Bruker D2 PHASER User manual

Innovation with Integrity XRD
D2 PHASER
User Manual
Original Instructions

The reproduction, transmission or use of this document or its contents is not permitted without express written
authority. Offenders will be liable for damages. All rights reserved.
We have checked the contents of this manual for agreement with the hardware and software described. Since
deviations cannot be precluded entirely, we cannot guarantee full agreement. However, the data in this manual are
reviewed regularly and any necessary corrections are included in subsequent editions. Suggestions for improvement
are welcome.
All configurations and specifications are subject to change without notice.
Order no. DOC-M88-EXX141 V5. Updated: Jan 30, 2015.
© 2009 - 2015 Bruker AXS GmbH, Karlsruhe, Germany.
All trademarks and registered trademarks are the sole property of their respective owners.
Printed in the Federal Republic of Germany.
Bruker AXS GmbH
Östliche Rheinbrückenstr. 49
76187 Karlsruhe, Germany
Tel. [phone]
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[e-mail]
www.bruker.com

D2 PHASER User Manual
DOC-M88-EXX141 V5 – 01.2015
i
D2 PHASER User Manual
Caution!
Read the manuals ‘D2 PHASER Introductory User Manual’ and ‘D2 PHASER – From
Unpacking to the First Measurement – Quick Start Guide’ completely before
switching on the D2 PHASER instrument.
Table of contents
Introduction................................................................................................................1 
Basics and principle of operation ............................................................................3 
Design of the diffractometer.....................................................................................4 
Goniometer ......................................................................................................................................4
X-ray tube.........................................................................................................................................4
Slit systems, slit and Soller modules and other passive optics ................................................6
Primary divergence slit systems ................................................................................................6
Secondary detector slit systems ................................................................................................6
Slit module..................................................................................................................................6
Kfilter module ..........................................................................................................................7
Absorber module........................................................................................................................7
Soller slit module........................................................................................................................7
Airscatter screen modules..........................................................................................................7
Sample holder..................................................................................................................................8
Sample Changer ..............................................................................................................................8
Detectors..........................................................................................................................................8
Silicon strip detector LYNXEYE .................................................................................................9
XFlash detector ..........................................................................................................................9
Operation of the D2 PHASER .................................................................................10 
Transport and positioning of the instrument .............................................................................10
Switching on the instrument........................................................................................................10
Switching off the instrument........................................................................................................11
Warning and status lamps............................................................................................................11
Operational controls and connection plugs...............................................................................11
Front door of the instrument........................................................................................................11
Measurement with the D2 PHASER.............................................................................................11
Configuration and settings of primary section..........................................................................12
Configuration and settings of sample section ..........................................................................12
Configuration and settings of secondary section .....................................................................13
Start measurement with commander .......................................................................................13
Start measurement with joblist.................................................................................................14
Start element analyses with the program SPECTRA ..............................................................14

User Manual D2 PHASER
DOC-M88-EXX141 V5 – 01.2015ii
Alignment of the diffractometer .............................................................................15
Introduction ...................................................................................................................................15
Philosophy of alignment for D2 PHASER systems ...................................................................15
Functional principle of the goniometer.......................................................................................16
Zero definition of the scale....................................................................................................16
Setting the parameters of the detector unit..............................................................................17
Avoiding Collisions with the D2 PHASER Goniometer ............................................................19
Maintenance of the diffractometer .........................................................................20
Introduction ...................................................................................................................................20
Maintenance of the internal cooling unit ....................................................................................20
Cooling cycle............................................................................................................................20
Thermomodule .........................................................................................................................20
Checking the cooling fluid level................................................................................................20
Refilling the cooling fluid tank...................................................................................................21
Replacement of the fan filter........................................................................................................21
X-ray safety precautions .........................................................................................22
Introduction ...................................................................................................................................22
Detailed description of the X-ray safety system ........................................................................22
Radiation protection enclosure ................................................................................................22
Safety system...........................................................................................................................22
Radiation protection and leakage levels ..................................................................................24
Resetting the D2 PHASER Safety System ..................................................................................24
Important Information for Canadian Users............................................................25
General Safety Precautions of the D2 PHASER.........................................................................25
Biological Effects ..........................................................................................................................25
Mechanisms of Damage ..........................................................................................................25
Tissue Sensitivity .....................................................................................................................26
Prompt and Delayed Effects ....................................................................................................26
Delayed Effects of Radiation Exposure ...................................................................................26
General Physical Principles .........................................................................................................26
Production of X-rays.................................................................................................................26
Continuous Spectrum...............................................................................................................27
Characteristic Spectrum...........................................................................................................28
X-ray safety precaution ............................................................................................................30
Troubleshooting ......................................................................................................31
Resetting the Safety System ........................................................................................................31
Overtemperature Safety Shutdown .............................................................................................31
Trouble with the Internal Cooling Unit ........................................................................................31
Generator Arcing...........................................................................................................................31
Drive Error......................................................................................................................................31
DSP Error with XFlash Detector ..................................................................................................32
Other problems..............................................................................................................................32
Maintenance parts and consumables....................................................................33
Maintenance parts.........................................................................................................................33
Maintenance kit for D2 PHASER systems ...............................................................................33

D2 PHASER User Manual
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Tables and constants..............................................................................................36
Figures......................................................................................................................37

