Agilent Technologies E1420B User manual

Agilent Technologies
Agilent E5505A
Phase Noise
Measurement System
User’s Guide
First edition, June 2004

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E5505--90003
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First edition, June 2004
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Agilent E5505A User’s Guide 3
Contents
1 Getting Started
Introduction 26
Documentation Map 27
Table 1. E5505A user’s guide map 27
Additional Documentation 28
Figure 1. Navigate to system documentation 28
System Overview 29
Figure 2. E5505A benchtop system, typical configuration 30
Table 2. Equivalent system/instrument model numbers 30
2 Introduction and Measurement
Introducing the GUI 32
Figure 3. E5500 graphical user interface (GUI) 33
Designing to Meet Your Needs 34
Beginning 34
E5505A Operation: A Guided Tour 35
Required equipment 35
How to begin 35
Powering the System On 36
To power on a racked system 36
To power on a benchtop system 36
Starting the Measurement Software 37
Figure 4. Navigation to the E5500 user interface 37
Figure 5. Phase noise measurement subsystem main screen 38
Performing a Confidence Test 39
Figure 6. Opening the file containing pre-stored parameters 39
Figure 7. Navigating to the Define Measurement window 40
Beginning a measurement 40
Figure 8. Navigating to the New Measurement window 40
Figure 9. Confirm new measurement 41
Figure 10. Setup diagram displayed during the confidence test. 41
Figure 11. Connect diagram example 42
Making a measurement 42
Figure 12.Typical phase noise curve for test set confidence test 43
Sweep segments 43

4Agilent E5505A User’s Guide
Congratulations 43
Learning more 44
Table 3. Parameter data for the N5500A confidence test example 44
Powering the System Off 45
To power off a racked system 45
To power off a benchtop system 45
Using the E5500 Shutdown Utility 45
Figure 13. Shutdown utility icon 45
3PhaseNoiseBasics
What is Phase Noise? 48
Figure 14. RF sideband spectrum 49
Phase terms 49
Figure 15. CW signal sidebands viewed in the frequency domain 50
Figure 16. Deriving L(f) from a RF analyzer display 51
Figure 17. L(f) Described Logarithmically as a Function of Offset Frequency 51
Figure 18. Region of validity of L(f) 52
4 Expanding Your Measurement Experience
Starting the Measurement Software 54
Figure 19. Navigate to E5500 user interface 54
Using the Asset Manager 55
Configuring an asset 55
Figure 20. Navigate to Asset Manager 55
Figure 21. Navigate to Add in Asset Manager 56
Figure 22. Select source as asset type 56
Figure 23. Choose source 57
Figure 24. Select I/O library 57
Figure 25. Enter asset and serial number 58
Figure 26. Enter comment 58
Figure 27. Click check-mark button 59
Figure 28. Confirmation message 59
Using the Server Hardware Connections to Specify the Source 60
Figure 29. Navigate to server hardware connections 60
Figure 30. Select Sources tab 60
Figure 31. Successful I/O check 61
Figure 32. Failed I/O check 61
Setting GPIB Addresses 63
Table 4. Default GPIB addresses 63

Agilent E5505A User’s Guide 5
Figure 33. Asset Manager on System menu 64
Figure 34. Asset Manager window 64
Figure 35. GPIB address dialog box 65
Testing the 8663A Internal/External 10 MHz 66
Required equipment 66
Defining the measurement 66
Figure 36. Select the parameters definition file 66
Figure 37. Enter Source Information 67
Table 5.Tuning characteristics for various sources 68
Selecting a reference source 68
Figure 38. Selecting a reference source 68
Selecting loop suppression verification 69
Figure 39. Selecting loop suppression verification 69
Setting up for the 8663A 10 MHz measurement 69
Figure 40. Noise floor for the 8663 10 MHz measurement 70
Figure 41. Noise floor example 70
Beginning the measurement 71
Figure 42. Selecting new measurement 71
Figure 43. Confirm new measurement 71
Figure 44. Connection diagram 72
Table 6.Test set signal input limits and characteristics 73
Sweep segments 75
Figure 45. Oscilloscope display of beatnote from test set monitor port 76
Making the measurement 76
Figure 46. Selecting suppression 77
Figure 47. Typical phase noise curve for an 8663A 10 MHz measurement 78
Table 7. Parameter data for the 8663A 10 MHz measurement 79
Testing the 8644B Internal/External 10 MHz 81
Required equipment 81
Defining the measurement 81
Figure 48. Select the parameters definition file 81
Figure 49. Sources tab in define measurement window 82
Table 8.Tuning characteristics for various sources 83
Selecting a reference source 83
Figure 50. Selecting a reference source 84
Selecting loop suppression verification 84
Figure 51. Selecting loop suppression verification 85
Setting up the 8663A 10 MHz measurement 85
Figure 52. Noise floor for the 8644B 10 MHz measurement 85
Figure 53. Noise floor example 86
Beginning the measurement 87

