Eico 667 User manual

DYNAMIC CONDUCTANCE
TUBE &TRANSISTOR TESTER
f£/CO*
131-01 39th Ave., FlLshirtg, N- Y. 11352
k.

MODEL 667 ADDENDUM -TRANSISTOR
(For Instruction Manual)
An Improved procedure has been developed for transistor testing, which is described in the
following revision of steps 5to 8on page 7of the Instruction Manual. No transistor chart is
provided, as it is not required when using the revised test procedure. With the great number of
transistors now available, atransistor handbook would be needed, in any case, to determine the
type (p-n-p or n-p-n) and basing of all the transistors to be encountered.
Revised Steps 5to 8, Page 7 of the INSTRUCTION MANUAL:
5. Refer to atransistor handbook for the type (p-n-p or n-p-n) and basing of the transistor to be
tested. Note that only signal transistors can be tested with the instrument and the criteria
described below apply only to signal transistors (not power transistors).
*
6. Insert the emitter (E), base (B), and collector (C) lead of the transistor In the corresponding
terminals of the transistor socket located immediately above the TRANSISTOR TEST selector,
7. Turn the TRANSISTOR TEST selector from "TUBE" to position 1(first position away from "TUBE")
on the p-n-p or n-p-n side depending on the type of transistor under test. The indication on
the meter will be proportional to the collector current with emitter grounded and no base
signal. On this test, transistors in good condition should preferably read in the "Ico GOOD"
area between 0and 40 on the 0to 140 meter scale, but are acceptable with readings up to 80
on this scale. Reject transistor that reads above 80 on this test.
8. Turn the TRANSISTOR TEST selector to position 2(second position away from "TUBE"), and
read the DC Beta (ratio of collector current to base current). The minimum acceptable DC
Beta reading depends on the Ico reading obtained in step 7. The higher the Ico reading (up to
the maximum acceptable limit of 80), the higher the minimum acceptable DC Beta reading is,
in direct proportion* Numerically, the minimum acceptable DC Beta reading is slightly more
than 60% of the Ico reading on the 0to 140 meter scale. Examples: If the Ico scale reading
is 80, the minimum acceptable DC Beta reading is 50; if the Ico scale reading is 40, the minimum
acceptable DC Beta reading is 25.
Page 9of the INSTRUCTION MANUAL:
Delete the following material from the text:
"In some cases, the range of Beta given In the chart has been taken directly from the
transistor manufacturer's specification; in other cases Beta has been calculated from the
grounded base Alpha, Alpha ce, according to the relationship:
Alpha ce
Beta ="
1-Alpha ce
1

MODEL 667ADDENDUM (Continued)
Revise the remaining text as follows:
"These simple tests, when related to each other as described In the test procedure, will
determine If the transistor Is good or bad. They do not, of course, duplicate the factory
tests of frequency response. Input resistance, output resistance, collector capacitance,
and other electrical characteristics that are necessary for aspecific grade of transistor,"
Page 12 of the Instruction Manual:
In Figure n) TRANSISTOR TEST 1, add ashunt resistor R5 across meter Ml.
In Figure o) TRANSISTOR TEST 2, add ashunt resistor R6 across meter Ml.
I. E. 1495 EICO Electronic Instrument Co. Inc,, 131-01 39th Ave, ,Flushing, N.Y., 11352

667 TUBE TESTER ^EICQL,<• page l
GENERAL DESCRIPTION
The EICO Model 667 Dynamic Conductance Tube &Transistor Tester is one of the first
thoroughly practical service instruments able to test both tubes and transistors. Among its
advantages are rapid and simple operation, close simulation of actual tube operating conditions,
and unexcelled thoroughness and accuracy of test. The outstanding mechanical design and
layout, coupled with components carefully selected for ruggedness, makes the Model 667 extremely
well-suited for the hard usage of daily service work.