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D2 PHASER User Manual
DOC-M88-EXX141 V5 – 01.2015 1
Introduction
Congratulations on the purchase of this unique desktop diffractometer system. The D2 PHASER is a
small portable X-ray diffractometer desktop system (fig. 1, fig. 2) with a compact all-in-one desktop
design. The D2 PHASER is easy in operation and has a very small footprint (fig. 2). It is a high quality
XRD system with innovative high end design which works without any external components, i.e. chiller,
computer system, display etc. This system needs only mains power supply between 100V-240V
(50/60Hz) and a footprint of approx. 50cm x 60cm. The D2 PHASER opens the door to modern XRD
investigations, all of it fast, simple, efficient and with high data quality. These are:
Qualitative and quantitative phase analysis and identification
Determination of degree of crystallinity
Determination of crystal properties as crystallite size and lattice strain
Determination of crystal structure
The D2 PHASER system is suitable for tasks in
Cement and raw materials
Minerals and mining
Geology and exploration
Ceramics
Chemistry and catalysts
Research and education
Pharmaceuticals
Environment
Although the D2 PHASER system works with a low power X-ray generator of 300W, it produces very
good measurement results in short times, especially with 1D-detector LYNXEYE (fig. 3) in fastscan
mode. The mechanics of the Bragg-Brentano geometry is factory-aligned and it is normally not
necessary to realign.
The D2 PHASER is very flexible in handling different samples. Different material properties require
different sample preparations. There are standard sample holders made from PMMA or steel. In
addition there are holders for small sample amounts, low absorbing and weakly diffracting samples,
for filters, for environment-sensitive samples and for examining materials that tend to show a preferred
orientation. Possible sample holders are:
Holders with various cavities
Holder for automated sample preparation
Holder for clays
Low background holders for small sample amounts
Airtight holder for environment sensitive samples
Holder for filter samples

User Manual D2 PHASER
DOC-M88-EXX141 V5 – 01.20152
Samples must be prepared in 51mm standard sample rings (fig. 4). The exchanging of samples is
then very easy. The sample holder (fig. 5) of the goniometer, which has a rotation motor, allows easy
loading and unloading samples. A D2 PHASER with sample changer needs special sample rings (fig.
144) ), which are smaller and have 32mm . The filling up of the sample magazine is very easy (fig.
150) as well.
The D2 PHASER system is offered with three detector types:
Standard Bragg Brentano geometry with fixed primary (a) and secondary slit modules (b) and
dynamic counter PM tube (photomultiplier tube) (c) with NaI scintillation crystal NaI(Tl) as shown in
fig. 6.
Standard Bragg Brentano geometry with fixed primary (a) and linear (position sensitive) LYNXEYE
counter (c) for fastscan measurements as shown in fig. 7 (D2 PHASER with sample changer see
fig. 141).
Standard Bragg Brentano geometry with fixed primary (a) and secondary slit modules (b) and an
energy dispersive XFlash detector (c) for monochromatic measurements and basic qualitative
element analyses, as shown in fig. 8.

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DOC-M88-EXX141 V5 – 01.2015 3
Basics and principle of operation
The operation mode, which is described here in principle, is called the focussing Bragg Brentano
geometry. Radiation from the X-ray tube (e) (fig. 9 and 10) is emitted from the focus (f) and hits the
sample in the goniometer centre (a). The incident beam direction is (b). The primary beam hits the
sample and is diffracted by the crystal lattice of the powder sample.
The diffraction peaks result from the interference of x-ray waves by the periodic 3d-lattice of the
sample, i.e. of all powder microcrystals, which are in diffraction condition. Each powder microcrystal
contributes to a discrete diffraction peak on the diffraction cones. Their peak intensity is a result of the
atomic types and their positions in the unit cell. The diffraction peaks are generated at specific angles
which are directly correlated with the lattice symmetry (14 Bravais lattice symmetries).
The diffracted radiation is detected by an X-ray sensitive detector (k). Angular positions and intensities
of the diffracted radiation peaks are characteristic for the sample’s crystal structure. Additional
qualitative and quantitative information on crystal properties can be found by analyzing diffraction
patterns, for example chemical composition and physical properties such as crystallinity.
The powder sample rotates with a constant angular velocity around axis (j) (fig. 11 for a standard
sample rotation or fig. 146 for a sample changer) in order to bring more crystallites in the X-ray beam
and therefore improves statistics. The axis (j) of this sample rotation is perpendicular to the goniometer
axis (and to the sample surface) and bisects the incident and diffracted beam. Sample rotation can be
switched on or off if required.
During the measurement of the characteristic diffraction pattern of a polycrystalline sample, detector
and tube rotate (fig. 9 and 10) around the goniometer centre (a) each with angle to the sample
surface (--geometry). The tube focus (f), the goniometer centre (a) and the detector aperture (l)
define a circle ((d) in fig. 9 and fig. 10), the measurement circle, with the goniometer centre as the
circle’s centre.
Another circle is defined by tube focus (f), goniometer centre (a) and detector aperture (l) which lie on
the circumference of the focusing circle ((m) in fig. 9 & 10). The surface of the sample contacts this
circle tangentially. The circle is called focusing circle because all X-rays which leave the tube focus
(point) within a certain divergence angle area are concentrated (focused) again to a point in the centre
of the detector slit. If a 1D-detector is used, X-rays which are not in --condition do not fulfil the
focussing condition perfectly ((m) in fig. 9).
The diameter of the focusing circle changes with --rotation, the diameter of the measurement circle
remains constant. For optimal focusing, the sample should be a segment of the focusing circle. In
practice the sample surface is flat and hence an approximation to this ideal case. The approximation
becomes better when the focusing circle becomes larger in diameter (at smaller diffraction angles 2).
In this case the focusing condition is better fulfilled.
For smaller focusing circles there are deviations from the ideal focusing condition which can be seen
in measured peak profiles and shifts of the peak position (known as flat specimen errors). The
diffraction angle 2is the angle between the primary beam direction (b) and the diffracted beam
direction. The beam paths and conditions are shown in figures (9) and (10).

