B+K precision 530 User manual

00'93
Sctud
Sggllg
sloullll 'olecgqg
. 'lS puepoC.rllggtg. NOpVUOdUOC
NVOSVNAOlo lonpord V
Jolsol
Jolcnpuoclluos
08s

gt999sloullll'o5or1q1
faarts
PuoluoJ
fserv\
o9r9
Nolrvuoduo) NV)SVNAO
u3rsil
uorcnoNoilruss
otg13co1,ll
NOlSlClUd-y
? g
uoJ
lVnNVUlrNOlrCnUrSNl

6Z
8Z
LZ
LZ
9Z
9Z
€.^OC AINYUUVA\UVA
IINOCSIIWIT
ON SNOIICNUISNIIICIAUIIS
AINVIruVAI
8€ NOIIVNV-IdXg {
gt sesneq
rolcnpuocFues
roJ
qoqu{g pr?prnls
Vt suolllugoq
roleu?J?droJ
suollurnEguo3
rolslsrrurl
Et, sopolcnutz pw sopoKl
z€
Ig sJols$rr?rl
rulodrg
It lBreuec
SI^RMICO,tr.UVSSO'IC
XICNTIddV
sernpocord
oJrares
prBog'c'd 'c
' uorl?rqIPc
llncrrc4 'g
::::::::::::::::::::::
::
,',
.-
.-:r{jlf;}Hifit,'$,$frI
uorl?rqgJeJotszretery
qeg/eEe4url 'V
NOIIWSITVJ (INV !IJNVNIIINTVW
ST, fryncrl3 4 .g
E(, .{r1rncrr3
}sel u.rBC
.C
OC, fr]rncnJ lsel u \op>luorgleEqerl
'3
gI frlrncrr3
1se1
peg/pooC
.g
8I rlclp\S
lsal .V
NOIJ"dTJS!I( II.NJUIJ O€S'IgCOru
s.ucs
'g
seponnusz 'q
sepol( 'c
sJgc 'g
srolsFrr?rl
'v
Eur1sal
lncrrC-Jo-lno
8ur1se;
luenpurolul 'g
Eu4sa;.JJO-spuBH,,
'C
sopolc'3
s.ucs
'g
..i. ' s.Igd prr?
srolsrsrrsrl
'v
Eu4se;
lrncrrJ-ul
OTSTIICOW
IIHI CNISN
6 SUOIVJICNI (INV S'IOUINOJ
O€STIIOOW
IIHI IrIOgV AION)T
OI SCNIHI
S)NDI QNV SINIH
oo -ITIA| otsIIHJMA\ gO
I.UVWWnS
Cgrug
SNOIIVCIdIClIdS
SgUNIVgd TVIJAdS
i
I
t
LI
LT
LT
SI
II
II
II
OI
OI
OI
I
I
tI
i
1
L
9
9
s
n
,
a8e4
i
iI
SINEINOJ dO iI'IgVI
NOIIJNCOUINI

TheB&K-hecision
Model530Semiconductor
Tester
isde-
signedfor
in-circuit
and
out-of-circuitsemiconductor
testing,
with specialf'eatures
for nraking additionaltestsondevices
out-of-circuit.It usesa high-current,low duty-cycle
pulse
technique
to test transistors in the presence
of shunting
circuitry.
anda low-current
drivesysternwhichenablesthe
user to identify the ternrinals
of the devicein most
in-ciicuittestsandall
out-of-circuit
checks.
An exceptional
featureis
provision
forrleasurement
of
thefrequencyat which transistor
gain
isoneorunity.
This
is the fr ratingfor a transistor
and is applied
to bipolar
devices.
For out-of-circuit
measurements
of transistor
beta
and
FET gm, the low duty-cycle,
high-power
pulse
technique
providesfor testinghighcurrent
devices
atrated current,
up
to 2 amperes,
without over-dissipation.
The instrumentis designed
for a minimum amount
of
control manipulation,facilitating rapid testing of most
devices.
INTRODUCTION
SPECIAL
FEATURES
l. Patented
linrited-energy
pulse circuit permitshighly
successful
useof in-circuittesting
in the presence
of
low shunt irnpedances
with completesafety for the
deviceundertest.
Six-positionTEST switch sequentially
connects
the
device being tested in all possibleconfigurations
nrakingit unnecessaryto know the deviceterminal
identification.Canbe left in GOODposition sothat
additionaltests
canbe madewithout memorizing
test
position.
Base
or gate lead
identifiedby color asTestSwitchis
operatedwhen testing with HI drive. All leadsof
transistorare identified when testingwith LO drive.
GateleadisidentifiedonFET's.
4. Autornatic
polarityindicationto identify NPN
orPNP
bipolar devices andN-channel
or P-channel for FET's.
5. A-udibletone tells when the device under test is
good
- no need to take eyes
off circuit board while
testins
hard-to-set-atdevices.
Measuresbetaof low-power
and
high-power
transistors
in two ranges.
A special300pSEC
, l% duty-cycle,
high-current (1. = 2 arnpfor 0 = 200) pulsing
circuit
for accurate ttsting of power transistors
without
overdissipation.
Measures
& (gain-Uandwidth
product)of bipolartran'
sistors.
Measuresgm of low-power and high-power
FET's.
Both depletion-mode
and enchancement-mode
power
FET's
can
betested.
Measures
voltagebreakdown and reversevoltageleak'
age ratings up to 100V. Automatic current limiting
prevents
damageto devices
under
test.
Hasa compressed
leakage
meter
scale,which displays
a
wideleakagecurrentrange
on asinglemeter.
Clip-ontestleadsmakepositive
connections
to devices
in difficult locations.
Freesoperator'shands
to make
furthertests.
Choice of test leads or front panel sockets for
out-of-circuittests.
6.
7.
8.
9.
3.
10.
n.
t2.
il
-{
fi
{
I

'(Ex
tqd'sqr
6's
:IHSISM
('urc
Z'0I x tuc
L.g(,x
urc
tt)
'
,,?
x,,8/I'0Ix ,,glt-tI :gzls
'(puorldo) eqor4xageu,{q g-4g o
'peqddns'slueruarns?eru
4 roJ
speel
lsolUoqS o
'pagddns
sdrrc
{col-pFu qt!$ speel
}set
oerql .
:sgruossilJJv
'zHW
69- ,{cuanbar;
1sa1
i211141
00SI ot 0 = 4 .t.
'zHIN
91- ,{cuenber;1sa1
iz11y,q
00Sot 0 = 4 .Z
'ZHI
I 1 -.,{cuanbarg
}sa}
izHW
00I ot 0 = 4 .[
.VUJ
OI
'sllo^
g
:sa8uur
1se;
(paxU)
]uerrnc
lsel
:a8u11ol
1sa1 .
:SINSIAIiIUNSVEIAI
{
'o^up
o-I r{1!r\
pJru
t. o}dn
'a^lrp
IH rlll^\pJur
sI 01dn :ecuelrcedu3 .
'e^lrp
O-I
W!lr\
suqo
{S'I o}u/r\o(]
'e^lrp
IHr{}!r\
srur{o
0I 01u.,r\oo :ecuBlsrseu.
:rssr
(vs/oooc
OI'IVA UOC SflN'IVA INNHS IINJUIJ.NI CNIIIWI'I
'
e1c,tc-,{1np
o61
fiapurxordde
te paslnd yur 0I @ UAld HCIH isnonurluoc
Vr,gS @ UA\d it\OT :luorrnJ e^rrq es?g ?teg
'(Vr,OOt)A 00I ol A 0I puu
(yru 9)
A 0I ol 0 :lsel eEe>pr1roJ aEellon osre^og
'puoJos
nd 2:e]BU
uorlleday 1se;
'a1c,{c-,{1np
%v}?vru 00I :e^lr(Iro}cello] o
'01c,{c-,,{1np
%V
tv
(anppOl) Vtu 1ro (erup IH) Vru 0OZ:e^rrpes?g .
:SINflUUNf, ISgI (IflI'IddV
'zHC S'I ol dn(srolsrsuurl
rulodrq go lcnpord-qlpl/npueq-up6) 4 serns?eni .
's.IgC renod-qEg pue
-^\olroJtuE
ernspol4l .
'srolslsrr?r1
rarvrod-q8H
prrB
-^to[
roJSlsarnseery .
's.IgC goe8u4uelale8
puu
SS(I1
sornseol4l .
'sepory
puu
s.UJS
'srolsrsuurl
roy
vru Sol Vr/ S'0ruoUECVXVgT esra^er
serns?en o
sepop ptrB s.uJs 'srolsrsuerl
roJ A00I ol dn efellol u/nop{Berq sern$an o
'roloc
p30l
1sa1
,{q UJS ro rolsrsuurl
Jo spBol IIB sreur}uepl .
'ro1oc
puol
tsel
fq tEg Jopuel
elu8sag4uapl o
N
s?
IECpu'dNd
ro
NdN
'n,orrrruntTrffi"$: o
's,UJS
ro s6IgC 'srolsrsuerl
roJ lsel CVS/OOOC o
:IINJUIJ.CO-INO
'sepory;o
,{1ue1od
sagrluapl o
'uf,s Jospsel
IIB
seulluapl o
'eAIJp
61 Sutsnueq^\ rotsrsuerl
Jo speol Ip seurtuapl .
(arup p1)rolslsuurl
Jo psel esuq ro IEC Jo peel ele8 seurtuapl o
'leuuBrlJ
d ro
N s3 IEC puB
dNd ro NdN sB
rolsrsusrlseunuepl o
's,U)Sro 's(IEC'srolsrsuert
roJ
lsetAVg/COOC, o
?
i
)
:
l
i
%0t
%sz
%sr
obgr
objz
%02
%0r
%0r
%0r
%br
%L
%L
. tuerrnc
,ananJl
. (remo4-no1 puu--qBIH)
tu|
(reno4-mo1pue
-qBfH)
i,lrg
'f, o0s-0
@'J ogC
@'J o9(,
@lueluaJns?aH
pealuur?nC Jecldf;
SINIII4IITUNSVIII4I
ISgI CO
AJWNJJV
SNOIIVJIdIf,EdS
:IINJUIJ.NI

