Murata GRM32ER71J106KA12 Series User manual

GRM32ER71J106KA12_ (1210, X7R:EIA, 10uF, DC63V)
_: packaging code Reference Sheet
1.Scope
2.MURATA Part NO. System
(Ex.)
3. Type & Dimensions
(Unit:mm)
4.Rated value
5.Package
Product specifications in this catalog are as of Mar.4,2016,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
(3) Temperature Characteristics
(Public STD Code):X7R(EIA)
g
0.3 min.
(5) Nominal
Capacitance
mark
(4)
Rated
Voltage
Packaging Unit
DC 63 V
Temp. Range
(Ref.Temp.)
(8) Packaging
-15 to 15 %
-55 to 125 °C
(25 °C)
1.0 min.
(1)-1 L
3.2±0.3
(1)-2 W
2.5±0.2
This product specification is applied to Chip Monolithic Ceramic Capacitor used for General Electronic equipment.
(2) T
e
Chip Monolithic Ceramic Capacitor for General
Specifications and Test
Methods
(Operating
Temp. Range)
Temp. coeff
or Cap. Change
±10 %
(6)
Capacitance
Tolerance
10 uF
2.5±0.2
-55 to 125 °C
L
f180mm Reel
EMBOSSED W8P4
1000 pcs./Reel
K
f330mm Reel
EMBOSSED W8P4
4000 pcs./Reel
(1)L/W
Dimensions
(2)T
Dimensions
(3)Temperature
Characteristics
(4)Rated
Voltage
(5)Nominal
Capacitance
(6)Capacitance
Tolerance
(8)Packaging
Code

Control Code
GRM 32 ER7 1J 106 K A12 L
GRM32ER71J106KA12-01 1

Temperature
Compensating Type
High Dielectric
Constant Type
1 Rated Voltage Shown in Rated value. The rated voltage is defined as the maximum voltage
which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage,
VP-P or VO-P, whichever is larger, should be maintained
within the rated voltage range.
2 Appearance No defects or abnormalities. Visual inspection.
3 Dimension Within the specified dimensions. Using calipers. (GRM02 size is based on Microscope)
4 Voltage proof No defects or abnormalities. Measurement Point : Between the terminations
Test Voltage : 300% of the rated voltage
(Temperature compensating type)
250% of the rated voltage
(High dielectric constant type)
Applied Time : 1s to 5 s
Charge/discharge current : 50mA max.
5 Insulation Resistance(I.R.)
C≦ Measurement Point : Between the terminations
C＞ Measurement Voltage : DC Rated Voltage
C:Nominal Capacitance Charging Time : 2 min
Charge/discharge current : 50mA max.
Measurement Temperature : Room Temperature
6 Capacitance Shown in Rated value. Measurement Temperature : Room Temperature
(1)Temperature Compensating Type
7 Q or Dissipation Factor (D.F.)
30pF and over:Q≧1000 W.V.:100Vdc :0.025max.(C<0.068µF)
30pF and below:Q≧400+20C :0.05max.(C≧0.068µF)
C:Nominal Capacitance(pF) W.V.:63/50/35/25Vdc :0.025max.
W.V.:16/10Vdc :0.035max. (2)High Dielectric Constant Type
W.V.:6.3/4Vdc :0.05max.(C<3.3µF)
:0.1max. (C≧3.3µF)
8
Temperature No bias Nominal values of the B1,B3 : Within +/-10% The capacitance change should be measured after 5 min
Characteristics temperature coefficient is
(-25°C to +85°C) at each specified temp. stage.
of Capacitance
shown in Rated value. R1,R7 : Within +/-15% In case of applying voltage, the capacitance change should be
(-55°C to +125°C) measured after 1 min with applying voltage in equilibration of
But,the Capacitance Change R6 : Within +/-15% each temp. stage.
under 20℃is shown (-55°C to +85°C) Capacitance value as a reference is the value in step 3.
in Table A. C7 : Within +/-22%
(-55°C to +125°C) (1)Temperature Compensating Type
C8 : Within +/-22% The capacitance drift is calculated by dividing the differences
Capacitance Drift *
(-55°C to +105°C) between the maximum and minimum measured values in the
Within +/-0.2% or +/-0.05pF L8 : Within +/-15% step 1,3 and 5 by the cap. value in step 3.
(Whichever is larger.)
(-55°C to +125°C)
*Not apply to 1X/25V : Within +15/-40%
(+125°C to +150°C)
50% of - B1 : Within +10/-30% (2)High Dielectric Constant Type
the rated R1 : Within +15/-40% Measurement Voltage :
voltage GRM32ER71J106 only : 0.1+/-0.03Vrms
GRM188B31C475 only : 0.2+/-0.05Vrms
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
9 Adhesive Strength No removal of the terminations or other defect Solder the capacitor on the test substrate shown in Fig.3.
of Termination should occur.
Holding Time : 10+/-1s
Applied Direction : In parallel with the test substrate and vertical with
the capacitor side.
No
Item
Specification
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
■Specifications and Test Methods
Type Applied Force(N)
GRM02 1
GRM03 2
GRM15/GRM18 5
GRM21/GRM31/GRM32 10
These Part Numbers are designed for use in the circuits where
continuous applied voltage to the capacitor is derated than rated
voltage, and guarantee DurabilityTest with 100% × rated voltage
as testing voltage at the maximum operating temperature.
The voltage and temperature derating conditions on the leftare
recommended for use to ensure the same reliabilitylevel as
normal specification.
Step
Temperature(C)
1
Reference Temp.+/-2
2
Min. Operating Temp.+/-3
3
Reference Temp.+/-2
4
Max. Operating Temp.+/-3
5
Reference Temp.+/-2
Step
Temperature(C)
Applying Voltage(VDC)
1
Reference Temp.+/-2
No bias
2
Min.Operating Temp.+/-3
3
Reference Temp.+/-2
4
Max.Operating Temp.+/-3
5
Reference Temp.+/-2
50% of
the rated voltage
(For B1,R1)
6
Min.Operating Temp.+/-3
7
Reference Temp.+/-2
8
Max.Operating Temp.+/-3
Capacitance
Frequency
Voltage
C≦
1.0+/-0.1kHz
1.0+/-0.2Vrms
C＞
120+/-24Hz
0.5+/-0.1Vrms
Capacitance
Frequency
Voltage
C≦1000pF
1.0+/-0.1MHz
0.5 to 5.0Vrms
C＞1000pF
1.0+/-0.1kHz
1.0+/-0.2Vrms
JEMCGS-00795E 2

