Agilent Technologies 4263B User manual

○
CCopyright 2009 Agilent Technologies
Agilent 4263B LCR Meter Operation Manual
Manual Change
Agilent Part No. N/A
Jun 2009
Change 1
Add TAR in Test Signal Frequency Accuracy Test (Page 9-38) as follows.
Test Signal Frequency Accuracy
Frequency
[Hz]
Limits [Hz] Result1 [Hz] Uncertainty [Hz] TAR
100 ±0.01 ± 0.00031 31.77
120 ±1.2 ± 0.00034 3550.50
1 k ±0.00010 k k ± 0.0000029 k 35.38
10 k ±0.0010 k k ± 0.000019 k 53.80
20 k ±0.0020 k k ± 0.000020 k 100.32
100 k ±0.010 k k ± 0.00019 k 53.78
Note 1: Result = Measurement – Nominal Frequency
Change 2
Add TAR in Test Signal Level Accuracy Test (Page 9-38) as follows.
Test Signal Level Accuracy
Signal
Level [V]
Frequency
[HZ]
Limits [V] Result1 [V] Uncertainty [V] TAR
50 m 100 ±15.0 m m± 0.90 m 16.70
50 m 20 k ±15.0 m m± 0.078 m 193.62
50 m 100 k ±15.0 m m± 0.18 m 86.62
250 m 100 ±35.0 m m± 2.50 m 14.04
250 m 20 k ±35.0 m m± 0.35 m 102.30
250 m 100 k ±35.0 m m± 1.88 m 18.66
1 100 ±0.11 ± 0.00349 31.60
1 20 k ±0.11 ± 0.00147 74.91
1 100 k ±0.11 ± 0.00108 101.92
Note 1: Result = Measurement – Nominal Level
Change 3
Add TAR in DC Bias Level Accuracy Test (Page 9-39) as follows.
DC Bias Level Accuracy
DC Bias
Level [V]
Limits [V] Result1 [V] Uncertainty [V] TAR
0 ±0.002 ± 0.087 m 23.07
1.5 ±0.077 ± 0.44 m 175.51
2 ±0.102 ± 0.92 m 111.10
Note 1: Result = Measurement – Nominal Level

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CCopyright 2009 Agilent Technologies
Change 4
Add TAR in 0 m Impedance Measurement Accuracy Test (Page 9-40 to 9-42) as follows.
Impedance Measurement Accuracy
Measurement: Capacitance
Cable length: 0 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
10 pF 100 k Cp ±0.331 pF pF ± 0.0040 pF 83.58
10 pF 100 k D ±0.0331 ± 0.00043 78.09
100 pF 1 k Cp ±0.19 pF pF ± 0.0074 pF 25.79
100 pF 1 k D ±0.0019 ± 0.000063 30.57
100 pF 10 k Cp ±0.44 pF pF ± 0.017 pF 26.79
100 pF 10 k D ±0.0044 ± 0.00023 19.15
100 pF 20 k Cp ±1.10 pF pF ± 0.021 pF 53.34
100 pF 20 k D ±0.0110 ± 0.000091 121.51
100 pF 100 k Cp ±1.37 pF pF ± 0.019 pF 74.59
100 pF 100 k D ±0.0137 ± 0.00033 42.12
1 nF 100 Cp ±0.002 nF nF ± 0.000098 nF 20.11
1 nF 100 D ±0.0020 ± 0.000063 32.10
1 nF 1 k Cp ±0.0012 nF nF ± 0.000092 nF 12.67
1 nF 1 k D ±0.0012 ± 0.000064 19.02
1 nF 100 k Cp ±0.0128 nF nF ± 0.00012 nF 116.20
1 nF 100 k D ±0.0128 ± 0.00033 38.90
10 nF 100 Cp ± 0.018 nF nF ± 0.00065 nF 28.46
10 nF 100 D ±0.0018 ± 0.000022 84.00
10 nF 120 Cp ± 0.018 nF nF ± 0.00059 nF 16.38
10 nF 120 D ±0.0018 ± 0.000022 85.34
10 nF 1 k Cp ± 0.011 nF nF ± 0.00076 nF 14.17
10 nF 1 k D ±0.0011 ± 0.000021 53.05
10 nF 10 k Cp ± 0.018 nF nF ± 0.00067 nF 27.75
10 nF 10 k D ±0.0018 ± 0.000036 51.18
10 nF 100 k Cp ± 0.128 nF nF ± 0.00087 nF 148.58
10 nF 100 k D ±0.0128 ± 0.00022 60.42
100 nF 1 k Cp ± 0.11 nF nF ± 0.0068 nF 15.62
100 nF 1 k D ±0.0011 ± 0.000023 47.81
100 nF 100 k Cp ± 1.47 nF nF ± 0.015 nF 102.37
100 nF 100 k D ±0.0147 ± 0.00026 57.89
1 μF 100 Cp ±0.0018 μFμF± 0.000074 μF 24.88
1 μF 100 D ±0.0018 ± 0.000047 38.90
1 μF 120 Cp ±0.0018 μFμF± 0.000073 μF 24.49
1 μF 120 D ±0.0018 ± 0.000047 38.84
1 μF 1 k Cp ±0.0011 μFμF± 0.000067 μF 15.89
1 μF 1 k D ±0.0011 ± 0.000032 34.29
1 μF 10 k Cp ±0.0026 μFμF± 0.00014 μF 19.45
1 μF 10 k D ±0.0026 ± 0.000069 38.02
1 μF 100 k Cp ±0.0176 μFμF± 0.00018 μF 102.72

