Agilent Technologies ENA Series User manual

Caution
Do not exceed the operating input power, voltage, and current
level and signal type appropriate for the instrument being used, refer to
your instrument's Function Reference.
Electrostatic discharge(ESD) can damage the highly sensitive
microcircuits in your instrument. ESD damage is most likely to occur as
the test fixtures are being connected or disconnected. Protect them from
ESD damage by wearing a grounding strap that provides a high
resistance path to ground. Alternatively, ground yourself to discharge any
static charge built-up by touching the outer shell of any grounded
instrument chassis before touching the test port connectors.

Safety Summary
When you notice any of the unusual conditions listed below, immediately
terminate operation and disconnect the power cable.
Contact your local Agilent Technologies sales representative or
authorized service company for repair of the instrument. If you continue
to operate without repairing the instrument, there is a potential fire or
shock hazard for the operator.
- Instrument operates abnormally.
- Instrument emits abnormal noise, smell, smoke or a spark-like
light during operation.
- Instrument generates high temperature or electrical shock
during operation.
- Power cable, plug, or receptacle on instrument is damaged.
- Foreign substance or liquid has fallen into the instrument.

Agilent E5070A/E5071A ENA Series RF Network Analyzers
User’s Guide
Second Edition
FIRMWARE REVISIONS
This manual applies directly to instruments that have the firmware revision 2.00.
For additional information about firmware revisions, see Appendix A.
Agilent Part No. E5070-90010
April 2002
Printed in Japan

2
Notices
The information contained in this document is subject to change without notice.
This document contains proprietary information that is protected by copyright. All rights
are reserved. No part of this document may be photocopied, reproduced, or translated to
another language without the prior written consent of Agilent Technologies.
Agilent Technologies Japan, Ltd.
Component Test PGU-Kobe
1-3-2, Murotani, Nishi-ku, Kobe, Hyogo, 651-2241 Japan
ÓCopyright Agilent Technologies Japan, Ltd. 2001, 2002
Portions ÓCopyright 1996, Microsoft Corporation. All rights reserved.
Manual Printing History
The manual’s printing date and part number indicate its current edition. The printing date
changes when a new edition is printed (minor corrections and updates that are incorporated
at reprint do not cause the date to change). The manual part number changes when
extensive technical changes are incorporated.
December 2001 First Edition (part number: E5070-90000)
April 2002 Second Edition (part number: E5070-90010)