MITECH MFD500B User manual

MITECH ULTRASONIC
FLAW DETECTOR
MFD500B
User’s Manual
MITECH CO.,LTD.
www.mitech-ndt.com

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CONTENTS
1 Introduction...........................................................................................................................................................3
1.1 Features of the Instrument...........................................................................................................................3
1.2 Specifications................................................................................................................................................. 4
1.3 Instrument Standard Configuration............................................................................................................ 5
2 Understanding the Keypad, Menu System and Display...........................................................................5
2.1 Structure Feature...........................................................................................................................................5
2.2 Screen Display............................................................................................................................................... 6
2.3 Keys and Rotary Knob Features.................................................................................................................8
2.4 Menus and Functions....................................................................................................................................9
2.5 Alarm Lights....................................................................................................................................................9
3 Initial Start-up....................................................................................................................................................... 9
3.1 Power Supply................................................................................................................................................. 9
3.2 Connecting a Probe.................................................................................................................................... 10
3.3 Starting the Instrument............................................................................................................................... 10
4.0 Operation......................................................................................................................................................... 10
4.1 Adjusting the Display Range..................................................................................................................... 10
4.2 Setting the Material Velocity...................................................................................................................... 10
4.3 Setting the Display Delay...........................................................................................................................10
4.4 Selecting the Probe Test Mode................................................................................................................. 11
4.5 Selecting a Rectification Mode.................................................................................................................. 11
4.6 Setting the A-Scan Reject Level............................................................................................................... 11
4.7 Setting the Gain........................................................................................................................................... 12
4.8 Changing the Gain-Adjustment Increment (DB STEP).........................................................................13
4.9 Auto Gain Feature....................................................................................................................................... 13
4.10 Configuring the Gates.............................................................................................................................. 13
4.11 Setting the Damping Level.......................................................................................................................14
4.12 Setting the Pulse Energy Level.............................................................................................................. 14
4.13 Setting the Pulse Width............................................................................................................................17
4.14 Adjusting the Pulse Repetition Frequency (PRF)................................................................................17
4.15 Specifying the Probe Frequency............................................................................................................ 17
4.16 Specifying the Piezo Crystal Size.......................................................................................................... 17
4.17 Setting the Probe X-Value....................................................................................................................... 17
4.18 Probe Delay Calibration........................................................................................................................... 17
4.19 Setting the Angle of Incidence................................................................................................................ 17
4.20 Magnifying the Contents of a Gate........................................................................................................ 18
4.21 Freezing the A-Scan Display...................................................................................................................18
4.22 Setting the Display Grid........................................................................................................................... 18
4.23 Selecting Units...........................................................................................................................................18

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4.24 Scale Setting..............................................................................................................................................18
4.25 Fill function................................................................................................................................................. 19
4.26 Setting the Display Brightness................................................................................................................19
4.27 Setting the Display Color......................................................................................................................... 19
4.28 Setting the A-Scan Color......................................................................................................................... 19
4.29 Setting the Menu Color............................................................................................................................ 20
4.30 Key Sound..................................................................................................................................................20
4.31 Date and Time Setting..............................................................................................................................20
4.32 Display the System Information..............................................................................................................21
4.33 Resetting the Instrument..........................................................................................................................21
4.34 Connecting to a Computer.......................................................................................................................21
5 Calibration and Measurement....................................................................................................................... 21
5.1 Calibration with Straight-and Angle-Beam Probes................................................................................ 21
5.2 Calibration with Dual-Element (TR) Probes............................................................................................23
5.3 Distance Amplitude Curve......................................................................................................................... 23
5.4 Measuring with DGS/AVG..........................................................................................................................26
5.5 Curved Surface Correction........................................................................................................................ 28
5.6 AWS D1.1 Weld Rating Feature............................................................................................................... 28
5.7 Crack Height Measuring Feature..............................................................................................................28
5.8 Envelope Function...................................................................................................................................... 29
5.9 Peak Hold Feature...................................................................................................................................... 29
5.10 B-Scan Feature......................................................................................................................................... 30
5.11 Weld Figure Feature................................................................................................................................. 30
5.12 Coded Echo color......................................................................................................................................30
5.13 Data Storage..............................................................................................................................................32
6 Maintenance and Care..................................................................................................................................... 33
6.1 Care of the Instrument................................................................................................................................33
6.2 Care of the Batteries...................................................................................................................................34
6.3 Maintenance.................................................................................................................................................34
6.4 Warranty........................................................................................................................................................34
6.5 Tips on Safety.............................................................................................................................................. 34
Appendix.................................................................................................................................................................35
Appendix A: Charging the Batteries................................................................................................................35
Appendix B: Menu Structure............................................................................................................................ 36
User's Note: ..........................................................................................................................................................36

