Keithley S530 User manual

www.tek.com/keithley
S530/S540 Parametric Test System
KTE Linear Parametric Test Library Manual
S530-900-01 Rev. E / September 2017
*PS530-900-01E*
S530-900-01E
A Tektronix Company

KTE Linear Parametric Test Library (LPTLib)
User's Manual
© 2017, Keithley Instruments
Cleveland, Ohio, U.S.A.
All rights reserved.
Any unauthorized reproduction, photocopy, or use of the information herein, in whole or in part,
without the prior written approval of Keithley Instruments is strictly prohibited.
These are the original instructions in English.
All Keithley Instruments product names are trademarks or registered trademarks of Keithley
Instruments. Other brand names are trademarks or registered trademarks of their respective
holders.
Document number: S530-900-01 Rev. E / September 2017
S530/S540

Safety precautions
The following safety precautions should be observed before using this product and any associated instrumentation. Although
some instruments and accessories would normally be used with nonhazardous voltages, there are situations where hazardous
conditions may be present.
This product is intended for use by personnel who recognize shock hazards and are familiar with the safety precautions required
to avoid possible injury. Read and follow all installation, operation, and maintenance information carefully before using the
product. Refer to the user documentation for complete product specifications.
If the product is used in a manner not specified, the protection provided by the product warranty may be impaired.
The types of product users are:
Responsible body is the individual or group responsible for the use and maintenance of equipment, for ensuring that the
equipment is operated within its specifications and operating limits, and for ensuring that operators are adequately trained.
Operators use the product for its intended function. They must be trained in electrical safety procedures and proper use of the
instrument. They must be protected from electric shock and contact with hazardous live circuits.
Maintenance personnel perform routine procedures on the product to keep it operating properly, for example, setting the line
voltage or replacing consumable materials. Maintenance procedures are described in the user documentation. The procedures
explicitly state if the operator may perform them. Otherwise, they should be performed only by service personnel.
Service personnel are trained to work on live circuits, perform safe installations, and repair products. Only properly trained
service personnel may perform installation and service procedures.
Keithley Instruments products are designed for use with electrical signals that are measurement, control, and data I/O
connections, with low transient overvoltages, and must not be directly connected to mains voltage or to voltage sources with high
transient overvoltages. Measurement Category II (as referenced in IEC 60664) connections require protection for high transient
overvoltages often associated with local AC mains connections. Certain Keithley Instruments measuring instruments may be
connected to mains. These instruments will be marked as category II or higher.
Unless explicitly allowed in the specifications, operating manual, and instrument labels, do not connect any instrument to mains.
Exercise extreme caution when a shock hazard is present. Lethal voltage may be present on cable connector jacks or test
fixtures. The American National Standards Institute (ANSI) states that a shock hazard exists when voltage levels greater than
30 V RMS, 42.4 V peak, or 60 VDC are present. A good safety practice is to expect that hazardous voltage is present in any
unknown circuit before measuring.
Operators of this product must be protected from electric shock at all times. The responsible body must ensure that operators
are prevented access and/or insulated from every connection point. In some cases, connections must be exposed to potential
human contact. Product operators in these circumstances must be trained to protect themselves from the risk of electric shock. If
the circuit is capable of operating at or above 1000 V, no conductive part of the circuit may be exposed.
Do not connect switching cards directly to unlimited power circuits. They are intended to be used with impedance-limited
sources. NEVER connect switching cards directly to AC mains. When connecting sources to switching cards, install protective
devices to limit fault current and voltage to the card.
Before operating an instrument, ensure that the line cord is connected to a properly-grounded power receptacle. Inspect the
connecting cables, test leads, and jumpers for possible wear, cracks, or breaks before each use.
When installing equipment where access to the main power cord is restricted, such as rack mounting, a separate main input
power disconnect device must be provided in close proximity to the equipment and within easy reach of the operator.
For maximum safety, do not touch the product, test cables, or any other instruments while power is applied to the circuit under
test. ALWAYS remove power from the entire test system and discharge any capacitors before: connecting or disconnecting
cables or jumpers, installing or removing switching cards, or making internal changes, such as installing or removing jumpers.
Do not touch any object that could provide a current path to the common side of the circuit under test or power line (earth)
ground. Always make measurements with dry hands while standing on a dry, insulated surface capable of withstanding the
voltage being measured.

