Murata GCM1885G1H101JA16 Series User manual

GCM1885G1H101JA16_ (0603, X8G:EIA, 100pF, DC50V)
_: packaging code Reference Sheet
1.Scope
2.MURATA Part NO. System
(Ex.)
3. Type & Dimensions
(Unit:mm)
4.Rated value
5.Package
Product specifications in this catalog are as of Oct.7,2015,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
0.5 min.
(1)-1 L
1.6±0.1
(1)-2 W
0.8±0.1
e
Chip Monolithic Ceramic Capacitor for Automotive
mark
(4)
Rated
Voltage
Packaging Unit
DC 50 V
Temp. Range
(Ref.Temp.)
(8) Packaging
Temp. coeff
or Cap. Change
This product specification is applied to Chip Monolithic Ceramic Capacitor used for Automotive Electronic equipment.
(2) T
0.8±0.1
-55 to 150 °C
0±30 ppm/°C
25 to 150 °C
(25 °C)
(6)
Capacitance
Tolerance
100 pF
Specifications and Test
Methods
(Operating
Temp. Range)
±5 %
(3) Temperature Characteristics
(Public STD Code):X8G(EIA)
g
0.2 to 0.5
(5) Nominal
Capacitance
D
f180mm Reel
PAPER W8P4
4000 pcs./Reel
J
f330mm Reel
PAPER W8P4
10000 pcs./Reel
(1)L/W
Dimensions
(2)T
Dimensions
(3)Temperature
Characteristics
(4)Rated
Voltage
(5)Nominal
Capacitance
(6)Capacitance
Tolerance
(8)Packaging
Code

Control Code
GCM 18 85G 1H 101 J A16 D
GCM1885G1H101JA16-01 1

Temperature
Compensating Type High Dielectric Type
Pre-and Post-Stress 
Electrical Test
2High Temperature The measured and observed characteristics should satisfy the
Set the capacitor for 1000±12 hours at 150±3℃.
Exposure (Storage) specifications in the following table. Set for 24±2 hours at room temperature, then measure.
Appearance No marking defects
Capacitance Within ±2.5% or ±0.25pF R7/L8/R9 : Within ±10.0%
Change (Whichever is larger)
Q/D.F.
30pFmin. : Q≧1000 R7/L8 W.V.: 25Vmin. : 0.03 max.
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.05 max.
C: Nominal Capacitance(pF) R9 : 0.075max.
I.R.
5C/5G/R7/L8 : More than 10,000Mor 500・F(Whichever is smaller)
・F(Whichever is smaller)
3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table. the same conditions as (19). Perform cycle test according to the four
Appearance No marking defects heat treatments listed in the following table. Set for 24±2 hours at
Capacitance Within ±2.5% or ±0.25pF R7/L8/R9: Within ±10.0% room temperature, then measure
Change (Whichever is larger)
Q/D.F.
30pFmin. : Q≧1000 R7/L8 W.V.: 25Vmin. : 0.03 max. *
30pFmax.: Q ≧400+20C * GCM188R7 1E/1H 563 to 104:0.05 max.
C: Nominal Capacitance(pF) W.V.: 16V/10V : 0.05 max.
R9 : 0.05max.
I.R.
More than 10,000Mor 500・F
(Whichever is smaller)
・Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4 Destructive No defects or abnormalities Per EIA-469.
Physical Analysis
5 Moisture Resistance The measured and observed characteristics should satisfy the
Apply the 24-hour heat (25 to 65℃) and humidity (80 to 98%)
specifications in the following table.
treatment shown below, 10 consecutive times.
Appearance No marking defects
Set for 24±2 hours at room temperature, then measure.
Capacitance Within ±3.0% or ±0.30pF R7/L8/R9 : Within ±12.5%
Change (Whichever is larger)
Q/D.F.
30pFmin. : Q≧350 R7/L8 : W.V.: 35Vmin.: 0.03 max.
10pF and over, 30pF and below: W.V.: 25Vmax. : 0.05 max.
Q≧275+5C/2 R9 : 0.075max.
10pFmax.: Q ≧200+10C
C: Nominal Capacitance(pF)
I.R.
5C/5G/R7/L8 : More than 10,000Mor 500・F(Whichever is smaller)
・F(Whichever is smaller)
6Biased Humidity The measured and observed characteristics should satisfy the

specifications in the following table.
at 85±3℃and 80 to 85% humidity for 1000±12 hours.
Appearance No marking defects
Remove and set for 24±2 hours at room temperature, then measure.
Capacitance Within ±3.0% or ±0.30pF R7/L8/R9: Within ±12.5%
The charge/discharge current is less than 50mA.
Change (Whichever is larger)
Q/D.F.
30pF and over: Q≧200 R7/L8 W.V.: 35Vmin.: 0.035 max.*
30pF and below: Q≧100+10C/3 * GCM188L81H221 to 103 : 0.05 max.
C: Nominal Capacitance(pF) W.V.: 25Vmax. : 0.05 max.
R9 : 0.075max.
I.R.
More than 1,000Mor 50・F
(Whichever is smaller)
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
1
-
Step
Time(min)
Cycles
1000(for ΔC/R7)
300(for 5G/L8/R9)
1
15±3
-55℃+0/-3
-55℃+0/-3
2
1
Room
Room
3
15±3
125℃+3/-0
150℃+3/-0
4
1
Room
Room
One cycle 24hours
Hours
Initial measuremt
+10
- 2 ℃
Humidity
90～98%
Humidity
80～98%
Humidity
80～98%
Humidity
90～98%
Humidity
90～98%
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Temperature
70
65
60
55
50
45
40
35
30
25
20
15
10
5
0
-5
-10
(℃)
JEMCGS-0363T 2