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1 Introduction
The MFD500B is an advanced digital ultrasonic flaw detector featuring full digital TFT LCD and a host of
new features to meet challenging inspection requirements. Combined with powerful flaw detection and
measurement capabilities, extensive data storage, it is capable for transfer detailed inspection data to
the PC via its high-speed USB port.
The instrument incorporates many advanced signal processing features including a 10MHz RF
bandwidth to permit testing of thin materials, narrow band filters to improve signal to noise in high gain
applications, a spike pulse for applications required higher frequencies and a adjustable square wave
pulse to optimize penetration on thick or highly attenuating materials.
The instrument can be widely used in locating and sizing hidden cracks, voids, disbands and similar
discontinuities in welds, forgings, billets, axles, shafts, tanks, pressure vessels, turbines and structural
components.
1.1 Features of the Instrument
The instrument extends the performance and range of applications that are capable of being satisfied by
a portable instrument. The quality, portability, durability, and dependability that you have come to expect
from the popular Mitech MFD Series instruments remain.
1Leading Technology including full English menu, master-slave, shortcut key and rotary key
design, it is easy for operation.
2Adopted with full digital TFT LCD, clear screen brightness, capable for choosing the
background color, waveform color and menu color. Adjustable brightness freely, suitable for operating
under different environments.
3High performance security battery module is easy to assemble and disassemble, the instrument
can work continuously more than eight hours.
Display
Hi-resolution (320×240 pixels) full digital TFT LCD with adjustable brightness, it is capable of providing
high contrast viewing of the waveform from bright, direct sunlight to complete darkness.
The hi-resolution TFT LCD display with fast 60 Hz update gives an “analog look” to the waveform
providing detailed information that is critical in many applications including nuclear power plant
inspections.
Range
Up to 6000 mm in steel; range selectable in fixed steps or continuously variable, suitable for use on large
work pieces and in high-resolution measurements.
Pulse
Pulse Energy selectable among Low (300V), Medium (500V) and High (700V)
Pulse Repetition Frequency adjustable from 10 Hz to 1 KHz in 1 Hz increments
Damping selectable among 100Ω, 200Ω and 400Ω for optimum probe performance
Test Modes including Straight, Angle, Dual and Thru-transmission
Receiver
Sampling：10 digits AD Converter at the sampling speed of 160 MHz
Rectification：Positive Halfwave, Negative Halfwave, Fullwave and RF
Analog Bandwidth: 0.5MHz to 15MHz capability with selectable frequency ranges (automatically set by
the instrument) to match probe for optimum performance.
Gain：0 dB to 110 dB adjustable in selectable steps 0.1 dB, 2 dB, 6 dB, and locked
Gates
Two fully independent gates offer a range of measurement options for signal height or distance using
peak triggering.
The echo-to-echo mode allows accurate gate positioning for signals which are extremely close together.
Gate Start: Variable over entire displayed range
Gate Width: Variable from Gate Start to end of displayed range
Gate Height: Variable from 0 to 99% Full Screen Height
Alarms: Threshold positive/negative

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Memory
Memory of 100 channel files to store calibration set-ups
Memory of 1000 wave files to store A-Scan patterns and instrument settings.
All the files can be stored, recalled and cleared.
Video Recorder
Screen scenes can be captured as movie files. About 2 minutes movie can be saved to the inside
memory. They can be re-played using the instrument or the PC software delivered with the instrument.
Video Recorder is useful in many situations, convenient for those who want to analyze the probing
activities later.
Functions
Semiautomatic two point calibration: Automated calibration of transducer zero offset and/or material
velocity
Flaw Locating：Live display Sound-path, Projection (surface distance), Depth, Amplitude,
Flaw sizing: Automatic flaw sizing using AVG/AVG or DAC, speeds reporting of defect acceptance
or rejection.
Digital Readout and Trig. Function: Thickness/Depth can be displayed in digital readout when using
a normal probe. Sound-path, Surface Distance and Depth are directly displayed when using angle
probe.
Both the DAC and the AVG method of amplitude evaluation are available.
Curved Surface Correction Feature
Crack Height Measure Function
Weld Figure Feature
Magnify Gate：spreading of the gate range over the entire screen width
Video Recording and Play
Auto-gain Function
Envelope: Simultaneous display of live A-scan at 60 Hz update rate and envelope of A-scan display
Peak Hold: Compare frozen peak waveform to live A-Scans to easily interpret test results.
A Scan Freeze：Display freeze holds waveform and sound path data
B Scan display feature
AWS D1.1 Feature
Real Time Clock
The instrument clock keeps running tracking the time.
Communication
High Speed USB2.0 Port
The DataPro software helps manage and format stored inspection data for high-speed transfer to the PC.
Data can be printed or easily copied and pasted into word processing files and spreadsheets for further
reporting needs. New features include live screen capture mode and database tracking.
Battery
Internal rechargeable Li-ion battery pack rated 7.2V at 8800 mAh
8 hours nominal operating time depending on display brightness
8-10 hours typical recharge time
Knob
Operating adjustments are easily and quickly made using the rotary knob.
1.2 Specifications
Range: 0 to 9999mm, at steel velocity
Material Velocity: 300 to 15000m/s
Display Delay: -20 to 3400 µs
Probe Delay/Zero Offset : 0 to 99.99µs
Sensitivity Leavings:>60dB (flat-bottomed deep hole 200mmФ2)
resolution :>40dB (5P14)
Noise Level: ≤ 8%
Test Modes: straight ,angle, dual element and thru-transmission

