Dragon Wholesaling DFD30 User manual

Ultrasonic Flaw Detector DFD30
Operation Instructions
Dragon Electronics Co.
2015-05-01

Ultrasonic Flaw Detector DFD30
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Content
Chaper I Overview...........................................................................................................................................................3
1. How to Use the Operation Instructions................................................................................................................3
Chaper II Technical Parameters....................................................................................................................................4
2.1 Technical Specification......................................................................................................................................4
2.2 Standard Delivery..............................................................................................................................................4
2.3 Optioal Accessories ...........................................................................................................................................5
Chaper III Preparation...……...…………………………………………………………………………………….…...5
3.1 Overview of the Instrument .............................................................................................................................5
3.2 Operation...........................................................................................................................................................6
3.3 Display............................................................................................................................................................. 7
3.4 Overview of main menu .................................................................................................................................. 7
Chaper IV Shortcut operation of main unit...……...…………………………………………………………………....8
4.1 Calibration of straight probe ............................................................................................................................8
4.2 Calibration of angle beam probe........................................................................................................................9
Chaper V Parameter setting........................................................................................................................................... 9
5.1 Setting of BASE ................................................................................................................................................9
5.2 Setting of a and b GATE..................................................................................................................................11
5.3 Setting of PULS...............................................................................................................................................13
5.4 Setting of CAL.................................................................................................................................................14
5.5 Setting of DAC................................................................................................................................................15
5.6 PK MEM..........................................................................................................................................................16
5.7 TRIG................................................................................................................................................................17
5.8.WELD..............................................................................................................................................................18
5.9 SET..................................................................................................................................................................19
Chapter VI Calibration of straight and angle beam probe.............................................................................................19
6.1 Calibration of straight probe............................................................................................................................19
6.2 Calibration of angle beam probe......................................................................................................................20
Chapter VII Thickness Measurement ............................................................................................................................21
7.1 How to enter thickness measurement ..............................................................................................................21
7.2 How to back flaw detection.............................................................................................................................22
Chapter VIII Communication with PC..........................................................................................................................22
Chapter IX Maintenance................................................................................................................................................22
Appendix .......................................................................................................................................................................25
Appendix I Notice to User…………………………………………………………………………………...…...25
Appendix II List of Operations …..………………………………………………………………………………26

Ultrasonic Flaw Detector DFD30
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Chapter I Overview
This is a portable industrial non-destructive flaw detector, which can rapidly, easily and accurately inspect, locate,
evaluate and diagnose various defects (crack, inclusion and pinhole, etc.) in a workpiece without destruction. It can
be used both in a lab and field. The instrument can be widely used in any fields that need defect inspection and
quality controlling e.g. manufacturing industry, iron & steel metallurgical industry, metalworking, chemical industry,
etc., also be broadly used in the active safety inspection and service-life evaluation in such fields as aerospace,
railway transportation and boiler pressure vessels, etc. It is an essential instrument for non-destructive inspection
industry.
When the ultrasonic wave propagates in a job, one can detect the defect in it by the influence on the propagation of
ultrasonic wave based on the acoustic characteristic demonstrated by the defect in the material. Based on this
principle, by using ultrasonic wave one can measure such defects as crack, pinhole and inclusion in such media as
metal, non metal and composite, etc.
Fig. 1.1 Basic working principle for ultrasonic detection
1. How to use the operation instructions
It is necessary to read chapter 1, 2, 3 and 4 of the Instructions before operating instrument for the 1st time. The
descriptions in the chapters are necessary preparation for operating the instrument, which will describe all keys and
displays on screen, and explain the operation principle.
By following the directions, you can avoid error or failure due to operation mistake and can have a clear concept
about all functions of the instrument.

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Chapter II Technical Parameters
2.1 Technial Specifications
Frequency Range
0.4-10MHz
Gain Range
0dB ~110 dB
D-Delay
-20～+3400s
P-Delay
0µs～99.99µs
Measurement Range
Scan: 0 mm ~6000.0 mm
Thickness: 5.0 mm ~1000.0 mm
Dynamic Range
＞32dB
Vertical linear error
＜3.0%
Horizontal linear error
＜0.1%
Sensitivity leavigns
＞58dB
Reject
0%～90%
Rectification
Positive half wave, negative wave, full wave and RF
Test Mode
Pulse-echo, dual, through transmission
Power Supply
Li battery
Charging Time
4-5 hours
Continuous Work
More than 8 hours
Weight
0.42Kg
Overall Dimension
141×87×40mm
2.2 Standard Delivery
Item
Quantity
Main unit
1
2.5A/4.2V power adaptor
1
probe connecting cable
1
Straight probe
2.5MHz Φ20mm (One)
Angle probe
4MHz 8×9 60°(One)
Software and cable
1
Neck and Wrist strap
1
Instruction manual
1
Calibration certificate
1

