Agilent Technologies DSOX4USBSQ USB 2.0 User manual

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DSOX4USBSQ USB 2.0
Signal Quality Analysis
Application
Electrical Testing Notes

Notices
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Version 03.10.0000
Edition
February 12, 2013
Available in electronic format only
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DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes 3
USB 2.0 Signal Analysis—At a Glance
The DSOX4USBSQ USB 2.0 Signal Quality Analysis application for the
InfiniiVision 4000 X- Series oscilloscopes supports two use models:
•You can quickly test USB signal quality in- circuit with real- world
packets. In this case:
•You can use test fixtures as an easy way to probe signals.
•The USBSQ analysis application's Auto Setups may need to be
adjusted before analyzing real- world packets.
•You can verify signal quality to USB 2.0 compliance specifications. In
this case:
•You must use the test fixtures, equipment, and test setups required
by the USB Implementers Forum (USB- IF).
•The USBSQ analysis application's Auto Setups should work as is for
the required test packets.
The signal quality analysis application:
•Lets you select Hi- Speed, Full Speed, or Low Speed tests for Devices
and Hosts. Hubs can be tested by running both device and hosts tests
against the hub.
•Runs all the signal quality tests for the selected speed and device type
combination.
•Automatically sets up the oscilloscope for the selected tests.
•Provides detailed results information for each test that has been run.
•Lets you save the detailed results information to an HTML report.
In This Book This manual contains notes on the electrical tests that are performed by
the DSOX4USBSQ USB 2.0 Signal Quality Analysis application; it describes
the equipment used and how the tests are performed. It has these
chapters:
•Chapter 1, “Preparing for Signal Quality Analysis,” starting on page 7
•Chapter 2, “Device Signal Quality Testing,” starting on page 19
•Chapter 3, “Host Signal Quality Testing,” starting on page 39
•Chapter 4, “Hub Upstream Signal Quality Testing,” starting on page 53
•Chapter 5, “Hub Downstream Signal Quality Testing,” starting on page
65
•Chapter 6, “Saving Test Results to an HTML File,” starting on page 81
•Appendix A, “Probing Hi-Speed Signals with InfiniiMode Using SQiDD
as a Feedthrough,” starting on page 83
See Also •The USB 2.0 developers documents are available at the USB
Implementers Forum web site, "http://www.usb.org/developers/docs".

4 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes

DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes 5
Contents
USB 2.0 Signal Analysis—At a Glance 3
1 Preparing for Signal Quality Analysis
Oscilloscope Requirements 8
Fixtures for Signal Quality Tests 9
Fixtures for Hi-Speed Signal Quality Tests 9
Fixture for Full/Low Speed Signal Quality Tests 10
Probe Requirements 12
Differential Probe Connection for Hi-Speed Signal Quality Tests 12
Single-Ended SMA Cable Connection for Hi-Speed Signal Quality Tests 13
Single-Ended Probe Connection for Full/Low Speed Signal Quality Tests 14
Miscellaneous Cables and Devices 15
Additional Equipment and Set Up for Signal Quality Compliance Testing 16
High-Speed Electrical Test Bed Computer 16
Additional Set Up for Signal Quality Compliance Testing 17
2 Device Signal Quality Testing
Device Hi-Speed Signal Quality Test 20
Device Hi-Speed Connection - Differential Probe 24
Device Hi-Speed Connection - SMA Cables 25
Device Hi-Speed Compliance Test Packets 26
Device Full Speed Signal Quality Test 28
Device Full Speed Connection 30
Device Full Speed Compliance Test Packets 31
Device Low Speed Signal Quality Test 33
Device Low Speed Connection 35
Device Low Speed Compliance Test Packets 36
3 Host Signal Quality Testing
Host Hi-Speed Signal Quality Test 40
Host Hi-Speed Connection - Differential Probe 43
Host Hi-Speed Connection - SMA Cables 44
Host Hi-Speed Compliance Test Packets 44

6 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes
Host Full Speed Signal Quality Test 46
Host Full Speed Connection 48
Host Low Speed Signal Quality Test 50
Host Low Speed Connection 52
4 Hub Upstream Signal Quality Testing
Hub Upstream Hi-Speed Signal Quality Test 54
Hub Upstream Hi-Speed Connection - Differential Probe 57
Hub Upstream Hi-Speed Connection - SMA Cables 58
Hub Upstream Hi-Speed Compliance Test Packets 59
Hub Upstream Full Speed Signal Quality Test 60
Hub Upstream Full Speed Connection 62
Hub Upstream Full Speed Compliance Test Packets 63
5 Hub Downstream Signal Quality Testing
Hub Downstream Hi-Speed Signal Quality Test 66
Hub Downstream Hi-Speed Connection - Differential Probe 69
Hub Downstream Hi-Speed Connection - SMA Cables 70
Hub Downstream Hi-Speed Compliance Test Packets 71
Hub Downstream Full Speed Signal Quality Test 72
Hub Downstream Full Speed Connection 74
Hub Downstream Low Speed Signal Quality Test 76
Hub Downstream Low Speed Connection 78
6 Saving Test Results to an HTML File
A Probing Hi-Speed Signals with InfiniiMode Using SQiDD as a Feedthrough
Index