BRIEF
SUMMARY
OFWHAT
THE530
WILL DO
{I
iI
l
{
tt
T
il
,ru
{
{
4
k
fl
*id
"d
{
'q
&
{"
*,j
s
f,
J
.:1
j
.'{
{
{
I
il
il
il
9.
Transistor
Collector
(case)
Base
Emitter
1. Determines
good
orbad
transistors,
FET's
or SCR's,
in-
or out-of-circuit.
2. Determines
good
orbad
diodes
in' or out'of-circuit.-
3. Identifies
Emitter-Base-Collector
leads
of transistors.
4. Identifies
gate
lead
of FET.
5. Indicates
polarity of gooddevices
(NPNor PNP;
N or P
channel).
6. Identifies
Cathode-Gate-Anode
leads
of SCR's.
7. Measures
all breakdown and leakageparameters
of
transistors.
8. Measures
lpg5and
gate
leakage
ofFET's.
9. Measures
BVggg
oftransistors
and
PIV
of diodes
upto
100
v.
10. Measures
reverseleakage
current
of diodes.
11. Measures
fr of bipolar transistors,
in 3 ranges:
0-100
MHz,
0-500
MHz,0-1500
MHz.
12.Determines
whether
device
is
a
transistor,
FET
orSCR.
13.Will test newpower
FET's,both enhancement
and
depletion
types.
HINTSAND KINKS
IDENTIFYING TRANSISTORS
AND DIODES
1. Nearly all germanium
transistorscomein .rnetal
cases,
either the tubular type with flexible leads,
or in the
standard
TO-5
package.
2. Power transistorsin stud packages
or in the TO-5 or
TO-3 canbe eithergermanium,
siliCon
or FET. Two-
andthree-digit
2N-numbersare
mostlygermanium.
3. The T0-66 power transistors
andthe plastic
powertab
packages
are nearly always silicon. The collector is
usually,but not always,connected
to themountingtab
and the center lead. This alwayscanbe verifiedby a
continuity check between the collector pin and the
mounting
tab.
4. Thebase
leailof mostmodernplastic-type
transistors
is
either the center lead or the right-hand lead when
facing the flat side with the leadsdown. In the latter
case,
thecollectorlead
isin themiddle.
5. Most plasticFET's havethe gate
leadon theright side
when facing the flat sidewith the leadsdown and the
source in the middle, but there are exceptions.In
nearly alljunction FET's, the sourceand drain canbe
interchanged
with no adverse
effects.
All transistorswill have some gain with the collector
and emitter leadsinterchanged,
with the exceptionof
Darlingtons.
Germanium
signal
diodes
usuallycanberecognized
by
their transparent
hollow glass cases
with eitherthreeor
four color bands,
or type numbers
printed on them.
Silicon diodes usually are painted because
silicon is
light-sensitivg
urd must be protected from ambient
tiftrt. fne "moose" types,suchasthe'stud package,
canbeeithergermaniumor silicon.
8. Power FET's in TO-3 packages
generallyhave lead
configurationssimilar to bipolar transistors,
with the
following comparisons
:
6.
7.
FET
Drain
Gate
Source
10.
The APPENDIX to this instruction manual provides
theschematicsymbols
for devices testedby the Model
530. This information should be usedto identify the
device
prior to testing.
An extensivelist of semiconductor
test and operating
parameters
isprovided
in theAPPENDIXalso.

-r..
I
.l
I
I
I
I
{
:
I
I
I
I
I
i
I
t-
I
I
!
I
i
I
I
I
t
I
t
i
i"
'ITOSflU
AVh[CNIOVEU
ACVXVg'ISNOIINOUUII
NV
'asIA\ugHJo
:lNgluEunsvgru
actrxvilT
EHI CNIUNC
STVNII^NIII
IIJIAECAHI OI
CgIJANNOf, UEJEI^I
gHJ IINVET
ION OC
!ION
-
Jo
sruu*urel
ar{}
ssorc?percouqo}:TtJt,i"1il
i,i|]l;}l
ecuapedul-€H e 'Surpuer
tuarrnc raleu NIVC/iICV
-XVE^I ur aEueqc
ro asuerrur
uoppnsu f,q parrrasqo
su 'a8u_11o^
u^\op>luerq
lcexe eql umlqo oI .uorlur.u
-xordde u?sr leu?d lorluoc eql yo apcs aEello^
eql .g
'Vrt00I peecxe
lou [m ]uerrnc
pel?crpu eql sllo^0I e^oq?
u^\op $parq ecl^ep
er{}
JI
'1uau1sn[p?
SITO1 ECVXVg] eql;o Eurllas
a8e11o,r
eql Jo sselpru8ar
'apcs IInJ ,(laleuxordde el?Jrpur
IIIiy\
relotu eql 'sllo^ uol ^\olaq u/y\opq?erq uorlcunl
'3cr^ep
3 JI ,vrro0l o1 peuu{ sr }uorrnc eqt suo^
0I e^oqv 'Vur S o1 pelnurt {gecrluuro}nesr }uerJnt
aql sllo^0I Jo aEu11o,r
1se1
? ol dn 'lsel repun eJr^ep
u o1 a8uu?p
Jo ,{lgrqrssod
eq} el?u1u[e ol .Bur1rurq
-
JuerJno
crl?ruolnp
qll^\ peplaordsr lsel repun secnep
o1pallddusrleql e8e11o,r
lset SITOA 1ICVXVET ordl .l
'lselrepun
0cn0p
er{lJo
?leq
eql o] Surprocce
selru^
(cI) tuarrnc rolconoc pe^rosqo
er{}'luelsuoc
sr
(91)
e^upesuqeq}asnucag
.a1cfc
,{1np
%I pue QgSrt699 ,,{leluurxordde
ro; paqnd 'Vtu 0I
lnoqusr91's1sat
Bloqrolsrsu?rl
ranod-q8nr
rod .lsal
qre8CC orl?ls e lsnf 1ou 'suorlrpuoJ lncric-ur-.(ueur
Eurlulnurs(sulqJC uodn pesodrulredns
'pu8rs ilBr.us
'elelr\ arenbs)
l.selJnuuur{p
e sr lse} ?}eq remod-no1
eq]^
'oslv 'luaJJnc luulsuoc 'Vr,0S flaleurrxordde
q (t{l) }uoJJnc
aszq's1se1e}eq
Jolsrsuerlra,trod-zl\ol
JoC 'S
'uorlrsod
o^rrp
IH eql
uI e llrsuosOror.u
sr lrncJrJuorlcelep 0€s Iepow OqI
'IgC e eq ol u^\oDI sr petsal Suraq
eJr^ap
oql ueq/r\
IH ol les0q
plnoqsqc4 \s iIAruC aq1
's.ggg uorlcunf
ItB,
roJ tsat peq/p-oo8
p11e^
g,,-ernsq o] 'arogereqg
'o^lrp O-I,q poo8 lsel rulrr ulE ,{B1q
e qtp\ s.IgC
,{1uo
1nq'e lrp IH ro OT reqlro
w pelsol
aqu?cs.IgC .t
'peurtuepr
eq uucrolsrsu?r]
eql Jo pBel
as?qaq1,{1uo'1n!".1sb1
poo? plle^ ? IUlssl srql '^\opur1\ uorl?curluepl p?e.J
aql'ul roloc ESVg auus eql Euneq suorlrsodqrll/r\S
lsol tueJutpe
orw urpooE
lsal .{eur
..Blog
asrarrer,,
qBnI
.{lunsnunq}l^\ sJolsrsu?rlro sro}srsuur1.(cuanbarg-q3q
',sesuc
a&rur
eqlosuJ 'uorlrsodr{ctlus $e;-.,auo,{1uo
ur
osop grmpoo? lsel luql srolsrsrrerl
lsoru 'alup OT uI .E
u'clolsrsrr'rl
eql
'asec
raql,,
", .;gfr',rt#itTttlffirXi
auo[1uo ur poo8 lsel [rA\ rolsrsu?r]aril ',ro1 .,fuaa
sr
Jolslsu?Jl
0r{l
Jo..?^}aq
-asJe^eJ,,
oql Jo'papnqs flpueq
sf
ltncrtc
eqlJI'pa8uegcrelp erurellFue prre
rolJelloc
eql ueq/r\(utaq asralar) unE auos a^?q srolsrsu?r}
osnpJeq
q sFII 'suorlrsodqclp\S lsel luecetpv om1
utn
osop 1ym poo?lsel lur{l srolsrsrr?Jl
lsoru,elup IH uI .Z
's.,{urru
epolp
ptru
scurp
'scurrl
:apnlcu esoql'l,sel touuor 0ts eql qcruA\
srolsrsuBrl
eu {ool }Br{}
socl^ep
ro}cnpuocruos
ureuoceft aroql 'I
i.r
t:
a
's[elapelBcsreletu
NIV9/ECV)Vg-I peF]ep
roJ ..SUOI-VJIONIANy S.IOUJNOJ,, repunZ .Ell
ol reJay_'sdutu
7 ro 'seredru?ryIur
0002 o1spuo{serroc
002 Jo Eurpuer
epcs IlnJ eql ,spro^\reqlo ul .ue1
Jo
uor1ecld11lnu
?{q saredur?ilIur
pn}Je ol peue^uocoq
u?c
obuur
IH or{t
Joelurs
00tr-0
aql .}sel
repun
(s.Igd
ro;) luarrno ururpro (srolsrsuerl
rog)r'uarrncroiiopoc
Jo lunotuu a{l 01 lBuoruodord
sr olecs
B]eq ranod
IH oql 'retotu NIVC/:ICVXVE-I ol ecueloJolfq
'suorlrpuoJ
lsol eql rapunsecr^ep rerrrod
r.oJ
luerrns
ururp
ro rolcelloc
aq]aurrurelep
o1
elqrssod
sl 1l
.s.IEC
puu srolsrsu?rl
Jo stsel urC pue elaq Burturo;red
uI .9
t
,1.
i
I:
i-
OTS
-IEOOI,II
EHI INOSV MON) OI SCNIHI

1
i
1
I
.{
#
k,t
eiil.1.
;".
i
H
I
I
I
\qi l
{*
ft
,1
t
l
,;
f{
'o
{-)
G'
()
.-
#tr
.d
C\€
Ftr
cg
(n
Fv
Lr
#Fa
A
(t L)
FO
ca
111
-q)
€
A
{:
-F
cb
.-
Tr
&.-
tII
:
,i
{I
T