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DOC-M88-EXX141 V5 – 01.20154
Design of the diffractometer
The main component of the D2 PHASER diffractometer is the goniometer (fig. 12). Further essential
components are tube (c) with housing and mount, sample holder (d), detector with mount (e)
(LYNXEYE or scintillation counter) and primary and secondary optics components (slit systems). The
system is installed vertically in a radiation protection housing and meets all requirements for fully
protected X-ray systems, as written in the last valid german X-ray regulations (German Law
‘Röntgenverordnung’: Pattern approval as fully protected system according §8, Anlage 2 Nr. 3 RöV
and French radiation safety standard: AFNOR NFC 74-100).
When the user switches off the HV of the X-ray tube, the lock of the front door is released and can be
opened. The door and other safety relevant components are controlled by an electronic safety system
((f) in fig. 14 and (a) in fig. 16).
Danger!
Never bridge security switches and never make any changes of the security
protection system! This is strictly forbidden and dangerous!
Goniometer
The goniometer of the D2 PHASER (fig. 12) moves the X-ray source (c) and the detector (e)
simultaneously relative to the sample surface (d) with --geometry (sequence of movement is shown
in fig. 13). Tube and detector are mounted on two arms which move around the goniometer centre ((d)
in fig. 12).
The tube with its housing and primary slit system is fixed to the primary goniometer track. The detector
(LYNXEYE or scintillation detector) with slit system is mounted onto the secondary track.
The D2 PHASER diffractometer is designed for a measuring circle radius of 141,4mm. This design
guarantees best resolution with compact dimensions simultaneously.
X-ray tube
Sealed X-ray tubes ((a) in fig. 14) with line focus (12mm x 0,4mm), earthed anode and ceramic body
are used in D2 PHASER systems. They are energized with power of an X-ray generator ((g) in fig. 14
and (c) in fig. 16) which is installed in the back part of the system housing. X-ray diffraction tubes are
available with Cr, Co and Cu anode.
These X-ray tubes are available for D2 PHASER systems:
Ceramic X-ray tube KFL Cu–2K, 0,4mm x 12mm
Ceramic X-ray tube KFL Co–2K, 0,4mm x 12mm
Ceramic X-ray tube KFL Cr–2K, 0,4mm x 12mm
All tubes are working with 300W (30kV @ 10mA) with long lifetime. An emission angle of approx. 6°
reduces the projection of the focus to 1/10 of its width (40μm). This geometry guarantees high
intensity at high angular resolution. Radiation protection requires that the X-ray tube is mounted within
a housing. An electromechanically driven shutter is not used. HV can only be set when the front door
is closed and locked.
To avoid overheating of the tube, there is a thermomodule mounted (fig. 15) on the tube head. The
temperature (measured by NTC sensor) of the tube’s head is displayed in the tools of the
DIFFRAC.MEASUREMENT Suite. If the temperature increases in case of malfunction of the cooling
circuit, a warning message occurs. If the temperature increases further and exceeds an alarm limit, the
generator will be switched off at 68°C. If there is a failure in the NTC sensor or in its evaluation

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DOC-M88-EXX141 V5 – 01.2015 5
electronics and there is a further temperature increases over 68°C there is a thermofuse (fig. 143)
which will melt at 86°C (±5°C) and switch off the HV generator in order to protect the system by
overheating.
Please follow the instructions as follows if it is necessary to replace the tube with a new one or with
another anode type:
a) Move 2to angle 0°, close all programs, shut down the system, switch off the instrument when
the message appears on the screen ‘it is now safe to turn off the computer’ and remove the
mains plug!
b) Remove the 4 screws of the cover as shown in fig. 126 and 127.
c) Remove the 3 plugs from the plug connector panel (fig. 130).
d) Mount the 4 handles in the upper position of the housing (fig. 128) and lift the cover with the help
of a second person (fig. 129) (weight: 20kg!).
Warning!
Violent pressure to hand and fingers between cover and
bottom.
e) Put the cover to a safe place.
f) Locate the X-ray tube (c) (fig. 12) and (a) (fig. 14).
g) Remove the thermomodule (fig. 15) with the hexagon socket screw. Be careful and don’t violate or
break the connection cable!
h) Keep wipe and tissue ready! It is possible that cooling fluid leaks out during replacement of the
tube.
i) Loosen the large screws positioned diagonal in the edges of the cooling head of the X-ray tube.
j) Lift the tube very carefully and pay attention that no fluid spills into the tube housing (HV!) and the
instrument’s bottom housing. If some fluid is spilled, clean all parts completely, especially the
interior of the tube housing.
k) Check the correct position of the O-ring seals of the cooling fluid connection’s inlet and outlet.
Replace them if necessary.
l) Insert the new X-ray tube in correct position (position of pin!) carefully, press it down and mount it
with the two large screws. Fix it with moderate force.
m) Mount the thermomodule again.
n) Mount the instrument’s cover again with the help of a second person (fig. 129).
Caution!
Don’t violate or break any interface cable during attaching the
cover!
o) Fix the cover with the 4 screws again. Connect all 3 plugs again with the plug connector panel (fig.
130).
p) Plug in mains plug, connect to mains supply, switch on instrument, boot system, start programs
and set the 2-drive to a large angle (LYNXEYE: 145°).
q) Press hose carefully in direction (a) (fig. 131) in order to remove any air bubbles.
r) Refill cooling fluid as described in a later section of this manual.
Warning!
Never touch the tube’s exit windows with fingers or tools
(Beryllium is toxic!). Any partial damage on this thin window
layers might lead to non-repairable malfunctions of the tube.
If necessary change wavelength and anode type, respectively: Select ‘Type Number’ of tube in
‘configuration’ plugin (b in fig. 132), then press ‘apply’. Enter ‘element’ (a in fig. 132), then press ‘apply’.
Check that the fields c, d, e and f (fig. 132) are set to value ‘0.00000’. In this case the stored values of
the tube are used. For further details see software manuals.