Temperature
Compensating Type
High Dielectric
Constant Type
10 Vibration  Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.
Capacitance Within the specified initial value.
Q or D.F. Within the specified initial value. Kind of Vibration : A simple harmonic motion
10Hz to 55Hz to 10Hz (1min)
Total amplitude : 1.5mm
This motion should be applied for a period of 2h in each 3 mutually
perpendicular directions(total of 6h).
11 Substrate Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.1.
Bending test
Capacitance Within +/-5% or +/-0.5pF Within +/-10%
Change (Whichever is larger) Pressurization method : Shown in Fig.2
Flexure : 1mm
Holding Time : 5+/-1s
Soldering Method : Reflow soldering
12 Solderability 95% of the terminations is to be soldered evenly and continuously. Test Method : Solder bath method
Flux Solution of rojin ethanol 25(wt)%
Preheat :
80℃to 120℃for 10s to 30s
Solder : Sn-3.0Ag-0.5Cu
Solder Temp. :
245+/-5℃
Immersion time :
2+/-0.5s
13
Resistance to Appearance No defects or abnormalities. <GRM03 size min.>
Soldering Heat Capacitance Within +/-2.5% or +/- 0.25pF Within +/-7.5% Test Method : Solder bath method
Change (Whichever is larger) Solder : Sn-3.0Ag-0.5Cu
Solder Temp. :
270+/-5℃
Q or D.F. Within the specified initial value.
Immersion time :
10+/-0.5s
Exposure Time : 24+/-2h
I.R. Within the specified initial value. Preheat :
GRM31 size max.: 120℃to 150℃for 1 min
GRM32 size : 100℃to 120℃for 1 min
Voltage proof No defects.
and 170℃to 200℃for 1 min
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
<GRM02 size only>
Test Method : Reflow soldering (hot plate)
Solder : Sn-3.0Ag-0.5Cu
Solder Temp. :
270+/-5℃
Reflow Time : 10+/-0.5s
Test Substrate : Glass epoxy PCB
Exposure Time : 24+/-2h
Preheat :
120℃to 150℃for 1 min
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
14
Temperature Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.
Sudden Change Capacitance Within +/-2.5% or+/- 0.25pF Within +/-7.5%
Change (Whichever is larger) Perform the five cycles according to the four heat treatments
shown in the following table.
Q or D.F. Within the specified initial value.
I.R. Within the specified initial value.
Voltage proof No defects.
Exposure Time : 24+/-2h
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
Item
Specification
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
No
Type Applied Force(N)
GRM02 1
GRM03 2
GRM15/GRM18 5
GRM21/GRM31/GRM32 10
These Part Numbers are designed for use in the circuits where
continuous applied voltage to the capacitor is derated than rated
voltage, and guarantee DurabilityTest with 100% × rated voltage
as testing voltage at the maximum operating temperature.
The voltage and temperature derating conditions on the leftare
recommended for use to ensure the same reliabilitylevel as
normal specification.
Step
Temp.(C)
Time (min)
1
Min.Operating Temp.+0/-3
30+/-3
2
Room Temp.
2 to 3
3
Max.Operating Temp.+3/-0
30+/-3
4
Room Temp
2 to 3
JEMCGS-00795E 3

