Tektronix 308 User manual

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COMMITTEDTO EXCELLENCE
WARNING
THE FOLLOWING SERVICING INSTRUCTIONS
ARE FOR USE BY QUALi Fl ED PERSONNEL ONLY.
TO AVOID PERSONAL INJURY, DO NOT
PERFORM ANY SERVICING OTHER THAN THAT
CONTAINED IN OPERATING INSTRUCTIONS
UNLESS YOU ARE QUALIFIED TO DO SO.
308 DATA
ANALYZER
SERVICE
INSTRUCTION MANUAL
Tektronix, Inc.
P.O.
Box 500
Beaverton, Oregon 97077 Serial
Number
070-2662-00
First Printing OCT 1979

WARRANTY
Tektronix warrants to the original purchaser that this productisfree
from defects in materials and workmanship, under normal use, for a
period of one (1) year from the dateofshipment. Tektronix will, at its
option , repair or replace the product if Tektronix determines it is
defective within
the warranty period, and it is returned, freight
prepaid, to a Tektronix Service Center.
There
is no implied warranty of fitness for a particular purpos
Tektronix
is not liable for consequential damages.
Copyright © 1979 by Tektronix , Inc. All rights reserved.
Contentsof this publication may not be reproduced in any
form
without the permission of Tektronix, Inc.
Products
of Tektronix , Inc. and its .-Subsidiaries are
covered by U.
S. and foreign patents and/or pending
patents.
TEKTRONIX,
TEK , SCOPE-MOBl LE, and ~ are
registered trademarks of Tektronix, Inc.
Printed in U.S.A. Specification and price change
privileges are reserved.
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308 Service
TABLE OF CONTENTS
Page
LIST OF ILLUSTRATIONS ....... . . ......... ii
LIST OF TABLES .. ... ... .. ...... . ........ iv
OPERATOR'S SAFETY SUMMARY ............ v
SERVICE SAFETY
SUMMARY ................ vii
SECTION 1
INTRODUCTION AND
SPECIFICATION
INT RODUCTION
. .......
1-1
SPECIFICATION
........ 1-2
SECTION 2
OPERATING
INSTRUCTIONS
I NSTA LL AT I ON .........
2-1
Power Requirements ....
2-1
Power
Cord .......... 2-1
CONTROLS , CONNECTORS,
AND IND I CATORS .......
2-2
Acqu isi tion Contro ls . ...
2-2
Instrument and Display
Mode Contro ls ....... . 2-4
En
try Controls . . . .. . ..
2-5
Signature Controls ..... 2-6
Input Controls and
Connectors
.......... 2-6
OPERATORS CHECKOUT
PROCEDURE ...........
2-9
I
ntrod uction . .........
2-9
Diagnostics
. . ........ 2-9
OPERATORS
FAMILIARIZATION .......
2-10
The Contro l Function
Access Chart .........
2- 10
The Next State Tab le 2-10
Basic
Operating
Information
. ......... 2-10
Typical Application .....
2-19
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SECTION 3
SECTION 4
THEORY OF OPERATION
Page
INTRODUCTION ........
3-1
SYSTEM
ARCHITECTURE
3-1
GENERAL SYSTEM
DESCRIPTION ..........
3-4
DETAILED CIRCUIT
DESCRIPTION ..........
3-7
Parallel Data
Input {i;>
3-7
Word Recognizer 0 3-11
Parallel
Acquisition
Memory and Trigger
Delay 0 ........ ..
3-15
Time Base 0 ......
3-19
Serial/
Signature
Input 0 .......... 3-19
Signature Generator 0 3-22
Seri
al Data
Acquis i tion (f> ...... 3-25
Keyboard (/} and
MPU 0 .......... 3-
29
Display Control 0 ..
3- 31
CRT~ ......... . 3-34
Power
Supply ~
3-37
CALIBRATION
PERFORMANCE CHECK 4-3
Power-on Diagnostics . . . 4-4
Operator-Initiated
Diagnostics . . . . . . . . . . 4-4
Threshold Voltages. . . . . 4-7
Minimum External Clock
Period . . . . . . . . . . . . . . 4-8
Minimum Sample Interval
and
Minimum Data Pulse
Width .............. 4-10
Word Recognizer Filter . . 4-12
Minimum Word Recognizer
Pulse Width .......... 4-14
Trigger Delay Counter .. 4-16
Signature Acquisition ... 4-19
Serial
Acquisit ion . . . . . . 4-20

308 Service
TABLE OF CONTENTS (cont)
SECTION 4
CALIBRATION (cont) Page SECTION 5 MAINTENANCE (cont) Page
ADJUSTMENT PROCEDURE 4-23 CORRECTIVE
Power Supplies
... . .. . 4-24
MAINTENANCE . . .. . . . ..
