IST 878 User manual
MODEL 878
IST
IST MODEL 878
TECHNICAL SPECIFICATIONS
IST
Information Scan Technology, Inc.
487 Gianni St., Santa Clara, California 95054
Phone: 408.988.1908
Fax: 408.980.1794
Web: www.infoscantech.com
PROGRAMMABLE PARAMETRIC TESTER
FOR SEMICONDUCTOR DEVICES
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit
testing for a wide range of discrete semiconductors including:
• Bipolar Transistors
• MOSFETs
• IGBTs
• Diodes
• Zener Diodes
• Junction FETs
• SCRs
• TRIAC
• Optoisolators
• Voltage Regulators
• TVS (Varistors,
SIDACs)
LOW DRIVE Ic ≤ 10 ma
Ib ≤ 0.9 ma
HIGH DRIVE Ic ≤ 350 ma
Ib ≤ 75 ma
DRIVING PULSE ≤ 300 us
DRIVING CONDITION IN FUNCTIONAL TEST
DUT OUTPUT LEVEL THRESHOLD LEVEL
LOGIC OUT-CIRCUIT IN-CIRCUIT
HIGH 11.0 V 6.80 V
LOW 1.18 V 2.20 V
RANGE LOW HIGH
13 ma 50 ma
210 ma 150 ma
330 ma 400 ma
435 ma 500 ma
540 ma 650 ma
650 ma 750 ma
770 ma 1000 ma
CONSTANT CURRENT SOURCE
DIODE FORWARD VOLTAGE (Vf) MEASUREMENT
MIN. Vf > 0.1 V WITH FORWARD CURRENT FROM 50 ma
to 1,000 ma
ZENER DIODE BREAKDOWN VOLTAGE (Vz)
FROM 0.1V TO 30V WITH BIAS CURRENT FROM 3 ma TO 80 ma
VOLTAGE REGULATOR OUTPUT VOLTAGE (+/- Vo)
FROM 0.2 V to 26.0 V WITH OUTPUT LOADING CURRENT FROM
50 ma to 1.0 AMP
TEST RANGE*RESOLUTION ACCURACY GIVEN VOLTAGE
0-400 uA 0.1 nA +/- 2% 0-1,099 V Programmable
0-4 uA 1 nA +/- 1% 0-1,099 V Programmable
0-40 uA 10 nA +/- 1% 0-1,099 V Programmable
0-400 uA 100 nA +/- 1% 0-1,099 V Programmable
0-4 mA 1 uA +/- 1% 0-1,099 V Programmable
0-40 mA 10 uA +/- 1% Not Available
PARAMETERS FOR LEAKAGE CURRENT MEASUREMENT
TEST RANGE*RESOLUTION ACCURACY GIVEN VOLTAGE
0-400 uA 0.1 nA +/- 2% 0-30 V Programmable
0-4 uA 1 nA +/- 1% 0-30 V Programmable
0-40 uA 10 nA +/- 1% 0-30 V Programmable
0-400 uA 100 nA +/- 1% 0-30 V Programmable
0-4 mA 1 uA +/- 1% 0-30 V Programmable
0-40 mA 10 uA +/- 1% 0-30 V Programmable
MOSFET AND J-FET LEAKAGE CURRENT MEASUREMENTS
MOSFET: Igss J-FET: Idss, Igss
PARAMETERS FOR BREAKDOWN VOLTAGE MEASUREMENT
BIPOLAR / MOSFET TRANSISTORS: BVceo, BVces, BVcbo, & VBdss
DIODE: BVr THYRISTOR: BVdrm
TEST RANGE RESOLUTION ACCURACY GIVEN CURRENT
0-30 V 0.03 V +/- 1% 0-40 mA auto-ranging
30-1,099 V 1.05 V +/- 1% 0-4 mA auto-ranging
HIGH VOLTAGE SUPPLY
Max Output Voltage: 1,099 V
Max Output Wattage: 3 W
DIMENSIONS:
9.2” WIDE x 6.3” DEEP x 2.8” HIGH (23.3 cm x 16 cm x 7.1 cm)
SHIPPING WEIGHT:
7.5 lbs (3.4kg)
AC/AC POWER ADAPTOR:
INPUT: 120 VAC or 220 VAC +/- 5% 50/60 Hz
OUTPUT: 36 VAC with C.T. 800mA Max.