'ale3s
srqluo sJolsrsuell
lennod
Mol lo elaq peoU
'e6ue:
luollnc eu OOOZ
ol 0gI sentOsrql '01 Aq
sraqurnu
polecrpur
6urAldrtlnu
Aq
eur
ur
peol
aq uec
lsal Japun
ocrnap
lannod
q0lLl
lo luollnc
ureJp
lo lolcollos
lenlsv
'olecs
stql
uo s,IlJ
rs^ od r',lol
lo u$ peag
'alecs
srqluo s,Ill
rennod
q0!q
'o u$ peag
uorleurxordde
crurqlrre0ol
luar.uOas-y
e sraleos
SSal/aOe)eal
'alecs
sltll
uo sluolJnc
SSolpue
e6eleal
peag
'alecs
srrlluo slolstsuell
rennod
q6lq 'o etaq peag
'sel?rs
retatu
umE/atqerl .Z.tld
I
I
I
I
t
I
I
I
I
t
I
t.
i.=
t-
I
('Z'Elg eeg)'sluetuernsueru
UFE prrs aEnpal lrncrrc-Jo-lno 11e roJ rolecrpuJ
'relel4t
IxJ-Jo-Ino NIVg/gCVXVgr
'(f t) qclp\s a8uer
qlft\ uorlJunluoc
uI pesn
uoq^\ lsel Jepunrolsrsrrsrl
roJ uorl?Jlpul 4 sepr^ord
'ralel'\l
IInSuIJ-go-Ino rJ
'slueruoJnsueru
4 JoJ
oSuerfcuenber3
slcoles
'{ roJrlclp$szHI^l'flcNvu 'l,I
'fpo srolsrsrr?rl
NdNJosluouerns?eu4 roJposn
'4 roJle{cos NeI rols$uB{ NdN 'gI
',{1uo
sJolsrsrreJl
dNdJoslueueJns?eru
4 roJpesn
'{ roJ le{cos $aI rolslsuB{ dNd 'sI
'(uorlucuddu
ro; pesserdap
aq tsntu qcllr\S ISSI-OI-HS1fl stsel u^\op{Borq
eEe11o,r
pue eEulealroJ e8ellol lsol eq] lsnfpuol pesn
'lorluoJ
sI.IoA ilcvxvgl .nl
'(lt) Iolluoc SITO1 gCVXVIIT
et{t E_u1sn
ueq \ sluotuernsuoru urnopryeiq aEelprr
pue eSapel umtqo o1 passerdep
eq lsnu qclr \s srql
'rlrll,r\s
Isglol-Hsnd'€I
'lsel puq-pooE
aqlq pelq8[
q '(U) ro (t) 'lq8[ qrlq/h l(q peururelep s uorlrsod
r{c}l/l\s perrnber aql 'sluotuernsBeru ure8 puB a8u
-ryel llncrlc-Jo-lno roJ suorlrpuoJ
1sa1
radord slcelag
'qclp\S rolcales NeI dNd/NdN
'uo peurnl sl1run
ueq \ dn s1q3[
Jol?crpur
luacefpuorII 'JJo ro uo ralrod lrun suJnl
qcrp\s
No-uilMod
's.rgc
s? [o,r\ spsrolslsu?r1relodrq o1 sa[dde sF4J.seJr^ap
remod-qEq ro renod-/$ol roJ suorlrpuoc lsel slcales
'qrl!,r\S rolceles $eI Ui{d IH/UMd O.I
'slsel
IgC ro rolsrsrrer1roJ suorlrpuoclsel perrnbar
slceleg
'qcllr\S rolceles pa; uf ffIC/VIgg UOISISNWI
larrs
1se1
erqpru
owerq?sp,"oilJt.f,i;'Htti.oi{
'qclprrs
No-uiDlvilds
'(9) s1a>1cog
p?e.llsel Joesoql
qlp\ Iellared
urpalceuuoc
,tlpuralur
erB
lo>lcos
sF{lJosl?urturel
eql 'le{cos sr,qlo}ur eJr^ap
aq1Eu4rosutl(q porurograd
aq wc. s]se]lrncrrc-Jo-lno
'la{cos NaI ecpeo
'sIBUrruJel
ectlrep
Jo uortecgpueplroJ (t) ^topuvy\
uorlecurluepr
psol eqt o1pafo4 or3srolor er{I 'lrun egl q}I/Y\pep$
-ord spual
lsol aql roJ selc?ldacor
aru sle{cos esaql
'sle{cos pBe"J
NeI
'slseluollucll4uopl eql rog
parrnbor
sle^el
o^lrpslceles
'qcil,rs
il^ruo
'uorlBcurluepr
puel
pue
Eurlsal
JoJ
suorlcouuoc
ecnepredord
slcoles
'qclprs$eI 't
'(9) slelcos puoT
tsel oqlJo esoql
o1
pa,{e>1
eff ^\op
-ur^\
0q1ursroloJ'lsel ropunecr^ep
Jo spuel
sorJrluepl
',r\opq^{ uoll8clJlluepl pBe.I
'pooE
slsellgc Ieuu?qc-d
ro rolsrsuurldNd ? uer{
\ slq8n
'rq8n HJ-d/dNd
'poo8
slsol
lgd leuu?rlc-N
ro rolsrsrar] NdN rr?
ueqikr
slqBIT
.IqEN HJ'N/NdN
'6I
'8I
'0I
'6
'8
'9
's
.L
'€
'71
L
.I
.II
(t 'qg o1re;aA)
SUOIVJIONI ONV S'IOUINOJ

USING
THE
MODEL530
I
{
IN-CIRCIIT TESTING
CAI.]"fION
Makesure
all power is turned off in the circuit
being tested, and that all capacitorsare dis-
charged.
A. Transistors
andFET's:
1. Setthe DRIVE Switch(5) to the LO position.
2. Connect the three test leads
(in any manner) to
the threeleadsof the device
you wishto test.The
test leadsmust be pluggedinto their respective
color Testkad Sockets
(6).
3. Move the Test Switch (4) slowly through its six
positions
until oneof thetwo red
lamps
(1) or(2),
glows. A tone also will be heard if SPEAKER
Switch (8) is ON. The lamp that glows
indicates
whetherthe deviceis NPN (l) or PNP
(2) or N oi
P channel.
In LO drive, most transistors
that test
good will do soin only one Test Switch position
(see
"THINGS TO KNOWABOUT THE 530"). In
this Test Switch position, all the leads of the
transistorcan be identified asshownin the I-ead
Identification Window (3). Most FET's will test
good (LO or HI drive) in two Test Switch
positions having the sameBASE color shown in
the IBad Identification Window (3), since
practi-
cally all junction FET's are symmetrical. The
BASE color indicatedis the gate Ieadof the FET.
4. If thereis no goodindication (neitherof the two
lamps glows) as the Test Switch (a) is slowly
movedthrouglrits six positions,
in LO drive,then
the deviceundertestisoneof the following:
a. Device with high leakage or very low gain
(-uy not function properlyin circuit).
b. Devicewith open/shortedelements.
c. Device with excessive circuit shunting (see
"SPECIFICATIONS").
d. FET that will not testwith LO drive.
5. Re-testthe device,using HI drive. In HI drive,
most transistors that test good will do soin /wo
adjacent Test Switch positions having the same
BASE color shown in the kad Identification
Window. Only the base
leadof the transistor
can
thenbeidentified.
6. If thedevicetests
good
usingHI drive,then4(a)or
4(d) above
couldbetrue.
7. If the device doesnot testgood in anyTestSwitch
position, in HI drive,lemovethe device
from the
circuit and re-test using OUT-OF-CIRCUIT pro-
cedures.
B. SCR'S:
1. Set
theDRIVE switch
(5) to theHI position.
t0
2. Connect
the threetest leads
(in any manner)
to
thetfuee
leadsof theSCR
you wishto test.
3. Move the Test Switch (4) slowly through its six
positionsuntil the NPN lamp (l) glowsin one
position and PNP lamp (2) glows in another
positionhaying adifferent BASE
color asshownin
the Lead
IdentificationWindow(3).
4. The SCR
is good only if the followingindications
are
obtained:
a. One
NPN.
b. One
PNP,
NOTE:indications
must
not have
sameBASE
color.
LEAD IDENTIFICATION:
a. The BASEcolor shown
in the kad ldentifica'
tion Window (3) is the gate lead when the
NPNlamp
(1)glows.
b. The BASEcolor
shown
in thekad ldentifica'
tion Window is the cathode lead when the
PNP
(2) lampglows.
5. If the SCR testsbad, then it shouldbe removed
from the circuit and testedagain
(muy be subjebt
to excessiveshunting in-circuit), using out'of-
circuit
procedures.
C. Diodes:
l. Set
LEAKAGEVOLTScontrol(14)to zero.
2. Set Test Switch(a) to top position(Green
base
identification).
3. Set
NPN/PNPSwitch
(12)to PNP.
4. Connectthe blue andyellow testleadsacross
the
diode
to betested.
5. Adjust the LEAKAGE VOLTS Control (1a) to
approximately
l0 volts,asindicatedon the con'
trol panel.
6. Depress the PUSH-TO-TEST
Switch (13) and,
whilekeeping
thisswitch
depressed,
rotatethelest .
Switch (a) to eachof the upper two positions.
(Green
base
identification.)
7. While performing step 6, observe
the resultson
LEAKAGE/GAIN Meter(19). The meter
reading
will beapproximately
full scale
for one
positionof
Test Switch ( ) while the other position of the
Test Switch will givea lower reading,depending
on the shunting effect of the circuitry. In the
position givingthe highest
reading,
the
cuthodeof
ihe diode
under
test
is connected
to thetestlead
having
the collector (C) color in the Lead
Identifi'
cation Window (3). If both positionsproduce
full-scalereadings
the diode is either shorted or
heavily shunted by low-resistance
circuitry; for
example,a transient suppressor
diode across
a
relay
-or a solenoid coil. In this casethe diode
should be disconnectedfrom the circuit and
re-tested
using
OUT-OF-CIRCUIT
procedures.
:
:
I
{I
II
{
I
,!
't
J
t?
#
\

