Murata GRT32ER61E226ME13 Series User manual

GRT32ER61E226ME13_ (1210, X5R:EIA, 22uF, DC25V)
_: packaging code Reference Sheet
1.Scope
2.MURATA Part NO. System
(Ex.)
3. Type & Dimensions
(Unit:mm)
4.Rated value
5.Package
Product specifications in this catalog are as of May.10,2017,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
(3) Temperature Characteristics
(Public STD Code):X5R(EIA)
g
0.3 min.
(5) Nominal
Capacitance
mark
(4)
Rated
Voltage
Packaging Unit
DC 25 V
Temp. Range
(Ref.Temp.)
(8) Packaging
-15 to 15 %
-55 to 85 °C
(25 °C)
1.0 min.
(1)-1 L
3.2±0.3
(1)-2 W
2.5±0.2
This product specification is applied to Chip Monolithic Ceramic Capacitor used for Car Multimedia, Car Interior, Car Comfort application and General Electronic
equipment.
Please contact us when using this product for any other applications than described in the above.
Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.).
(2) T
e
Chip Monolithic Ceramic Capacitor meet AEC-Q200 for Infotainment
Specifications and Test
Methods
(Operating
Temp. Range)
Temp. coeff
or Cap. Change
±20 %
(6)
Capacitance
Tolerance
22 uF
2.5±0.2
-55 to 85 °C
L
f180mm Reel
EMBOSSED W8P4
1000 pcs./Reel
K
f330mm Reel
EMBOSSED W8P4
4000 pcs./Reel
(1)L/W
Dimensions (2)T
Dimensions (3)Temperature
Characteristics (4)Rated
Voltage (5)Nominal
Capacitance (6)Capacitance
Tolerance (8)Packaging Code
(7)Murata’s Control
Code
GRT 32 ER6 1E 226 M E13 L
GRT32ER61E226ME13-01 1

Pre-and Post-Stress 
Electrical Test
2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board).
Exposure (Storage) specifications in the following table.
Set the capacitor for 1000±12h at maximum operating temperature ±3℃.
Appearance No marking defects Set for 24±2h at room temperature, then measure.
Capacitance R6, C8: Within ±12.5%
Change
Dissipation R6, C8: 0.2 max.
Factor
Insulation
More than 500MΩ or 25Ω ∙F (Whichever is smaller)
Resistance
3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board).
specifications in the following table. Perform the 1000 cycles test according to the four heat treatments
Appearance No marking defects in the following table.
Set for 24±2h at room temperature, then measure.
Capacitance R6, C8: Within ±12.5%
Change
Dissipation R6, C8: 0.2 max.
Factor
・Initial measurement
Insulation Within the specified initial value.
Perform a heat treatment at 150+0/-10 ℃for 1h and then set
Resistance for 24±2h at room temperature.
Perform the initial measurement.
4 Destructive No defects or abnormalities Per EIA-469
Physical Analysis
5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board).
specifications in the following table.
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
Appearance No marking defects
at 85±3℃and 80 to 85% humidity for 1000±12h.
Remove and set for 24±2h at room temperature, then measure.
Capacitance R6,C8: Within ±12.5%
The charge/discharge current is less than 50mA.
Change
Dissipation R6,C8: 0.2 max
・Measurement after test
Factor
Perform a heat treatment at 150+0/–10°C for 1h and then let
sit for 24±2h at room temperature, then measure.
Insulation
More than 100MΩ or 5Ω ∙F (Whichever is smaller)
Resistance
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
AEC-Q200 Test Method
1
-
Step
1
2
3
4
Temp.
(C)
-55+0/-3
Room
Temp.
85 +3/-0 (For R6)
105+3/-0 (For C8)
Room
Temp.
Time
(min.)
153
1
153
1
JEMCGS-02088H 2