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CCopyright 2009 Agilent Technologies
1 μF 100 k D ±0.0176 ± 0.00032 55.73
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Capacitance
Cable length: 0 m
Measurement time: Med
Test signal level: 50 mV
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
10 nF 100 Cp ± 0.063 nF nF ± 0.00070 nF 89.93
10 nF 100 D ±0.0063 ± 0.000043 146.37
10 nF 100 k Cp ± 0.271 nF nF ± 0.0023 nF 119.28
10 nF 100 k D ±0.0271 ± 0.00044 62.83
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Capacitance
Cable length: 0 m
Measurement time: Short
Test signal level: 50 mV
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
10 nF 100 Cp ± 0.179 nF nF ± 0.011 nF 16.27
10 nF 100 D ±0.0179 ± 0.00072 25.02
10 nF 100 k Cp ± 0.287 nF nF ± 0.00081 nF 356.95
10 nF 100 k D ±0.0287 ± 0.00069 41.99
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Capacitance
Cable length: 0 m
Measurement time: Long
Test signal level: 1 V
DC bias: On
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
1 μF 1 k Cp ±0.0011 μFμF± 0.000066 μF 16.28
1 μF 1 k D ±0.0011 ± 0.000033 34.30
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Resistance
Cable length: 0 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 mΩ100 R ±0.52 mΩmΩ± 0.030 mΩ17.76
100 mΩ1k R ±0.48 mΩmΩ± 0.030 mΩ16.31
Note 1: Result = Measurement – Calibrated Value of
Standard
Measurement: Resistance
Cable length: 0 m

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CCopyright 2009 Agilent Technologies
Measurement time: Med
Test signal level: 500 mV
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 mΩ100 R ±0.62 mΩmΩ± 0.033 mΩ19.12
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Resistance
Cable length: 0 m
Measurement time: Short
Test signal level: 500 mV
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 mΩ100 R ±1.10 mΩmΩ± 0.13 mΩ8.91
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: DC Resistance
Cable length: 0 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Parameter Limits Result1Uncertainty TAR
100 mΩR ±0.97 mΩmΩ
± 0.039
mΩ25.06
100 kΩR ±0.87 kΩmΩ± 0.013 kΩ67.56
Note 1: Result = Measurement – Calibrated Value of Standard