User Manual D2 PHASER
DOC-M88-EXX141 V5 – 01.20156
Slit systems, slit and Soller modules and other passive optics
There are slit systems for the primary and secondary beam path. The primary slit system is able to
hold one slit module - the divergence slit module - and one axial Soller module. The secondary slit
system for 0D-detectors (scintillation counter and XFlash detector) is more complex and can hold the
antiscatter slit module, the secondary Soller module and the detector slit module.
There is an additional holder between the slit modules which can be used for absorber or filter
modules. The secondary slit system for 1D-detectors differs from that for 0D-detectors but it is also
possible to insert detector slit modules (detector window opening), absorber/filter modules and Soller
modules.
Slit and Soller modules (fig. 19 and 20) can be manually changed. The primary slit holder system (fig.
17) defines the divergence by the divergence slit module and the axial divergence by the Soller
module (fig. 18). The secondary slit system which is used for scintillation counters and XFlash
detectors (fig. 21 - 24) has positions for the antiscatter slit module ((a) in fig. 24), the detector slit
module ((d) in fig. 24), a position for an absorber or filter module ((c) in fig. 24) and a position ((b) in fig.
24) for an axial Soller module ((a), (b) in fig. 25). The secondary slit system for LYNXEYE-detectors
(fig. 27) has a position for a detector slit ((b) in fig. 28 and (b) in fig. 29), a position for an absorber or
filter module ((a), (b) in fig. 28 and (b) in fig. 29) and a position for an axial Soller module ((a) in fig. 27
and (a) in fig. 29).
Primary divergence slit systems
The slits in the modules are perpendicular to the measuring circle plane and parallel to the --axis.
The primary divergence slit module (fig. 18 and fig. 30) defines the sample area which is irradiated by
X-rays. The centre of the divergence slit is aligned to the connection line between the tube focus point
and the goniometer centre.
A Soller slit module ((a) and (b) in fig. 19) can be inserted under the cover of the pimary divergence slit
system (fig. 18). There are 1.5°, 2.5° and 4° Soller slit modules available. The primary Soller slit
module angle must fit with the secondary one.
The cover (fig. 30 and fig. 139) of the slit system reduces the X-ray background to a minimum and
shields the detector from parasitic radiation.
Secondary detector slit systems
All slit modules of the secondary slit systems are perpendicular to the measurement plane and parallel
to the goniometer centre axis as well. The secondary detector slit system for the LYNXEYE has three
positions for plug-in modules (fig. 28). Possible detector slit module positions are shown in fig. 28. The
slit defines the 2angular window range of the 1D-detector.
There are 2 options: leave this position empty if you need the complete 1D-range of the detector, or
insert a 3mm plug-in slit module for LYNXEYE antiscatter slit extension for low angle measurements.
Onother plug-in slit holder is designed for absorber and filter modules ((b) in fig. 28 and fig. 29). The
third position is designed to hold the Soller slit module ((a) in fig. 29). The Soller slit module for
LYNXEYE detetors reduces the axial divergence to 1.5°, 2.5° or 4°, respectively.
The cover of the slit system for 0D-detectors avoids that scattered radiation reaches the detector
window, thus background is reduced to a minimum by shielding the detector from parasitic radiation.
The centre of the antiscatter slit module ((a) in fig. 24) of the 0D-slit system is aligned to the
connection line of the goniometer centre and the detector slit centre ((d) in fig. 24). This line defines
the secondary beam path. Position (c) is for an additional filter or absorber module. Position (b) is
intended to be used for the secondary Soller module with divergences of 1.5°, 2.5° and 4°. Note:
primary and secondary Soller slit modules must have the same divergence angle.
Slit module
The slit width is marked in millimetres on the fixed slit unit ((a) in fig. 31). Each slit module has a mark