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Pulse Repetition Frequency ranges from 10 Hz to 1000 Hz
Pulse Energy: Low (300V), Medium (500V) and High (700V) spike pulse.
Damping: 100Ω, 200Ω and 400Ω
Bandwidth (amplifier bandpass ): 0.5 to 15MHz
Gate Monitors: Two independent gates controllable over entire sweep range
Rectification: Positive half wave, negative half wave, full wave, RF
System Linear Error: Horizontal: +/-0.1% FSW, Vertical: 0.25% FSH, Amplifier Accuracy +/-1 dB.
Reject (suppression): 0 to 80% full screen height
Units: Inch or millimeter
Transducer Connections: BNC or LEMO
Power Requirements: AC Mains 100-240 VAC, 50-60 Hz
Overall Dimensions:263H×170W×61D mm
Relative Humidity:(20 ~ 95)% RH
Power Supply:DC 9V
Operating Temperature: -10℃to 50℃
Storage Temperature: -30℃to 50℃
1.3 Instrument Standard Configuration
No.
Item
Qty
Remarks
Standard
config.
1
Main unit
1
with full digital TFT LCD Display
2
Straight Beam Probe
1
4 MHz, Φ10
3
Angle Beam Probe
1
4 MHz, 8 mm×9 mm, 60°
4
Probe Cable
1
Q9-C5，or optional C9- C5
5
Battery Module
1
8.8 amp hour (MB-02)
6
Power Adapter
1
7
Supporting pillar
1
8
Attached files
1
9
Datapro Software
1
10
USB Cable
1
11
Power Cable
1
12
ABS Case
1
Optional
config.
1
Protective Cover for Main Unit
2
Dual-crystal Straight Probe
2 Understanding the Keypad, Menu System and Display
2.1 Structure Feature
The right figure gives an overview
of the instrument system.
1、The Main Unit
2、Probe (Transducer)

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The Main Unit
1.Belt 2.LCD Display 3.LOGO 4. Hooks 5. Menu Keys
6. Alarm LED 7. Power LED 8. Keypad 9. Rotary Knob
10. Product Label 11.Support Pillar Screw 12. Battery Case
13. Power adapter port 14. Battery Switch 15. USB Socket
16., Probe Cable Port (Transmit) 17. Probe Cable Port (Receive)
2.2 Screen Display
The instrument displays are designed to be easy to interpret.
The Instrument has a
digital screen for the
display of A-Scan.
The status line below
the wave display shows
values of range settings
and measured values.
On the first status line
Echo height is displayed as: 24.5%. It means that the peak echo height inside the current selected
gate is 24.5% FSH (Full Screen Height of the wave area).
Flaw size value means ERS (Equivalent Reflector Size) of the reflector signal inside the current
selected gate. It is displayed after the AVG curve is switched on. When the DAC curve is on, this
value will be displayed as the dB offset of the peak echo inside the current selected gate to the
reference DAC curve (DAC→OFFSET→SIZE REF).
The icon ‘ ’ indicates that the horizontal scale is displayed as sound path (S-PATH). It can be
changed to ‘ ’ (Projection value) or ‘ ’ (Depth) by simply pressing repeatedly.

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On the second status line, it shows the channel file name, the beam angle and the measured value of
the peak echo ( : Sound path. : Projection. :Depth) inside the current selected gate.
“A 61.3” means gate mode is single; current selected gate is gate A; and peak echo position: sound
path 61.3 mm.
“AB 24.0” means Echo-Echo mode of the gates; selected gate is gate A; sound path: 24.0 mm.
The names of the menus or submenus
are displayed at the bottom of the screen.
The selected menu or submenu is
highlighted.
Indicated at the right of the display, next
to the A-Scan, are the functions of the
corresponding menu.
The status area at the bottom-right corner
shows the system status. The following
status will be showed:
: Indicates the battery capacity
: Straight beam probe
: Angle beam probe
: Dual element probe
: Through-transmit mode
: Envelope function on
: Peak hold function on
: USB online; : A-Scan freezed

