEDO Telecom S.L.
C/ Joan d’Àustria 112
08018 Barcelona - Spain
E-mail: [e-mail]
Telephone: [phone]

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Table Of Contents
Chapter 1: Introduction ............................................................................................. 1
Important Notice ............................................................................................... 2
Warranty................................................................................................ 2
Battery Safety........................................................................................ 3
WEEE Notice ........................................................................................ 3
The Tester ........................................................................................................ 3
Test Connectors.................................................................................... 4
Platform Connectors ............................................................................. 5
The Graphical User Interface ........................................................................... 6
Running Tests .................................................................................................. 9
Upgrading the Unit............................................................................................ 9
Chapter 2: Connection to the Network .................................................................. 11
Setting the Operation Mode............................................................................ 11
Connecting the Tester to the DUT / SUT........................................................ 14
Configuring the Port A and Port B .................................................................. 17
Entering the Line Settings................................................................... 20
Testing with an External Timing Reference.................................................... 22
Configuring the Audio Output Source............................................................. 22
Configuring the Tone Generator..................................................................... 23
Using the Auto-configuration .......................................................................... 24
The Summary Panel....................................................................................... 24
Global Pass / Fail indication................................................................ 26
Chapter 3: Testing Physical Properties ................................................................. 27
Frequency and Level Measurements ............................................................. 27
Measuring Round-Trip Delay.......................................................................... 29
ITU-T G.711 Statistics .................................................................................... 32
Voice Frequency Measurements.................................................................... 34
Verifying Pulse Mask Compliance.................................................................. 35
Chapter 4: Jitter Generation and Analysis ............................................................ 39
Jitter Metrics and Measurement ..................................................................... 39
Unitary interval .................................................................................... 40
Jitter measurement filters.................................................................... 40
Measurement interval.......................................................................... 41
Jitter Analysis ................................................................................................ 42
Jitter Generation............................................................................................. 47
Chapter 5: Wander Generation and Analysis........................................................ 49
The Metrics of Wander ................................................................................... 49
TIE....................................................................................................... 49
MTIE.................................................................................................... 49

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TDEV ...................................................................................................50
Measuring Output Wander..............................................................................52
Wander Generation.........................................................................................55
Measuring MTIE/TDEV ...................................................................................56
Chapter 6: Tests over G.703 Signals ......................................................................61
The E1 Frame.................................................................................................61
Frame Alignment .................................................................................62
NFAS ...................................................................................................62
Multiframe CRC-4................................................................................62
Signalling Channel...............................................................................64
Generation and Analysis of Framed Signals...................................................64
Using the Multiplexer and the Demultiplexer .......................................68
FAS / NFAS Generation and Analysis ............................................................69
CAS Generation and Analysis ........................................................................70
Event Insertion and Analysis...........................................................................72
The LEDs Panel ..................................................................................73
Defect and Anomaly Counters.............................................................74
The Event Logger ................................................................................77
Event Insertion.....................................................................................79
Using the G.703 / E0 Port ...............................................................................81
Chapter 7: BER and Performance Tests ................................................................83
Setting up the Test Pattern and External Interface .........................................83
Computing the BER ........................................................................................86
Testing Performance.......................................................................................87
Setting the Performance Objectives ....................................................87
Running the Performance Test............................................................89
Chapter 8: Data Communications Testing.............................................................91
Emulating Datacom Endpoints........................................................................91
Using the Circuit Map ..........................................................................96
DTE and DCE Monitoring ...............................................................................98
Add / Drop of E1 Tributaries to Datacom Interfaces .......................................99
IEEE C37.94 Testing ....................................................................................100
Connection to the Network and Configuration...................................101
Measuring Frequency and Bit Rate ...................................................102
Running BER and Performance Tests ..............................................102
Event Generation and Analysis .........................................................103
Measuring Round Trip Delay.............................................................103
Chapter 9: Test Management ................................................................................105
Generating Reports.......................................................................................105
File Management ..........................................................................................107
Saving Configurations .......................................................................108
Renaming Files..................................................................................108
Deleting Files.....................................................................................108
Exporting Files to External Devices...................................................109
Importing Configurations ...................................................................109