Temperature
Compensating Type
High Dielectric
Constant Type
15
High Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.
Temperature
High Humidity Capacitance Within +/-7.5% or +/-0.75pF Within +/-12.5%
Test Temperature :
40+/-2℃
(Steady) Change (Whichever is larger)
Test Humidity :
90%RH to 95%RH
Test Time :
500+/-12h
Q or D.F. 30pF and over:Q≧200 W.V.:100Vdc :0.05max.(C<0.068µF) Applied Voltage : DC Rated Voltage
30pF and below
:0.075max.(C≧0.068µF)
Charge/discharge current : 50mA max.
:Q≧100+10C/3 W.V.:50/35/25Vdc :0.05max.
Exposure Time :
24+/-2h
W.V.:16/10Vdc :0.05max.
C:Nominal Capacitance(pF) W.V.:6.3/4Vdc :0.075max.(C<3.3µF)
:0.125max.(C≧3.3µF)
I.R. 
16 Durability Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3.
Capacitance Within +/-3% or +/-0.3pF Within +/-12.5% Test Temperature : Max. Operating Temp. +/-3℃
Change (Whichever is larger)
Test Time :
1000+/-12h
Applied Voltage : 100% of the rated voltage
Q or D.F. 30pF and over:Q≧350 W.V.:100Vdc :0.05max.(C<0.068µF) Charge/discharge current : 50mA max.
10pF and over
:0.075max.(C≧0.068µF)
Exposure Time : 24+/-2h
30pF and below W.V.:50/35/25Vdc :0.05max.
: Q≧275+5C/2 W.V.:16/10Vdc :0.05max. ･Initial measurement for high dielectric constant type
10pF and below W.V.:6.3/4Vdc :0.075max.(C<3.3µF) Apply 100% of the rated DC voltage at the max. operating
: Q≧200+10C :0.125max.(C≧3.3µF) temp. +/-3°C for 1h and then let sit for 24+/-2h at room temperature,
then measure.
C:Nominal Capacitance (pF)
I.R. 
Recommended derating conditions on voltage and temperature
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
No
Item
Specification
Type Applied Force(N)
GRM02 1
GRM03 2
GRM15/GRM18 5
GRM21/GRM31/GRM32 10
These Part Numbers are designed for use in the circuits where
continuous applied voltage to the capacitor is derated than rated
voltage, and guarantee DurabilityTest with 100% × rated voltage
as testing voltage at the maximum operating temperature.
The voltage and temperature derating conditions on the leftare
recommended for use to ensure the same reliabilitylevel as
normal specification.
Table A
Char.
Capacitance Change from 20C (%)
-55℃
-25℃
-10℃
Max.
Min.
Max.
Min.
Max.
Min.
2C/0C
0.82
-0.45
0.49
-0.27
0.33
-0.18
3C
1.37
-0.90
0.82
-0.54
0.55
-0.36
4C
2.56
-1.88
1.54
-1.13
1.02
-0.75
2P
-
-
1.32
0.41
0.88
0.27
3P
-
-
1.65
0.14
1.10
0.09
4P
-
-
2.36
-0.45
1.57
-0.30
2R
-
-
1.70
0.72
1.13
0.48
3R
-
-
2.03
0.45
1.35
0.30
4R
-
-
2.74
-0.14
1.83
-0.09
2S
-
-
2.30
1.22
1.54
0.81
3S
-
-
2.63
0.95
1.76
0.63
4S
-
-
3.35
0.36
2.23
0.24
2T
-
-
3.07
1.85
2.05
1.23
3T
-
-
3.40
1.58
2.27
1.05
4T
-
-
4.12
0.99
2.74
0.66
3U
-
-
4.94
2.84
3.29
1.89
4U
-
-
5.65
2.25
3.77
1.50
1X
-
-
-
-
-
-
JEMCGS-00795E 4

Substrate Bending test
・Test substrate
Material : Copper-clad laminated sheets for PCBs
(Glass fabric base, epoxy resin)
Thickness : 1.6mm (GRM02/GRM03/GRM15: t:0.8mm)
Copper foil thickness : 0.035mm
: Solder resist
(Coat with heat resistant resin for solder)
Fig.1 (in mm)
・Test substrate
Kind of Solder : Sn-3.0Ag-0.5Cu
・Test substrate
Pressurization method
Fig.2 (in mm)
Adhesive Strength of Termination, Vibration, Temperature Sudden Change, Resistance to Soldering Heat (Reflow method)
High Temperature High Humidity(Steady) , Durability
・Test substrate
Material : Copper-clad laminated sheets for PCBs
(Glass fabric base, epoxy resin)
Thickness : 1.6mm or 0.8mm
Copper foil thickness : 0.035mm
・Test substrate
Kind of Solder : Sn-3.0Ag-0.5Cu
・Test substrate
Land Dimensions
Fig.3
Type Applied Force(N)
GRM02 1
GRM03 2
GRM15/GRM18 5
GRM21/GRM31/GRM32 10
These Part Numbers are designed for use in the circuits where
continuous applied voltage to the capacitor is derated than rated
voltage, and guarantee DurabilityTest with 100% × rated voltage
as testing voltage at the maximum operating temperature.
The voltage and temperature derating conditions on the leftare
recommended for use to ensure the same reliabilitylevel as
normal specification.
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
100
40
a
c
b
Land
f4.5
c
Type
Dimension (mm)
a
b
c
GRM02
0.2
0.56
0.23
GRM03
0.3
0.9
0.3
GRM15
0.4
1.5
0.5
GRM18
1.0
3.0
1.2
GRM21
1.2
4.0
1.65
GRM31
2.2
5.0
2.0
GRM32
2.2
5.0
2.9
Type
Dimension (mm)
a
b
c
GRM02
0.2
0.56
0.23
GRM03
0.3
0.9
0.3
GRM15
0.4
1.5
0.5
GRM18
1.0
3.0
1.2
GRM21
1.2
4.0
1.65
GRM31
2.2
5.0
2.0
GRM32
2.2
5.0
2.9
c
b
a
Solder Resist
Chip Capacitor
Land
45
45
Flexure
Capacitance meter
Pressurization
speed
1.0mm/s
Support
Capacitor
Pressurize
45
45
R5
20
50 min.
JEMCGS-00795E 5

1.Tape Carrier Packaging(Packaging Code:D/E/W/L/J/F/K)
1.1 Minimum Quantity(pcs./reel)
3
5
1.2 Dimensions of Tape
(1)GRM01/02 (W4P1 CODE:L) (in:mm)
1
*3 Nominal value
10000(W8P2)
50000(W8P2)
4000
4000
GRM55
GRM43
F
E
S
M
GRM32
GRM31
GRM21
GRM15
5(LW Dimensions Tolerance:±0.2
and T Dimensions:0.5 +0/-0.1)
5(LWT Dimensions Tolerance:±0.1min.)
5(LWT Dimensions Tolerance:±0.05)
N
C
R/D/E
GRM01
GRM02
2
3/X
5 (LW Dimensions Tolerance:±0.1min.
and T Dimensions Tolerance:±0.05)
GRM03
2
GRM18
6
9
A/B
6/9
M/X
10000(W8P2)
10000(W8P2)
10000(W8P2)
4000
M
N/R/D
4000
50000(W4P1)
E
N/C/R/D
C
9
A/M
Package
GRM Type
15000(W8P2)
20000(W8P2)
10000(W8P2)
10000(W8P2)
Paper Tape
Plastic Tape
Paper Tape
Plastic Tape
4000
30000(W8P1)
20000(W8P1)
40000(W4P1)
3000
2000
3000
3000
300
50000(W8P2)
50000(W8P2)
50000(W8P2)
50000(W8P2)
2000
2000
1000
1000
10000
10000
500
1000
1000
500
1000
500
3000
10000
10000
40000(W8P2)
50000(W8P2)
10000
10000
1500
Code:D/E
Code:W
Code:L
Code:J/ F
Code:K
8000
6000
4000
10000
10000
6000
10000
L