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The status area at the top-right corner
indicated shows the system gain and the
sound velocity.
2.3 Keys and Rotary Knob Features
To access any function:
Press one of the five menu keys (F1~F5) to select a menu. The menus across the
bottom of the display will immediately be replaced with the submenus contained in the
selected menu
Press a menu key (F1~F5) again to select the submenu containing the desired function.
Press and to move the cursor to select the desired function.
Change the value listed in the function box with the rotary knob. Some values can also
be adjusted with repeatedly pressing the knob.
Special keys such as Gain, Gate, Range, Probe Zero-Offset Calibration, Angle Calibration,
Freeze, Save Waveform, Auto-Gain, Envelop, Peak Hold and etc. are grouped together for
easy thumb control. This design allows direct access to important instrument set-up
parameters and provides easy and fast operating in difficult inspection environments
Functions of the keys:
Home key immediately returns the instrument to the main screen (full screen)
Freeze key freezes the A-Scan
Magnify key expands the gate range to full screen
For turning the instrument On/Off
Db-Step key selects the gain submenus or switch the db step
A / B
Gate key - Gate functions selecting gate functions and Gate A/B switch
Range key - Range function selecting
Probe-Delay key – Probe Delay calibration
Probe-Angle key selects the angle calibration functions
Save key performs a data-storage of the A-Scan pattern
G A I N
A U T O
Auto-Gain key starts or stops the Auto-Gain function
L O P E
E N V E
Envelope key turns the Envelope function on and off
The instrument is designed to
give the user quick access to all
of the instrument’s functions.
Its easy-to-use menu system
allows any function to be
accessed with no more than
three key presses.
The instrument is designed to
give the user quick access to all
of the instrument’s functions.
Its easy-to-use menu system
allows any function to be
accessed with no more than
three key presses.

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P E A K
H O L D
Peak-Hold key turns the Peak-Hold function on and off.
V I D E O
Video key starts or stops recording a segment of the display
D A C
A V G
DAC-AVG key selects the menus of DAC/AVG
Up Arrow key – Move the cursor up to select the desired function
Down Arrow key – Move the cursor down to the desired function
searches next echo towards left, or move the cursor to left when inputting digit numbers.
searches next echo towards right, or move the cursor to right when inputting digit numbers.
confirms or switches current selection
Rotary knob makes it convenient for handling device parameters and functions. It supports three
operations: turn clockwise, turn counter-clockwise and single press.
Turn clockwise: increase the selected parameter, or change the selection.
Turn counter-clockwise: decrease the selected parameter, or change the item selection.
Single press: changes mode between coarse and fine parameter adjustments or changes item selection.
2.4 Menus and Functions
The instrument menu system consists of several menus, submenus, and functions. It allows the operator
to select and adjust various features and instrument settings.
Available menus are accessed via the Home Menu. Note that the menus visible on your particular
instrument depend on which options are installed.
Each menu contains several submenus.
Menus and submenus are selected by pressing the key below the desired item (F1 to F5).
When a submenu is selected, the functions contained in that submenu are listed in the Function Bar
down the right-hand side of the display screen.
Functions are then selected by pressing and .
Turning the Function Knob will change the value shown in the selected function’s box.
Note that some functions, like RANGE, have both coarse and fine adjustment modes. There are three
steps in the fine adjustment mode. Coarse and fine modes are selected by pressing the knob more than
once. An icon of “ ” will appear on the left of the function name when the function is in fine adjustment
mode. When the function is in coarse adjustment mode, turning the function knob will produce large
changes in the selected function’s value. When the function is in fine adjustment mode, rotating the
function knob will change the value by smaller amounts.
2.5 Alarm Lights
Two alarm lights appear at the top-right corner front of the instrument’s keypad. One alarm light is
marked as ALRM, which is assigned to the gate alarm. When a gate alarm is triggered, this light will
illuminate. The other light is marked as PWR indicating power and battery status.
Status
ALRM LED
PWR LED
Gate alarm
Red on
×
Battery charging
×
Flash red/green
Battery charge completed with
external power connected
×
Green on
External power connected
No battery installed
×
Green on
No external power
×
off
3 Initial Start-up
3.1 Power Supply
The instrument can be operated with an external power adapter or with batteries.
You can connect the instrument to the mains supply system even if it carries batteries. A discharged
battery is charged in this case, viz. parallel to the instrument operation.
Operation Using the Power Supply Unit