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Using the Embedded Web Server..................................................... 110
Programming Tests ...................................................................................... 111
Using the System Menu ............................................................................... 113
Using the Network............................................................................. 114
Installing Software Options ............................................................... 117
Using the Remote Control ............................................................................ 118
Appendix A: Technical Specification................................................................... 121
E1 Generation / Analysis .............................................................................. 121
Connectors........................................................................................ 121
Line ................................................................................................... 121
Frame................................................................................................ 121
Test Patterns and Signals................................................................. 122
Analysis............................................................................................. 122
Event Insertion .................................................................................. 122
Jitter and Wander Generation Function ............................................ 122
Jitter Analysis Function ..................................................................... 123
Wander Analysis Function ................................................................ 123
Pulse Mask Analysis ......................................................................... 123
ITU-T G.703 / E0 Interface ........................................................................... 124
Connector.......................................................................................... 124
Features............................................................................................ 124
Data Communications .................................................................................. 124
Connectors........................................................................................ 124
Interfaces .......................................................................................... 124
Tests ................................................................................................. 124
Frame Relay Monitoring ............................................................................... 125
Interfaces .......................................................................................... 125
Settings ............................................................................................. 125
Events ............................................................................................... 125
Statistics............................................................................................ 125
IEEE C37.94................................................................................................. 125
Analogue Test .............................................................................................. 125
Synchronization............................................................................................ 126
General......................................................................................................... 126
Appendix B: Accessory Specification ................................................................. 127
AT-80 VF Adapter......................................................................................... 127
AT-81 Codirectional Adapter ........................................................................ 128
AT-84 Balanced RJ-48 to Unbalanced BNC E1 Balun................................. 128
AT-82 Contradirectional Clock Adapter ........................................................ 129
AT-85 Balanced RJ-48 to Balanced CF (Siemens) Adapter ........................ 129
AT-86 Stereo Audio Adapter ........................................................................ 130
AT-76 Balanced RJ-48 to Unbalanced BNC E1 Balun................................. 130
Appendix C: Connector Pinouts........................................................................... 133
Smart Serial DTE / DCE Connectors............................................................ 133
Audio Connector (2.5 mm Jack)................................................................... 134

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Printer / Console Connector (RJ-45).............................................................134
Balanced TX / RX Ports (RJ-45)...................................................................134
Appendix D: Datacom Cable Pinouts ...................................................................135
V.24 / V.28 Adaptor Cables ..........................................................................135
X.21 / V.11 Adaptor Cables ..........................................................................136
V.35 Adaptor Cables.....................................................................................136
V.36 Adaptor Cables.....................................................................................137
EIA-530 Adaptor Cables ...............................................................................137
EIA-530A Adaptor Cables.............................................................................138

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Chapter 1
Introduction
The ALBEDO Telecom AT-2048 / Ether.Genius is a handheld tester for generation and
analysis of 2048 kb/s TDM (E1) and data communications (V.11 / X.24, V.24, V.35,
V.36, EIA-530, EIA-530A) interfaces. The AT-2048 / Ether.Genius has an external DC
input but it also has internal batteries. This makes this tester suitable for field testing
applications.
Figure 1.1: AT-2048 Front view. The tester presents results by means a colour screen and
the LEDs. The configuration is performed through the keyboard.
Test Connector
AT-2048
E1 / Datacom Tester
LEDS F1 F2 F3 F4
EVENT
RUN
HOME
SUM
BACK
PWR
DC
ENTER
Panel
Platform Connector
Panel
Function
Buttons
On / Off
Button
Rubber Boot
(Left) Rubber Boot
(Right)
LEDs Panel
Shortcut
Port A
Summary LED
Port B
Summary LED
Colour
Screen
Event Insertion
Button
Start / Stop
Button
DC / Charge
Power
LED
LED
Cursors
Confirm
Button
Summary
Shortcut
Leave Screen
Button
Home Panel
Shortcut

