
XBee/XBee‐PRODigiMesh2.4OEMRFModules
©2008DigiInternational,Inc. 8
Electrical Characteristics
Table3‐02. DCCharacteristics(VCC=2.8‐3.4VDC)
Symbol Characteristic Condition Min Typical Max Unit
VIL Input Low Voltage All Digital Inputs - - 0.35 * VCC V
VIH Input High Voltage All Digital Inputs 0.7 * VCC - - V
VOL Output Low Voltage IOL = 2 mA, VCC >= 2.7 V --0.5V
VOH Output High Voltage IOH = -2 mA, VCC >= 2.7 V VCC - 0.5 - - V
IIIN Input Leakage Current VIN = VCC or GND, all inputs, per pin - 0.025 1 µA
IIOZ High Impedance Leakage Current VIN = VCC or GND, all I/O High-Z, per pin - 0.025 1 µA
TX Transmit Current VCC = 3.3 V - 45
(XBee)
215, 140
(PRO,
Int)
-mA
RX Receive Current VCC = 3.3 V - 50
(XBee)
55
(PRO) -mA
PWR-DWN Power-down Current SM parameter = 1 - < 10 - µA
Table3‐03. ADCCharacteristics(Operating)
Symbol Characteristic Condition Min Typical Max Unit
VREFH VREF - Analog-to-Digital converter
reference range 2.08 - VDDAD V
IREF VREF - Reference Supply Current Enabled - 200 - µA
Disabled or Sleep Mode - < 0.01 0.02 µA
VINDC Analog Input Voltage1
1. Maximumelectricaloperatingrange,notvalidconversionrange.
VSSAD - 0.3 -VDDAD + 0.3 V
Table3‐04. ADCTiming/PerformanceCharacteristics1
1. AllACCURACYnumbersarebasedonprocessorandsystembeinginWAITstate(verylittleactivityandnoIOswitching)
andthatadequatelow‐passfilteringispresentonanaloginputpins(filterwith0.01μFto0.1μFcapacitorbetweenanalog
inputandVREFL).Failuretoobservetheseguidelinesmayresultinsystemormicrocontrollernoisecausingaccuracyerrors
whichwillvarybasedonboardlayoutandthetypeandmagnitudeoftheactivity.
Datatransmissionandreceptionduringdataconversionmaycausesomedegradationofthesespecifications,dependingon
thenumberandtimingofpackets.ItisadvisabletotesttheADCsinyourinstallationifbestaccuracyisrequired.
Symbol Characteristic Condition Min Typical Max Unit
RAS Source Impedance at Input2
2. RASistherealportionoftheimpedanceofthenetworkdrivingtheanaloginputpin.Valuesgreaterthanthisamountmay
notfullychargetheinputcircuitryoftheATDresultinginaccuracyerror.
--10 k
VAIN Analog Input Voltage3
3. AnaloginputmustbebetweenVREFLandVREFHforvalidconversion.ValuesgreaterthanVREFHwillconvertto$3FF.
VREFL VREFH V
RES Ideal Resolution (1 LSB)4
4. Theresolutionistheidealstepsizeor1LSB=(VREFH–VREFL)/1024
2.08V < VDDAD < 3.6V 2.031 - 3.516 mV
DNL Differential Non-linearity5
5. Differentialnon‐linearityisthedifferencebetweenthecurrentcodewidthandtheidealcodewidth(1LSB).Thecurrent
codewidthisthedifferenceinthetransitionvoltagestoandfromthecurrentcode.
- ±0.5 ±1.0 LSB
INL Integral Non-linearity6
6. Integralnon‐linearityisthedifferencebetweenthetransitionvoltagetothecurrentcodeandtheadjustedidealtransition
voltageforthecurrentcode.Theadjustedidealtransitionvoltageis(CurrentCode–1/2)*(1/((VREFH+EFS)–(VREFL+EZS))).
- ±0.5 ±1.0 LSB
EZS Zero-scale Error7
7. Zero‐scaleerroristhedifferencebetweenthetransitiontothefirstvalidcodeandtheidealtransitiontothatcode.The
Idealtransitionvoltagetoagivencodeis(Code–1/2)*(1/(VREFH–VREFL)).
- ±0.4 ±1.0 LSB
FFS Full-scale Error8
8. Full‐scaleerroristhedifferencebetweenthetransitiontothelastvalidcodeandtheidealtransitiontothatcode.Theideal
transitionvoltagetoagivencodeis(Code–1/2)*(1/(VREFH–VREFL)).
- ±0.4 ±1.0 LSB
EIL Input Leakage Error9
9. Inputleakageerroriserrorduetoinputleakageacrosstherealportionoftheimpedanceofthenetworkdrivingtheanalog
pin.Reducingtheimpedanceofthenetworkreducesthiserror.
- ±0.05 ±5.0 LSB
ETU Total Unadjusted Error10
10.Totalunadjustederroristhedifferencebetweenthetransitionvoltagetothecurrentcodeandtheidealstraight‐linetrans‐
ferfunction.Thismeasureoferrorincludesinherentquantizationerror(1/2LSB)andcircuiterror(differential,integral,zero‐
scale,andfull‐scale)error.ThespecifiedvalueofETUassumeszeroEIL(noleakageorzerorealsourceimpedance).
- ±1.1 ±2.5 LSB