Texas Instruments DAC63202W User manual

DAC63202W 12-Bit, Dual, Voltage and Current Output Smart DACs
WithAuto‑Detected I2C, SPI, or PMBus™ Interface in DSBGA
1 Features
• Programmable voltage or current outputs with
flexible configuration:
– Voltage outputs:
• 1 LSB DNL
• Gains of 1 ×, 1.5 ×, 2 ×, 3 ×, and 4 ×
– Current outputs:
• 1 LSB INL and DNL (8-bit)
• ±25 μA, ±50 μA, ±125 μA, ±250 μA output-
range options
• Programmable comparator mode for all channels
• High-impedance output when VDD is off
• High-impedance and resistive pulldown power-
down modes
• 50-MHz SPI-compatible interface
• Automatically detects I2C, SPI, or PMBus™
interface
– 1.62-V VIH with VDD = 5.5 V
• General-purpose input/output (GPIO) configurable
as multiple functions
• Predefined waveform generation: sine, cosine,
triangular, sawtooth
• User-programmable nonvolatile memory (NVM)
• Internal, external, or power-supply as reference
• Wide operating range:
– Power supply: 1.8 V to 5.5 V
– Temperature: –40˚C to +125˚C
• Tiny package:
– 16-pin DSBGA: 1.72 mm × 1.72 mm, nominal
2 Applications
•Optical module
•High performance computing
•Standard notebook PC
3 Description
The DAC63202W is a 12-bit, dual-channel, buffered,
voltage-output and current-output smart digital-to-
analog converter (DAC). The DAC63202W devices
support Hi-Z power-down mode and Hi-Z output
during power-off conditions. The DAC outputs provide
a force-sense option for use as a programmable
comparator and current sink. The multifunction GPIO,
function generation, and programmable nonvolatile
memory (NVM) enable these smart DACs for
processor-less applications and design reuse. This
device automatically detects I2C, SPI and PMBus
interfaces, and contain an internal reference.
The feature set combined with the tiny package
and low power make this smart DAC an excellent
choice for applications such as voltage margining and
scaling, dc set-point for biasing and calibration, and
waveform generation.
Package Information
PART NUMBER PACKAGE(1) BODY SIZE (NOM)
DAC63202W YBH (DSBGA, 16) 1.72 mm × 1.72 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
SMPS / LDO R1
R2
VFB
SENSE
PH
GND
VOUT
IN
BOOT
CL
CB
L
DAC63202W
VDD
VIN
VOUT/
IOUT
VOUT/
IOUT
DAC
REG
DAC
BUF
DAC
REG
DAC
BUF
NVM
Internal
Reference
LDO
Output Configuration
Logic
VREF CAP
AGND
Digital Interface
SCL/SYNC
SDA/SCLK
A0/SDI
PROTECT
R3
R3
1.5 μ
F
0.1 μ

10 kΩ
Power-supply: 0
Power-supply: 1
Voltage Margining and Scaling Using the DAC63202W
DAC63202W
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.