Temperature
Compensating Type
High Dielectric Type
7 Operational Life The measured and observed characteristics should satisfy the
Apply 200% of the rated voltage for 1000±12 hours at 125±3℃
specifications in the following table.
℃(for 5G/L8/R9).
Appearance No marking defects Set for 24±2 hours at room temperature, then measure.
Capacitance Within ±3.0% or ±0.30pF R7/L8/R9: Within ±12.5% The charge/discharge current is less than 50mA.
Change (Whichever is larger)
Q/D.F.
30pFmin. : Q≧350 R7/L8 : W.V.: 35Vmin.: 0.035 max.* ・Initial measurement for high dielectric constant type.
10pF and over, 30pF and below: * GCM155R71H 562 to 223: 0.05 max. Apply 200% of the rated DC voltage for one hour at the maximum
Q≧275+5C/2 GCM188L81H221 to 103 : 0.04 max. operating temperature ±3℃. Remove and set for 24±2 hours at
10pFmax.: Q ≧200+10C W.V.: 25Vmax. : 0.05 max. room temperature. Perform initial measurement.
C: Nominal Capacitance(pF) R9 : 0.075max.
I.R.
・F
(Whichever is smaller)
8 External Visual No defects or abnormalities Visual inspection
9 Physical Dimension Within the specified dimensions Using calipers
10 Resistance to Appearance No marking defects
Per MIL-STD-202 Method 215
Solvents Capacitance Within the specified tolerance Solvent 1 : 1 part (by volume) of isopropyl alcohol
3 parts (by volume) of mineral spirits
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max. Solvent 2 : Terpene defluxer
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035 max. Solvent 3 : 42 parts (by volume) of water
C: Nominal Capacitance(pF) R9 : 0.05max.
1 part (by volume) of propylene glycol monomethyl ether
1 part (by volume) of monoethanolamine
I.R.
・F
(Whichever is smaller)
11 Mechanical Appearance No marking defects
Three shocks in each direction should be applied along 3 mutually
Shock Capacitance Within the specified tolerance
perpendicular axes of the test specimen (18 shocks).
The specified test pulse should be Half-sine and should have a
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max. duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035 max.
C: Nominal Capacitance(pF) R9 : 0.05max.
I.R.
・F
(Whichever is smaller)
12 Vibration Appearance No defects or abnormalities
Solder the capacitor to the test jig (glass epoxy board) in the same
Capacitance Within the specified tolerance
manner and under the same conditions as (19). The capacitor
should be subjected to a simple harmonic motion having a total
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max. amplitude of 1.5mm, the frequency being varied uniformly between
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035 max. the approximate limits of 10 and 2000Hz. The frequency range, from
C: Nominal Capacitance(pF) R9 : 0.05max. 10 to 2000Hz and return to 10Hz, should be traversed in
approximately 20 minutes. This motion should be applied for 12
I.R.
・Fitems in each 3 mutually perpendicular directions (total of 36 times).
(Whichever is smaller)
13 Resistance to The measured and observed characteristics should satisfy the
Immerse the capacitor in a eutectic solder solution at 260±5℃for
Soldering Heat specifications in the following table.
10±1 seconds. Set at room temperature for 24±2 hours, then
Appearance No marking defects
measure.
Capacitance Within the specified tolerance
・Initial measurement for high dielectric constant type
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max. Perform a heat treatment at 150+0/-10 ℃for one hour and then set
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035 max. for 24±2 hours at room temperature.
C: Nominal Capacitance(pF) R9 : 0.05max. Perform the initial measurement.
I.R. ・F
(Whichever is smaller)
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
JEMCGS-0363T 3

Temperature
Compensating Type High Dielectric Type
14 Thermal Shock The measured and observed characteristics should satisfy the
Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table.
the same conditions as (19). Perform the 300 cycles according to
Appearance No marking defects
the two heat treatments listed in the following table(Maximum
Capacitance Within ±2.5% or ±0.25pF R7/L8/R9: Within ±10.0%
transfer time is 20 seconds). Set for 24±2 hours at room
Change (Whichever is larger)
temperature, then measure
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.03 max.*
30pFmax.: Q ≧400+20C * GCM188R7 1E/1H 563 to 104:0.05 max.
C: Nominal Capacitance(pF) W.V.: 16V/10V : 0.05 max.
R9 : 0.075max
I.R.
・F
(Whichever is smaller)
・Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
15 ESD Appearance No marking defects
Per AEC-Q200-002
Capacitance Within the specified tolerance
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max.
30pFmax.: Q ≧400+20C W.V.: 16V/10V :0.035 max.
C: Nominal Capacitance(pF) R9 : 0.05max.
I.R.
・F
(Whichever is smaller)
16 Solderability
(a) Preheat at 155℃for 4 hours. After preheating, immerse the
capacitor in a solution of ethanol(JIS-K-8101) and rosin (JIS-K-
5902) (25% rosin in weight proportion). Immerse in
eutectic solder solution for 5+0/-0.5 seconds at 235±5℃.
(b) should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in weight
proportion). Immerse in eutectic solder solution for 5+0/-0.5
seconds at 235±5℃.
(c) should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in weight
proportion). Immerse in eutectic solder solution for 120±5
seconds at 260±5℃.
17 Electrical Appearance No defects or abnormalities Visual inspection.
Chatacteri- Capacitance Within the specified tolerance
The capacitance/Q/D.F. should be measured at 25℃at the
zation
frequency and voltage shown in the table.
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max.
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035 max.
C: Nominal Capacitance(pF) R9 : 0.05max.
I.R. 25℃・F・FThe insulation resistance should be measured with a DC voltage not
(Whichever is smaller) (Whichever is smaller)
exceeding the rated voltage at 25℃and 125℃
150℃(for 5G/L8/R9) within 2 minutes of charging.
I.R. 125℃・F・F
(Whichever is smaller) (Whichever is smaller)
I.R. 150℃・F・F
(Whichever is smaller) (Whichever is smaller)
Dielectric No failure No failure should be observed when 250% of the rated voltage is
Strength applied between the terminations for 1 to 5 seconds, provided the
charge/ discharge current is less than 50mA.
95% of the terminations is to be soldered evenly and continuously.
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
Step
1
2
Temp.
(℃）
-55+0/-3
125+3/-0 
150+3/-0 (for 5G/L8/R9)
Time
(min.)
15±3
15±3
Char.
Item
ΔC,5G
(1000 pF and below)
ΔC,5G
(more than 1000pF)
R7,R9,L8
(C≦10μF)
Frequency
1±0.1MHz
1±0.1kHz
Voltage
0.5 to 5Vrms
1±0.2Vrms
JEMCGS-0363T 4

