Keysight Technologies B1505A User manual

Keysight Technologies B1505A
Power Device Analyzer/Curve Tracer
Step by Step Measurement
Handbook for Power BJT

3
Agilent B1505A Power evice Analyzer/Curve Tracer is a powerful tool for measur-
ing and characterizing power devices.
This power bipolar junction transistor (BJT) measurement handbook covers how to
measure the typical power BJT parameters found in power BJT specifications or
data sheet as shown in table 1. Each test is covered with step by step instructions of
cable connection to the power BJT and the parameter setting of the test, and you
can easily setup the test and execute it by just following the guide.
The step by step measurement handbook covers;
● A cable connection from the instrument to the device terminal,
● A test setup of the measurement parameters and the data extraction scheme,
● A test execution and analysis on EasyEXPERT software which is resident in
B1505A and provides all the control of the B1505A.
A customized Application Test Library is created for testing the specifications intro-
duced in this measurement handbook. They can be downloaded from the Agilent
web site and you can use them by importing to your B1505A. They include the Appli-
cation Test library and the test definitions, and you can start measurements right
away.
Measuring power devices sometimes requires special knowledge of both the device
and the measuring instruments.
For example, the high voltage breakdown test sometimes requires a series resistor
connected between the High voltage SMU (HVSMU) and the collector of power BJT
to measure the breakdown characteristics or to protect from a damage of the device
from an unusual device breakdown.
The connection between SMU and the power BJT requires a different technique
than the power MOSFET because the base current of the power BJT is relatively
higher, and the voltage drop by the connection cable and the contact cannot be ig-
nored.
You can perform accurate measurement by following the steps of setup and the
measurement instructions of this measurement handbook.
Introduction

4
Typical power BJT Parameter Symbol Unit Measurement*
1
Typical Measurable Range of B1 0 A
Collector Current Ic A Ic-Vce -40 A to 40 A
(Minimum 10 fA resolution) *
2
C Current gain h
FE
Ic-Ib 1 ~ 10000 *
3
Collector Emitter Sustaining Voltage V
CE(SUS)
Collector Emitter Breakdown Voltage V
(BR)CEO
Collector-Emitter Cut-off Current I
CEO
A Ic-Vceo -8 mA to 8 mA
(Minimum 10 fA resolution) *
4
Collector-Base Voltage V
CBO
V Ic-Vcbo -3,000 V to 3,000 V
(Minimum 200 µV resolution) *
5
Collector-Base Cut-off Current I
CBO
A Ic-Vcbo -8 mA to 8 mA
(Minimum 10 fA resolution) *
4
Emitter-Base Voltage V
EBO
V Ie-Vebo -20 V to 20 V
(Minimum 2 µV resolution) *
6
Emitter Cut-off Current I
EBO
A Ie-Vebo -1 A to 1 A
(Minimum 10 fA resolution) *
7
Collector-Emitter Saturation Voltage V
CE(sat)
V Vce(sat)-Ic -20 V to 20 V
(Minimum 2 µV resolution) *
6
Base-Emitter Saturation Voltage V
BE(sat)
V Vce(sat)-Ic -20 V to 20 V
(Minimum 2 µV resolution) *
6
Base Emitter ON Voltage V
BE(on)
V Ic-Vbe -20 V to 20 V
(Minimum 2 µV resolution) *
6
Collector-Emitter Voltage (Base-Emitter
short) V
CES
V Ic-Vces -3,000 V to 3,000 V
(Minimum 200 µV resolution) *
5
Output Capacitance Cob pF C-V Better than 1% at C<10 nF *
8
V Ic-Vceo -3,000 V to 3,000 V
(Minimum 200 µV resolution) *
4
Note: *1: Measurement used for extracting the parameter.
*2: With two HCSMUs and requires ual HCSMU Combination Adapter.
*3: Rule of thumb (Example (Ic/Ib): 20 A/20 A ~ 1 A/100 µA)
*4: HVSMU. Maximum 4 mA at 3 kV, 8 mA at 1,500 V.
*5: HVSMU
*6: HPSMU and HCSMU. 2 µV resolution at 2 V range.
*7: HPSMU at 20 V range
*8: Max. 3,000 V C bias with High-voltage Bias T adapter.
Table 1. Typical DC and Capacitance parameters of power BJT and the compatibility of the B1 0 A.