For safety, instruments and accessories must be used in accordance with the operating instructions. If the instruments or
accessories are used in a manner not specified in the operating instructions, the protection provided by the equipment may be
impaired.
Do not exceed the maximum signal levels of the instruments and accessories. Maximum signal levels are defined in the
specifications and operating information and shown on the instrument panels, test fixture panels, and switching cards.
When fuses are used in a product, replace with the same type and rating for continued protection against fire hazard.
Chassis connections must only be used as shield connections for measuring circuits, NOT as protective earth (safety ground)
connections.
If you are using a test fixture, keep the lid closed while power is applied to the device under test. Safe operation requires the use
of a lid interlock.
The symbol on an instrument means caution, risk of hazard. The user must refer to the operating instructions located in the
user documentation in all cases where the symbol is marked on the instrument.
The symbol on an instrument means warning, risk of electric shock. Use standard safety precautions to avoid personal
contact with these voltages.
The symbol on an instrument shows that the surface may be hot. Avoid personal contact to prevent burns.
The symbol indicates a connection terminal to the equipment frame.
If this symbol is on a product, it indicates that mercury is present in the display lamp. Please note that the lamp must be
properly disposed of according to federal, state, and local laws.
The WARNING heading in the user documentation explains dangers that might result in personal injury or death. Always read
the associated information very carefully before performing the indicated procedure.
The CAUTION heading in the user documentation explains hazards that could damage the instrument. Such damage may
invalidate the warranty.
The CAUTION heading with the symbol in the user documentation explains hazards that could result in moderate or minor
injury or damage the instrument. Always read the associated information very carefully before performing the indicated
procedure. Damage to the instrument may invalidate the warranty.
Instrumentation and accessories shall not be connected to humans.
Before performing any maintenance, disconnect the line cord and all test cables.
To maintain protection from electric shock and fire, replacement components in mains circuits — including the power
transformer, test leads, and input jacks — must be purchased from Keithley Instruments. Standard fuses with applicable national
safety approvals may be used if the rating and type are the same. The detachable mains power cord provided with the
instrument may only be replaced with a similarly rated power cord. Other components that are not safety-related may be
purchased from other suppliers as long as they are equivalent to the original component (note that selected parts should be
purchased only through Keithley Instruments to maintain accuracy and functionality of the product). If you are unsure about the
applicability of a replacement component, call a Keithley Instruments office for information.
Unless otherwise noted in product-specific literature, Keithley Instruments instruments are designed to operate indoors only, in
the following environment: Altitude at or below 2,000 m (6,562 ft); temperature 0 °C to 50 °C (32 °F to 122 °F); and pollution
degree 1 or 2.
To clean an instrument, use a cloth dampened with deionized water or mild, water-based cleaner. Clean the exterior of the
instrument only. Do not apply cleaner directly to the instrument or allow liquids to enter or spill on the instrument. Products that
consist of a circuit board with no case or chassis (e.g., a data acquisition board for installation into a computer) should never
require cleaning if handled according to instructions. If the board becomes contaminated and operation is affected, the board
should be returned to the factory for proper cleaning/servicing.
Safety precaution revision as of June 2017.

General information.................................................................................................1-1
Introduction .......................................................................................................................... 1-1
Manual contents................................................................................................................... 1-1
Linear Parametric Test Library................................................................................2-1
Introduction .......................................................................................................................... 2-1
Measuring ............................................................................................................................ 2-1
Ordinary measurements............................................................................................................2-1
Averaged measurements..........................................................................................................2-2
Integrated measurements.........................................................................................................2-2
Sourcing and limits............................................................................................................... 2-2
Ranging................................................................................................................................ 2-3
Smart ranging............................................................................................................................2-3
Sticky ranging............................................................................................................................2-3
Settling time ..............................................................................................................................2-4
Fixed ranging ............................................................................................................................2-4
Range limits ..............................................................................................................................2-4
Matrix operations.................................................................................................................. 2-4
Sweeping ............................................................................................................................. 2-5
Triggers................................................................................................................................ 2-6
GPIB..................................................................................................................................... 2-6
Instruments and instrument drivers...................................................................................... 2-7
Instrument and terminal IDs................................................................................................. 2-9
Optimizing test sequences................................................................................................... 2-9
Specify the default system speed mode..................................................................................2-10
Fixed range versus autorange measurements........................................................................2-10
Fix-range trigger instruments ..................................................................................................2-10
Use combination commands...................................................................................................2-10
Editing the icconfig_<QMO>.ini file.................................................................................... 2-11
Default system speed..............................................................................................................2-11
Default maximum voltage........................................................................................................2-12
Error handling..................................................................................................................... 2-12
Calling the getlpterr function....................................................................................................2-12
Error messages.......................................................................................................................2-13
Special error values returned..................................................................................................2-13
LPTLib command reference....................................................................................3-1
Introduction .......................................................................................................................... 3-1
Conventions used in this manual..............................................................................................3-1
Categorized command lists.................................................................................................. 3-2
Matrix commands......................................................................................................................3-3
Range commands.....................................................................................................................3-3
Source commands....................................................................................................................3-3
Measure commands..................................................................................................................3-3
Table of contents