6 Operational Life The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board).
specifications in the following table. Apply 100% of the rated voltage for 1000±12h at maximum operating
Appearance No marking defects
temperature ±3℃. Set for 24±2h at room temperature, then measure.
The charge/discharge current is less than 50mA.
Capacitance R6,C8: Within ±12.5%
Change
・Initial measurement
Dissipation R6,C8: 0.2max
Perform a heat treatment at 150+0/-10℃for 1h and then set
Factor for 24±2h at room temperature.
Perform the initial measurement.
・Measurement after test
Insulation
More than 100MΩ or 5Ω ∙F (Whichever is smaller) Perform a heat treatment at 150+0/–10°C for 1h and then let
Resistance
sit for 24±2h at room temperature, then measure.
7 External Visual No defects or abnormalities Visual inspection
8 Physical Dimension Within the specified dimensions Using Measuring instrument of dimension.
9 Resistance to Appearance No marking defects
Per MIL-STD-202 Method 215
Solvents Solvent 1 : 1 part (by volume) of isopropyl alcohol
Capacitance Within the specified tolerance 3 parts (by volume) of mineral spirits
Solvent 2 : Terpene defluxer
Solvent 3 : 42 parts (by volume) of water
Dissipation Within the specified initial value.
1 part (by volume) of propylene glycol monomethyl ether
Factor
1 part (by volume) of monoethanolamine
Insulation Within the specified initial value.
Resistance
10 Mechanical Appearance No marking defects Solder the capacitor on the test substrate(glass epoxy board).
Shock
Three shocks in each direction should be applied along 3 mutually
Capacitance Within the specified tolerance
perpendicular axes of the test specimen (18 shocks).
The specified test pulse should be Half-sine and should have a
Dissipation Within the specified initial value.
duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.
Factor
Insulation Within the specified initial value.
Resistance
11 Vibration Appearance No defects or abnormalities Solder the capacitor on the test substrate(glass epoxy board).
The capacitor should be subjected to a simple harmonic motion having
Capacitance Within the specified tolerance
a total amplitude of 1.5mm, the frequency being varied uniformly between
the approximate limits of 10 and 2000Hz. The frequency range, from
Dissipation Within the specified initial value. 10 to 2000Hz and return to 10Hz, should be traversed in
Factor approximately 20min. This motion should be applied for 12
items in each 3 mutually perpendicular directions (total of 36 times).
Insulation Within the specified initial value.
Resistance
12 Resistance to The measured and observed characteristics should satisfy the Immerse the capacitor in Sn-3.0Ag-0.5Cu solder solution or an eutectic
Soldering Heat specifications in the following table.
solder solution at 260±5℃for 10±1s.
Appearance No marking defects
Set at room temperature for 24±2h, then measure.
Capacitance Within the specified tolerance
・Initial measurement
Perform a heat treatment at 150+0/-10 ℃for 1h and then set
Dissipation Within the specified initial value.
for 24±2h at room temperature.
Factor Perform the initial measurement.
Insulation Within the specified initial value.
Resistance
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
AEC-Q200 Test Method
JEMCGS-02088H 3

13 Thermal Shock The measured and observed characteristics shall satisfy the Solder the capacitor on the test substrate(glass epoxy board).
specifications in the following table.
Perform the 300 cycles according to the two heat treatments listed
Appearance No marking defects
in the following table(Maximum transfer time is 20s).
Set for 24+/-2h at room temperature, then measure.
Capacitance R6,C8: Within ±12.5%
Change
Dissipation Within the specified initial value.
Factor
Insulation Within the specified initial value.
・Initial measurement
Resistance
Perform a heat treatment at 150+0/-10 for 1h and then set
for 24±2h at room temperature.
Perform the initial measurement.
14 ESD Appearance No marking defects
Per AEC-Q200-002
Voltage setting level : 2kV
Capacitance Within the specified tolerance
Dissipation Within the specified initial value.
Factor
Insulation Within the specified initial value.
Resistance
15 Solderability
(a) Preheat at 155℃for 4h. After preheating, immerse the capacitor
in a solution of ethanol(JIS-K-8101) and rosin (JIS-K-5902)
(25% rosin in mass proportion).
Immerse in Sn-3.0Ag-0.5Cu solder solution at 245+/-5℃or
an eutectic solder solution at 235+/-5℃for 5+0/-0.5s.
(b) should be placed into steam aging for 8h+/-15min.
After preheating, immerse the capacitor in a solution of ethanol
(JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in mass
proportion). Immerse in Sn-3.0Ag-0.5Cu solder solution at 245+/-5℃
or an eutectic solder solution at 235+/-5℃for 5+0/-0.5s.
(c) should be placed into steam aging for 8h+/-15min.
After preheating, immerse the capacitor in a solution of ethanol
(JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in mass
proportion). Immerse in Sn-3.0Ag-0.5Cu solder solution or
an eutectic solder solution for 120+/-5s at 260+/-5℃.
16 Electrical Appearance No defects or abnormalities Visual inspection.
Chatacteri-
zation Capacitance Within the specified tolerance
The capacitance/Q/D.F. should be measured at 25℃at the
frequency and voltage shown in the table.
Dissipation R6.C8 :0.125max
Factor
Insulation More than 1000MΩ or 50Ω ∙ F (Whichever is smaller) The insulation resistance should be measured with a DC voltage not
Resistance
exceeding the rated voltage at 25℃and maximumoperating temperature※
25℃within 1min of charging.
Insulation More than 100MΩ or 5Ω ∙ F (Whichever is smaller)
Resistance
※85+3/-0℃(For R6), 105+3/-0℃(For C8)
85℃(For R6)
105℃(For C8)
Dielectric No failure No failure should be observed when 250% of the rated voltage is
Strength applied between the terminations for 1 to 5s, provided the
charge/ discharge current is less than 50mA.
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
AEC-Q200 Test Method
95% of the terminations is to be soldered evenly and continuously.
Step
1
2
Temp.
(℃)
-55+0/-3
105+3/-0 (For C8)
85+3/-0 (For R6)
Time
(min.)
15±3
15±3
Char.
Item
R6,C8
6.3V max.
(C≦10F)
R6,C8
10V min.
(C≦10F)
R6,C8
(10F< C)
Frequency
10.1kHz
10.1kHz
12024Hz
Voltage
0.50.1Vrms
10.2Vrms
0.50.1Vrms
JEMCGS-02088H 4