Table of Contents
1 Features............................................................................1
2 Applications.....................................................................1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 ESD Ratings............................................................... 4
6.3 Recommended Operating Conditions.........................4
6.4 Thermal Information....................................................4
6.5 Electrical Characteristics: Voltage Output...................5
6.6 Electrical Characteristics: Current Output...................7
6.7 Electrical Characteristics: Comparator Mode..............8
6.8 Electrical Characteristics: General..............................9
6.9 Timing Requirements: I2C Standard Mode............... 10
6.10 Timing Requirements: I2C Fast Mode.....................10
6.11 Timing Requirements: I2C Fast Mode Plus............. 10
6.12 Timing Requirements: SPI Write Operation............ 11
6.13 Timing Requirements: SPI Read and Daisy
Chain Operation (FSDO = 0).......................................11
6.14 Timing Requirements: SPI Read and Daisy
Chain Operation (FSDO = 1).......................................11
6.15 Timing Requirements: GPIO...................................12
6.16 Timing Diagrams.....................................................12
6.17 Typical Characteristics: Voltage Output.................. 14
6.18 Typical Characteristics: Current Output.................. 19
6.19 Typical Characteristics: Comparator.......................23
6.20 Typical Characteristics: General............................. 24
7 Detailed Description......................................................25
7.1 Overview...................................................................25
7.2 Functional Block Diagram.........................................25
7.3 Feature Description...................................................26
7.4 Device Functional Modes..........................................27
7.5 Programming............................................................ 45
7.6 Register Map.............................................................53
8 Application and Implementation..................................71
8.1 Application Information............................................. 71
8.2 Typical Application.................................................... 71
8.3 Power Supply Recommendations.............................73
8.4 Layout....................................................................... 73
9 Device and Documentation Support............................75
9.1 Documentation Support............................................ 75
9.2 Receiving Notification of Documentation Updates....75
9.3 Support Resources................................................... 75
9.4 Trademarks...............................................................75
9.5 Electrostatic Discharge Caution................................75
9.6 Glossary....................................................................75
10 Mechanical, Packaging, and Orderable
Information.................................................................... 75
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
DATE REVISION NOTES
April 2023 * Initial Release
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5 Pin Configuration and Functions
1 2 3 4
A
B
C
D
Not to scale
VREF OUT0 NC GPIO/SDO
VDD FB0 NC SCL/SYNC
AGND FB1 NC A0/SDI
CAP OUT1 NC SDA/SCLK
Figure 5-1. YBH (16-pin DSBGA) Package, Top View
Table 5-1. Pin Functions
PIN TYPE DESCRIPTION
NO. NAME
A1 VREF Power
External reference input. Connect a capacitor (approximately 0.1 μF) between VREF and AGND.
Use a pullup resistor to VDD when the external reference is not used. This pin must not ramp up before VDD. In
case an external reference is used, make sure the reference ramps up after VDD.
A2 OUT0 Output Analog output voltage from DAC channel 0.
A3 NC NC Not connected.
A4 GPIO/SDO Input/Output
General-purpose input/output configurable as LDAC, PD, PROTECT, RESET, SDO, and STATUS. For STATUS and
SDO, connect the pin to the IO voltage with an external pullup resistor. If unused, connect the GPIO pin to VDD or
AGND using an external resistor. This pin can ramp up before VDD.
B1 VDD Power Supply voltage.
B2 FB0 Input Voltage feedback pin for channel 0. In voltage-output mode, connect to OUT0 for closed-loop amplifier output. In
current-output mode, keep this pin unconnected to minimize leakage current.
B3 NC NC Not connected.
B4 SCL/SYNC Output I2C serial interface clock or SPI chip select input. This pin must be connected to the IO voltage using an external
pullup resistor. This pin can ramp up before VDD.
C1 AGND Ground Ground reference point for all circuitry on the device.
C2 FB1 Input Voltage feedback pin for channel 1. In voltage-output mode, connect to OUT1 for closed-loop amplifier output. In
current-output mode, keep this pin unconnected to minimize leakage current.
C3 NC NC Not connected.
C4 A0/SDI Input
Address configuration pin for I2C or serial data input for SPI.
For A0, connect this pin to VDD, AGND, SDA, or SCL for address configuration (Section 7.5.2.2.1).
For SDI, this pin need not be pulled up or pulled down. This pin can ramp up before VDD.
D1 CAP Power External bypass capacitor for the internal LDO. Connect a capacitor (approximately 1.5 μF) between CAP and
AGND.
D2 OUT1 Output Analog output voltage from DAC channel 01
D3 NC NC Not connected.
D4 SDA/SCLK Input/Output Bidirectional I2C serial data bus or SPI clock input. This pin must be connected to the IO voltage using an external
pullup resistor in the I2C mode. This pin can ramp up before VDD.