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DOC-M88-EXX141 V5 – 01.2015 7
(cut corner) which indicates the edge to which the slit edges are precisely adjusted ((b) in fig. 31).
Insert the slit modules in the orientation as shown in fig. 31 and fig. 33. The slit modules are fixed
magnetically (fig. 30) in the slit holder. Please insert the slit modules always in such a way that the cut
corner is positioned towards the magnets within the slit holder. The labeling has to be visible. The slit
module contacts the support pins, this guarantees that the slit is parallel to the goniometer axis.
Kfilter module
A Kfilter (for LYNXEYE fig. 32 and for 0D-scintillation detector (c) in fig. 24) should be used for
suppressing the characteristic Kradiation. Its position is in the slit module holder of the LYNXEYE ((a)
or (b) in fig. 34) or in the secondary slit system for the 0D-detector ((c) in fig. 24); for the XFlash
detector no Kfilter is necessary.The filter material depends on the type of characteristic radiation.
The following list shows the various filters for attenuating the Kline.
radiation
K
K-filter
material
Cu Ni
Cr V
Co Fe
Absorber module
One Cu absorber module may be inserted into its position of the secondary slit holder (scintillation
counter and XFlash detector: (b) in fig. 21 and (c) in fig. 24, LYNXEYE: (a) or (b) in fig. 28) for pulse
rate reduction at the detector during adjustment work with the direct beam. Detector counting rates for
scintillation counters and XFlash detectors should be not more than 1x105cps to 2x105cps at the
maximum to reduce counting losses and pile-up events. Fig. 38 shows the position of an absorber
module for LYNXEYE detectors.
There is another absorber module ((a) in fig. 30) which stops the primary beam in order to protect the
detector. This absorber module is mounted with two screws on the right hand side of the rotation
sample holder and can be removed for alignment purposes (reference determination). Caution: The
XFlash detector will be damaged if hit by the direct beam!
Soller slit module
Axial Soller slit modules (fig. 20) in primary (fig. 18) and secondary position ((d) in fig. 35) reduce the
divergence of the radiation in axial direction and improve the resolution. The angular size of the
primary Soller must fit with the secondary one to get optimum resolution. Construction of primary and
secondary Soller slit modules ((a) and (b) in fig. 25) are identical for 0D-detector systems (scintillation
counter and XFlash detector). These Soller slit modules differ from LYNXEYE Soller slit modules (fig.
36 and (a) in fig. 26). Insert this Soller slit module as shown in fig. 37.
Follow this procedure to change the primary Soller slit module. Locate the lid of the primary Soller slit
holder (fig. 136) and remove the 4 screws with a Torx screwdriver 08 x 60. Remove the Soller slit
module carefully (fig. 137). It is held by a spring loaded ball (fig. 137). Insert the new one carefully and
put the lid back again on the holder and fix it with the four screws.
Airscatter screen modules
The airscatter screen module (fig. 39 for standard rotation sample holder) has two edges with different
distances to the sample surface (fig. 44) with a < b. The airscatter screen modules for the sample

User Manual D2 PHASER
DOC-M88-EXX141 V5 – 01.20158
changer are very similar but they differ in detail, see fig. 140. The distance of the airscatter screen
module’s edge from the sample surface is 1mm and 3mm (for standard sample holder), respectively.
For the sample changer there a two airscatter screen modules, one with 1mm and 3mm and a second
one with 0.5mm and 2mm (fig. 140). Decide which setting you need for the measurement and insert
the airscatter screen module as shown in fig. 40. This module is held magnetically.
Sample holder
The sample holder and sample changer are factory aligned so that the goniometer centre coincides
with the surface of the sample and the surface must be parallel to the line which connects the two
wing axes. The sample holder is mounted with four screws ((a), (b), (c) and (d) in fig. 41). The sample
changer is fixed with screws (a) & (b) in fig. 138 and (c) & (d) in fig. 139.
Caution!
Do not loosen these screws because the sample holder’s alignment will become lost.
Fans provide the interior of the D2 PHASER with fresh cooling air from the environment. An
overpressure is created inside the instrument which is relieved through the ventilation slots. When the
front door is opened, air flows from the inside to the outside of the housing through the front door.
Warning!
If the user intends to insert or remove a powder sample through the front door, it is
possible that the powder is blown toward his face or body. Use only solidly
compressed powders and samples which cannot be blown away from the sample
holder. In case of doubt use a mask and work coat in order to protect your respiratory
tracts and your body with cloths. In addition follow the working and safety conditions
and laws concerning hazardous substances.
Sample Changer
The sample changer is factory aligned so that the goniometer centre coincides with the surface of the
sample and the surface must be parallel to the line which connects the two wing axes. The sample
holder is mounted with four screws (a), (b), (c) and (d) in fig. 138 & fig. 139.
Caution!
Do not loosen these screws because the sample holder’s alignment will become lost.
Fans provide the interior of the D2 PHASER with fresh cooling air from the environment. An
overpressure is created inside the instrument which is relieved through the ventilation slots. When the
front door is opened, air flows from the inside to the outside of the housing through the front door.
Warning!
If the user intends to insert or remove a powder sample through the front door, it is
possible that the powder is blown toward his face or body. Use only solidly
compressed powders and samples which cannot be blown away from the sample
holder. In case of doubt use a mask and work coat in order to protect your respiratory
tracts and your body with cloths. In addition follow the working and safety conditions
and laws concerning hazardous substances.
Detectors
Three detectors are available for the D2 PHASER system: two types of 0D-detectors (scintillation
counter or XFlash detector) or a 1D-linear LYNXEYE detector. Each detector is optimized to best
performance and X-ray sensitivity at lowest background for maximum measurement speed.