6Agilent E5505A User’s Guide
Figure 54. Selecting a new measurement 87
Figure 55. Confirm measurement dialog box 87
Figure 56. Connect diagram dialog box 88
Table 9.Test set signal input limits and characteristics 89
Figure 57. Oscilloscope display of beatnote from test set monitor port 91
Making the measurement 92
Figure 58. Suppression selections 92
Figure 59. Typical phase noise curve for an 8644B 10 MHz measurement. 93
Table 10. Parameter data for the 8644B 10 MHz measurement 94
Viewing Markers 96
Figure 60. Navigate to markers 96
Figure 61. Adding and deleting markers 96
Omitting Spurs 97
Figure 62. Navigate to display preferences 97
Figure 63. Uncheck spurs 97
Figure 64. Graph displayed without spurs 98
Displaying the Parameter Summary 99
Figure 65. Navigate to parameter summary 99
Figure 66. Parameter summary 100
Exporting Measurement Results 101
Figure 67. Export results choices 101
Exporting Trace Data 102
Figure 68.Trace data results 102
Exporting spur data 103
Figure 69. Spur data results 103
Exporting X-Y data 104
Figure 70. X-Y data results 104
5 Absolute Measurement Fundamentals
The Phase-Lock-Loop Technique 106
Understanding the Phase-Lock-Loop Technique 106
Figure 71. Simplified block diagram of the phase lock loop configuration 106
The Phase-Lock-Loop Circuit 106
Figure 72. Capture and drift-tracking range with tuning range of VCO 107
Figure 73. Capture and drift-tracking ranges and beatnote frequency 108
What Sets the Measurement Noise Floor? 110
The System Noise Floor 110
Table 11. Amplitude ranges for L and R ports 110
Figure 74. Relationship between the R input level and system noise floor 110

Agilent E5505A User’s Guide 7
The Noise Level of the Reference Source 111
Figure 75. Reference source noise approaches DUT noise 111
Selecting a Reference 112
Figure 76. DUT noise approaches reference noise 112
Using a Similar Device 112
Using a Signal Generator 113
Tuning Requirements 113
Table 12. Tuning Characteristics of Various VCO Source Options 113
Figure 77.Voltage tuning range limits relative to center voltage of the VCO tuning
curve 114
Estimating the Tuning Constant 115
Table 13. VCO tuning constant calibration method 115
Tracking Frequency Drift 116
Evaluating beatnote drift 116
Changing the PTR 118
Figure 78. Peak tuning range 118
The Tuning Qualifications 118
Minimizing Injection Locking 120
Adding Isolation 120
Increasing the PLL Bandwidth 120
Figure 79. Peak tuning range (PTR) Required by injection locking. 121
Inserting a Device 122
An attenuator 122
Figure 80. Measurement noise floor relative to R-Port signal level 122
An amplifier 123
Figure 81. Measurement noise floor as a result of an added attenuator 123
Evaluating Noise Above the Small Angle Line 124
Determining the Phase-Lock-Loop bandwidth 124
Figure 82. Phase lock loop bandwidth provided by the peak tuning range 125
Figure 83. Graph of small angle line and spur limit 126
Figure 84. Requirements for noise exceeding small angle limit 127
6 Absolute Measurement Examples
Stable RF Oscillator 130
Required equipment 130
Defining the measurement 130
Figure 85. Select the parameters definition file 130
Figure 86. Enter source information 131
Table 14.Tuning characteristics for various sources 132

8Agilent E5505A User’s Guide
Selecting a reference source 132
Figure 87. Selecting a reference source 133
Selecting Loop Suppression Verification 133
Figure 88. Selecting loop suppression verification 134
Setup considerations for stable RF oscillator measurement 134
Figure 89. Noise floor for the stable RF oscillator measurement 135
Figure 90. Noise floor calculation example 135
Beginning the measurement 136
Figure 91. Selecting a new measurement 136
Figure 92. Confirm new measurement 136
Figure 93. Connect diagram for the stable RF oscillator measurement 137
Table 15.Test set signal input limits and characteristics 138
Checking the beatnote 139
Figure 94. Oscilloscope display of beatnote from test set Monitor port 140
Making the measurement 140
Figure 95. Selecting suppressions 141
Figure 96.Typical phase noise curve for a stable RF oscillator 142
Table 16. Parameter data for the stable RF oscillator measurement 143
Free-Running RF Oscillator 145
Required equipment 145
Defining the measurement 145
Figure 97. Select the parameters definition file 146
Figure 98. Enter source information 147
Table 17.Tuning characteristics for various sources 147
Selecting a reference source 148
Figure 99. Selecting a reference source 148
Selecting Loop Suppression Verification 148
Figure 100. Selecting loop suppression verification 149
Setup considerations for the free-running RF oscillator measurement 149
Figure 101. Noise floor for the free-running RF oscillator measurement 150
Figure 102. Noise floor calculation example 150
Beginning the measurement 151
Figure 103. Selecting a new measurement 151
Figure 104. Confirm measurement dialog box 151
Figure 105. Connect diagram for the free-running RF oscillator measurement 152
Table 18.Test set signal input limits and characteristics 153
Checking the beatnote 153
Figure 106. Oscilloscope display of beatnote from test set Monitor port 154
Making the measurement 155
Figure 107. Selecting suppressions 156
Figure 108.Typical phase noise curve for a free-running RF oscillator 157

