Teledyne Lecroy ZD500 User manual

User Manual
ZD500, ZD1000, ZD1500
High Impedance
Differential Probes

ZD Series High Impedance Differential Probes User Manual
© 2022 Teledyne LeCroy, Inc. All rights reserved.
Users are permitted to duplicate and distribute Teledyne LeCroy documentation
for internal training purposes only. Resale or unauthorized duplication of
Teledyne LeCroy documentation materials is strictly prohibited.
Teledyne LeCroy is a registered trademark of Teledyne LeCroy, Inc. Other
product or brand names are trademarks or requested trademarks of their
respective holders. Information in this publication supersedes all earlier
versions. Specifications are subject to change without notice.
935129-00 Rev A
zd-series-probes-manual_19aug22.pdf
August, 2022

User Manual
1
Contents
Safety Instructions ...............................................................................................2
Symbols ................................................................................................................2
Precautions ..........................................................................................................2
Operating Environment ......................................................................................3
Introduction...........................................................................................................3
Key Features ........................................................................................................3
Standard Accessories ........................................................................................4
Deskewing with the PCF-200............................................................................7
Probe Input Loading.............................................................................................8
Probe Operation....................................................................................................9
Handling the Probe .............................................................................................9
Connecting the Probe to an Oscilloscope ......................................................9
Connecting the Probe to the Test Circuit .................................................... 10
Operation with an Oscilloscope..................................................................... 10
Auto Zero ........................................................................................................... 10
Care and Maintenance.......................................................................................11
Cleaning ............................................................................................................. 11
Calibration Interval........................................................................................... 11
Service Strategy................................................................................................ 11
Replacement Parts .......................................................................................... 11
Performance Verification ..................................................................................12
Required Test Equipment ............................................................................... 12
Test Setup and Preliminary Procedure ........................................................ 14
Functional Check.............................................................................................. 14
Verification Procedure..................................................................................... 14
ZD______ Test Record...................................................................................... 18
Reference.............................................................................................................19
Returning a Product for Service...................................................................... 19
Technical Support ............................................................................................ 20
Certifications..................................................................................................... 20
Warranty............................................................................................................. 21

ZD Series High Impedance Differential Probes
2
Safety Instructions
This section contains instructions that must be observed to keep this
oscilloscope accessory operating in a correct and safe condition. You are
required to follow generally accepted safety procedures in addition to the
precautions specified in this section. The overall safety of any system
incorporating this accessory is the responsibility of the assembler of the
system.
Symbols
These symbols may appear on the probe body or in this manual to alert you to
important safety considerations.
CAUTION. Potential for damage to probe or instrument it is connected
to. Attend to the accompanying information to protect against
personal injury or damage. Do not proceed until conditions are fully
understood and met.
ELECTROSTATIC DISCHARGE (ESD) HAZARD. The probe is
susceptible to damage if anti-static measures are not taken.
DOUBLE INSULATION
Precautions
Connect and disconnect properly. Connect probe to the measurement
instrument before connecting the test leads to a circuit/signal being tested.
Use only within operational environment listed. Do not use in wet or explosive
atmospheres.
Use indoors only.
Keep product surfaces clean and dry.
Be careful with sharp tips. The tips may cause bodily injury if not handled
properly.
Do not operate with suspected failures. Do not use the probe if any part is
damaged. Cease operation immediately and sequester the probe from
inadvertent use.