Temperature
Compensating Type
High Dielectric Type
18 Board Flex Appearance No marking defects
Solder the capacitor on the test jig (glass epoxy board) shown in
Fig1 using a eutectic solder. Then apply a force in the direction
Capacitance Within ±5.0% or ±0.5pF R7/L8/R9: Within ±10.0%
shown in Fig 2 for 5±1sec. The soldering should be done by the
Change (Whichever is larger)
reflow method and should be conducted with care so that the
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max. soldering is uniform and free of defects such as heat shock.
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035max.
C: Nominal Capacitance(pF) R9 : 0.05max.
I.R.
・F
(Whichever is smaller)
19 Terminal Appearance No marking defects Solder the capacitor to the test jig (glass epoxy board) shown in
Strength Fig.3 using a eutectic solder. Then apply *18N force in parallel with
Capacitance Within specified tolerance the test jig for 60sec.
The soldering should be done either with an iron or using the reflow
Q/D.F.
30pFmin. : Q≧1000 R7/L8 : W.V.: 25Vmin.: 0.025 max. method and should be conducted with care so that the soldering is
30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.035max. uniform and free of defects such as heat shock
C: Nominal Capacitance(pF) R9 : 0.05max.
I.R.
・F
(Whichever is smaller)
(in mm)
Fig.3
20 Beam Load Test Destruction value should be exceed following one. Place the capacitor in the beam load fixture as Fig 4.
< Chip L dimension : 2.5mm max. > Apply a force.
< Chip Length : 2.5mm max. >
< Chip L dimension : 3.2mm min. >
< Chip Length : 3.2mm min. >
Fig.4
Speed supplied the Stress Load : *0.5mm/s
*GCM03: 0.1mm/s
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
Chip thickness = 0.3mm rank : 5N
Chip thickness < 1.25mm rank : 15N
Chip thickness ≧1.25mm rank : 54.5N
Chip thickness < 0.3mm rank : 2.5N
Chip thickness > 0.5mm rank : 20N
Chip thickness = 0.5mm rank : 8N
t : 1.6mm
*2N(GCM03/15)
Type
a
b
c
GCM03
0.3
0.9
0.3
GCM15
0.5
1.5
0.6
GCM18
0.6
2.2
0.9
GCM21
0.8
3.0
1.3
GCM31
2.0
4.4
1.7
GCM32
2.0
4.4
2.6
(in mm)
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
100
40
a
c
b
f4.5
c
Fig.1
Type
a
b
c
GCM03
0.3
0.9
0.3
GCM15
0.4
1.5
0.5
GCM18
1.0
3.0
1.2
GCM21
1.2
4.0
1.65
GCM31
2.2
5.0
2.0
GCM32
2.2
5.0
2.9
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
a
a
c
b
ﾗﾝﾄﾞ
f4.5
c
Solder resist
Baked electrode or
Copper foil
b
t: 1.6mm
(GCM03/15: 0.8mm)
Iron Board
45
45
Flexure：≦2
(High Dielectric Type)
Capacitance meter
Pressurizing
speed:1.0mm/s
Pressurize
支持台
ｺﾝﾃﾞﾝｻ
45
45
Fig.2
Flexure：≦3
(Temperature
Compensating Type)
R4
20
114
L
0.6L
JEMCGS-0363T 5

Temperature
Compensating Type
High Dielectric Type
21 Capacitance Capacitance Within the specified tolerance. R7 : Within ±15% The capacitance change should be measured after 5 min. at
Temperature Change (Table A) (-55℃to +125℃)each specified temperature stage.
Characteristics L8 : Within ±15% (1)Temperature Compensating Type
(-55℃to +125℃)The temperature coefficient is determined using the capacitance
Within +15/-40% measured in step 3 as a reference. When cycling the temperature
(+125℃to +150℃)℃to +125℃,
R9 : Within ±15%
5G:+25℃to +150℃other temp. coeffcient.:+25℃to +85℃) the
(-55℃to +150℃) capacitance should be within the specified tolerance for the
temperature coefficient and capacitance change as Table A-1. The
capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the step
Temperature Within the specified tolerance. 1,3 and 5 by the cap value in step 3.
Coefficient (Table A)
Capacitance Within ±0.2% or ±0.05 pF
Drift (Whichever is larger.)
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the above 25℃
value over the temperature ranges shown in the table should be
within the specified ranges.
･Initial measurement for high dielectric constant type.
Perform a heat treatment at 150+0/-10℃for one hour
and then set for 24±2 hours at room temperature.
Perform the initial measurement.
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
Step
Temperature.(C)
1
25±2
2
-55±3
3
25±2
4
125±3（）, 150±3（for 5G/R9/L8）,85±3（for other TC）
5
25±2
Table A
Char.
Nominal Values
(ppm/C)
Capacitance Change from 25C (%)
-55
-30
-10
Max.
Min.
Max.
Min.
Max.
Min.
5C/5G
0± 30
0.58
-0.24
0.40
-0.17
0.25
-0.11
Note 1: Nominal values denote the temperature coefficient within a range of 25C to 125C(for C)/ 150C(for 5G).
JEMCGS-0363T 6

1.Tape Carrier Packaging(Packaging Code:D/E/W/F/L/J/K)
1.1 Minimum Quantity(pcs./reel)
 