j
II
NIVC/gCVXVAT oql
Joalecs
tuE
elurrdorddu
eqluopo^rosqo
sl'tuE
ro um8
eql pueIAC B
sl1!e1
repunocr^ep
eql ,uolllsod
ruE
lgc eql
ur (6) qrtrl(s uE lgg/vrgg UOJSISNVuT
aql qll/y\ peulBlqosI Eurpuer
B JI 'IEC e
sl
lselrepun
ecr^ap
eql
JI.,p,,
dols
urpeurulqo
srSurpeer ou luql os patfrsepsl 0€S IOpoW
eql 'uoll?culluepr orr^€pul pF raqunJ e sv l
'(peEuuqc
-Jelur rallrua puu ro1ca11oc)
?1eq esJeler
oql sl Eurpeer
?leq reaol eq1EunF uo4rsod
r{rll/r\s }sel eqJ '(l) qctns lsel ;o uorlrsod
radordeql ol spuodsarroc
Surpuarraq8q aql
'(61)relau uopeurulqo
Eurpeor
Bleq
eqt o^res
-qo puu uorysod VIES UOISISNVUI eql
ut
(6)
qcrlr\s
uE tgg/vrilg uoJsISNwr
oql ploH'(g) nopurll uortrBcurtuepl
pue.l
aql ul pe^I3sqo
s? uorl?cullueplroloc 0s3q
etu?s
eql wq qcrq^r uorlrsodluecufpueql ul
(t) qclpts tsoJ,
er{leculdueql puu oloqu 6.p,,
dels
;o EurDear
?laq aql alou 'uorl?cgrluepr
puelradord rqt tnoqu tQnop
,{ue
sr areq}
JI
'alBcs
rlsBe
uo ,{ncerlp
ual6 sr Eurpuar
uleq
at1l 'pe}celos
sr (Ot) qctprs go '.,t1elr1cadsar
'uo111sod
UA\d IH ro U/1d O.I or{} roqtarfr\
uodn Surpuedep
(61) relau Jo elecs
(d) elaq
IH ro OT er{luoureErolsrsu?rt
aqt
peag .(61)
ralel4J
NIVC/ACVXVSI egl o^resqo
prru
uorl
-ls9d
vrEguorslsNvur eqrol(o)
qcrps
L..d ISC/VIES UOISISNYUI EI{I UINI
e
q
uuc
I
se
1
?
1
a
q
;
i,",i:lll-';L
fiT,i
"i"t'?H:
-Jifi
e'1ceg
u1
'suollrSod
qloq urpelsel
grpaEuuep
eq lou [r \ ro]srstruJl
er{} 'ssepreEar
isuorl
-ecrlddu
relrod-lro1
ro rerrrod-q8p1
roJ
pepuolur
sr1r Jer{leq/y\
selBcrpur
,(lpraueE
aas pcrs,(qd
0q1 'lsel ropun rolsrsusrl or{t roJ alqBIrsAB
sIuorlBruroJul
ouJI 'pe1s01
eqol rolsrsu?r]
Jo
ad,{1
aq1uo Eulpuadap
'uorlrsodelupdordde
aql q (Ot) r{cll^S UA\dIH/U1r\d
O.I oqt eculd .c
'(O to (t) tqBU
lsa1
poo7,{q
palecrpur
uorlrsod
eql ol (Zt) r{cll^S dNd/NdN er{t}oS .q
'peurtuapr
,,{pedord er? spual rolsrsuurl IIB r{Jlrl,tl
ur uortrsodaqt q (t) qctpr\Stsel eqt ec?ld .e
:slsel8lefl
'u/r\op{?erq
aEulloa
pu? 4 'eleg roJpe}?nlB^e
raqlJnJ
eq u?c poo8 slsel qcrqt rolsrsuurlV .e
'uol8urpuq
esr
ecl^ap
1eq1
Eur.,{ylro^
reUB
'elup 11 tursn
'1sa1-og
'a8u11on
e^lrp es?q qEyq
sarrnbar
qJlqrr\'ad.,{1
uofuqruq ra^\odu srecueC @)
'Eurpaacord
erogaq,tJgaA
'a^rrp ol qlp\ lset lou [Lr\ 1?q1
IEC (g)
.stuauele
palroqs/uado
qlpnecneq @)
'(tFc
-rrc w ,{padord uoqounJ 1ou ,{utu) uruE
rrrol
fre,r ro e8e>1ualqEF{
q}r,n rols-rsu?rJ
(f )
:Euurrolog
0rl1Jo
euo$ lsel repun ocnop eq] ueql 'alup
O-Iq'suorlrsod xrsslr qEnorglpo^oru,t1no1s
q (t) I{rll^\S }sol eq} se (smo1Esduel olrr1
er11
Jo roqlleu) uorlecrptn
pooEoa sr eror{l
JI
'(g) aropul1\
uorl?cglluepl pBrI oqt ur rr \oqs
s3
pourluepl0qu?Jrolsrsu?rler{l
Jo spBol0q}
ge'uorlrsod
qclrng lsol sIItruI '(.,0€S
gHI
JnOgV A\ON)I OI SCNIHL, eas)uorlrsod
qcll/r\s $eL auo .,(1uo
urosop1p,r pooS 1sa1
IBI{1
srotslsu?rt
}soru'elrrpOT uI '(Z) aUa ro
(t) NaN sr
ocr,rop
orllreqleq^\sot?crpursrnop
1uq1
durel eqJ 'NO st (g) r{c}!r\SUgXViIdS
Jr
pr?eq
eqIII \ osle
ouoly 'snop '(Z) ro (t)
'sdurul
per o^u eql Jo euo plun suorlrsod
xn
sg qEnorql f1no1s (t) qcll,us lso1,
oqt e^o4
'(q)
slo{cos p?oT
}sol roloc a,ulcadsor
Jreql
o}ul
paEEnld
eq lsntu spuel
lsot or{I '}sol ol qsr^\
no.,{
rolsrsu?rl
eq}
Jospuel
oerqleqlo}(rauueu
fue ur) sp?el
tsel eorql eqt lceuuoc ro '(1)
10{Jos
}sel Ocnecolq rolsrsu?rl
eql lJasul .q
'uorlrsod
OT oqto] (S)qclp\S iIAruO er{t}oS 'e
'(srolsrsuerl
ptfrs pue rarnod)
qsagp?g-poog 'I
:sJolslsuB{ 'v
9NIISgI IINf,UIJ.dO-INO
'slueuod
-tuoc elorcsrp
yo Surlooc prdur Surprrrord
roy InJesn
ellnb sr ..furdg ploJ lu?lsuJ,,
Jo u?c V 'euol luel
-lrturelulu?,{qpet?cpureqru/I\
rolsrsu?rl
trua}lrture}ur
uy 'Eurlooc ro 'Eurleaq'Eurddel
s?
qcns s1sa1
pcrs,,{qd
snorJ?Ao1 pelcalqns
eq uec Jolsrsu?Jl
arn 'uorlrsod
sF{}
q ots eql 8unue1
'uar{I 'prBor{
sr euo} eql I}un
qcllr\S ISSI eql e otu pu? srolsrsrr?r1
palcadsns
eq1
01
sp?al
lsel aql lcauuoJ 'lrncJrc
B ur srolsrsu?Jl
luel
-truralu {g11uap1
o} pasn
oquec
0€Slepory
ar{}uaUO
:Eu11sa1
luelllrurelq'iI
'pr3oq
'J'd eqlJo oprs
reqlleuorJ socr^ep
1sel
o1(puo4do)
Egoud s-dcTaoow xlncvN^C uolsrrerd-)
TI
eql esn osIBuuc no,{ 'arnluag slq} qllA\ .sp?al o^u
Eururuurer
aql eqordol oer; eq ru,!\
spu?q
qloq .eJr^ep
oql otuo paddrlc aq u?J p?el euo JI 'petset Euloq
echep eql ol speel aefl{l IIB }ceuuoJ ol elqrssodur
sI
lr ueql\ro 'lrncrrc
uursJolsrsu?Jl
Jorequnu e1sol
ol
frusseceu
sr
1r
uer{^\
InJesn
sr
poqleu 6JJO
spu?H,,
eql
'euol
uacnpordo1
paEueqrrelw
oQ
o1
eluq,{uru
sp?alrel}nue
pu? Jolcelloc eql 'r{luuorsecc6'pooE sr Jolsrsu?Jl
oqt uaq/t\
no,t 11a1
[r/r\ ouo] olqryn?aql 'flaarlcedsar
're11nua
puu rolcoiloc oql o1 spuolno11a,{pw enlq
eqlpuu'esuq
aql ol puel
uearE
aqtSullcauuoc
,{q.euo
-r(q-euo
paqordeq uaql uuc srolsrsuurl
aq; .uorlrsod
lsourreddn eql u1 gJl,r\S lsel agt e^ual 'pegrluopr
eq wc petsel SuraqsecnopJo peol aseq eet ueqrt\
II
I:
li
I
i
.:
'c
'p
{ -ti
I
ri;
:3uJ1se1
6.JJO
spuE{,, 'O