Type
1500
5000
4000
5000
4000
2000
W
T
t
0.145
0.27
0.4 max.
0.2±0.02
0.2±0.02
0.23
0.43
0.125±0.013
0.125±0.013
0.4±0.05
0.25±0.013
Type
0.2±0.05
0.2±0.05
0.26
GRM02
GRM01
2
0.4±0.02
15000(W8P2)
50000(W8P2)
0.5 max.
0.46
Dimensions(Chip)
A *3
B *3
t
2.0±0.04
＊2
＊1
φ0.8±0.04
0.9±0.05
4.0±0.05
1.8±0.02
＊1,2：1.0±0.02
0.05以下
Ａ
Ｂ
0.15～0.4
*1,2：1.0±0.02
2.0±0.04
*1
0.9±0.05
4.0±0.05
1.8±0.02
Ａ
Ｂ
t
*2
0.05 max.
φ0.8±0.04
0.15～0.25
JEMCGP-01796E 6

(2)GRM03/15(W8P2 CODE:D/E/J/F)
(in:mm)
L W
T
2 0.2 +0.02/-0.04
0.3±0.03 0.5 max.
0.6±0.05 0.3±0.05 0.3±0.05 0.39 0.69
0.3±0.09 0.6 max.
5 0.5±0.05
2 0.2 +0.02/-0.04
X 0.25±0.05
1.0±0.2 0.5±0.2 0.78 1.29
1.0±0.05 0.5±0.05 0.5±0.05
1.0±0.07 0.5±0.07 0.5±0.07
1.0±0.1 0.5±0.1 0.5±0.1 0.70 1.20
1.0±0.15 0.5±0.15 0.5±0.15 0.72 1.25
0.5 +0/-0.1
0.5±0.2
0.5±0.05 *3 Nominal value
(3)GRM033/155(W8P1 CODE:W) (in:mm)
L W
T
0.6±0.03 0.3±0.03 0.3±0.03 0.37 0.67
0.6±0.05 0.3±0.05 0.3±0.05 0.39 0.69
0.6±0.09 0.3±0.09 0.3±0.09 0.44 0.74 0.6 max.
GRM15 5 1.0±0.05 0.5±0.05 0.5±0.05 0.65 1.15 0.8 max.
*3 Nominal value
0.5 max.
Dimensions(Chip)
A *3
B *3
t
1.0±0.2
0.5±0.2
0.65
0.78
1.15
1.29
0.74
0.8 max.
0.5±0.05
0.3±0.03
0.65
1.15
Type
Dimensions(Chip)
0.6±0.03
GRM03
3
0.6±0.09
0.3±0.03
0.3±0.09
Package
GRM Type
A *3
B *3
t
0.37
5
0.67
GRM03
3
GRM15
3
1.0±0.05
Type
0.44
*1,2：2.0±0.05
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
4.0±0.1
*1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
Ａ
Ｂ
t
*2
0.05 max.
1.0±0.05
4.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
Ａ
Ｂ
t
1.0±0.05
JEMCGP-01796E 7

(4)GRM18/21/31/32 (in:mm)
<Paper Tape> <Plastic Tape>
L W
T
1.6±0.1 0.8±0.1 1.05±0.10 1.85±0.10
50.5±0.05
6 0.6 +0/-0.1
7 0.7±0.1
1.6±0.1 0.8±0.1 0.8±0.1
8 1.6±0.15 0.8±0.15 0.8±0.15
1.6±0.2 0.8±0.2 0.8±0.2 1.10±0.10 2.00±0.10
0.6±0.1
0.6 +0/-0.15
0.85±0.05
0.85±0.1
0.85 +0.15/-0.1
0.85 +0/-0.2
2.0±0.15 1.25±0.15
0.85 +0.15/-0.05 1.50±0.20 2.30±0.20
2.0±0.1 1.25±0.1 1.0 +0/-0.2 1.45±0.20 2.25±0.20
2.0±0.2 1.25±0.2 1.0±0.2 1.50±0.20 2.30±0.20
2.0±0.1 1.25±0.1 1.25±0.1 1.45±0.20 2.25±0.20
B 2.0±0.15 1.25±0.15 1.25±0.15
2.0±0.2 1.25±0.2 1.25±0.2
6 0.6±0.1
3.2±0.2 1.6±0.2
B 1.25±0.1
1.15±0.1
1.15±0.15
X 1.2±0.1
1.6±0.2
3.2±0.3 1.6±0.3 1.6±0.3 2.10±0.20 3.60±0.20
9 0.85 +0.15/-0.05 2.80±0.20 3.60±0.20 1.15 max.
Paper Tape
A 1.0 +0/-0.2
M 1.15±0.1
N 1.35±0.15
C 1.6±0.2
R 1.8±0.2
D 2.0±0.2
E 2.5±0.2 3.7 max.
Dimensions
of Tape
Package
GRM Type
1.15 max.
2.0±0.1
2.0±0.2
1.25±0.1
0.85±0.1
1.7 max.
Plastic Tape
A
Type
Dimensions(Chip)
A
B
t
1.6±0.2
Plastic Tape
2.5 max.
3.0 max.
M
C
2.5 max.
3.2±0.3
1.6±0.15
1.6±0.2
2.5±0.2
GRM32
2.80±0.20
3.50±0.20
1.7 max.
GRM31
2.00±0.20
3.60±0.20
1.15 max.
0.85±0.1
1.6±0.15
Paper Tape
9
1.90±0.20
3.50±0.20
1.7 max.
Plastic Tape
2.0 max.
1.50±0.20
2.30±0.20
3.2±0.15
3.2±0.15
3.2±0.2
GRM21
6
1.55±0.15
2.30±0.15
9
Paper Tape
1.05±0.10
1.85±0.10
1.25±0.2
0.8±0.2
0.8 max.
0.5 +0/-0.1
GRM18
1.10±0.10
2.00±0.10
4.0±0.1
4.0±0.1
2.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
t
Ａ
Ｂ
8.0±0.3
4.0±0.1
3.5±0.05
1.75±0.1
Ａ
Ｂ
t
2.0±0.1
φ1.5
+0.1
-0
4.0±0.1
0.25±0.1(T≦2.0mm)
0.3±0.1(T：2.5mm)
JEMCGP-01796E 8

