Oxford Instruments 233 User manual

233
User Manual
P/N: 51-98-3090-00022
Oxford Instruments Coating Measurement
360 El Pueblo Rd, Scotts Valley CA 95066
Tel: [phone] Fax: [phone]
Email: [e-mail]
www.coatingmeasurementstore.com
Non-Warranty Customer Service:
[email protected] [phone]
© Copyright 2006 Oxford Instruments
Measurement Systems
The information in this document is private and confidential and must not be copied.
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INTRODUCTION........................................................................................................................................ 4
PURPOSE OF EQUIPMENT ............................................................................................................................ 4
LOCATION OF INSTRUMENT........................................................................................................................ 4
ELECTRICAL CONNECTIONS ....................................................................................................................... 4
SETUP........................................................................................................................................................... 4
UNPACKING................................................................................................................................................ 4
CABLE CONNECTIONS ................................................................................................................................ 4
POWER ON/OFF......................................................................................................................................... 4
PROBE ........................................................................................................................................................ 5
UNITS ......................................................................................................................................................... 5
MEASUREMENT .......................................................................................................................................... 5
Continuous Mode.................................................................................................................................. 5
Regular Mode ....................................................................................................................................... 5
Scan Mode............................................................................................................................................. 5
MEMORY STRUCTURE ................................................................................................................................ 5
APPLICATIONS............................................................................................................................................ 6
SAMPLE FOR MEASUREMENT..................................................................................................................... 6
UNIT OPERATION..................................................................................................................................... 6
PROBE TUNING........................................................................................................................................... 6
CALIBRATIONS ........................................................................................................................................... 6
Universal Calibrations.......................................................................................................................... 6
How to Store Individual and Universal Calibrations ........................................................................... 6
How to Assign Universal Calibration Locations.................................................................................. 7
How to Make Calibrations.................................................................................................................... 7
One Point Calibration........................................................................................................................... 7
Two Point Calibration .......................................................................................................................... 8
Base Calibration................................................................................................................................... 9
Surface Roughness Calibration ............................................................................................................ 9
MEMORY MANAGEMENT...........................................................................................................................10
Memory Structure ................................................................................................................................10
How to Select A Memory Location ......................................................................................................10
How to Clear a Memory Location .......................................................................................................10
How to Clear all Memory Locations....................................................................................................11
HOW TO TAKE MEASUREMENTS................................................................................................................11
Regular Mode ......................................................................................................................................11
Continuous Mode.................................................................................................................................11
Scan Mode............................................................................................................................................12
STATISTICS................................................................................................................................................13
Viewing the Statistics...........................................................................................................................13
Clearing the Statistics..........................................................................................................................13
OFFSETS ....................................................................................................................................................14
How to Enter an Offset ........................................................................................................................14
How to Clear an Offset ........................................................................................................................14
LIMITS .......................................................................................................................................................14
How to Set Limits.................................................................................................................................15
How to Remove Limits .........................................................................................................................15
DATE AND TIME STAMP ............................................................................................................................15
Memory Capacity.................................................................................................................................15
Setting the Date and Time....................................................................................................................15
Printing the Date and Time..................................................................................................................16
OUTPUT SELECTIONS.................................................................................................................................16
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Separator Character............................................................................................................................16
Blocks...................................................................................................................................................17
PRINTING OUTPUT.....................................................................................................................................18
SERIAL OUTPUT.........................................................................................................................................18
APPENDIX A ..............................................................................................................................................19
Troubleshooting...................................................................................................................................19
APPENDIX B...............................................................................................................................................21
Eddy Current........................................................................................................................................21
Magnetic Induction..............................................................................................................................23
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INTRODUCTION
PURPOSE OF EQUIPMENT
The 233 is a dedicated non-destructive plating thickness tester. It is designed to
precisely measure nonconductive coatings on conductive substrates and/or
nonmagnetic coatings on magnetic substrates.
LOCATION OF INSTRUMENT
The 233 is a hand-held plating thickness gage designed to be used in a shop
environment. All cable connections are covered to prohibit foreign matter from
getting into the unit. The carrying case provides additional coverage of any
openings on the unit.
ELECTRICAL CONNECTIONS
Each 233 operates from a 9-volt battery or a low voltage power supply connected
to a 115-volt, 50/60 Hertz, single-phase alternating current power source. If a
battery is the source of power to the gage, when the battery voltage drops below
the level required for operation a low battery condition will occur. The unit will
show “BAT” in the lower right of the display. The battery should be replaced with
an alkaline type before the unit will function properly.
