SPECTRO XEP05 User manual

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SPECTRO XEPOS
Benchtop XRF Spectrometer
Original operating instructions

SPECTRO XEPOS — 19.01.2017 — 3
Table of Contents
1Description of instrument ....................................................................................5
1.1Description .......................................................................................................................... 5
1.2Function .............................................................................................................................. 5
1.3Overview ............................................................................................................................. 6
1.3.1Configuration ......................................................................................................... 6
1.3.2Instrument (front) ................................................................................................... 7
Opening and closing the sample chamber lid ....................................................... 8
1.3.3Instrument (back)................................................................................................... 9
1.3.4Sample chamber ................................................................................................. 10
1.3.5Sample chamber - additional components.......................................................... 11
1.3.6Sample tray ......................................................................................................... 11
2Safety................................................................................................................12
2.1Symbols used ................................................................................................................... 12
2.2User information................................................................................................................ 13
2.3Intended use ..................................................................................................................... 13
2.4Prohibited operating conditions ........................................................................................ 14
2.5Residual risks.................................................................................................................... 14
2.6Radiation protection advice .............................................................................................. 16
2.6.1Other countries .................................................................................................... 16
3Technical data...................................................................................................17
4Transportation/Setting-up .................................................................................18
4.1Storage ............................................................................................................................. 19
4.2Gas supply (optional)........................................................................................................ 19
4.3Vacuum (option)................................................................................................................ 20
4.4Uninterruptible power supply – UPS (option) ................................................................... 21
5Operation ..........................................................................................................23
5.1Displays ............................................................................................................................ 23
5.1.1Screen – Routine dialog ...................................................................................... 23
5.1.2Beam Stop display on the instrument.................................................................. 24
5.2Switching on the instrument.............................................................................................. 25
5.3Proceed with the start-up test ........................................................................................... 27
5.3.1Checking the safety circuits on the sample chamber lid ..................................... 27
5.3.2Checking the safety circuit on the filter changer ("Beam Stop").......................... 28
5.3.3Initialization of the stepping motors ..................................................................... 29
5.3.4Automatic verification of the safety circuits after one month ............................... 30
5.4Switching off the instrument.............................................................................................. 31
5.5Standby mode................................................................................................................... 32
5.6Measuring procedure........................................................................................................ 33
5.6.1Preparing the measuring procedure.................................................................... 33
How to measure different samples...................................................................... 34

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How to measure cuvettes (powder or liquid) ....................................................... 34
How to measure powder pallets .......................................................................... 35
How to measure glass or melting pellets............................................................. 35
How to measure large samples ........................................................................... 36
5.6.2Proceed with the measurement ........................................................................... 37
How to change/remove the sample tray .............................................................. 38
5.7Dust protection shutter / beam stabilization vacuum shutter (option)............................... 39
Dust protection shutter......................................................................................... 39
Beam stabilization vacuum shutter...................................................................... 39
6Maintenance by the operator............................................................................ 40
6.1Operator maintenance plan............................................................................................... 40
6.2Energy channel recalibration (MCA) ................................................................................. 42
6.3Standardization (Global recalibration)............................................................................... 43
6.4Clean the sample tray ....................................................................................................... 44
6.5Clean the sample chamber ............................................................................................... 44
6.6Replacing the adhesive film in the discharge reservoir .................................................... 45
6.7Replacing the tray pads .................................................................................................... 46
6.8Insert the film for the "liquid protect" sample cup.............................................................. 47
6.9Replacing the filter mat ..................................................................................................... 49
6.10Dust protection shutter / beam stabilization vacuum shutter (option) — Clean O-ring..... 50
6.11Troubleshooting ................................................................................................................ 51
7Spare parts and consumables.......................................................................... 55
8De-commissioning............................................................................................ 55
9Manufacturer address ...................................................................................... 55
10EC Declaration of Conformity........................................................................... 56

Description of instrument
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1 Description of instrument
1.1 Description
Designation: SPECTRO XEPOS
Model: XEP05
Type: 76004852
1.2 Function
X-rays excite the atoms of the sample, causing them to emit radiation. This
radiation is measured by a semiconductor detector.
To achieve a higher sensitivity, the exciting radiation can be optimized by using X-
ray optical elements or filters.
The instrument comes with a prepared analysis method. Data are already stored
in the instrument's memory. The measured values are compared with these data.
After the measurement is complete, the results of a sample relating to an unknown
composition are displayed on the screen.
The sample material may be solid, liquid or in powder form, see Chapter "How to
measure different samples".

Description of instrument
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1.3 Overview
1.3.1 Configuration
The instrument is available in various configurations. Depending on the
application/requirement, the instrument is equipped with the following X-ray optics:
Direct excitation
Direct excitation and single polarization channel
Direct excitation and dual polarization channel
Depending on the application / requirement, the following expansions are
available:
Sample spinner
Helium flushing
Vacuum pump
Active pile-up suppression
Dust protection shutter / beam stabilization vacuum shutter

Description of instrument
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1.3.2 Instrument (front)
Fig. 1: Front view
No. Component
1 Sample chamber lid
2 Ventilation slots with filter mat
3 Beam stop display Open/closed (Open = red/closed = green)
X-ray display On/Off (On = orange/Off = off),
see also Chapter 5.1.2.
1
2
3
3

Description of instrument
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Opening and closing the sample chamber lid
Caution! Risk of crushing injuries!
When closing the sample chamber lid, there is an inherent risk of crushing injuries.
When closing the sample chamber lid keep the fingers out of the sample
chamber.
Fig. 2
No. View
1 Sample chamber lid closed
2 Sample chamber lid open
When pressing slightly against the handle, the sample chamber lid can be pushed
back and locked into place. In order to open the cover, slightly press against the
handle and pull on the sample chamber lid.
12

Description of instrument
SPECTRO XEPOS — 19.01.2017 — 9
1.3.3 Instrument (back)
Fig. 3: Rear view
No. Component No. Component
1 Type plate with serial number,
date of production, max.
parameters of the X-ray tube
5 Power supply connection for
vacuum pump (1000 W max.)
2 PC/Ethernet conviction (using the
LAN cable included in delivery)
6 Power In (max. 1200 W)
3 Helium supply line connection 7 Key-operated switch On/Off
4 Vacuum hose connection
Note
Set up the instrument to ensure the power isolators (switches and power cable)
can be easily reached.
1
3
2
45
67

Description of instrument
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1.3.4 Sample chamber
Fig. 4
No. Component
1 Sample tray locking device
2 Sample tray (different models available)
3 Analysis position (position of the sample during the measurement)
4 Tray handle
5 Tray screw
1
4
2
3
5