NXP Semiconductors SAFE ASSURE UM11729 User manual

UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Rev. 1 — 21 February 2022 User manual
Document information
Information Content
Keywords automotive, half-bridge, GD3162, gate driver
Abstract This document describes key features and usage requirements for performing
evaluation of GD3162 gate driver with FRDMGD3162HBIEVM.

NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Rev Date Description
1 20220221 initial version
Revision history
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User manual Rev. 1 — 21 February 2022
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
1 Important notice
IMPORTANT NOTICE
For engineering development or evaluation purposes only
NXP provides the product under the following conditions:
This evaluation kit is for use of ENGINEERING DEVELOPMENT OR
EVALUATION PURPOSES ONLY. It is provided as a sample IC pre-soldered
to a printed-circuit board to make it easier to access inputs, outputs and
supply terminals. This evaluation board may be used with any development
system or other source of I/O signals by connecting it to the host MCU
computer board via off-the-shelf cables. This evaluation board is not
a Reference Design and is not intended to represent a final design
recommendation for any particular application. Final device in an application
heavily depends on proper printed-circuit board layout and heat sinking
design as well as attention to supply filtering, transient suppression, and I/O
signal quality.
The product provided may not be complete in terms of required design,
marketing, and or manufacturing related protective considerations, including
product safety measures typically found in the end device incorporating the
product. Due to the open construction of the product, it is the responsibility of
the user to take all appropriate precautions for electric discharge. In order to
minimize risks associated with the customers’ applications, adequate design
and operating safeguards must be provided by the customer to minimize
inherent or procedural hazards. For any safety concerns, contact NXP sales
and technical support services.
2 FRDMGD3162HBIEVM
Figure 1. FRDMGD3162HBIEVM
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
3 Getting started
The NXP analog product development boards provide an easy-to-use platform for
evaluating NXP products. The boards support a range of analog, mixed-signal, and
power solutions. They incorporate monolithic integrated circuits and system-in-package
devices that use proven high-volume technology. NXP products offer longer battery life, a
smaller form factor, reduced component counts, lower cost, and improved performance in
powering state-of-the-art systems.
The tool summary page for FRDMGD3162HBIEVM is at http://www.nxp.com/
FRDMGD3162HBIEVM. The overview tab provides an overview of the device, product
features, a description of the kit contents, a list of (and links to) supported devices, a list
of (and links to) any related products, and a Get Started section.
The Get Started section provides links to everything needed to start using the
device and contains the most relevant, current information applicable to the
FRDMGD3162HBIEVM.
1. Go to http://www.nxp.com/FRDMGD3162HBIEVM.
2. On the Overview tab, locate the Jump To navigation feature on the left side of the
window.
3. Select the Get Started link, review each entry, and download an entry by clicking the
title.
4. After reviewing the Overview tab, visit the other product-related tabs for additional
information:
• Documentation: download current documentation
• Software & Tools: download current hardware and software tools
• Buy/Parametrics: purchase the product and view the product parametrics
After downloading files, review each file, including the user guide, which includes setup
instructions. If applicable, the bill of materials (BOM) and supporting schematics are also
available for download in the Get Started section of the Overview tab.
3.1 Kit contents/packing list
The FRDMGD3162HBIEVM kit contents include:
•Assembled and tested FRDMGD3162HBIEVM board in an anti-static bag
•3.3 V to 5.0 V translator board (KITGD316xTREVB) connected to FRDM-KL25Z
•USB cable, type A male/type mini B male, 3 ft
•Quick start guide
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
3.2 Required equipment
To use this kit, you need:
•Compatible HybridPACK Drive insulated gate bipolar transistor (IGBT) or SiC
metal-oxide-semiconductor field-effect transistor (MOSFET) module
•DC link capacitor compatible with the HybridPACK Drive module
•1.27 mm jumpers for configuration (included with kit)
•30 µH to 50 µH, high current air core inductor for double pulse testing
•HV power supply with protection shield and hearing protection
•20 V, 1.0 A DC power supply
•500 MHz 2.5 GS/s 4-channel oscilloscope
•Rogowski coil, PEM Model CWT Mini HF60R, or CTW MiniHF30 (smaller diameter)
•Isolated high-voltage probes
•Digital voltmeter
3.3 System requirements
The kit requires the following to function properly with the software:
•Windows 7 or higher operating system
4 Getting to know the hardware
4.1 Overview
The FRDMGD3162HBIEVM is a half-bridge evaluation kit populated with two GD3162
single channel gate drive devices. The kit includes the Freedom KL25Z microcontroller
hardware for interfacing a PC installed with FlexGUI software for communication to the
serial peripheral interface (SPI) registers on the GD3162 gate drive devices in either
daisy chain or standalone configuration.
The KITGD316xTREVB translator board is used to translate 3.3 V signals to 5.0 V
signals between the MCU and GD3162 gate drivers. The evaluation kit can be connected
to a compatible IGBT or SiC module for half-bridge evaluations and applications
development.
4.2 Board features
•Capability to connect to HybridPACK Drive module for half-bridge evaluations
•Adjustable negative VEE gate low drive level (0 V to −10 V DC)
•Adjustable VCC gate high drive level (10 V to 25 V DC)
•Jumper configurable for disabling dead time fault protection when short-circuit testing
•Easy access power, ground, and signal test points
•Easy to install and use FlexGUI for interfacing via SPI through PC; software includes
double pulse and short-circuit testing capability
•DC link bus voltage monitor on low-side driver via AMUXIN and AOUT
•Negative or positive temperature coefficient connection and configurable for monitoring
module temperature
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
4.3 Device features
Device Description Features
GD3162 The GD3162 is an
advanced single
channel gate driver
for IGBT and SiC with
dynamic gate strength
adjust.
