HP 1660E Series User manual

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Service Guide
(
HP 1660EIESIEP-Series
Logic Analyzers

Service Guide
Publication munber 01660-97030
First edition, November 1998
For Safety information, Warranties, and Regulatory
information, see the pages at the end of the book.
©Copyright Hewlett-Packard Company 1987-1998
All Rights Reserved.
HP 1660E/ESIEP-Series
Logic Analyzers

" l ...
HP 1660E-Series, HP 1660ES-Series, and
HP 1660EP-Series Logic Analyzers
The HP 1660E-series are 100-MHz State/500 MHz Timing logic analyzers.
The
HP 1660ES-series includes all the features of the HP 1660E-series, as well as a
2-channel, 2GSa/s oscilloscope.
The
HP 1660EP-series includes all the features of the HP 1660E-series, as well as a
32-channel
pattern generator.
Features
Some of the main features of the HP 1660E-series logic analyzers are as follows:
•130
data channels and 6 clock/data channels in the HP 1660E
•96
data channels and 6 clock/data channels in the HP 1661E
•64
data channels and 4 clock/data channels in the HP 1662E
•32
data channels and 2 clock/data channels in the HP 1663E
•3.5-inchflexible
disk drive
•2.3 GB hard disk drive
•HP-IE, R8-232-C,
and Centronics printer interfaces
•Variable setuplhold time
• 4k memory on all channels with 8k in half channel mode
• Marker measurements
•12 levels of trigger sequencing for state and 10 levels of sequential triggering for
timing
•100 MHz
time and number-of-states tagging
• . Full programmability
• DINrhouse
•DIN keyboard support
The HP 1660EP-series logic analyzers also include the following features:
•15
output channels at 200 MHz
•32 output channels at 100 MHz
•
Memory depth of 258,048 vectors
• Support for TTL, 3-stateTTU3.3v, 3-state TTUCMOS, ECLterminated, ECL
unterrninated,
and differential ECL (without pod).
ii

The HP 1660ES-series logic analyzers also include the following features:
• 2 GSa/s digitizing
for 500 MHz bandwidth single shot oscilloscope
•32768
samples per channel
• Automatic pulse parameters
displays time between markers, acquires until specified time between markers is
captured, performs statistical analysis on time between markers
•Lightweight miniprobes
Service Strategy
The service strategy for this instrument is the replacement of defective assemblies.
This service guide contains information for finding adefective assembly by testing
and servicing the HP 1660EIESIEP-series logic analyzers.
This logic analyzer
can be returned to Hewlett-Packardfor all service work, including
troubleshooting.
Contact your nearest Hewlett-Packard Sales Office for more details.
01660E24
The HP 1660-series logic analyzer
"
. :.i\ ;
iii

In This Book
This book is the service guide for the HP 1660EIESIEP-series logic analyzers and is divided
into eight chapters.
Chapter 1contains information about
the logic analyzer and includes accessories,
specifications
and characteristics, and equipment required for servicing.
Chapter 2tells how to prepare
the logic analyzer for use.
Chapter 3gives instructions on how to
test the performance of the logic analyzer.
Chapter 4contains calibration instructions for the logic analyzer.
Chapter 5contains self-tests and flowcharts for troubleshooting the logic analyzer.
Chapter 6tells how to replace assemblies of
the logic analyzer and how to return them to
Hewlett-Packard.
Chapter 7lists replaceable parts, shows an explodedview,
and gives ordering information.
Chapter 8explains how
the logic analyzer works and what the self-tests are checking.
iv

