
3.6. LOW FREQUENCY MEASUREMENTS
Special
care
should
be
taken when
low
frequency measurements
are
carried out. Piezoelectric ceramic accelerometers on account
of
pyroelectric
effects
will
yield a
low
frequency
output
when subjected
to
temperature
variations. Since the frequency response
of
the Preamplifier
can
go down
to
0.3 Hz, these
low
frequency variations
can
be
seen
on the
output
of
the
amplifier.
To
eliminate this effect, the position
of
the selector giving the
highest possible
low
frequency
cut-off
should
be
used
as
a general rule.
If
wide temperature fluctuations
are
encountered, Quartz Ace. Type 8304
should
be
used.
3.7. HUM & NOISE REDUCTION
For
correct operation
of
the instrumentation, the effects
of
hum
and
noise fields should be
cut
down
to
a
minimum.
The
following
remarks may
help
as
a useful guide in reducing the effects.
Avoid
earth loops through which serious hum problems could arise. Make
the screen
of
the
output
cable the
only
connection between the preamplifier
and the
following
instruments.
If
the main transformer in a power amplifier
has
considerable capacitance between its windings,
it
is
best
to
ground the
amplifier, making this the one
and
only
earth
point
in the system. Since
most accelerometers
have
their casing
as
one connection, they must
be
isolated
from
the test object
if
it
is
grounded
by
a metal structure.
If
the
transformer
output
of
the Preamplifier Type 2626
is
used,
this
is
not
neces-
sary.
For
minimizing wind-induced noise,
an
efficient
draught shield
can
be
of
great help,
even
in
an
apparently still room.
If
necessary
an
accelerometer
of
higher charge sensitivity may
be
used.
3.8.
EVALUATION
OF NOISE REFERRED TO INPUT
Noise in a charge
amplifier
is
dependent upon active
input
devices
and
input
source capacitance C5 (consisting
of
transducer capacitance and cable
capacitance).
For
evaluation
of
the noise the feedback capacitance Cf
of
the
amplifier and
input
noise must
be
known. As the Conditioning
Amplifier
Type 2626
has
a Field
Effect
Transistor
input
stage,
only
the voltage noise
en
has
to
be
considered
for
an
approx. calcuI
at
ion
of
wide band noise,
Fig.3.1.
15