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Connect the instrument to the mains socket-outlet using the power supply unit. The plug receptacle is at
the top left of the instrument. Push the plug of the power supply unit into the plug receptacle until it snaps
into place with a clearly audible click. The PWR LED on the keypad of the instrument will light in green
color if the connection is properly aligned
Operation Using Batteries
Use a lithium-ion battery pack provided with the instrument for the battery operation.
The battery compartment is situated at the instrument back. The cover is fastened with 4 screws To
insert the battery pack
Loosen the four screws of the battery cover.
Lift the cover off upward.
Insert the battery into the battery compartment.
Close the battery compartment and fasten the screws.
Turn on the instrument to make sure the battery is installed correctly and firmly.
Note:
The battery switch on the top of the instrument must be set to ON when operating with the battery
pack or charging it.
When not using the instrument, set the switch to OFF to save power.
3.2 Connecting a Probe
To prepare the instrument for operation, you have to connect a probe to it. The instrument is available
with the probe connectors BNC (LEMO connectors are optional).
When connecting a probe to the instrument, it’s not only important that the probe’s physical connection
be properly made. It’s also important that the instrument is properly configured to work with the installed
probe. The Instrument will operate with one or two single-element probes or with a dual-element probe.
To install a single-element probe, connect the probe cable to either of the two ports on the front of the
instrument. When two probes or a dual-element probe is connected to the instrument, the “Receive”
probe connector should be installed in the right port and the ‘Transmit’ probe connector in the left port.
3.3 Starting the Instrument
To start the instrument, press the switch-on key . If it operates on the internal battery pack, make sure
to set the battery switch to ON position before starting.
The start display of the instrument appears; here you will also see the current software version and the
serial number of the instrument. The instrument carries out a self-check and then switches over to
stand-by mode.
The settings of all function values are the same as before switching-off of the instrument.
The instrument will shut off automatically when the battery capacity level is too low.
4 Operation
4.1 Adjusting the Display Range
The function group BASE enables you to make the basic adjustment of the display range. The display on
the screen must be adjusted for the material to be tested and for the probe used.
Calibration requires the use of calibrated standard made of the same material as the test piece. Prior to
calibrating the instrument/probe combination, the A-Scan display-screen range (the material thickness
Connect one single element
probe to either port.
Connect leads from a Dual
Element Probe to both ports.
For through-transmission,
connect two single element
probes to the transmit (left,
labeled as ) and receive
(right, labeled as ) ports.

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value represented by the full horizontal width of the screen) will normally be set to a value equal to or
slightly larger than the calibrated standard.
1Activate the BASE submenu (located in the BASIC menu) by pressing the menu key below it.
Three functions will appear down the right side of the display screen.
2Select the function item titled RANGE. You’ll note that RANGE has both coarse and fine
adjustment modes. Coarse and fine modes are selected by repeatedly pressing .
3To change the range, turn the knob.
4The display’s horizontal range will remain as set.
Range is adjustable in fixed steps or
continuously variable.
4.2 Setting the Material Velocity
Use VEL to set the sound velocity within the test object. Always ensure that the function VEL is correctly
set. The instrument calculates all range and distance indications on the basis of the value adjusted here.
Velocity range：300m/s～15000m/s
Coarse adjustment, in steps as follow
2260m/s 2730m/s 3080m/s 3230m/s
4700m/s 5920m/s 6300m/s
4.3 Setting the Display Delay
Here you can choose whether to display the adjusted range (for example 300 mm) starting from the
surface of the test object, or in a section of the test object starting at a later point. This allows you to shift
the complete screen display and consequently also the display zero. If the display should for example
start from the surface of the test object, the value in D-DELAY must be set to 0. To set the display delay
1Activate the BASE submenu (located in the BASIC menu) by pressing the menu key below it.
Three functions will appear down the right side of the display screen.
2Select the function item titled D-DELAY.
3To change the display delay, turn the knob. You’ll note that the displayed echoes shift to the left
or right.
D-DELAY range: -20~3400 µs
Coarse adjustment: 12 pixel space (in µs)
Fine adjustment: 1 pixel space (in µs)
4.4 Selecting the Probe Test Mode
You can use the function PROBE to activate the pulse-receiver separation. The following modes are
available:
STRAIGHT- For single straight beam transducer operation ( will be displayed).The probe
connection sockets are connected in parallel.
ANGLE- For single angle beam transducer operation ( will be displayed)
DUAL – For the use with dual-element (TR) probes ( will be displayed); the right-hand socket is
connected with the amplifier input whereas the initial pulse is available at the left-hand socket.
THRU – Through-transmission mode for the use with two single-element probes ( will be

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displayed); the receiver is connected with right, the pulse is connected with left.
Select the probe model step:
1Activate the PROBE submenu (located in the CAL menu) by pressing the menu key below it.
2Select the function item titled PROBE.
3To change the probe mode, turn the knob. Each available probe mode is represented by an icon
on screen display whenever that probe mode is indicated.
4The probe mode will be set to the last one displayed.
4.5 Selecting a Rectification Mode
You can select the rectification mode of the echo pulses according to your application in the function
RECTIFY (BASIC→ECHO→RECTIFY).
Rectification affects the orientation of the A-Scan on the display screen. The A-Scan represents the
pulse (echo) that’s returned from the material being tested to the instrument. The series of echoes looks
like the Radio Frequency (RF) signal.
Note that the RF signal has a negative
component below the axis, and a positive
component above the axis.
RF rectification is useful when evaluating a
probe.
RF rectification is forbidden when displaying
the DAC/AVG curves.
Positive Half Rectification means that only
the upper (positive) half of the RF signal is
displayed.
Negative Half Rectification means that only
the bottom (negative) half of the RF signal is
displayed. In the figure above, note that
even though it’s the negative half of the RF
signal, it’s displayed in the same orientation
as a positive component. This is only to
simplify viewing. The signal displayed in the
view identified as Negative Rectification is
the negative component of the RF signal.
Full-Wave Rectification combines the
positive and negative rectified signals
together, and displays both of them in a
positive orientation. Full-wave rectification is
recommended for most inspections.
Use the following procedure to select a rectification mode
1Activate the ECHO submenu (located in the BASIC menu) by pressing the menu key below it.