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DSOX4USBSQ USB 2.0 Signal Quality Analysis Application
Electrical Testing Notes
1
Preparing for Signal Quality Analysis
Oscilloscope Requirements 8
Fixtures for Signal Quality Tests 9
Probe Requirements 12
Miscellaneous Cables and Devices 15
This chapter describes the equipment and software required for
performing signal quality analysis with the 4000 X- Series oscilloscope and
the DSOX4USBSQ USB 2.0 Signal Quality Analysis application.

8 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes
1Preparing for Signal Quality Analysis
Oscilloscope Requirements
The DSOX4USBSQ USB 2.0 Signal Quality Analysis application requires an
Agilent InfiniiVision 4000 X-Series oscilloscope, firmware version 3.10 or
later.
For Hi-Speed
Tests
Hi- Speed tests require a 1.5 GHz bandwidth model oscilloscope.
Hi- Speed tests on a 2- channel oscilloscope with single- ended SMA cable
connections is not supported because the sample rate will not meet the
5 GSa/s rate that is required. Using a differential probe on a 2- channel
oscilloscope works fine.
For Full and Low
Speed Tests
Full and Low Speed tests can be performed with 200 MHz, 350 MHz,
500 MHz, 1 GHz, or 1.5 GHz bandwidth model oscilloscopes.
Full Speed testing is best on a 4- channel oscilloscope because when using
a 2- channel oscilloscope, channels 1 and 2 are non- interleaved and the
sample rate will be below the 4 GSa/s that the USB- IF testing procedures
require. If Full Speed tests are run on a 2- channel oscilloscope,
interpolation is used on the data.
For Optional USB
2.0 Triggering and
Decode in the
Oscilloscope
The optional DSOX4USBH and DSOX4USBFL products (for USB 2.0
Hi- Speed and Full/Low- Speed triggering and decode, respectively) can be
very useful tools for identifying and triggering on packets that you might
want to run the USB signal quality tests on.

Preparing for Signal Quality Analysis 1
DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes 9
Fixtures for Signal Quality Tests
Two different fixtures are used for Hi- Speed tests; one is for devices and
other is for hosts. See “Fixtures for Hi- Speed Signal Quality Tests" on
page 9.
One fixture is used for Full and Low Speed tests. See “Fixture for
Full/Low Speed Signal Quality Tests" on page 10.
Fixtures for Hi-Speed Signal Quality Tests
Hi- Speed testing requires one of these test fixtures:
•Device Hi- Speed Signal Quality Test Fixture, part number E2649- 66401.
This fixture can be ordered using the Agilent part number
E2649- 60001, which includes two RF SMA (m) vertical 50- ohm
termination connectors and two 4 inch USB A- to- B cables
(E2646- 61601).
•Host Hi- Speed Signal Quality Test Fixture, part number E2649- 66402.

10 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes
1Preparing for Signal Quality Analysis
This fixture can be ordered using the Agilent part number
E2649- 60002, which includes two RF SMA (m) vertical 50- ohm
termination connectors and two 4 inch USB A- to- B cables
(E2646- 61601).
These Hi-Speed Signal Quality test fixtures are powered by a 5 V power
supply, which can be ordered using Agilent part number 0950- 2546.
Equivalent power supplies can also be used.
Older Versions of
the Hi-Speed
Signal Quality
Test Fixtures
Older versions of the Hi- Speed signal quality test fixtures exist and may
be used:
•Device Hi- Speed Signal Quality Test Fixture, part number E2645- 66507.
•Host Hi- Speed Signal Quality Test Fixture, part number E2645- 66508.
When using these older fixtures with the 1131A, 1133A, or 1134A
InfiniiMax differential probes, you also need the Agilent header adapter,
part number 01131- 68703. This header adapter is included with E2669A
and E2678A (purchased after October 2003).
Fixture for Full/Low Speed Signal Quality Tests
Full and Low Speed testing require this test fixture:
•E2646A/B SQiDD board test fixture.
NOTE
The Hi-Speed fixture part numbers E2649-66401 and E2649-66402 are provided for
identification purposes only and cannot be used for ordering.