17 Board Flex Appearance No marking defects
Solder the capacitor on the test substrate(glass epoxy board)
shown in Fig1.
Then apply a force in the direction shown in Fig 2 for 5±1s
Capacitance Within specified tolerance
The soldering should be done by the reflow method and should be
conducted with care so that the soldering is uniform and free of defects
such as heat shock.
Dissipation Within the specified initial value.
Factor
Insulation Within the specified initial value.
Resistance
(in mm)
Fig.2
18 Terminal Appearance No marking defects
Solder the capacitor on the test substrate(glass epoxy board)
Strength
shown in Fig3.
Capacitance Within specified tolerance Then apply 18N* force in parallel with the test jig for 60s.
The soldering should be done either with an iron or using the reflow
Dissipation Within the specified initial value. method and should be conducted with care so that the soldering is
Factor uniform and free of defects such as heat shock
Insulation Within the specified initial value.
Resistance
（in mm）
19 Beam Load Test Destruction value should be exceed following one. Place the capacitor in the beam load fixture as Fig 4.
< Chip L dimension : 2.5mm max. > Apply a force.
< Chip Length : 2.5mm max. >
< Chip L dimension : 3.2mm min. >
< Chip Length : 3.2mm min. >
Speed supplied the Stress Load : *0.5mm / s
*GRT03: 0.1mm/s
Chip thickness ≧1.25mm rank : 54.5N
Chip thickness > 0.5mm rank : 20N
Chip thickness = 0.5mm rank : 8N
Chip thickness = 0.3mm rank : 5N
Chip thickness < 0.3mm rank : 2.5N
Chip thickness < 1.25mm rank : 15N
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
AEC-Q200 Test Method
t : 1.6mm
(GRT03,15:0.8mm)
Fig.3
Fig.4
*2N(GRT03,15)
t : 1.6mm
(GRT03,15:0.8mm)
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
100
40
a
c
b
C
Fig.1
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
a
a
c
b
ﾗﾝﾄﾞ
f4.5
c
Solder resist
Baked electrode
or copper foil
b
Iron Board
L
0.6L
Type
a
b
c
GRT03
0.3
0.9
0.3
GRT15
0.5
1.5
0.6
GRT18
0.6
2.2
0.9
GRT21
0.8
3.0
1.3
GRT31
2.0
4.4
1.7
GRT32
2.0
4.4
2.6
Type
a
b
c
GRT03
0.3
0.9
0.3
GRT15
0.4
1.5
0.5
GRT18
1.0
3.0
1.2
GRT21
1.2
4.0
1.65
GRT31
2.2
5.0
2.0
GRT32
2.2
5.0
2.9
45
45
Flexure：≦2
(Chip thickness＞0.85mm rank
High Dielectric Type)
Flexure：≦1
(Chip thickness≦0.85mm rank
High Dielectric Type)
Capacitance meter
Pressurization
speed
1.0mm/s
Support
Capacitor
Pressurize
45
45
20
50
R4
20
50 min.
JEMCGS-02088H 5

20 Capacitance Temperature R6 : Within ±15% The capacitance change should be measured after 5min at
Characteristics (-55℃to +85℃) each specified temperature stage.
Capacitance value as a reference is the value in step 3.
C8 : Within ±22%
(-55℃to +105℃)
・Initial measurement
Perform a heat treatment at 150+0/-10℃for one hour
and then set for 24±2 hours at room temperature.
Perform the initial measurement.
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
AEC-Q200 Test Method
Step
Temperature(C)
1
Reference Temp.+/-2
2
Min. Operating Temp.+/-3
3
Reference Temp.+/-2
4
Max. Operating Temp.+/-3
5
Reference Temp.+/-2
JEMCGS-02088H 6

1.Tape Carrier Packaging(Packaging Code:D/E/W/F/L/J/K)
1.1 Minimum Quantity(pcs./reel)
GRT03
GRT18
1.2 Dimensions of Tape
(1)GRT03/15(Paper Tape W8P2 Code:D/E/J/F) (in mm)
2
*3 Nominal value
1.0±0.2
0.5±0.2
0.5±0.2
0.78
1.29
1.0±0.15
0.5±0.15
0.5±0.15
0.72
1.25
1.0±0.1
0.5±0.1
0.5±0.1
0.70
1.20
5
0.5±0.05
GRT15
1.0±0.05
0.5±0.05
0.2 +0.02/-0.04
0.65
1.15
0.8 max.
0.6±0.05
0.3±0.05
0.3±0.05
0.39
0.69
0.37
0.67
0.5 max.
GRT03
3
0.6±0.03
0.3±0.03
0.3±0.03
Type
Dimensions Tolerance(Chip)
A *3
B *3
t
L
W
T
8000
D/E
1000
4000
GRT32
N
2000
10000
C
2000
6000
4000
10000
M
3000
10000
GRT31
6
4000
10000
9
9
4000
10000
GRT21
6
4000
10000
B
3000
4000
10000
5(LWTDimensions
Tolerance:±0.1min.)
10000(W8P2)
40000(W8P2)
5(LWTDimensions
Tolerance:±0.05)
10000(W8P2)
20000(W8P1)
50000(W8P2)
GRT15
2
20000(W8P2)
50000(W8P2)
15000(W8P2)
30000(W8P1)
50000(W8P2)
Code:K
Paper Tape
Plastic Tape
Paper Tape
Plastic Tape
Package
GRT Type
Type
φ180mm reel
φ330mm reel
Code:D/E
Code:W
Code:L
Code:J/F
*1,2：2.0±0.05
＊2
4.0±0.1
8.0±0.3
3.5±0.05
0.05以下
＊1
φ1.5
+0.1
-0
Ａ
t
*1,2：2.0±0.05
1.75±0.1
Ｂ
4.0±0.1
*1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
Ａ
Ｂ
t
*2
0.05 max.
JEMCGP-01742H 7