Table of contents
S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
Scope card commands .............................................................................................................3-4
Pulse generator commands ......................................................................................................3-4
Combination commands ...........................................................................................................3-5
Timing commands.....................................................................................................................3-5
GPIB commands.......................................................................................................................3-5
General commands...................................................................................................................3-6
LPTLib commands............................................................................................................... 3-7
addcon......................................................................................................................................3-7
adelay .......................................................................................................................................3-8
asweepX...................................................................................................................................3-8
avgX........................................................................................................................................3-11
bmeasX...................................................................................................................................3-13
bsweepX.................................................................................................................................3-15
clrcon ......................................................................................................................................3-17
clrscn.......................................................................................................................................3-17
clrtrg........................................................................................................................................ 3-19
conpin .....................................................................................................................................3-21
conpth.....................................................................................................................................3-22
delay .......................................................................................................................................3-24
delcon .....................................................................................................................................3-25
devclr ......................................................................................................................................3-26
devint ......................................................................................................................................3-26
disable.....................................................................................................................................3-28
enable.....................................................................................................................................3-28
forceX......................................................................................................................................3-29
getlpterr...................................................................................................................................3-30
getstatus..................................................................................................................................3-31
imeast .....................................................................................................................................3-32
insbind.....................................................................................................................................3-32
intgX........................................................................................................................................3-34
kibdefclr...................................................................................................................................3-36
kibdefint...................................................................................................................................3-37
kibrcv.......................................................................................................................................3-38
kibsnd......................................................................................................................................3-39
kibspl....................................................................................................................................... 3-40
kibsplw....................................................................................................................................3-41
limitX.......................................................................................................................................3-41
lorangeX..................................................................................................................................3-42
measX.....................................................................................................................................3-45
mpulse ....................................................................................................................................3-47
pgu_current_limit.....................................................................................................................3-48
pgu_delay................................................................................................................................3-48
pgu_fall ...................................................................................................................................3-49
pgu_halt..................................................................................................................................3-49
pgu_height..............................................................................................................................3-50
pgu_init ...................................................................................................................................3-50
pgu_load.................................................................................................................................3-51
pgu_mode...............................................................................................................................3-51
pgu_offset ...............................................................................................................................3-52
pgu_period..............................................................................................................................3-52
pgu_range...............................................................................................................................3-53
pgu_rise..................................................................................................................................3-53
pgu_select...............................................................................................................................3-54
pgu_trig...................................................................................................................................3-54
pgu_trig_burst.........................................................................................................................3-55
pgu_trig_unit...........................................................................................................................3-56
pgu_width................................................................................................................................3-57
pulseX.....................................................................................................................................3-57
rangeX ....................................................................................................................................3-60
rdelay......................................................................................................................................3-62

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Table
of contents
refctrl.......................................................................................................................................3-62
rtfary........................................................................................................................................3-63
savgX......................................................................................................................................3-64
scp_close................................................................................................................................3-65
scp_detect_peaks...................................................................................................................3-66
scp_init....................................................................................................................................3-67
scp_measure...........................................................................................................................3-68
scp_measure_next..................................................................................................................3-69
scp_selftest.............................................................................................................................3-70
scp_setup................................................................................................................................3-70
searchX...................................................................................................................................3-71
setauto....................................................................................................................................3-74
setmode..................................................................................................................................3-74
setmode modifier tables..........................................................................................................3-76
setXmtr....................................................................................................................................3-81
sintgX......................................................................................................................................3-82
smeasX................................................................................................................................... 3-84
ssmeasX .................................................................................................................................3-86
sweepX...................................................................................................................................3-88
trigXg, trigXl.............................................................................................................................3-91
tstsel........................................................................................................................................ 3-94
Error definitions.......................................................................................................4-1
Result values indicating an error.......................................................................................... 4-1
Error messages.................................................................................................................... 4-2
3 LPT_NOCOMCHAN...............................................................................................................4-2
5 SYS_MEM_ALLOC_ERR ......................................................................................................4-2
20 LPT_PREVERR...................................................................................................................4-2
21 LPT_FATAL .........................................................................................................................4-2
22 LPT_FATALINTEST.............................................................................................................4-2
24 LPT_TOMANYARGS........................................................................................................... 4-2
100 MX_INVLDCNT.................................................................................................................. 4-3
101 MX_NOPIN ........................................................................................................................4-3
102 MX_MULTICON.................................................................................................................4-3
109 MX_ILLGLTSN...................................................................................................................4-3
113 MX_NOSWITCH................................................................................................................4-3
114 MX_ILLGLCON..................................................................................................................4-3
122 UT_INVLDPRM..................................................................................................................4-3
126 UT_NOURAM ....................................................................................................................4-3
129 UT_TMRIVLD.....................................................................................................................4-4
137 UT_INVLDVAL...................................................................................................................4-4
152 CB_BADFUNC...................................................................................................................4-4
156 CB_NOFILE.......................................................................................................................4-4
157 CB_FORMAT..................................................................................................................... 4-4
162 CB_INVLDERROR.............................................................................................................4-4
163 CB_INVLDEVENT..............................................................................................................4-4
166 CB_INSNOTREC...............................................................................................................4-4
173 CB_MULTITIMER ..............................................................................................................4-5
194 MX_INVLDTRM .................................................................................................................4-5
233 FM_NOCON.......................................................................................................................4-5
455 ECP_PROTOVER..............................................................................................................4-5
601 SYS_INTERNAL_ERR.......................................................................................................4-5
610 SYS_SPAWN_ERR...........................................................................................................4-5
611 SYS_NETWORK_ERR......................................................................................................4-5
612 SYS_PROTOCOL_ERR ....................................................................................................4-5
650 TAPI_BADCHANNEL.........................................................................................................4-6
651 TAPI_BADTESTER............................................................................................................4-6
652 TAPI_NOTFOUND.............................................................................................................4-6
653 TAPI_REFUSED................................................................................................................4-6