Plastic Tape Paper Tape Plastic Tape
Code:D/E Code:W Code:L Code:J/ F Code:K
GCM03
15000(W8P2) 30000(W8P1) 50000(W8P2)
5 (Dimensions Tolerance:±0.05)
10000(W8P2) 20000(W8P1) 50000(W8P2)
5 (Dimensions Tolerance:±0.1min.)
10000(W8P2) 40000(W8P2)
GCM18
4000 10000
64000 10000
94000 10000
B3000 10000
64000 10000
94000 10000
M3000 10000
C2000 6000
94000 10000
M3000 10000
N2000 8000
R/D/E 1000 4000
M1000 5000
GCM43
N/R 1000 4000
E500 2000
M1000 5000
N/R 1000 4000
1.2 Dimensions of Tape
(1)GCM03/15 <Paper Tape W8P2 CODE:D/E/J/F> (in mm)
LW Dimensions
Tolerance(Chip)
GCM03 ±0.03 0.37 0.67 0.5 max.
±0.05 0.65 1.15
±0.1 0.70 1.20
±0.2 0.75 1.35
(2)GCM03/15 <Paper Tape W8P1 CODE:W> (in mm)
LW Dimensions
Tolerance(Chip)
GCM03 ±0.03 0.37 0.67 0.5以下
GCM15 ±0.05 0.65 1.15 0.8以下
GCM15
GCM55
Paper Tape
Type
GCM32
Package
GCM Type
GCM31
GCM21
Type
A *3
B *3
t
GCM15
0.8 max.
*3 Nominal value
Type
A *
B *
t
* Nominal value
Code GCM03 GCM15
A * 0.37 0.65
B * 0.67 1.15 * Nominal value
ｔ0.5 max. 0.8 max.
*1,2：2.0±0.05
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
4.0±0.1
*1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
Ａ
Ｂ
t
*2
0.05 max.
1.0±0.05
4.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
Ａ
Ｂ
t
1.0±0.05
JEMCGP-01894F 7

(3)GCM18/21/31/32 <Paper Tape> (in mm)
LW Dimensions
T Dimensions
Tolerance(Chip) (Chip)
GCM18 8 ±0.1 0.8±0.1 1.05±0.10 1.85±0.10
6 ±0.15 0.6±0.1
9 ±0.15 0.85±0.1
GCM31 9 ±0.15 0.85±0.1 2.00±0.20 3.60±0.20
GCM32
9 L:±0.3/W:±0.2 0.85+0.15/-0.05 2.80±0.20 3.60±0.20
(4)GCM21/31/32 <Plastic Tape> (in mm)
LW Dimensions
T Dimensions
Tolerance(Chip) (Chip)
±0.15 1.25±0.15 1.45±0.20 2.25±0.20
±0.2 1.25±0.2 1.50±0.20 2.30±0.20
±0.15 1.15±0.1
±0.2 1.15±0.15
±0.2 1.6±0.2
±0.3 1.6±0.3 2.10±0.20 3.60±0.20
M 1.15±0.1 1.7 max.
N 1.35±0.15 2.5 max.
R 1.8±0.2
D 2.0±0.2
E 2.5±0.2 3.7 max.
(5)GCM43/55 <Plastic Tape> (in mm)
A *1 B *1
3.6 4.9
5.2 6.1 *1 Nominal value
t
1.1 max.
GCM21
2.30±0.15
A
B
Package
GCM Type
Type
A
B
t
GCM21
B
2.0 max.
1.55±0.15
Type
3.0 max.
Type
t
GCM31
M
1.90±0.20
3.50±0.20
1.7 max.
C
2.5 max.
GCM43
2.5 max.(T≦1.8mm)
3.7 max.(T : 2.5mm)
GCM55
GCM32
L:±0.3
W:±0.2
2.80±0.20
3.50±0.20
GC□21 GC□21 GC□31 GC□31 GC□32
Code (Dimensions Tolerance: (Dimensions Tolerance: (Dimensions Tolerance: (Dimensions Tolerance:
±0.15) ±0.2) ±0.2 within) ±0.3)
A 1.45±0.2 1.5±0.2 1.9±0.2 2.1±0.2 2.8±0.2
B 2.25±0.2 2.3±0.2 3.5±0.2 3.6±0.2 3.5±0.2
Code GC□18 GC□21 GC□31 GC□32
A 1.05±0.1 1.55±0.15 2.0±0.2 2.8±0.2
B 1.85±0.1 2.3±0.15 3.6±0.2 3.6±0.2
Code GC□43 GC□55
A *2 3.6 5.2 *2 Nominal value
B *2 4.9 6.1
4.0±0.1
4.0±0.1
2.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
1.1 max.
Ａ
Ｂ
8.0±0.3
4.0±0.1
3.5±0.05
1.75±0.1
Ａ
Ｂ
＊
2.0±0.1
φ1.5
+0.1
-0
＊
1.7 max.(T≦1.25mm)
2.5 max. (T:1.35/1.6mm)
3.0 max. (T:1.8/2.0mm)
3.7 max. (T≧2.5mm)
4.0±0.1
0.25±0.1(T≦2.0mm)
0.3±0.1(T：2.5mm)
φ1.5
+0.1
-0
4.0±0.1
8.0±0.1
φ1.5
+0.2
-0
12.0±0.3
5.5±0.1
1.75±0.1
Ａ
*
Ｂ
t
*：2.0±0.1
0.3±0.1
4.0±0.1
4.0±0.1
2.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
t
Ａ
Ｂ
8.0±0.3
4.0±0.1
3.5±0.05
1.75±0.1
Ａ
Ｂ
t
2.0±0.1
φ1.5
+0.1
-0
4.0±0.1
0.25±0.1(T≦2.0mm)
0.3±0.1 (T：2.5mm)
JEMCGP-01894F 8

Package
GCM Type
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)

ｗ1
W
Top Tape : Thickness 0.06
Feeding Hole :As specified in 1.2.
Hole for Chip : As specified in 1.2.
Base Tape : As specified in 1.2.
Bottom Tape :Thickness 0.05
(Only a bottom tape existence )
W
w1
GCM32 max.
16.5 max.
10±1.5
GCM43/55
20.5 max.
14±1.5
-3.0

 min.