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Operating Environment
The accessory is intended for indoor use and should be operated in a clean, dry
environment. Before using this product, ensure that its operating environment is
maintained within these parameters:
Temperature: 5° to 40° C
Humidity: Maximum relative humidity 90 % for temperatures up to 31° C
decreasing linearly to 50 % relative humidity at 40° C
Altitude: Up to 10,000 ft (3,048 m)
Introduction
The ZD series of differential probes (ZD500, ZD1000 and ZD1500) are high
bandwidth, high impedance, active differential probes. The probes feature low
noise, very high input impedance and high common mode rejection, and are
ideally suited for signal integrity measurements in high-speed digital systems.
With low input capacitance and high input resistance, circuit loading is
minimized.
The probes can be used with a variety of Teledyne LeCroy oscilloscopes
running MAUI firmware version 6.4.1.x or later. See the oscilloscope product
page at teledynelecroy.com/oscilloscopes for probe compatibility.
With the ProBus interface, the probe becomes an integral part of the
oscilloscope, able to be controlled from the oscilloscope’s front panel. The
oscilloscope provides power to the probe, so there is no need for a separate
power supply or batteries.
Key Features
Key Benefits
Features
1 MOhm input resistance
Low input capacitance
Wide dynamic range
ProBus interface
Small, low mass probe head is designed
for ease of use and high performance.
Probe tip socket fits easily onto 0.025
inch square pins for direct access to test
points. Several available adaptors
connect directly to the probe socket.
Complete accessory kit.

ZD Series High Impedance Differential Probes
4
Standard Accessories
The ZD series probes are provided with numerous standard accessories to
make probing different test points easier than ever.
Standard Accessory
Quantity
Part Number
Straight Tip
4
PACC-PT001
Swivel Tip Adapter
1
PACC-ZD005
Tip Saver
2
PACC-ZD004
Solder-in Lead
2
PACC-ZD002
Long Right-Angle Lead
2
PACC-LD004
Y-lead Adapter
1
PACC-ZD001
Small IC Adapter
2
PACC-ZD006
Spring-loaded Ground (Long)
2
PACC-ZD003
Spring-loaded Ground (Short)
2
PACC-CD008
Micro-Grabber
2
PK006-4
Mini-Grabber
2
PACC-CL001
Freehand Probe Holder
1
PACC-MS001
Probe Calibration Fixture
1
PCF200
User Manual
1
N/A
Certificate of Calibration
1

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Tips
Straight Tip
The straight tip is rugged and designed for general
probing. Fits in either probe socket.
Swivel Tip Adapter
The swivel tip adapter is designed for multi-purpose
browsing and features adjustable tip spacing to
reach test points .300” apart with Z
-axis
compliance. Resistive compensation to reduce
inductive peaking is included.
Tip Saver
To prevent excessive wear on the probe input leads,
it is recommended to use tip saver in most probing
scenarios. The tip saver offers full system
bandwidth and will not degrade signal under test.
Grounds
The bendable ground leads on the Long and Short
Spring
-Loaded Bendable Grounds are designed to
be attached to the offset ground socket or be
attached to either socket of the probe head.
Short, spring-loaded bendable ground in use.

ZD Series High Impedance Differential Probes
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Leads
Long Right Angle Lead
This lead has a socket on one end and a square
pin on the other to connect to the input or ground
socket of the probe body, and may be used for
general purpose probing or can be connected to
the Mini
-Grabber or Micro-Grabber accessories.
Solder-In Lead
This lead can be soldered directly to the test
points for a secure probe connection.
Y Lead Adapter
This lead is used for both ground and input lead
simultaneously. It has two sockets on one end
and two square pins on the other and may be
used for gener
al purpose probing. Resistive
compensation to reduce inductive peaking is
included.
Small IC Adapter
The Small IC adapters are designed for probing
the leads of an IC. One side is insulated to
prevent shorting one pin to the adjacent pin. The
IC
adapters can probe between IC legs with a
width as narrow as .010” up to .100”. Resistive
compensation to reduce inductive peaking is
included.
Micro- and Mini-Grabbers
The micro- and mini-grabbers are ideal for
connecting to small IC legs or pins ver
y tightly
spaced.

