18
DC/AC MicroProbe Models K100 and K110
• Always zero the Model K100/K110 prior to making a measure-
ment.See§4.1forprocedure.
• Makesurethatprobejawmatingsurfacesarefreeofdustand
contamination. Contaminants cause air gaps between sensor
halves, making the Model K100/K110 susceptible to external
magneticeldswhichcancontributetomeasurementerrors.See
§5.3forcleaningprocedure.
• Donotallow probejawstoabruptly snapclosedfromthe open
state. This can lead to residual readings. If this happens, the
ModelK100/K110willneedtoberezeroed.
• Bewareofshort-circuitcurrents.Largein-rushcurrents(whichcan
occurwhenpowerisrstappliedinacircuit)andlargehigh-cur-
renttransientsmaycausevaryingdegreesofresidualreadings.
Ifindoubtofaparticularreading,removetheprobefromthecon-
ductorundertestandchecktoseethatthedisplaydevicereturns
zero.Ifnot,itwillbenecessarytorezerotheModelK100/K110.
• WhenusingtheModelK100/K110tomeasureACcurrents,keep
inmindthemaximumcurrentratingsandthefrequencyresponse
curves shown in the electrical specications section. Dynamic
currentsthatcontainlargestepdiscontinuitiesand/orfrequency
constituents near or beyond the measurement passband are
subject to measurements errors and waveform distortion (oscil-
loscopedisplay).IftheredLEDcomesonduringmeasurement,
theMicroProbe’soutputsignalmaybeinerror.
ManyDVMsprovidenull(relative)measurementcapability.ADVMplaced
inthenullmodedisplaysthedifferencebetweenastorednullvalueand
theinputsignal.
• YoucanuseaDVM’snullfunctioninplaceoftheexternalDCzero
control to cancel any DC offset from the K100/K110. The DVM
nullfunctionshouldbeenabledwiththeproberemovedfromthe
conductorimmediatelybeforemeasurement.
• You can use a DVM’s null function to display changes in mea-
suredcurrentfromaxed(constant)level.Inthisapplication,the
DVMnullfunctionisenabledwiththeprobeconnectedtothecon-
ductor.
When making null (relative) measurements, the probe aperture current
(notdisplayedcurrent)mustnotexceedthemaximumratingssetforthin
thespecicationssection.