meter
(19).
3. fr Tests:
Measurement
of the fr parametersof bipolar
transistors
is complex
in theory andperformance.
A detailed explanation of fr measurements
is
providedin theappendix
of thismanual.
Whenmeasuring fr, it is importantto know that,
with sometransistors.
the samemeterdeflection
may occur
on two ranges,such
asthe 0-100
MHz
andthe G500MHzranges.
Thefr of thetransistor
is always the range
readingthat gives
the highest
numerical
value
(in this example,
the readingon
the0-500rimge
applies).
a. To obtain reliable
information regarding
the
frequency characteristics
of the transistor
undertest,theleadidentification
and
polarity
of the device
must
beknownasdetermined
in
the
previous
tests.
b. Insert the transistor under test into the
appropriate
fr testsocket
(15) or (16). The
transistor leads must properly match the
socket
leaddesignations.
If the device cannot
be made
to fit into the socket
provided,
use
the three-lead
adapter
providedto makethe
connections
to the transistor.
Note that any
additional
leadlengthcan be detrimental
to
the accuracy of this test; therefore, the
three-leadadapter should be used only if
absolutelynecessary.
c. Setthe fr RANGE MHz Switch(17) to the
0-
1500 range
and read the value on the fr
meter
(18)
onthe1500
MHz
scale.
d. If thereading
isgreater
than300,thisisthefr
of thetransistor
under
test.
e. If the observed
reading
is lessthan 300, set
the RANGE, MHz switch(17) to the 0'500
range and observe
the meter (18). If the
reading
is greaterthan 50, thisisthe fr of the
transistor
under
test.
f. If the observed
reading
islessthan50,setthe
RANGE,
MHzswitch
(17)to the
0-100range
andobserve
meter
(18). Thisis thefr reading
of the transistor
under test.Theaccuracy
of
readings
below
5onthis
rangeis
questionable.
E. If there is a difference in readings
on two
ranges
where the scales
overlap,the largest
absolute
valuefor fr isthemostaccurate.
NOTEON VOLTAGE AND
BREAKDOWN
TESTS
All voltageand breakdown
testsoutlinedhere
eliminate the need to know the devicelead
identification whenbeginning
the test.In cases
when the devicelead identification is known,
the following table indicates the connections
required for the device tests. The indicated
positions
of TestSwitch
(4) correspond
to the
uppermost for position I and the adjacent
position for position 2. Both of these
Test
Switch positions
have
the green
base
identifi-
cation in [rad ldentification Window (3).
Connections
can be made to the test leads
provided
or thedevice
can
be
inserted
into Test
Socket (7). The required connections are
indicated
by an "X". Whereno connection
is
required,
"NC" is
entered.
TEST
LEAD COLOR
AND NUMBER
BVCpS (Collector-Emitter Breakdown Voltage
WithBase
Shorted
to Emitter):
a. Connect
transistor
to the testleadsor plugit
into thetestsocket
(7).
b. Makesure
the DRIVE switch (5) isin the LO
position.
c. Move the Test Switch (4) to the position
which produces a good indication, as in-
dicatedby thepolarity
lights
(l) or (2).
NOTE
If the good-bad
testof paragraph
"A-1" results
rn a good indication in two adjacent
positions
of Test Switch (4), the collector can be
identified by observations
during the leakage
test
asfollows:
o SettheLEAKAGEVOLTSControl
(14)
to about10volts.
o Depress
thePUSH-TO-TEST
Switch
(13)
andmovethe TestSwitch (4) between
thetwo
positionswhich gaveagood
indication.
r The TestSwitch(4) positionwhich gives
the lowest indicated current on LEAKAGE/
GAIN Meter(19) is the positionin.which all
transistor
leadscan
beidentified.
d. Set
the NPN/PM Switch
(12) to theposition
corresponding
to the polaritylight (1) or (2)
whichlights.
e. Set the LEAKAGE VOLTS Control (l ) to
zero.
i
1
!
I
{I
l
4.
Device
Tests
Yellow(3)
Emitter
Green
(2)
Base
Blue
(l)
Collector
Test
Switch
Position
BVCES,
ICpS
BVCEO,
ICEO
BVCBO,tCgO
BVECS,
IgCS
BVECO,
Ip,CO
BVEBO,
Ig,gO
X
X
NC
X
X
X
X
NC
X
X
NC
X
X
X
X
X
X
NC
I
I
I
2
2
2
t2

€I
']sel ropunecr^ep0r{}
JoslBrrture}
roloelloo
prru
os?qoql ol rolotullo^acuepedur
-q8fq
? lceuuoc 'parrsap
sr aEellol 1se1lcuxe
eqlJI'posneqwc (p1) lorluocSI'IOA ECV
-XVin eql Jo uort?rqrl?c
leuud eql 'parrnbor
sr uorlucrpur
aEellorreluuxordde uu ,(Iuo JI
'lselsnonerd
oql
w s?
e|'uss0rl1eJ?suorl"OuuoJrolsrsuBrl
eqJ
'lsol snorlardoq1ur
pesn
uonrsod
tsel eql ul (l) qclprs tsel e^?e.I
:s^rolloJ
sBpeocord
'umou4 ere senpl oseqlJI .a8e11ol
lsel pogrcads
e 1Bllru11
pegrceds
Bsrluerrnc sruJ
:(uadgrolgurg qll1(luerrnJ os?B-ro1ce11o3)
OBJI '6
.enIB^
OBhg er{}sl laued
eql
uo pat?crpur
eEullol eql '(61) ralau NIVC
/SCVXVET uo pa^resqo
srluorrnJ ur aEueqc
ueppns
ro esuarcurdreqs B lllun (tt) Iorl
-uoc sJTon gcv)vgT oql esBercur,,{1mo1s
pu?(€1) uo11nq
ISgI-OI-HS1d aq1
sserdaq 'c
'otez
ol (tI) Iortuor SJ-IOA ACV)VE.I er{t las 'q
'pelceuuoc
erBspsel
oseq
puurotcalloc aq1
{po tprl} os(l) ta{cos
lsel olur 1s0l
JepunJolsrsrrsJl
er{lilesul ro 'o1
lcauuoJ 'aloqu ,,7,, rqdvtterudur (t) qclprs
lsol Jouorlrsod
radordeq1 EunnutrelopreUV 'e
:(uadoJennuir
r{1l1\aEello1u^\op{BeIgesug'ro1ca11o3l
OUJnI '8
'lsel
rapun ocr^epeqt Jo enIB^
O!IJ1 eql sr sn{I
'(61) releu NIVC/iICVXVE'I uo petecrpur
sB luorJnc eEu>1ua1or{l el:esqo 'passard
-ep (E
t) uounq ISEI-OI-HSnd oW r{}tA\ l
'JoJJo
ul eq[Lr\ luotueJnseoruluarrnca8e
-{ueleq}esLt\reqlo
llas ueaqsuqa8u11o^
tsel
eql relJu'pasn
;t 'relaurllol eql lcouuocsrq 'e
'a8u11o,r
1se1
pagrcads
eql 01 Iorluoc sI'IoA llcvxvET etll les
pu?(€1) uo11nq
ISgI-OI-HS1d aql ssardeq 'p
'}se]
ropunecr^ap0r{}
JoslBurrure}
rolceiloc
puu rellnue oql ol relaullo^ ecuupadurr
-q8q e lceuuoc 'parrsep
sr aEellorr
1sel
louxe
eql
JI 'pesn
oqu?r (71) lorluor SI'IO1 ACV
-XVE
I eqlJo uorlurqrpclauudaq1
'parrnbar
sI uorl?crpur
aEelloleleurxorddeuu ,{po 31 'c
'lsa1
snonard
aql
uI s?er.uBs
er{leJB
suorlceuuocJolsrsuBJl
aql 'q
.lsel
snonard
eqlul
posn
uortrsod
1sa1
oq1
q (t) qctpns
tsel e^Bal 'e
:S1Y\olloJ
sBpeocoJd
'urnou4 oJc senpl asaqlJJ 'e3u11orr
lsel peurJads
u l? ilurll pagrceds
Bsr
luerrnc sFII
:(uod6
esug gllA\ tuorrnJ re]lrug'ro1ca1o3) OlIJ1
'onTB^
OEJng eqtq leuudaq1
uo pet?crpur eEe11o^
oql '(61) ralaur NIVC
/gCVXVgT uo pe^resqo
srluorrnc ur aEueqc
uappnsro osuercurdreqs e plun (y1) Iorl
-uoc SIIOA 1ICV)VgT egl aseercur
,(1nop
pue(t1) uo11nq
ISgI-OI-HS1d aqt sserdeq 'c
'olez ot (p1) 1or1uof,SJTO1 gCVXVg"I les 'q
'1aund
aql qJnoircu saop
poalpaicauuolun
aw lotu atns ag'polceuuoc
er?sp?elJolJelloc
pu? rallnue eqt ,(po l?ql os (D }o{cos
lsel eql ur rolsrsuurl oql Ewlresur pu? p?ol
eseqer{lEurpuaq,tq ro 'palceuuoJ osJr p?ol
lsel eqlEurlcauuocsp
,{q roq}lo'p?olossqeq}
lceuuocsrp
'aloqe ,,7,,rqdvtflurud
ur(t) qct1lrrs
lsol Jouorysodredord aqt Sululuuelep
reUV 'B
:(uadg osu_g
gilAt
eEellon u/y\op{?org ret}nug-ro1cago3) OlIJng
'lsol ropunocnoper{l
Jo enlu^
S!IJ1aq1
st
s1ql'(61)ralau NIVC/ACVXV1I'I uopeleo
-rpursB
luerrno eEqeal eql o^resqo
'posserd
-ap (et) uolnq ISiII-OI-HS1d e{r t{}t1\ l
'JOJre
UI
eqIIrl\ luetuaJns?atuluarrnc e8e
-{Beloq} esr^\rer{}oilas uaaq seqeEu11o^
lsol
eql reu? 'pasn
gr 're1aru11ol
ar{l }ceuuocsrq 'a
'aEu11o,r
lsolpourJads
aql
ol (tI) IortuoJ SI'IOA ECV11Vg'I eql tos
pw (81) uo11ng
ISgI-OI-HS1d aq] sserdaq 'p
'lsel repunachapeqlJoslBur(urelJolcelloc
pu? rellnuo oql ol releullo^ acuepedur
-qEfq
p loeuuoc
'parrsap
sr aEellollsel lcexo
er{}
JI 'pesn
oqu?c
(p1) lorluoJ SJ.IOA 1ICV
,XVST aql Jo uorlurqrpc lauud eql 'perrnber
sr uor]Btrpure3e11ol
aluunxorddsue {1uo Jt 't
'lsolsnonard
aql
ur sBauESar{}
eJ?suorlceuuoJJolsrswr}aql 'q
'lselsnoherd
eq1u1
pesn
uorlrsod
tsat
eqtul (l) qcrprs lsel e^e{ 'e
:s/t\olloJ
sEpeecord
'umom1eft senle^esaq]
JI 'e8u11ol
]se]pourcods
u lu lpu[ paglcads
u sr]uerrncsnIJ
:(ra11nugol peporls
eseg qll1\ luerrnJ rallltuE-Io1ca1o3) S3J1 'S
'lueuernseau
aEulloA
oqlrag?pelceuuoc
roletullo^0q1o^?el
lou oo 'lse}Jopun
ecl^ep
el{l Jo sl?ur.urel rallnue pw rolcalloc er{t
ssoJcurolatullol acuepadtul-r{EFl
u }ceuuoJ
't_p^tJlon.
sr,ql
Jo lueruernseoru
lcuxe uB roC
'(."n9) rellrue eql 01peuoqs
es?qoql qll \
aEelloiru^\op{Barq rollrue-rolcoiloc aql st
lauud
oqtuopetuorpur
aEu11o,roql '(61)ra1a61
NIVC/ECV)VS'I uo pe^Iesqo sr tuorrnc
ura8ueqcueppnsro eseoJcur
druqs
e plun IoJl
-uo3 SJTO1 ECV)VE-I eqt oseercw,tprols
puu(€1) uo11nq
ISEI-OI-HS1d aqt ssardaq l
.L
5
I
iI
I
I
'q
: -rd
I
I
i

