Agilent Technologies 1670G Series User manual

Service Guide
Publication number 01670-97023
November 2003
For Safety information, Warranties, and Regulatory
information, see the pages at the end of the book.
Copyright Agilent Technologies 1987–2003
All Rights Reserved.
Agilent Technologies 1670G-Series
Logic Analyzers

Agilent Technologies 1670G-Series Logic Analyzers
The Agilent 1670G-Series are 150-MHz State/500-MHz Timing Logic Analyzers. There are two
options available. One option is to add a 2 GSa/s digitizing oscilloscope. Another option is to
add a 32 channel pattern generator.
Features
Some of the main features of the Agilent 1670G-Series Logic Analyzers are as follows:
•132 data channels and 4 clock/data channels in the Agilent 1670G
•98 data channels and 4 clock/data channels in the Agilent 1671G
•64 data channels and 4 clock/data channels in the Agilent 1672G
•32 data channels and 2 clock/data channels in the Agilent 1673G
•3.5-inch flexible disk drive
•2-GB hard disk drive
•GPIB, RS-232-C, Centronics, and LAN interfaces
•Thinlan and Ethertwist LAN ports
•Variable setup/hold time
•64K memory on all channels with 256K and 2M options
•Marker measurements
•12 levels of trigger sequencing for state and 10 levels of sequential triggering for
timing
•Full programmability
•DIN mouse
•DIN keyboard support
The pattern generator option includes the following features:
•15 output channels at 200 MHz
•32 output channels at 100 MHz
•Memory depth of 258,048 vectors
•Support for TTL, 3-state TTL/3.3v, 3-state TTL/CMOS, ECL terminated, ECL
unterminated, and differential ECL (without pod).
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•2 GSa/s digitizing for 500 MHz bandwidth single shot oscilloscope
•>32000 samples per channel
•Automatic pulse parameters displays time between markers, acquires until
specified time between markers is captured, performs statistical analysis on time
between markers
•Lightweight mini probes
Service Strategy
The service strategy for this instrument is the replacement of defective assemblies.
This service guide contains information for finding a defective assembly by testing
and servicing the Agilent 1670G-series logic analyzers.
This logic analyzer can be returned to Agilent for all service work, including
troubleshooting. Contact your nearest Agilent Technologies Sales Office for details.
Agilent Technologies 1670G-Series Logic Analyzer
iii

In This Book
This book is the service guide for the Agilent 1670G-Series Logic Analyzers and is divided into
eight chapters.
Chapter 1 contains information about the logic analyzer and includes accessories,
specifications and characteristics, and equipment required for servicing.
Chapter 2 tells how to prepare the logic analyzer for use.
Chapter 3 gives instructions on how to test the performance of the logic analyzer.
Chapter 4 contains calibration instructions for the logic analyzer.
Chapter 5 contains self-tests and flowcharts for troubleshooting the logic analyzer.
Chapter 6 tells how to replace assemblies of the logic analyzer and how to return them to
Agilent Technologies.
Chapter 7 lists replaceable parts, shows an exploded view, and gives ordering information.
Chapter 8 explains how the logic analyzer works and what the self-tests are checking.
iv

Table of Contents
Service Strategy 1–iii
1 General Information
Accessories 1–2
Specifications (logic analyzer) 1–3
Specifications (oscilloscope) 1–4
Specifications (pattern generator) 1–4
Characteristics (logic analyzer) 1–5
Characteristics (oscilloscope) 1–5
Characteristics (pattern generator) 1–6
Recommended Test Equipment (logic analyzer) 1–9
Recommended test equipment (oscilloscope) 1–10
Recommended test equipment (pattern generator) 1–11
2 Preparing for Use
To inspect the logic analyzer 2–2
To apply power 2–3
To operate the user interface 2–3
To clean the logic analyzer 2–3
To test the logic analyzer 2–4
3 Testing Performance
To perform the self-tests 3–3
To make the test connectors (logic analyzer) 3–7
To test the threshold accuracy (logic analyzer) 3–9
Set up the equipment 3–9
Set up the logic analyzer 3–10
Connect the logic analyzer 3–12
Test the ECL Threshold 3–13
Test the 0 V User threshold 3–15
Test the next pod 3–16
To test the single-clock, single-edge, state acquisition (logic analyzer) 3–17
Set up the equipment 3–17
Set up the logic analyzer 3–18
Connect the logic analyzer 3–20
Verify the test signal 3–23
Check the setup/hold combination 3–24
Test the next channels 3–28
To test the multiple-clock, multiple-edge, state acquisition (logic analyzer) 3–29
Set up the equipment 3–29
Set up the logic analyzer 3–30
Connect the logic analyzer 3–32
Verify the test signal 3–35
v