5-11
CRT Circuit ... ... ....
4-25
Obtaining Replacement
Clock Delay . .. . . .. . . . 4-26 Parts
.' ....... . . .. . . . 5-11
External
Trigger Delay 4-29
Soldering Techniques . ..
5-11
. .
DC Balance and Bias
...
4-31 Removal and
Replacement
Input Capacitance 4-32
Instructions . .... . ....
5-12
. .. . .
Signature Data Delay 4-35
Recalibration . .. . . ... . 5-20
. . .
Instrument Repackaging . 5-21
SECTION 5
MAINTENANCE
STATIC SENSITIVE
SECTION 6
OPTIONS
COMPONENTS
.... .. ...
5-1
PREVENTIVE
SECTION 7 REPLACEABLE
MAINTENANCE .. . ......
5-2
ELECTRICAL PARTS
Cleaning . . .... . ..... 5-2
Inspection ... .. ..... . 5-2
SECTION 8
DIAGRAMS
TROUBLESHOOTING
.. ..
5-4
SECTION 9 REPLACEABLE
Troubleshooting Aids ... 5-4
MECHANICAL PARTS
Troubleshooting
Equipment ..... .. .... 5-6 ACCESSORIES
Troubleshooting
Techniques
... ... .. . . 5-9
CHANGE INFORMATION
LIST OF ILLUSTRATIONS
Figure
No .
1-1
2-1
2-2
2-3
2-4
2-5
2-6
2-7
2-8
ii
Page
308 Data Analyzer
viii
308
dimensional drawing. . . . . . . . . . . 1-13
Location of the line-voltage indicator . . 2-1
Connecting the power cord . . . . . . . . . 2-1
Optional power cords for the 308 . . . . . 2-2
Acquisition controls and indicators . . . 2-3
Instrument and display mode controls 2-4
Entry controls . . . . . . . . . . . . . . . . . . 2-5
Signature controls . . . . . . . . . . . . . . . 2-6
Right side panel controls and connectors 2-7
Figure
No.
2-9
2-10
Page
Data transitions , filter adjustment, and
triggering . . . . . . . . . . . . . . . . . . . . . 2-8
Next state table . . . . . . . . . . . . . . . . . 2-11
2-11
Basic 308 acquisition and display system 2-11
2-12
2-13
2-14
2-15
2-16
2-17
Positive
logic with number assignments to
voltage inputs .... .. .. .. .. . ..... 2-12
Parallel
acquisition menu . . . . . . . . . . 2-14
Serial
acquisition menu. . . . . . . . . . . . 2-14
Typical signature data sequences . . . . 2-18
Data
to signature sequence . .. ... . . . 2-19
Test schematic for the 308 application
example . . . . . . . . . . . . . . . . . . . . . . 2-20
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308 Service
LIST OF ILLUSTRATIONS (cont)
Figure
No.
3-1
Page
E xamp le of block-structured routines in
the 308 . . . . . . . . . . . . . . . . . . . . . . . 3-2
3-2
Memory allocat ion map for the 308 ... 3-3
3-3
3-4
3-5
3-6
3-7
3-8
3-9
3
-10
3- 11
3-12
3-13
3-14
3-15
3-16
3
-1 7
3-18
3-19
3-20
3-21
3-22
3-23
3-24
3-25
3-26
3-27
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Si mp li fied diagram of the 308 . . . . . . . 3-5
Simp lifi ed diagram of the parallel data
i
nput circuit ...... .. ... . ..... .. . 3-8
E
quivalent circuit of one chann el of the
P6451 data acquis iti on probe. . . . . . . . 3-9
S
implifi ed diagram for one channel of the
samp l e/ Iatch stage . . . . . . . . . . . . . . . 3-9
Simpl if iedtiming di agram of sample/ l atch
stage . . . . . . . . . . . . . . . . . . . . . . . . . 3-10
Si
mp lified diagram of the word recognizer
circu it . ....................... 3-12
Asy nc filter timing diagram ..... . ... 3-14
Simpli
fied diagram of the parallel
acquisiti on me mor y and trigger delay
c ir cu it s .. .. .... . ............ . . 3-16
Simp li fied timing diagram for data
acqu isiti on sequence ............. 3-17
Si
mp li fied diagram ofthetime base circu it 3-20
S
implifi ed diagram of the serial /s ign ature
input, si gnature ge ner ator, and seri al data
acqu isiti on circuits . . . . . . . . . . . . . . . 3-21
Simp li fied diagram of the vari able de lay
c ir cuit and its timing .. ..... ....... 3-23
Tim ing diagram of the gating logic stage 3-24
Simp li fied diagram of the CRC ge ne rator
stage. . . . . . . . . . . . . . . . . . . . . . . . . 3-26
Asynchronous mode instruction format 3-27
Sync h ronous mode instructi on format 3-27
Status in format ion format . . . . . . . . . . 3-28
Typ ical data bl ock f or a USART. . . . . . 3-28
USART com mand instruction format .. 3-29
Simpl i fied diagram of the MPU and key
board circuits. . . . . . . . . . . . . . . . . . . 3-30
Simp l ified diagram of the disp l ay contro l
circuit . . . . . . . . . . . . . . . . . . . . . . . . 3-32
Timin g diagram of the display timing
generator stages . . . . . . . . . . . . . . . . 3-33
Simp lified diagram of the CRT ci rcuit .. 3-35
Si
mp l ified diagram and waveforms of the
hori zonta l sweep generator . . . . . . . . . 3-36
S
implifi ed diagram of the power supp ly
circu it . . . . . . . . . . . . . . . . . . . . . . . . 3-38
Figure
No.