Table of con
tents S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
656 TAPI_CHANLIMIT..............................................................................................................4-6
657 TAPI_BUFOFLOW.............................................................................................................4-6

In this section:
Introduction .............................................................................. 1-1
Manual contents....................................................................... 1-1
Introduction
The Linear Parametric Test Library (LPTLib) contains detailed information about the S530/S540
LPTLib commands. It is intended as a reference guide for experienced users. This manual describes
each command in detail.
Manual contents
Section 1, General information (on page 1-1): Describes how the document is organized and what
information is presented in each section.
Section 2, Linear Parametric Test Library (on page 2-1): Describes how the Linear Parametric Test
Library (LPTLib) is used, and what functions it provides during test plan creation.
Section 3, LPTLib command reference (on page 3-1): Provides full details for the user of the LPTLib,
which contains the analysis commands built into the Parametric Test System software.
Section 4, Error definitions (on page 4-1): Describes error messages.
Section 1
General information

In this section:
Introduction .............................................................................. 2-1
Measuring ................................................................................ 2-1
Sourcing and limits................................................................... 2-2
Ranging.................................................................................... 2-3
Matrix operations...................................................................... 2-4
Sweeping ................................................................................. 2-5
Triggers.................................................................................... 2-6
GPIB ........................................................................................ 2-6
Instruments and instrument drivers.......................................... 2-7
Instrument and terminal IDs..................................................... 2-9
Optimizing test sequences....................................................... 2-9
Editing the icconfig_<QMO>.ini file........................................ 2-11
Error handling......................................................................... 2-12
Introduction
The Keithley line of parametric testers uses function libraries to control the instruments in the system.
These libraries are called test control libraries. A test control library is the lowest level software
interface to a parametric tester. This manual documents the Linear Parametric Test Library (LPTLib).
Measuring
The most important part of a parametric tester is its ability to make measurements. There are three
types of measurements you can make with the Linear Parametric Test Library (LPTLib):
•Ordinary measurements
•Integrated measurements
•Averaged measurements
The type of measurement you make depends on the type of noise you are trying to eliminate from
your measurement.
Ordinary measurements
Ordinary measurements are made with the measXcommand. This is the fastest single-point
measurement you can make. Use this type of measurement when speed is most important or when
noise is not significant.
Section 2
Linear Parametric Test Library

Section
2: Linear Parametric Test Library S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
2-2 S530-900-01 Rev. E / September 2017
Averaged measurements
Averaged measurements are made with the avgXcommand. Make an averaged measurement by
making several single-point measurements and averaging them. Averaged measurements reduce the
effects of random noise.
Integrated measurements
Integrated measurements are made with the intgXcommand. Integrated measurements examine
the signal over a longer period and reduce the effects of AC noise. Like averaged measurements,
integrated measurements reduce the effects of random noise, but they also reject noise with a period
that is an integer multiple of the integration period or aperture.
You can change the integration aperture of some instruments. Integration apertures are commonly
defined in units of power line cycles (PLCs). A PLC is the time it takes for one complete AC cycle of
the main power supplied to the system. The default integration aperture is one PLC. For 60 Hz power,
one PLC is 16.667 ms; for 50 Hz, one PLC is 20 ms. An integration aperture of 0.1 PLC on a 60 Hz
system is (0.1)(16.667 ms) = 1.667 ms.
A common mistake is to try to use large aperture integrated measurements to eliminate the effect of
random noise. Although noise can be reduced this way, it is typically more productive to use an
averaged measurement. The integrated measurement is generally as stable, but averaged
measurements usually can be made more quickly than integrated measurements.
This is especially true when making autoranged measurements. When an instrument makes
autoranged measurements, all of the measurements it makes when determining the best range are
done at the same aperture. If the instrument discards any measurements because they are on a
suboptimal range, time is wasted if they are made with a large aperture. With averaged
measurements, the instrument typically spends less time finding the optimal range.
Some instruments allow combinations of integration and averaging by allowing the behavior of one or
more of the three types of measurements to be altered temporarily. In this case, the instrument is
capable of performing an averaged integrated measurement.
Sourcing and limits
Source instruments normally force 0.0 by default. You can change the source value with the forceX
command. All current and voltage sources restrict the complementary function to the one they are
sourcing.
Current is the complementary function of voltage, and voltage is the complementary function of
current. For example, when a voltage source is forcing voltage, it restricts how much current it allows
to flow (including when it is sourcing its default 0.0 value). This is called the limit (also known as the
compliance limit). A current limit is used for a voltage source and a voltage limit is used for a current
source.
When this limit is reached, the source reduces its force value. In the preceding example, when the
voltage source reaches the limit, it reduces the voltage being forced so that the current does not
exceed the limit. When this happens, the source is said to be in compliance. For this example, the
voltage source is in current compliance.