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Item
Quantity
Carrying case
1
2.3 Optional Accessory
Item
Different straight and angle beam
Different cables
Different test blocks
Chapter III Preparation
3.1 Overview of Instrument
Direction：
up,down,left and
right.
Down straight:
Confirm and
fine adjustment.
Frozen
Data Plus
Data Minus
COPY

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3.2 Operation
3.2.1 Preparation
a. Connect to probes and insert into correct socket. It is mention in 3.1.4.
b. Press power key to turn on the main unit.
c. It carries out self-check. After self-check, it automatically enters into the testing statues and the setting is kept with
that you turned off last time.
d. Check voltage of the battery. If the power monitor shows that the voltage is low, please chargeASAP.
3.2.2 Turn on or off
Turn on: Please make sure there is enough power of battery and press power key for about 3 seconds. Then users
would hear a long buzzer, meanwhile main unit is in working condition.
Notice:
when users turn on the instrument, the setting is the same as the one users turn off last time.
Turn off: Please make sure all data necessary is stored; then press power key for about 3 seconds again and main unit
turns off.
3.2.3 Usage of power supply
DFD30 can work with plug-in power supply (AC, DC adaptor) or battery.
The detector uses the power supply to adapter automatically when the power supply adapter is connected. In the other
hand, the detector uses the power supply to battery automatically when the power supply adapter is not connected.
3.2.4 Connect to probes
There is suitable cable to connect main unit and probe. On the top and side of main unit, there are 2 lemo00
interfaces.
Proper probe shall be connected when using DDFD30 to inspect. So long that you have a proper cable, and the
working frequency is within proper range, any probe made by our company is suitable for DDFD30.
dB+
dB-
Power
Transducer
interface
Transducer
interface
USB data transfer

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The probe shall be connected to the socket at side of the instrumentl Both connector sockets have different function,
the socket on the top that sends the echo, the bottom, receiving the echo. Under single probe mode, the socket that
sends echo can be used only. When connecting with dual, TR or two probes (one for sending, the other for receiving),
please make sure to the right socket; otherwise, it may result in loss or disorder echo waveform.
Notice:
1. Bad quality of cables and probes has great impact on the test results. Please be sure good condition of cable and
probe is used.
2. When using dual probe, please pay attention to the connecting order of probe; otherwise lead to echo power
consumption and not right echo display.
3.3 Dispaly
In detail
3.4 Overall of main menu
Main functions of DFD30 are included in functional groups and several special functions.
The functional groups include BASE, P/R, GATE, CHAN, AGLEY, GAIN DAC1, DAC2, AVG1, AVG1,BSCAN,
SCR, MEM, CFG, ADV they will be introduced in the following table.
Gain value
Gate A is on
Gain value
Under setting
Need to be set
Thickness
Power
indication

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No.
group
Functions
Description
1
BASE
RANGE, db-STEP, MTLVEL, D-DELAY , P-ZERO
Basic adjustment
items necessary for
the display range
2
a GATE
a START, a WIDTH, a THRESH, a LOGIC, E to E
Relative items for
gate configuration
3
bGATE
b START, b WIDTH, b THRESH, b LOGIC, b GATE
Relative items for
gate configuration
4
PULS
PROBE TYPE, REJECT, PRF, FINE G, T-SCAN
Sending and
receiving the
adjustment items
needed
5
CAL
MEAS, S-REF1,a START, S-REF2, b START
Basic adjustment
items necessary for
the display range
6
DAC
DAC3, DGS, AWS
Plotting DAC curve
7
PK
MEM
PK MEM, ENVLOP, SHADOW, AGC 80%
Advanced function
8
TRIG
ANGLE, X-VALUE, MTLTHK
Setting relative with
angle probe
9
WELD
WELD, W WIDTH, W DIST, W DISP
Advanced function
10
SET
HORN, BRIGHT, UNIT, DATE, TIME
Advanced function
Other special functions can be realized by Special Function (SF) keys. The functions of each SF keys are introduced
in the following table.
Special Functions
Description of function
Gain step
To adjust the gain step
dB+、dB-
To adjust the gain
Freeze
To freeze waveform
Memory Peaks
Capture the max value of echo on the screen
Measure display
Select the display mode of measure result on the screen
Chapter IV Shortcut operation of main unit
Here is shortcut of operation for user reference. Please check below in detail:

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4.1 Calibration of straight probe
Press power key to turn on the instrument and connect the probe with it
Under PULS menu, set probe as straight probe by pressing Data plus or minus
Under BASE menu, choose RANGE and set it as 125mm by pressing Data plus or
minus; choose MTLVEL and set it as 5920m/s by pressing Data plus or minus
Please prepare a test block model CSK-IA and put couplant on it. Meanwhile,
locate probe on the test block, press dB+ or dB- key to make the echo 80% full of
the screen
Under a GATE, mova a GATE cover the echo
Under BASE menu, choose P-ZERO, set it by pressing Data plus as the thickness
is 100mm because standard value of test block is 100mm. Rihgt now, calibration
process is completed.
4.2 Calibration of angle probe
4.2.1 P-ZERP calibration
Press power key to turn on the instrument and connect the probe with it
Under PULS menu, set probe as angle probe by pressing Data plus or minus
Under BASE menu, choose RANGE and set it as 125mm by pressing Data plus or
minus; choose MTLVEL and set it as 3240m/s by pressing Data plus or minus
Please prepare a test block model CSK-IA and put couplant on it. Meanwhile,
locate probe on the test block, press dB+ or dB- key to make the echo 80% full of
the screen
Under a GATE, mova a GATE cover the echo
Under BASE menu, choose P-ZERO, set it by pressing Data plus as the thickness
is 100mm because standard value of test block is 100mm. Rihgt now, calibration
process is completed.
4.2.2 X-VALUE calibration
When P-ZERO calibration process is completed, next we move to X-VALUE calibration.
Set probe
Set range and velocity
Locate probe on test block
A GATE covers it
P-ZERO calibration
Turn on and connect probes
Set probe
Set range and velocity
Locate probe on test block
A GATE covers it
P-ZERO calibration
Turn on and connect probes
P-ZERO calibration

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Locate the probe on test block CSK-IA and make the echo of R100 as 80% the
highest peak, make the distance between edge of test block and front face of probe
as L1, X-VALUE is 100mm-L1
Under TRIG menu, choose X-VALUE by up or down key, set X-VALUE by press
Data plus or minus
Chapter V Parameter setting
5.1 Setting of BASE
In the BASE functional group, users can adjust and set the functional items relative with the display range, including
RANGE, db-STEP,MTVEL, D-DELAY and P-ZERO.
During the detection, the display range of screen is in great relation to the material of workpiece and probe’s nature.
The workpiece material will influence the transmission velocity of ultrasonic wave, and the character of probe
determines the P-DELAY.
Notice: In order to set the sound velocity of ultrasonic wave in workpiece and P-DELAY, please refer to Chapter VI
Calibration of Instrument.
UnderA-Scan mode, press left or right direction key to set a or b GATE.
5.1.1 RANGE
Press left or right key to enter into BASE SETTING, then press up or down key to choose RANGE.
Range: 0mm～6000mm/0.1＂～200＂
If RANGE is selected, there are two ways to change. They are Rough and Fine adjustment.
Under RANGE, press + or -key
Rough adjustment: 25mm, 50mm, 100mm, 125mm, 200mm, 250mm, 500mm, 1000mm, 2000mm, 4000mm,
6000mm.
Calibration of X-VALUE
Set X-VALUE
X-VALUE calibration
completionn