3-28
4
-1
4-2
4-3
4-4
4-5
4-6
4-7
4-8
4-9
4-10
4-11
4
-1 2
4
-1 3
4
-1 4
4-15
4
-1 6
4
-1 7
5-1
5-2
5-3
5-4
5-5
5-6
5-7
5-8
5-9
5-10
5-11
Page
Representation of inverter stage and
idealized
waveforms . . . . . . . . . . . . . . 3- 40
Diagnostic 0 keyboard code . . . . . . . . 4-5
Diagnostic test setup . . . . . . . . . . . . . 4-6
Test
setup for check ing minimum external
clock per iod . . . . . . . . . . . . . . . . . . . . 4-8
Test
waveform for minimum external
clock period . . . . . . . . . . . . . . . . . . . . 4-9
Test
waveforms for minimum samp le
interv al and mini mum data pulse wi dth. 4-11
Test
waveforms for word recognizer filter 4-13
Test
waveforms for minimum word
r ecogn izer pul se wi dth ............ 4 -1 5
Test
setup for trigger de lay counter ... 4-17
Adjusting pul se generators outputs for
trigger delay counter check ......... 4 -1 8
Adjust ing pul se generator ou tput s for
si gnature acquisi tio n check . ..... . .. 4-19
Test
setup for seri al acqu isit ion ch eck 4-22
Test
setup for adjusting clock delay and
si
gnature data delay . . . . . . . . . . . . . . 4-27
Test
waveforms for clock de l ay
adj ustment, ext erna l trigger, and
signature data de l ay . . . . . . . . . . . . . . 4-28
Test
setup fo r adjust in g externa l trigger
delay . . . . . . . . . . . . . . . . . . . . . . . . . 4-30
Test
setup for adjust ing i nput capac i tance 4-33
Test
waveforms f or adjust in g inpu t
capac i tance . . . . . . . . . . . . . . . . . . . . 4-34
Test
setup for adjust ing sig natur e data
de lay . . . . . . . . . . . . . . . . . . . . . . . . . 4-36
Di agnost ic 5 reference pattern . . . . . . . 5-4
Circuit board locations ... .. ....... 5-5
Co l or code for resistors and capacitors 5-7
Semiconductor lead configurat i ons . . . 5-8
Multi
-co nnector holder orientation . . . . 5-9
Keyboard remova l ..... . .......... 5-13
Side panel and circu it board remova l . . . 5-14
308
top view . . . . . . . . . . . . . . . . . . . 5-15
Power switch actuation linkage ...... 5-16
CRT c ircuit board re moval details . . . . 5-17
Pin
con n ector repl acement ..... ... . 5-21
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308 Service r
LIST OF ILLUSTRATIONS (cont)
Figure NOTE
The following illustrations appear in the Diagrams Figure
No. foldout section. No. [
8 -1
Sem icondu ctor lead configurations 8-10
A1 Data input board test point and
8-2 A1 Data in
put board component Iocations
adjustme nt loc ations
8-3 A2
Trigger board component locations
8-11 A2
Trigg er board test point and r
8-4 A3 Serial &
signature data acquisition
adjustment lo cations
board component locations
8 -1 2 A3 Serial &
signature data acquisition
8-5 A5 Key board
component locations
board test point and adjustment locations
8-6 A4
MPU board component locations
8-13 A4
MPU board test point and adjustment
8-7 A6
CRT board component locations
lo cat ions
8-8 A7
Primary power supply board
8-14 A6
CRT board test point and adjustment
component locations locations
8 -9
A8 Secondary power supply board
8-15
AS Secondary power supply board test
component locations
point and adjustment locations
8-16
Character Display
LIST OF TABLES
NOTE
Table Table The following tables appear in the Diagramsfoldout
No. Page No. section. [
1-1
Electrical Characteristics .. . . ... . ...