All components of the Model 667 tube tester are assembled to the heavy-gauge aluminum
front panel, which is in turn top-mounted by 14 screws to flanges on all four sides of the steel
case. Adetachable steel cover is mounted to the back of the case with separable hinges so that
the cover may easily be removed for use of the instrument as acounter -top model or replaced
to convert it back to aportable instrument.
There are ten different tube sockets on the panel to accomodate modern receiving and
other tube types (see Types Tested below). In addition, pilot and Christmas tree lamps can be
checked rapidly using the center of the Novar socket. Aspecial transistor socket accomodates
both n-p-n and p-n-p transistors. To protect against damage due to current overload, atype
3AG 1ampere fuse is connected in series with the primary of the power transformer.
SPECIFICATIONS
LINE VOLTAGE &FREQUENCY: 105- 130V, 60 cycles. Note: Do not connect to adc line.
POWER CONSUMPTION: 10 watts with no tube/transistor under test; 50 watts at maximum load.
TYPES TESTED: 5&7pin Nuvistors; Novars; Compactrons; 7,9, &lOpin miniatures; 5, 6&7
pin sub-miniatures (in-line base); 8-pin sub-miniatures (circular base); octal;
loctal. In addition to receiving types, both domestic and foreign, many
small transmitting and special-purpose tubes, voltage regulators, cold
cathode rectifiers, electron-ray indicators, and ballast tubes are tested.
Tests n-p-n and p-n-p transistors. Pilot lamps are tested in center of
Novar socket. Accessory Model CRU adaptor for testing all color and
black and white picture tubes.
TUBE TESTS: a) Direct-reading of inter-element and cathode heater leakage in ohms on a0to
20 megohms scale. DC test voltage always applied in correct polarity to elimi-
nate emission effects from reading, b) Merit test, which is an emission reading
for diodes and rectifiers and adynamic conductance (combined plate conductance,
mutual conductance, and emission) reading for triodes, tetrodes, andpentrodes.
TRANSISTOR TESTS: N-p-n and p-n-p types.
TRANSISTOR TESTS: a) Leakage measurement of collector current with emitter grounded and
no base signal, b) Direct reading of current amplification factor or
Beta (change in collector current caused by change in base current.
ACCURACY OF LINE VOLTAGE INDICATION: ±3%
SIZE: 12" x15" x6"
WEIGHT: 20 lbs.

PAGE 2««««<« ‘
lEICQL, 667 TUBE TESTER
FUNCTIONS OF CONTROLS
Anecessary supplement to the operating instructions is the following description of control
functions. Several controls, for example, have unusual secondary functions which must be
understood in making settings.
FILAMENT SELECTOR —The dial of this control indicates rms a-c volts tapped from the
power transformer and applied to the tube filament at each position. Do not take the setting
for granted; check the roll chart and set it to the value shown for the particular tube type. The
last position, marked "Z", is used when checking cold cathode tubes such astheOZ4 for which
the plate voltage of the Model 667 is insufficient to initiate conduction in the tube. The 117 volts
available from the FILAMENT switch is thrown in series with the plate voltage of 180 volts at
the "Z" position to provide atotal voltage sufficient to initiate tube conduction. A3K resistor,
placed in series with this circuit, provides current limiting to protect the tube after the start
of conduction.
LINE ADJ. —This control is acontinuously variable potentiometer connected across aportion
of the primary winding. It permits adjustment of transformer secondary voltages to the stand-
ard test values despite line voltage and filament load variations. The LINE push-button serves
to insert astandard resistance in the leakage test circuit whichwill result in exactly half-scale
deflection (LINE mark) when the LINE ADJ. control has been set properly in relation to the
actual line voltage and filament load. The actual line voltage may be read off the dial of the
LINE ADJ. control with an accuracy of ±3% when line adjustment is made under no-load condi-
tions (no tube inserted for testing).
GRID control —Acontinuously variable potentiometer which taps the desired grid voltage up
to amaximum of 5, 15, or 45 volts, depending on the setting of the Vlever. Asnap switch,
which takes up the first few divisions on the dial, is actuated in the most counter-clockwise
position and inserts a400S2 current-limiting resistor in series with the plate supply (for high-
current rectifiers). At settings of 7and above, the resistor is shorted.