Table of Contents
1General Information
Accessories 1-2
Specifications (logic analyzer) 1-3
Specifications (oscilloscope) 1-4
Specifications (pattern generator) 1-4
Characteristics (logic analyzer) 1-5
Characteristics (oscilloscope) 1-5
Characteristics (pattern generator) 1-6
Recommended test equipment (logic analyzer) 1-9
Recommended
test equipment (oscilloscope) 1-10
Recommended
test equipment (pattern generator) 1-11
2Preparing for Use
To inspect the logic analyzer 2-2
To apply power 2-3
To operate the user interface 2-3
To set the line voltage 2-3
To clean the logic analyzer 2-4
To test the logic analyzer 2-4
3 Testing Performance
To perform the self-tests 3-2
To make the test connectors (logic analyzer) 3-7
To test the threshold accuracy (logic analyzer) 3-9
Set up the equipment 3-9
Set up the logic analyzer 3-10
Connect the logic analyzer 3-10
Test the TTL threshold
3-11
Test the ECL threshold 3-13
Test the-User threshold 3-14
Test the +User threshold 3-15
Test the 0 VUser threshold 3-16
Test the next pod 3-17
To test the glitch capture (logic analyzer) 3-18
Setup the equipment 3-18
Set up the logic analyzer 3-19
Connect the logic analyzer
3-19
Testthe glitch capture on the connected channels 3-21
Testthe next channels 3-23
To
test the single-clock, single-edge, state acquisition (logic analyzer) 3-24
Set up the equipment 3-24
Set up the logic analyzer 3-25
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Contents
Connect the logic analyzer 3-27
Verify the test signal 3-29
Check the setup/hold combination 3-31
Test
the next channels 3-36
To
test the multiple-clock, multiple-edge, state acquisition (logic analyzer) 3-37
Set up the equipment 3-37
Set up the logic analyzer 3-38
Connect the logic analyzer 3-40
Verify the test signal 3-42
Check
the setup/hold with single clock edges, multiple clocks 3-44
Test the next channels 3-48
To test the single-clock, multiple-edge, state acquisition (logic analyzer) 3-49
Set up the equipment 3-49
Set up the logic analyzer 3-50
Connect the logic analyzer 3-52
Verify the test signal 3-54
Check the setup/hold with single clock, multiple clock edges
3-56
Test the next channels 3-59
To
test the time interval accuracy (logic analyzer) 3-60
Set up the equipment 3-60
Set up the logic analyzer 3-61
Connect the logic analyzer 3-64
Acquire the data 3-64
To test the CAL OUTPUT ports ( oscilloscope) 3-65
Set up the equipment 3-65
Set up the logic analyzer 3-66
Verify the
DC CAL OUTPUT port 3-67
Set up the logic analyzer 3-68
Verify the AC CAL OUTPUT port 3-68
To test the input resistance (oscilloscope) 3-69
Set up the equipment 3-69
Set up the logic analyzer 3-70
Connect the logic analyzer 3-71
Acquire the data 3-72
Perform an operational accuracy calibration 3-72
To test the voltage measurement accuracy (oscilloscope) 3-73
Set up the equipment 3-73
Set up the logic analyzer 3-74
Connect the logic analyzer 3-75
Acquire the data 3-76
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To test the offset accuracy (oscilloscope) 3-77
Set up the equipment 3-77
Set up the logic analyzer 3-78
Connect the logic analyzer 3-79
Acquire the zero input data 3-80
Acquire the DC input data 3-81
To test the bandwidth (oscilloscope) 3-82
Set up the equipment 3-82
Set up the logic analyzer 3-83
Connect the logic analyzer 3-85
Acquire the data 3-86
To test the time measurement accuracy (oscilloscope) 3-87
Set up the equipment 3-87
Set up the logic analyzer 3-88
Connect the logic analyzer 3-90
Acquire the data 3-90
To test the trigger sensitivity (oscilloscope) 3-91
Set up the equipment 3-91
Set up the logic analyzer 3-92
Connect the logic analyzer 3-94
Acquire the data 3-94
Performance Test Record (logic analyzer) 3-95
Performance Test Record (oscilloscope) 3-101
Performance Test Record (pattern generator) 3-104
4 Calibrating and Adjusting
Logic analyzer calibration 4-2
To calibrate the oscilloscope 4-3
Set up the equipment 4-3
Load the Default Calibration Factors 4-4
Self Cal menu calibrations 4-5
5 Troubleshooting
To use the flowcharts 5-2
To check the power-up tests 5-17
To nm the self-tests 5-18
To test the power supply voltages 5-24
To test the LCD display signals 5-26
To test the keyboard signals 5-27
To test the flexible disk drive voltages 5-28
To test the hard disk drive voltages 5-30
Contents
vii

Contents
To perform the BNC test 5-31
To test the logic analyzer probe cables 5-32
To verify pattern output (HP 1660EP-series only) 5-36
The
Ether address 5-38
To test the auxiliary power 5-39
6 Replacing Assemblies
To remove and replace the handle 6-5
To remove and replace the feet and tilt stand 6-5
To remove and replace the cover 6-5
To remove and replace the disk drive assembly 6-6
To remove and replace the power supply 6-7
To remove and replace the CPU board 6-7
To remove and replace SIMM memory 6-9
To remove and replace the switch actuator assembly 6-10
To remove and replace the rear panel assembly 6-11
To remove and replace the HP 1660E-series acquisition board 6-12
To remove and replace the HP 1660ES-series oscilloscope board 6-13
To remove and replace the HP 1660EP-series pattern generatorboard 6-14
To remove and replace the front panel and keyboard 6-15
To remove and replace the LCD display 6-16
To remove and replace the handle plate 6-17
To remove and replace the fan 6-18
To remove and replace the line filter 6-18
To remove and replace the HP 1660EP-series pattern generator cables 6-19
To remove and replace the HP-IB and RS-232-C cables 6-19
To remove and replace the JlO board 6-20
To return assemblies 6-20
7 Replaceable Parts
Replaceable Parts Ordering 7-2
Replaceable
Parts List 7-3
Exploded View
7-4
Power Cables and Plug Configurations 7-8
8 Theory of Operation
Block-Level Theory 8-3
The HP 1660EIESIEP-Series Logic Analyzer 8-3
The Logic Acquisition Board 8-7
The Oscilloscope Board 8-10
The
Pattern Generator Board 8-13
Self-Tests Description 8-15
Power-up Self-Tests 8-15
System Tests (System PV) 8-16
Analyzer Tests (Analy PV) 8-20
Oscilloscope
tests (Scope PV) 8-22
Pattern Generator tests (Patt Gen) 8-23
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