1-2 8-1
Troubl es hooting Tree to Signature List
1-2
Environmental Characteristics . .. .... 1-12
Cross-Reference
1-3
Physical Characteristics
.. ... . .....
1-13 8-2 Device
Error List
8-3 308
Power-Up Diagnostic Errors
2-1
Power-up Error Codes
.... . ... .... 2-9 8-4
Signature List and Setup Conditions for
2-2 Parallel and Serial
Acquisition Parameters 2-13 ROM
Check
2-3 Signature List .
.. . ... .... . ...... 2-21 8-5
Signature List and Setup Conditions for
Kernel Check
3-1
Truth Table for Setting Parameters 8-6
Signature List and Setup Conditions for
...
3-11
Chip Select Test
3-2
Truth Table for the Clock Gate
. ... . . 3-18 8-7
Signature List and Setup Conditions for
3-3
Sample Int erval Selection
.. . . . ... . . 3-19
Chip Select Test (Write Only)
3-4
Programmable Bit-Rate Generator
8-8 Signature List and Setup Conditions for
Outputs .............. . ........
3-25
Address Counter
3-5 Data Bus
Buffer Control
.... . .. .. .. 3-27 8-9
Signature List and Setup Conditions for
3-6
USART Read/ Write Control Logic
.. .. 3-29 Delay
Counter
8-10 Signature List and Setup Conditions for
4-1
Test Equipment Required
4-1
Data Paths
......... .
4-2 Serial
Acquisition Data .. .. ... . ....
4-21 8
-11 Signature List and Setup Conditions for
4-3
Power Supply Tolerances . ... .... . . 4-24
Display Column Counter
8-12 Signature List and Setup Conditions for
Display Row-Line Counter
5-1 Relative
Susceptibility to Static Discharg e
8-1 3 Signature List and Setup Conditions for
Damage . .. ....... . .... .. .... ..
5-1
Display Character Row Counter
5-2 Ex ternal Inspection Checklist .......
5-3 8-14 Baud Rate Test
One
5-3 Internal Inspection Checklist .. . .. .. . 5-3 8-15 Baud Rate Test
Two
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308 Service
OPERATORS SAFETY SUMMARY
The general safety information in this part of the summary is for both operating and servicing
personnel. Specific warnings and cautions will be found throughout the manual where they
apply and do not appear in this summary.
TERMS
In This Manual
CAUTION statements identify conditions or practices that could result in damage to the
equipment or other property.
WARNING statements identify conditions or practices that could result in personal injury or
loss of life.
As Marked on Equipment
CAUTION indicates a personal injury hazard not immediately accessible as one reads the
marking, or a hazard to property including the equipment itself.
DANGER indicates a personal injury hazard immediately accessible as one reads the marking.
SYMBOLS
As Marked on Equipment
f DANGER - High voltage.
@ Protective ground (earth) terminal.
Power Source
This product is intended to operate from a power source that will not apply more than 250volts
rms between the supply conductors or between either supply conductor and ground. A
protective ground connection by way of the grounding conductor in the power cord is
essential
for safe operation.
v

308 Service
vi
Grounding the Product
This product is grounded through the grounding conductor of the power cord. To avoid
electrical shock , plug the power cord into a properly wired receptacle before connecting to the
product input or output terminals. A protective ground connection by way of the grounding
conductor in the power cord is essential for safe operation.
Danger Arising From Loss of Ground
Upon loss of the protective-ground connection, all accessible conductive parts (including
knobs and controls that may appear to be insulating) can render an electric shock.
Use the Proper Power Cord
Use
only the power cord and connector specified for your product.
Use only a power cord that is in good condition .
For
detailed information on power cords and connectors, see Section 2 of the manual.
Refer
cord and connector changes to qualified service personnel.
Use the Proper Fuse
To avoid fire hazard, use only the fuse of correct type, voltage rating and current rating as
specified in the parts list for your product.
Refer fuse replacement to qualified service personnel.