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 2:
Linear Parametric Test Library
S530-900-01 Rev. E / September 2017 2-3
All sources have default limits, but you can change limit values with the limitXcommand.
When there are active sources in a test sequence, you can reset all source levels to the default of 0.0
with the devclr command. This resets the source level only. If a limit or any other instrument setting
has been changed from its default, it is not reset by the devclr call.
To reset all instrument settings to their initial or default state, use the devint command. The devint
command also clears all sources by internally calling the devclr command before resetting all
instruments to default settings.
Ranging
The default mode of operation for all instruments is to automatically select the best range available for
sourcing and for measuring. This is known as autoranging. For sources, the range is picked when the
source value is changed. When measuring, the instrument may need to make several measurements,
each on a different range, until it finds the best range for the measurement.
Autoranged measurements can take much longer to make than fixed-range measurements because
the instrument may need to change ranges and make extra measurements before finding the correct
range. There are two features that instruments may support that improve the performance of
autoranged measurements. These are smart ranging and sticky ranging.
Smart ranging
An instrument without smart ranging successively upranges or downranges until the correct range is
found. For instruments with many ranges, a large change in signal causes the instrument to scan
through many ranges before finding the correct one. With smart ranging, the instrument uses the
measured value on the incorrect range to try and determine what the correct range will be. If the
measurement is really small, the instrument skips ranges and tries to downrange directly to the
correct range.
When upranging, the instrument upranges once. If it is still on the wrong range it goes straight to its
highest allowable range (source limits affect the highest allowable range). If this range is too large, it
uses the smart method of downranging to the correct range. Note that as instrument technologies
evolve, new instruments may actually use variations of this technique.
Sticky ranging
The other special ranging feature an instrument may have is sticky ranging. Often an instrument is
required to make many measurements on the same range. If the instrument starts on the default
range each time (for example, the highest allowable range) and goes through its autorange algorithm
for each requested measurement, the instrument must make extra measurements to get to the
correct range each time.
Sticky ranging causes the instrument to stay on the last range it was on. If the next measurement it
must make is on this range, the instrument only makes one measurement. This feature is most useful
during sweeps where most of the measurements are on the same range. Sticky ranging also
coordinates with fixed ranging. When an instrument is put on a fixed range and then switched back to
autorange, the instrument starts autoranging on that range.

Section
2: Linear Parametric Test Library S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
2-4 S530-900-01 Rev. E / September 2017
Settling time
Another issue associated with range changes is settling time. The lowest ranges of an instrument can
have significantly larger settling times than the higher ranges. Both sticky ranging and smart ranging
help with this problem.
You may want autoranged measurements but do not care about resolution once the signal falls below
a certain value. In this case, having an autoranged measurement go to the lowest range an
instrument has wastes time.
You can use the lorangeXcommand to specify the lowest range an instrument uses when
autoranging. The instrument then gives you the resolution you need without wasting time trying to
make a measurement on a more accurate range.
Fixed ranging
Often, autoranged measurements are not required. If the range on which a measurement will be
made is known before the measurement is made, fixed ranging can be used. You can select a fixed
range on an instrument with the rangeXcommand. Fixed-range measurements are made more
quickly than autoranged measurements.
When making fixed range measurements, you must be careful that the range is not set too low. If the
range is set too low, the signal may be too large to measure on the specified range. If the signal is
larger than the full scale of the range, the instrument goes into an overrange condition. When this
happens, the instrument returns a special value to indicate the error instead of the actual
measurement.
Range limits
When an instrument is on a range lower than its compliance limit, it limits at full scale of range. For
example, a voltage source that is fixed on the 10 µA current measurement range limits at 10 µA, even
though the compliance may be programmed to a larger value. Because a fixed range measurement
will not automatically uprange, it cannot resolve this artificial compliance. This is known as range limit.
This can affect measurements made on another instrument because the source is not forcing the
programmed value. The system automatically resolves problems like this, but only for instruments
that are on autorange.
Matrix operations
Most instruments require their terminals to be connected to a device under test (DUT) before they can
be used. This involves the use of matrix commands. A typical test sequence consists of making
connections, sourcing, measuring, and then calling the devint command to restore the entire
system, including the matrix, to its default condition.
The command most used to make connections is the conpin command. Normally, several conpin
calls are made together at the beginning of a test sequence. These grouped conpin calls are
collectively called a conpin sequence.
If you need to clear all matrix connections in the middle of a test sequence, you can call the clrcon
command to do this explicitly. If you start a new conpin sequence in the middle of a test sequence,
the conpin command automatically performs a clrcon command before making any new
connections.