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Freehand Probe Holder
The FreeHand lets you focus on the oscilloscope
screen instead of on maintaining contact to
multiple test points. It allows the user to
concentrate on what is really important
– the
waveform.
It is designed to keep most of the weight on the
probe tip and will prevent l
ost contact when a
bump to the table shakes the circuit under test.
Additionally, the ZD probe can be mounted
horizontally or vertically in the
FreeHand, giving
added measurement flexibility.
Probe Calibration Fixture
The PCF-200 probe calibration fixture may be used to
determine the effect of probe input loadin
g on the
circuit under test, for v
erification of the probe respons
e
to the signal being measured, or
as a convenient way
to deskew several probes/oscilloscope channels.
Deskewing with the PCF-200
1. Connect a fast edge to one or both PCF-200 inputs and terminate the
corresponding output to any oscilloscope channel. Trigger on this
channel for a common time reference.
2. Connect the probe tip(s) to the appropriate PCF-200 connection point
(solder-in tips may be inserted under the clamping mechanism).
3. Display the probe signals on the oscilloscope screen and use the
Horizontal adjust controls to align them to a common point.

ZD Series High Impedance Differential Probes
8
Probe Input Loading
Attaching any probe to a test circuit adds some loading to the circuit under test.
In most applications, the high impedance of the probe, compared to the
impedance of the circuit under test, imparts an insignificant load to the test
circuit. However, at very high frequencies the capacitive reactance of the probe
tip or lead may load the circuit enough to affect the measurement. The ZD
series probes are designed to minimize these effects at high frequencies. Refer
to the figures below for differential input equivalent circuit and impedance vs.
frequency derating.
ZDxxxx Differential Input Equivalent Circuit

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ZDxxxx Impedance vs. Frequency Derating Curve
Probe Operation
Handling the Probe
The ZD series probes are precision test instruments. Exercise care when
handling and storing the probe. Always handle the probe by the probe body or
compensation box. Avoid putting excessive strain or exposing the probe cable
to sharp bends.
ESD Sensitive: The tips of the ZD series probes are sensitive to
Electrostatic Discharge (ESD). Avoid causing damage to the probe by
always following anti-static procedures (wear wrist strap, etc.) when
using or handling the probe.
Connecting the Probe to an Oscilloscope
The ZD series probes has been designed for use with Teledyne LeCroy
platforms equipped with the ProBus interface. When you attach the probe
output connector to the oscilloscope’s input connector, the oscilloscope

ZD Series High Impedance Differential Probes
10
recognizes the probe, provides proper termination and activates the probe
control functions in the user interface.
Connecting the Probe to the Test Circuit
To maintain the high-performance capability of the probe in measurement
applications, care must be exercised in connecting the probe to the test circuit.
Increasing the parasitic capacitance or inductance in the input paths may
introduce a “ring” or slow the rise time of fast signals. Input leads which form a
large loop area will pick up any radiated electromagnetic field which passes
through the loop and may induce noise into the probe input.
Using one of the available accessories makes a ZD series probe with its small
profile and low mass head ideally suited for applications in dense circuitry.
Operation with an Oscilloscope
When the probe is connected to any compatible Teledyne LeCroy oscilloscope,
the displayed scale factor and measurement values are automatically adjusted.
Turning the front panel Volts/Div knob controls the oscilloscope’s scale factor
to give full available dynamic range up to 2.25 V/div.
Auto Zero
Auto Zero corrects for DC offset drifts that naturally occur from thermal effects
in the amplifier. The probe incorporates Auto Zero capability to remove the DC
offset from the probe's amplifier output to improve the measurement accuracy.
Auto Zero is invoked manually from the ZDxxxx dialog that appears when the
probe is connected to the oscilloscope.
Always perform Auto Zero after the probe is warmed up (recommended warm-
up time is 20 minutes). Depending on the measurement accuracy desired
and/or changes in ambient temperature where the probe is located, it may be
necessary to perform Auto Zero more often. If the probe is disconnected from
the oscilloscope and reconnected, repeat Auto Zero after a suitable warm-up
time.
CAUTION:Disconnect the probe from the circuit before Auto Zero, or
else any DC component that is part of the Signal to be measured will be
zeroed out.