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CCopyright 2009 Agilent Technologies
Change 5
Add TAR in 1 m Impedance Measurement Accuracy Test (Page 9-43) as follows.
Measurement: Capacitance
Cable length: 1 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 pF 1 k Cp ±0.19 pF pF ± 0.0077 pF 24.59
100 pF 1 k D ±0.0019 ± 0.000063 30.52
100 pF 10 k Cp ±0.48 pF pF ± 0.012 pF 40.75
100 pF 10 k D ±0.0048 ± 0.00013 37.17
100 pF 20 k Cp ±1.10 pF pF ± 0.024 pF 47.09
100 pF 20 k D ±0.0110 ± 0.000085 130.36
100 pF 100 k Cp ±1.37 pF pF ± 0.010 pF 136.75
100 pF 100 k D ±0.0137 ± 0.00016 87.72
1 nF 100 Cp ±0.002 nF nF ± 0.000091 nF 21.61
1 nF 100 D ±0.0020 ± 0.000063 32.10
1 μF 100 Cp ±0.0018 μFμF± 0.000075 μF24.28
1 μF 100 D ±0.0018 ± 0.000047 38.74
1 μF 1 k Cp ±0.0011 μFμF± 0.000069 μF15.58
1 μF 1 k D ±0.0011 ± 0.000033 33.55
1 μF 10 k Cp ±0.0026 μFμF± 0.00014 μF 19.09
1 μF 10 k D ±0.0026 ± 0.000061 43.04
1 μF 100 k Cp ±0.0207 μFμF± 0.00016 μF 132.97
1 μF 100 k D ±0.0207 ± 0.00029 73.20
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Resistance
Cable length: 1 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 mΩ100 R ±0.60 mΩmΩ± 0.030 mΩ20.44
100 mΩ1k R ±0.60 mΩmΩ± 0.031 mΩ19.33
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: DC Resistance
Cable length: 1 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Limits Result1Uncertainty TAR
100 mΩR ±1.05 mΩmΩ
± 0.030
mΩ35.88
100 kΩR ±0.87 kΩmΩ± 0.014 kΩ26.19
Note 1: Result = Measurement – Calibrated Value of Standard

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CCopyright 2009 Agilent Technologies
Change 6
Add TAR in 2 m Impedance Measurement Accuracy Test (Page 9-44) as follows.
Measurement: Capacitance
Cable length: 2 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 pF 1 k Cp ±0.19 pF pF ± 0.011 pF 18.59
100 pF 1 k D ±0.0019 ± 0.000073 26.34
100 pF 10 k Cp ±0.51 pF pF ± 0.013 pF 41.04
100 pF 10 k D ±0.0051 ± 0.00014 37.14
100 pF 20 k Cp ±1.10 pF pF ± 0.022 pF 51.11
100 pF 20 k D ±0.0110 ± 0.000094 118.00
1 nF 100 Cp ±0.002 nF nF ± 0.000090 nF 21.86
1 nF 100 D ±0.0020 ± 0.000075 26.94
1 μF 100 Cp ±0.0018 μFμF± 0.000077 μF23.71
1 μF 100 D ±0.0018 ± 0.000047 38.79
1 μF 1 k Cp ±0.0011 μFμF± 0.000069 μF15.53
1 μF 1 k D ±0.0011 ± 0.000033 34.31
1 μF 10 k Cp ±0.0026 μFμF± 0.00014μF 19.38
1 μF 10 k D ±0.0026 ± 0.000062 42.27
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Resistance
Cable length: 2 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 mΩ100 R ±0.68 mΩmΩ± 0.030 mΩ22.95
100 mΩ1k R ±0.72 mΩmΩ± 0.034 mΩ21.35
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: DC Resistance
Cable length: 2 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Parameter Limits Result1Uncertainty TAR
100 mΩR ±1.13 mΩmΩ± 0.030mΩ38.28
100 kΩR ±0.87 kΩmΩ± 0.014 kΩ66.20
Note 1: Result = Measurement – Calibrated Value of Standard