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Ether.Genius includes the same E1 and datacom testing capabilities than the AT-2048
but it adds Gigabit Ethernet and IP testing capabilities. For more information about
Gigabit Ethernet / IP testing check the Ether.Genius Gigabit Ethernet Testing Guide.
Within your AT-2048 pack you will find the following items:
• One AT-2048 tester.
• One AC/DC adapter with a power cord specific for your country.
• One Carrying bag.
• Two coaxial cables with BNC male connectors (if ordered).
• One datacom cable set (if ordered).
• One audio headset (if ordered).
• One CD-ROM with user documentation.
• One printed copy of this user manual (if ordered).
Check with your distributor the availability of other optional items for your AT-2048 unit.
Check the Ether.Genius Gigabit Ethernet Testing Guide to know more about the items
and options included in your Ether.Genius pack.
1.1.Important Notice
Operation, manipulation and disposal warnings for your AT-2048 /Ether.Genius unit
are listed below.
1.1.1. Warranty
The ALBEDO Telecom AT-2048 /Ether.Genius is supplied with a warranty that
includes replacement of damaged or faulty components in the terms and period
described in the ordering information. This Warranty does not apply to:
1. Product subjected to abnormal use or conditions, accident, mishandling, neglect,
unauthorized alteration, misuse, improper installation or repair or improper stor-
age.
2. Product whose mechanical serial number or electronic serial number has been
removed, altered or defaced.
3. Damage from exposure to moisture, humidity, excessive temperatures or extreme
environmental conditions.
4. Damage resulting from connection to, or use of any accessory or other product not
approved or authorized by the Company.
5. Product damaged from external causes such as fire, flooding, dirt, sand, weather
conditions, battery leakage, blown fuse, theft or improper usage of any electrical
source.

Introduction
3
1.1.2. Battery Safety
The ALBEDO Telecom AT-2048 /Ether.Genius tester contains a built-in battery,
improper use of which may result in explosion. Do not heat, open, puncture, mutilate,
or dispose of the product in fire. Do not leave the device in direct sunlight for an
extended period of time, which could cause melting or battery damage.
1.1.3. WEEE Notice
This product must not be disposed of or dumped with other waste. You are liable to
dispose of all your electronic or electrical waste equipment by relocating over to the
specified collection point for recycling of such hazardous waste. For more information
about electronic and electrical waste equipment disposal, recovery, and collection
points, please contact your local city centre, waste disposal service, or manufacturer of
the equipment.
1.2.The Tester
Interaction with the AT-2048 is based on a high resolution colour screen, different kinds
of status LEDs, and a keyboard. These are the keyboard elements:
•Cursors: Enable navigation through the graphical user interface. Including menus,
keyboards and configuration lists. To leave a menu or configuration list, the left
arrow can be used. In menus, the right arrow enters in the lower level menu or list.
•ESC: Leaves the current panel (menus, lists, and special panels).
•ENTER: In menus, enters in the lower level menu or list. In a configuration list, it
selects the current item and leaves. In keyboards and some special panels, it
selects the current item without leaving.
•HOME: Shortcut to the Home panel. From any menu, list, or special panel, it
returns directly to Home.
•SUMMARY: Displays the Summary panel. If the Summary panel is already shown,
it returns to the previous panel.
•LEDS:Displays the LEDs panel. If the LEDs panel is already shown, it returns to
the previous panel.
• EVENT: Starts (and sometimes stops) the event insertion. The exact way this but-
ton works depends on the actual event insertion mode. For example, if single
event inversion is configured, each time you press EVENT a new event will be
inserted but if continuous insertion is the current configured value, you will need to
press EVENT during event insertion to stop the action.
• Start / Stop: This button starts / stops a new test. Some results (LEDs, some ana-
logue values) are available without an ongoing test. Most of the configuration is
blocked during a test execution.
•Function keys (F1, F2, F3, F4): These keys do not have a fixed purpose. Their
associated action depends on the panel being displayed.