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage, VDD to AGND –0.3 6 V
Digital inputs to AGND –0.3 VDD + 0.3 V
VFBX to AGND –0.3 VDD + 0.3 V
VOUTX to AGND –0.3 VDD + 0.3 V
VREF External reference, VREF to AGND –0.3 VDD + 0.3 V
Current into any pin except the OUTx, VDD, and AGND pins –10 10 mA
TJJunction temperature –40 150 °C
Tstg Storage temperature –65 150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
6.2 ESD Ratings
VALUE UNIT
V(ESD) Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±2000 V
Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002, all pins((2)) ±500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN NOM MAX UNIT
VDD Positive supply voltage to ground (AGND) 1.7 5.5 V
VREF External reference to ground (AGND) 1.7 VDD V
VIH Digital input high voltage, 1.7 V < VDD ≤ 5.5 V 1.62 V
VIL Digital input low voltage 0.4 V
CCAP External capacitor on CAP pin 0.5 15 μF
TAAmbient temperature –40 125 °C
6.4 Thermal Information
THERMAL METRIC(1)
DAC63202W
UNITYBH (DSBGA)
16 PINS
RθJA Junction-to-ambient thermal resistance 80.2 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 0.4 °C/W
RθJB Junction-to-board thermal resistance 18.8 °C/W
ΨJT Junction-to-top characterization parameter 0.2 °C/W
ΨJB Junction-to-board characterization parameter 18.8 °C/W
(1) For information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.
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6.5 Electrical Characteristics: Voltage Output
all minimum/maximum specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C, 1.7 V ≤ VDD ≤ 5.5 V,
DAC reference tied to VDD, gain = 1 ×, DAC output pin (OUT) loaded with resistive load (RL = 5 kΩ to AGND) and capacitive
load (CL = 200 pF to AGND), and digital inputs at VDD or AGND (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
STATIC PERFORMANCE
Resolution 12 Bits
INL Integral nonlinearity((1)) –5 5 LSB
DNL Differential nonlinearity(1) –1 1 LSB
Zero-code error(4)
Code 0d into DAC, external reference, VDD = 5.5 V 6 12
mV
Code 0d into DAC, internal VREF, gain = 4 ×,
VDD = 5.5 V 6 15
Zero-code error temperature
coefficient(4) ±10 µV/°C
Offset error(4) (6)
1.7 V ≤ VDD < 2.7 V, VFB pin shorted to VOUT, DAC
code: 32d –0.75 0.3 0.75
%FSR
2.7 V ≤ VDD ≤ 5.5 V, VFB pin shorted to VOUT,
DAC code: 32d –0.5 0.25 0.5
Offset-error temperature
coefficient(4) VFB pin shorted to VOUT, DAC code: 32d ±0.0003 %FSR/°C
Gain error(4) Between end-point codes: 32d to 4064d –0.5 0.25 0.5 %FSR
Gain-error temperature
coefficient(4) Between end-point codes: 32d to 4064d ±0.0008 %FSR/°C
Full-scale error(4) (6) 1.7 V ≤ VDD < 2.7 V, DAC at full-scale –1 1 %FSR
2.7 V ≤ VDD ≤ 5.5 V, DAC at full-scale –0.5 0.5
Full-scale-error temperature
coefficient(4) DAC at full-scale ±0.0008 %FSR/°C
OUTPUT
Output voltage Reference tied to VDD 0 VDD V
CLCapacitive load(2) RL = infinite, phase margin = 30° 200 pF
Phase margin = 30° 1000
Short-circuit current
VDD = 1.7 V, full-scale output shorted to AGND or
zero-scale output shorted to VDD 15
mA
VDD = 2.7 V, full-scale output shorted to AGND or
zero-scale output shorted to VDD 50
VDD = 5.5 V, full-scale output shorted to AGND or
zero-scale output shorted to VDD 60
Output-voltage headroom(2)
To VDD (DAC output unloaded, internal reference =
1.21 V), VDD ≥ 1.21 V × gain + 0.2 V 0.2 V
To VDD and to AGND
(DAC output unloaded, external reference at VDD (gain
= 1 ×), the VREF pin is not shorted to VDD)
0.8
%FSR
To VDD and to AGND (ILOAD = 10 mA at VDD = 5.5 V,
ILOAD = 3 mA at VDD = 2.7 V, ILOAD = 1 mA at VDD =
1.8 V), external reference at VDD (gain = 1 ×), the VREF
pin is not shorted to VDD)
10
ZOVFB dc output impedance(3)
DAC output enabled, internal reference (gain = 1.5 ×
or 2 ×) or external reference at VDD (gain = 1 ×), the
VREF pin is not shorted to VDD
400 500 600 kΩ
DAC output enabled, internal VREF, gain = 3 × or 4 × 325 400 485
Power supply rejection ratio
(dc)
Internal VREF, gain = 2 ×, DAC at midscale,
VDD = 5 V ±10% 0.25 mV/V
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6.5 Electrical Characteristics: Voltage Output (continued)
all minimum/maximum specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C, 1.7 V ≤ VDD ≤ 5.5 V,