(2)GRT03/15Paper Tape W8P1 Code:W) (in mm)
L
W T
0.6±0.03 0.3±0.03 0.3±0.03 0.37 0.67
0.6±0.05 0.3±0.05 0.3±0.05 0.39 0.69
GRT15 5 1.0±0.05 0.5±0.05 0.5±0.05 0.65 1.15 0.8 max.
(3)GRT18/21/31/32(Paper Tape) (in mm)
L
W T
1.6±0.1 0.8±0.1 0.8±0.1
1.6±0.15 0.8±0.15 0.8±0.15
1.6±0.2 0.8±0.2 0.8±0.2 1.10±0.10 2.00±0.10
0.6±0.1
0.6+0/-0.15
0.85±0.1
0.85+0/-0.2
2.0±0.15 1.25±0.15 0.85±0.1
6 0.6±0.1
3.2±0.2 1.6±0.2
9
0.85±0.1
1.6±0.15
2.00±0.20
3.60±0.20
9
GRT21
6
2.0±0.1
1.25±0.1
1.55±0.15
GRT18
8
1.05±0.10
1.85±0.10
1.1 max.
2.30±0.15
GRT31
3.2±0.15
GRT03
3
0.5 max.
Type
Dimensions Tolerance(Chip)
A
B
t
Package
GRT Type
Type
Dimensions Tolerance(Chip)
A
B
t
4.0±0.1
4.0±0.1
2.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
t
Ａ
Ｂ
1.0±0.05
4.0±0.1
φ1.5
+0.1
-0
1.75±0.1
8.0±0.3
3.5±0.05
Ａ
Ｂ
t
1.0±0.05
JEMCGP-01742H 8

(4)GRT21/31/32(Plastic Tape) (in mm)
L
W T
2.0±0.1 1.25±0.1 1.25±0.1 1.45±0.20 2.25±0.20 1.7 max.
2.0±0.15 1.25±0.15 1.25±0.15
2.0±0.2 1.25±0.2 1.25±0.2
3.2±0.15 1.6±0.15 1.15±0.1
1.15±0.15
C 1.6±0.2 2.5 max.
N 1.35±0.15 2.5 max.
D 2.0±0.2 3.0 max.
E 2.5±0.2 3.7 max.
GRT32
3.2±0.3
2.5±0.2
2.80±0.20
3.50±0.20
3.2±0.2
1.6±0.2
2.30±0.20
2.0 max.
GRT31
M
1.90±0.20
3.50±0.20
1.7 max.
GRT21
B
1.50±0.20
Type
Dimensions Tolerance(Chip)
A
B
t
Package
GRT Type
8.0±0.3
4.0±0.1
3.5±0.05
1.75±0.1
Ａ
Ｂ
t
2.0±0.1
φ1.5
+0.1
-0
4.0±0.1
0.25±0.1(T≦2.0mm)
0.3±0.1(T：2.5mm)
JEMCGP-01742H 9

Package
GRT Type
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
φ21±0.8
ｗ1
W
Top Tape : Thickness 0.06
Feeding Hole :As specified in 1.2.
Hole for Chip : As specified in 1.2.
Base Tape : As specified in 1.2.
Bottom Tape :Thickness 0.05
(Only a bottom tape existence )
W
w1
GRT32 max.
16.5 max.
10±1.5
φ180+0/-3.0
φ330±2.0
φ50 min.
φ13±0.5
2.0±0.5
Chip
(in mm)
Fig.1 Package Chips
Fig.2 Dimensions of Reel
Fig.3 Taping Diagram
JEMCGP-01742H 10

1.3 Tapes for capacitors are wound clockwise shown in Fig.3.
(The sprocket holes are to the right as the tape is pulled toward the user.)
1.4 Part of the leader and part of the vacant section are attached as follows. (in mm)
1.5 Accumulate tolerance of sprocket holes pitch = ±0.3mm / 10 pitch
1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.
1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.
1.8 There are no jointing for top tape and bottom tape.
1.9 There are no fuzz in the cavity.
1.10 Break down force of top tape : 5N min.
Break down force of bottom tape : 5N min. (Only a bottom tape existence )
1.11 Reel is made by resin and appeaser and dimension is shown in Fig 1. There are possibly
to change the material and dimension due to some impairment.
1.12 Peeling off force : 0.1N to 0.6N* in the direction as shown below.
* GRT03:0.05N to 0.5N
1.13 Label that show the customer parts number, our parts number, our company name, inspection
number and quantity, will be put in outside of reel.
Package
GRT Type
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
Tail vacant Section
Chip-mounting Unit
Leader vacant Section
Leader Unit
(Top Tape only)
Direction
of Feed
160 min.
190 min.
210 min.
図
1
ﾁｯﾌﾟ詰め状態
(
単位：
mm)
165 to 180°
Top tape
JEMCGP-01742H 11