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 2:
Linear Parametric Test Library
S530-900-01 Rev. E / September 2017 2-5
To make new connections or remove connections in the middle of a test sequence, use the addcon
and delcon commands. These commands do not clear the matrix like the conpin command does.
To prevent damage to matrix relays, all switching is done with sources off. The addcon, delcon, and
clrcon commands internally call the devclr command before opening or closing any relays. The
devint command does not directly call the devclr command as described in the sourcing section
above. It calls the clrcon command, which then calls the devclr command as part of its normal
processing.
Sweeping
The Linear Parametric Test Library (LPTLib) can automatically perform multiparameter sweeps.
Sweeps are more efficient than programmatically changing the source value on an instrument and
performing a set of individual measurements.
To set up a sweep, use the smeasX, sintgX, and savgXcommands to populate a measurement
scan table. Each call to one of these commands adds an entry to the table. You can then use the
sweepXcommand to step a source through a range of source values. At each step, a measurement
is made for each entry in the measurement scan table.
Before sweeping the source, the source range is automatically set to the range appropriate for the
largest source value in the sweep. This prevents a source range change in the middle of the sweep.
When ranging, the absolute value of the source value is used to determine range. For example, if a
voltage source is swept from –10 V to +0.5 V, the range appropriate for ±10 V (the 10 V range) is
used.
After the sweep has completed, the measurement scan table is not cleared. If another sweep is
performed, more measurements are made for each entry in the measurement scan table. The new
data is appended to the data from previous sweeps.
Calling the smeasX, sintgX, or savgXcommand does not clear the measurement scan table. The
new entries are added to the existing measurement scan table. The measurement scan table is
automatically cleared when the devint command is called, but it can be explicitly cleared by calling
the clrscn command.

Section
2: Linear Parametric Test Library S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
2-6 S530-900-01 Rev. E / September 2017
Triggers
Several Linear Parametric Test Library (LPTLib) commands use triggers. Triggers are Boolean
conditions, but to fully understand them you must understand how the LPTLib processes them.
Triggers are registered with the system using the trigXY commands. This creates an entry in a
trigger table. During processing of multiple LPTLib commands, the system evaluates the triggers.
This is done by examining each entry in the trigger table to see if its condition is true or false. If any of
the triggers are true, the trigger evaluation is true. Based on the evaluation of the triggers, the LPTLib
command may alter how it continues processing.
The trigger table is cleared automatically when the devint command is called. Note that previous
entries are not cleared by adding a new trigger. The new trigger is appended to the existing trigger
table and it is used with the rest of the trigger table entries the next time triggers are evaluated. This
is a common mistake among even experienced LPTLib users. The trigger table can be cleared
explicitly by calling the clrtrg command.
Most triggers are set up to monitor when a measurement on a specified instrument goes above or
below a specified value. For example, calling trigvg (SMU1, 2.0) registers a trigger that is true
when the voltage measured by SMU1 goes above 2 V.
When evaluating this type of trigger, the system does not monitor any measurements made by you.
Instead, it requests a fresh reading from the triggering instrument, which it then compares to the
threshold value. This means that while evaluating triggers, the system implicitly makes a
measurement for each entry in the trigger table, for all entries of this type of trigger.
The measurement is made using the measXcommand of the triggering instrument. You can use the
setmode command to force the LPTLib to use the intgXor avgXcommand of the triggering
instrument instead. To do this, all triggering instruments must support the intgXor avgXcommand,
respectively.
This type of trigger uses real numbers for the comparison. You can use the setmode command to
make all triggers evaluate based on the absolute value of the measurement instead of the polarized
measurement. You can clear this setmode option and the other triggering options mentioned above
using the clrtrg and devint commands.
GPIB The kibXXX commands allow you to control general purpose interface bus (GPIB) instruments that do
not have Linear Parametric Test Library (LPTLib) drivers. Because the instruments controlled this way
do not have drivers that automatically interact with matrix control, you must clear all sources before
performing any matrix operations.
You must also ensure that the instruments are returned to their default state at the end of a test
sequence. You can use the kibdefclr and kibdefint commands to do this. These commands
allow you to define strings that are sent to GPIB instruments any time the system is executing a
devclror devint command.
Failure to clear active GPIB-based sources before a matrix operation is performed could result in
damage to the matrix.