Do Not Operate in Explosive Atmospheres
To avoid explosion, do not operate this product in an explosive atmosphere unless it has been
specifically certified for such operation .
Do Not Remove Covers or Panels
To avoid personal injury , do not remove the product covers or panels. Do not operate the
product without the covers and panels properly installed .
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308 Service
SERVICING SAFETY SUMMARY
FOR QUALIFIED SERVICE PERSONNEL ONLY
Refer also to the preceding Operators Safety Summary.
Do Not Service Alone
Do
not perform internal service or adjustment of this product unless another person capable of
render i ng first aid and resuscitation is present.
Use·
care When Servicing With Power On
Dangerous voltages exist at several points in this product. To avoid personal injury, do not
touch exposed connections and components while power is on.
Di
sconnect power before removing protective panels, soldering, or replacing components.
Power Source
This product is intended to operate from a power source that will not apply more than 250 volts
rms between the supply conductors or between either supp ly conductor and ground . A
protective ground connection by way of the grounding conductor in the power cord is
essential
for safe operation.
vii

308 Service
The 308 Data Analyzer.
2662-33
Viii
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Section 1-308 Service
INTRODUCTION AND SPECIFICATION
INTRODUCTION
DESCRIPTION
The Sony/Tektroni x 308 is a keyboard-controlled,
multifunctional, portable data analyzer, intended to meet
the need for a portable and inexpensive service aid. The
308 can also be used
as a digital design instrument and as
a production-line checkout tool for in-circuit tests. Four
modes
of operation provide the user with a variety of data-
analyzing
methods . This instrument can be used for
timing analysis of parallel signals, state analysis of parallel
signals, state analysis
of serial transmissions (including
data communications), and signature analysis.
Parallel Timing Analyzer Function
When used as a Parallel Timing analyzer, the 308
provides an eight-channel input, a 20 MHz clock speed,
and 252
bits/channel memory size. The eight-channel
parallel word recognizer triggers upon recognition of a
preset
digital word. This word-recognition capability is
expandable to 24 channels with an accessory word
recognizer probe. If no preset data is specified, the 308
software immediately generates an internal trigger at the
start of an acquisition . The digital delay counts up to
65,535 clocks. Data sampled before or after the delayed
trigger can be stored either at sample intervals ranging
from 50 ns to 200 ms or synchronously with an external
clock . The latch input allows the 308 to capture glitches
narrower than the sample interval. Stored data is dis-
played on the crt in digitized timing format representing
the high and low levels of the stored data, but not the
actual waveform .
@
Parallel State Analyzer Function
The Parallel State Analyzer function is identical to the
Parallel Timing Analyzer function except for the display.
Data is
displayed in binary , octal, and hexadecimal
formats.
Serial State Analyzer Function
When operated as a Serial State analyzer, the 308
receives serial data
which conforms to EIA STD RS-232-C.
Data of five, six, seven,
or eight bits per character may be
inputted using either synchronous or asynchronous tim-
ing. A two-character word recognizer provides internal
triggering upon recognition of a preset digital word. The
digital delay counts up to 65,535 words . Data sampled
before
or after the delayed trigger can be stored, using an
internal
clock, at baud rates of 50 Hz to 9. 6 kHz or using an
external
clock . Stored data is displayed on the crt readout
in binary, hexadecimal, and ASCII formats.
Signature Analyzer Function
The Signature Analyzer function provides data inputs ,
start-stop gating inputs, and a 20 MHz clock input. A
sequence
of data between the start and stop gates is
converted
to a four-digit word and displayed as a four-
digit signature .
1-1

Introduction and Specification-308 Service
SPECIFICATION
Tables 1-1, 1-2, and 1-3 list the electrical, en vi ronmen-
tal, and physical characteristics of the 308. The electrical
characteristics are valid for the 308 when the 308 has been
adjusted as described in the Service Manual (Calibration)
at an ambient temperature between +20° to +30°C (+ 68°
to +86°F), is operating in an ambient temperature
between 0° to + 50 °C (+ 32° to +122° F) and has warmed
up for at least 15 minutes.
Table 1-1
Electrical Characteristics
Characteristics Performance Requirements Supplemental Information
PARALLEL TIMING ANALYZER FUNCTION
Inputs to P6451 Data Acquisition
Probe (Clock and data)
Input Rand C 1 MO ± 5%. Paralleled by =5 pF.
Thresho ld Voltage at the
MONITOR Jack
VAR At least -12 V to +12 V.
TTL +1.4 V ±0 .2 V.