Caution
■Limitation of Applications
Please contact us before using our products for the applications listed below which require especially high reliability
for the prevention of defects which might directly cause damage to the third party's life, body or property.
①Aircraft equipment ②Aerospace equipment ③Undersea equipment ④Power plant control equipment
⑤Medical equipment ⑥Transportation equipment(vehicles,trains,ships,etc.) ⑦Traffic signal equipment
⑧Disaster prevention / crime prevention equipment ⑨Data-processing equipment
⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.
This series is designed for use in Car Multimedia, Car Interior, Car Comfort application and General
Electronic equipment. It is not appropriate for use in applications critical to passenger safety and car driving
function(e.g. ABS,AIRBAG, etc.). Please use the GCM series is in critical applications.
■Storage and Operation condition
1. The performance of chip monolithic ceramic capacitors may be affected by the storage conditions.
1-1. Store the capacitors in the following conditions:
Room Temperature of +5℃to +40℃and a Relative Humidity of 20% to 70%.
(1) Sunlight, dust, rapid temperature changes, corrosive gas atmosphere, or high temperature and humidity
conditions during storage may affect solderability and packaging performance.
Therefore, please maintain the storage temperature and humidity. Use the product within six months after receipt ,
as prolonged storage may cause oxidation of the terminations (outer electrodes).
(2) Please confirm solderability before using after six months.
Store the capacitors without opening the original bag.
Even if the storage period is short, do not exceed the specified atmospheric conditions.
1-2. Corrosive gas can react with the termination (external) electrodes or lead wires of capacitors, and result
in poor solderability. Do not store the capacitors in an atmosphere consisting of corrosive gas (e.g.,hydrogen
sulfide, sulfur dioxide, chlorine, ammonia gas etc.).
1-3. Due to moisture condensation caused by rapid humidity changes, or the photochemical change caused
by direct sunlight on the terminal electrodes and/or the resin/epoxy coatings, the solderability and
electrical performance may deteriorate. Do not store capacitors under direct sunlight or in high huimidity
conditions
■Rating
1.Temperature Dependent Characteristics
1. The electrical characteristics of the capacitor can change with temperature.
1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature
changes. The following actions are recommended in order to ensure suitable capacitance values.
(1) Select a suitable capacitance for the operating temperature range.
(2) The capacitance may change within the rated temperature.
When you use a high dielectric constant type capacitor in a circuit that needs a tight (narrow) capacitance
tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and
carefully confirm the various characteristics in actual use conditions and the actual system.
[Example of Temperature Caracteristics X7R(R7)] [Example of Temperature Characteristics X5R(R6)]
Sample: 0.1μF, Rated Voltage 50VDC Sample: 22μF, Rated Voltage 4VDC
!
-20
-10
-15
-5
5
0
10
15
20
Temperature (°C)
-75 -50 -25 025 50 75 100 125 150
Capacitance Change(%)
-20
-10
-15
-5
5
0
10
15
20
Temperature (°C)
-75 -50 -25 025 50 75 100
Capacitance Change(%)
JEMCGC-01743E 12

2.Measurement of Capacitance
1. Measure capacitance with the voltage and frequency specified in the product specifications.
1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.
Please confirm whether a prescribed measured voltage is impressed to the capacitor.
1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.
Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.
3.Applied Voltage
1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.
1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.
(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.
When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.
(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.
Typical Voltage Applied to the DC capacitor
DC Voltage DC Voltage+AC AC Voltage Pulse Voltage
(E：Maximum possible applied voltage.)
1-2. Influence of over voltage
Over voltage that is applied to the capacitor may result in an electrical short circuit caused by the breakdown
of the internal dielectric layers .
The time duration until breakdown depends on the applied voltage and the ambient temperature.
4.Type of Applied Voltage and Self-heating Temperature
1.Confirm the operating conditions to make sure that no large current is flowing into the capacitor due to the
continuous application of an AC voltage or pulse voltage.
When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current
or pulse current will flow into the capacitor; therefore check the self-heating condition.
Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits
of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is
used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.
<Applicable to Rated Voltage of less than 100VDC>
1-1. The load should be contained to the level
such that when measuring at atmospheric
temperature of 25°C, the product's self-heating
remains below 20°C and the surface
temperature of the capacitor in the actual circuit
remains within the maximum operating
temperature.
Caution
!
10 1 2 3
Current (Ar.m.s.)
4 5 6
Temperature Rise (℃)
100kHz
10
100 Ripple Current
500kHz
1MHz
[Example of Temperature Rise (Heat Generation) in Chip
Monolithic Ceramic Capacitors in Contrast to Ripple Current]
Sample: R(R1) characteristics 10μF, Rated voltage: DC10V
E
E
E
E
0
0
0
0
JEMCGC-01743E 13