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 2: Lin
ear Parametric Test Library
S530-900-01 Rev. E / September 2017 2-7
Because of the slow speed of GPIB communication and the order in which instruments are cleared,
do not use GPIB instruments when performing bsweepXtests.
Multiple GPIB interfaces are not currently supported. However, future systems may support multiple
interfaces.
Instruments and instrument drivers
The Linear Parametric Test Library (LPTLib) provides the lowest level of instrument control available,
though it does not control the hardware directly. Instead, LPTLib relies on hardware drivers to control
instruments.
Each of these drivers only supports LPTLib commands appropriate for their function. For example,
the driver for a voltmeter would not support the function to measure frequency. The following tables
provide information about which LPTLib commands are supported by the driver for each type
instrument.
The following commands are supported by all drivers:
•
delay
•
devint
The following commands are supported by source-measure unit (SMU) drivers:
•
adelay
•asweepX
•avgi, avgv (avgX)
•bmeasX
•bsweepX
•clrscn
•clrtrg
•devclr
•forcei, forcev (forceX)
•getstatus
•insbind
•
intgi
,
intgv
(
intg
X)
•
limitX
•lorangeX
•measi, measv (measX)
•pulseX
•rangei, rangev (rangeX)
•refctrl
•rtfary
•rttrigary (26xx only)
•savgi, savgv (savgX)
•searchX
•setauto
•
setimtr (26xx only)
•setmode
•setvmtr (26xx only)
•sintgi, sintgv (sintgX)
•smeasi, smeasv (smeasX)
•sweepi, sweepv (sweepX)
•trigig, trigtg,trigvg
(trigXg)
•trigil, trigtl, trigvl
(trigXl)
•tstsel
The following commands are supported by capacitance-voltage unit (CVU) drivers:
•avgc, avgcg, avgg (avgX)
•clrscn
•devclr
•forcev
•
getstatus
•
insbind
•intgc, intgcg, intgg
(intgX)
•measc, meascg, measg
(
meas
X)
•
rangec
•rtfary
•setauto
•setmode
•
sweepv

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2-8 S530-900-01 Rev. E / September 2017
The following commands are supported by pulse-generator unit (PGU) drivers:
•
pgu_init
•pgu_load
•pgu_current_limit
•pgu_range
•pgu_period
•
pgu_rise
•
pgu_fall
•pgu_width
•pgu_delay
•pgu_height
•pgu_offset
•
pgu_mode
•
pgu_trig_burst
•pgu_trig_unit
•pgu_trig
•pgu_halt
The following commands are supported by scope card (SCP) drivers:
•
scp_init
•scp_setup
•
scp_measure
•
scp_measure_next
•scp_detect_peaks
•
scp_selftest
•
scp_close
The following commands are supported by system drivers:
•
setmode
The following commands are supported by digital multimeter (DMM) drivers:
•
avgi
,
avgv
(
avg
X)
•clrtrg
•devclr
•getstatus
•intgi, intgv (intgX)
•lorangeX
•measi, measv (measX)
•
rangei
,
rangev
(
range
X)
•refctrl
•savgv (savgX)
•setauto
•setmode
•sintgv (sintgX)
•
smeast, smeasi,
smeasv (smeasX)
•trigtg, trigvg
(trigXg)
•trigtl, trigvl
(trigXl)
•tstsel
The following commands are supported by switch mainframe drivers:
•
addcon
•clrcon
•
conpin
•
conpth
•delcon
•
setmode
•tstsel
The following commands support timer functions:
•
disable
•enable
•
imeast
The following commands control USB instruments that are not supported by S530 or S540 drivers:
•
kibdefclr
•kibdefint
•
kibrcv
•
kibsnd
•kibspl
•
kibsplw