PLATE control -- Acontinuously variable rheostat in series with the meter which acts as a
"fine" adjustment of meter sensitivity in conjunction with the "coarse" adjustment provided by
the "S" lever switch.
LEVER switches 1through 12 &C-- These are single section six-position switches which con-
nect the similarly numbered tube socket terminals (lever Cis for the cap lead) to the proper
voltage sources for the tube which is to be tested. At the 1position, each switch contacts
ground; at the 2position, each switch contacts the filament voltage; at the 3position, each
switch contacts the screen voltage; at the 4position, each switch contacts plate voltage; in the
5position, each switch contacts grid voltage; in the 6position, each switch furnishes an open
circuit.
LEVER V-This is athree section switch with four positions (1 through 4). 5, 15, 45, 90 and
180 volt taps on a separate secondary winding on the transformer are so connected to these
switch sections as to provide selection from four combinations of plate, screen, and grid
voltages. The plate and screen voltages selected are applied through the MERIT switch to the
corresponding position contacts on lever switches 1through C. The grid voltage selected is
applied to the GRID potentiometer so that the desired portion of the total available voltage can
be accurately tapped off by means of the dial calibration and applied to the grid position contacts
on lever switches 1through C, also through the MERIT switch. The plate screen, and grid
voltages selected at each position of the Vswitch are as follows:

667 TUBE TESTER LlEICOL>«PAGE 3
POSITION PLATE SCREEN GRID
145V ~T5V 0-5V
290 45 0-15
3180 90 0-15
4180 90 0-45
LEVER S—This is asingle section six-position switch which selects the value of shunt resis-
tance placed across the meter and PLATE control potentiometer. As such, lever Sis a"coarse"
meter sensitivity control which is used in conjunction with the "fine" control provided by the
PLATE potentiometer. Position 1provides the least meter sensitivity for high current tubes
and position 5the highest sensitivity for low current tubes; intermediate positions provide a
variety of sensitivities necessary for testing the many tube types encountered. At position 6
of the Sswitch, the grid voltage from the Vswitch is connected through the 24, 000 ohm current-
limiting resistor in testing light-duty diodes.
PUSH-SWITCHES 1through 12 &C—Each of these switches serves as atransfer switch for
the tube element connected to the corresponding base pin number. The No. 1switch controls
all connections to the No. 1socket terminals; the No. 2switch controls all connections to the
No. 2socket terminals; and so forth, in order, through to the No-. 12 switch for the No. 12
terminal of the COMPACTRON socket. The Cswitch controls the connections to the cap lead.
These push switches serve the following functions:
With the MERIT and LINE switches at their normal position, depressing one of these switches
transfers the corresponding tube element to one side of the ohmmeter circuit (with the remaining
tube elements all grounded together with the other side of the ohmmeter circuit) as required
for the inter -element leakage tests. These push-switches are also primarily responsible for
two of the outstanding features of this tube tester; one feature being that in the majority of cases
all sections of multi-section tubes draw their normal current when any one section is tested;
the second being the rapid testing afforded multi-section tubes due to the saving in set-uptime.
These advantages are obtained because the push switches permit selection of the tube base pin
which will be connected to the transformer power supply through the meter circuit when the
MERIT switch is pulled down, in order that the current through the corresponding tube element
(normally the plate of atube or atube section) be measured for MERIT testing. The remaining
tube base pins (connected to the push switches which are not depressed for the particular MERIT
test) are connected either directly to the transformer power supply or indirectly through a
potentiometer.
RESET push button —This button is aconvenience intended to permit restoring of adepressed
push-switch to the normal position.
H-K LEAKage push switch —This is amomentary switch which is used for heater -cathode
leakage testing. When the push switch for an indirectly heated cathode (underlined in the LEAK
column of the roll chart) is depressed to transfer the cathode to one side of the ohmmeter circuit,
the H-K LEAK button is depressed also to break the ground connection of the remaining "lumped"
elements in order that cathode emission current to these elements will be excluded from the
cathode heater leakage measurement.