e.
d. Depress the PUSH-TO-TEST
button (13) and
settheLEAKAGEVOLTScontrol
(14)to the
specified
testvoltage.
Disconnect
the voltmeter,if used,after the
test voltage
hasbeenset;otherwisethe leak-
agecurrent
measurement
will be in error.
With'the PUSH-TO-TEST
button (13) de-
pressed, observe the leakage current as
indicated on LEAKAGE/GAIN meter (19).
This is the 1699 value of the device
under
test.
Disconnectthe voltmeter, if used,after the
test voltagehasbeen set;otherwisetheleak-
age
current
measurementwill be in error.
With the PUSH-TO-TEST
button (13) de-
pressed,
observe
the leakagecurrent as in-
dicated
on LEAKAGE/GAIN meter
(19).
This
is
theIpgO valueof thedeviceunder
test.
f.
10. BVB3O (Reverse
Emitter-Base
Breakdown
Voltage
WithCollector
Open):
a. Setthe LEAKAGEVOLTS
Control
(la) to
zeto,
Set the Test Switch (4) to the position
adjacent
to that usedfor the BV6'ps testof
paragraph
"2" which hasthe sarne*Firr
color
indication in kad Identification Window(3).
Disconnect
the collectorlead,either by dis-
connecting
thetestleadif so
connected,or by
bending the collector lead and insertingthe
transistorin Test Socket
(7) sothat only the
emitter
andbaseleadsare
connected.
Depress
the PUSH-TO-TEST
switch
(13) and
adjust the LEAKAGE VOLTS Control (14)
until a sharp increase
or suddenchangein
current is observed on LEAKAGE/GAIN
meter
(19). Thisis the BVegO voltage
of the
device under test. This voltage can be
measuredaccurately by connecting a high-
impedance voltmeter across the base and
emitter terminalsof the deviceundertest.
Do
not leave the voltmeter connectedafter the
voltageisadjusted.
12.BVBCO(Reverse Emitter-Collector
Breakdown
VolfageWith
BaseOpen):
a. Set
the LEAKAGEVOLTS Control
(14)to
zeto.
Set the Test Switch (4) to the position
adjacentto that usedfor the BV6'pgtestof
paiagfaph
"2" which hasthe same-Fise
color
indication in I-eadIdentification Window(3).
Disconnectthe base lead, either by discon-
nectingthe test leadif so connected,or by
bendingthe base
lead andinsertingthe tran-
sistor in Test Socket (7) so that only the
emitterand
collector
leadsare
connected.
Depressthe PUSH-TO-TEST switch
(13) and
adjust the LEAKAGE VOLTS control (14)
until a sharpincreaseor suddenchangein
current is observed on LEAKAGE/GAIN
meter
(19). Thisis the BVECOvoltage
of the
device under test. This voltage can be
measuredaccurately by connecting a high-
impedance
voltmeteracrossthe collectorand
emitterterminalsof the device undertest.Do
not leavethe voltmeter connected after the
voltage
isadjusted.
I3CO (Reverse
Emitter-Collector
Current With
Base
Open):
This currentis a specifiedlimit at a specified
test
voltage. If these values arc known, proceed as
follows:
Leave
TestSwitch(a) in thetestpositionused
in the previous
test.
The transistor
connectionsarethe sameasin
theprevious
test.
If only an approximatevoltageindication is
required,the panel calibrationof the LEAK-
AGE VOLTS control (14) canbe used.
If the
exact test voltageis desired,connect a high-
impedance voltmeter to the emitter and
collectorterminals
of thedeviceundertest.
Depress
the PUSH-TO-TEST
button (13) and
setthe LEAKAGE VOLTS control (14) to the
specifiedtestvoltage.
Disconnectthe voltmeter, if used,after the
test voltagehasbeen set;otherwisethe leak-
age
currentmeasurement
will bein error.
b.
c.
b.
c.
d.
13.
11. IBgg (Reverse Emitter-Base
CurrentWith Collec-
tor Open):
This currentis a specifiedlimit at a specifiedtest
voltage. If these values are known, proceed as
follows:
a. Leave
TestSwitch(4) in the testpositionused
in the previous test.
b. The transistor
connections
arethe sameasin
theprevious test.
c. If only an approximatevoltageindication is
required,the panel calibrationof the LEAK-
AGE VOLTS control (14) can
beused.
If the
exact test voltageis desired,connect a high-
impedance voltmeter to the emitter and
base
terminals
of the device
undertest.
d. Depressthe PUSH-TO-TEST
button (13) and
setthe LEAKAGE VOLTS control (14) to the
specified
testvoltage.
a.
b.
d.
l4
e.

SI
u
rp eurrrn
os?s
r
r', 1
p.
g,r
rart
tiitttr
t$i Tt.;Yl
eJl^o_p
eqt 'elqslTp^e
srBlup lsel pu? pegrluepr
,{gadord sr ecr^epoql erar{A{
.slsel Eurrnoloy
aqt
3_o
,(ue
ursllo^ 0I peecxo
lou op ,ed.,{1
SOlt
ro ad.(1uorlJunf
es?
pourluapr
,(lelrysod
lou si
r{cF{^\
IEC s o1
e8uuruppro^uoI .papoeJxe
ere
saEellol u^\opluerq' Jr pa8uurup
flluaueurrad
equor 'ralamoqs.IEd ggyg .e8etu?p
]noqll \
'0tS lepory eql ,tq uiy\op>leorq
esre^orpuB
uorlJnpuoc
olur uo^rJp
eq uucs.IEg uorlcunf
NOI.INVJ
'(6t) tatau NIVO/aOV)VE'I;o epcs
tuE
aluudordd?
eqt uo JAf rqiroi,itF rqt pn.g .o
rrclr^\s
uB
rEg/vrfi'X';i#3^#ff:ii.1,1''l
.p
-rqd
equ'c
rser
*a rurr'r*.E-c^iffi'q
i;Hfij
-Uaq e '1ce1
uJ .suorlrsod
qt;d ur palsel
JJ
poderuup
eq lou il1,!\.
ecpep eql ,ssalpruEer
isuorlecrlddu rarrrod-noI to ralrrod-.lgF{
roJ
pepuolq sr
lr ror{leq^\
satucrpur
.{lpreuaE
azn
pcrs,{qd
eql 'lsat repun IgC oq} i6y alqupz,ru
sr_uorl?ruroJql
ou J-l .pelsoleq ol JEC Jo
ad,{1
aq1
uo Euryuedep
.uorlrsod ,lnrr*do'iain
eql q (Ot) qcrprsU/t\d IH/UA\d O.I eql eculd .c
'(7)
t9(t) tq8n
{q pelecrpur
,{1Fe1od
ocl^ep
eqlor (zt) qctp[s
dNd/NdN
erl]tes
r{cl,{^,
uo
11rs
od'
"
;
i?j?yr,:l
J
:,XT
fi
i
:t^:t
'lsol repunecr^ep
eqlJo onIB^
SJ!I1oqtsl
sgql '(6I) relotuNIVC/gC\1XV1IT uo potecrp
-ur sB luaJJnc aEu4uel
e{t elJosqo ,passard
'ep(Et) uoltnq
rsar-or-Hsnd ovrqll/tt J
'JOJJa
UI
aq[Lr\ ]uotueJns?eru
luarrnce3e
-ryel eql asl&\rorllo
iles ueaqsuqeEu11o^
lsol
eql ratJu'pesngr 'ra1eu11olaril lceuuocsn .o
'e8u11ol
1so1
pagrcads
eql ol (71) lorluor sJToA EOVXVgT eql ros
pu?(t1) uo11nq
JSAJ-OI-HS1d aql sserdeq .p
'1s01
repunecnepeqlJoslBurturel
rolcailoc
pqu rellrue oql of reloullo^ ecuepedurr
-qEg ? lceuuoc 'perrsep
sr e8u11oa
lsel lcuxo
eqlJI'posnequuc
(p1)lorluoo
SJTOAACV
-XVIIT eql Jo uorlerqrlBc
laued aqt operrnbar
sr uorl?crpur
e8ullol eluuxordde uu ,(tuo JI .c
ur
s?a.,,?s
eql
e,n
suorlcouu;Tiilil,Ht'itril3
.q
pesn
uorrrsod
1sa1
oql
q(rfiXiffiT,Ti
3H# .v
:s^\olloJ
sonp^esoqtr
Jl 'a8u11ol
pegrceds
Bsr
]uerrnc
srql
su poecold'unou4 eJB
lsol paurceds
e l? ]Full
.(Z)
to 11)
srUEI
{q pelecryw
s?
peurure}ep
uaeq
s?q
,{1Fu1od
acrlop eql eJns e>[?tu'Surpaacord eJoJeg
'sdals
3urno11o3
aql ul petucrpu sepelunlu^e
reqpnJ eq u?c pooS slsat qcq^\ IEC V
'e^rlcaJep
sr
lselrapun
lgc
eqt ueql 'panrecar
sr uorl?JrpurpooE ou JI
'a1n7
aqts!
(t) /Y\opurA,\
uorl
-Bcurtuopl
p?{ aqluru^\oqsrolor ESVSeql
'(pculauru,tsare
s.IEg-f lsot{) 'rolocESVg
ar.u?s
eql e^Br.lrl3lq,tl uorlrsod qcllr\s lsel
luecefpu
o&r1uI poo8 e]BJrpur
illr\ s.IgC-f
'NO st
(g) qclvrts
U1I)VEdS
al{l JI preer{eq il1lrrouol B puu }q3[ ru,!\
(Z) to (1) duel 'IEC pooE
u setecrpulgtg
Ieporu
eql [tun (l) qclprs tsel e^ou ,(pro1g
'(l) lelcoS lse; ur lrosur
ro (q) sta{cosp?e.l
lsel 1?
spsel
lsal eql ol ecl^ep
eql lceuuoJ
'uorlrsod
IH aql ot (g) r{clr^\sgn ruC aql tes
:(ro1ca11o3
o]pepoqs
eseg
tltl1\ tuarrnJ rotrolloJ-roprug esre,rag)
SJIII .g
1
'palsnfpe
sr
e8u11o,r
aq] relJ? pelcouuoc
r01etu1[o^
eq] e^Bel
lou
oo 'lsel repunOcr^Op
ew Jo sl?urturel
rellnuo
puu rolJolloc
eqlssorJe
Jolorullo^
ecuepadurr
-qaq u Sullcauuoc ,{q flalernccu perns?oru
eq uec^eEu11gl._slqJ
'lsel repun ecr^ep
eqlJo eaullor
sJcng eql slsFII .(6I) Ietetu
NIyC/ECy)VET uo pe^resqo sr luerrnc
ur a8uuqc
ueppnsro os?ercurdruqs e Irlun
(71) lorluoc SI'IO1 gCV)VE.I or{t lsnfpu
puu(tI) qcly'rs
ISgI-OI-HS1d aql ssardeq .p
Bnldro
spuer
lser
aql",f3il3"T,",t
lrT*:#Lj .c
'(E)lropurlA uorl?rulluepl p?a-lul uorl?crpur
JoloceSPq^eIu?S
eql s?q qcF{rt\
,,7,, qdetaeJf.;d
Jo lsel scJng eql roJ pesn
]sq1o1luecufp? .
uoyllsod ar{t ot (l) qcq/r\S }sel er{t tes .q
'orez
ot (tI) IoItuoJ SITOA ECVXViI-I eqt las .e
:(ro1ca11o3
01
peuor{S
osug
qtl \ a8ullon
u^\op{?arg rotrelioJ-ropnuA asranag) SJllng .Vl
'q
:slseJ
tuE '7
'e
)
I
I
,,
I
'p
'c
'q
'e
:(s.JEC
IUUBIS
pu?
reaod)
tsal pug-pooC .l
:S.IEC 'g
'1sel
repun
ecr^op
eql
Joanle^
OJII1
eqlsl
stqJ'(61)relau NIVC/ECVXVg"I uo pelecrp
-ur s? lueJJnc a8u>1ua1
eql elJesqo 'pesserd
-op (e
t) uopnq JSEI-OI-HSpd arlr qqA;J