Logic Swing
Minimum 500 mV p-p + 2% of threshold voltage. Centered on
the threshold voltage.
Max i mum
-40 V. A threshold voltage of at least +10 V.
Nondestructive Input
Voltage (Maximum)
At least -40 V to +40 V.
Latch Mode
Any transition that occurs between two
sample clocks is displayed as one clock-
period-wide data during the next clock
interval.
Width of Data Input (Minimum)
400 mV Overdrive 10 ns.
250 mV Overdrive 15 ns.
550
mV Overdrive 5 ns.
Ex
ternal Clock Mode
Clock Period (Minimum)
50 ns.
Clock Pulse Width (Minimum)
High-Logic Level 24.5 ns.
Low-Logic Level 24.5 ns.
Data
Setup Time (Minimum) 25 ns. Data
must precede clock transition by
this amount of time.
Data
Hold Time (Minimum) O ns.
1-2 @
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r Introduction and
Specification-308 Service
Table 1-1 (cont)
Electrical Characteristics
Characteristics Performance Requirements Supplemental Information
PARALLEL TIMING ANALYZER FUNCTION (cont)
Internal Clock Mode
Sa mple Interval (Minimum)
50 ns.
Data Pulse Width to ensure
sampling (Minimum)
1 sample interval plus 10 ns.
[
Input Delay between Channels
Channels
0-7
15 ns or less.
[
Frequency of Crystal Oscillator
100 MHz ±0 .005 MHz. 0.0025%
from 0° C to 50° C ambient,
0.0015% at 25° C
±3° C ambient.
Aging: 5 ppm per year.
Sample Intervals 50 ns
to 200 ms/sample in
1,2,5 sequence.
Clock Qualif i er
Function is enabled when Qualifier
S171 set to position T (Trigger
Input switch (S171) on side panel
Qualifier function) at factory.
is set to C.
[
Input Threshold
+1.4 V ±0.2 V (TTL level).
Input Impedance
10 kO or more for TTL signal.
Setup
Time
O ns or less with reference to selected
[ (rising
or falling) clock edge.
Ho ld Time
30 ns plus Clock pulse width or less.
Safe Peak
Input Voltage
+10 V to -5 V.
Memory Size
Acquisition
8 x 252 (bits).
[ Reference 8 x 252 (bits).
Trigger
Data Word Recognizer Programmable to set 8 bits of
recognition pattern.
Input
8-channel data input from P6451
Data Acquisition Probe.
Asynchronous Mode
Internal sampie interval requires asyn-
chronous word recognition.
Input Pulse Width (Minimum) 20 ns for any single channel.
35 ns
for any combination of
channels.
Filter
Continuously variable to at least
Matching combinations of narrower width
300 ns.
than filter setting are not recognized.
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Introduction and Specification-308 Service
Table 1-1 (cont)
Electrical Characteristics
Characteristics Performance Requirements Supplemental Information
PARALLEL TIMING ANALYZER FUNCTION (cont)
Trigger (cont)
Synchronous Mode External sample interval requires
synchronous word recognition .
Setup
Time 35 ns.
Hold Time
O ns. With reference to selected (rising
or falling) clock edge.
External
Qualifier Programmable to set 1-bit qualifier .
Input Threshold
+1.4 V ± 0.2 V (TTL level).
Input Impedance
1O kO or more for TTL signal.
Asynchronous Mode
Pulse Width (Min i mum)
20 ns for qualifier input only.
Synchronous Mode
Setup Time 0 ns or less. With reference to selected (rising
or falling) clock edge.
Hold Time 40 ns
or less.
Safe Peak
Input Voltage +10 V to - 5 V.
External
Word Recognizer
Programmable to set 16-bit
(Optional P6406 Probe)
recognition pattern.
Input Channels 16 channels of input data from
P6406.
Input Threshold
+1.4 V ± 0.2 V (TTL level).
Input Current
High-Logic Level 40
µA maximum at +2.7 V.
Low - Log ic Level - 400 µA max i mum at 0.4 V.
Safe Peak
Input Voltage +15 V
to - 1 V peak.
Asynchronous Mode
Pulse Width (Minimum)
20 ns for any single channel.
45 ns
for any combination of the 24
channel inputs from P6451 and
P6406.
Synchronous Mode
Setup Time
45 ns.
Hold Time
O ns. With reference to selected (rising
or falling) clock edge.
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r Introduction and
Specification-308 Service
r Table 1-1 (cont)
Electrical Characteristics
Characteristics Performance Requirements Supplemental Information
PARALLEL TIMING ANALYZER FUNCTION (cont)
r
Trigger Output of Word Recognizer
Output Level TTL level. 0.5 V
or less for low-level output;
2.4 V or more for high-level output.
Voltage (Maximum)
+ 6 V peak. .