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Fine adjustment: +1 or -1mm
Under RANGE, press down key. Right now, there are two tri-angle appear. Under this condition, press + or –key to
realize fine adjustment.
5.1.2 db-STEP
Press left or right key to enter into BASE SETTING, then press up or down key to choose db-STEP.
Press + or –key to change from 01db, 02db, 06db and 12db.
5.1.3 MVTEL
Users are allowed to set the transmission velocity of ultrasonic wave in workpiece. There are two velocities stored in
main unit. They are:
3,240m/s 0.127 in /µs Sound velocity of transverse wave in steel
5,920m/s 0.233 in /µs Sound velocity of longitudinal wave in steel
Usera are also allowed to carry our fine adjustment.
Under MVTEL, press down key. Right now, there are two tri-angle appear. Under this condition, press + or –key to
realize fine adjustment.
Fine adjustment: Step is 1m/s 0.0001in/µs
5.1.4 D-DELAY
Users could set the pulse shift during detection, via. D delay. By which, users are allowed to adjust the starting
position for waveform, as well as adjusting the zero point of pulse, so as to make sure that it is at the surface or a
starting face inside the workpiece. If the pulse has to be started from the surface of workpiece, D delay must be set to
0.
Range: 0-512mm
Step: 1mm
There are two ways of adjustment, Rough and fine.
Rough adjustment
Under D-DISPLAY menu, press down key. Right now, there are two tri-angle appear. Under this condition, press + or
–key to realize rough adjustment.
Fine adjustment
Under D-DISPLAY menu, press + or –key directly to realize fine adjustment.
5.1.5 P-ZERO
Range: 0-9.99µs
Step: 0.1µs
There are two ways of adjustment, Rough and fine.
Rough adjustment
Under D-DISPLAY menu, press down key. Right now, there are two tri-angle appear. Under this condition, press + or
–key to realize rough adjustment.

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Fine adjustment
Under D-DISPLAY menu, press + or –key directly to realize fine adjustment.
5.2 Setting of a and b GATE
It is used for adjustment of gate settings, including Gate logic, Gate alarm, Gate start, Gate width and Gate height.
Functions of gate during detection:
To monitor whether the job has flaws in the set logic and range, if yes, it will alarm.
To measure the position and size of flaw echo.
DFD30 is equipped with double-gate function: Gate A and Gate B, normally Gate A is used alone for detecting the
workpiece flaw, and the double-gate is usually used in the measuring and calibration of multi-echo, eg. Measuring the
distance between surface echo and first echo during thickness measurement.
Gate B could be open if E to E function is used under menu a Gate and set E to E as on or b-GATE is set on. Under
this condition, Gate B appears on the display.
UnderA-Scan mode, press left or right direction key to set a or b GATE.
5.2.1 a START and b START
This functional menu is multipurpose for Start of Gate A and Gate B.
Under a GATE and b GATE, press up or down key to choose a START and b START, press + or –key to make
change.
Notice: Gate B is independent from Gate A. The three gate parameters: Gate Start, Gate Width and Gate Height can
be adjusted separately without disturbing each other.
5.2.2 a WIDTH and b WIDTH
This functional menu is multipurpose for Width of Gate A and Gate B.
Under a GATE and b GATE, press up or down key to choose a WIDTH and b WIDTH, press + or –key to make
change.
5.2.3 a THRESH and b THRESH
This functional menu is multipurpose for Threshold of Gate A and Gate B.

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Under a GATE and b GATE, press up or down key to choose a THRESH and b THRESH, press + or –key to make
change.
Parameter ange: 3.5%-96.5%
5.2.4 a LOGIC and b LOGIC
This menu is multipurpose for gate logic.
GATE LOGIC:
Gate logic has four options: NONE, POS, NEG, MUL.
Options:
POS: when the echo amplitude is higher than the preset threshold of the gate, it will alarm
NEG: when the echo amplitude is lower than the preset threshold of the gate, it will alarm
Under a GATE and b GATE, press up or down key to choose a LOGIC and b LOGIC, press + or –key to make
change.
5.2.5 E to E
This function menu is for mode of E to E. If it is set on, GATE b appears on the display and achieves E to E function.
Under a GATE and b GATE, press up or down key to choose E to E, press + or –key to choose on or off.
5.3 Setting of PULS
UnderA-Scan mode, press left or right direction key to set PULS.
5.3.1 TYPE
This functional menu is to set probe type.
PROBE TYPE:
Set ultrasonic probe. If the current probe is an echo probe, then set it to single; if it is a double-wafer probe, set it to
DUAL, and if it is a through transmission probe, set it to THRU.
Options: Straight probe: Single transducer.
Angle probe: Single transducer.
Dual: One connector acts as a transmitter, the other acts as a receiver. The top transducer connector
is designated as the transmitter. The bottom transducer connector is designated as the
receiver.