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Care and Maintenance
Cleaning
The exterior of the probe and cable should be cleaned, using a soft cloth
moistened with water. The use of abrasive agents, strong detergents, or other
solvents may damage the probe. Always ensure that the input leads are free of
debris.
CAUTION: The probe case is not sealed and should never be immersed
in any fluid.
Calibration Interval
The recommended calibration interval is one year. The Performance
Verification procedure should be performed as the first part of calibration.
Service Strategy
The ZD series probes utilizes fine pitch surface mount devices. It is therefore
impractical to attempt to repair in the field. Defective probes must be returned
to a Teledyne LeCroy service facility for diagnosis and exchange. Defective
probes under warranty are repaired or replaced. A probe that is not under
warranty can be exchanged for a factory refurbished probe for a modest fee.
You must return the defective probe in order to receive credit for the probe core.
Replacement Parts
The probe connection accessories and other common parts can be ordered
through the North America Customer Care Centers. Refer to the part numbers
listed on the Standard Accessories table (p.4).

ZD Series High Impedance Differential Probes
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Performance Verification
This procedure can be used to verify the warranted characteristics of a ZD
series differential probe (ZD500, ZD1000, ZD1500). It tests:
•Output Zero Voltage
•LF Attenuation Accuracy
The recommended calibration interval for the ZD series models is one year.
Complete the performance verification as the first step of annual calibration.
Results can be recorded on a photocopy of the Test Record provided.
Performance verification can be completed without removing the probe covers
or exposing the user to hazardous voltages. There are no adjustments.
Required Test Equipment
The following table lists the test equipment (or equivalent) that is required for
performance verification of a ZD series probe. As connector types may vary on
different brands and models of test instruments, additional adapters or cables
may be required.
This procedure has been developed to minimize the number of calibrated test
instruments required. Only the parameters listed in boldface in the Minimum
requirements column must be calibrated to the accuracy indicated.
NOTE: The function generator used in this Performance Verification Procedure
is used for making relative measurements. Because the output of the generator
is measured with an oscilloscope in this procedure, it is not required to calibrate
the generator.
The warranted characteristics of the ZD probes are valid at any temperature
within the Operating Environment listed in this manual (p.3). However, some of
the other test equipment used to verify performance may have environmental
limitations required to meet the accuracy needed for the procedure. Be sure
that the ambient conditions meet the requirements of all the test equipment
used in this procedure.

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Table of Required Test Equipment
Description
Minimum Requirement
Example Equipment
Digital Oscilloscope
ProBus Interface
Windows-based
≥ 2 GHz for Bandwidth
Test
WaveRunner 8000
WavePro 7 Zi-A
Digital Multimeter
(DMM) with test probe
leads
4.5 digit
DC: 0.1% Accuracy
AC: 0.1% Accuracy
Keysight 34401A
Fluke 8842A-09
Function Generator
Sine Wave output
amplitude adjustable to
14.14 Vp-p (5 Vrms) into
1 MΩ at 70 Hz
Keysight 33120A
Stanford Research DS340
RF Signal Generator
Sine wave output 500
MHz, 1 GHz, 1.5 GHz
+6 dBm output
Anritsu MG3690C
Power Supply
0-12 V, settable to 10 mV
HP E3611A
BNC Coaxial Cable
(2)
Male to Male, 50 Ω,
36" Cable
Pomona 2249-C-36
Pomona 5697-36
BNC Tee Connector
Male to Dual Female
Pomona 3285
Calibration Fixture
0.1 mm square pin head
Teledyne LeCroy PCF200
Calibration Fixture
ProBus Extender Cable
Teledyne LeCroy
PROBUS-CF01
Terminator,
Precision BNC
50 Ω ± 0.05%
Teledyne LeCroy
TERM-CF01
Banana Plug Adapter
(2)
Female BNC to
Dual Banana Plug
Pomona 1269
BNC to Mini-grabber
BNC Male to
Mini-grabber Cable, 36”
Pomona 5187-C-36
2.54mm Sq. Pin Short
Pins connected to short
the probe inputs
Samtec TSW-102-07-G-S
SMA-BNC Adapter