DAC reference tied to VDD, gain = 1 ×, DAC output pin (OUT) loaded with resistive load (RL = 5 kΩ to AGND) and capacitive
load (CL = 200 pF to AGND), and digital inputs at VDD or AGND (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DYNAMIC PERFORMANCE
tsett Output voltage settling time
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to
10%FSR, VDD = 5.5 V 20
µs
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to
10%FSR, VDD = 5.5 V, internal VREF, gain = 4 × 25
Slew rate VDD = 5.5 V 0.3 V/µs
Power-on glitch magnitude At start-up (DAC output disabled) 75 mV
At start-up (DAC output disabled), RL = 100 kΩ 200
Output-enable glitch
magnitude
DAC output disabled to enabled (DAC registers at zero
scale), RL = 100 kΩ 250 mV
VnOutput noise voltage (peak to
peak)
f = 0.1 Hz to 10 Hz, DAC at midscale, VDD = 5.5 V 50
µVPP
Internal VREF, gain = 4 ×, f = 0.1 Hz to 10 Hz,
DAC at midscale, VDD = 5.5 V 90
Output noise density
f = 1 kHz, DAC at midscale, VDD = 5.5 V 0.35
µV/√Hz
Internal VREF, gain = 4 ×, f = 1 kHz, DAC at midscale,
VDD = 5.5 V 0.9
Power supply rejection ratio
(ac)(3)
Internal VREF, gain = 4 ×, 200-mV 50-Hz or 60-Hz sine
wave superimposed on power supply voltage, DAC at
midscale
-68 dB
Code change glitch impulse ±1 LSB change around midscale (including
feedthrough) 10 nV-s
Code change glitch impulse
magnitude
±1 LSB change around midscale (including
feedthrough) 15 mV
POWER
IDD Current flowing into VDD(4) (5) Normal operation, DACs at full scale, digital pins static, external reference at VDD but the VREF pin is not
shorted to VDD
150 µA/ch
(1) Measured with DAC output unloaded. For external reference and internal reference VDD ≥ 1.21 × gain + 0.2 V, between end-point
codes: 32d to 4064d.
(2) Specified by design and characterization, not production tested.
(3) Specified with 200-mV headroom with respect to reference value when internal reference is used.
(4) Measured with DAC output unloaded.
(5) The total power consumption is calculated by IDD × (total number of channels powered on) + (sleep-mode current).
(6) When a DAC channel is configured in IOUT mode for long term and then switched to VOUT mode, the VOUT mode can show
parametric drift.
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6.6 Electrical Characteristics: Current Output
all minimum/maximum specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C, 1.7 V ≤ VDD ≤ 5.5 V,
±250-µA output range, and digital inputs at VDD or AGND (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
STATIC PERFORMANCE
Resolution 8 Bits
INL Integral nonlinearity DAC codes between 0d and 255d –1 1 LSB
DNL Differential nonlinearity DAC codes between 0d and 255d –1 1 LSB
Offset error DAC output ranges: ±25 µA, ±50 µA, ±125 µA, and
±250 µA; DAC at midscale ±1 %FSR
Gain error DAC output ranges: ±25 µA, ±50 µA, ±125 µA, and
±250 µA; DAC codes between 0d and 255d ±1.3 %FSR
OUTPUT
Output compliance voltage(1) DAC output ranges: ±25 µA, ±50 µA, ±125 µA, and
±250 µA; to VDD and to AGND 400 mV
ZOIOUT dc output impedance(2) DAC at midscale, DAC output kept at VDD/2 60 MΩ
Power supply rejection ratio
(dc)
DAC at midscale, all bipolar ranges, VDD changed from
4.5V to 5.5V 0.23 LSB/V
DYNAMIC PERFORMANCE
tsett Output current settling time
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to 1 LSB
at 8-bit resolution, VDD = 5.5 V, common-mode voltage
at OUTx pin is VDD/2
60 µs
VnOutput noise current (peak to
peak)
0.1 Hz to 10 Hz, DAC at midscale,
VDD = 5.5 V, ±250-µA output range 150 nAPP
Output noise density f = 1 kHz, DAC at midscale,
VDD = 5.5 V, ±250-µA output range 1 nA/√Hz
Power supply rejection ratio
(ac)(3)
±250-µA output range, 200-mV 50-Hz or 60-Hz sine
wave superimposed on power-supply voltage, DAC at
midscale
0.65 LSB/V
POWER
IDD Current flowing into VDD(3) (4)
Normal operation, DACs at full scale, ±25-µA output
range, digital pins static 42 50
µA/ch
Normal operation, DACs at full scale, ±50-µA output
range, digital pins static 56 70
Normal operation, DACs at full scale, ±125-µA output
range, digital pins static 98 120
Normal operation, DACs at full scale, ±250-µA output
range, digital pins static 167 200
(1) Measured between DAC codes 0d and 255d.