TRANSISTOR TEST selector —This is aspecial five-position multi-circuit switch performing
the following functions: a) At the TUBE position the transistor test socket is de-energized and
the meter connected so as to render it available for line adjustment, leakage testing, and merit
testing; b) At the transistor test positions, it applied adc bias voltage between the collector and
emitter socket terminals, of polarity depending on whether the n-p-n or p-n-p positions are used.

PAGE 4‘
-jEWQL, 667 TUBE TESTER
At the 1position for either transistor type, the meter is inserted in the collector circuit
in series with aIK current-limiting resistor to measure the current (Iceo)under these conditions.
At either 2position, a200Kresistor is connected between the collector side of the power supply
and the base to put asmall current into the base. The current gain, Beta, is then read on the
meter, which remains in the collector circuit.
WARNING: Be certain as to the type of transistor (n-p-n or p-n-p) you aretesting. Testing
atransistor using the positions designated for the opposite type may damage the
tester meter or the transistor. Note that shorted transistors may cause the
meter to read past full scale at the "N-P-N 1" or "P-N-P 1". Should this
occur, turn the switch back to the "TUBE" position immediately and discard
the defective transistor, after you have first checked to see that the correct
test position was used for the particular type.
SPECIAL SOCKET CONNECTIONS —Several socket terminal connections are not standard and
should be noted. The pilot light socket in the center of the NOVAR socket is connected across
the selected filament voltage (shell to ground, center post to filament switch arm). The center
of the loctal socket is connected to ground. The sub-miniature in-line socket has no numbers
assigned to its seven terminals. In the Model 667, these terminals are connected to the push-
switches as if they were numbered 1to 7beginning at the index dot on the panel. However, a
consistent connection procedure has been established (the roll chart settings are given accord-
ingly), which is as follows: With tube base and socket indexes matched (dot or spur on tube
base to dot at right of socket on the panel), the tube leads are inserted in order so as not to skip
any socket terminals starting from the extreme right.
OPERATING INSTRUCTIONS
PRELIMINARY STEPS FOR TUBE OR TRANSISTOR TESTING
1. Insert the power plug in a105-130 volts AC, 60 cps line outlet. Do not use aDC line
outlet or any AC line outlet other than specified above.
2. Turn the tester on by rotating the LINE ADJ. control clockwise from AC-OFF.
3. Set the TRANSISTOR TEST selector to TUBE, regardless of whether it is atube or
transistor that is to be tested.
4. Make apreliminary line adjust by holding down the LINE button while turning the LINE
ADJ. control until the meter pointer is over the LINE ADJ. mark on the meter (center scale).
Release the LINE button at the conclusion of the adjustment.
TUBE TESTING CONTINUED
5. Press the RESET button to release anybutton which may be down from aprevious setting.
Make sure the TRANSISTOR TEST selector is set at "TUBE".
6. Move all 15 lever switches down to the "1" position.
7. Rotate one or both roll chart wheels until the tube type you wish to test appears in one
of the windows. Obsolete types will be found in asupplement to this manual.

667 TUBE TESTER ‘
lEICQL, PAGE 5
8. Note the number of lines of settings devoted to the tube in the chart. Each line of
settings corresponds to asection of the tube (1 line for asingle diode, triode or pentode; 2lines
for adouble diode, triode or pentagrid converter; 3lines for aduodide-triode, etc.) Each
section of the tube is tested by making the settings indicated on asingle line of the chart and
then depressing the MERIT lever. Note, however, that twin or triple section tubes having
identical tube characteristics will occupy one line with two or three plate numbers in the merit
column instead of the usual single number. Each of these numbers signifies an individual merit
test. Using the same line of settings, perform each individual merit test.
EXAMPLE: 12AT7, twin triode
In the merit column you will find the entry 16 (one, six). Press 1to read merit of the
first triode. Press 6to read merit of the second triode.
