
3310-PR-TF and 3312-PR-TF English
Instruction Sheet
Page 2
Symbols
The table below lists the symbols used on the Probe and/or in this
instruction sheet.
Symbol Description
This product complies with the WEEE Directive
(2002/96/EC) marking requirements. The affixed label
indicates that you must not discard this
electrical/electronic product in domestic household
waste. Product Category: With reference to the
equipment types in the WEEE Directive Annex I, this
product is classed as category 9 “Monitoring and
Control Instrumentation” product. Do not dispose of
this product as unsorted municipal waste. Go to
Fluke's website for recycling information.
Important Information. See manual.
Hazardous Voltage. Risk of electric shock.
Double insulation.
Do not apply to or remove from hazardous, live
conductors without taking additional protective
measures.
Canadian Standards Association- Complies with
relevant North American Safety Standards.
Complies with the relevant European standards.
Conforms to relevant Australian standards.
Measurement Category III is applicable to test and
measuring circuits connected to the distribution part of
the building’s low-voltage MAINS installation.
Measurement Category IV is applicable to test and
measuring circuits connected at the source of the
building’s low-voltage MAINS installation.
Safety Instructions
Please read this section carefully. It will familiarize you with the most
important safety instructions for handling the Probe. In this instruction
sheet, a Warning identifies conditions and actions that pose hazard(s) to
the user. A Caution identifies conditions and actions that may damage
the Probe or the test equipment.
Warning
To prevent possible electrical shock, fire, or personal injury:
•The Probe is to only be used and handled by qualified
personnel.
•Always connect to display device before it is installed
around the conductor.
•Use the Product only as specified, or the protection
supplied by the Product can be compromised.
•High voltages and currents can be present in adjacent
circuits under test.