
S500 Integrated Test System Administrative Guide
Specifications are subject to change without notice
PA-939 Rev. C / October 2014 2 of 33
*Maximum number depends on system cabinet height of 37U as well as other items selected.
Table 2
S500 high power semiconductor testing configuration choices
Series 2600 System SourceMeter
Instruments
0 to 3
Either 2612s or 2636s
2657A High Power SourceMeter®Instruments
0 to 2
(not in series or parallel)
2651A High Power SourceMeter
Instruments
0 to 2
(2 units allow 100 A parallel operation)
CV Meter (4200-SCS-NOSMU with 4210-CVU)
0 to 1
/F or /C chassis (with or without flat panel display, respectively)
8020 High Power Interface Panel
0 to 2
Optional 3 kV CV hardware
Choice of output connectors (Keithley high-voltage triaxial, standard
triaxial, SHV, or Agilent high-voltage triaxial)
Optional unit support arm
8010 High Power Device Test Fixture
0 to 2
Cabinet selection
23U with or without vented front door
Computer selection – Industrial PC with RAID
(Linux or Windows operating system)
0 to 1. However, if the 4200-SCS (Semiconductor Characterization
System) is included, this unit serves as the system computer.
Internal or external computer
Flat panel display selection
None (with 4200-SCS/F-NOSMU option)
Monitor with support arm
Monitor installed externally
Examples of other items and accessories to accompany the S500 system:
•Cables (from system to probe station)
•9139A Probe Card Adapter
•Other Keithley instruments
System software options for the S500
•Keithley Instruments offers the Automated Characterization Suite (ACS) for test and prober automation and
parametric device characterization. For 2600-series wafer level reliability (WLR) testing, the optional ACS-
2600-RTM can be used with ACS for single device or parallel device testing.
•ACS Basic Edition can be used when prober automation is not required.
•Independently-developed software can also be used.