All interelement leakage testing must be performed before any of the Merit tests, as a
safeguard to the tube tester. The push-button which must be pressed down to complete the
leakage and short testing are all given in the same line or different lines for different sections
of the tube. Specific instructions for making settings and performing the required tests follow.
9. The first 3settings following the tube type are for the FIL. selector, GRID control and
PLATE control, in that order. Set these controls accordingly.
10. The next 15 settings are for lever switches 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, C, Vand S
in that order. Set these levers accordingly.
11. Check all settings to make sure that no mistake has been made.
12. Insert the tube into the socket which matches its base. (The socket just above the
TRANSISTOR TEST selector is for transistors only. All other sockets are for tubes only). If
the rectangular sub-miniature socket is used, turn the tube so that its index (red dot, black dot,
glass spur) matches the dot on the panel; then insert each lead into asocket terminal in order,
not skipping any socket terminals starting from the right. If there is atop cap on the tube,
connect it with the cap clip lead.
13. Allow sufficient warm-up time before proceeding. For battery-operated tubes and
h. v. rectifiers (1B3 type) warm up is almost instantaneous; for most receiving tubes 10 to 20
seconds; for high power pentodes, triodes, and rectifiers 20-40 seconds. Note that the MERIT
test (step 17) should not be performed until the stated warm-up time has elapsed.
14. Press the LINE button and note the meter reading. Depending on the filament drain
of the tube under test, the meter will read more or less to the left of the LINE ADJ. mark
(center scale). Holding the LINE button down turn the LINE ADJ. control until the meter
pointer is again over the LINE ADJ. mark. Release the LINE button at the conclusion of this
adjustment.
15. Refer to the first (or only) line of settings for the tube and note the buttons listed in
the LEAK column. Press down each of the buttons listed one at atime (in order), observing
the meter each time. (See next paragraph for evaluation of leakage readings. )The underlined
leakage buttons are for indirectly heated cathodes; when these buttons are depressed, the re-
sulting meter reading will be valid only when the H-K LEAK button is also depressed. Failure
to do so will not normally cause damage to the tube, but will give too low aleakage resistance
reading due to emission to other elements. Thus, the underlined leakage tests are of heater to
cathode leakage only.

PAGE 6««<«««< liE/CQL1667 TUBE TESTER
On cathode leakage test of light duty diodes in multi-section tyibes, meter will not swing
across the scale as for other type of tubes if tube under test is good, and there is no need to
depress the H-K LEAK button. Underlining of pin No. 2in case of 6AQ7 merely indicates
cathode. The above also applies to other tubes of similar types such as 6R8, 6S8, and 6T8.
Standard for acceptance of rejection on Inter-Element Leakage (excluding cathode -heater
leakage): No less than 5megs on any test. Astricter standard for high reliability applications
would be no less than 10 megs on any test.
Standard for Acceptance or Rejection on Cathode-Heater Leakage: Not less than 1megfor
non-power types; not less than 500K for power types. Half these values may be acceptable for
tubes approaching end of life, with the exception of tubes used in audio preamplifiers which may
not read less than 1meg at any time.
In general, tubes failing to meet these standards should be discarded. In any case, do not
perform aMERIT test on any tube having an inter -element leakage resistance less than 100K
ohms, as this may damage the tube tester. Note that all required inter-element and cathode-
heater leakage tests for the entire tube have been completed with the tester set up for the first
(or only) MERIT test and before the first (or only) MERIT test is made. No further leakage
testing is performed thereafter.
Note: Depressing the buttons listed in the MERIT column actually tests that element for
leakage until the MERIT lever is depressed. Atube giving too low an ohms reading
in this condition should not be tested for MERIT.