(5)GRM43/55 (in:mm)
L W
T
M 1.15±0.1
N 1.35±0.15
R 1.8±0.2
D 2.0±0.2
E 2.5±0.2
S 2.8±0.2 4.7 max.
M 1.15±0.1
N 1.35±0.15
C 1.6±0.2
R 1.8±0.2
D 2.0±0.2
E 2.5±0.2
F 3.2±0.2 4.7 max.
*1 Nominal value
t
3.7 max.
4.5±0.4
3.2±0.3
5.7±0.4
5.0±0.4
GRM55
5.2
6.1
2.5 max.
3.7 max.
Package
GRM Type
GRM43
3.6
4.9
2.5 max.
Type
Dimensions(Chip)
A *1
B *1
φ1.5
+0.1
-0
4.0±0.1
8.0±0.1
φ1.5
+0.2
-0
12.0±0.3
5.5±0.1
1.75±0.1
Ａ
*
2.0±0.1
4.0±0.1
Ｂ
t
*：2.0±0.1
0.3±0.1
JEMCGP-01796E 9

Package
GRM Type
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)

ｗ1
W
Top Tape : Thickness 0.06
Feeding Hole :As specified in 1.2.
Hole for Chip : As specified in 1.2.
Base Tape : As specified in 1.2.
Bottom Tape :Thickness 0.05
(Only a bottom tape existence )
W
w1
GRM01/02
8.0 max.
5±1.5
GRM03/15/18/21/31/32
16.5 max.
10±1.5
GRM43/55
20.5 max.
14±1.5
-3.0

 min.

2.0±0.5
Chip
(in:mm)
Fig.1 Package Chips
Fig.2 Dimensions of Reel
Fig.3 Taping Diagram
JEMCGP-01796E 10

1.3 Tapes for capacitors are wound clockwise shown in Fig.3.
(The sprocket holes are to the right as the tape is pulled toward the user.)
1.4 Part of the leader and part of the vacant section are attached as follows.
(in:mm)
1.5 Accumulate pitch : 10 of sprocket holes pitch = 20±0.3mm(GRM01/02)
40±0.3mm(GRM03 min.)
1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.
1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.
1.8 There are no jointing for top tape and bottom tape.
1.9 There are no fuzz in the cavity.
1.10 Break down force of top tape : 5N min.
Break down force of bottom tape : 5N min. (Only a bottom tape existence )
1.11 Reel is made by resin and appeaser and dimension is shown in Fig 2.
There are possibly to change the material and dimension due to some impairment.
1.12 Peeling off force : 0.1N to 0.6N*in the direction as shown below.
* GRM01/02/03:0.05N～0.5N
1.13 Label that show the customer parts number, our parts number, our company name, inspection
number and quantity, will be put in outside of reel.
Package
GRM Type
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
Tail vacant Section
Chip-mounting Unit
Leader vacant Section
Leader Unit
(Top Tape only)
Direction
of Feed
160 min.
190 min.
210 min.
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
165～180°
Top tape
JEMCGP-01796E 11

Caution
■Limitation of Applications
Please contact us before using our products for the applications listed below which require especially high reliability
for the prevention of defects which might directly cause damage to the third party's life, body or property.
①Aircraft equipment ②Aerospace equipment ③Undersea equipment ④Power plant control equipment
⑤Medical equipment ⑥Transportation equipment(vehicles,trains,ships,etc.) ⑦Traffic signal equipment
⑧Disaster prevention / crime prevention equipment ⑨Data-processing equipment
⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.
■Storage and Operation condition
1. The performance of chip monolithic ceramic capacitors may be affected by the storage conditions.
1-1. Store the capacitors in the following conditions:
Room Temperature of +5℃to +40℃and a Relative Humidity of 20% to 70%.
(1) Sunlight, dust, rapid temperature changes, corrosive gas atmosphere, or high temperature and humidity
conditions during storage may affect solderability and packaging performance.
Therefore, please maintain the storage temperature and humidity. Use the product within six months,
as prolonged storage may cause oxidation of the terminations (outer electrodes).
(2) Please confirm solderability before using after six months.
Store the capacitors without opening the original bag.
Even if the storage period is short, do not exceed the specified atmospheric conditions.
1-2. Corrosive gas can react with the termination (external) electrodes or lead wires of capacitors, and result
in poor solderability. Do not store the capacitors in an atmosphere consisting of corrosive gas (e.g.,hydrogen
sulfide, sulfur dioxide, chlorine, ammonia gas etc.).
1-3. Due to moisture condensation caused by rapid humidity changes, or the photochemical change caused
by direct sunlight on the terminal electrodes and/or the resin/epoxy coatings, the solderability and
electrical performance may deteriorate. Do not store capacitors under direct sunlight or in high huimidity
conditions
■Rating
1.Temperature Dependent Characteristics
1. The electrical characteristics of the capacitor can change with temperature.
1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature
changes. The following actions are recommended in order to ensure suitable capacitance values.
(1) Select a suitable capacitance for the operating temperature range.
(2) The capacitance may change within the rated temperature.
When you use a high dielectric constant type capacitor in a circuit that needs a tight (narrow) capacitance
tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and
carefully confirm the various characteristics in actual use conditions and the actual system.
[Example of Temperature Caracteristics X7R(R7)] [Example of Temperature Characteristics X5R(R6)]