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 2:
Linear Parametric Test Library
S530-900-01 Rev. E / September 2017 2-9
Instrument and terminal IDs
The Linear Parametric Test Library (LPTLib) uses instrument identification codes to refer to the
instruments in the system. An instrument identification code is an integer value. This manual never
refers to the actual numbers used to identify the instruments. Instead, it refers to the mnemonic codes
that you can use in your programs to refer to the various instruments.
An instrument ID typically consists of a mnemonic string that identifies the type of instrument and a
number that specifically identifies an individual instrument of this type. For example, SMU2 is an
instrument ID that refers to the second source-measure unit (SMU) in the system.
This manual often refers to a SMU instrument as SMUn(the nrepresents a number), however, it does
not matter which SMU is being used. Anywhere an instrument ID is required by a library command, a
specific instrument ID (mnemonic) can be used directly or as an integer variable that was assigned
the value of an instrument ID. For example, SMUncan indicate SMU1, SMU2, SMU3, and so on.
Most instruments have terminals that must be connected to your circuit before the instrument can be
used in a test sequence. For example, a simple voltmeter has two terminals: A high terminal and a
low terminal. The terminals of an instrument also have identification codes similar to the instrument
IDs; in some places an instrument ID and terminal ID can be used interchangeably.
The LPTLib Command Reference (on page 3-1) section contains information for instruments you may
have in your system that can be controlled by the LPTLib. In some cases, specific terminal IDs are
associated with the instrument; where appropriate, they are listed in the instr_id parameter
description. There are also some special instrument IDs and terminal IDs that the system recognizes
but are not associated with any specific instrument.
Special instrument IDs:
•KI_SYSTEM: This refers to the system itself. Note that KI_SYSTEM is a special
pseudo-instrument and the instrument ID does not refer to the collection of instruments in the
system but to the pseudo-instrument itself.
Special terminal IDs:
•CHUCK: The chuck connection. The sense pin option cannot be used with CHUCK. Use CHUCKM
instead.
•KI_EOC: This is a special terminal ID used to terminate a list of terminals in a connection
subroutine. This value is 0; you can use the value 0instead of KI_EOC.
Optimizing test sequences
There are several things you can do to optimize the S530/S540 for faster operation.

Section
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2-10 S530-900-01 Rev. E / September 2017
Specify the default system speed mode
Starting with Keithley Test Environment (KTE) software version 5.6, you can specify one of the
following speed modes as the default for your system:
FAST: Produces faster measurements than previous KTE versions, with little or no effect on data
correlation. This mode is the default setting starting with version 5.6.
LEGACY: A system speed mode that you can specify if you experience problems with the data you
are getting in the fast mode. This mode has speed and resolution performance similar to those in KTE
versions 5.5.1 or earlier.
CUSTOM: Allows you to optimize your system by making adjustments to delay, filtering, and
analog-to-digital (AD) conversion settings.
The S530/S540 can be set up to automatically run in any of these modes by changing the value of
the MODE parameter in the [SYSTEM SPEED MODE] section of the system
$KIHOME/IC/icconfig_<QMO>.ini file.
You can also set the speed mode for a specific module by adding the setmode command
KI_SYSTEM_SPEED_MODE modifier to your test sequence. For more information about the setmode
command and available modifiers, see setmode (on page 3-74).
For information about setting the default system speed mode in the icconfig_<QMO>.ini file, see
Editing the icconfig_<QMO>.ini file (on page 2-11).
Fixed range versus autorange measurements
Use fixed-range measurements whenever possible. Depending on the measurement, this can
significantly increase the speed of the test sequence.
Fix-range trigger instruments
When you are using triggers, you should fix-range the triggering instrument with the value of the
trigger. If you do not do this, the trigger command forces a measurement to be made after each
sweep point, and the measuring instrument autoranges. Autoranging noticeably increases the total
test execution time.
Use combination commands
Do not use individual forceXand measXcommands to sweep a set of points. Use the sweepX
command, which incurs significantly less overhead.

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 2:
Linear Parametric Test Library
S530-900-01 Rev. E / September 2017 2-11
Editing the icconfig_<QMO>.ini file
The $KIHOME/IC/icconfig_<QMO>.ini file is a system configuration file that defines the types of
instruments installed in the S530/S540 system, matrix and terminal configuration, and default system
settings. Your Keithley service technician configures this file when your system is installed.
This file can be edited to reflect changes in system hardware or to set different default system
settings.
When editing the icconfig_<QMO>.ini file (where <QMO> is the system QMO number), follow the
guidelines below:
•Make a backup copy of the file before making edits.
•Use only upper case characters.
•Do not use space or tab characters.
•Lines should be terminated with newline characters only (\n).
•Avoid duplicate entries and assignments.
Default system speed
By default, the S530/S540 is configured to FAST mode. S530 systems upgraded from an older
Keithley Test Environment (KTE) version may not have a [SYSTEM SPEED MODE] section in their
icconfig_<QMO>.ini file. This can be added but is not necessary unless you want to change the
settings.
The options for system speed mode are FAST, LEGACY, and CUSTOM. The default is:
[SYSTEM SPEED MODE]
MODE=FAST
When FAST or LEGACY mode is selected, other settings such as SOURCE_SETTLING, NPLC,
ANALOG_FILTER, and DELAY_FACTOR are ignored. If you set the speed mode to CUSTOM, the
system will use the settings specified in the icconfig_<QMO>.ini file.
To set a custom default system speed mode, add the following block to the top of the
icconfig_<QMO>.ini file (example):
[SYSTEM SPEED MODE]
MODE=CUSTOM
SOURCE_SETTLING=3
NPLC=0.01
ANALOG_FILTER=1
DELAY_FACTOR=0
If you have problems with correlation of data using the default FAST mode, your service technician
can add the following line to your icconfig_<QMO>.ini file to force the system to use the older
error mode: TSP_ERROR_MODE OFF (in KTE version 5.6.5 or later).