2.0±0.5
Chip
(in mm)
Fig.1 Package Chips
Fig.2 Dimensions of Reel
Fig.3 Taping Diagram
JEMCGP-01894F 9

1.3 Tapes for capacitors are wound clockwise shown in Fig.3.
(The sprocket holes are to the right as the tape is pulled toward the user.)
1.4 Part of the leader and part of the vacant section are attached as follows.
(in mm)
1.5 Accumulate pitch : 10 of sprocket holes pitch = 40±0.3mm
1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.
1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.
1.8 There are no jointing for top tape and bottom tape.
1.9 There are no fuzz in the cavity.
1.10 Break down force of top tape : 5N min.
Break down force of bottom tape : 5N min. (Only a bottom tape existence )
1.11 Reel is made by resin and appearance and dimension is shown in Fig 2.
There are possibly to change the material and dimension due to some impairment.
1.12 Peeling off force : 0.1N to 0.6N*in the direction as shown below.
* GCM03:0.05N to 0.5N
1.13 Label that show the customer parts number, our parts number, our company name, inspection
number and quantity, will be put in outside of reel.
Package
GCM Type
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
Tail vacant Section
Chip-mounting Unit
Leader vacant Section
Leader Unit
(Top Tape only)
Direction
of Feed
160 min.
190 min.
210 min.
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
165～180°
Top tape
JEMCGP-01894F 10

Caution
■Limitation of Applications
Please contact us before using our products for the applications listed below which require especially high reliability
for the prevention of defects which might directly cause damage to the third party's life, body or property.
①Aircraft equipment ②Aerospace equipment ③Undersea equipment ④Power plant control equipment
⑤Medical equipment ⑥Transportation equipment(vehicles,trains,ships,etc.) ⑦Traffic signal equipment
⑧Disaster prevention / crime prevention equipment ⑨Data-processing equipment
⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.
■Storage and Operation condition
1. The performance of chip monolithic ceramic capacitors may be affected by the storage conditions.
1-1. Store the capacitors in the following conditions: Room Temperature of +5℃to +40℃and a Relative Humidity
of 20% to 70%.
(1) Sunlight, dust, rapid temperature changes, corrosive gas atmosphere or high temperature and humidity
conditions during storage may affect solderability and packaging performance.
Therefore, please maintain the storage temperature and humidity. Use the product within six months,
as prolonged storage may cause oxidation of the electrodes.
(2) Please confirm solderability before using after six months.
Store the capacitors without opening the original bag.
Even if the storage period is short, do not exceed the specified atmospheric conditions.
1-2. Corrosive gas can react with the termination (external) electrodes or lead wires of capacitors, and result
in poor solderability. Do not store the capacitors in an atmosphere consisting of corrosive gas (e.g.,hydrogen
sulfide, sulfur dioxide, chlorine, ammonia gas etc.).
1-3. Due to moisture condensation caused by rapid humidity changes, or the photochemical change caused
by direct sunlight on the terminal electrodes and/or the resin/epoxy coatings, the solderability and
electrical performance may deteriorate. Do not store capacitors under direct sunlight or in high huimidity
conditions
■Rating
1.Temperature Dependent Characteristics
1. The electrical characteristics of the capacitor can change with temperature.
1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature
changes. The following actions are recommended in order to ensure suitable capacitance values.
(1) Select a suitable capacitance for the operating temperature range.
(2) The capacitance may change within the rated temperature.
When you use a high dielectric constant type capacitors in a circuit that needs a tight (narrow) capacitance
tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and
carefully confirm the various characteristics in actual use conditions and the actual system.
[Example of Temperature Characteristics R7] [Example of Temperature Characteristics R6]

!
-20
-10
-15
-5
5
0
10
15
20
Temperature (C)
-75 -50 -25 025 50 75 100 125 150
Capacitance Change(%)
-20
-10
-15
-5
5
0
10
15
20
Temperature (C)
-75 -50 -25 025 50 75 100
Capacitance Change(%)
JEMCGC-2702P 11

2.Measurement of Capacitance
1. Measure capacitance with the voltage and frequency specified in the product specifications.
1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.
Please confirm whether a prescribed measured voltage is impressed to the capacitor.
1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.
Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.
3.Applied Voltage
1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.
1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.
(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.
When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.
(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.
Typical voltage applied to the DC capacitor
DC voltage DC voltage+AC AC voltage Pulse voltage
(E：Maximum possible applied voltage.)
1-2. Influence of over voltage
Over voltage that is applied to the capacitor may result in an electrical short circuit caused by the breakdown
of the internal dielectric layers .
The time duration until breakdown depends on the applied voltage and the ambient temperature.
4.Type of Applied Voltage and Self-heating Temperature
1.Confirm the operating conditions to make sure that nolarge current is flowing into the capacitor due to the
continuous application of an AC voltage or pulse voltage.
When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current
or pulse current will flow into the capacitor; therefore check the self-heating condition.
Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits
of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is
used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.
<Applicable to Rated Voltage of less than 100VDC>
1-1. The load should be contained to the level
such that when measuring at atmospheric
temperature of 25°C, the product's self-heating
remains below 20°C and the surface
temperature of the capacitor in the actual circuit
remains within the maximum operating
temperature.
Caution
!
1
10
100
0123
Current (Ar.m.s.) 456
Temperature Rise (C)
[Example of Temperature Rise (Heat Generation) in Chip
Monolithic Ceramic Capacitors in Contrast to Ripple
Current]
Sample: R1 characteristics 10 Rated voltage: DC10V
Ripple Current
100kHz
500kHz
1MHz
E
E
E
E
0
0
0
0
JEMCGC-2702P 12