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Silicon strip detector LYNXEYE
The LYNXEYE is a 1-dimensional detector for X-ray powder diffraction, based on Bruker AXS
compound silicon strip technology (fig. 3, 28, 42, 43). Compared to a single point detector, the
LYNXEYE considerably increases measurement speed, without losses in resolution and peak shape
quality. D2 PHASER systems equipped with LYNXEYEs record typical powder patterns several times
faster (approx. factor of 100 to 150) than using a point detector like scintillation counter detectors with
identical data quality.
The LYNXEYE is based on the silicon strip detector technology. The 192 strips of the sensor work as
192 individual detectors which measure simultaneously. Most of these stripes are used. The
geometrical principle of the goniometer causes that sometimes some few sensor stripes at the border
of the chip cannot be active.
This technology allows operation at count rates much higher than those typically possible with
gaseous detectors while using all benefits. Together with innovative controller electronics, optimum
tuning of the silicon strip sensor to the requirements of the X-ray energy from 6keV to 15keV is
provided. The factory settings are optimized for Cu-K.
The LYNXEYE fits perfectly for D2 PHASER systems. There is no need for counting gas, cooling
water or liquid nitrogen, making the LYNXEYE a compact, robust and maintenance free detector.
XFlash detector
The XFlash is an energy dispersive semiconductor detector. The X-ray radiation emitted by the
sample is collected in the detector which works according to the drift chamber (SDD) principle. Within
the active volume of the detector, each X-ray quantum induces a local space charge which is
registered by an HV electrode and causes a charge burst proportional to the initial X-ray quantum
energy. This pulse is amplified and transferred to the digital signal processor. Its output signals are
collected as spectra and transferred to the measuring computer via the RS232-interface. The
semiconductor detector is cooled electro-thermally for noise minimization.
Due to its excellent energy resolution, the XFlash detector can be used as monochromator for XRD
measurements: By defining an energy range corresponding to the Ksignal, only X-ray energies
within this particular region of interest (ROI) will be used for the diffractogram while other wavelengths,
like fluorescence from the sample, will be excluded. This results in diffractograms with excellent
signal-to-noise ratio, usually only obtained by crystal monochromators or multilayer mirrors.
In addition, the XFlash allows for simple qualitative element analyses by means of energy dispersive
X-ray fluorescence analysis and hence expands the overall analytic perfomance of the D2 Phaser
beyond XRD purposes.

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Operation of the D2 PHASER
Transport and positioning of the instrument
The D2 PHASER has a weight of approx. 95kg and must be carried at least by 2 persons (fig. 90).
Mount the four handles into the lower threads of the instrument as shown in fig. 88 and fig. 93.
Transport the instrument with a trolly wherever possible (fig. 89). Avoid mechanical shocks during
transport so that the sensitive components are not damaged.
Set the instrument on a table which has a suitable capacity load (fig. 91 & 95). The floor and the
platform should be level. Check that cooling air can circulate without restrictions. A minimum of approx.
10 inch (25cm) from the wall or any other vertical surface is recommended (example fig. 95) (see also
introductory user manual). Avoid direct solar radiation. After transport remove the handles (fig. 92) and
insert the screw covers as shown in fig. 94.
Press on the drawer front (fig. 96), pull and open it (fig. 97). Take keyboard and mouse (fig. 98) and
put it to a suitable position (fig. 100) and close drawer again by pushing on its front (fig. 99).
Caution!
Violent pressure to hands and fingers! Take care and don’t violate or break the
cables of keyboard and mouse during closing the drawer.
Place the D2 PHASER in such a way that you sit directly in front of the display and the keyboard. The
TFT display should be at eye level or slightly lower. Tilt the TFT screen up or down (fig. 101 and fig.
102) to optain optimum view with minimum light reflection (fig. 103). Pay attention that your arm joint is
not twisted during working with the keyboard and mouse. There must be enough work space in order
to prop up the hands during working with the keyboard and mouse. Try to organize your work in such
a way that you do not have to work for a longer time with the keyboard and mouse. Hold your
forearms horizontally, the upper arms should be in casual position. Use a chair with backrest, and rest
the weight of your legs on the feet and not on the leading edge of the chair. For this purpose, fit the
height of the chair into the desired position or use a footrest if necessary.
Warning!
Working permanently or in wrong position with the keyboard and mouse can result
in health damage. Looking to the TFT display for a longer time can stress your eyes.
Switching on the instrument
Insert the generator key (fig. 104) and turn it to the right (fig. 105) (clockwise). Take the patch cable
(network cable) with grey connectors to connect D2 PHASER with LAN (fig. 106 and fig. 107) if
desired (see also introductory user manual). The cable with red connector is a twisted one for
connection with an external PC. Connect the power cord to mains supply (fig. 108) and switch on the
system (fig. 109). The boot process starts with four active LEDs (fig. 110) and it stops when the
operating system shows the logon screen (fig. 111).
Only the green LED (on) remains active (fig. 111). Enter password for administrator. The password is
‘password’ (without quotation mark). Note: for safety reasons please change password immediately.
Start measurement server and programs of the ‘DIFFRAC.Measurement Suite’ in the start menue of
the operating system.