Current (Maximum)
High -L ogic Level - 1 mA.
Low-Logic Level 2 mA .
Typical Propagation Delay 60 ns .
(Probe tip to word recognizer
output with filter set to minimum)
Trigger Delay Programmable to set the delay count.
Delay
Count Up to 65,535 count.
Delayed by clock .
[ Data Position
PRE Positions
the Delayed Trigger at the
240th position in the 252-byte
r Data
Memory .
POST Positions
the Delayed Trigger at the
13th position in the 252-byte
[ Data
Memory .
Full Valid Data Display/First Selectable by
internal jumper.
Instrument is shipped in Full Valid Data
Trigger Mode Selection
Mode . Under certain circumstances a
[
fraction of display is indicated as invalid
data
to indicate unused storage location .
Full Valid Data Display Produces a full valid
data display.
l First
Trigger Mode
Accepts first trigger after start of
a data acquisition .
l
ST ART Control Starts data acquisition when START
key is pressed in.
STOP Control Stops data acquisition and switches
to display mode when STOP key is
pressed in.
RE-START Control Repeats acquisition if valid new Data
Memory matches data in Reference
Memory. If not equal, stops data
acq
uisition and switches to display
mode.
L
L @ 1-5

Introduction and Specification-308 Service
Table 1-1 (cont)
Electrical Characteristics
Characteristics Performance Requirements Supplemental Information
PARALLEL TIMING ANALYZER FUNCTION (cont)
Display
Data Format
Timing Diagram.
Window Size
42, 84, or 168 bits/channel.
Display Mode
MENU
Displays all setting information for
acquisition.
WINDOW
Window position and size are
displayed on screen.
CURSOR Displays
position of cursor line
and
word at cursor line.
PARALLEL STATE ANALYZER FUNCTION
Characteristics, Performance Requirements and Supplemental Information for Parallel State Analyzer Function are
identical to the Parallel Timing Function except for the Display format .
Display
Data Format
Binary, octal, and hexadecimal.
Data Table Size 12 rows.
Display Mode
MENU
Displays all setting information for
acquisition .
CURSOR Displays
the cursor position and
12 bytes of data
beginning at the
cursor point and the cursor position.
SEARCH Displays data
which matches search
word setting. Data is displayed on
top of the table in inverse video .
Programmable to set a search word
pattern.
COMPARE
Highlights data different from data
in Reference Memory. Data is
displayed in inverse video.
1-6 @
r.
L
L
L

Introduction and Specification-308 Service
r Table 1-1 (cont)
Electrical Characteristics
r Characteristics Performance Requirements Supplemental Information
SERIAL STATE ANALYZER FUNCTION
r.
Data Input (via P6107 Probe)
r.
Input Rand C 10
MO ±3%, paralleled by approxi-
mately 13 pF at probe tip .
1 MO paralleled by 40 pF ±1 pF
[ at
bnc input connector .
Threshold Voltage at
MONITOR Jack
VAR
-12 V to +12 V.
TTL
+1.4 V ± 0.2 V.
Logic Swing
Minimum
500 mV p-p +2% of threshold voltage. Centered on
the thresho ld voltage.
[
Maximum
±30 V peak.
Nondestructive Peak Input
±500 Vat probe tip.
Voltage
,[
±25 0 Vat bnc input connector.
External Clock and T rigger Input
(via P6451 Probe)
[
Clock Input
Clock input from P6451.
Trigger Input
CH 0 input from P6451.
Input Rand C 1 MO
±5%, paralleled by about 5 pF .
Threshold Vol tage at
MONITOR Jack
[ VAR
-12 V to +12 V.
Sets threshold voltage at O V for
measurement of RS-232-C Interface
signaL
TTL
+1.4 V ±0.2 V.
Logic Swing
Minimum
500 mV p-p +2% of threshold voltage.
Centered on the threshold voltage .
Maximum Peak Input Voltage ±30 V.
Nondestructive Input Voltage
At least -40 V to +40 V.
(Maximum)
Data Sampling Timing
Synchronous and asynchronous.
Bits per Character
5, 6, 7, or 8.
Includes parity bit if parity is active.