5. DC Voltage and AC Voltage Characteristic
1. The capacitance value of a high dielectric constant type
capacitor changes depending on the DC voltage applied.
Please consider the DC voltage characteristics when a
capacitor is selected for use in a DC circuit.
1-1. The capacitance of ceramic capacitors may change
sharply depending on the applied voltage. (See figure)
Please confirm the following in order to secure the
capacitance.
(1) Determine whether the capacitance change caused
by the applied voltage is within the allowed range .
(2) In the DC voltage characteristics, the rate of
capacitance change becomes larger as voltage
increases, even if the applied voltage is below
the rated voltage. When a high dielectric constant
type capacitor is used in a circuit that requires a
tight (narrow) capacitance tolerance (e.g., a time
constant circuit), please carefully consider the
voltage characteristics, and confirm the various
characteristics in actual operating conditions in
an actual system.
2. The capacitance values of high dielectric
constant type capacitors changes depending
on the AC voltage applied.
Please consider the AC voltage characteristics
when selecting a capacitor to be used in a
AC circuit.
6. Capacitance Aging
[Example of Change Over Time (Aging characteristics) ]
1. The high dielectric constant type capacitors
have the characteristic in which the capacitance
value decreases with the passage of time.
When you use a high dielectric constant type
capacitors in a circuit that needs a tight (narrow)
capacitance tolerance (e.g., a time-constant circuit),
please carefully consider the characteristics
of these capacitors, such as their aging, voltage,
and temperature characteristics. In addition,
check capacitors using your actual appliances
at the intended environment and operating conditions.
7.Vibration and Shock
1. Please confirm the kind of vibration and/or shock, its condition, and any generation of resonance.
Please mount the capacitor so as not to generate resonance, and do not allow any impact on the terminals.
2. Mechanical shock due to being dropped may cause damage or
a crack in the dielectric material of the capacitor.
Do not use a fallen capacitor because the quality and reliability
may be deteriorated.
3. When printed circuit boards are piled up or handled, the corner
of another printed circuit board
should not be allowed to hit the capacitor in order to avoid
a crack or other damage to the capacitor.
Caution
-100
-80
-60
-40
-20
0
20
010 20 30
DC Voltage (V) 40 50
[Example of DC Voltage Characteristics]
Sample: R7 Characteristics 
Capacitance Change (%)
00.5 1
AC Voltage (Vr.m.s.) 1.5 2
[Example of AC Voltage Characteristics]
Sample: R7 Characteristics 
Capacitance Change (%)
30
20
10
0
-10
-20
-30
-40
-50
-60
Floor
Crack
Mounting printed circuit board
Crack
!
20
10
0
-10
-20
-30
-40
10
100
1000
10000
Time(h)
Capacitance Change(%)
5C
R7
R6
JEMCGC-2702P 13

■Soldering and Mounting
1.Mounting Position
1. Confirm the best mounting position and direction that minimizes the stress imposed on the capacitor during flexing
or bending the printed circuit board.
1-1.Choose a mounting position that minimizes the stress imposed on the chip during flexing or bending of the board.
[Component Direction]
Locate chip horizontal to the
direction in which stress acts.
[Chip Mounting Close to Board Separation Point]
It is effective to implement the following measures, to reduce stress in separating the board.
It is best to implement all of the following three measures; however, implement as many measures as possible
to reduce stress.
Stress Level
(1) Turn the mounting direction of the component parallel to the board separation surface.
A > D
(2) Add slits in the board separation part.
A > B
(3) Keep the mounting position of the component away from the board separation surface.
A > C
[Mounting Capacitors Near Screw Holes]
When a capacitor is mounted near a screw hole, it may be affected by the board deflection that occurs during
the tightening of the screw. Mount the capacitor in a position as far away from the screw holes as possible.
2.Information before Mounting
1. Do not re-use capacitors that were removed from the equipment.
2. Confirm capacitance characteristics under actual applied voltage.
3. Confirm the mechanical stress under actual process and equipment use.
4. Confirm the rated capacitance, rated voltage and other electrical characteristics before assembly.
5. Prior to use, confirm the solderability for the capacitors that were in long-term storage.
6. Prior to measuring capacitance, carry out a heat treatment for capacitors that were in long-term storage.
7.The use of Sn-Zn based solder will deteriorate the reliability of the MLCC.
Please contact our sales representative or product engineers on the use of Sn-Zn based solder in advance.
Caution
Contents of Measures
Screw Hole Recommended
!
①
②
③
1C
1B
1A
Perforation
Slit
A
B
C
D
①
1A
JEMCGC-2702P 14

3.Maintenance of the Mounting (pick and place) Machine
1. Make sure that the following excessive forces are not applied to the capacitors.
1-1. In mounting the capacitors on the printed circuit board, any bending force against them shall be kept
to prevent them from any bending damage or cracking. Please take into account the following precautions
and recommendations for use in your process.
(1) Adjust the lowest position of the pickup nozzle so as not to bend the printed circuit board.
(2) Adjust the nozzle pressure within a static load of 1N to 3N during mounting.
[Incorrect]
[Correct]
2.Dirt particles and dust accumulated between the suction nozzle and the cylinder inner wall prevent
the nozzle from moving smoothly. This imposes greater force upon the chip during mounting,
causing cracked chips. Also, the locating claw, when worn out, imposes uneven forces on the chip
when positioning, causing cracked chips. The suction nozzle and the locating claw must be maintained,
checked and replaced periodically.
Caution
!
Board Guide
Board
Suction Nozzle
Deflection
Backup Pin
JEMCGC-2702P 15

4-1.Reflow Soldering
1. When sudden heat is applied to the components, the [Standard Conditions for Reflow Soldering]
mechanical strength of the components will decrease
because a sudden temperature change causes Reflow
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both the components and the PCB.
Preheating conditions are shown in table 1. It is required to
keep the temperature differential between the solder and