5
Chapter 1. Basic Knowledge of the B1 0 A
1-1. Agilent B1 0 A Power Device Analyzer/Curve Tracer
1-2. Agilent N12 9A Power Device Fixture
1-3. EasyEXPERT Software
● Application Test
● Classic Test
● Tracer Test
Chapter 2. Preparation for the Measurements
2-1. Before using the B1 0 A
2-2. Instruments and Accessories used in the measurement examples
2-3. Devices used in the measurement examples
2-4. Cable Connection between the B1 0 A and the N12 9A Test Fixture
2- . Starting the B1 0 A
Chapter 3. Measurements of Data Sheet Specifications of Power BJTs
3-1. Application Test Example
3-1-1. Ic - Vce measurement
3-1-2. hFE and Vbe(on) versus Ic measurement
3-1-3. Vce(sat) and Vbe(sat) versus Ic measurement
3-1-4. Vce(sus) or V(BR)ceo, and Iceo-Vce measurement
A. Without 100 kΩ collector series resistor
B. With 100 kΩ collector series resistor
3-1-5. BVcbo and Icbo-Vcb measurement
3-1-6. BVebo and Iebo-Veb measurement
3-1-7. BVces and Ic-Vces measurement
3-1-8. Cob-Vc measurement
3-2. Classic Test and Tracer Test Example
3-2-1. Ic-Vce Tracer Test
3-2-2. Vce(sat) and Vbe(sat) versus Ic Classic Test
3-2-3. 100 kΩ resistor precision measurement for Vce(sus) Application Test
Table of Contents

6
Appendix
Appendix 1. Supplemental Information for Preparation
A1-1. ownload the example file-set from the Agilent web site
A1-2. How to return to Workspace management page
Appendix 2. Preparation for the Measurements using the Module Selector
A2-1. Instruments and Accessories used in the measurement examples
A2-2. Cable Connection between the B1505A and the N1259A Test Fixture
A2-3. Connection inside the N1259A Test Fixture
Appendix 3. Configuration for 40 A output
A3-1. Instruments and Accessories used for 40 A configuration
A3-2. Cable Connection between the B1505A and the N1259A Test Fixture
A3-3. EasyEXPERT configuration before starting a measurement
Appendix 4. Before returning the demo-B1 0 A
A4-1. Saving the measured data
A4-2. eleting the workspace and measured data

7
This chapter provides basic B1505A related informa-
tion that is better to know before you proceed this
material.
Agilent B1505A Power evice Analyzer / Curve
Tracer is designed for measuring present power de-
vices. B1505A uses the EasyEXPERT software, a
specially-designed Microsoft Windows® application
program.
The B1505A can measure wide range of power de-
vices from 10 fA to 40 A and 2 µV to 3,000 V with
3,000 V CV measurement features.
The EasyEXPERT software, which is resident on the
B1505A, provides an intuitive and flexible data man-
agement and analysis environment.
Chapter 1. Basic Knowledge of the B1 0 A
B1505A has 10 module slots, which support the following modules
B1510A High Power SMU (HPSMU) 10 fA~1 A/2 µV~200 V
B1512A High Current SMU (HCSMU) 10 pA~1 A/200 nV~40V ( C) or 10 pA~20
A/200 nV~20 V (Pulse)
B1513A High Voltage SMU (HVSMU) 10 fA~4 mA/200 µV~3000 V or 10 fA~8
mA/200 µV~1500 V
B1520A Multi Frequency CMU (MFCMU) 1 fF~10 nF @ 1 MHz for power BJT pa-
rameters with 0~3000 V C bias by using High Voltage Bias-Tee adapter.
Output and measurement range of each module are visually shown in figure 1-1.
1-1. Agilent B1 0 A Power Device Analyzer/Curve Tracer

8
Output and measurement range of each module are visually shown in figure 1-1.
40V-40V
-20A
-10A
10A
20A
1A
-1A
Pulse
DC
-20V 20V
Voltage
Current
(B) HCSMU Output and Measurement range
200V
100V
-200V -100V
1A
00mA
12 mA
-1A
20V
40V
Current
Voltage
(A) HPSMU Output and Measurement range
(C ) HVSMU Output and Measurement range
3000V
1 00V
-3000V -1 00V
- 4mA
- 8mA
8mA
4mA
1 00V Range
3000V Range
Current
Voltage
Figures 1-1. Output and measurement range.