5. DC Voltage and AC Voltage Characteristic
1. The capacitance value of a high dielectric constant type
capacitor changes depending on the DC voltage applied.
Please consider the DC voltage characteristics when a
capacitor is selected for use in a DC circuit.
1-1. The capacitance of ceramic capacitors may change
sharply depending on the applied voltage. (See figure)
Please confirm the following in order to secure the
capacitance.
(1) Determine whether the capacitance change caused
by the applied voltage is within the allowed range .
(2) In the DC voltage characteristics, the rate of
capacitance change becomes larger as voltage
increases, even if the applied voltage is below
the rated voltage. When a high dielectric constant
type capacitor is used in a circuit that requires a
tight (narrow) capacitance tolerance (e.g., a time
constant circuit), please carefully consider the
voltage characteristics, and confirm the various
characteristics in the actual operating conditions
of the system.
2. The capacitance values of high dielectric
constant type capacitors changes depending
on the AC voltage applied.
Please consider the AC voltage characteristics
when selecting a capacitor to be used in a
AC circuit.
6. Capacitance Aging
[Example of Change Over Time (Aging characteristics) ]
1. The high dielectric constant type capacitors
have an Aging characteristic in which the capacitance
value decreases with the passage of time.
When you use a high dielectric constant type
capacitors in a circuit that needs a tight (narrow)
capacitance tolerance (e.g., a time-constant circuit),
please carefully consider the characteristics
of these capacitors, such as their aging, voltage,
and temperature characteristics. In addition,
check capacitors using your actual appliances
at the intended environment and operating conditions.
7.Vibration and Shock
1. Please confirm the kind of vibration and/or shock, its condition, and any generation of resonance.
Please mount the capacitor so as not to generate resonance, and do not allow any impact on the terminals.
2. Mechanical shock due to being dropped may cause damage or
a crack in the dielectric material of the capacitor.
Do not use a dropped capacitor because the quality and reliability
may be deteriorated.
3. When printed circuit boards are piled up or handled, the corner
of another printed circuit board
should not be allowed to hit the capacitor in order to avoid
a crack or other damage to the capacitor.
Caution
-100
-80
-60
-40
-20
0
20
010 20 30
DC Voltage (V) 40 50
[Example of DC Voltage Characteristics]
Sample: R(R1) Characteristics 0.1μF, Rated Voltage 50VDC
Capacitance Change (%)
00.5 1
AC Voltage (Vr.m.s.) 1.5 2
[Example of AC Voltage Characteristics]
Sample: X7R(R7) Characteristics 10μF, Rated Voltage 6.3VDC
Capacitance Change (%)
30
20
10
0
-10
-20
-30
-40
-50
-60
Floor
Crack
Mounting printed circuit board
Crack
!
20
10
0
-10
-20
-30
-40
10
100
1000
10000
Time(h)
Capacitance Change(%)
C0G(5C)
X7R(R7)
JEMCGC-01743E 14

■Soldering and Mounting
1.Mounting Position
1. Confirm the best mounting position and direction that minimizes the stress imposed on the capacitor during flexing
or bending the printed circuit board.
1-1.Choose a mounting position that minimizes the stress imposed on the chip during flexing or bending of the board.
[Component Direction]
Locate chip horizontal to the
direction in which stress acts.
(Bad Example) (Good Example)
[Chip Mounting Close to Board Separation Point]
It is effective to implement the following measures, to reduce stress in separating the board.
It is best to implement all of the following three measures; however, implement as many measures as possible
to reduce stress.
Stress Level
(1) Turn the mounting direction of the component parallel to the board separation surface.
A > D *1
(2) Add slits in the board separation part.
A > B
(3) Keep the mounting position of the component away from the board separation surface.
A > C
*1 A > D is valid when stress is added vertically to the perforation as with Hand Separation.
If a Cutting Disc is used, stress will be diagonal to the PCB, therefore A > D is invalid.
[Mounting Capacitors Near Screw Holes]
When a capacitor is mounted near a screw hole, it may be affected by the board deflection that occurs during
the tightening of the screw. Mount the capacitor in a position as far away from the screw holes as possible.
2.Information before Mounting
1. Do not re-use capacitors that were removed from the equipment.
2. Confirm capacitance characteristics under actual applied voltage.
3. Confirm the mechanical stress under actual process and equipment use.
4. Confirm the rated capacitance, rated voltage and other electrical characteristics before assembly.
5. Prior to use, confirm the solderability of capacitors that were in long-term storage.
6. Prior to measuring capacitance, carry out a heat treatment for capacitors that were in long-term storage.
7.The use of Sn-Zn based solder will deteriorate the reliability of the MLCC.
Please contact our sales representative or product engineers on the use of Sn-Zn based solder in advance.
Caution
Contents of Measures
Screw Hole Recommended
!
①
②
③
1C
1B
1A
Perforation
Slit
A
B
C
D
①
1A
JEMCGC-01743E 15