○
CCopyright 2009 Agilent Technologies
Change 7
Add TAR in 4 m Impedance Measurement Accuracy Test (Page 9-45) as follows.
Measurement: Capacitance
Cable length: 4 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 pF 1 k Cp ±0.19 pF pF ± 0.0078 pF 25.29
100 pF 1 k D ±0.0019 ± 0.000065 29.32
1 nF 100 Cp ±0.002 nF nF ± 0.000089 nF 22.18
1 nF 100 D ±0.0020 ± 0.000062 32.72
1 μF 100 Cp ±0.0018 μFμF± 0.000077 μF23.73
1 μF 100 D ±0.0018 ± 0.000047 38.88
1 μF 1 k Cp ±0.0011 μFμF± 0.000071 μF15.08
1 μF 1 k D ±0.0011 ± 0.000033 33.34
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: Resistance
Cable length: 4 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Frequency [Hz] Parameter Limits Result1Uncertainty TAR
100 mΩ100 R ±0.84 mΩmΩ± 0.030 mΩ28.84
100 mΩ1k R ±0.96 mΩmΩ± 0.030 mΩ32.06
Note 1: Result = Measurement – Calibrated Value of Standard
Measurement: DC Resistance
Cable length: 4 m
Measurement time: Long
Test signal level: 1 V
Status PASS
Standard Parameter Limits Result1Uncertainty TAR
100 mΩR ±1.29 mΩmΩ
± 0.030
mΩ43.74
100 kΩR ±0.87 kΩkΩ± 0.013 kΩ68.26
Note 1: Result = Measurement – Calibrated Value of Standard

○
CCopyright 2007 Agilent Technologies
Agilent 4263B LCR Meter Operation Manual
Manual Change
Agilent Part No. N/A
July 2008
Change 1
Change the Measurement Uncertainty value of Test Signal Frequency Accuracy Test (Page
9-38) to the following information.
Test Signal
Frequency Test Limits Test Result1 Measurement Uncertainty
100 Hz ±0.010 Hz Hz ± 0.00031 Hz
120 Hz ±1.200 Hz Hz ± 0.00034 Hz
1 kHz ±0.00010 kHz kHz ± 0.0000029 kHz
10 kHz ±0.0010 kHz kHz ± 0.000019 kHz
20 kHz ±0.0010 kHz kHz ± 0.000020 kHz
100 kHz ±0.010 kHz kHz ± 0.00019 kHz
Change 2
Change the Measurement Uncertainty value of Test Signal Level Accuracy Test (Page 9-38)
to the following information.
Test Signal
Level
Test Signal
Frequency
Test Limits
Test Result1 Measurement Uncertainty
50 mV 100 Hz ±15.0 mV ± 0.90 mV
50 mV 20 kHz2±15.0 mV ± 0.078 mV
50 mV 100 kHz ±15.0 mV ± 0.18 mV
250 mV 100 Hz ±35.0 mV ± 2.50 mV
250 mV 20 kHz ±35.0 mV ± 0.35 mV
250 mV 100 kHz ±35.0 mV ± 1.88 mV
1 V 100 Hz ±0.11 V ± 0.00349 V
1 V 20 kHz ±0.11 V ± 0.00148 V
1 V 100 kHz ±0.11 V ± 0.00109 V

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CCopyright 2007 Agilent Technologies
Change 3
Change the Measurement Uncertainty value of DC Bias Level Accuracy Test (Page 9-39) to
the following information.
DC Bias Level
Test Limits
Test Result1
Measurement
Uncertainty
0 V ±0.002 V V ± 0.088 mV
1.5 V ±0.077 V V ± 0.44 mV
2 V ±0.102 V V ± 0.92 mV
Change 4
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Capacitance Measurement Accuracy Test (Meas. Time Mode: LONG) (Page 9-40) to
the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
10 pF 100 kHz Cp ±0.331 pF pF ± 0.0040 pF
D ±0.0331 ± 0.00043
100 pF 1 kHz Cp ±0.19 pF pF ± 0.0074 pF
D ±0.0019 ± 0.000063
100 pF 10 kHz Cp ±0.44 pF pF ± 0.017 pF
D ±0.0044 ± 0.00023
100 pF 20 kHz2Cp ±1.10 pF pF ± 0.021 pF
D ±0.0110 ± 0.000091
100 pF 100 kHz Cp ±1.37 pF pF ± 0.019 pF
D ±0.0137 ± 0.00033
1000 pF 100 Hz Cp ±2 pF pF ± 0.000098 nF
D ±0.0020 ± 0.000063
1000 pF 1 kHz Cp ±0.0012 nF pF ± 0.000092 nF
D ±0.0012 ± 0.000064
1000 pF 100 kHz Cp ±0.0128 nF pF ± 0.00012 nF
D ±0.0128 ± 0.00033
0.01 μF 100 Hz Cp ± 0.018 nF pF ± 0.00065 nF
D ±0.0018 ± 0.000022
0.01 μF 120 Hz Cp ± 0.018 nF pF ± 0.00059 nF
D ±0.0018 ± 0.000022
0.01 μF 1 kHz Cp ± 0.011 nF pF ± 0.00076 nF
D ±0.0011 ± 0.000021
0.01 μF 10 kHz Cp ± 0.018 nF pF ± 0.00067 nF
D ±0.0018 ± 0.000036
0.01 μF 100 kHz Cp ± 0.128 nF pF ± 0.00087 nF
D ±0.0128 ± 0.00022
0.1 μF 1 kHz Cp ± 0.11 nF pF ± 0.0068 nF
D ±0.0011 ± 0.000023
0.1 μF 100 kHz Cp ± 1.47 nF pF ± 0.015 nF
D ±0.0147 ± 0.00026