16. Perform the first (or only) MERIT test on tubes which have been found satisfactory as
to leakage and shorts by first pressing down the button listed in the MERIT column and then
pulling down the MERIT lever switch. With the MERIT lever held down, read the merit (quality)
indication on the DIODES GOOD scale for diodes and rectifiers, or the colored areas and percent
markings for all other tubes. Note that although 100% represents normal conductance for anew
tube, some tubes will read higher and some lower because of the tolerances allowed in tube
manufacturing. Note also that the limits of the GOOD, ?(doubtful), and REPLACE areas are
obtained by striking an average for all tube types and so should not be interpreted in an absolute
manner.
17. If there is more than one line of settings for the tube, leave the tube in the socket and
proceed as follows for each line: a) Reset the lever switches and GRID and PLATE controls
accordingly; b) Depress the button listed in the MERIT column; c) Pull down the MERIT lever
switch to read the quality on the meter of the particular tube section under test.
18. After testing the last section of atube, remove the tube from the socket of the tube
tester. Push reset button and return all lever switches to "1". Failure to do this can result
in damage to the meter when you proceed to test the next tube.
19. Proceed with testing another tube by beginning with Step 5. If there are no more tubes
or transistors to be tested, turn the LINE ADJ. control counter-clockwise to its AC-OFFposi-
tion. Aslide switch at the end of the potentiometer winding opens the primary circuit of the power
transformer and turns the tester off. If there is atransistor to be tested, proceed directly to
step 5of TRANSISTOR TESTING after completing step 18 of TUBE TESTING.

667 TUBE TESTER t-jEICQL1«PAGE 7
CONTINUE PROCEDURE FOR TRANSISTOR TESTING (From Step 4, Page 4)
5. Locate the type number of the transistor to be tested on the transistor chart. Note
whether the transistor is an-p-n or p-n-ptype and the specified allowable range of Beta. Make
sure that the TRANSISTOR TEST selector is set at "TUBE".
6. Insert the emitter (E), base (B), and collector (C) lead of the transistor in the corres-
ponding terminals of the transistor socket located immediately above the TRANSISTOR TEST
selector.
7. Turn the TRANSISTOR TEST selector from "TUBE" to position Ion the p-n-p or n-p-n
side depending on the type of transistor under test. The indication on the meter will be propor-
tional to the collector current with emitter grounded and no base signal. On this test, transistors
in good condition should read in the "Iceo GOOD" area (between 0and 40 on the 0to 140 scale).
Reject transistors that read outside the "Iceo GOOD" area (higher than 40 on theO to 140 scale),
unless note has been made on the chart that ahigher reading is acceptable.
8o Turn the TRANSISTOR TEST selector to position 2and read the current amplification
factor or Beta (change in collector current caused by achange in base current) on the 0to 140
Beta Scale. Agood transistor will read within the allowable range of Beta as given on the chart
for the particular transistor type. Transistors which do not give areading within the specified
allowable range of Beta may still be useable; see data sheet.
9. Turn the TRANSISTOR TEST selector back to "TUBE" and then remove the transistor
from the transistor socket.
10. Proceed with testing another transistor by beginning with step 5. If there are no more
transistors or tubes to be tested, turn the tester off by turning the LINE ADJ. control to its
AC-OFF position. If there is atube to be tested, proceed directly to step 5of TUBE TESTING
after completing step 9of TRANSISTOR TESTING.
NOTE: The only controls having any effect in transistor testing are the TRANSISTOR TEST
selector, the LINE ADJ. control, and the LINE push-button. Provided that atube
has not been left inserted in any of the tube sockets, the settings of any other lever
switches, push-buttons or potentiometers on the panel have no effect and are
immaterial.
CIRCUIT DESCRIPTION
It may be of assistance in understanding the functioning of the instrument to examine the
following typical partial schematics, each of which indicates the voltages appliedand the place-
ment of the meter circuit when performing the tests provided (in accordance with the detailed
operating instructions) for tubes and transistors.
NOTE:' Rs denotes the meter shunt resistance selected by S29 (Lever S). 01, 02, and
03denote various a-c voltages taken from taps on the high voltage secondary winding of the
power transformer and selected by S28 (Lever V). An asterisk denotes the function of current-
limiting.