SETUP
UNPACKING
Carefully open and inspect the shipping box, and remove all items. Notify Oxford
Instruments and/or the carrier immediately in case of damage to the unit.
CABLE CONNECTIONS
There are three connectors provided at the top on the unit. Each cable
connection to the 233 is unique to prevent incorrect connection. There is a
phone type jack for connection of the printing or serial dump cable, a jack for the
connection of a low voltage power supply, and a polarized 6 pin threaded
connector for the probe. Connection of any other external device may damage
the gage.
POWER ON/OFF
The unit can be turned on at any time by pressing the ON/OFF key. The
ON/OFF key turns off the unit or it will turn off automatically after ten minutes
have passed and no entry or measurement has been made. When the unit is
turned on, the software version will show in the upper left of the display and the
model number will flash in the main display. After this, the display will show the
last reading taken in the main display and the memory location in the upper left of
the display.
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PROBE
The 233 uses the ECP, SMP-1, and SMP-2 probes. It utilizes Eddy Current (with
the ECP) or Magnetic Induction technology (with the SMP-1 and SMP-2) to
perform the coating measurement. For more information on the theory of these
technologies see Appendix B.
UNITS
The measurement units can be changed from mils (1/1000 in) to um
(micrometer) by pressing the ZERO/UNITS key. Both statistics and readings will
be changed to reflect the units selected.
MEASUREMENT
The gage must be calibrated before measurements can be made.
Measurements can be taken in Continuous Mode (with an activation setting, see
How to Take Measurements —Continuous Mode), Regular Mode or Scan Mode.
Pressing the C/M key changes the mode of measurement.
Continuous Mode
When the probe is placed on a sample, instantaneous readings are displayed.
These readings cannot be saved into the statistics unless the Capture feature is
activated. Refer to the section on How to Take Measurements -- Continuous
Mode for directions on activating this feature. When the probe is placed in air
“InF” will show on the display until the probe is placed on a sample.
Regular Mode
When the probe is placed in contact with a sample a single reading is taken,
displayed, and saved into the statistics. When the probe is placed in air, the last
reading taken will remain on the display until another reading is taken.
Scan Mode
The 233 can be configured with optional Scan Mode software. Units with this
feature allow for moving the probe around the surface of a sample to obtain an
average thickness of the coating. This feature is useful when measuring large
parts, samples where the thickness of the coating varies across the surface,
sandblasted parts, and textured surfaces. The probe must be held in contact
with the sample, while being slid across its surface, for the specified scan time.
Readings are continuously being taken at a rate of approximately 2 readings per
second. After the scan time has elapsed, three beeps will sound and the word
“dOnE” will show in the main display. The mean, low, or high value of the
readings can be shown and inserted as one measurement into the statistics. The
scan time can be set from 1 to 60 seconds. The mode of printing or displaying
the statistics can be selected. See How to Take Measurements — Scan Mode.
MEMORY STRUCTURE
Memory locations 1 to 99 are available. Each location stores a calibration,
statistics and readings. Locations 1 to 50 are allocated for Magnetic applications
and locations 51 to 99 for Eddy Current applications. The memory location is
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shown in the upper left of the display. “FE” shows in the lower left of the display
for Magnetic applications and “NON-FE” shows for Eddy Current applications.
APPLICATIONS
The Eddy Current and Magnetic applications thickness ranges for measurement
are given below.
Application
Thickness Range
Display
Probe
Eddy Current
0 to 40 mil/1016 um
“NON-FE”
ECP
Magnetic
0 to 50 mil/1270 um
“FE”
SMP-1
Magnetic
0 to 120 mil/3048
“FE”
SMP-2
SAMPLE FOR MEASUREMENT
The sample must be clean and free of surface defects for proper measurement.
UNIT OPERATION
PROBE TUNING
For each probe this procedure must be performed.
1. Connect the probe to the gage and turn it on.
2. Press the key sequence “٭” “1” “1” “1” ENTER.
3. The word “tunE” will appear on the display for about 5 seconds, and the
unit will turn off.
4. The probe is now tuned and the gage can be turned on and used.
CALIBRATIONS
Universal Calibrations
The Universal Calibration feature allows the user to make one calibration that
then can be used by an assigned number of memory locations. This feature
saves time in the calibration process, and allows statistics to be stored in
separate memory locations.
How to Store Individual and Universal Calibrations
Individual calibrations can be stored in any active memory location. Universal
Calibrations can only be stored in memory locations 1 and 51 for Eddy Current
and Magnetic applications, respectively. The individual calibration will apply only
to that memory location. Calibrations are automatically stored in the memory
location where they are performed.