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Switching off the instrument
Press ‘X-ray off’ button if X-rays are on. Close all programs. Shut down computer until the screen
displays the message ‘It is now safe to turn off your computer’ (fig. 112). The system can then be
switched off without risk. Avoid switching off the system with running operating system because this
can cause the same damages as known from standard PCs.
Warning and status lamps
There are four status LEDs on the left hand side of the instrument (fig. 110). After switching on the
instrument, all LEDs are active until the firmware is loaded. When the firmware is working properly and
no alarm is present, the ‘ready’, ‘alarm’ and ‘busy’ LEDs change to off status. When HV is switched on
(‘X-ray on’) with the measurement program, the ‘ready’ LED changes to ‘on’ status. This means that
HV and X-rays are on. After switching off the HV (‘X-ray off’), the filament heating of the tube remains
on and the ‘ready’ LED starts to blink.
The red LED lights up permanently if there are any instrument faults which lead to an alarm. In case of
warnings, the LED will blink. In either case please switch to the tools section in the
‘DIFFRAC.MEASUREMENT Suite’ and try to find out the reason.
For the time interval of a measurement, the ‘busy’ LED indicates that the instrument is busy with
measurement.
The long LED array on the upper front corner of the D2 PHASER ((a) in fig. 113) indicates that HV is
on (X-ray on). This array is bright and visible from a greater distance.
Operational controls and connection plugs
There are control keys at the lower side of the display (fig. 114) where contrast, brightness and other
display properties are adjustable. On the back side of the instrument there are 2 USB ports (a, b in fig.
115), an Ethernet network port (c) and the key switch (e) which enables/disables the HV.
The mains plug unit consists of the mains plug (f), the mains switch (h) and the socket for the fuse (g).
(c) is the minimum mark (fig. 79) of the cooling fluid. Control the fluid level each week. Maintenance
work is described in another chapter of this manual.
Front door of the instrument
The front door of the instrument contains the TFT display and works as radiation protection door. The
door is locked when HV is on and cannot be opened because the X-ray tube has no shutter. Only if
HV is off, the door lock is released.
Lift the knob on the lower side of the display (directions of arrow (a) in fig. 116 and fig. 117) in order to
open the door. If the door is locked and HV is on and the open knob is actuated as described before,
the door will only move a small amount in opening direction (approx. 4mm).
This status (4mm opened but locked door) is safe, no dangerous radiation will leave the instrument
because there is a radiation labyrinth around the door frame opening. It is not possible to switch off the
HV in this state because the door is not closed properly. Force down the door with both hands until it
is closed correctly, then switch off the HV.
Measurement with the D2 PHASER
Measurements with the D2 PHASER in Bragg-Brentano reflection geometry are very easy. There is a
standard setup which guarantees an optimum resolution at maximum intensity. A corundum sample
(Bruker AXS D2 PHASER standard) is included in delivery of each diffractometer. Measurement
results of this sample are suitable for checks of the diffractometers functionality, precision and
alignment.

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This table lists the most important reflections with line positions in 2for Cu radiation
(CuK1= 0.154060 nm). The certified reference material to be used is based on Bruker AXS’s inhouse
corundum standard reference material.
Reflection
(hkl)
Line position [°2]
Bragg-Brentano
(0 1 2) 25.559
(1 0 4) 35.129
(1 1 0) 37.762
(1 1 3) 43.337
(0 2 4) 52.534
(1 1 6) 57.477
(0 3 0) 68.198
(0 2 10) 88.967
(2 2 6) 95.233
(2 1 10) 101.046
(1 3 10) 127.659
(4 1 6) 136.075
(4 0 10) 145.154
There is a level for instrument verification which is called daily check. This performance verification
level covers the functionality of all relevant components of the diffraction system under investigation.
The daily check routine is a procedure to routinely check with the corundum standard that the
instrument is operating within specified limits.
For D2 PHASER systems with Cu-radiation, we recommend the following settings:
- Sample Bruker AXS’s corundum standard reference material
- Generator 30kV, 10mA
- Divergence slit 1.0mm (0.6°)
- Soller slit module primary: 2.5°, secondary: 2.5°
- Antiscatter screen no
- Filter Ni
- Receiving slit 0.2mm for scintillation counter systems
- LYNXEYE detector 5° detector opening and standard 0.5% Ni-filter
- Rotation 15rpm is recommended
Configuration and settings of primary section
The standard Soller slit module is 2.5°. Its position is in the primary slit holder system as shown in fig.
18. The 2.5° Soller slit module may be replaced with the 4° or 1.5° unit ((b) in fig. 19) if required. In this
case remove the cover of the primary slit holder system: Move 2to 60° and open cover of the
primary slit holder system by removing the screws ((d) fig. 6). Access to these screws is possible
through the front door.
Insert a primary slit module into the slit holder system as shown in fig. 33. Preferably use a 1mm slit
module ((d) in fig. 19) for high intensity and optimum resolution. Pay attention to insert it in the correct
orientation as shown in fig. 31, 33.
Configuration and settings of sample section
Prepare your sample into a suitable sample holder which is offered for D2 PHASER diffractometer
systems. A measurement with the Bruker AXS’s inhouse corundum standard reference sample is