(2) Specified by design and characterization, not production tested.
(3) The current flowing into VDD does not account for the load current sourced or sink on the OUTx pins. The VREF pin is connected to
VDD.
(4) The total power consumption is calculated by IDD × (total number of channels powered on) + (sleep-mode current).
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6.7 Electrical Characteristics: Comparator Mode
all minimum/maximum specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C, 1.7 V ≤ VDD ≤ 5.5 V,
DAC reference tied to VDD, gain = 1x in voltage output mode, DAC output pin (OUT) loaded with resistive load (RL = 5 kΩ to
AGND) and capacitive load (CL = 200 pF to AGND), and digital inputs at VDD or AGND (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
STATIC PERFORMANCE
Offset error(1) (2) 1.7 V ≤ VDD ≤ 5.5 V; DAC at midscale, comparator input at Hi-Z, and DAC operating with external
reference.
–6 0 6 mV
Offset error time drift(1)
VDD = 5.5 V, external reference, TA = 125°C, FB in
Hi-Z mode, DAC at full scale and VFB at 0 V or DAC
at zero scale and VFB at 1.84 V, drift specified for 10
years of continuous operation
4 mV
OUTPUT
Input voltage
VREF connected to VDD, VFB resistor network
connected to ground 0 VDD
V
VREF connected to VDD, VFB resistor network
disconnected from ground 0
VDD
(1/3 –
1/100)
VOL Logic low output voltage ILOAD = 100 μA, output in open-drain mode 0.1 V
DYNAMIC PERFORMANCE
tresp Output response time
DAC at midscale with 10-bit resolution, FB input at
Hi-Z, and transition step at FB node is (VDAC –
2 LSB) to (VDAC + 2 LSB), transition time measured
between 10% and 90% of output, output current of
100 µA, comparator output configured in push-pull
mode, load capacitor at DAC output is 25 pF
10 µs
(1) Specified by design and characterization, not production tested.
(2) This specification does not include the total unadjusted error (TUE) of the DAC.
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6.8 Electrical Characteristics: General
all minimum/maximum specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C, 1.7 V ≤ VDD ≤ 5.5
V, DAC reference tied to VDD, gain = 1 × in voltage output mode or ±250-µA output range in current output mode, DAC
output pin (OUT) loaded with resistive load (RL = 5 kΩ to AGND) in voltage-output mode and capacitive load (CL = 200 pF to
AGND), and digital inputs at VDD or AGND (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
INTERNAL REFERENCE
Initial accuracy TA = 25°C 1.1979 1.212 1.224 V
Reference output temperature
coefficient(1) (2) 50 ppm/°C
EXTERNAL REFERENCE
VREF input impedance(1) (3) 192 kΩ/ch
EEPROM
Endurance(1) –40°C ≤ TA ≤ +85°C 20000 Cycles
TA = 125°C 1000
Data retention(1) TA = 25°C 50 Years
EEPROM programming write
cycle time(1) 200 ms
Device boot-up time(1) Time taken from power valid (VDD ≥ 1.7 V) to output valid state (output state as programmed in EEPROM),
0.5-µF capacitor on the CAP pin
5 ms
DIGITAL INPUTS
Digital feedthrough Voltage output mode, DAC output static at midscale,
fast mode plus, SCL toggling 20 nV-s
IDD Current flowing into VDD DAC in sleep mode, internal reference powered down,
external reference at 5.5 V 28 µA
IDD Current flowing into VDD(1) DAC in sleep mode, internal reference
enabled, additional current through internal reference 10 µA
IDD Current flowing into VDD(1) DAC channels enabled, internal reference enabled, additional current through internal reference per DAC
channel in voltage-output mode
12.5 µA
Pin capacitance Per pin 10 pF
POWER-DOWN MODE
HIGH-IMPEDANCE OUTPUT
ILEAK Current flowing into VOUTX and
VFBX
DAC in Hi-Z output mode, 1.7 V ≤ VDD ≤ 5.5 V 10 nA
VDD = 0 V, VOUT ≤ 1.5 V, decoupling capacitor between
VDD and AGND = 0.1 μF 200 nA
VDD = 0 V, 1.5 V < VOUT ≤ 5.5 V, decoupling capacitor
between VDD and AGND = 0.1 μF 500 nA
100 kΩ between VDD and AGND, VOUT ≤ 1.25 V, series
resistance of 10 kΩ at OUT pin ±2 µA
(1) Specified by design and characterization, not production tested.