2. Solderability of tin plating termination chips might be
deteriorated when a low temperature soldering profile where
the peak solder temperature is below the melting point of
tin is used. Please confirm the solderability of tin plated Temperature
termination chips before use. Incase of Lead Free Solder
( ): In case of Pb-Sn Solder
3. When components are immersed in solvent after mounting,

between the component and the solvent within the range Vapor Reflow
shown in the table 1.
Table 1
GC□03/15/18/21/31
GC□32
Recommended Conditions [Allowable Reflow Soldering Temperature and Time]
Reflow Vapor Reflow
Peak
Temperature Saturated vapor
of inactive solvent
Pb-Sn Solder: Sn-37Pb
Lead Free Solder: Sn-3.0Ag-0.5Cu
In the case of repeated soldering, the accumulated
soldering time must be within the range shown above.
4. Optimum Solder Amount for Reflow Soldering
4-1. Overly thick application of solder paste results in
a excessive solder fillet height.
This makes the chip more susceptible to mechanical
and thermal stress on the board and may cause
the chips to crack.
4-2. Too little solder paste results in a lack of adhesive
*GC□03: 1/3 of Chip Thickness min.
strength on the outer electrode, which may result in in section
chips breaking loose from the PCB.
4-3. Make sure the solder has been applied smoothly
to the end surface to a height of 0.2mm* min.
Make sure not to impose any abnormal mechanical shocks to the PCB.
Inverting the PCB
230 to 250℃
230 to 240℃
240 to 260℃
Caution
≦190℃
≦130℃
Pb-Sn Solder
Lead Free Solder
Part Number
Temperature Differential
Atmosphere
Air
Air or N2
!
SolderingTemperature(℃)
SolderingTime(s)
280
270
260
250
240
230
220
0
30
60
120
90
0.2mm min*
Temperature(℃)
PeakTemperature
(170℃)
(150℃)
(130℃)
(200℃)
Soldering
Gradual
Cooling
Preheating
ΔT
60-120seconds
30-60 seconds
Time
190℃
170℃
150℃
220℃
Temperature(℃)
PeakTemperature
(170℃)
(150℃)
(130℃)
ΔT
Soldering
Gradual
Cooling
Preheating
Time
60-120seconds
20 seconds max.
190℃
170℃
150℃
JEMCGC-2702P 16

4-2.Flow Soldering
1. Do not apply flow soldering to chips not listed in Table 2.
[Standard Conditions for Flow Soldering]
Table 2
2. When sudden heat is applied to the components, the
mechanical strength of the components will decrease
because a sudden temperature change causes
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both of the components and the PCB.
Preheating conditions are shown in table 2. It is required to
[Allowable Flow Soldering Temperature and Time]
keep the temperature differential between the solder and

3. Excessively long soldering time or high soldering
temperature can result in leaching of the outer electrodes,
causing poor adhesion or a reduction in capacitance value
due to loss of contact between the electrodes and end termination.
4. When components are immersed in solvent after mounting,

between the component and solvent within the range
shown in the table 2. In the case of repeated soldering, the accumulated
soldering time must be within the range shown above.
Recommended Conditions Pb-Sn Solder Lead Free Solder
90 to 110℃100 to 120℃
240 to 250℃250 to 260℃
Air Air
Pb-Sn Solder: Sn-37Pb
Lead Free Solder: Sn-3.0Ag-0.5Cu
5. Optimum Solder Amount for Flow Soldering
5-1. The top of the solder fillet should be lower than the
thickness of components. If the solder amount is
excessive, the risk of cracking is higher during
board bending or any other stressful condition.
Caution
Temperature Differential
≦150℃
Part Number
GC□18/21/31
(Except for Temperature
Characteristics:0C,5G,R9,L8)
Preheating Peak Temperature
Soldering Peak Temperature
Atmosphere
!
Soldering mperature(℃)
SolderingTime(s)
280
270
260
250
240
230
220
0
10
20
40
30
Temperature(℃)
Soldering
Peak
Temperature
Preheating
Peak
Temperature
30-90seconds
Preheating
5 seconds max.
Time
Gradual
Cooling
Soldering
ΔT
Up to Chip Thickness
Adhesive
in section
JEMCGC-2702P 17

4-3.Correction of Soldered Portion
When sudden heat is applied to the capacitor, distortion caused by the large temperature difference occurs internally,
and can be the cause of cracks. Capacitors also tend to be affected by mechanical and thermal stress depending
on the board preheating temperature or the soldering fillet shape, and can be the cause of cracks.
Please refer to "1. PCB Design" or "3. Optimum solder amount" for the solder amount and the fillet shapes.
1. Correction with a Soldering Iron
1-1. In order to reduce damage to the capacitor, be sure to preheat the capacitor and the mounting board.
Preheat to the temperature range shown in Table 3. A hot plate, hot air type preheater, etc. can be used for preheating.
1-2. After soldering, do not allow the component/PCB to cool down rapidly.
1-3. Perform the corrections with a soldering iron as quickly as possible. If the soldering iron is applied too long,
there is a possibility of causing solder leaching on the terminal electrodes, which will cause deterioration of the
adhesive strength and other problems.
Table 3
*Applicable for both Pb-Sn and Lead Free Solder.
Pb-Sn Solder: Sn-37Pb
Lead Free Solder: Sn-3.0Ag-0.5Cu
2. Correction with Spot Heater
Compared to local heating with a soldering iron, hot air heating by a spot heater heats the overall component
and board, therefore, it tends to lessen the thermal shock. In the case of a high density mounted board,
a spot heater can also prevent concerns of the soldering iron making direct contact with the component.
2-1. If the distance from the hot air outlet of the spot heater to the component is too close, cracks may occur due to
thermal shock. To prevent this problem, follow the conditions shown in Table 4.
2-2. In order to create an appropriate solder fillet shape, it is recommended that hot air be applied at the angle shown
in Figure 1.
Table 4
Distance 5mm or more
Hot Air Application angle 45° *Figure 1
Hot Air Temperature Nozzle Outlet 400°C max.
Less than 10 seconds
Application Time (1206 (in inch) / (3216 (in mm) size or smaller)
Less than 30 seconds
(1210 (in inch) / 3225 (in mm) size or larger)
3. Optimum solder amount when re-working with a soldering iron
3-1. In the case of 0603 (in inch) / 1608 (in mm) and smaller
sizes (GC□03/15/18), the top of the solder fillet should
be lower than 2/3 of the thickness of the component or
0.5mm, whichever is smaller.
In the case of 0805 (in inch) / 2012(in mm) and larger
sizes (GC□21/31/32), the top of the solder fillet in section
should be lower than 2/3 of the thickness of the component.
If the solder amount is excessive, the risk of cracking is higher
during board bending or under any other stressful condition.
3-2. A soldering iron with a tip of ø3mm or smaller should be used.
It is also necessary to keep the soldering iron from touching
the components during the re-work.
3-3. Solder wire with ø0.5mm or smaller is required for soldering.
Part Number
GC□03/15/18/21/31
Temperature of
Soldering Iron tip
350℃max.
280℃max.
Preheating
Temperature
Temperature

