Solver NEXT SPM. Instruction Manual
7.1.4.Contact Error Mode............................................................................................................ 76
7.1.4.1.Brief Description of the Mode...............................................................................................76
7.1.4.2.Preparation for Measurements...............................................................................................77
7.1.4.3.Scanning................................................................................................................................ 77
7.1.5.Piezoresponse Force Microscopy ....................................................................................... 78
7.1.5.1.Brief Description of the Mode...............................................................................................78
7.1.5.2.Preparation for Measurements...............................................................................................80
7.1.5.3.Adjusting Scanning Parameters.............................................................................................81
7.1.5.4.Scanning................................................................................................................................ 82
7.2.SEMICONTACT AFM....................................................................................................................... 84
7.2.1.Semicontact Mode ............................................................................................................... 84
7.2.1.1.Adjusting the Controller Configuration.................................................................................85
7.2.1.2.Adjusting Piezodrive Parameters ..........................................................................................85
7.2.1.3.Approaching the Sample to the Probe ...................................................................................89
7.2.1.4.Adjusting Working Level of the Feedback Gain...................................................................91
7.2.1.5.Adjusting Scanning Parameters.............................................................................................92
7.2.1.6.Scanning................................................................................................................................ 97
7.2.1.7.Saving Measurement Data .................................................................................................. 100
7.2.1.8.Completing Measurements..................................................................................................101
7.2.2.Semicontact Error Mode................................................................................................... 101
7.2.2.1.Brief Description of the Mode.............................................................................................101
7.2.2.2.Preparation for Measurements.............................................................................................102
7.2.2.3.Scanning.............................................................................................................................. 102
7.2.3.Phase Imaging Mode ........................................................................................................ 103
7.2.3.1.Brief Description of the Mode.............................................................................................103
7.2.3.2.Preparation for Measurements.............................................................................................104
7.2.3.3.Scanning.............................................................................................................................. 104
7.2.3.4.Modes of Improving Image Quality ....................................................................................105
7.3.MANY-PASS AFM TECHNIQUES ................................................................................................... 106
7.3.1.Magnetic Force Microscopy ............................................................................................. 106
7.3.1.1.Brief Description.................................................................................................................106
7.3.1.2.Procedural Sequence ........................................................................................................... 107
7.3.1.3.Adjusting Scanning Parameters...........................................................................................108
7.3.1.4.Scanning.............................................................................................................................. 109
7.3.2.Kelvin Probe Microscopy.................................................................................................. 110
7.3.2.1.Brief Description.................................................................................................................110
7.3.2.2.Procedural Sequence ........................................................................................................... 112
7.3.2.3.Adjusting Scanning Parameters...........................................................................................113
7.3.2.4.Testing SKM Operation Mode ............................................................................................ 113
7.3.2.5.Scanning.............................................................................................................................. 116
7.3.3.Electric Force Microscopy................................................................................................ 118
7.3.3.1.Brief Description of the Technique .....................................................................................118
7.3.3.2.Preparation for Measurements.............................................................................................120
7.3.3.3.Adjusting Scanning Parameters...........................................................................................121
7.3.3.4.Scanning.............................................................................................................................. 122
7.4.SCANNING TUNNELING MICROSCOPY........................................................................................... 125
7.4.1.Constant Current Mode .................................................................................................... 125
7.4.1.1.Adjusting the Controller Configuration...............................................................................126
7.4.1.2.Approaching the Sample to the Probe .................................................................................126
7.4.1.3.Adjusting Working Level of the Feedback Gain.................................................................131
7.4.1.4.Adjusting Scanning Parameters...........................................................................................132
7.4.1.5.Scanning.............................................................................................................................. 137
7.4.1.6.Saving Measurement Data .................................................................................................. 140
7.4.1.7.Completing Measurements..................................................................................................140
7.5.AFM SPECTROSCOPIES................................................................................................................. 141
7.5.1.Force-distance Spectroscopy ............................................................................................ 141
7.5.1.1.Selecting the Function to be Measured................................................................................142
7.5.1.2.Selecting Points for Spectroscopy ....................................................................................... 144
7.5.1.3.Starting the Measurements .................................................................................................. 147
7.5.1.4.Viewing Spectroscopy Data ................................................................................................147
7.5.1.5.Calculating Adhesion Force ................................................................................................150
7.5.1.6.Saving Measurement Data .................................................................................................. 152
7.5.2.Amplitude Spectroscopy Mag(Z)....................................................................................... 152
7.5.2.1.Configuring and Making Measurements .............................................................................152
7.5.2.2.Calibration of Cantilever Oscillations Amplitude ...............................................................154
7.5.3.Current Spectroscopy I(V) ................................................................................................ 156