Agilent E5505A User’s Guide 9
Table 19. Parameter data for the free-running RF oscillator measurement 158
RF Synthesizer Using DCFM 160
Required equipment 160
Defining the measurement 160
Figure 109. Select the parameters definition file 160
Figure 110. Enter source information 161
Table 20.Tuning characteristics for various sources 162
Selecting a reference source 162
Figure 111. Selecting a reference source 162
Selecting Loop Suppression Verification 163
Figure 112. Selecting loop suppression verification 163
Setup considerations for the RF synthesizer using DCFM measurement 163
Figure 113. Noise floor for the RF synthesizer (DCFM) measurement 164
Figure 114. Noise floor calculation example 164
Beginning the measurement 165
Figure 115. Selecting a new measurement 165
Figure 116. Confirm measurement dialog box 165
Figure 117. Connect diagram for the RF synthesizer (DCFM) measurement 166
Table 21.Test set signal input limits and characteristics 167
Checking the beatnote 167
Figure 118. Oscilloscope display of beatnote from the test set Monitor port 168
Making the measurement 169
Figure 119. Selecting suppressions 169
Figure 120.Typical phase noise curve for an RF synthesizer using DCFM 170
Table 22. Parameter Data for the RF Synthesizer (DCFM) Measurement 171
RF Synthesizer Using EFC 173
Required equipment 173
Defining the measurement 173
Figure 121. Select the parameters definition file 173
Figure 122. Enter Source Information 175
Table 23.Tuning Characteristics for Various Sources 175
Selecting a reference source 176
Figure 123. Selecting a reference source 176
Selecting Loop Suppression Verification 176
Figure 124. Selecting Loop suppression verification 177
Setup considerations for the RF synthesizer using EFC measurement 177
Figure 125. Noise floor for the RF synthesizer (EFC) measurement 178
Figure 126. Noise floor calculation example 178
Beginning the measurement 179
Figure 127. Selecting a new measurement 179
Figure 128. Confirm measurement dialog box 179

10 Agilent E5505A User’s Guide
Figure 129. Connect diagram for the RF synthesizer (EFC) measurement 180
Table 24. Test set signal Input Limits and Characteristics 181
Checking the beatnote 181
Figure 130. Oscilloscope display of a beatnote from the test set Monitor port 182
Making the measurement 182
Figure 131. Selecting suppressions 183
Figure 132.Typical phase noise curve for an RF synthesizer using EFC 184
Table 25. Parameter data for the RF synthesizer (EFC) measurement 185
Microwave Source 187
Required equipment 187
Defining the measurement 187
Figure 133. Select the parameters definition file 187
Figure 134. Enter source information 189
Table 26.Tuning characteristics for various sources 189
Selecting a reference source 190
Figure 135. Selecting a reference source 190
Selecting Loop Suppression Verification 190
Figure 136. Selecting loop suppression verification 191
Setup considerations for the microwave source measurement 191
Figure 137. Noise characteristics for the microwave measurement 191
Beginning the measurement 192
Figure 138. Selecting a new measurement 192
Figure 139. Confirm measurement dialog box 192
Figure 140. Connect diagram for the microwave source measurement 193
Table 27.Test set signal input limits and characteristics 194
Checking the beatnote 194
Figure 141. Oscilloscope display of a beatnote from the test set Monitor port 195
Making the measurement 196
Figure 142. Selecting suppressions 197
Figure 143.Typical phase noise curve for a microwave source 198
Table 28. Parameter data for the microwave source measurement 199
7 Residual Measurement Fundamentals
What is Residual Noise? 202
The noise mechanisms 202
Figure 144. Additive noise components 202
Figure 145. Multiplicative noise components 203
Assumptions about Residual Phase Noise Measurements 204
Figure 146. Setup for typical residual phase noise measurement 204
Frequency translation devices 205