Agilent Technologies X Series User manual

Agilent X-Series
Signal Analyzer
N9000A CXA Functional
Tests
This manual provides documentation for the
following X-Series Analyzer:
CXA Signal Analyzer N9000A

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Manual Part Number
N9000-90017
Supersedes:None
Print Date
August 2009
Printed in USA
Agilent Technologies, Inc.
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3
Warranty
This Agilent technologies instrument product is warranted against defects in material and workmanship for
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4

Contents
5
Table of Contents
1. Functional Tests
Functional Test Versus Performance Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Contents of this Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Before Performing a Functional Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Test Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2. Displayed Average Noise Level (DANL)
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
3. Frequency Readout Accuracy
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
4. Second Harmonic Distortion (SHD)
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5. Amplitude Accuracy at 50 MHz
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Testing Preamp Option (P03, P07) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
6. Frequency Response (Flatness)
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
7. Frequency Response (Flatness), Preamp On
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
8. Scale Fidelity
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

6
Contents
Table of Contents

7
Functional Tests
1 Functional Tests
Functional tests are tests of various instrument parameters that give a high degree of confidence that the
analyzer is operating correctly. They are recommended as a check of analyzer operation for incoming
inspection or after a repair. Measurement uncertainty analysis is not available for functional tests, and the
analyzer is checked against limits that are wider than the published specifications. The functional tests
are designed to test an analyzer operating within the temperature range defined by the analyzer
specifications using a minimum set of test equipment. If a test does not pass, performance verification
tests must be run to determine whether a problem exists.

8 Chapter1
Functional Tests
Functional Test Versus Performance Verification
Functional Tests
Functional Test Versus Performance Verification
Functional tests use a minimum set of test equipment to check a much smaller range of parameters (and
a limited number of data points for each parameter) than do performance verification tests. Functional
tests use limits that are wider than the published specifications; measurement uncertainty analysis is not
available for functional tests.
NOTE If a functional test does not pass, you must run performance verification tests to
determine whether a problem exists.
Performance verification tests span a wide range of instrument parameters and provide the highest level
of confidence that the instrument conforms to published specifications. These tests can be time
consuming and require extensive test equipment.

Chapter 1 9
Functional Tests
Contents of this Document
Functional Tests
Contents of this Document
This chapter includes the following:
•“Before Performing a Functional Test” on page 10 (what to do first).
•“Test Equipment” on page 11 (a list of the equipment required for all of the tests).
Subsequent chapters describe the following Functional Tests:
•“Displayed Average Noise Level (DANL)” on page 15
•“Frequency Readout Accuracy” on page 19
•“Second Harmonic Distortion (SHD)” on page 21
•“Amplitude Accuracy at 50 MHz” on page 25
•“Frequency Response (Flatness)” on page 31
•“Frequency Response (Flatness), Preamp On” on page 35
•“Scale Fidelity” on page 39
Each functional test includes:
• Test limits (pass/fail criteria)
• A description of the test
• The equipment required for the test
• A figure showing how to connect the equipment
• Step-by-step instructions
• One or more tables in which to record the measurement results

10 Chapter1
Functional Tests
Before Performing a Functional Test
Functional Tests
Before Performing a Functional Test
1. Ensure that you have the proper test equipment.
2. Switch on the unit under test (UUT) and let it warm up (in accordance with warm-up requirements in
the instrument specifications).
3. Allow sufficient warm-up time for the required test equipment (refer to individual instrument
documentation for warm-up specifications).
4. Ensure that the analyzer’s frequency reference is set to Internal:
a. Press the Input/Output, More, Freq Ref In keys.
b. If the Freq Ref In softkey does not show Internal, press the Freq Ref In softkey and select Internal.
5. Following instrument warm-up, perform the auto align routine:
Press System, Alignments, Align Now, All.
NOTE Functional test accuracy depends on the precision of the test equipment used. Ensure that
all of the test equipment is calibrated before running a functional test.