3.Maintenance of the Mounting (pick and place) Machine
1. Make sure that the following excessive forces are not applied to the capacitors.
1-1. In mounting the capacitors on the printed circuit board, any bending force against them shall be kept
to a minimum to prevent them from any damage or cracking. Please take into account the following precautions
and recommendations for use in your process.
(1) Adjust the lowest position of the pickup nozzle so as not to bend the printed circuit board.
(2) Adjust the nozzle pressure within a static load of 1N to 3N during mounting.
[Incorrect]
[Correct]
2.Dirt particles and dust accumulated between the suction nozzle and the cylinder inner wall prevent
the nozzle from moving smoothly. This imposes greater force upon the chip during mounting,
causing cracked chips. Also, the locating claw, when worn out, imposes uneven forces on the chip
when positioning, causing cracked chips. The suction nozzle and the locating claw must be maintained,
checked and replaced periodically.
Caution
!
Board Guide
Board
Suction Nozzle
Deflection
Support Pin
JEMCGC-01743E 16

4-1.Reflow Soldering
1. When sudden heat is applied to the components, the [Standard Conditions for Reflow Soldering]
mechanical strength of the components will decrease
because a sudden temperature change causes
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both the components and the PCB.
Preheating conditions are shown in table 1. It is required to
keep the temperature differential between the solder and
the components surface (ΔT) as small as possible.
2. Solderability of tin plating termination chips might be
deteriorated when a low temperature soldering profile where
the peak solder temperature is below the melting point of
tin is used. Please confirm the solderability of tin plated Temperature
termination chips before use. Incase of Lead Free Solder
( ): In case of Pb-Sn Solder
3. When components are immersed in solvent after mounting,
be sure to maintain the temperature difference (ΔT)
between the component and the solvent within the range
shown in the table 1. [Allowable Reflow Soldering Temperature and Time]
Table 1
Series
GRT
GRT
In the case of repeated soldering, the accumulated
Recommended Conditions
soldering time must be within the range shown above.
Peak
Temperature
Pb-Sn Solder: Sn-37Pb
Lead Free Solder: Sn-3.0Ag-0.5Cu
4. Optimum Solder Amount for Reflow Soldering
4-1. Overly thick application of solder paste results in a excessive solder fillet height.
This makes the chip more susceptible to mechanical and thermal stress on the board and may cause the chips to crack.
4-2. Too little solder paste results in a lack of adhesive strength on the termination, which may result in chips breaking
loose from the PCB.
4-3. Please confirm that solder has been applied smoothly to the termination.
Make sure not to impose any abnormal mechanical shocks to the PCB.
Inverting the PCB
240 to 260℃
Atmosphere
Air
Air or N2
32
ΔT≦130℃
Pb-Sn Solder
Lead Free Solder
230 to 250℃
03/15/18/21/31
ΔT≦190℃
Caution
Chip Dimension(L/W) Code
Temperature Differential
!
Soldering Temperature(℃)
SolderingTime(s)
280
270
260
250
240
230
220
0
30
60
120
90
Temperature(℃)
PeakTemperature
(170℃)
(150℃)
(130℃)
(200℃)
Soldering
Gradual
Cooling
Preheating
ΔT
60-120seconds
30-60 seconds
Time
190℃
170℃
150℃
220℃
JEMCGC-01743E 17

4-2.Flow Soldering
1. Do not apply flow soldering to chips not listed in Table 2.
[Standard Conditions for Flow Soldering]
Table 2
2. When sudden heat is applied to the components, the
mechanical strength of the components will decrease
because a sudden temperature change causes
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both of the components and the PCB.
Preheating conditions are shown in table 2. It is required to
[Allowable Flow Soldering Temperature and Time]
keep the temperature differential between the solder and
the components surface (ΔT) as low as possible.
3. Excessively long soldering time or high soldering
temperature can result in leaching of the terminations,
causing poor adhesion or a reduction in capacitance value
due to loss of contact between the inner electrodes and terminations.
4. When components are immersed in solvent after mounting,
be sure to maintain the temperature differential (ΔT)
between the component and solvent within the range
shown in the table 2. In the case of repeated soldering, the accumulated
soldering time must be within the range shown above.
Recommended Conditions
Pb-Sn Solder: Sn-37Pb
Lead Free Solder: Sn-3.0Ag-0.5Cu
5. Optimum Solder Amount for Flow Soldering
5-1. The top of the solder fillet should be lower than the
thickness of the components. If the solder amount is
excessive, the risk of cracking is higher during
board bending or any other stressful condition.
Soldering Peak Temperature
240 to 250℃
250 to 260℃
Atmosphere
Air
Air or N2
Pb-Sn Solder
Lead Free Solder
Preheating Peak Temperature
90 to 110℃
100 to 120℃
GRT
18/21/31
ΔT≦150℃
Caution
Series
Chip Dimension
(L/W) Code
Temperature Differential
!
Soldering mperature(℃)
SolderingTime(s)
280
270
260
250
240
230
220
0
10
20
40
30
Temperature(℃)
Soldering
Peak
Temperature
Preheating
Peak
Temperature
30-90 seconds
Preheating
5 seconds max.
Time
Gradual
Cooling
Soldering
ΔT
Up to ChipThickness
Adhesive
in section
JEMCGC-01743E 18