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Thru: Two separate transducers, typically on opposite sides of the test specimen. Use the top
transducer connector as the transmitter. The bottom transducer connector is designated as the
receiver.
Under PULS, press up or down key to choose PROBE TYPE, press + or –key to make change.
Notice: Probe setting plays an important role in flaw detecting. Please choose right probe according to the setting.
5.3.2 REJECT
This menu is used to reject the echo’s display amplitude, for example, to remove the structural noise in the job. It is to
reject the display of echo whose amplitude is lower than the setting value by setting a percentage (i.e. percentage at
full amplitude).
The suppressing percentage (i.e. percentage at full amplitude) indicates the min. echo height to be displayed. Any
echo amplitude lower than this height will be neglected and recorded as zero amplitude.
Parameter range: 0%~90%
Step graduation: 1%
Under PULS, press up or down key to choose REJECT, press + or –key to make change.
5.3.3 PRF
This model is equipped with an adjustable pulse repetition reate, with adjustable settings of 10, 25, 50, 100, 250, 500,
750 and 1000Hz.The primary purpose is to control how fast the pulser is firing. The repetition rate is tied into the
alarm LEDS. Therefore, when scanning at higher speed, a higher repetition rate will make the alarm trigger more
responsive.
Under PULS, press up or down key to choose PRF press + or –key to make change.
5.3.4 FINE G
This menu is to adjust the gain in fine status.
Under PULS, press up or down key to choose PRF press + or –key to make change.
5.3.5 T-SCAN
This menu is multipurpose for SCAN WAY.
5.4 Setting of CAL
UnderA-Scan mode, press left or right direction key to set CAL.

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5.4.1 MEAS
There are two styles: PEAK and FLANK.
PEAK: The detection occurs at the highest peak in the gate.
FLANK: The detection occurs as teh first half cycle left edge rises and breaks the threshold.
5.4.2 S-REF1
This feature offers users setting a reference thickness.from 0 to 250mm.
5.4.3 a START
This setting is the same as a Gate setting. Please check 4.2.4.
5.4.4 S-REF2
This feature offers users setting a reference thickness.from 0 to 250mm.
5.4.5 b START
The setting of b Gate will be displayed here.
5.5 Setting of DAC
5.5.1 DAC 3C
This feature toggles the DAC feature on/off. A Distance Amplitude Correction (DAC) curve is used to configue a
variable threshold for the gate, using the same size reflector at different distances.
UnderA-Scan mode, press left or right direction key to set DAC.

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Making of DAC curve
1．Please do caliration of Probe zero, X-value as well as K-value of angle beam. Acccording to specific condition,
please do set the range, for example reference test block, take a hole of 10mm in depth and let the echo at the
highest peak to be 90% full of screen.
2．Use left or right arrow key and choose DAC3C function, then set it as on. Meanwhile, there is a small cross on
the top.
3．Move a Gate to the highest peak and trap it.
4．Press Frozen key to confirm the fist point.
5．Repeat step 3 and 4 to accomplish the other points, at least 3 points, at most 6 points.Regarding to depth, it is
recommend to 20mm, 30mm, 40mm or accoding to specific requirement of users.
6．Press arrow key down, the DAC curve displays on the screen. Under this condition RL, SL and EL curve could
be set. Please check the detail below.
7．Set the menu * POINT as ON, 3 curves show on the screen.
Notice: Explanation of RL, SL and EL curve.
DAC Group is used for adjusting the relative parameters necessary for plotting a DAC curve. It includes RL, SL and
EL curve as well as DAC REF.
In order to meet the standard for plotting DAC curve in different industries, the instrument is equipped with three
DAC curves with adjustable offsets, which are DAC-EL (evaluating line), DAC-SL (quantifying line), DAC-RL
(reject-judging line). In addition, in order that DAC curve can be adaptive to different ambient conditions, Gain
Compensation function is provided. The three offset curve are all generated from generatrix, and the generatrix is
drawn according to the plotting points and the ultrasonic attenuation. According to their different functions, they
appear seperatly as DAC-RL, DAC-SL and DAC-EL on the screen from top to bottom. CORRECT works for
compensating the difference between the surfaces of test block and detected object which will influence the ultrasonic
transmission between them. When the CORRECT gets increased, the three DAC offset curve will get lower
correspondingly, and contrarily they will get higher.
Quit making of DAC
During Step 1-6 mention above of DAC curve making, press COPY key to quit of DAC curve making.