!
-20
-10
-15
-5
5
0
10
15
20
Temperature (C)
-75 -50 -25 025 50 75 100 125 150
Capacitance Change(%)
-20
-10
-15
-5
5
0
10
15
20
Temperature (C)
-75 -50 -25 025 50 75 100
Capacitance Change(%)
JEMCGC-2701X 12

2.Measurement of Capacitance
1. Measure capacitance with the voltage and frequency specified in the product specifications.
1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.
Please confirm whether a prescribed measured voltage is impressed to the capacitor.
1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.
Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.
3.Applied Voltage
1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.
1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.
(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.
When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.
(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.
Typical Voltage Applied to the DC capacitor
DC Voltage DC Voltage+AC AC Voltage Pulse Voltage
(E：Maximum possible applied voltage.)
1-2. Influence of over voltage
Over voltage that is applied to the capacitor may result in an electrical short circuit caused by the breakdown
of the internal dielectric layers .
The time duration until breakdown depends on the applied voltage and the ambient temperature.
4.Type of Applied Voltage and Self-heating Temperature
1.Confirm the operating conditions to make sure that no large current is flowing into the capacitor due to the
continuous application of an AC voltage or pulse voltage.
When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current
or pulse current will flow into the capacitor; therefore check the self-heating condition.
Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits
of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is
used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.
<Applicable to Rated Voltage of less than 100VDC>
1-1. The load should be contained to the level
such that when measuring at atmospheric
temperature of 25°C, the product's self-heating
remains below 20°C and the surface
temperature of the capacitor in the actual circuit
remains within the maximum operating
temperature.
Caution
!
1
10
100
0123
Current (Ar.m.s.) 456
Temperature Rise (C)
[Example of Temperature Rise (Heat Generation) in Chip
Monolithic Ceramic Capacitors in Contrast to Ripple Current]
Sample: R(R1) characteristics 10 Rated voltage: DC10V
Ripple Current
100kHz
500kHz
1MHz
E
E
E
E
0
0
0
0
JEMCGC-2701X 13

5. DC Voltage and AC Voltage Characteristic
1. The capacitance value of a high dielectric constant type
capacitor changes depending on the DC voltage applied.
Please consider the DC voltage characteristics when a
capacitor is selected for use in a DC circuit.
1-1. The capacitance of ceramic capacitors may change
sharply depending on the applied voltage. (See figure)
Please confirm the following in order to secure the
capacitance.
(1) Determine whether the capacitance change caused
by the applied voltage is within the allowed range .
(2) In the DC voltage characteristics, the rate of
capacitance change becomes larger as voltage
increases, even if the applied voltage is below
the rated voltage. When a high dielectric constant
type capacitor is used in a circuit that requires a
tight (narrow) capacitance tolerance (e.g., a time
constant circuit), please carefully consider the
voltage characteristics, and confirm the various
characteristics in the actual operating conditions
of the system.
2. The capacitance values of high dielectric
constant type capacitors changes depending
on the AC voltage applied.
Please consider the AC voltage characteristics
when selecting a capacitor to be used in a
AC circuit.
6. Capacitance Aging
[Example of Change Over Time (Aging characteristics) ]
1. The high dielectric constant type capacitors
have an Aging characteristic in which the capacitance
value decreases with the passage of time.
When you use a high dielectric constant type
capacitors in a circuit that needs a tight (narrow)
capacitance tolerance (e.g., a time-constant circuit),
please carefully consider the characteristics
of these capacitors, such as their aging, voltage,
and temperature characteristics. In addition,
check capacitors using your actual appliances
at the intended environment and operating conditions.
7.Vibration and Shock
1. Please confirm the kind of vibration and/or shock, its condition, and any generation of resonance.
Please mount the capacitor so as not to generate resonance, and do not allow any impact on the terminals.
2. Mechanical shock due to being dropped may cause damage or
a crack in the dielectric material of the capacitor.
Do not use a dropped capacitor because the quality and reliability
may be deteriorated.
3. When printed circuit boards are piled up or handled, the corner
of another printed circuit board
should not be allowed to hit the capacitor in order to avoid
a crack or other damage to the capacitor.
Caution
-100
-80
-60
-40
-20
0
20
010 20 30
DC Voltage (V) 40 50
[Example of DC Voltage Characteristics]
Sample: X7R(R7) Characteristics 
Capacitance Change (%)
00.5 1
AC Voltage (Vr.m.s.) 1.5 2
[Example of AC Voltage Characteristics]
Sample: X7R(R7) Characteristics 
Capacitance Change (%)
30
20
10
0
-10
-20
-30
-40
-50
-60
Floor
Crack
Mounting printed circuit board
Crack
!
20
10
0
-10
-20
-30
-40
10
100
1000
10000
Time(h)
Capacitance Change(%)
C0G(5C)
X7R(R7)
X5R(R6)
JEMCGC-2701X 14