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•On/Off key: If the tester is in off status, push to switch it on. If the tester is on, use
this key to switch it off (long push).
There are four LEDs (PWR, DC, Port A summary, Port B summary). Their description
is given below:
•PWR: Displays the current tester on / off status. The green colour is displayed
under normal operation conditions. Orange and red are shown to indicate a low
battery load.
•DC: This led is lit when the DC input is connected. Orange indicates a charging
batteries status and green means that the internal batteries are ready.
•Port A / Port B Summary: These LEDs provide a permanent indication of the cur-
rent input signal (or signals) status. The LEDs summarize the Port A and Port B
information given by the event LEDs. If any event LEDs for a test port is in ‘red’
status, the port summary led will be set to ‘red’. If any event LED is ‘orange’ but
there is no ‘red’ event, the summary led will be set to ‘orange. The ‘green’ colour is
used when no events (defects or anomalies) are found in the input signal. Finally,
the LED is switched off when the port is disabled.
Description of the Ether.Genius keyboard and LEDs is included in the Ether.Genius
Gigabit Ethernet Testing Guide.
1.2.1. Test Connectors
The AT-2048 is connected to the DUT / SUT through the test connector panel. Ports
and elements included in this panel are described in the following list:
•BNC Port A RX: Unbalanced (BNC) 75 input. This input is used to analyse
2048 kb/s signals.
Figure 1.2: AT-2048 test connector panel. Connection to the DUT / SUT is done in this
panel.
Datacom Port B Port A
Balanced TX/RX Balanced TX/RXRX TX
SD
DCE
DTE
Smart Serial
DTE
Smart Serial
DCE
SD Card
RJ-45
Port B TX/RX
RJ-45
Port A TX/RX
BNC
Port A RX
BNC
Port A TX

Introduction
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•BNC Port A TX: Unbalanced (BNC) 75 output. This output is used to generate
2048 kb/s signals.
•RJ-45 Port A TX/RX: Balanced (RJ-45) 120 input / output. This interface is used
to generate and analyse 2048 kb/s signals.
•RJ-45 Port B TX/RX: Balanced (RJ-45) 120 input / output. This interface is used
to generate and analyse 2048 kb/s signals but also as a codirectional interface or
clock input (2048 kb/s or 2048 kHz)
•Smart Serial DTE: Universal datacom interface for the DTE. It supports V.11 /
X.24, V.24, V.35, V.36, EIA-530, EIA-530A. This interface is disabled unless the
Datacom options are purchased for the tester.
•Smart Serial DCE: Universal datacom interface for the DCE. It supports V.11 /
X.24, V.24, V.35, V.36, EIA-530, EIA-530A. This interface is disabled unless the
Datacom options are purchased for the tester.
•SD Card: Slot for SD Cards. These cards can be use as external storage devices.
Description of the Ether.Genius test connector panel is included in the Ether.Genius
Gigabit Ethernet Testing Guide.
1.2.2. Platform Connectors
There is a connector panel specifically devoted to the platform ports. This panel
includes capabilities like remote control and external device connection. A more
detailed description is given below:
•Power connector: The input must be 12 V DC, 4 A. A suitable external AC/DC
adapter for your country is provided with the tester.
Figure 1.3: AT-2048 platform connector panel. This panel includes connectivity to USB
devices, Ethernet Interfaces, serial ports and more.
DC IN
15V Max.
Printer / Console Ethernet
Power
connector
RJ-45
printer or console
connector
RJ-45
general purpose
LAN connector
USB Slave USB Master
Analogue audio
input / output

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•RJ-45 printer or console: Console connector. This interface is prepared for con-
necting a serial printer.
•USB Slave: Use a USB cable with Slave type connector (Type B, Device) for this
port. Currently this port enables connection of a PC to the tester and access to the
internal tester file system.
•USB Master: Use a USB cable with a Master type connector (Type A, Host) for
this port. Currently this port is used for software upgrades and connection of exter-
nal storage devices.
•RJ-45 general purpose LAN connector: This is the platform Fast Ethernet connec-
tor (10/100BASE-T). It is used for remote management of the test unit.
•Analogue audio input / output: It is a 2.5 mm audio jack for connecting external
speakers and microphone.
Description of the Ether.Genius platform connector panel is included in the
Ether.Genius Gigabit Ethernet Testing Guide.
1.3.The Graphical User Interface
The AT-2048 /Ether.Genius graphical user interface is based in a 480 x 272 colour
screen and a set of keys attached to the front panel. Some of these keys have a
permanent purpose but the specific function for some other keys depend on the
context.
The keyboard and the screen allow the user setting configuration values, starting tests
and displaying results. The user is always aware of the current status of the received
Figure 1.4: AT-2048 / Ether.Genius, the Home panel.
Port A
Softleds
Port B
Softleds Date and Time Current Panel
Menu items