Check the setup/hold with single clock edges, multiple clocks 3–36
Test the next channels 3–40
To test the single-clock, multiple-edge, state acquisition (logic analyzer) 3–41
Set up the equipment 3–41
Set up the logic analyzer 3–42
Connect the logic analyzer 3–44
Verify the test signal 3–47
Check the setup/hold with single clock, multiple clock edges 3–49
Test the next channels 3–52
To test the time interval accuracy (logic analyzer) 3–53
Set up the equipment 3–53
Connect the logic analyzer 3–54
Set up the logic analyzer 3–55
Acquire the data 3–58
To test the input resistance (oscilloscope) 3–59
Set up the equipment 3–59
Set up the logic analyzer 3–60
Connect the logic analyzer 3–61
Acquire the data 3–62
Perform an operational accuracy calibration 3–62
To test the voltage measurement accuracy (oscilloscope) 3–63
Set up the equipment 3–63
Set up the logic analyzer 3–64
Connect the logic analyzer 3–65
Acquire the data 3–66
To test the offset accuracy (oscilloscope) 3–67
Set up the equipment 3–67
Set up the logic analyzer 3–68
Connect the logic analyzer 3–69
Acquire the zero input data 3–70
Acquire the DC input data 3–71
To test the bandwidth (oscilloscope) 3–72
Set up the equipment 3–72
Set up the logic analyzer 3–73
Connect the logic analyzer 3–75
Acquire the data 3–76
To test the time measurement accuracy (oscilloscope) 3–77
Set up the equipment 3–77
Set up the logic analyzer 3–78
Connect the logic analyzer 3–80
Contents
vi

Acquire the data 3–80
To test the trigger sensitivity (oscilloscope) 3–81
Set up the equipment 3–81
Set up the logic analyzer 3–82
Connect the logic analyzer 3–84
Acquire the data 3–84
Performance Test Record (logic analyzer) 3–85
Performance Test Record (oscilloscope) 3–88
Performance Test Record (pattern generator) 3–91
4 Calibrating and Adjusting
Logic analyzer calibration 4–2
To calibrate the oscilloscope 4–3
Set up the equipment 4–3
Load the Default Calibration Factors 4–4
Self Cal menu calibrations 4–5
To test the CAL OUTPUT ports 4–6
Set up the equipment 4–6
Set up the logic analyzer 4–7
Verify the DC CAL OUTPUT port 4–8
Set up the logic analyzer 4–9
Verify the AC CAL OUTPUT port 4–9
5 Troubleshooting
To use the flowcharts 5–2
To check the power-up tests 5–11
To run the self-tests 5–12
To test the power supply voltages 5–20
To test the LCD display signals 5–21
To test the keyboard signals 5–22
To test the flexible disk drive voltages 5–24
To test the hard disk drive voltages 5–26
To perform the BNC test 5–28
To test the logic analyzer probe cables 5–29
To verify pattern output (pattern generator option only) 5–33
The Ether address 5–35
To test the auxiliary power 5–36
6 Replacing Assemblies
To remove and replace the handle 6–5
To remove and replace the feet and tilt stand 6–5
To remove and replace the cover 6–5
Contents
vii

To remove and replace the disk drive assembly 6–6
To remove and replace the acquisition board 6–7
To remove and replace the CPU board 6–9
To remove and replace SIMM memory 6–10
To remove and replace the rear panel 6–11
To remove and replace the power supply 6–12
To remove and replace the oscilloscope board (oscilloscope option only) 6–13
To remove and replace pattern generator board ( pattern generator option only) 6–14
To remove and replace the front panel and keyboard 6–15
To remove and replace the LCD display and Inverter board 6–16
To remove and replace the handle plate 6–17
To remove and replace the fan 6–18
To remove and replace the pattern generator cables (pattern generator option only) 6–18
To remove and replace the GPIB and RS-232-C cables 6–19
To remove and replace the I/O board 6–19
To return assemblies 6–20
7 Replaceable Parts
Replaceable Parts Ordering 7–2
Replaceable Parts List 7–3
Exploded View 7–4
Power Cables and Plug Configurations 7–8
8 Theory of Operation
Block-Level Theory 8–3
The Agilent 1670G-Series Logic Analyzer 8–3
The Logic Acquisition Board 8–7
The Oscilloscope Board 8–10
The Pattern Generator Board 8–15
Self-Tests Descriptions 8–17
Power-up Self-Tests 8–17
System Tests (SysPV) 8–18
Analyzer Tests (Analy PV) 8–22
Oscilloscope tests (Scope PV) 8–25
Pattern Generator tests (Patt Gen) 8–26
GPIB 8–30
RS-232-C 8–32
Contents
viii