■Soldering and Mounting
1.Mounting Position
1. Confirm the best mounting position and direction that minimizes the stress imposed on the capacitor during flexing
or bending the printed circuit board.
1-1.Choose a mounting position that minimizes the stress imposed on the chip during flexing or bending of the board.
[Component Direction]
Locate chip horizontal to the
direction in which stress acts.
(Bad Example) (Good Example)
[Chip Mounting Close to Board Separation Point]
It is effective to implement the following measures, to reduce stress in separating the board.
It is best to implement all of the following three measures; however, implement as many measures as possible
to reduce stress.
Stress Level
(1) Turn the mounting direction of the component parallel to the board separation surface.
A > D *1
(2) Add slits in the board separation part.
A > B
(3) Keep the mounting position of the component away from the board separation surface.
A > C
*1 A > D is valid when stress is added vertically to the perforation as with Hand Separation.
If a Cutting Disc is used, stress will be diagonal to the PCB, therefore A > D is invalid.
[Mounting Capacitors Near Screw Holes]
When a capacitor is mounted near a screw hole, it may be affected by the board deflection that occurs during
the tightening of the screw. Mount the capacitor in a position as far away from the screw holes as possible.
2.Information before Mounting
1. Do not re-use capacitors that were removed from the equipment.
2. Confirm capacitance characteristics under actual applied voltage.
3. Confirm the mechanical stress under actual process and equipment use.
4. Confirm the rated capacitance, rated voltage and other electrical characteristics before assembly.
5. Prior to use, confirm the solderability of capacitors that were in long-term storage.
6. Prior to measuring capacitance, carry out a heat treatment for capacitors that were in long-term storage.
7.The use of Sn-Zn based solder will deteriorate the reliability of the MLCC.
Please contact our sales representative or product engineers on the use of Sn-Zn based solder in advance.
Caution
Contents of Measures
Screw Hole Recommended
!
①
②
③
1C
1B
1A
Perforation
Slit
A
B
C
D
①
1A
JEMCGC-2701X 15

3.Maintenance of the Mounting (pick and place) Machine
1. Make sure that the following excessive forces are not applied to the capacitors.
1-1. In mounting the capacitors on the printed circuit board, any bending force against them shall be kept
to a minimum to prevent them from any damage or cracking. Please take into account the following precautions
and recommendations for use in your process.
(1) Adjust the lowest position of the pickup nozzle so as not to bend the printed circuit board.
(2) Adjust the nozzle pressure within a static load of 1N to 3N during mounting.
[Incorrect]
[Correct]
2.Dirt particles and dust accumulated between the suction nozzle and the cylinder inner wall prevent
the nozzle from moving smoothly. This imposes greater force upon the chip during mounting,
causing cracked chips. Also, the locating claw, when worn out, imposes uneven forces on the chip
when positioning, causing cracked chips. The suction nozzle and the locating claw must be maintained,
checked and replaced periodically.
Caution
!
Board Guide
Board
Suction Nozzle
Deflection
Support Pin
JEMCGC-2701X 16

4-1.Reflow Soldering
1. When sudden heat is applied to the components, the [Standard Conditions for Reflow Soldering]
mechanical strength of the components will decrease
because a sudden temperature change causes
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both the components and the PCB.
Preheating conditions are shown in table 1. It is required to
keep the temperature differential between the solder and

2. Solderability of tin plating termination chips might be
deteriorated when a low temperature soldering profile where
the peak solder temperature is below the melting point of
tin is used. Please confirm the solderability of tin plated
termination chips before use.
3. When components are immersed in solvent after mounting,

between the component and the solvent within the range [Allowable Reflow Soldering Temperature and Time]
shown in the table 1.
Table 1
Series
GRM
GRM
In the case of repeated soldering, the accumulated
Recommended Conditions
soldering time must be within the range shown above.
Lead Free Solder: Sn-3.0Ag-0.5Cu
4. Optimum Solder Amount for Reflow Soldering
4-1. Overly thick application of solder paste results in a excessive solder fillet height.
This makes the chip more susceptible to mechanical and thermal stress on the board and may cause the chips to crack.
4-2. Too little solder paste results in a lack of adhesive strength on the termination, which may result in chips breaking loose
from the PCB.
4-3. Please confirm that solder has been applied smoothly to the termination.
Make sure not to impose any abnormal mechanical shocks to the PCB.
Inverting the PCB
240 to 260℃
Chip Dimension(L/W) Code
01/02/03/15/18/21/31
32/43/55
≦190℃
Caution
Lead Free Solder
Peak Temperature
Air or N2
Atmosphere
≦130℃
Temperature Differential
!
Temperature(℃)
PeakTemperature
Soldering
Gradual
Cooling
Preheating
ΔT
60-120seconds
30-60 seconds
Time
190℃
170℃
150℃
220℃
SolderingTemperature(℃)
Soldering Time(s)
280
270
260
250
240
230
220
0
30
60
120
90
JEMCGC-2701X 17

4-2.Flow Soldering
1. Do not apply flow soldering to chips not listed in Table 2.
[Standard Conditions for Flow Soldering]
Table 2
Series
GRM
2. When sudden heat is applied to the components, the
mechanical strength of the components will decrease
because a sudden temperature change causes
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both of the components and the PCB.
Preheating conditions are shown in table 2. It is required to
[Allowable Flow Soldering Temperature and Time]
keep the temperature differential between the solder and

