
Chapter 3 Theory of Operation
3-1 INTRODUCTION ···································3-3
3-2 SYSTEM OVERVIEW ·································3-3
3-3 ANALOG SUBSYSTEM ASSEMBLIES·······················3-10
Signal Source Module ..............................3-10
Test Set Module, 20 GHz and 40 GHz Instruments ..............3-11
Test Set Module, 50 GHz and 65 GHz Instruments ..............3-13
A7 PCB 10 MHz Timebase............................3-15
Receiver Module .................................3-16
A8, Source Lock/Signal Separation and Control PCB .............3-18
IF Section.....................................3-18
A7PCB,LO3...................................3-19
A5 A/D Converter PCB..............................3-19
3-4 DIGITAL SUBSYSTEM ASSEMBLIES·······················3-20
A9 Main Processor PCB Assembly .......................3-20
A13 I/O Interface #1 PCB Assembly.......................3-21
A14 I/O Interface #2 PCB Assembly.......................3-21
A15 Graphics Processor PCB Assembly.....................3-22
A16 Hard Disk PCB Assembly..........................3-22
Floppy Disk Drive Assembly...........................3-22
A24 VME Bus Terminator PCB .........................3-22
3-5 MAIN CHASSIS ASSEMBLIES ···························3-22
A17 System Motherboard Assembly.......................3-22
Front Panel Assembly ..............................3-23
A18 Rear Panel Interface PCB..........................3-23
Power Supply Module ..............................3-24
Chapter 4 Operational Performance Tests
4-1 INTRODUCTION ···································4-3
4-2 CHECKING THE SERVICE LOG ··························4-4
4-3 SELF TEST ······································4-5
4-4 PERFORMANCE TESTS ·······························4-6
Test Specifications .................................4-6
Required Equipment................................4-7
Additional Required Equipment .........................4-7
Installation and Launching the Test Program ..................4-7
Running the Tests .................................4-9
Description of Tests ................................4-9
iv 37XXXD MM
Table of Contents (Continued)