ZD Series High Impedance Differential Probes
14
Test Setup and Preliminary Procedure
NOTE: The correct operation of a ZD series probe requires software version
6.4.1.x or higher. The oscilloscope software version can be verified by selecting
Utilities > Utilities Setup > Status. Contact your local Teledyne LeCroy
representative or visit teledynelecroy.com/softwaredownload if the software in
your oscilloscope requires updating.
1. Connect the ZD series probe to oscilloscope channel 1.
2. Turn on the oscilloscope and allow at least 30 minutes warm-up time
before performing the Verification Procedure.
3. Turn on the other test equipment and allow them to warm up for the
manufacturer’s recommended time.
4. While the instruments are reaching operating temperature, make a
photocopy of the ZD Series Probe Test Record and fill in the necessary
data.
Functional Check
The functional check will verify the basic operation of the probe functions.
Perform the Functional Check prior to the Performance Verification.
1. Return to the factory default settings by:
•Selecting File > Recall Setup from the menu bar.
•Touching the Recall Default button.
2. Touch the C1 descriptor box to open the C1 dialog.
3. Verify that the correct probe is sensed and displayed on the tab behind the
C1 dialog.
Verification Procedure
A. Output Zero Voltage
1. Leave the probe connected to oscilloscope C1. Set the vertical sensitivity
for C1 to 20 mV/ and the horizontal scale to 1.0 us/.
2. Turn on measurement P1 and set it to measure the mean of C1. Turn on
statistics.
3. Insert the square pin short into the probe input sockets to short the inputs.
4. Initiate an AutoZero (control on the ZD probe dialog behind C1).
5. Wait an additional 15 minutes, then clear sweeps on C1.

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6. Record the value of P1: mean (C1) as Output Zero on the Test Record.
7. Verify the absolute value of Output Zero is less than the value given on the
probe data sheet.
B. LF Attenuation Accuracy
1. Connect the BNC tee to the output of the function generator.
2. Carefully insert the Straight Tips (supplied in accessory kit) into the sockets
of the probe head. Attach the red lead of the mini-grabber to the positive (+)
signal input and the black lead to the negative (-) input of the probe head.
3. Connect the BNC connector of the mini-grabbers to the BNC tee on the
output of the function generator.
4. Attach a BNC cable to the unused female port of the BNC tee, connect a
dual banana plug adapter to the other end of the cable and plug the dual
banana plug adapter into the DMM input. Be sure the side of the banana
plug adapter corresponding to the BNC shield (marked "GROUND") is
connected to the LOW or COMMON input of the DMM.
5. Set the DMM to read AC volt and set the range to measure 5.0 Vrms.
6. Set the function generator to output a 70 Hz sine wave, output amplitude to
5 Vrms ±10 mV as measured on the DMM.
7. Record the output voltage to 1 mV resolution as "Generator Output Voltage"
in the Test Record. Be careful not to alter the output amplitude after the
reading is recorded.
8. Remove the probe from C1 of the scope and re-connect using the Probus
extender cable. Connect one end of a BNC cable to the probe end of the
extender cable, and the other end to the precision 50Ω adapter.
9. Set the vertical scale of C1 to 1 V/. Select the probe dialog tab and record
the value listed for ‘Effective Gain, top range’ on the test record.
10. Take the recorded generator output voltage and divide by the effective gain.
Record this value as ‘Expected Output Voltage, top range’ on the test record.
11. Connect the banana plugs of the precision 50Ω adapter to the input of the
DMM. Measure the output voltage and record this as ‘Measured Output
Voltage, top range’ on the test record.