○
CCopyright 2007 Agilent Technologies
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Capacitance Measurement Accuracy Test (Meas. Time Mode: LONG) (Page 9-41) to
the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
1 μF 100 Hz Cp ±0.0018 μF pF ± 0.000074 μF
D ±0.0018 ± 0.000047
1 μF 120 Hz Cp ±0.0018 μF pF ± 0.000073 μF
D ±0.0018 ± 0.000047
1 μF 1 kHz Cp ±0.0011 μF pF ± 0.000067 μF
D ±0.0011 ± 0.000032
1 μF 10 kHz Cp ±0.0026 μF pF ± 0.00014 μF
D ±0.0026 ± 0.000069
1 μF 100 kHz Cp ±0.0176 μF pF ± 0.00018 μF
D ±0.0176 ± 0.00032
Change 5
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Capacitance Measurement Accuracy Test (Meas. Time Mode: MED) (Page 9-41) to
the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
0.01 μF 100 Hz Cp ± 0.063 nF pF ± 0.00070 nF
100 Hz D ±0.0063 ± 0.000043
0.01 μF 100 kHz Cp ± 0.271 nF pF ± 0.0023 nF
100 kHz D ±0.0271 ± 0.00044
Change 6
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Capacitance Measurement Accuracy Test (Meas. Time Mode: SHORT) (Page 9-41) to
the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
0.01 μF 100 Hz Cp ± 0.179 nF pF ± 0.011 nF
D ±0.0179 ± 0.00072
0.01 μF 100 kHz Cp ± 0.287 nF pF ± 0.00081 nF
D ±0.0287 ± 0.00069

○
CCopyright 2007 Agilent Technologies
Change 7
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Capacitance Measurement Accuracy Test (DC Bias: ON) (Page 9-41) to the following
information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
1 μF 1 k Cp ±0.0011 μFμF ± 0.000066 μF
D ±0.0011 ± 0.000033
Change 8
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Resistance Measurement Accuracy Test (Meas. Time Mode: LONG) (Page 9-42) to
the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits Test Result1
Measurement
Uncertainty
100 mohm 100 Hz R ±0.52 mohm mohm ± 0.030 mohm
100 mohm 1 kHz R ±0.48 mohm mohm ± 0.030 mohm
Change 9
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Resistance Measurement Accuracy Test (Meas. Time Mode: MED) (Page 9-42) to the
following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
100 mohm 100 Hz R ±0.62 mohm mohm ± 0.033 mohm
Change 10
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m Resistance Measurement Accuracy Test (Meas. Time Mode: SHORT) (Page 9-42) to
the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
100 mohm 100 Hz R ±1.10 mohm mohm ± 0.13 mohm

