Teledyne Lecroy ZD500 User manual

User Manual
ZD500, ZD1000, ZD1500
High Impedance
Differential Probes

ZD Series High Impedance Differential Probes User Manual
© 2022 Teledyne LeCroy, Inc. All rights reserved.
Users are permitted to duplicate and distribute Teledyne LeCroy documentation
for internal training purposes only. Resale or unauthorized duplication of
Teledyne LeCroy documentation materials is strictly prohibited.
Teledyne LeCroy is a registered trademark of Teledyne LeCroy, Inc. Other
product or brand names are trademarks or requested trademarks of their
respective holders. Information in this publication supersedes all earlier
versions. Specifications are subject to change without notice.
935129-00 Rev A
zd-series-probes-manual_19aug22.pdf
August, 2022

User Manual
1
Contents
Safety Instructions ...............................................................................................2
Symbols ................................................................................................................2
Precautions ..........................................................................................................2
Operating Environment ......................................................................................3
Introduction...........................................................................................................3
Key Features ........................................................................................................3
Standard Accessories ........................................................................................4
Deskewing with the PCF-200............................................................................7
Probe Input Loading.............................................................................................8
Probe Operation....................................................................................................9
Handling the Probe .............................................................................................9
Connecting the Probe to an Oscilloscope ......................................................9
Connecting the Probe to the Test Circuit .................................................... 10
Operation with an Oscilloscope..................................................................... 10
Auto Zero ........................................................................................................... 10
Care and Maintenance.......................................................................................11
Cleaning ............................................................................................................. 11
Calibration Interval........................................................................................... 11
Service Strategy................................................................................................ 11
Replacement Parts .......................................................................................... 11
Performance Verification ..................................................................................12
Required Test Equipment ............................................................................... 12
Test Setup and Preliminary Procedure ........................................................ 14
Functional Check.............................................................................................. 14
Verification Procedure..................................................................................... 14
ZD______ Test Record...................................................................................... 18
Reference.............................................................................................................19
Returning a Product for Service...................................................................... 19
Technical Support ............................................................................................ 20
Certifications..................................................................................................... 20
Warranty............................................................................................................. 21

ZD Series High Impedance Differential Probes
2
Safety Instructions
This section contains instructions that must be observed to keep this
oscilloscope accessory operating in a correct and safe condition. You are
required to follow generally accepted safety procedures in addition to the
precautions specified in this section. The overall safety of any system
incorporating this accessory is the responsibility of the assembler of the
system.
Symbols
These symbols may appear on the probe body or in this manual to alert you to
important safety considerations.
CAUTION. Potential for damage to probe or instrument it is connected
to. Attend to the accompanying information to protect against
personal injury or damage. Do not proceed until conditions are fully
understood and met.
ELECTROSTATIC DISCHARGE (ESD) HAZARD. The probe is
susceptible to damage if anti-static measures are not taken.
DOUBLE INSULATION
Precautions
Connect and disconnect properly. Connect probe to the measurement
instrument before connecting the test leads to a circuit/signal being tested.
Use only within operational environment listed. Do not use in wet or explosive
atmospheres.
Use indoors only.
Keep product surfaces clean and dry.
Be careful with sharp tips. The tips may cause bodily injury if not handled
properly.
Do not operate with suspected failures. Do not use the probe if any part is
damaged. Cease operation immediately and sequester the probe from
inadvertent use.

User Manual
3
Operating Environment
The accessory is intended for indoor use and should be operated in a clean, dry
environment. Before using this product, ensure that its operating environment is
maintained within these parameters:
Temperature: 5° to 40° C
Humidity: Maximum relative humidity 90 % for temperatures up to 31° C
decreasing linearly to 50 % relative humidity at 40° C
Altitude: Up to 10,000 ft (3,048 m)
Introduction
The ZD series of differential probes (ZD500, ZD1000 and ZD1500) are high
bandwidth, high impedance, active differential probes. The probes feature low
noise, very high input impedance and high common mode rejection, and are
ideally suited for signal integrity measurements in high-speed digital systems.
With low input capacitance and high input resistance, circuit loading is
minimized.
The probes can be used with a variety of Teledyne LeCroy oscilloscopes
running MAUI firmware version 6.4.1.x or later. See the oscilloscope product
page at teledynelecroy.com/oscilloscopes for probe compatibility.
With the ProBus interface, the probe becomes an integral part of the
oscilloscope, able to be controlled from the oscilloscope’s front panel. The
oscilloscope provides power to the probe, so there is no need for a separate
power supply or batteries.
Key Features
Key Benefits
Features
1 MOhm input resistance
Low input capacitance
Wide dynamic range
ProBus interface
Small, low mass probe head is designed
for ease of use and high performance.
Probe tip socket fits easily onto 0.025
inch square pins for direct access to test
points. Several available adaptors
connect directly to the probe socket.
Complete accessory kit.