Chapter 1 11
Functional Tests
Test Equipment
Functional Tests
TEST EQUIPMENT
The table below summarizes the test equipment needed to perform all of the functional tests. Alternate
equipment model numbers are given in case the recommended equipment is not available. If neither the
recommended nor the alternative test equipment are available, substitute equipment that meets or
exceeds the critical specifications listed.
Analyzer
Option Item Critical Specifications Recommended
Agilent Model
Alternate
Agilent
Model
Adapters
All 3.5 mm (f) to 3.5mm (f)
(connector saver for
source)
Frequency: 10 MHz to 26.5 GHz
VSWR: < 1.1:1 83059B 1250-1749
All BNC (f) to SMA (m) Frequency: 40 MHz 1250-1200
All Type N (f) to Type N (f) Frequency: 10 MHz to 18 GHz
VSWR: < 1.05:1
1250-1472 1250-0777
All Type N (m) to 3.5 mm (m) Frequency: 10 MHz to 18 GHz
VSWR: < 1.1:1
1250-1743
All Type N (m) to 3.5 mm (f) Frequency: 10 MHz to 18 GHz
VSWR: < 1.1:1
1250-1744
All Type N (f) to 3.5 mm (f) Frequency: 10 MHz to 18 GHz
VSWR: < 1.1:1
1250-1745
All Type N (m) to BNC (f) Frequency: 10 MHz to 1 GHz
VSWR: < 1.05:1
1250-1476
Attenuators
All 10 dB Step Attenuator Frequency: 50 MHz
Range: 0 to 70 dB
8495A 8496A
All 10 dB Fixed Attenuator (2
required) Frequency: 50 MHz
VSWR: < 1.2:1
8493C Option 010 8493A
Option 010
or
8493B
Option 010
Pxx 30 dB Fixed Attenuator Accuracy: < 0.05 dB @ 50 MHz 11708A
Cables
All 3.5 mm (1 meter) Frequency: 10 MHz to 26.5 GHz
VSWR: < 1.4:1
Loss: < 2.0 dB
11500E 8120-4921

12 Chapter1
Functional Tests
Test Equipment
Functional Tests
All Cable, BNC (3 required) 120 cm (48 in.) BNC cable 10503A
Signal Source
All Synthesized Sweeper Frequency: 10 MHz to 26.5 GHz
Harmonic level: < − 40 dBc
Amplitude range: 10 to − 20 dBm
Frequency Accuracy: 0.02%
PSGa83630B,
83640B,
83650B
Power Meter
All Power Meter Power Reference Accuracy: ±1.2%
Compatible with power sensor E4418B E4419B
All Power Sensor Frequency Range: 50 MHz to
3.66 GHz
Amplitude Range: −70 to –10 dBm
8481D 8487D
8485D
P03 Low Power Sensor Frequency Range: 50 MHz to 3.6 GHz
Amplitude Range: –70 to –10 dBm
8481D 8485D
8487D
Pxx other
than P03 Low Power Sensor Frequency Range: 50 MHz to 26.5 GHz
Amplitude Range: –70 to –10 dBm
8485D 8487D
Oscilloscope
All Agilent Infiniium
Oscilloscope Cutoff Frequency: 50 MHz
Rejection at 65 MHz: > 40 dB
Rejection at 75 MHz: > 60 dB
Rejection at 80 MHz: > 60 dB
Frequency: 10 MHz to 26.5 GHz
54800B
Miscellaneous Equipment
All Filter, 50 MHz Low Pass Cutoff Frequency: 50 MHz
Rejection at 65 MHz: > 40 dB
Rejection at 75 MHz: > 60 dB
Rejection at 80 MHz: > 60 dB
Frequency: 10 MHz to 26.5 GHz
0955-0306
503, 507, Power Splitter Nominal Insertion Loss: 6 dB
Tracking Between Ports: < 0.25 dB
11667A 11667B
All Termination, 50ΩType N (m) Connector
Frequency: 30 Hz to 26.5 GHz
909A Option 012
a. PSG model numbers: E8244A, E8254A, E8247C Option 520, E8247C Option H31 or 540,
E8257D Option 520, E8257D Option 550, E8257D Option 567, E8267D Option 544.
Analyzer
Option Item Critical Specifications Recommended
Agilent Model
Alternate
Agilent
Model

