Larsen & Toubro Universal Test Kit User manual

Instruction Manual
Universal Test Kit
User Manual
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Table Of Contents:-
1. Testkit Identification
1.1 Front Panel
1.2 Rear Panel
2. Testkit accessories
2.1 Cables and Their Part Numbers
3. How To Power-ON the Testkit
3.1 Connection Diagram
4. Terminology
4.1 Abbrevations used in testing
5. How to do the setting while testing release
5.1 Navigation flow
6. Current to be injected for different test
6.1 Basic specification
6.2 Additional Specification ( only for UNRS 3 and SR 71)
6.3 Test Procedure
7. How to connect with each release
7.1 Precaution to be taken while connecting to each release
8. Cable images
9. Protection Curves
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A- LCD Display
B- Navigation Keys (Up, Down, Left, Right, Enter)
C- Red Biscuit LED
D- Green Biscuit LED
E- Communication Indicator LED
F- Test Button
G- Power Supply Button
H- Power Supply LED

I- Power Supply Connector
J-Communication Connector (SR 71 / UNRS 3)
K- Testkit Connector
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2) Testkit accessories
2.1 Cables and their part numbers
1) CL00889 : Comm. Cable (UN-RS3)
2) CL00890 : Main Cable (UN-RS3)
3) CL00892 : Cable for UN-RS1,2 series
4) XK13219 : Power Cord
5) CL00696 : Comm. Cable (SR 71)
6) CL00697 : Comm. Cable (SR 71)
7) CL00891 : Sub cable ( UNRS3 & SR 71)
8) CL00032 : Cable assembly (SR 18 / SR 21i / SR 18G/SR 18GD/SR 18GDi)
9) CL00033 : Cable assembly (MTX MCCBs)
10) CL00038 : Cable assembly (RC MCCBs)
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3) How To Power-ON the Testkit
3.1 Connection Diagram
3.1.1 Test kit Rear panel
- It has power cable connector, communication connector
and 15 pin test kit connector.
- Power connector is used to Power-ON the testkit through .power cord ( Part No. Xk13219)
- 15 Pin Test kit connector for connecting cable is used to test the releases.
-. The voltage required to Power-ON the testkit is 240 Vac
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- Communication connector is used for SR 71 and UN-RS3.

4) Terminology
4.1 Abbrevations :
5) How to do the settings while testing release
5.1 Navigation flow
5.1.1 Main screen after power ON & completion of self-test
Abbrevation
In
Ir
Tr
It
MES
i-dis
Tk-id
Comm.I.d
full form
Nominal Current
Rated Current
Delay time@ 6In
Test Value
Measured Value
I discrimination
test kit I.d
Communication I.d
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-DB9
-DB15
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6) Current to be injected for different test
6.1 Basic Specification
6.2 Additional Specification ( only for UNRS 3 and SR 71)
6.2.1 View records : Maximum last 10 records can be viewed.
6.2.2 Reset release password : Testkit has a provision to reset release’s password to
default factory password 0000.
6.2.3 Download trip records : Release trip records can be downloaded in test kit by
this command.
6.2.4 Data Recovery : This command is helpful to recover the actual settings of the
release in case of communication link failure while writing settings to release.
Table: 1(ACB)
Note - Instantaneous above 10In not supported by test kit.
B
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6.3 Test Procedure
a) Switch ON the testkit and connect the respective test cable to release and testkit connector
b) Set the pickup setting in the release for the test(O/L,S/C,E/F,Inst) which needs to be
Note:- Ensure while doing any particular test the other protection settings in the release
d) Set the test current value in test kit equal to the pick up setting of the release.
c) Set the same time delay of particular test in the release as well as in teskit.
e) Refer 5.1.2 for the navigation flow in test kit.
f) Refer Table 1 for ACB & Table 2 for MCCB to identify the type of test can be tested through
testkit.
Screen
Abbreviation Details
Currrent Setting(A),Ir = In x … Ir 0.4 to 1.0 in steps of
0.05xIn
Time Delay , Tr (s) at 6 x Ir tr 3,10
Test Current Value : It 2,4,6,8
Thermal Reflectivity THM-MEM
Currrent Setting(A),Is = In x … Is 1.5,2.5,4,5.5,6.5
Time Delay , Ts (ms) DELAY/I2T OFF 100ms
Test Current Value : It 2.5In to 13In in steps of
0.5In
Currrent Setting(A),Ip = In x … Ip 1.5,2.5,4,5.5,6.5
Test Current Value : It 2.5In to 13In in steps of
0.5In
Currrent Setting(A),Ig = In x … Ig 0.2,0.3,0.4,0.5,0.6
Time Delay (s), Tg Tg 0.1, 0.2 s
Test Current Value : It 0.25In to 0.7In in steps of
0.05
Table 2
Parameter
Overload (Phase)
Short-Circuit
I2t OFF
Instantaneous
Earth Fault
I2t OFF
(MCCB)
Note : S/C and Inst testing at 8In is not Supported by testkit
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Example:- While doing overload test , the other protection like Short-circuit,Earth-Fault,
of testkit
perfromed, also the same settings need to be done in testkit.
should be off.
Instatntaneous of the release should be turned OFF.