3. IpSS
Current:
Currents
up to 5 milliamps
can
be
measured
below
l0 volts;the currentindicationislimited to 100
microamps
whentesting
above
10volts.
Although
the Ip55 values
for manyJ-FET's
are
specified
at
drain-to-source.voltages
above
l0 volts,
theIp55
values
obtainedbetween5 and l0 volts cariSe
considered
accuratebecause
the drain current
characteristic
usuallyis constant
above
afew
volts
(Sqf. Fig. 3). Most power FET's will provide
full-scale readingsbecause
the IpSS values are
considerably
higher
than 5 milliamps.If afull-scale
reading
is obtained
below5 volts,
the
actualIOSS
value is geater than 5 milliamps and cannot be
measured
accurately
with theModel
530.
246810
Vs5- DRAIN SOURCE
VOLTAGE
(VOLTS)
Fig. 3. Typical depletion mode FET characteristics.
Set the LEAKAGE VOLTS control (14) to
zeto.
Move Test Switch (4) to a position which
produces
a
good
indication.
Setthe NPN/PNPswitch (12) to the position
indicatedby GOOD
testlights
(l) or (2).
DepressthePUSH-TO-TEST
button(13).
IncreaseLEAKAGE VOLTS control (14)and
observeLEAKAGE/GAIN meter
(19).
Do not
exceed10 voltsunless
the FETtypeand
test
parameters
are
known. A high-impedance
volt-
meter can be connected
acrossthe drain and
sourceof the device
under test to determine
the exact voltage corresponding
to an ob-
served
IOSSreading.Oncethe observedcur-
rent exceeds5 milliamps below 10 volts or
exceeds100 microamps
abovel0 volts,the
panel voltage calibration does not apply be-
causeof thebuilt-in currentlimiting circuitry.
The LEAIGGE/GAIN meter (19) will read
IpSS. IpSS of FET's can rangefrom a few
microamperes
to several
milliamperes,
andin
somecases
will be
limitedto 5mA.
FET Gate l-eakage: Drain-to-Gateand/orSource-
to-Gatelrakage.
a. Notethepolarity indicatedby lights
(1) or (2)
in theGOODtest.
b. Set
the NPN/PNP
Switch
(12)to the
opposite
polarity
of thatindicatedin (a).
c. Set LEAKAGE VOLTS Adjust (14) to l0
volts,approximately, or the desired
testvolt-
age,
if known.
d. Depressthe PUSH-TO-TEST
button switch
(13) andmove
theTestSwitch
(4) throughall
six positions and watch LEAKAGE/GAIN
meter(19). If the device
is good,the meter
will indicate zero current in two of the six
TestSwitch
positions.
FET Drain-to-Gate
or Source-to-Gate
Leakage
(Junction
Diodes):
a. With the FET connected
to the test
leadsor
inserted in test socket (7) place DRIVE
Switch(5) in the HI positionandoperate
Test
Switch (4) until agood
indicationisobtained.
La*p (l) or (2) will light.
b. Note the base
color which appears
in the l*ad
Identification Window (3). This identifiesthe
connection
to the gate
of theFETundertest.
c. SetLEAKAGE VOLTScontrol
(14) to z.ero.
d. Set the NPN/PNP
switch(12) to match the.
polarity
indicated
by lights
(l) or(2).
e. Pqsition
theTestSwitch
(4) sothatthecolor
associatedwith the gate
leadis indicated
as
the collector lead in the Lead ldentification
Window
(3).
f. Depress
the PUSH-TO-TEST
switch
(13) and
slowly adjustthe LEAKAGE VOLTS control
(14) starting
at zero andgradually
increasing
until a sudden
increase
in leakage
current is
indicated on LEAKAGE/GAIN meter (19).
The current and the correspondingvoltage
havethe following meaningfor two typesof
FET's:
J-FET: Forwardbiascurrentand
voltage
for the gate-to-channel
P-Njunc-
tion.
MOS-FET: The Breakdown voltage for the
combined
currents
of the gate-to-
channel leakage
current and the
protection diode if present on
device.
Depletion
Mode
FET's
(low-power):
4.
I
I
,
5.
a
s
F3
z
Llj
(E
E
l
=.
G
oI
a.
b.
c.
e.
f.
I
'cs=0
V
/I
-0
2v
l,/
t/ -0
4v
It I
-0
6v
-il i
-0
8v
f, aI
10V
17
I
I
I
-r
,y
7T-------- -------
t4v
I
t6
6.

LT
'(g) nopurlr uorluclllluepl p?e-I
oql
w u/r\or{s
s3
roloc gsvg luoroJJrD
uEunuquollsod
raqtou? ul snolt (3) duel dNd oql pue uorlrsod
euo ur snop (t) durt NdN ar{t F}un suortrsod
xrs str q8norqt ,{1no1s
(t) r{c1^S }sol eql e^ory
- 'lsol ol qsF\ no,(
935 ern
Josp?el
eerqleqt
o1 (reuuuur,,(uu
ur) spel lsol eoql oql lceuuo3
'uorlrsod
IH aWol (S)qcll^\sA11aC oql tos
:s.uJs 'II
'slsunure]
epop
eql ol relerullo^ acuepedul-qEFlu Eutlcauuoc
fq paururralop eguecetellol teuezlcuxo oql
'polecrptn
Eumuar
luejJnc 0{t le pu? 1s01
repun ocnap 0w
goa8ullor tevezeql st sF11
'(61) ralaurNM
/gC\fXVg'I,uo pe^resqo
srluerrnc ur eEueqc
uoppnsro esuarcurdreqs e glun (p1) Iorl
-uoc
slTon gcvxvgT orf] es?ercul
'passard
-ep
(e
t) qcrns rsilJ-or-Hsnd
e{r q}t
\
Nrvc/ac\rxvin
uope^rasqo
;$tlJifiH
luerrnc lse/r\ol a{t salF luq} (l) qcllr\s
lsel oqlJosuollrsod
dol o^u eqlJo euolJolas
puu (tt) rtc4,nS
ISSI-OI-HS1d aq1aleredg
'sllo^
s lnoq?
o1
(tI) [oIruoJ SJ'IOA 1ICV)VA'I oqt ]oS 'q
'apopaql
Jo
spselo^u
ewol spBel
lsel^\oilar(puu
ontqoqllsauuo3 'B
:o8e11on
nusz 'Z
'epouu
eql01
spuodserroc
JoloJ
Jollruo
eqtpu? epoql?c
aqtq (c)ro1ca11oc o1Eumuod
-sorroc
roloc eql '(€) ,'r\opur1\
uorlucgrluopl
pBe-I
eql ,tq peurluepreq u?c spsoleql /$oN
'(0t) rorau NIVC/gCVXVg1 eqr
uo turpuer rar{6Fleq1sea6 uorlrsod rIJll^\S
lsal qrFl/r\alou '(7) rlcllr\s lsol eql Jo suort
-tsoddo1 o/hl eql uee^UeqEuquuralp epl/tr
'puB
(€t) tlcl,ns ISiII-OI-HSnd eql sserdaq
.sllo^s lnoq?
01(tI) IoIluoJ SJ'IO1 gCVXVgl eql tes
'uorlrsod
dNd eqt ot (ZI) qcrprs dNd/NdN er{r las 'q
'apop eqlJosp?e[o^u
eql 01spsel
lsel /r\o[e,{pue enlq eql lceuuoJ 'e
:uorl8cgrluopl
pBrI 'I
:sapol( $uez 'o
'ecr^ap
eql roJluerrnJa8zluel
eqtq epoTp
aql
go lurod u rop{?orq eql aolaq pelucrpur
uorl
-?crput
luerrnc ,tuy 'epop eql roJ plorlserr{l
aEe11o,r
u \op>l?orq or{} o} spuodserroc
sFII 'srncco Euppear
ralou peleclpw er{t
ur eEueqcro es?eJcurueppns B lrlun esp\
-{colc (71) lorluoc SI.IOA 1ICVXV1IT
lsnlpv 'q
uoEwpeer orczrorumuruFuer{};Sfp
i:iiX
uorlrsod lsol oql q (t) qcll/hs lsel e^?rl 'E
're/l\ol
sr
lr rer{loeql
ul pueqEg sl luerrno pal?clpu aql suoylrsod
I{Jlt/y\s
}sal o^U eq} Jo ouo uI luql elou
pu? (0t) relou MVC/ACV)IVAT e^rasqo l
'(uorlucrpur
eseqaerE)suorlrsod
1sa1
on1 reddneqtueo^ueq
(t) qcll/ils1se1
olurado
puu (et) uollnq ISAI-OI-HS1d sserdeq 'o
'sllo^ s lnogB
o1 (tI) [oltuoc SJTOA 1ICVXVgT eW tes 'p
'uorlrsod
dNd etlr ol (Zt) qcllr\S dNd/NdN tos 'c
'(uorluclpulp?ol
asuq
uaerE)
uo4rsod
tsourreddn
oql ol (t) qctyos tsel les 'q
'lsel Iopunepop eqlJospue
o/hl
eql ot sp?o[
]sel /l\ollef pue ontq or{1
}ceuuoS 'e
:eEe4er1 '(,
'(E),noput^l
uortBculluapl
pBrI eq1u1(c)
uoISa"ITOJ 0r{ls?
pal?cryur
roloc p?e[
1s0]
oql ol pelcauuor
il apoqpr apop eqJ,
.(6I)
releu NM/ACy;1V1IT uo Eurpear opcs
-dnue secnpordsuorlsod 1ISVB uaart o/hl
egt
Jore^oqcnr\ ol (t) qrllhrs lsel er{}alotu
'(et) qcll^\S ISSI-OJ-HS1d ogr sserdaq 'p
'sp30l
apop
eqtot spuel
lsel ^\oilef pue ontqaql lcouuoJ 'c
'stlo^
s lnoqB
or (?I) lolluoc ISnf11V gCVITOA aql tes 'q
'uorlrsod
dNd eql ol qclp\s AIIuvTod eqr les 'E
'peurluepr
eq
u?cepop eql
Jo
sp?el
epoqlBc
puB
apouB
er{J :uorlBcurluepl
pErI 'I
:sePolo 'f,
'(..1-V,,
qderEered)
srolstsuerl
se
fu,r etu?s
eql uI pelsel eq wc s.Iac epou lueuacu?quE
:(1seg
psg-poo3)s.IgC opon tueuecu?qug 'L
'ggo
qcurdpm alu8eql teql Euunssu
gofe,r ou srareg acuepadulalu8qEq ,(1auerlxe
eql qlF\ pu? 'sluarrnc aEqeel ro/puu dn>1crd
ferls o1 1cafqns acnep eq] seeol puel aluE aqt
tutlceuuocstp.,(lerepi'Euqsal
eplt\ pos?Iq-asre^ar
eq ew? oql teql sarpber sF{} s? '0€S lepow
aql ,{q flqrnt, pernsuatu eq louuuc s.IgC epou
uorlaldap ralrod-lro1 ;o aEulual ecrnos-ol-u1prq
.E
'7,
.I
'p
f
'0
'p
tI
I
I
I
l