Chapter 1 13
Functional Tests
Test Equipment
Functional Tests

15
Displayed Average Noise Level (DANL)
2 Displayed Average Noise Level (DANL)
Test Limits (with 0 dB input attenuation)
See Table 2-1 on page 17 for values.
The Displayed Average Noise Level (DANL) of the signal analyzer is measured across a 10 kHz
frequency span at several center frequencies. The analyzer input is terminated into a 50Ωload. A test is
performed to assure the measurement is not performed in the presence of a residual response. The
measurement is then averaged, and the result is normalized to a 1 Hz bandwidth.
Figure 2-1. DANL Test Setup
Item Critical Specifications
(for this test) Recommended Agilent Model
Termination, 50ΩType-N(m) Frequency: DC to 18 GHz 909A Option 012

16 Chapter2
Displayed Average Noise Level (DANL)
Procedure
Displayed Average Noise Level (DANL)
Procedure
1. Configure the equipment as shown in Figure 2-1.
2. Press Mode, Spectrum Analyzer, Mode Preset on the analyzer.
3. Set up the signal analyzer by pressing:
FREQ Channel, Center Freq, 10, MHz
Input/Output, RF Input, RF Coupling, select DC
SPAN X Scale, Span, 10, kHz
AMPTD Y Scale, –70, dBm
AMPTD Y Scale, Attenuation, Atten, 0, dB
BW, Res BW, 1, kHz
BW, Video BW, 100, Hz
Meas Setup, Average/Hold, Number, 20, Enter
Trace/Detector, Trace Average
Single
4. Press Restart, then wait for Average/Hold to display 20/20.
5. Press View/Display, Display, then press Display Line, On.
6. Rotate the knob and set the display line at the average amplitude of the displayed noise floor by
visual inspection.
7. Confirm that the measurement is performed on the analyzer noise floor and not on a residual response
within the displayed 10 kHz span.
NOTE Ignore the residual response if one appears when taking the measurement.
8. Enter the value of the display line as the Measured Average Noise Level at 10 MHz column in
Table 2-1.
9. Normalize the measured value to a 1 Hz BW by adding –30 dB to the measured value.
NOTE The –30 dB value is added because the formula used to calculate the value of the noise
power in a 1 Hz BW when measured with a 1 kHz BW is:
Normalized Noise = 10 Log (BW 2/BW 1) where BW 2 is the 1 kHz BW we measure
and BW 1 is 1 Hz BW to which we want to normalize.
Therefore, 10 Log (1000) = 30 dB, so the noise floor will be 30 dB lower in a 1 Hz
BW.
10.Enter the normalized value of the displayed average noise level in Table 2-1.
11.The value of the normalized displayed average noise should be less than the specification value.
12.Change the analyzer center frequency to the next value listed in Table 2-1. Press: FREQ Channel,
Center Freq, [Table 2-1 Value], GHz

Chapter 2 17
Displayed Average Noise Level (DANL)
Procedure
Displayed Average Noise Level (DANL)
13.Repeat step 7 through step 12 to fill in the remainder of Table 2-1 for your analyzer frequency range.
Table 2-1 Displayed Average Noise Level (DANL) Results
Center Frequency Measured Average Noise Level
(dBm) Normalized Average Noise Level/(1 Hz BW) (dBm) Test Limits (dBm)
10 MHz –129
1.999 GHz –141
5.999 GHz –130

18 Chapter2
Displayed Average Noise Level (DANL)
Procedure
Displayed Average Noise Level (DANL)

19
Frequency Readout Accuracy
3 Frequency Readout Accuracy
Test Limits
Frequency Readout Accuracy is equivalent to the following equation:
See Table 3-1 on page 20 for actual values.
The frequency readout accuracy is measured in several spans and center frequencies that allow both
internal analyzer synthesizer modes and prefilter bandwidths to be tested. Frequency reference error is
eliminated by using the same frequency standard for the analyzer and signal source.
Figure 3-1. Frequency Readout Accuracy Test Setup
Item Critical Specification
(for this test) Recommended Agilent Model
Adapter, Type-N(m),
to 3.5 mm(f) Frequency: 10 MHz to 1.51 GHz
VSWR: < 1.1:1
1250-1744
Adapter, 3.5 mm(f) to
3.5 mm(f) Frequency: 10 MHz to 1.51 GHz
VSWR: < 1.1:1
83059B
Cable, 3.5 mm, 1
meter Frequency: 10 MHz to 1.51 GHz
VSWR: < 1.4:1
11500E
Cable, BNC, 120 cm Frequency: 10 MHz 10503A
Synthesized Sweeper Frequency: 10 MHz to 1.51 GHz PSG
0.25% span 5% RBW 2 Hz 0.5 horizontal resolution×++×+×()±