7 How to connect with each release
7.1 Precautions to be taken while connecting to each release
7.1.1 UN-RS3 RELEASE TEST SET UP
1) Connect the UN-PS module (AS+, AS-) to release.
2) Connect CL00889 (comm. Cable) to release.
3) Connect CL00890 & CL00891 back to back & the other end of the
CL00891 to test connector of the release.
4) Connect the Flux Shift Device to release.
5) Short digital i/ps DIO-DI1 on the release to get the fault indication after
every test.
6) Connect power chord XK13219 to Test kit.
7) TURN ON UN-PS module. Check the baud rate & node address of the
release. Set it to 9600 &1 respectively.
8) Turn on Test kit and set the COMM ID as 1. Do the settings of protections to
be tested as per Table1.
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9) Do the testing. After the issue of trip command, switch OFF and ON the
UN-PS module for the next test.
10)Reposition the FSD before start of each test to charged condition.
7.1.2 UN-RS1/2 RELEASE TEST SET UP
1) Connect CL00892 (test kit cable for UN-RS1/2) to release.
2) Connect the Flux Shift Device to release.
3) Connect the POWER CHORD XK13219 to Test kit.
4) Turn on the Test kit, do the settings of protections to be tested as per
Table1.
5) Do the testing.
6) Reposition the FSD before start of each test to charged condtion.
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7.1.3 SR71 RELEASE
1) Connect the UN-PS module (AS+ and AS-) to the release.
2) Connect CL00696 (Communication cable for SR71) to COM module
(D+ and D-) from there, connect DI , RE< Ro, VCC and GND
connection to the release.
3) Connect CL00890 and CL00891 back to back and the other end of
black line of the reset kit connector flat cable id on the user’s left hand
side.
4) Short the digits input (Breaker Status) on the release to get the fault
indication after every test.
5) Connect the power chord XK13219 to the test kit.
Note : Test will start after 1 sec of pressing the TEST key.
Comm. Cable CL00696
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6) Turn ON UNPS module. Check the baud rate and node address of the
release. Set it to 96000 and 1 respectively.
7) Turn ON test kit and set the COMM ID as 1. Configure the protection
settings to be tested as per Table1.
8) Follow the following instructions for testing.
a)Before the start of test , remove the communication cable (Cl00696)
that is connected at the back of the test kit.
b)Press the test button.
c)A message “Communication failed” will occur on the screen.
d)Now press enter.
e)Restore the connection of communication cable to the release.
f)Start the test again.
9) After the issue of trip command switch OFF and ON the UNPS module.
10) Reposition the FSD.
11) Go back to Step 8 in order to repeat the test.
Pick up(Ir):
Time Delay (Tr):
Test Value(It):
0.3In
0.5s
0.45In
Release Should trip
within 30 + 5S.
Release Should trip
within 400 + 40 mS
Release Should trip
within 70mS
Release Should trip
within 500 + 40 mS
Type Of Test
Overload
S/C Circuit I2t OFF
Instantaneous
E/F I2t OFF
Actions on Test kit Observations
Pick up(Ir):
Time Delay (Tr):
Test Value(It):
1In
30s
6In
Pick up(Ir):
Time Delay (Tr):
Test Value(It):
4In
400ms
5In
Pick up(Ir):
Test Value(It):
6In
9.5 In
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7.1.4 SR18 / SR18G-DB9 RELEASE
1) Connect CL00032 to release.
2)
3)
Connect the power chord XK13219 to test kit.
4)
Turn on test kit, do the settings of protections to be tested as per
Table 1.
5)
Do the testing.
Reposition the FSD before start of each test to charged condition.
Note :- SR18 release will be test under SR18G.
Note :- DB9 represent 9 pin test port connector.
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7.1.5 SR18G/SR18GD/GDi RELEASE-DB15
1) Connect CL00032 to release.
2)
3)
Connect the power chord XK13219 to test kit.
4)
Turn on test kit, do the settings of protections to be tested as per
Table 1.
5)
Do the testing.
Reposition the FSD before start of each test to charged condition.
Note :- DB15 represent 15 pin test port connector.
E/F I2T ON test not supported by test kit.
E/F I2T OFF non-trip test not supported by test kit.
B
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