
5.2 H ad Cl aning on Fi ld Applications
H ad cl aning is r comm nd d at us r's sit s, sp cially wh n
us d in s v r nvironm nts, b caus th h ads may accumulat
dust in th air and magn tic coating mat rial of th disk,
causing chanc of rror incr as and/or scratch on th disk
surfac .
R comm nd d sch dul s and proc dur s ar as follows:
1) Cl aning Sch dul s
(1) P riodical cl aning using w t typ cl aning disk.
i. Onc a month for normal usag in normal
nvironm nts.
ii. Should b incr as d to about onc a w k wh n
us d in s v r nvironm nts such as dusty ar a,
high humidity, high and low xtr m t mparatur s.
Low t mp ratur such as 5 to 10°C (41 to 50°F)
und r high humidity is most s v r for disk tt s.
iii. High r fr qu ncy for brand n w driv s would b
r comm nd d, for about onc a w k. B tt r
matchning b tw n h ad and m dium would b
produc d by a long tim us , as xp ri nc d.
(2) Wh n fr qu nt rrors ar d t ct d. (W t or dry typ
may b us d.)
(3) Wh n scratch ( s) ar found on th m dium surfac .
(W t or dry typ may b us d.)
2) R comm nd d H ad Cl aning Mat rial
(1) W t typ
Innovativ Comput r Products*, H ad Cl aning Kit
(or quival nt).
*9174 D ring Av ., Chatsworth, CA 91311
(213) 998-24 00/TWX 910-493-2188
(2) Dry typ
To b suppli d by Mitsubishi r pr s ntativ s. No
substitutions would b allowabl unl ss acc pt d
by factory t st.