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shown here as an example (corundum (c) in fig. 25 or in (a) of fig. 144 for sample changer). Move 2-
angle to 60° (sample exchange position), open the instrument’s door, pull down the spherical handle
of the sample holder lift ((b) in fig. 30), take the sample (fig. 4) and insert it into the sample position as
shown in fig. 5. Do not forget to lift the sample back to the measuring position again.
Filling up the magazine of the sample changer is different but also very easy. If the sample changer is
empty start with the sample positions which are easily accessible. Put the first sample (fig. 151) in
position n, n+1 and n+2 (fig. 152). Close the door and press ‘load sample’ # n+1. The sample changer
wheel rotates by 180° so that the remaining sample positions are now easily accessible. Open the
door again and insert samples into positions n-1, n-2 and n-3. The result is a full magazine (fig. 150).
The primary stop absorber unit should be mounted as shown in fig. 30 (a). Normally the scintillation
counters and LYNXEYE detectors are not damaged if they are exposed to the primary beam for
minutes or an hour but unintentional irradiation for days without primary stop absorber unit should be
avoided by all means. If the XFlash detector is exposed to the primary beam, it will be damaged!
Decide (see section ‘Airscatter screen module’) whether you need an airscatter screen (fig. 39 and fig.
44) for reduction of background. There are 2 possible positions or orientations ((a) and (b) in fig. 44)
which depend on the angle range of the measurement. The (b) edge has a smaller distance from the
sample surface and should be used for measurements at smaller angles whereas the (a) edge is
suitable for larger angles. The airscatter screen for the sample changer are different as shown in fig.
140.
Configuration and settings of secondary section
1.) 1D LYNXEYE detector
Insert a Soller module (fig. 37) which fits with the divergence of the primary Soller module. The
standard Soller module is 2.5° ((a) in fig. 26 and fig. 36). Insert Kfilter ((c) or (d) in fig. 26) if desired
for reduction of disturbing diffraction lines (position (a) in fig. 38 and (b) in fig. 34). There is a 3mm slit
module ((b) in fig. 26) for measurements at small angles. The angle range with the 3mm slit module is
1.3°. Insert this slit module in position (a) of the LYNXEYE detector slit system (fig. 34 and fig. 28).
2.) 0D detectors (scintillation counter or XFlash detector)
Insert an antiscatter slit module ((a) in fig. 21) which fits with the primary divergence slit module. Insert
a detector slit module ((c) in fig. 21). The 0.2mm slit module is the standard one. Use a 0.1mm slit
module for better resolution but with the disadvantage that the intensity decreases. Insert a Kfilter ((b)
in fig. 21) for reduction of disturbing diffraction K-lines if desired (none for XFlash detector). The
standard secondary Soller module must fit with divergence of the primary one. It is mounted under the
cover of the secondary slit holder system (position (b) in fig. 24). If desired, remove the cover of the
secondary slit holder system: Move 2to 60° and open cover of the secondary slit holder system by
removing the screws ((d) in fig. 21). Access to these screws is possible through the front door.
Start measurement with commander
Close the front door and switch on HV, set generator to 30kV and 10mA. If necessary, initialize 2
and/or phi motor drives. Check detector type (scintillation, LYNXEYE 0D or 1D mode) and detector
properties. Change detector window opening in [degrees] for 1D LYNXEYE mode or detector opening
in [mm] for 0D LYNXEYE mode if desired. Enter a value for sample rotation in rpm and press the ‘set’-
button to start rotation.
For ‘scan type’ select ‘locked coupled’, and for ‘scan mode’ either ‘continuous psd fast scan’ (only
LYNXEYE) or ‘step scan’. Enter ‘time’ per step or increment in [s]; typical times for LYNXEYE
detectors are 0.1s to 1s, depending on the type of sample, and several seconds (10s to 100s) for
scintillation counters. Measurement times with LYNXEYE detectors are a factor of approx. 100 to 150
faster than with scintillation counters at comparable data quality.
Parameters for a typical LYNXEYE (scintillation) measurement are:
- sample use corundum standard reference sample as an example

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- rotation 15rpm or 30rpm
- generator 30kV, 10mA
- detector LYNXEYE with 5° window opening (cf. fig. 59)
- scan type locked coupled
- scan mode continuous psd fast scan (only LYNXEYE)
- time 0.1s (10s)
- example range start 20°, increment 0.01°, stop 45°
Start measurement with joblist
Select ‘start jobs’ and click into the field ‘experiment name’ then ‘…’ appears and the ‘open file’
window appeares. Select a job file with extension ‘*.bsml’ and press OK. Move to ‘result file name’ and
enter a path and file name for the result file with extension ‘*.brml’. Enter other jobs in the same way
and press ‘start (x) jobs’. After the 1st job has started, the measurement is shown in realtime in the
diagram field of the DIFFRAC.MEASUREMENT.SUITE ‘commander’.
Start element analyses with the program SPECTRA
A D2 PHASER which is equipped with an XFlash detector additionally allows easy qualitative element
analyses: The XFlash detector can detect elements with excitation energies up to 20keV and hence
provides valuable information on the composition of a sample which, for instance, make qualitative
phase analyses more simple and straightforward. Detectability depends on the element and its
concentration in the sample. Best results can be archieved for elements with excitation energies below
that of the K-line of the tube’s anode material. Elements below 3keV cannot be detected due to
absorption of X-rays in air.
In order to meaure a spectrum, insert the sample into the sample holder and appropriate slits into the
primary and secondary beam slit modules ((a) and (b) in fig. 8), close the door and switch on HV. Start
the program SPECTRA to measure a spectrum either
in parallel to a diffractogram
This method is intended for time-saving measurements. As 2increases, Laue peaks from
the diffractive measurement can enter the spectrum of X-ray fluorescence but will cover a
wide energy range, resulting in somewhat higher background. Exceptional strong Laue peaks,
however, might cause broad peak-like artefacts in the spectrum, usually not corresponding to
any element. For inhomogeneous samples, relative peak intensities can vary as the area of
the sample hit by the initial X-ray beam will decreases with increasing 2-angle.
at fixed 2-position
This method is intended for precise measurements of fluorescence spectra at low background.
With the DIFFRAC.SUITE tools, set 2to a fixed value above ≈45°, aside any diffractive peak.
In this case, the detector receiving slit can be removed in order to increase statistics of the
spectrum or reduce measuring time.
The measurement can be set in advance to stop automatically by Menu
 Measurement  Method,
or manually at any time.
Spectra of samples can be saved and evaluated. For qualitative element analyses, spectral lines can
be identified automatically or manually by Menu
 Analyze  Periodic Table. With Menu  Analyze
 Evaluation SPECTRA calculates important parameters of spectral lines, like net intensities, in the
tab Results. This can be used to compare concentrations of a given element in a sample or, in
combination with appropriate standards, to estimate its concentration.
For detailed information on the SPECTRA software, please refer to the SPECTRA User Manual