1. To make and store a Universal Calibration for a Magnetic application
select memory location 1 or for an Eddy Current application, select
memory location 51. To select a memory location, refer to Memory
Management: How to Select a Memory Location. Then calibrate the gage
as described in How to Make Calibrations.
2. To make and store an individual calibration choose any location from 1 to
51 for a Magnetic application and 51 to 99 for an Eddy Current application.
Then calibrate the gage as described in How to Make Calibrations.
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3. To reset all locations to use the Universal Calibration, perform the
procedure in step 1.
How to Assign Universal Calibration Locations
A number, N, of memory locations can be can be assigned to use the Universal
Calibration. The maximum value of N for the Magnetic application is 50 and for
the Eddy Current application is 49, which corresponds to the total memory
locations for each of these application types.
1. Press the key sequence “٭” “9” ENTER. The letters “uc” will appear in the
upper left corner of the display, and the number of locations previously
assigned will appear on the display. The default value is one.
2. Using the numerical keys, enter the number of memory locations that are
to use the universal calibration and press ENTER.
How to Make Calibrations
Four types of calibrations can be performed.
1. A two point calibration must be performed once on a gage. All gages
come with a two point factory calibration. This calibration should be
performed again if a new probe is to be used.
2. Once the two point calibration has been made, the one point calibration
can be used to quickly reset the gage.
3. After a two point calibration has been made, the base calibration can be
used to re-zero the gage and allow the use of the same calibration on
samples with a different base material.
4. The surface roughness calibration is used with parts that have varying
coating thickness, an uneven surface, and/or variations in the base alloy.
One Point Calibration
For this calibration, use the shim whose value is closest to the actual coating
thickness to be measured, or according to the expected measurement range.
See table below. For ranges greater than 10 mils (254um), consult Oxford
Instruments Technical support for shim size information.
1. Select the memory location for the re-calibration as described in Memory
Management: How to Select a Memory Location.
2. To re-zero the unit:
a. Press the CAL key.
b. Place the probe on the bare part.
c. Press the ZERO/UNITS key.
d. Lift the probe off the bare part and wait for the beep.
3. To reset the thickness:
a. Re-zero the unit as stated in step 2.
b. Place the desired shim over the bare part.
c. Press the CAL key.
Measurement Range
Shim
Less than 1 mil
1 mil (25.4 um)
Greater than 1 mil
10 mil (254 um
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d. Place the probe on the shim over the bare part.
e. Enter the thickness of the shim, lift the probe at least 3 inches (76
mm) away from the part, and press the ENTER key. Once a
numerical key has been pressed, the probe can be lifted from the
shim without affecting the calibration.
Two Point Calibration
The two point calibration is performed with two shims according to the expected
measurement range. See table below. For ranges greater than 10 mils (254
um), consult Oxford Instruments Technical Support for shim size information.
NOTE: After a Zero Calibration, 0.00 will appear on the display. After a
thickness calibration, the value entered will appear on the display. Neither of
these readings will affect the statistics.
CAUTION: When a calibration (or a re-calibration) is made while in location 1, or
location 51, the new calibration will overwrite all calibrations assigned to the
universal calibration. See Calibrations – How to Assign Universal Calibration
Locations.
1. Select the memory location for the calibration as described in Memory
Management: How to Select a Memory Location.
2. Press the CAL key. The word CAL will appear on the right of the display
and “C” will appear in the upper left.
3. Place the probe on the bare part and press the ZERO/UNITS key.
4. Lift the probe off the bare part and wait for the beep.
5. Press the “٭” key and the press the CAL key. The word CAL will appear
on the right side of the display and “C1” will appear in the upper left.
6. Place the first shim on the bare part and place the probe over the shim.
7. A thickness will be displayed on the unit. Enter the thickness of the shim
using the numerical keys, even if the displayed value is correct. Once a
numerical key has been pressed, the probe can be lifted from the shim
without affecting the calibrations.
8. Check the display. If incorrect, press the CLEAR key and re-enter the
number. When finished, lift the probe at least 3 inches (76 mm) away
from the part and press the ENTER key. The display will now show “C2”
in the upper left corner.
9. Place the second shim on the bare part and place the probe over the
shim.
10.A thickness will be displayed on the unit. Enter the thickness of the shim
using the numerical keys, even if the displayed value is correct. Once a
numerical key has been pressed, the probe can be lifted from the shim
without affecting the calibration.