1
Accessories 1–2
Specifications (logic analyzer) 1–3
Specifications (oscilloscope) 1–4
Specifications (pattern generator) 1–4
Characteristics (logic analyzer) 1–5
Characteristics (oscilloscope) 1–5
Characteristics (pattern generator) 1–6
Recommended Test Equipment (logic analyzer) 1–9
Recommended Test Equipment (oscilloscope) 1–10
Recommended Test Equipment (pattern generator) 1–11
General Information

General Information
This chapter lists the accessories, the specifications and characteristics, and the
recommended test equipment.
Accessories
The following accessories are supplied with the Agilent 1670G-series logic analyzers. The part
numbers are current as of the print date of this edition of the Service Guide, but further
upgrades may change the part numbers. Do not be concerned if the accessories you receive
have different part numbers.
Accessories Supplied Part Number Qty
Probe tip assemblies 01650-61608 Note 1
Probe cables 01660-61605 Note 2
Grabbers (20 per pack) 5090-4356 Note 1
Probe ground (5 per pack) 5959-9334 Note 1
Double Probe Adapter 16542-61607 1
PS2 Mouse C3751-60201 1
Note 1 Quantities: 8 - 1670G
6 - 1671G
4 - 1672G
2 - 1673G
Note 2 Quantities: 4 - 1670G
3 - 1671G
2 - 1672G
1 - 1673G
Pattern Generator Option-Series Additional Accessories
Accessories Supplied Part Number Qty
Data Output Cable 16522-61601 4
Clock Output Cable 16522-61602 1
Oscilloscope Option-Series Additional Accessories
Accessories Supplied Part Number Qty
10:1 probes 1160A 2
BNC miniprobe adapter 1250-1454 1
Accessories Available
Other accessories available for the Agilent 1670G-series logic analyzer are listed in the
Accessories for Agilent Logic Analyzers brochure.
1–2

Specifications (logic analyzer)
The specifications are the performance standards against which the product is tested.
Maximum State Speed (selectable) 150 MHz
Minimum Master to Master Clock Time*6.666 ns
Threshold Accuracy ±(100 mV + 3% of threshold setting)
Setup/Hold Time:*
Single Clock, Single Edge 3.0/0.0 ns through -0.5/3.5 ns,
adjustable in 500-ps increments
Single Clock, Multiple Edges 3.5/0.0 ns through -0.5/4.0 ns,
adjustable in 500-ps increments
Multiple Clocks, Multiple Edges 4.0/0.0 ns through -0.5/4.5 ns,
adjustable in 500-ps increments
* Specified for an input signal VH = −0.9 V, VL = −1.7 V, slew rate = 1 V/ns, and threshold = −1.3 V.
General Information
Specifications (logic analyzer)
1–3

Specifications (oscilloscope)
The Agilent 1670G Logic Analyzers with an oscilloscope also include the following
specifications:
Bandwidth (*,1) DC to 500 MHz (real time, dc-coupled)
Time Interval Measurement Accuracy(*, 2) ±[(0.005% X ∆t)+
(2 x 10−6x delay setting)+150 ps]
DC Offset Accuracy(*) ±(1.0% of channel offset + 2.0% of full scale)
Voltage Measurement Accuracy(*, 3) ±[(1.25% of full scale + offset accuracy)
+ (0.016 x V/div)]
Trigger Sensitivity(*) DC to 50 MHz: 0.063 x full scale,
50 to 500 MHz: 0.125 x full scale
Input R (selectable) (*) 1 MΩ: ±1%, 50 Ω: ±1%
* Specifications (valid within ±10°C of auto-calibration temperature, excluding bandwidth−see note 1 for bandwidth specification.)
1. Upper bandwidth reduces by 2.5 MHz for every degree C above 35°C.
2. Specification applies to the maximum sampling rate. At lower rates, the specification is:±[(0.005% x ∆t)+(2 x 10-6 x delay setting) +
(0.15 x sample interval)] for bandwidth limited signals (tr= 1.4 x sample interval). Sample interval is defined as 1
sample rate
3. Digitizing level = (#vertical divisions)(1
2)( 1 LSB), where LSB=2 # bits in ADC
Specifications (pattern generator)
There are no specifications for the pattern generator option of the Agilent 1670G-Series Logic
Analyzers.
General Information
Specifications (oscilloscope)
1–4