4. The SCR is good only if all the following are
obtained.
a. OneNPNindication.
b. One
PNP
indication.
c. Indicationsmust not havesameBASE color.
LEAD IDENTIFICATION:
a. The BASEcolor shown
in the I*ad ldeptifica-
tion Window (3) is the gate lead when the
NPNlamp(l) glows.
b. The BASEcolor shownin the kad ldentifica-
tion Window is the cathode lead when the
PNP
lamp(2) glows.
MODEL530CIRCUIT
DESCRIPTION
A. TestSwitch
The 530 semiconductortester usesa six-position
leverswitch locatedat the top right cornerof the
front panel. This switch is used to connect the
device being tested in the correct' manner for
testing. As this test switch is moved through its
positions, the devicethat is connected
either to
the three test leadsor plugged into the testsocket
is connected in all possible configurations for
further testing. The uppermost position is the
"normal" connection, that is the test socket is
connected
in thestandardtriangle
configuration
to
the testingcircuits and the blue, green
and
yellow
testleadsareconnected to thecollector,base,and
emitter circuits respectively
(drain,gate
andsource
for FET's).
In two of the six positions,using HI drive, the
device is connected properly for the basic test
circuitry. This is true since all bipolar transistors
have gain, although usually very little, when the
collector and emitter are interchanged, and most
junction FET's are symmetrical. Thesetwo test
switch positions are always adjacent and always
display the same
basecolor in the lBad Identifica-
tion Window whenever the 530 is indicating a
gooddevice.
In LO drive, a transistorshould indicategoodin
only one test switch position since limited base
drive and lower detection sensitivity allow the
detectorto test the device as
good
only in its high
gainconnection.
A devicethat indicates
good
in a
singletestswitch position in LO driveis connected
properly for further gain testing with the Model
530.
B. Good/Bad TestCircuitry
l. The Model 530 test circuitry uses two clock
generators
that producea seriesof pulses
designed
to test a device
periodically,
aboutseven times
per
second. These short, high-current pulses are
applied to the collector (drain); the first is positive
for testing NPN/N-CH devices, followed by a
negative pulse for testing PM/P-CH devices.
During thesepulses,
a shorter pulseof the same
polarity is appliedto thebase
(gate)
of thedevice,
which drivesthe collector (drain) voltagetoward
saturation.
(See
Fig.4, pulses
A andB.)
l8
Taking a closer look at the basictest circuitry,
refer to Fig. 4 and schematic.
The slow clock,
which runs at approximately 7 llz, initiates each
test period while simultaneouslyresettingflip-flop
I and flip-flop 2. The fast clock runs at approxi-
mately 500 Hz and controls the pulse-forming
circuits.
The pulse-formingcircuit usesa combination of
toggles and RS flip-flop to produce the proper
sequence
of pulsesfor the collector (drain) drive
circuit, andthe base
(gate)
drive
circuit.
The collector (drain) and the base (gate) drive
circuits arc level-shifting complementary drivers
which can deliver several
hundred milliamperesat
+5V and-5V, or returnto zerovolts.
A properly connected NPN or N-channel device
will see
both waveforms'A' and 'B' of (Fig. a).
The collector (drain) will seewaveform 'A', and
the base (gate) of the device under test will see
waveform'B'.
Note that during the positive excursion of the
collector (drain) voltage, the base
(gate) is driven
first negative
andthen positive.
If the device
beingtestedis NPNor N-channel,
the
collector (drain) voltage will drop abruptly when
its base (gate) is driven positive. This negative-
going transition, which will only occur if gain
action is present
(a good device),is differentiated
and the signalproduced is used
to latch flip-f[op 1
of Fig.4.
If a PNPor P-channel
deviceis tested,the turn-on
transition occurs during the secondhalf of wave-
form 'A' of Fig. 4, andin the opposite
direction.
This transition (positive-going) is differentiated
and the produced signalis inverted and usedto
latchflip-flop 2 of Fig.4.
Of course, otherpulses appearat the differentiator
output, since
all voltagetransitionsof pulsg'A' are
similarly differentiated, but the synchronized
gating circuits prevent the unwanted pulses
from
reachingflipflops I and2, thus eliminating wrong
indications.
The input to flip-flop I is enabledonly during the
l.
2.
3.
2.
3.

6l
I
(ro
I
I
I
-
. -tl
,o
,,9
.o
,o
,t) j
€
o
o
o
3
t+
(,to(,r
);
I
-1
I
t:
IP
ts
tj
lo
3[
E}
oc
(,lN
!.u
_a
)o
x{
aO
rid
:ro
Ir
831
F=a
oos
.NN
E
o09
NN'.
orcrb
oo o
.ts.H
g
3
oo5I
E\q
o
o,
F
o
@
3=, F9 1+
.$gF
lDo
ET
AT'
HF
uicno
--N
r@o
O, ='
('|d
3F3
N-
gEF=
8-
ga
)t
-R
3ga
3FF
lo
EP
rH
o
oc)
ol
@
o
0
o
o
o
o
o
a= F+
FT
a€-
@N
-iE
o+
g€-
9-
o
('to
wo
=O
uo
o
31 =8'
qe a9
5
:. ;0
E qe
o o:.
C)o
7ro
A
F'
@
FJ
!l
;e)
v,
C)
(D
ut
o
C)
g
*

time period in which a NPN or N-channeldevice
canbe detected
andsimilarlyflip-flop 2 isenabled
only when a PNP or P-channel device can be
detected.
Only the flip-flop which corresponds
to
the type of devicebeing
tested
can
belatched.
4. Theoutputsof flip-flops I and2of Fig.4 areeither
+5V or - 5V, dependingon whether the device
tested was a good MN/P-channel or PIIP/
P-channel.The output from theactivated
flip-flop
drives a LED DRIVER which producesenough
current to turn on the corresponding
front panel
indicator, the NPN/N-channel or the PNP/
P-channel
LED.
Wheneither flip-flop I or 2 islatched,
thespeaker
driver is activated and audible tone is heard
throughthe speaker,
indicatingagooddevice.
Leakage/Breakdown
TestCircuitry
1. The 530 leakage/breakdown
voltage
circuitry uses
anexternallycontrolledDCpowersupply.Voltage
and. current sensorscontrol automatically, via
feedback, the voltage regulator that feeds the
externalload(See
Fig.5 andschematic).
A four-stageamplifier circuit is used to drive a
meter driverwhich in turn drives
themeter,
on a0
to 5 mA non-linearscale.
2. Taking a closer look at the leakage/breakdown
voltage
circuitry, referto Fig.5 andschematic.
A voltage-adjust
potentiometer is connected
to a
DC power supply.
Thispotentiometerwhichisthe
front panel LEAKAGE VOLTS control, drivesa
series
regulatedcircuit, andit canvary from zero
to 100V.Thevoltage
regulator
isfedbackthrough
voltage and current sensors,
which automatically
contrbl the voltage and current outputs to the
external
load.
3. The externalload (device
undertest)isconnected
to the voltage regulator through the polarity
switch (NPN N-channel/PNP
P-channel),
the lever
TEST SWITCH,andis activated
when the PUSH-
TO-TEST
switchispressed.
When
the LEAKAGE VOLTS control on the front
panel
isturnedclockwise,
theexternal
loadvoltage
can goup to 100VDC, but this is ture as
long as
the load current is 100 pA or less.As the load
impedancedrops, the voltage regulatorwhich is
fed backthrough the voltage
and current sensors,
starts to reducethe voltageto maintain 100 pA
through the load. This output voltagereduction
and constant
currentof 100
pA will continue
until
the voltageacross
theexternal
loaddrops
to about
lOV. If the loadimpedance
isreduced
to lowerthe
external voltage below about 10 volts, the low
voltagecurrent-limiting circuit takes
overandthe
indicated current on the LEAKAGE/GAIN meter
will increaseto 5 milliamperes.
Further reductionof the load impedance,
up to a
complete short, will reduce the load voltage to
zeto-.The vbltage regulator is currentJimited and
candeliver
only 5mA to theexternalload.
.ir
I
n
c
.l
c.
Voltage
Adjust
R72
Voltage
Regulator
o10,
o11,
o12
External Load
Device
Under
Test
og,o12
R70,R77
Amp Stage
tc10,D14
D15,
D16,
D17
q
20
Fig.5. Block diagram,
leakage/breakdowncircuitry.