9
Agilent N1259A Power evice Fixture shown in fig-
ure 1-2 is used for measuring packaged power de-
vices, It can basically covers the B1505A`s maximum
output range; 40 A and 3 kV.
We use N1259A option 020 High Voltage Bias-Tee
and option 022 100 kΩ resistor (optional) shown in
figure 1-3.
The module selector option 300 is handled in the
appendix section.
We do not use options 033 1 kΩ resistor in BJT ap-
plication.
Option 020 High Voltage Bias-Tee is required if you
perform a CV measurement with more than 25 V C
bias, and it expands the C bias range up to 3 kV
with HVSMU. You can perform the CV measurement
without Option 020 if the requirement of maximum
bias voltage is less than 25 V which can be output
from MFCMU-self.
Option 022 100 kΩ resistor is basically used by in-
serting a 100 kΩ resistor in series between the
HVSMU and the collector of the power BJT as
shown in Figure 1-4.
Figures 1-2. Agilent N12 9A Test Fixture
Opt 033
Opt 300
(Output)
Opt 020
Opt 022
Figure 1-3. N12 9A Opt 020, 022, 033 and 300
1 00kΩ
ΩΩ
Ω
R
GNDU
HVSMU
Protective resistor
Figure 1-4. Option 022 Series R inserted between the collector and the collector HVSMU.
1-2. Agilent N12 9A Power Device Fixture

10
Note:
We are not using Option 300 Module Selector which
is convenient for automatically switching the meas-
urement resources between the HVSMU, HCSMU and
HPSMU without manually re-connecting the cables
between the power BJT and each SMU. Figure 1-5
shows a simplified image of Module Selector con-
nected to the collector of the power BJT.
We can simplify the test setup in the example by not
using Option 300 and it becomes more versatile for
many users. If you have option 300 installed in the
N1259A, then you can simply use this option by prop-
erly interpreting the step by step instruction for the
collector connection.
However the instructions for using the module selec-
tor are covered in the appendix section.
Figure 1- . Simplified connection diagram using
N12 9A Option 300 Module Selector

11
The Easy EXPEERT software as a graphical user interface (GUI) of the B1505A has
three types of TEST mode, Application Test, Classic Test and Tracer Test. Each TEST
mode has its unique features and using an appropriate TEST mode that fits to your
test requirement is important for getting a better result sooner. Following describes
briefly about the B1505A`s TEST mode.
Application Test mode
The Application Test mode shown in figure 1-6 is a pre-defined test library coming
with the B1505A and it includes a basic and frequently used test, for example, Id-Vd
measurements. The user can start measurements by just typing in the measurement
parameters and the test results with a proper data which is automatically extracted
by the measurement is coming out by just pressing the Measure button.
We use improved Application Test definitions which are slightly modified version
from the original version included in the B1505A. You can find the instruction for
installing these files used in the handbook in the next section
It is simple and very easy for adding modifications like the example. You can refer to
the application note B1500A-4 “Customizing Agilent B1500A EasyEXPERT Applica-
tion Tests”, Agilent P/N: 5989-5167EN.
As a conclusion, Application Test is the best choice if it satisfies your requirement.
If not, there are two choices; one is to modify the existing Application Test defini-
tion, and the other is going to Classic Test mode.
1. Enter the Test Parameters 2. Press the Measure Button
Figure 1-6. Application Test GUI
1-3. EasyEXPERT Software

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Classic Test mode
Classic Test is used inside of the Application Test definition as a main measurement
engine for defining and executing a test. Classic Test can be used itself as a stand-
alone test engine and it can define a unique test. The user interface of the Classic
Test mode adopts the same concept of the Agilent Semiconductor Parameter Ana-
lyzers and anyone can get used to handle this interface easily. Any application that
is not covered in the Application Test library can be covered by using the Classic
Test mode.
Figure 1-7 shows an example Classic test setup window where 1. Channel Setup
page, 2. Measurement Setup page and 3. optional SMU parameter setup sub-panels
and 4. isplay setup page that is minimum pages you have to fill in before starting
measurements.
1.
2.
3.
4.
Figure 1-7. Example Classic Test measurement parameter setup panels.

13
Setting up a new Classic Test definition requires more knowledge as like the con-
nection between the device and SMUs of the B1505A and the function setup of the
SMUs as shown in figure 1-8 compared to the pre-defined Application Test. Gener-
ally speaking, the user can interact more directly to the SMU control in the case of
Classic Test compared to the Application Test which is somewhat black box to the
user until knowing the inside setup by sneaking in the Application Test definitions.
After you create a new Classic Test definition, you may have two choices; one is
continuously using that Classic Test definition or the other is converting the Classic
Test definition to a new Application Test definition. Creating a new Application Test
is effective if the new test definition is used by many people for relatively long pe-
riod because you can add more information to the user or operator through the Ap-
plication Test GUI and it can be considered as a simple record of the test definition.
Note: The Classic Test example setups used in the example application Test defini-
tions are included in the same example file set of the Application Test.
You can modify the measurement details such as user function, auto-analysis and
display items by using the example setups.
Tracer Test mode
Tracer Test mode shown as an example in figure 1-9 provides a real time feedback
in controlling the measurements like a curve tracer and it is useful as a debugging
tool for characterizing or quick check of a new or unknown devices. In the Tracer
Test mode, you can change the measurement parameters while the test is repeat-
edly executed, for example, the collector voltage of the Id-Vd sweep can be manu-
ally changed by rotating a knob of the B1505A like rotating a voltage dial of the
curve tracer.
Figure 1-8 shows an example of Tracer Test measurement example.
Figure 1-8. Example Tracer Test mode GUI.