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5.5.2 DGS
This feature toggles the DGS feature on/off. Distance Gain Size (DGS) curve is used to configure a variable threshold
for the gate using a single reflector using an empirically derived set of curves.
5.5.3 AWS
This feature toggles theAWS feature on/off. Used in the analysis of welds and calculating the indication rating.
5.5.4 RESET
This feature provides users to reset the basic setting in detection.
5.6 PK MEM
UnderA-Scan mode, press left or right direction key to set PK MEM.
5.6.1 PK MEM
Peak Memory is used for users to conveniently find out the flaw peak and estimate the flaw accurately.
5.6.2 ENVLOP
This is especially for Angle beam probe. When users move the probe on a workpiece, there are multiple echos
memorized, and main unit makes a line, then shows on the screen. According to this line, users easily find the echo of
flaw.
5.6.3 SHADOW
Making use of this function, echo is filled with color. Users easily check the echo.
5.6.4 AGC 80%
We can use the function to adjust the gain automatically to make amplitude of the largest echo in gate equal 80% of
the screen
Options: ON, OFF
5.7 TRIG

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UnderA-Scan mode, press left or right direction key to set TRIG.
5.7.1 ANGLE
It is to adjust the angle of a probe.
Range: 0.0-90.0
Under TRIG, press up or down key to choose ANGLE, press + or –key to make change.
5.7.2 X-VALUE
It is used to calculate the surface distance in the trigonometry function, as is a physical measurement from the index
point of the probe to the front of the wedge.like the graph below:
Probe is set to P2, then use 100 minus the distance in horizantal shown on display.
R100.0
91.0
2.0
6.0
R50.0
P1 P2 P3
Range: 0.00-50.0mm
Step: 0.1mm
Under TRIG, press up or down key to choose X-VALUE, press + or –key to make change.
5.7.3 MTLTHK
It is used to set the thickness of the test material. The thickness will be used to determine which workpiece is
detecting on.
5.8 WELD
UnderA-Scan mode, press left or right direction key to set WELD.
X-value

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5.8.1 WELD
There are several types of weld detection stored in the main unit, such as Type I, Type V, Type U and Type X. Take
Type I as an example, weld width, weld distance show on the display. Users could make change according to different
condition.
5.8.2 W WIDTH
This feature offers users to set the width of weld.
5.8.3 W DIST
This feature offers users to set the distance of weld to the surface.
5.9 SET
UnderA-Scan mode, press left or right direction key to set SET.
5.9.1 HORN
This menu is used to set HORN on or off.
Under menu of SET, press up or down key to choose HORN, press + or –key to make change.
5.9.2 BRIGHT
This menu is convenient for users operate in dark or sunlight places. So, it offers two modes: Low and High.
Under menu of SET, press up or down key to choose BRIGHT, press + or –key to make change.

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5.9.3 UNIT
It is selectable between Metric and English.
5.9.4 DATE
This menu offers to record and check time.
Under menu of SET, press up or down key to choose DATE, press down key to move the cursor, + or –key to make
change.
It shows like XX month XXdayXXyear. After confirmation, press up or down arrow key.
5.9.5 TIME
This menu offers to record and check time.
Under menu of SET, press up or down key to choose TIME, press down key to move the cursor, + or –key to make
change.
It shows like XX hourXXminutes.After confirmation, press up or down arrow key.
Chapter VI Calibration of straight and angle beam probe
6.1 Calibration of straight probe
For the convenience of user’s calibration of probe zero point,the function of calibration is built in the gauge. Further
more, users can also do the calibration of probe as what is shown here. Straight probe can be calibrated with the
following method.
For example of the standard straight probe which is frequency 2.5MHz, diameter 20mm and one test block CSK-IA
(shown below) with thickness determinate are needed.
The operation steps are as following:
(1) Turn on the instrument and connect with a straight probe
(2) Under PULS menu,set the probe as straight probe by pressing Data plus or minus key
(3) Under BASE menu, set the range as 125mm and sound speed value as 5920m/s, as well as dB as around 20
(4) Put couplant on the surface of the test block and locate the probe on it; it would be better that the echo is
around 80% height of full screen
(5) Move gate A start to echo and cover with it
(6) Finally, under BASE menu, choose P-ZERO menu through up or down key, make the thicknee value as
100mm by pressing Data plus key as the standard thickness of this test block is 100mm. Meanwhile, the
calibration process is completed.