ZD Series High Impedance Differential Probes
4
Standard Accessories
The ZD series probes are provided with numerous standard accessories to
make probing different test points easier than ever.
Standard Accessory
Quantity
Part Number
Straight Tip
4
PACC-PT001
Swivel Tip Adapter
1
PACC-ZD005
Tip Saver
2
PACC-ZD004
Solder-in Lead
2
PACC-ZD002
Long Right-Angle Lead
2
PACC-LD004
Y-lead Adapter
1
PACC-ZD001
Small IC Adapter
2
PACC-ZD006
Spring-loaded Ground (Long)
2
PACC-ZD003
Spring-loaded Ground (Short)
2
PACC-CD008
Micro-Grabber
2
PK006-4
Mini-Grabber
2
PACC-CL001
Freehand Probe Holder
1
PACC-MS001
Probe Calibration Fixture
1
PCF200
User Manual
1
N/A
Certificate of Calibration
1

User Manual
5
Tips
Straight Tip
The straight tip is rugged and designed for general
probing. Fits in either probe socket.
Swivel Tip Adapter
The swivel tip adapter is designed for multi-purpose
browsing and features adjustable tip spacing to
reach test points .300” apart with Z
-axis
compliance. Resistive compensation to reduce
inductive peaking is included.
Tip Saver
To prevent excessive wear on the probe input leads,
it is recommended to use tip saver in most probing
scenarios. The tip saver offers full system
bandwidth and will not degrade signal under test.
Grounds
The bendable ground leads on the Long and Short
Spring
-Loaded Bendable Grounds are designed to
be attached to the offset ground socket or be
attached to either socket of the probe head.
Short, spring-loaded bendable ground in use.

ZD Series High Impedance Differential Probes
6
Leads
Long Right Angle Lead
This lead has a socket on one end and a square
pin on the other to connect to the input or ground
socket of the probe body, and may be used for
general purpose probing or can be connected to
the Mini
-Grabber or Micro-Grabber accessories.
Solder-In Lead
This lead can be soldered directly to the test
points for a secure probe connection.
Y Lead Adapter
This lead is used for both ground and input lead
simultaneously. It has two sockets on one end
and two square pins on the other and may be
used for gener
al purpose probing. Resistive
compensation to reduce inductive peaking is
included.
Small IC Adapter
The Small IC adapters are designed for probing
the leads of an IC. One side is insulated to
prevent shorting one pin to the adjacent pin. The
IC
adapters can probe between IC legs with a
width as narrow as .010” up to .100”. Resistive
compensation to reduce inductive peaking is
included.
Micro- and Mini-Grabbers
The micro- and mini-grabbers are ideal for
connecting to small IC legs or pins ver
y tightly
spaced.

User Manual
7
Freehand Probe Holder
The FreeHand lets you focus on the oscilloscope
screen instead of on maintaining contact to
multiple test points. It allows the user to
concentrate on what is really important
– the
waveform.
It is designed to keep most of the weight on the
probe tip and will prevent l
ost contact when a
bump to the table shakes the circuit under test.
Additionally, the ZD probe can be mounted
horizontally or vertically in the
FreeHand, giving
added measurement flexibility.
Probe Calibration Fixture
The PCF-200 probe calibration fixture may be used to
determine the effect of probe input loadin
g on the
circuit under test, for v
erification of the probe respons
e
to the signal being measured, or
as a convenient way
to deskew several probes/oscilloscope channels.
Deskewing with the PCF-200
1. Connect a fast edge to one or both PCF-200 inputs and terminate the
corresponding output to any oscilloscope channel. Trigger on this
channel for a common time reference.
2. Connect the probe tip(s) to the appropriate PCF-200 connection point
(solder-in tips may be inserted under the clamping mechanism).
3. Display the probe signals on the oscilloscope screen and use the
Horizontal adjust controls to align them to a common point.

ZD Series High Impedance Differential Probes
8
Probe Input Loading
Attaching any probe to a test circuit adds some loading to the circuit under test.
In most applications, the high impedance of the probe, compared to the
impedance of the circuit under test, imparts an insignificant load to the test
circuit. However, at very high frequencies the capacitive reactance of the probe
tip or lead may load the circuit enough to affect the measurement. The ZD
series probes are designed to minimize these effects at high frequencies. Refer
to the figures below for differential input equivalent circuit and impedance vs.
frequency derating.
ZDxxxx Differential Input Equivalent Circuit