ACCESSORIES FURNISHED:
• 120 V or 220 V AC POWER ADAPTOR
• INSTRUCTION MANUAL
• THREE POINT PROBING DEVICE FOR IN-CIRCUIT TESTING
• TEST SOCKET ADAPTOR FOR TESTING SMD PACKAGES
OPTIONAL ACCESSORIES:
• THREE COLOR CODED TEST LEADS w/MINI PLUGS & TEST CLIPS
• TEST SOCKET ADAPTOR FOR TESTING OPTOISOLATORS
• HEAVY DUTY TEST SOCKET ADAPTOR FOR HIGH VOLUME
PRODUCTION TEST
BIPOLAR / MOSFET TRANSISTORS: Ices, Iceo, Icbo, & Idss
DIODE: Ir THYRISTOR (SCR/TRIAC): Idrm
* - Autoranging
No Setup
Self conguring test set-up allows for arbitrary loading of the Device
Under Test (DUT). The DUT’s polarity, function, and orientation is auto-
matically detected. There’s no need to nd the right pin to access before
testing.
Accessible Results
Pass or fail LEDs indicators quickly shows testing result status. A backlit
LCD display shows observed measurements: parameter data, device type,
device classication, and the function or polarity of each pin.
Detects Current Leaks
Sensitive current measurement detects damaged or degraded devices with
leakage problems.
Versatile Operation
Multiple test sockets and test slot adaptor provides support for most types
of through-hole and SMD component testing.
Constant Current Sink or Current Bias
Switches between a constant current sink for regulator output loading or
current bias for measuring Diode or Zener Diode voltage.
Fingertip Test Activation
3-point probing device with ngertip test activation button makes in-cir-
cuit PCB testing fast and easy.
Programmable Voltage Source
Programmable voltage source up to 1,099 volts for breakdown voltage
and leakage current testing.
Includes 22 Types of Testing Routines.
• Bipolar Transistors (Iceo, Ices, Icbo, BVceo, BVces, BVcbo)
• MOSFETs (Idss, Igss, BVdss)
• Diodes (Ir, BVr, Vf)
• Zener Diodes (Vz, Iz)
• Thyristor (Idrm, BVdrm)
• J-FET (Idss, Igss)
• Optoisolator (Iceo)
• Regulator (+/- Vo, +/- I load)
• I leakage*
* - Measures the voltage and current across any two terminals up to
1,099V for voltage and down to the “nA” range for current. Used for
testing the clamping voltage (Vbr) of Transient Voltage Suppressors,
measuring the input impedance of a device (by OHM’s law R=V/I), or
detecting leakage current between two points (I leak).
FEATURES AND ADVANTAGES
INTRODUCING THE IST MODEL 878
PROGRAMMABLE PARAMETRIC TESTER
FOR SEMICONDUCTOR DEVICES
Parameter / Function Switch – Selects
between a detailed parametric test or a self-
conguring function and leakage current test
Device and Parameter Indicators – LEDs show
test settings with parameter indicated with a
green light and test type with a red light.
Measurement / Testing Mode – Indicates
current mode as measurement or Go / No
Go testing mode.
Low/High Drive – Indicates that the DUT
requires low or higher driving current in order
to pass function tests. Higher driving current
indicates DUT has poor current gain or some
degree of malfunction.
Test Adaptor Sockets – Sockets for test leads with miniature banana
plugs or test adaptors for SMD and Optoisolator testing.
Ready / High Voltage Indicator – LED turns
green when all test conditions are entered and
red to indicate when a test is in progress and
high voltage is being applied to the DUT.
Start Button – When the green “Ready” LED is
lit, this button initializes an out-circuit test.
DUT Test Sockets – The Device Under Test (DUT)
can be loaded into one of the three test sockets
in any direction without regard to the function
or polarity of each pin. Function and polarity of
corresponding pins are detected automatically
during testing and are shown on the LCD display
once the test is completed.
LCD Display and Status Indicator – The 2x24
LCD display shows user prompts, test results,
and other operating information. The Pass or Fail
LED shows the test result of a functional test or
Parametric Go/No Go Test.
Function Key Switches – Keys to select and
setup testing procedure desired. Use to choose
device type, parameters, and test condition
values. Also used to clear test settings or to
interrupt a test in progress.