Measurement Range
First Shim Value
Second Shim Value
Less than 1 mil
0.2 mil (5.08 um)
1 mil (25.4 um)
Greater than 1 mil
1 mil (25.4 um)
10 mil (254 um)
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11.Check the display. If incorrect, press the CLEAR key and re-enter the
number. When finished, lift the probe at least 3 inches (76 mm) away
from the part and press the ENTER key.
12.The 233 is now calibrated and ready for measurement.
Base Calibration
1. Press the CAL key.
2. Place the probe on the bare part of the different base material.
3. Press the ZERO/UNITS key.
4. Lift the probe off the bare sample and wait for the beep.
Surface Roughness Calibration
This calibration consists of taking readings on several points over the surface of
the bare part and again with shims, instead of taking a reading at just one spot.
The averages of the bare readings and the readings taken with the shims are
stored as the calibration. If a surface roughness calibration is necessary, more
than likely the individual readings taken on coated parts will vary. To lessen the
variation in the readings it is suggested that an average reading be taken. The
averages should be fairly consistent.
1. Select the memory location for the calibration as described in Memory
Management: How to Select a Memory Location.
2. Press the CAL key. The word CAL will appear in the right side of the
display and “C” will appear in the upper left.
3. Place the probe on the bare part.
4. Wait for the reading to stabilize, then press the ENTER key.
5. Repeat steps 3 and 4 (up to 9 times), moving the probe around the entire
part. A “Cn” will be displayed on the upper left, with n representing the
number of readings taken so far in the calibration.
6. Press the ZERO/UNITS key.
7. Press the “٭” key, then press the CAL key. The word CAL will appear on
the right and “C1” will appear in the upper left.
8. Place the 1 mil (25.4 um) shim on the bare part. Place the probe over the
shim. Wait for the reading to stabilize, then press the ENTER key.
9. Repeat step 8 (up to 9 times), moving the probe and shim around the
entire part so as to take readings over the area of interest.
10.After the last measurement has been taken, enter the thickness of the
shim using the numerical keys. Once a numerical key has been pressed,
the probe can be lifted from the shim without affecting the calibration.
11.Check the display. If incorrect, press the CLEAR key and then re-enter
the number. When finished, lift the probe at least 3 inches (76 mm) away
from the part and press the ENTER key.
12.The display will now show “C2” in the upper left corner.
13.Place the 10 mil (254) shim on the bare part. Place the probe over the
shim. Wait for the reading to stabilize, then press the ENTER key.
14.Repeat step 13 up to a maximum of 9 times. Move the probe and shim
around the entire part to take readings over a large area.
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15.After the last measurement has been taken, enter the thickness of the
shim using the numerical keys. Once a numerical key has been pressed,
the probe can be lifted from the shim.
16.Check the display. If incorrect, press the CLEAR key and then re-enter
the number. When finished, lift the probe at least the probe at least 3
inches (76 mm) away from the part and press the ENTER key.
17.The 233 gage is now calibrated and ready for measurement.
MEMORY MANAGEMENT
Memory Structure
The 233 has 99 memory locations. Each location stores a calibration, statistics
and readings. Locations 1 to 50 are allocated for Magnetic applications and
location’s 51 to 99 for Eddy Current applications. The memory location is shown
in the upper left of the display. “FE” shows in the lower left of the display for
Magnetic applications and “NON-FE” shows for Eddy Current applications.
When the gage is turned on (and the probe has not been changed), it selects the
last memory location that was used to take measurements and displays the last
reading for the application last used to take a measurement.
How to Select A Memory Location
A memory location must be made active before it can be used to store
information. To activate a memory location, select it by using Method 1. To
select memory locations that already are active, use either of the following
methods.
Method 1
1. Press the SEL key. The word SEL will appear on the display.
2. Enter the desired memory location (1-99) using the numerical keys. The
location number will appear in the upper left of the display.
3. Press the ENTER key.
4. The unit will beep twice if this memory location was just activated and
0.000 will show in the main display, otherwise the unit will beep once and
the last reading taken will show in the main display.
Method 2
1. Press the SEL key. The word SEL will appear on the display.
2. Press the SEL key again, causing the display to scroll through the active
memory locations. The location number will appear in the upper left of the
display.
3. When the desired memory location is displayed, press the ENTER key.
4. The last reading taken will show in the main display.
How to Clear a Memory Location
When a memory location is cleared it is deactivated and all statistics,
measurements, and parameters are deleted. If memory location 1, and /or
location 51 are cleared, all memory locations that are assigned to that universal
calibration will also be cleared. A memory location can be cleared using one of
the following methods.
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