(2) Measured at –40°C and +125°C and calculated the slope.
(3) Impedances for the DAC channels are connected in parallel.
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6.9 Timing Requirements: I2C Standard Mode
all input signals are timed from VIL to 70% of Vpull-up, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and 1.7 V ≤ Vpull-up ≤ VDD V
MIN NOM MAX UNIT
fSCLK SCL frequency 100 kHz
tBUF Bus free time between stop and start conditions 4.7 µs
tHDSTA Hold time after repeated start 4 µs
tSUSTA Repeated start setup time 4.7 µs
tSUSTO Stop condition setup time 4 µs
tHDDAT Data hold time 0 ns
tSUDAT Data setup time 250 ns
tLOW SCL clock low period 4700 ns
tHIGH SCL clock high period 4000 ns
tFClock and data fall time 300 ns
tRClock and data rise time 1000 ns
tVDDAT Data valid time, R = 360 Ω, Ctrace = 23 pF, Cprobe = 10 pF 3.45 µs
tVDACK Data valid acknowledge time, R = 360 Ω, Ctrace = 23 pF, Cprobe = 10 pF 3.45 µs
6.10 Timing Requirements: I2C Fast Mode
all input signals are timed from VIL to 70% of Vpull-up, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and 1.7 V ≤ Vpull-up ≤ VDD V
MIN NOM MAX UNIT
fSCLK SCL frequency 400 kHz
tBUF Bus free time between stop and start conditions 1.3 µs
tHDSTA Hold time after repeated start 0.6 µs
tSUSTA Repeated start setup time 0.6 µs
tSUSTO Stop condition setup time 0.6 µs
tHDDAT Data hold time 0 ns
tSUDAT Data setup time 100 ns
tLOW SCL clock low period 1300 ns
tHIGH SCL clock high period 600 ns
tFClock and data fall time 300 ns
tRClock and data rise time 300 ns
tVDDAT Data valid time, R = 360 Ω, Ctrace = 23 pF, Cprobe = 10 pF 0.9 µs
tVDACK Data valid acknowledge time, R = 360 Ω, Ctrace = 23 pF, Cprobe = 10 pF 0.9 µs
6.11 Timing Requirements: I2C Fast Mode Plus
all input signals are timed from VIL to 70% of Vpull-up, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and 1.7 V ≤ Vpull-up ≤ VDD V
MIN NOM MAX UNIT
fSCLK SCL frequency 1 MHz
tBUF Bus free time between stop and start conditions 0.5 µs
tHDSTA Hold time after repeated start 0.26 µs
tSUSTA Repeated start setup time 0.26 µs
tSUSTO Stop condition setup time 0.26 µs
tHDDAT Data hold time 0 ns
tSUDAT Data setup time 50 ns
tLOW SCL clock low period 0.5 µs
tHIGH SCL clock high period 0.26 µs
tFClock and data fall time 120 ns
tRClock and data rise time 120 ns
tVDDAT Data valid time, R = 360 Ω, Ctrace = 23 pF, Cprobe = 10 pF 0.45 µs
tVDACK Data valid acknowledge time, R = 360 Ω, Ctrace = 23 pF, Cprobe = 10 pF 0.45 µs
DAC63202W
SLASF73 – APRIL 2023 www.ti.com
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