4-3.Correction of Soldered Portion
When sudden heat is applied to the capacitor, distortion caused by the large temperature difference occurs internally,
and can be the cause of cracks. Capacitors also tend to be affected by mechanical and thermal stress depending
on the board preheating temperature or the soldering fillet shape, and can be the cause of cracks.
Please refer to "1. PCB Design" or "3. Optimum solder amount" for the solder amount and the fillet shapes.
1. Correction with a Soldering Iron
1-1. In order to reduce damage to the capacitor, be sure to preheat the capacitor and the mounting board.
Preheat to the temperature range shown in Table 3. A hot plate, hot air type preheater, etc. can be used for preheating.
1-2. After soldering, do not allow the component/PCB to cool down rapidly.
1-3. Perform the corrections with a soldering iron as quickly as possible. If the soldering iron is applied too long,
there is a possibility of causing solder leaching on the terminal electrodes, which will cause deterioration of the
adhesive strength and other problems.
Table 3
*Applicable for both Pb-Sn and Lead Free Solder.
Pb-Sn Solder: Sn-37Pb
Lead Free Solder: Sn-3.0Ag-0.5Cu
* Please manage Δ T in the temperature of soldering iron and the preheating temperature.
2. Correction with Spot Heater
Compared to local heating with a soldering iron, hot air heating by a spot heater heats the overall component
and board, therefore, it tends to lessen the thermal shock. In the case of a high density mounted board,
a spot heater can also prevent concerns of the soldering iron making direct contact with the component.
2-1. If the distance from the hot air outlet of the spot heater to the component is too close, cracks may occur due to
thermal shock. To prevent this problem, follow the conditions shown in Table 4.
2-2. In order to create an appropriate solder fillet shape, it is recommended that hot air be applied at the angle shown
in Figure 1.
Table 4
Distance 5mm or more
Hot Air Application angle 45° *Figure 1
Hot Air Temperature Nozzle Outlet 400°C max.
Less than 10 seconds
Application Time (3216M / 1206 size or smaller)
Less than 30 seconds
(3225M / 1210 size or larger) (3216M , 3225M : Metric size code)
3. Optimum solder amount when re-working with a soldering iron
3-1. If the solder amount is excessive, the risk of cracking is higher
during board bending or any other stressful condition.
Too little solder amount results in a lack of adhesive strength
on the outer electrode termination, which may result
in chips breaking loose from the PCB.
Please confirm that solder has been applied smoothly is in section
and rising to the end surface of the chip.
3-2. A soldering iron with a tip of ø3mm or smaller should be used.
It is also necessary to keep the soldering iron from touching
the components during the re-work.
3-3. Solder wire with ø0.5mm or smaller is required for soldering.
GRT
32
280℃max.
150℃min.
ΔT≦130℃
Air
GRT
03/15/18/21/31
350℃max.
150℃min.
ΔT≦190℃
Air
Series
Chip Dimension
(L/W) Code
Temperature of
Soldering Iron tip
Preheating
Temperature
Temperature
Differential(ΔT)
Atmosphere
Caution
!
One-hole Nozzle
an Angle of 45°
[Figure 1]
SolderAmount
JEMCGC-01743E 19

5.Washing
Excessive ultrasonic oscillation during cleaning can cause the PCBs to resonate, resulting in cracked chips
or broken solder joints. Take note not to vibrate PCBs.
6.Electrical Test on Printed Circuit Board
1. Confirm position of the support pin or specific jig, when inspecting the electrical performance of a
capacitor after mounting on the printed circuit board.
1-1. Avoid bending the printed circuit board by the pressure of a test-probe, etc.
The thrusting force of the test probe can flex the PCB, resulting in cracked chips or open solder
joints. Provide support pins on the back side of the PCB to prevent warping or flexing.
Install support pins as close to the test-probe as possible.
1-2. Avoid vibration of the board by shock when a test -probe contacts a printed circuit board.
[Not Recommended] [Recommended]
7.Printed Circuit Board Cropping
1. After mounting a capacitor on a printed circuit board, do not apply any stress to the capacitor that
caused bending or twisting the board.
1-1. In cropping the board, the stress as shown may cause the capacitor to crack.
Cracked capacitors may cause deterioration of the insulation resistance, and result in a short.
Avoid this type of stress to a capacitor.
[Bending] [Twisting]
2. Check the cropping method for the printed circuit board in advance.
2-1. Printed circuit board cropping shall be carried out by using a jig or an apparatus (Disc separator, router
type separator, etc.) to prevent the mechanical stress that can occur to the board.
* When a board separation jig or disc separator is used, if the following precautions are not observed,
a large board deflection stress will occur and the capacitors may crack.
Use router type separator if at all possible.
Notes
Hand and nipper
separation apply a high
level of stress.
Use another method.
· Board handling
· Board bending direction
· Layout of capacitors
· Board handling
· Layout of slits
· Design of V groove
· Arrangement of blades
· Controlling blade life
Board handling
Recommended
×
△*
△*
◯
2) Disc Separator
3) Router Type Separator
Level of stress on board
High
Medium
Medium
Low
Caution
Board Separation Method
Hand Separation
Nipper Separation
(1) Board Separation Jig
Board Separation Apparatus
!
Peeling
Test-probe
Support Pin
Test-probe
①
1A
JEMCGC-01743E 20