Characteristics (logic analyzer)
These characteristics are not specifications, but are included as additional information.
Full Channel Half Channel
Maximum State Clock Rate 150 MHz not applicable
Maximum Conventional Timing Rate 250 MHz 500 MHz
Memory Depth 64K 128K
Memory Depth (option #001) 256K 512K
Memory Depth (option #002) 2048K 4196K
Channel Count:
1670G 136 68
1671G 102 51
1672G 68 34
1673G 34 17
Characteristics (oscilloscope)
The Agilent 1670G Logic Analyzers with an oscilloscope also include the following
characteristics:
Maximum Sample Rate 2 Gigasample per second
Number of Channels 2
Rise Time(1) 700 ps
ADC 8-bit real time
Vertical Resolution 8 bits over 4 vertical divisions (±0.4%)
Waveform Record Length >32000 points
Vertical (DC) Gain Accuracy(2) ±1.25% of full scale
Input Coupling 1 MΩ: ac and DC, 50 Ω: DC only
Input C Approximately 7 pF
1. Rise time is calculated from the formula: tr=0.35
bandwidth
2. Vertical gain accuracy decreases 0.08% per degree C from software calibration temperature.
General Information
Characteristics (logic analyzer)
1–5

Characteristics (pattern generator)
The Agilent 1670G Logic Analyzers with a pattern generator also include the following
characteristics:
Output channels 16 channels at 200 MHz clock; 32 channels at
100 MHz clock
Memory depth 258,048 vectors
Logic levels (data pods) TTL, 3-state TTL/3.3v, 3-state TTL/CMOS,
ECL terminated, ECL unterminated, and differential
ECL (without pod)
Data inputs 3-bit pattern - level sensing (clock pod)
Clock outputs Synchronized to output data, delay of 11 ns in 9 steps
(clock pod)
Clock input DC to 200 MHz (clock pod)
Internal clock period Programmable from 5 ns to 250 µs in a 1, 2, 2.5, 4, 5, 8
sequence
External clock period (user supplied) DC to 200 MHz
External clock duty cycle 2 ns minimum high time
Maximum number of "IF condition" 1
blocks at 50 MHz clock
Maximum number of different macros 100
Maximum number of lines in a macro 1024
Maximum number of macro invocations 1,000
Maximum number of Repeat loop 1,000
invocations
Maximum number of Wait event patterns 4
General Information
Characteristics (pattern generator)
1–6

Probes
Maximum Input Voltage + 40V, CAT 1
Auxiliary Power
Power Through Cables 1/3 amp at 5 V maximum per cable, CAT 1
Operating Environment (for indoor use only)
Temperature Instrument, 0 °C to 55 °C (+32 °F to 131 °F).
Probe lead sets and cables,
0 °C to 65 °C (+32 °F to 149 °F).
Disk media, 10 °C to 40 °C (+50 °F to 104 °F).
Humidity Instrument, probe lead sets, and cables, up to
80% relative humidity at +40 °C(+122 °F).
Altitude To 3067 m (10,000 ft).
Vibration Operating: Random vibration 5 to 500 Hz,
10 minutes per axis, ≈0.3 g (rms).
Non-operating: Random vibration 5 to 500 Hz,
10 minutes per axis, ≈ 2.41 g (rms);
and swept sine resonant search, 5 to 500 Hz,
0.75 g (0-peak), 5 minute resonant dwell
at 4 resonances per axis.
Dimensions
General Information
Characteristics (pattern generator)
1–7