○
CCopyright 2007 Agilent Technologies
Change 11
Change the Measurement Uncertainty value of 0 m Impedance Measurement Accuracy Test
for 0 m DC Resistance Measurement Accuracy Test (Opt. 001 Only) (Page 9-42) to the
following information.
Standard
Test Limits
Test Result1
Measurement
Uncertainty
100 mohm ±0.97 mohm mohm ± 0.039 mohm
100 kohm ±0.87 kohm kohm ± 0.013 kohm
Change 12
Change the Measurement Uncertainty value of 1 m Impedance Measurement Accuracy Test
for 1 m Capacitance Measurement Accuracy Test (Page 9-43) to the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits Test Result1
Measurement
Uncertainty
100 pF 1 kHz Cp ±0.19 pF pF ± 0.0077 pF
D ±0.0019 ± 0.000063
100 pF 10 kHz Cp ±0.48 pF pF ± 0.012 pF
D ±0.0048 ± 0.00013
100 pF 20 kHz2Cp ±1.10 pF pF ± 0.024 pF
D ±0.0110 ± 0.000085
100 pF 100 kHz Cp ±1.37 pF pF ± 0.010 pF
D ±0.0137 ± 0.00016
1000 pF 100 Hz Cp ±0.002 nF pF ± 0.000091 nF
D ±0.0020 ± 0.000063
1 μF 100 Hz Cp ±0.0018 μFμF ± 0.000075 μF
D ±0.0018 ± 0.000047
1 μF 1 kHz Cp ±0.0011 μFμF ± 0.000069 μF
D ±0.0011 ± 0.000033
1 μF 10 kHz Cp ±0.0026 μFμF ± 0.00014 μF
D ±0.0026 ± 0.000061
1 μF 100 kHz Cp ±0.0207 μFμF ± 0.00016 μF
D ±0.0207 ± 0.00029
Change 13
Change the Measurement Uncertainty value of 1 m Impedance Measurement Accuracy Test
for 1 m Resistance Measurement Accuracy Test (Page 9-43) to the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits Test Result1
Measurement
Uncertainty
100 mohm 100 Hz R ±0.60 mohm mohm ± 0.030 mohm
100 mohm 1 kHz R ±0.60 mohm mohm ± 0.031 mohm

○
CCopyright 2007 Agilent Technologies
Change 14
Change the Measurement Uncertainty value of 1 m Impedance Measurement Accuracy Test
for 1 m DC Resistance Measurement Accuracy Test (Opt. 001 Only) (Page 9-43) to the
following information.
Standard
Test Limits
Test Result1
Measurement
Uncertainty
100 mohm ±1.05 mohm mohm ± 0.030 mohm
100 kohm ±0.87 kohm kohm ± 0.014 kohm
Change 14
Change the Measurement Uncertainty value of 2 m Impedance Measurement Accuracy Test
for 2 m Capacitance Measurement Accuracy Test (Page 9-44) to the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits Test Result1
Measurement
Uncertainty
100 pF 1 kHz Cp ±0.19 pF ± 0.011 pF
D ±0.0019 ± 0.000073
100 pF 10 kHz Cp ±0.51 pF ± 0.013 pF
D ±0.0051 ± 0.00014
100 pF 20 kHz2Cp ±1.10 pF ± 0.022 pF
D ±0.0110 ± 0.000094
1 nF 100 Hz Cp ±0.002 nF ± 0.000090 nF
D ±0.0020 ± 0.000075
1 μF 100 Hz Cp ±0.0018 μF ± 0.000077 μF
D ±0.0018 ± 0.000047
1 μF 1 kHz Cp ±0.0011 μF ± 0.000069 μF
D ±0.0011 ± 0.000033
1 μF 10 kHz Cp ±0.0026 μF ± 0.00014 μF
D ±0.0026 ± 0.000062
Change 15
Change the Measurement Uncertainty value of 2 m Impedance Measurement Accuracy Test
for 2 m Resistance Measurement Accuracy Test (Page 9-44) to the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits
Test Result1
Measurement
Uncertainty
100 mohm 100 Hz R ±0.68 mohm mohm ± 0.030 mohm
100 mohm 1 kHz R ±0.72 mohm mohm ± 0.034 mohm