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Three functions will appear down the right side of the display screen.
2Select the function item titled RECTIFY. You’ll note that there are four options:
POS- Shows the positive component of the RF signal
NEG- Shows the negative component of the RF signal but displays it in a positive orientation
FULL-Shows the positive and negative halves of the RF wave, but both are oriented in the positive
direction.
RF- Shows the echo with no rectification
3Select the rectification method.
4.6 Setting the A-Scan Reject Level
The function REJECT allows you to suppress unwanted echo indications, for example structural noise
from your test object. To omit a portion of the A-Scan, you must define the percentage of full-screen
height you wish to omit. You may omit A-Scan up to 80% of the screen height. To set a reject percentage
1Activate the ECHO submenu (located in the BASIC Menu) by pressing the menu key below it.
2Select the function item titled REJECT.
3Set the required percentage value by turning the knob.
You should handle this function with great caution, as it may of course happen that you suppress echoes
from flaws as well. Many test specifications expressly forbid using the reject function.
4.7 Setting the Gain
Instrument gain, which increases and decreases the height of a displayed A-Scan, is adjusted with the
gain functions.
The gain includes the basic gain, the
offset gain and the correction gain. The
basic gain and the correction gain are
also displayed on the top-right corner of
the screen.
The maximum of the total gain (the basic
gain plus the offset gain plus the
correction gain) is 110 dB.
The offset gain is for the purpose of flaw evaluation. The DAC/AVG curves remain unchanged when
adjusting the offset gain.
Sensitivity correction gain: Compensate for the transfer losses in the material under test. This correction
gain is necessary if test object and reference block have different surface qualities. You have to find out
the adjustment value for the compensation of transfer losses by experiments. The gain is varied
accordingly in this correction, while the curve line remains unchanged. To set the sensitivity correction
gain, select the function T-CORR and then adjust its value according to the experiment.
When DAC is active, adjusting the basic gain setting will result in an equal adjustment of the DAC curve
position. To increase the instrument gain without changing the DAC curve position, please use the
T-CORR function to compensate for varying coupling/surface conditions.
4.8 Changing the Gain-Adjustment Increment (DB STEP)
When adjusting the A-Scan Gain, each click of the adjustment knob increases or decreases the gain
level by a dB increment equal to the DB STEP. Several values can be specified for DB STEP. Available
increments include: 0.1dB, 1dB, 2dB, 6dB and 0dB. Note that setting the DB STEP to 0dB prevents
adjustment of the instrument gain and prevents any changes using the knob.
To select one of the existing DB STEP values:
1Activate the GAIN submenu (located in the BASIC menu) by pressing the menu key below it.
2Select the function item titled DB STEP.

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3Change the DB STEP value by repeatedly pressing key or by turning the knob.
Note that DB STEP value can be quickly changed by repeatedly pressing the key .
4.9 Auto Gain Feature
Use the Auto Gain function to automatically set the basic gain, so as to adjust the peak echo inside the
currently selected gate to a target height.
1Set the target echo height using the AUTO function located in the FUNC submenu.
2Press
G A I N
A U T O
to start the Auto Gain function. “AUTO-XX%” will be shown on the screen.
3The Auto Gain function will end when the echo height reaches the target value. Or you can stop
the function by pressing
G A I N
A U T O
again.
4.10 Configuring the Gates
The gates monitor the range of the test object where you expect to detect a flaw. If an echo exceeds or
falls below the gate, an alarm signal is shown via the ALRM LED. The gate chooses the echo for the
digital time-of-flight or amplitude measurement.
The instrument has two gates: gate A and B. Gate A and B are independent of one another. Setting the
position and characteristics of the A- and B-Gates is the first step to configuring the instrument for flaw
detecting or material-thickness measurement. The GATE functions controls not only the location of the A
and B-Gates, but also the alarms and other features activated when an A-Scan signal crosses a specific
gate.
A-Scan signals crossing the A or B-Gate are evaluated for the purposes of flaw detection and
material-thickness evaluation. When the signal crosses the A or B-Gate, the maximum point (peak) of
the signal (in the specific gate) is used for evaluation purposes. The measured value is indicated on the
status line.
Selecting a Gate
Selecting a gate by using the GATE SEL
function in the GATE submenu.
You can also repeatedly press
A / B
to
switch the selected gate between Gate A
and Gate B.
The selected gate will be shown in solid
line. The unselected gate will be shown in
dashed line.
Positioning Gates
Use the following procedures to set the vertical and horizontal position of the A and B-Gates. Remember
that gate position has the following effects on instrument performance:
A-Scan echoes on the right side of the display screen represent features that occur at a greater
depth from the test-material surface than those on the left of the display screen. Therefore, moving a
gate to the right means that the gate is evaluating a deeper portion of the test material.
A wider gate will simply span the equivalent of more test-material depth
Increasing the vertical height (called threshold) of a gate means that only reflected signals of
sufficiently large amplitude will cross the gate.
Setting a Gate’s Starting Point
You can fix the starting point of the gates A or B within the display range.
1Activate the GATE submenu (located in the BASIC menu).
2Select the gate to be positioned using the GATE SEL function.
3Select the gate START function and adjust the starting point by turning the knob. Increasing and
decreasing the value of the starting point moves the gate to the right and left, respectively.