ZD Series High Impedance Differential Probes
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12. Calculate the gain error by taking 100 * [(Measured Output Voltage) –
(Expected Output Voltage)] / (Expected Output Voltage). Record this value
as the % Gain Error. Verify that this is within the limits given on the data
sheet.
13. Connect the signal generator to the DMM input and set the output
amplitude of the signal generator to 500 mVrms ±1 mV as measured on the
DMM.
14. Record the output voltage to 1 mV resolution as "Generator Output Voltage,
low range" in the Test Record. Be careful not to alter the output amplitude
after the reading is recorded.
15. Set the vertical scale of C1 to 200 mV/. Select the probe dialog tab and
record the value listed for ‘Effective Gain, low range’ on the test record.
16. Take the recorded generator output voltage and divide by the effective gain.
Record this value as ‘Expected Output Voltage, low range’ on the test
record.
17. Connect the banana plugs of the precision 50Ω adapter to the input of the
DMM. Measure the output voltage and record this as ‘Measured Output
Voltage, low range’ on the test record.
18. Calculate the gain error by taking 100 * [(Measured Output Voltage) –
(Expected Output Voltage)] / (Expected Output Voltage). Record this value
as the % Gain Error. Verify that this is within the limits given on the data
sheet.

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C. Probe Bandwidth
1. Disconnect the probe from the mini hooks and the ProBus extender
and connect it to oscilloscope channel 1.
2. Set the RF signal generator to 1.5 GHz for ZD1500, 1 GHz for ZD1000,
or 500 MHz for ZD500 at +6 dBm output.
3. Using the square-pin microstrip path, connect the PCF200 to the
oscilloscope C2 input using an SMA-BNC adapter. Connect the signal
generator to the C2 input through the PCF200.
4. Attach the probe to the PCF200 by seating the amplifier over the
square pins.
5. Set up the oscilloscope as follows:
a. C1 and C2 Vertical Scale 200 mV/div
b. C2 Coupling DC50Ω and Bandwidth Full
c. Horizontal Scale (timebase) 10 ns/div
d. Trigger on C2 Edge, Level = 0 V
e. Measurements:
i. P1 sdev of C1
ii. P2 sdev of C2
iii. P3 ratio of P1/P2
iv. P4 freq of C2
The probe bandwidth is defined as the frequency at which the probe
amplitude is 3 dB down from the input signal amplitude. This would be
the frequency at which the ratio measurement P3 drops to 0.7071.
6. Record the signal loss ratio (P3) with RF signal input and verify is it
greater than 0.7071.
This completes the Performance Verification of the ZD series probe. Complete
and file the Test Record as required to support your internal calibration
procedure.
Apply suitable calibration label to the probe housing as required.

ZD Series High Impedance Differential Probes
18
ZD______ Test Record
Technician:_____________________________________________
Date:_____________________
Equipment Used
Item
Model
Serial Number
Cal Due Date
Oscilloscope
Function Generator
Microwave Generator
Digital Multimeter
Probe
Lead
Tip
A. Output Zero Voltage
Step
Description
Result
A-6
Output Zero (Test limit 0V ± 5 mV)
B. LF Attenuation Accuracy
Step
Description
Result
B-7
Generator Output Voltage
V
B-9
Effective Gain, top range
B-10
Expected Output Voltage, top range
V
B-11
Measured Output Voltage, top range
V
B-12
Gain Error, top range (Test Limit ≤ ± 1.0%)
%
B-14
Generator Output Voltage
V
B-15
Effective Gain, low range
B-16
Expected Output Voltage, low range
V
B-17
Measured Output Voltage, low range
V
B-18
Gain Error, top range (Test Limit ≤ ± 1.0%)
%
C. Bandwidth
Step
Description
Result
C-6
Signal Loss at Max. Bandwidth
V/V
Permission is granted to photocopy this page to record the results of the Performance Verification
procedure. The test limits are included in each step. Record measurements and intermediate
calculations that support the limit check under "Results". Create a new record for each probe, lead,
and tip combination.