14
There are other ways for using the Tracer Test mode.
Since the Tracer Test setup can be easily converted to a Classic Test setup, You can
use Tracer Test mode as an easy test setup and test debugging tool.
The example test setup features will automatically set complicated test setup, and
the interactive measurement control features help for debugging the new test setup.
Then, you can convert the completed setup to a Classic test for repeated use with a
fixed measurement parameters or adding extra display traces and analysis function-
alities such as automatic markers or lines.
This handbook introduces measurement examples of power BJT specification
mainly by using Application Test setups. However, a few examples are shown in
section 3-2 for Classic Test mode and Tracer Test mode.

15
Chapter 2. Preparation for the Measurements
2-1. Before using B1 0 A
There are potentially hazardous voltages (3000 V for HVSMU, and 200 V
for HPSMU) present at the Force, Sense, and Guard terminals of Agilent
B1 0 A. To prevent electrical shock, the following safety precautions
must be observed during the use of B1 0 A.
● Use a three-conductor AC power cable to connect the cabinet (if
used) and B1505A to an electrical ground (safety ground).
● You must connect an interlock cable between B1505A and the test
fixture.
● Confirm periodically that the interlock function is functional.
● o not modify the interlock circuit.
● o not use extension cables for connecting the UT the outside of
the test fixture.
● Before touching the connections on the Force, Guard, and Sense ter-
minals, turn the B1505A off and discharge any capacitors. If you do
not wish to turn the B1505A off, complete all of the following items,
regardless of the B1505A settings.
- Press the Stop key to turn the module output off.
- Confirm that the High Voltage indicator is not lit.
- Open the shielding box access door.
- ischarge any capacitors connected to an SMU.
WARNING

16
HCSMU
MFCMU
HVSMU
HPSMU
HCSMU
HCSMU
HPSMU
MFCMU
HVSMU
HPSMU
(B) Two HCSMU and one
HPSMU configuration.
(A) Two HPSMU and one
HCSMU configuration.
We use the following two B1505A configurations in the measurement example,
Both configurations are used for 20 A collector output. The difference is the maxi-
mum base current is limited to 1 A in the configuration of figure 2-1(A) that uses
two HPSMUs and one HCSMU, but the other configuration that uses one HPSMU
and two HCSMUs (figure 2-1(B)) can drive more than 1A by using one of HCSMUs.
You can use the same example files by just replacing the corresponding SMU
names.
Agilent B1 0 A Power Device Analyzer/Curve Tracer
2 x HPSMU and 1 x HCSMU configuration:
● 1 X HVSMU (B1513A) High Voltage SMU
● 1 X HCSMU (B1512A) High Current SMU
● 2 X HPSMU (B1510A) High Power SMU (Note: only one HPSMU is used in
the example)
● 1 X MFCMU (B1520A) Multi-Frequency CMU
1 x HPSMU and 2 x HCSMU configuration:
● 1 X HVSMU (B1513A) High Voltage SMU
● 2 X HCSMU (B1512A) High Current SMU
● 1 X HPSMU (B1510A) High Power SMU
● 1 X MFCMU (B1520A) Multi-Frequency CMU
2-2. Instruments and Accessories used in the measurement examples
Figure 2-1. B1 0 A configuration used in the example.