Introduction
7
signal through the Softleds shown on the left. The Softleds are always displayed and
they work even when there is no test running. On the top side of the screen there is a
header zone which contains information about the current tester status (date, time,
tests running, event insertion active) and an identifier for the currently displayed panel.
Most of the graphical user interface panels are menus containing a variable number of
items. All the menus are available from the Home panel. Users can press the HOME
button at any time to go to the Home panel. The Home panel contains the following
menu items:
•Test : Contains configuration items related with general test configuration like
delayed test settings and performance objectives.
•Setup: Provides access to test resource configuration. For the 2048 kb/s testing
application, the setup submenus contain configuration of Port A and Port B (or
Port C if you are using Ether.Genius) and also global timing or analogue audio
port setup.
•Results: This item enables the user to browse test results. Most of them are not
available if a measurement has not been previously started but there are some
exceptions to this rule (LEDs, some analogue results).
•File: File management menus. Includes configuration, result and report file man-
agement. Files can be deleted, copied, exported or imported.
•System: Provides platform management tools. For example language selection,
screensaver configuration and others.
There are two special panels as well. These are the Summary panel and the LEDs
panel. The Summary provides some details about the current configuration and results.
The LEDs panel gives extended the information about the received signal status
already given by the Softleds. Both the Summary panel and the LEDs panel can be
displayed at any moment by pressing the SUM and LEDS buttons.
Figure 1.5: AT-2048 / Ether.Genius test results represented as a counter list

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Menus and submenus are organized in a tree. The root of the tree is the Home panel
and the leaves are configuration or result panels. Results are usually presented in a list
or a table. If all results cannot be simultaneously displayed, then the user is allowed to
use the cursors up and down to browse the list.
Figure 1.6: Different kinds of configuration panels: (a) Selection list, (b) Alphanumeric
keyboard, (c) Numeric keyboard.
(a)
(b)
(c)

Introduction
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Configuration panels are usually selection lists. Sometimes you can select only one
simultaneous item in the list and sometimes selection of several items at the same time
is possible. Keyboards are available if selection through lists is not possible. There is
one keyboard for numeric settings and one for alphanumeric settings.
1.4.Running Tests
Most of the results provided by the AT-2048 / Ether.Genius are not available until you
start a test. This section provides a high level description of the procedure to follow to
configure your unit for E1 testing, start a test and review the results.
1. Configure the tester to send / receive signals in the right operation mode and con-
nect it to the DUT / SUT (See section 2.1).
2. If you need to generate or analyse framed signals configure the frame format and
content (See section 6.2).
3. If you are generating a test signal (out-of-service test) you probably may want to
configure the test pattern or signal format (See section 7.1).
Note: At this point, the summary LEDs for the test Ports should be in the ‘Green’
status.
Note: Generators are switched on when an operation mode that requires generat-
ing signals is configured (even if no test has been started).
4. If there is any objective for the test to be met, use the Performance objectives and
Line objectives placed in the Test menu to set it.
5. Program the test start time and duration with the help of the Program menu (within
Test ) or start the test immediately by pressing RUN.
Note: Most of the configuration is blocked when there is an ongoing test.
6. Wait for the test to finish or press RUN to finish immediately.
7. Check the test results in the Results menu.
Note: All test results are upgraded in real time as the test progresses. That means
that is not really necessary to wait for the test to finish to check current results.
To know how to configure the equipment for Datacom or G.703 / E0 testing, go to the
specific chapter or chapter section devoted about these topics. To know how to
configure Ether.Genius for testing Ethernet, check the Ether.Genius Gigabit Ethernet
Testing Guide.
1.5.Upgrading the Unit
The test unit software can be upgraded with the help of a USB memory stick. Before
proceeding with the upgrade copy the ALBEDO software package (albedo-at2048.pki
or albedo-ethgenius.pki) to the root directory in the memory stick. The file name of the
upgrade package must not be modified. The USB must have a FAT32 file system.
Once the USB memory stick is ready. Follow this procedure to install the new software:

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1. Switch the unit off
2. Press HOME and ENTER simultaneously and, without releasing the keys, press
the On / Off button.
3. Now, keeping all three the keys pressed, wait until you hear a beep. Then release
the keys.
The ALBEDO Software Installer is loaded and executed. An informative panel dis-
plays the AT-2048 / Ether.Genius software version number found in the storage
device.
4. Press ENTER to continue with the installation process.
5. Select Install or Upgrade. Install regenerates all the software in the unit even if it is
up to date. Upgrade regenerates only the software that has changed since the last
upgrade. Use Install (F2 key) if you need to recover the unit after operation failure
due to corrupted software. Use Upgrade (F1 key) otherwise.
6. Confirm your previous selection by pressing ENTER or cancel with ESC.
7. Wait for the installation process to finish.
Note: The full process may take a few minutes.
Note: Do no disconnect the unit or remove the USB memory stick during installa-
tion.
8. Press ENTER to close the Software Installer and finish the installation process.
The unit will be automatically restarted. The new software will be loaded.

11
Chapter 2
Connection to the Network
The AT-2048 is equipped with two 2048 kb/s ports. Port A is full featured 2048 kb/s
interface. On the other hand, Port B usage is configurable (2048 kb/s TX/RX,
codirectional, clock input). Ether.Genius is equipped with one full featured 2048 kb/s
port (Port C).
This chapter describes how to connect the tester to the DUT / SUT and how to
configure it to receive and send signals. The basic procedure to do that is:
1. Set the right operation mode (E1 monitor, E1 endpoint, E1 MUX test, E1 DEMUX
test, Datacom Endpoint, Datacom Monitor, Through,G.703 / E0, Analog). The
mode depends on the particular DUT / SUT to be verified and test to be done.
Sometimes it will be necessary to configure the input impedance through the
Port A / Port B (or Port C, if you are using Ether.Genius) Connection mode menus.
2. Connect the test cables to the DUT / SUT. Again, this depends on the DUT / SUT
and the test to be done.
3. Configure the Port A / Port B (or Port C, if you are using Ether.Genius). You will
not be able to see any information before you set the right line parameters within
the test ports.
2.1.Setting the Operation Mode
As 2048 kb/s interfaces, Port A and Port B are independent but they share the same
operation mode. That means that, for example, if you configure Port A to be a
monitoring port, then Port B will become a monitoring port as well. In any other sense,
Port A and Port B are allowed to have a different configuration. This, does not apply to
Ether.Genius as this tester has a single E1 testing port, the Port C.
To configure the AT-2048 / Ether.Genius operation mode follow these steps:
1. From the Home panel, go to Test,
The test configuration panel is displayed.
2. Select Mode to enter in the mode selection Menu

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3. Choose between: E1 monitor, E1 endpoint, E1 through, E1 MUX test, E1 DEMUX
test, Datacom endpoint, Datacom monitor, G.703 / E0 or Analog. Confirm by
pressing ENTER.
Note: Some other operation modes may be available depending on the hardware /
software options available in your test unit.
Table 2.1: E1 Operation Modes
Setting Description
E1 monitor When the tester is operating in E1 monitor mode, the trans-
mitter is switched off.
This mode is suitable for analysis of life signals without dis-
turbing the network. Applications requiring this mode are fre-
quency or level monitoring, alarm monitoring or some kinds
of in service performance monitoring.
Often, the E1 monitor mode has to be combined with high
impedance settings to avoid disturbing the line but configur-
ing monitor does not automatically enables high impedance
operation in the tester.
E1 endpoint If the tester is configured in E1 endpoint mode, then it emu-
lates an E1 network terminating point. In this mode the gen-
erator sends a test signal to the DUT / SUT and the analyser
receives a different signal (which may be the test signal once
it has been transmitted through the DUT / SUT.
This mode is used for transparency testing, BER testing and
out of service performance monitoring.
E1 MUX test The E1 mux operation mode is used when the DUT / SUT is
an E1 multiplexer or something that is equivalent to an E1
multiplexer.
The transmitter has the format of a tributary signal (either
analogue voice, a G.703 64 kb/s signal or a datacom signal)
and the receiver is configured for G.704 framed E1 signals.
In this mode only a single E1 time slot can be sent to the
internal pattern analyser. The secondary output is not availa-
ble.