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4The gate starting point will remain as set, even when width adjustment is made.
Coarse adjustment: half of a lattice
Fine adjustment: 1 pixel space
When the gate exceeds the display range,
as shown in right figure, the measured
value will be shown as “*” on the status
line.
You can also set the selected gate’s starting point using the Quick Search Function. Quick Search
Function is achieved by simply pressing the and . Note that the instrument will only search the
echo whose peak crosses the selected gate in this function.
Adjusting a Gate’s Width
You can determine the threshold value of the gates within the range of 0 to 99% FSH (Full Screen Height)
for triggering the LED alarm if this value is exceeded or not reached, depending on the setting of the
LOGIC function.
1Activate the GATE submenu (located in the BASIC menu).
2Select the gate to be positioned using the GATE SEL function.
3Select the gate WIDTH function and adjust its value by turning the knob.
Setting a Gate’s Threshold (Vertical Position)
You can determine the threshold value of the gates within the range of 0 to 99% FSH (Full Screen Height)
for triggering the LED alarm if this value is exceeded or not reached, depending on the setting of the
LOGIC function.
1Activate the GATE submenu (located in the BASIC menu).
2Select the gate to be positioned using the GATE SEL function.
3Select the THRESH function and adjust the vertical height by turning the knob. Increasing and
decreasing the value of the threshold moves the gate up and down, respectively.
Defining B-Gate Alarm Logic
This function allows you to choose the method for triggering the B-Gate alarm.
Gate alarms can be set to trigger when an A-Scan echo crosses the gate (POSITIVE logic) or when no
echo crosses the gate (NEGATIVE logic) within the displayed range.
A-Gate is locked to POSITIVE logic. And
B-Gate can be set to either POSITIVE or
NEGATIVE.
The appearance is different between the
POSITIVE gate and the NEGATIVE gate when
displayed, as is shown in right figures.
Note that the alarm and measurement function
of the gates is only active within the display
range.
Use the following procedure to specify B-Gate
logic:

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1Activate the LOGIC submenu (located
in the BASIC menu) by pressing the menu key
below it.
2Select the B-LOGIC function and
choose the gate-alarm triggering logic.
Turning the Audible Alarm On or Off
When a gate alarm is activated, one or more of the following will occur:
An alarm indication light on the front of the instrument will illuminate
An audible alarm (HORN) will sound
Use the following procedure to turn the horn off or on:
1Activate the LOGIC submenu (located in the BASIC menu) by pressing the menu key below it.
2Select the ALARM function and turn the audible alarm ON or OFF.
Setting the Gate Work Mode
Two options for the gate work mode: SINGLE and E-E.
SINGLE: measures the distance from the work piece surface to the peak echo inside the selected gate.
E-E (Echo-Echo mode): measures the distance between two peak echoes (the two peak echoes should
be selected by two gates). It is useful in thickness measuring.
Use the GATE MODE function in the LOGIC submenu to select the gate work mode.