17
Following shows the N1259A test fixture configuration and cables
used for connecting between B1505A and the N1259A.
Agilent N12 9A High Power Test Fixture
● Opt 020 High Voltage Bias Tee
● Opt 300 Module Selector (Optional: Check appendix section for
using the Module Selector)
● Opt 010 Inline package socket module (3 pin)
● Opt 022 100 kΩ R-Box (Optional)
● Opt 033 1 kΩ R-Box (Not used in BJT applications)
● (10 X Test leads, 2 X SHV cables and SHV-Banana adapters are in-
cluding in the N1259A)
Cables
(2x HCSMU configuration is noted in parenthesis for each items)
● 1 X 16493S HCSMU Cable (2 X for 2x HCSMU config.)
● 1 X 16493T HV Triax Cable
● 4 X 16494A Triax Cable (2 X for 2x HCSMU A config.)
● 1 X 16493L GN U Cable
● 1 X N1300A CMU Cable
● 1 X 16493J Interlock Cable
Figures 2-2. Agilent N12 9A Test
Fixture
16494A Triax Cable N1300A CMU Cable
16493J Interlock Cable16493T HCSMU Cable
16493T HV Triax
Figure 2-3. Cables used for connecting between the B1 0 A and the N12 9A

18
Optional Items:
The following adapter and the cable are required for configuring the 40 A solution by
using two HCSMU modules. The configuration for 40A solution is introduced in the
appendix section.
Optional accessories (for 40A configuration only)
● 1 X 16493S Opt 021 ual HCSMU Combination Adapter
● 1 X 16493S Opt 021 cable
16493S Opt 021
(40 A option)
16493S Opt 021 Cable
(40 A option)
Note:
igital I/O cable shown in figure 2-5 is used for controlling the N1259A Option 300
Module Selector.
Since the Module Selector is not used in this section, there is no need for connect-
ing this cable at the moment.
However Module Selector is handled in the appendix section where the N1259A
Option 300 Module Selector is used for automatically switching between HCSMU
and HVSMU.
16493G igital I/O Cable
(Optional for N1259A Opt 300)
Figure 2- . Digital I/O Cable
Figures 2-4. Cables used for 40 A configuration

19
The following device is used in the measurement examples of this handbook.
MJL4281AG is a high-power BJT for audio application, and this transistor is used in
both the high current and high voltage measurement examples. This power BJT
used in the examples in the next chapter is suitable for showing the full capabilities
of the B1505A`s performance in a wide range of applications.
Even in case a different power BJT is used, the example test setup of this handbook
is not being affected by which power BJT is used, and the user can just enter appro-
priate parameters depending on the specification of the power BJT used.
Power BJT specifications
MJL4281AG (NPN) – High-power audio applications
● Bce(sus), V(BR)ceo: > 350 V (Ic=50 mA, Ib=0 A)
● Iceo: < 100 µΑ (Vce=200 V, Ib=0 A)
● Vcbo: > 350 V (Absolute Maximum)
● Icbo: < 50 µΑ (Vcb=350 V, Ie=0 A)
● Vebo: > 5 V (Absolute Maximum)
● Iebo: < 5 µΑ (Veb=5 V, Ic=0 A)
● Ic < 30 A (Pw < 5 ms, uty <10 %)
● P 230 W (Tc=25 degC)
● hFE 80 - 250 (Vce=5 V, Ic=0.1 ~ 5 A)
>50 (Vce=5 V, Ic=8 A)
>10 (Vce=5 V, Ic=15 A)
● Vbe(on) < 1.5 V (Vce=5 V, Ic=5 A)
● Vce(sat) < 1 V (Ic=8 A, Ib=0.8 A)
● Vbe(sat) < 1.4 V (Ic=8 A, Ib=0.8 A)
● Cob: < 600 pF (Vcb=10 V, Ie=0 A, f=1 MHz)
2-3. Devices used in the measurement examples
MJL4281AG

20
Before starting the measurements, connect the cables between the B1505A and the
N1259A depending on your B1505A configurations. These connections are used for
all the measurement examples, and there is no need for changing this configuration
later.
This configuration is used when only one HCSMU is installed in the B1505A.
Connect the cables between the B1505A and the N1259A as shown in figure 2-6 by
following the step number 1 to 6.
The breakdown of each steps with cable figures and the connector locations are
shown in figure 2-7.
Step number 1:
Using a 16493J Interlock Cable, connect the Interlock on the B1505A and the
Interlock on the N1259A
Tips:
For connecting the interlock cable, hold the black plastic part and then turn
the connector by pressing to ard the interlock connector in the instrument
side as sho n in figure 2-8.
2-4. Cable Connection between the B1 0 A and the N12 9A Test Fixture
2-4-1. 2 x HPSMU and 1 x HCSMU configuration
Back side of the B1505A
Back side of the N1259A
1
2
3
6
5
4
B1 13A
HVSMU
B1 12A
HCSMU
B1 10A
HPSMU
B1 10A
HPSMU
B1 20A
MFCMU
GNDU
Leave it open
CoaxTriax
Coax
Triax
Figure 2-6. Connections for 2x HPSMU and 1x HCSMU Configuration.