L
L @ 1-7

Introduction and Specification-308 Service
Characteristics
Data
Sampling Rates
Internal
Clock for
Asynchronous Mode
Accuracy of Internal Clock
External Clock for
Asynchronous Mode
External Clock for
Synchronous Mod e
Input Logic
Parity
Synchroniz ing Word
(Synchronous Mode Only)
Hunt Word (Synchronous
Mode Only)
Setup and Hold Time for
Synchronous Mode
Setup Time
Hold Time
Stop Bits (Asynchronous Mode
Only)
Trigger
Data Word Recognizer
External
Trigger
Trigger Delay
Delay Count
Data Position
PRE
POST
1-8
Table 1-1 (cont)
Electrical Characteristics
Performance Requirements Supplemental Information
SERIAL STATE ANALYZER FUNCT I ON (cont)
50, 75, 110, 134.5, 150, 200, 300, 600,
1200, 1800, 2400, 4800, and 9600
bits per second.
± 0.02%.
Up to 9600 bits per second.
Up to 9600 bits per second.
Negative
or positive.
Odd, even,
or none.
Programmable to require two equal
The ASCII SYN word is binary
words. If not programmed, defaults 00010110.
to ASCII SYN word.
Programmable to require one word. In
this particular case, xxxxxxxx means
If
not programmed, defaults to
not used (normally x equals don't care).
xxxxxxxx.
3 µs maximum with respect to
external clock edge.
3
µs max imum with respect to
external clock edge.
Responds
to one or more stop bits. Not adjustable.
Programmable to require a sequence
of two words (characters).
Programmable to require one bit.
Programmable to set delay count.
Up to 65,635. Count delayed by word.
Positions the Delayed Trigger at the
240th position in the 252-byte
Data
Memory.
Positions the Delayed Trigger at the
13th position in the 252- byte
Data Memory.
@
L

r Introduction and
Specification-308 Service
Table 1-1 (cont)
Electrical Characteristics
Characteristics Performance Requirements Supplemental Information
SERIAL
STATE ANALYZER FUNCTION (cont)
r
ST ART Control Switches to acquisition mode and
prepares
to recognize acquisition
start signal when START key is
pressed.
Acquisition Start Signal
Asynchronous Mode Recognition of start bit.
Synchronous Mode Recognition of two equal SYNC
characters.
STOP Control Stops data acquisition and switches
to display mode when STOP key is
pressed.
RE-START Control
Repeats acquisition if valid data in
Data
Memory matches data in
Reference Memory.
If there is no
[ match, stops
acquisition and display
mode is enabled.
Framing
Error Detection
When a valid stop bit is not detected, This allows acquiring
data acquisition is stopped and data from a continuous
switched to display mode, unless data stream in asynchronous
fewer than 9 bytes have been protocol.
received. In that case, acquisition
[ is restarted.
Display
Data Format Binary, hexadecimal, and ASCII.
Data
Table Size 12 rows.
[ Parity
Error Parity error is indicated beside If parity is programmed.
ASCII character.
Framing Error (Asynchronous
Framing error point is marked with
Mode Only) IFESTI.
Mode
MENU Identical to Parallel State Function.
EXTENDED
MENU Identical to Parallel State Function. Additional programming capabilities are
provided
through the Extended Menu.
CURSOR
Identical to Parallel State Function.
SEARCH Identical to Parallel State Function .
COMPARE Identical to Parallel State Function .
L
L @ 1-9

Introduction and Specification-308 Service r
Table 1-1 (cont)
Electrical Characteristics r
Characteristics Performance Requirements Supplemental Information r
SIGNATURE ANALYZER F UNCTION
r
Data Input (via P6107 Probe)
Setup Time
15 ns max imum.
Data to be valid at least 15 ns before
selected clock edge.
Hold Time
0 ns.
With reference to selected (rising
or falling) clock edge.
Input Rand C 1
O MO ±3%, paralleled by approxi-
r
mately 13 pF at probe tip.
1
MO paralleled by 40 pF ± 1 pF
at
bnc input connector.
Threshold Voltage at
MONITOR Jack
VAR -
12Vto + 12V.
TTL
+1.4 V to ± 0.2 V.
Logic Swing
Minimum
500 mV p-p + 2% of threshold voltage. Centered on
the threshold voltage.
Max
imum
±30 V peak. [
Nondestructive Peak ±500
Vat probe tip .
Input Voltage
±250 Vat bnc input connector . [
Clock Input (via Clock Input Input
performance requirements
of P6451 Probe) are same as data
input requirements
for Parallel Timing Analyzer Function .
Clock Period (Minimum)
50 ns.
Clock Pulse Width (Minimum)
High-Logic Level 24.5 ns. [
Low-Logic Level 24.5 ns. [
[
1-10 @