3. Excessively long soldering time or high soldering
temperature can result in leaching of the terminations,
causing poor adhesion or a reduction in capacitance value
due to loss of contact between the inner electrodes and terminations.
4. When components are immersed in solvent after mounting,

between the component and solvent within the range
shown in the table 2. In the case of repeated soldering, the accumulated
soldering time must be within the range shown above.
Recommended Conditions
Lead Free Solder: Sn-3.0Ag-0.5Cu
5. Optimum Solder Amount for Flow Soldering
5-1. The top of the solder fillet should be lower than the
thickness of the components. If the solder amount is
excessive, the risk of cracking is higher during
board bending or any other stressful condition.
Temperature Differential
Caution
Lead Free Solder
Preheating Peak Temperature
Soldering Peak Temperature
Chip Dimension(L/W) Code
18/21/31
≦150℃
Atmosphere
100 to 120℃
250 to 260℃
Air or N2
!
Soldering mperature(℃)
SolderingTime(s)
280
270
260
250
240
230
220
0
10
20
40
30
Temperature(℃)
Soldering
Peak
Temperature
Preheating
Peak
Temperature
30-90 seconds
Preheating
5 seconds max.
Time
Gradual
Cooling
Soldering
ΔT
Up to ChipThickness
Adhesive
in section
JEMCGC-2701X 18

4-3.Correction of Soldered Portion
When sudden heat is applied to the capacitor, distortion caused by the large temperature difference occurs internally,
and can be the cause of cracks. Capacitors also tend to be affected by mechanical and thermal stress depending
on the board preheating temperature or the soldering fillet shape, and can be the cause of cracks.
Please refer to "1. PCB Design" or "3. Optimum solder amount" for the solder amount and the fillet shapes.
1. Correction with a Soldering Iron
1-1. In order to reduce damage to the capacitor, be sure to preheat the capacitor and the mounting board.
Preheat to the temperature range shown in Table 3. A hot plate, hot air type preheater, etc. can be used for preheating.
1-2. After soldering, do not allow the component/PCB to cool down rapidly.
1-3. Perform the corrections with a soldering iron as quickly as possible. If the soldering iron is applied too long,
there is a possibility of causing solder leaching on the terminal electrodes, which will cause deterioration of the
adhesive strength and other problems.
Table 3
Lead Free Solder: Sn-3.0Ag-0.5Cu

2. Correction with Spot Heater
Compared to local heating with a soldering iron, hot air heating by a spot heater heats the overall component
and board, therefore, it tends to lessen the thermal shock. In the case of a high density mounted board,
a spot heater can also prevent concerns of the soldering iron making direct contact with the component.
2-1. If the distance from the hot air outlet of the spot heater to the component is too close, cracks may occur due to
thermal shock. To prevent this problem, follow the conditions shown in Table 4.
2-2. In order to create an appropriate solder fillet shape, it is recommended that hot air be applied at the angle shown
in Figure 1.
Table 4
Distance 5mm or more
Hot Air Application angle 45° *Figure 1
Hot Air Temperature Nozzle Outlet 400°C max.
Less than 10 seconds
Application Time (3216M / 1206 size or smaller)
Less than 30 seconds
(3225M / 1210 size or larger) (3216M , 3225M : Metric size code)
3. Optimum solder amount when re-working with a soldering iron
3-1. If the solder amount is excessive, the risk of cracking is higher
during board bending or any other stressful condition.
Too little solder amount results in a lack of adhesive strength
on the termination, which may result in chips breaking
loose from the PCB.
Please confirm that solder has been applied smoothly is in section
and rising to the end surface of the chip.
3-2. A soldering iron with a tip of ø3mm or smaller should be used.
It is also necessary to keep the soldering iron from touching
the components during the re-work.
3-3. Solder wire with ø0.5mm or smaller is required for soldering.
Atmosphere
350℃max.
150℃min.
≦190℃
Air
Air
150℃min.
280℃max.
≦130℃
Chip Dimension
(L/W) Code
Temperature of
Soldering Iron Tip
Series
GRM
GRM
03/15/18/21/31
Caution
32/43/55
Preheating
Temperature
Temperature

!
One-hole Nozzle
an Angle of 45
[Figure 1]
SolderAmount
JEMCGC-2701X 19

5.Washing
Excessive ultrasonic oscillation during cleaning can cause the PCBs to resonate, resulting in cracked chips
or broken solder joints. Take note not to vibrate PCBs.
6.Electrical Test on Printed Circuit Board
1. Confirm position of the support pin or specific jig, when inspecting the electrical performance of a
capacitor after mounting on the printed circuit board.
1-1. Avoid bending the printed circuit board by the pressure of a test-probe, etc.
The thrusting force of the test probe can flex the PCB, resulting in cracked chips or open solder
joints. Provide support pins on the back side of the PCB to prevent warping or flexing.
Install support pins as close to the test-probe as possible.
1-2. Avoid vibration of the board by shock when a test -probe contacts a printed circuit board.
[Not Recommended] [Recommended]
7.Printed Circuit Board Cropping
1. After mounting a capacitor on a printed circuit board, do not apply any stress to the capacitor that
caused bending or twisting the board.
1-1. In cropping the board, the stress as shown may cause the capacitor to crack.
Cracked capacitors may cause deterioration of the insulation resistance, and result in a short.
Avoid this type of stress to a capacitor.
[Bending] [Twisting]
2. Check the cropping method for the printed circuit board in advance.
2-1. Printed circuit board cropping shall be carried out by using a jig or an apparatus (Disc separator, router
type separator, etc.) to prevent the mechanical stress that can occur to the board.
* When a board separation jig or disc separator is used, if the following precautions are not observed,
a large board deflection stress will occur and the capacitors may crack.
Use router type separator if at all possible.
Board Separation Method
Hand Separation
Nipper Separation
(1) Board Separation Jig
Board Separation Apparatus
2) Disc Separator
3) Router Type Separator
Low
Level of stress on board
×
△*
△*
◯
Notes
Hand and nipper
separation apply a high
level of stress.
Use another method.
· Board handling
· Board bending direction
· Layout of capacitors
· Board handling
· Layout of slits
· Design of V groove
· Arrangement of blades
· Controlling blade life
Board handling
Recommended
Caution
High
Medium
Medium
!
Peeling
Test-probe
Support Pin
Test-probe
①
1A
JEMCGC-2701X 20