Atmosphere
Caution
Air
Air
≦190℃
≦130℃
150℃min.
150℃min.
GC□32
!
One-hole Nozzle
an Angle of 45
[Figure 1]
SolderAmount
JEMCGC-2702P 18

5.Washing
Excessive ultrasonic oscillation during cleaning can cause the PCBs to resonate, resulting in cracked chips
or broken solder joints. Take note not to vibrate PCBs.
6.Electrical Test on Printed Circuit Board
1. Confirm position of the backup pin or specific jig, when inspecting the electrical performance of a
capacitor after mounting on the printed circuit board.
1-1. Avoid bending the printed circuit board by the pressure of a test-probe, etc.
The thrusting force of the test probe can flex the PCB, resulting in cracked chips or open solder
joints. Provide backup pins on the back side of the PCB to prevent warping or flexing.
Install backup pins as close to the test-probe as possible.
1-2. Avoid vibration of the board by shock when a test -probe contacts a printed circuit board.
[Not Recommended] [Recommended]
7.Printed Circuit Board Cropping
1. After mounting a capacitor on a printed circuit board, do not apply any stress to the capacitor that
caused bending or twisting the board.
1-1. In cropping the board, the stress as shown at right may cause the capacitor to crack.
Cracked capacitors may cause deterioration of the insulation resistance, and result in a short.
Avoid this type of stress to a capacitor.
[Bending] [Twisting]
2. Check the cropping method for the printed circuit board in advance.
2-1. Printed circuit board cropping shall be carried out by using a jig or an apparatus (Disk separator, router
type separator, etc.) to prevent the mechanical stress that can occur to the board.
* When a board separation jig or disk separator is used, if the following precautions are not observed,
a large board deflection stress will occur and the capacitors may crack.
Use router type separator if at all possible.
Board Separation Method
Hand Separation
Nipper Separation
(1) Board Separation Jig
Board Separation Apparatus
2) Disk Separator
3) Router Type Separator
High
Medium
Medium
Low
Level of stress on board
×
△*
△*
◯
Notes
Hand and nipper
separation apply a high
level of stress.
Use another method.
· Board handling
· Board bending direction
· Layout of capacitors
· Board handling
· Layout of slits
· Design of V groove
· Arrangement of blades
· Controlling blade life
Board handling
Recommended
Caution
!
Peeling
Test-probe
Backup
Pin
Test-probe
①
1A
JEMCGC-2702P 19

(1) Example of a suitable jig
[In the case of Single-side Mounting]
An outline of the board separation jig is shown as follows.
Recommended example: Stress on the component mounting position can be minimized by holding the
portion close to the jig, and bend in the direction towards the side where the capacitors are mounted.
Not recommended example: The risk of cracks occurring in the capacitors increases due to large stress
being applied to the component mounting position, if the portion away from the jig is held and bent in the
direction opposite the side where the capacitors are mounted.
[Outline of jig]
[In the case of Double-sided Mounting]
Since components are mounted on both sides of the board, the risk of cracks occurring can not be avoided with the
above method. Therefore, implement the following measures to prevent stress from being applied to the components.
(Measures)
(1) Consider introducing a router type separator.
If it is difficult to introduce a router type separator, implement the following measures.
(Refer to item 1. Mounting Position)
(2) Mount the components parallel to the board separation surface.
(3) When mounting components near the board separation point, add slits in the separation position
near the component.
(4) Keep the mounting position of the components away from the board separation point.
(2) Example of a Disk Separator
An outline of a disk separator is shown as follows. As shown in the Principle of Operation, the top
blade and bottom blade are aligned with the V-grooves on the printed circuit board to separate the board.
In the following case, board deflection stress will be applied and cause cracks in the capacitors.
(1) When the adjustment of the top and bottom blades are misaligned, such as deviating in the top-bottom,
left-right or front-rear directions
(2) The angle of the V groove is too low, depth of the V groove is too shallow, or the V groove is misaligned
top-bottom
IF V groove is too deep, it is possible to brake when you handle and carry it. Carefully design depth of the
V groove with consideration about strength of material of the printed circuit board.
[ Outline of Machine ] [ Principle of Operation ] [ Cross-section Diagram ]
Top Blade Top Blade Top Blade Top Blade
Bottom Blade Bottom Blade Bottom Blade Bottom Blade
Depth too Shallow
Depth too Deep
Example of
Recommended
V-groove Design
Not Recommended
Left-right Misalignment
Low-Angle
Not recommended
Recommended
Top-bottom Misalignment
Left-right Misalignment
Front-rear Misalignment
Caution
Recommended
Not recommended
Printed Circuit Board
Top Blade
V-groove Bottom Blade
Top Blade Printed Circuit Board
V-groove
!
Board Cropping Jig
V-groove
Printed Circuit Board
Printed circuit
board
Components
Load point
Direction of
load
Printed circuit
board
Component
s
Load point
Direction of load
JEMCGC-2702P 20