•Compatible with current sense and temp sense IGBT
and SiC MOSFET modules
•DESAT detection capability for detecting VCE
desaturation condition
•Fast short-circuit protection for IGBT and SiC
MOSFET with current sense feedback
•Compliant with automotive safety integrity level
(ASIL) C/D ISO 26262 functional safety requirements
•SPI interface for safety monitoring, programmability,
and flexibility
•Integrated galvanic signal isolation up to 8 kV
•Integrated boost capability for increased drive
strength
•Interrupt pins for fast response to faults and real-time
reporting capability
•Compatible with negative gate supply
•Active bus discharge functionality
Table 1. Device features
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
4.4 Board description
The FRDMGD3162HBIEVM is a half-bridge evaluation board populated with two GD3162
single channel IGBT or SiC gate drive devices. The board supports connection to
an FRDM-KL25Z microcontroller for SPI communication configuration programming
and monitoring. The board includes DESAT circuitry for short-circuit detection and
implementation of GD3162 shutdown protection capabilities.
The evaluation board is designed to connect to a HybridPACK Drive module for
evaluation of the GD3162 performance and capabilities.
Figure 2. Connecting FRDM-KL25Z, GD31xx half-bridge EVB and translator board
4.4.1 Low-voltage logic and control connector
Low-voltage domain is 5 V VDD domain that interfaces with the MCU and GD3162
control registers through the 24-pin connector interface.
Low-side driver and high-side driver domains are driver control interfaces to HybridPACK
Drive module single phase connections and test points.
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Figure 3. Evaluation board voltage and interface domains
Pin Name Function
1 AOUTL analog output duty cycle encoded signal (low side) for reading temperature via
TSENSEA or voltage via AMUXIN
2 GS_ENH gate strength enable HIGH; gate drive pull-up strength control logic
3 CSBL chip select bar (low side)
4 GS_ENL gate strength enable LOW; gate drive pull-down strength control logic
5 PWML pulse width modulation (PWM) input (low side)
6 INTBL interrupt bar (low side)
7 MOSIL master out slave in (low side)
8 SCLK serial clock input
9 MISOL master in slave out (low side)
10 EN_PS MCU control of flyback power supply
11 FSSTATEL fail-safe state (low side)
12 GND ground
13 FSENB fail-safe enable (high side and low side)
14 MISOH master in slave out (high side)
Table 2. Low-voltage domain 24-pin connector definitions
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Pin Name Function
15 INTAL fault reporting and real time VCE and VGE monitoring (low side)
16 MOSIH master out slave in (high side)
17 INTAH fault reporting and real time VCE and VGE monitoring (high side)
18 CSBH chip select bar (high side)
19 LED_PWR USB 3.3 V power for INTB LEDs (high side and low side)
20 AOUTH duty cycle encoded signal (high side)
21 PWMH PWM input (high side)
22 FSSTATEH fail-safe state (high side)
23 GND ground
24 INTBH interrupt bar (high side)
Table 2. Low-voltage domain 24-pin connector definitions...continued
4.4.2 Test point definitions
All test points are clearly marked on the evaluation board. Figure 4 shows the location of
various test points.
Figure 4. Key test point locations
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NXP Semiconductors UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Test point Definition
Low-voltage domain
VSUP DC voltage source connection point for VSUP power input of GD3162 devices. Externally supplied 12 V DC
supply voltage. VSUP supplies 5 V regulator for gate drive VDD.
GND grounding points for low-voltage domain
INTAH fault monitor and VCE/VGE real-time report monitor high-side test point
INTBL interrupt bar low-side test point
INTAL fault monitor and VCE/VGE real-time report monitor low-side test point
INTBH interrupt bar high-side test point
Low-side driver domain
GNDL low-side domain ground point
VCCL positive voltage supply test point for isolated circuitry and low-side driver domain
VRFL 5.0 V reference test point for isolated analog circuitry on low-side driver
TSENSEL temperature sense connection low-side test point
GL module gate test point on low-side driver domain which is the charging pin of gate; including MMCX probe
connection
FSISOL high-voltage domain fail-safe low-side test point
DSTL VCE desaturation test point connected to low-side driver DESAT pin and circuitry
VEEL negative voltage supply test point for low-side driver gate of IGBT or SiC module
VDC DC link voltage test point at voltage divider
COLL collector test point/connection terminal on low side
High-side driver domain
VCCH positive voltage supply test point for isolated circuitry and high-side driver domain
GNDH high-side domain ground point
COLH collector test point/connection high side
TSENSEH temperature sense connection high-side test point
VRFH 5.0 V reference test point for isolated analog circuitry on high-side driver
FSISOH high-voltage domain fail-safe high-side test point
GH module gate test point on high-side driver domain which is the charging pin of gate; including MMCX probe
connection
DSTH VCE desaturation test point connected to high-side driver DESAT pin and circuitry
VEEH negative voltage supply test point for high-side driver gate of IGBT or SiC module
AMXH analog MUX input test point for high-side driver
Table 3. Test point definitions
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