20 Chapter3
Frequency Readout Accuracy
Procedure
Frequency Readout Accuracy
Procedure
1. Configure the equipment as shown in Figure 3-1.. Confirm the analyzer’s built-in auto alignment has
been performed within the past 24 hours.
2. On the synthesized sweeper, press PRESET, then set the controls as follows:
FREQUENCY, 1505, MHz
POWER LEVEL, –10, dBm
3. Set up the signal analyzer by pressing:
Mode, Spectrum Analyzer
Mode Preset
Input/Output, More, Freq Ref In, External
FREQ Channel, Center Freq, 1505, MHz
SPAN X Scale, Span, 2990, MHz
Trace/Detector, More, Detector, Sample
Single
4. Press Restart.
Press Peak Search on the analyzer. If the instrument is functioning correctly, the marker reading in the
active function block will be between the values listed in Table 3-1. Record the marker value in the
Marker Frequency Readout column in Table 3-1.
5. On the signal analyzer, change the span and center frequency as listed in Table 3-1.
6. Change the synthesized sweeper frequency to match the center frequency of the analyzer.
7. Repeat step 4 through step 6 until the Marker Frequency Readout column of Table 3-1 is complete.
Table 3-1 Frequency Readout Accuracy Results
Span
(MHz) Center Frequency
(MHz) Minimum Marker Frequency
Readout Maximum
2990 1505 1495.9 MHz 1514.1 MHz
127.2 1505 1504.56 MHz 1505.44 MHz
54.1 1505 1504.8122 MHz 1505.1878 MHz
7.95 1505 1504.97240 MHz 1505.0276 MHz
0.106 1505 1504.999630 MHz 1505.000370 MHz
1.98 517.59 517.58316 MHz 517.59684 MHz
1.98 832.50 832.49316 MHz 832.50684 MHz

21
Second Harmonic Distortion (SHD)
4 Second Harmonic Distortion (SHD)
Test Limits
This test checks the second harmonic distortion of the signal analyzer by tuning to twice the input
frequency and examining the level of the distortion product. A low pass filter is inserted between the
source and the signal analyzer to prevent the source second harmonic from artificially raising the second
harmonic product displayed on the analyzer.
The power level at the input mixer is 10 dB higher than specified to allow the distortion product to be
seen. For example, the instrument specification may state that with a –30 dBm signal at the input mixer,
the distortion product should be suppressed by > –65 dBc.
The equivalent Second Harmonic Intercept (SHI) is 35 dBm (–30 dBm + 65 dBc). This test is performed
with –20 dBm at the mixer and verifies the distortion product is suppressed by –55 dBc. This ensures the
SHI is also 35 dBm (–20 dBm + 55 dBc).
Applied Frequency Mixer Levela
a. Mixer Level = Input Level - RF Attenuation
Distortion
40 MHz –20 dBm < –55 dBc
Item Critical Specifications
(for this test) Recommended Agilent Model
Adapter, Type-N(m) to
BNC(f) Frequency: 10 MHz to 80 MHz
VSWR: < 1.05:1
1250-1476
Adapter, BNC(f) to
SMA(m) Frequency: 40 to 80 MHz 1250-1200
Adapter,
3.5 mm(f) to 3.5 mm(f)
Frequency: 10 MHz to 80 MHz
VSWR: < 1.1:1
83059B
Cable, BNC 120 cm (2
required) Frequency: 10 to 40 MHz 10503A
Filter, 50 MHz Low Pass Cutoff Frequency: 50 MHz
Rejection at 65 MHz: > 40 dB
Rejection at 75 MHz: > 60 dB
0955-0306
Synthesized Sweeper Frequency: 50 MHz
Spectral Purity: Better than –30 dBc PSG