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Gate Mode: Single
Gate Mode: E-E
4.11 Setting the Damping Level
Note: For this model, the parameter is fixed.
This function serves for matching the probe. You can use it to adjust the damping of the probe’s
oscillating circuit and to consequently change the height, width and resolution of the echo display.
1Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
2Move the cursor to the selection titled DAMPING.
3To change the specified damping level and optimize the A-Scan signal appearance, turn the
knob. You’ll note that the following damping levels are available: 100Ω、200Ω、400Ω.
4The damping level will be set to the one last displayed.
4.12 Setting the Pulse Energy Level
Use the function ENERGY to set the pulse voltage. The relative energy with which the pulse fires can be
selectable set to LOW, MEDIUM or HIGH.
The setting MEDIUM is recommended for most inspections. HIGH is used for inspections in which
maximum sensitivity is import, e.g. for the detection of small flaws. Choose the setting LOW for
broadband probes or if narrow echoes are required (better lateral resolution).
To set the pulse energy
1Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
2Select the function item titled ENERGY.
3Select the energy level by turning the knob or continuing to press the key.
4.13 Setting the Pulse Width
The function is no available in this model.
4.14 Adjusting the Pulse Repetition Frequency (PRF)
The pulse repetition frequency indicates the number of times an initial pulse is triggered per second. You
can determine whether you need the highest possible PRF value, or whether you are satisfied with a low
value.
The PRF value ranges from 10 Hz to 1000 KHz. The larger your work piece, the smaller PRF values are
needed in order to avoid phantom echoes. In the case of smaller PRF values, however, the A-Scan
update rate becomes lower, for this reason, high values are required if a work piece should be scanned
fast.
The best way to determine the suitable PRF value is by experimenting: start from the highest step and
reduce the value until there are no more phantom echoes.
To set the PRF level
1Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
2Select the function item titled PRF.
3Change the PRF value by turning the knob.
4.15 Specifying the Probe Frequency
In this function, you can specify the probe frequency according to the frequency of your probe. The
instrument will automatically utilize a built-in filter to match the probe frequency.
1Activate the PROBE submenu (located in the CAL menu) by pressing the menu key below it.
2Select the function item titled FREQ.
3To change the specified frequency, turn the knob.
4The probe frequency will be set to the last one displayed.
4.16 Specifying the Piezo Crystal Size
Use DIAMETR function to set the Piezo Crystal Size of your probe. This value is required when
programming the AVG.
4.17 Setting the Probe X-Value

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The function X-VALUE enables you to set
the X-Value (distance between the probe’s
leading face and probe index/sound exit
point) of the probe used. This value is
required for the automatic calculation of the
reduced projection distance in angle beam
transducer operation.
Adjustment range: 0~50 mm
4.18 Probe Delay Calibration
Each probe has a delay line between the transducer element and the coupling face. This means that the
initial pulse must first pass through this delay line before the sound wave can enter the test object. You
can compensate for this influence of the delay line in the function P-DELAY.
If the value for P-DELAY is not known, read Chapter 5 in order to determine this value.
4.19 Setting the Angle of Incidence
The ANGLE function enables you to adjust the angle of incidence of your probe for the material used.
This value is required for the automatic calculation of the flaw position. The angle of incidence for the
straight-beam probe is fixed to 0°.
Adjustment range: 0°~80°.
4.20 Magnifying the Contents of a Gate
Whenever an A-Scan is active, pressing the key enlarges the displayed portion of the A-Scan
contained in the selected gate. Any of the available gates may be specified as the selected gate. The
width of the magnified gate determines the level of magnification since the display is magnified until the
gate width equals the full-screen width. The display will contain the magnified view until pressing
again.
Before Magnifying
After Magnifying
4.21 Freezing the A-Scan Display
Whenever an A-Scan is active, pressing freezes the A-Scan display. The active A-Scan will remain
as it appeared when was pressed and the display will remain frozen until is pressed again.
4.22 Setting the Display Grid
1Activate the SYS submenu (located in the CFG menu) by pressing the menu key below it. Four
functions will appear down the right side of the display screen.
2Select the function item titled GRID.
3To change the grid type, Press key or turn the knob. Each grid style is shown in the

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display screen’s A-Scan window as it is selected. You’ll note that the following styles are available:
G1-Ten major horizontal and five vertical divisions, with two major horizontal and vertical divisions.
G2-Two major horizontal and vertical divisions.
G3-No on-screen grid. Only display-edge marks are visible.
G4- Ten major horizontal and five vertical divisions.
4The grid style will be set to the last one displayed.
4.23 Selecting Units
In the function UNITS you can choose your favorite unit system between METRIC and IMPERIAL unit
systems.
1Activate the SYS submenu (located in the CFG menu) by pressing the menu key below it.
2Select the function item titled UNITS. You’ll note that the following options are available:
METRIC-metric unit system.
IMPERIAL-Imperial unit system
3To change the units of measurements, Press key or by means of the knob.
4The unit of measurement will be set to the choice last displayed.
4.24 Scale Setting
As an alternative to the measured values, the instrument enables to display a scale on the first status
line. The scale gives you an overview of the position of echoes.
The following settings are possible:
S-PATH: Display of sound path scale
P-VALUE: Display of projection distance
scale
DEPTH: Display of depth distance scale
Select the function SCALE. Then use the knob to set the required display mode.
As an alternative, you can repeatedly press to switch the scale.
4.25 Fill function
The function FILL toggles between the filled and the normal echo display mode. The filled echo display
mode improves the echo perception due to the strong contrast, especially in cases where workpieces
are scanned more quickly.
4.26 Setting the Display Brightness
Use the function BRIGHT to set the display brightness. You can choose between four brightness options:
25%, 50%, 75% and 100%.
1Activate the LCD submenu (located in the CFG menu) by pressing the menu key below it. Four
functions will appear down the right side of the display screen.