○
CCopyright 2007 Agilent Technologies
Change 16
Change the Measurement Uncertainty value of 2 m Impedance Measurement Accuracy Test
for 2 m DC Resistance Measurement Accuracy Test (Opt. 001 Only) (Page 9-44) to the
following information.
Standard
Test Limits Test Result1
Measurement
Uncertainty
100 mohm ±1.13 mohm mohm ± 0.030 mohm
100 kohm ±0.87 kohm kohm ± 0.014 kohm
Change 17
Change the Measurement Uncertainty value of 4 m Impedance Measurement Accuracy Test
for 4 m Capacitance Measurement Accuracy Test (Page 9-45) to the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits Test Result1
Measurement
Uncertainty
100 pF 1 kHz Cp ±0.19 pF pF ± 0.0078 pF
1 kHz D ±0.0019 ± 0.000065
1000 pF 100 Hz Cp ±0.002 nF pF ± 0.000089 nF
100 Hz D ±0.0020 ± 0.000062
1 μF 100 Hz Cp ±0.0018 μFμF ± 0.000077 μF
100 Hz D ±0.0018 ± 0.000047
1 μF 1 Hz Cp ±0.0011 μFμF ± 0.000071 μF
1 kHz D ±0.0011 ± 0.000033
Change 18
Change the Measurement Uncertainty value of 4 m Impedance Measurement Accuracy Test
for 4 m Resistance Measurement Accuracy Test (Page 9-45) to the following information.
Standard
Test Signal
Frequency Parameter Measured Test Limits Test Result1
Measurement
Uncertainty
100 mohm 100 Hz R ±0.84 mohm mohm ± 0.030 mohm
100 mohm 1 kHz R ±0.96 mohm mohm ± 0.030 mohm

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CCopyright 2007 Agilent Technologies
Change 19
Change the Measurement Uncertainty value of 4 m Impedance Measurement Accuracy Test
for 4 m DC Resistance Measurement Accuracy Test (Opt. 001.Only) (Page 9-45) to the
following information.
Standard
Test Limits
Test Result1Measurement
Uncertainty
100 mohm ±1.29 mohm mohm ± 0.030 mohm
100 kohm ±0.87 kohm kohm ± 0.013 kohm

Agilent 4263B LCR Meter Operation Manual
Manual Change
Agilent Part No. N/A
July 2007
Change 1
Add the following steps to the step 2 of DC Bias LevelAccuracy Test (page 9-9).
2-a. Set the test signal frequency to 100 kHz using Freq.
2-b. Set the test signal level to 50 mV using Level.
Change 2
Change the figure 9-4 of DC Bias Level Accuracy Test Setup without the Interface Box (page 9-10) as
follows.
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CCopyright 2007 Agilent Technologies

マニュアル チェンジ
変更 1
DC バイアス・レベル確度試験の手順 2（ページ 9-9）に以下の手順を追加して下さい。
2-a. Freq を押して測定信号周波数を 100 kHz に設定します。
2-b. Level を押して測定レベルを 50 mV に設定します。
変更 2
DC バイアス・レベル確度試験用セットアップの図 9-4（ページ 9-10）を以下に変更して下さい。
○
CCopyright 2007 Agilent Technologies

Agilent 4263B LCR Meter Operation Manual
Manual Change
Agilent Part No. N/A
June 2007
Change 1
Add the following note to the “3-c. Turning On the 4263B and Setting the Line Frequency” (page 1-13).
Note
In case the setting of the ac line frequency is not match, there’s any possibility the measurement error will
rise. Make sure the ac line frequency has been set up correctly.
Change 2
Add the following condition to the “Measurement Accuracy” (page 8-3).
5. The ac line frequency has been set up correctly.
○
CCopyright 2007 Agilent Technologies

マニュアル チェンジ
変更 1
電源投入と電源周波数の設定の手順 3-c（ページ 1-11）に以下の注記を追加して下さい。
注記
AC 電源周波数の設定値が一致していない場合、測定誤差が増大する可能性があります。必ず AC 電源周波数
を正しく設定して下さい。
変更 2
測定確度の条件（ページ 8-3）に以下の条件を追加して下さい。
5. AC 電源周波数が正しく設定されている。
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CCopyright 2007 Agilent Technologies