Product Regulations
Safety IEC 1010-1:1990+A1 / EN 61010-1:1993
UL3111
CSA-C22.2 No. 1010.1:1993
EMC This product meets the requirement of the European
Communities (EC) EMC Directive 89/336/EEC.
Emissions EN55011/CSIPR 11 (ISM, Group1,Class A equipment)
IEC 555-2 and IEC 555-3
Immunity EN50082-1 Code1Notes2
IEC 801-2 (ESD)4kV CD, 8kV AD 1
IEC 801-3 (Rad.) 3V/m 1
IEC 801-4 (EFT) 1kV 1
1Performance Codes:
1 PASS - Normal operations, no effect.
2 PASS - Temporary degradation, self recoverable.
3 PASS - Temporary degradation, operator intervention required.
4 FAIL - Not recoverable, component damage.
General Information
Characteristics (pattern generator)
1–8

Recommended Test Equipment (logic analyzer)
Equipment Required
Equipment Critical Specifications Recommended
Model/Part
Use*
Pulse Generator 150 MHz, 3.0 ns pulse width,
< 600 ps rise time
8133A Option 003 P,T
Digitizing Oscilloscope ≥6 GHz bandwidth, < 58 ps rise time 54750A mainframe with
54751A plugin module
P
Function Generator Accuracy ≤ (5)(10−6) ×frequency,
DC offset voltage ±6.3 V
3325B Option 002 P
Digital Multimeter 0.1 mV resolution, 0.005% accuracy 3458A P
BNC-Banana Cable 11001-60001 P
BNC Tee BNC (m)(f)(f) 1250-0781 P
Cable BNC (m)(m) 48 inch 8120-1840 P,T
SMA Coax Cable (Qty 3) 18 GHz bandwidth 8120-4948 P
Adapter (Qty 4) SMA(m)-BNC(f) 1250-1200 P, T
Adapter SMA(f)-BNC(m) 1250-2015 P
Coupler (Qty 4) BNC (m)(m) 1250-0216 P, T
20:1 Probes (Qty 2) 54006A P
BNC Coax Cable BNC(m)(m), >2 GHz bandwidth, >1 meter length 10503A T
BNC Test Connector, 17x2
(Qty 1)** P
BNC Test Connector, 6x2
(Qty 4)** P,T
Digitizing Oscilloscope > 100 MHz Bandwidth 54600B T
BNC Shorting Cap 1250-0774 T
BNC-Banana Adapter 1251-2277 T
*A = Adjustment P = Performance Tests T = Troubleshooting
**Instructions for making these test connectors are in chapter 3, "Testing Performance."
General Information
Recommended Test Equipment (logic analyzer)
1–9

Recommended test equipment (oscilloscope)
Equipment Required
Equipment Critical Specifications Recommended
Model/Part
Use*
Signal Generator Frequency: 1 - 500 MHz at approx.
170 mV RMS
Output Accuracy: ±1 dB
1 MHz time base accuracy 0.25 ppm
8656B Option 001 P
DC Power Supply Range: −35.000 to +35.000 Vdc, ±1 mV 3245A Option 002 P
Digital Multimeter 0.1 mV resolution
Accuracy: better than 0.005%
Resistance measurement: better than
0.25% accuracy
3458A P
Power Meter/Sensor 1 - 250 MHz ±3% accuracy 436/8482A P
Power Splitter Outputs differ by <0.15 dB 11667B P
Blocking Capacitor BNC (m)(f), 0.18 µF, ±200 V 10240B P
BNC Shorting Cap 1250-0074 P
Adapter BNC (f)(f) (UG-914/U) 1250-0080 C
Adapter BNC(f)-to-Dual Banana Plug 1251-2277 P
Adapter Type N(m)-to-BNC(f) 1250-0780 P
BNC Tee BNC (m)(f)(f) 1250-0781 P,C
Cable Type N(m-to-m) 24-inch 11500B P
Cable 50 ΩBNC (m-to-m) 48-inch 10503A P, C
Cable (2) 50 ΩBNC (m-to-m) 9 inch 10502A C
*P = Performance Tests C = Calibration
General Information
Recommended test equipment (oscilloscope)
1–10

Recommended test equipment (pattern generator)
Equipment Required
Equipment Critical Specifications Recommended
Model/Part
Use*
Oscilloscope ≥500 MHz Bandwidth 54820A T
Probe 500 MHz Bandwidth 1160A T
Output Data Pod no substitute 10460A - series T
* T = Troubleshooting
General Information
Recommended test equipment (pattern generator)
1–11

1–12