GW Instek GUT-6000A User manual

GUT-6000A
Digital IC Tester
USER MANUAL

GUT-6000A USER MANUAL
2
INTRODUCTION...................................................3
FEATURES...........................................................4
SPECIFICATIONS.................................................5
CONTROLS & INDICATORS................................6
KEYS’ INSTRUCTION...........................................7
OPERATIONAL INSTRUCTIONS.........................8
1. OPERATIONAL PROCEDURES......................8
2. TESTING PROCEDURES................................9
3. AUTO LOOP TEST...........................................10
4. AUTO Search....................................................11
TROUBLE SHOOTING........................................12
MESSAGE DESCRIPTIO.....................................13
KEY CODE DESCRIPTION.................................15
TOTAL ASSEMBLY.............................................16
KEY CODE TABLES............................................17

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INTRODUCTION
GOOD WILL INSTRUMENT CO., LTD., accumulated over 30 years experiences in
electronic products’ research and development, is a pioneering manufacturer in IC
testers industry. The GUT-6000A, desktop design, is a newly launched and best
quality possible and multi-functions equipped product.
User’s friendly sets up by replacing another IC; the GUT-6000A continues to
undertake the task. The hard ware design of ''black-light'' function extends user’s
convenience for testing ICs in an inadequate light environment. The Buzzer key
built in various tones can easily identify the testing result. The unique capability
in identifying over 1800 CMOS/TTL digital ICs (up to 24 pins) surpasses the other
major digital IC testers.
The GUT-6000A feature such as built in ''auto search & test'' speeds to identify
and test IC. In addition, the ''loop'' design for continuously testing function is
intelligently applied to detect defective ICs and their stability. All these strengths
provide signicantly conveniences for digital IC testers.
All the GUT-6000A accumulated incalculable benets are to be discovered as
users utilize the value-added, multi-functions equipped tester. This is a best
choice for the factories, R&D sections, maintenance departments, laboratories as
well as academics because it really creates future with your business.

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FEATURES
● Reliable desktop design.
● User’s friendly set up and operates.
● 16*1 character 9*7 dot matrix LCD display.
● Built in 6 functions and 10 numerical keys.
● Identifier over 1800 CMOS/TTL digital ICs (up to 24 pins).
● High test speed at an average 0.8 second for one IC test.
● The following IC series can be tested under 5V.
■ Texas Instruments 54/74 TTL series.
■ Motorola 14000 and RCA CD4000 CMOS series.
■ Other compatible ICs with the above mentioned devices.
● ''AUTO'' function key supports ''auto search and test'' function. User only to put
the IC into the socket, no need to press any key, no need to process any other
movements, the ''auto search and test'' will continue processing.
● ''LOOP'' function key supports ''continue examining'', able to make sure
reliability of the IC.
● Various ''BUZZER'' sounds to presents the test results ''FAIL'', or ''PASS''.

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SPECIFICATIONS
DISPLAY 16*1 character dot matrix LCD display
TEST SOCKET One position for 28 Pin IC socket
OPERATIONAL KEY
( 1 ) TTL/CMOS, BUZZER, LOOP,
AUTO, GO, BACK SPACE
( 2 ) 10 numerical keys ( 0 – 9 )
TEST VOLTAGE 5 - 24VDC
ALARM Various tones for the test result
POWER SUPPLY 110/220VAC, 50/60 Hz(Auto range)
OPERARING
TEMPERATURE 10℃to 40 ℃
STORAGE TEMPERATURE 0℃ to 50 ℃
MEASURENENT 13”(W) x 11.8”(D) x 4.3”(H)
WEIGHT 3.3 LB ( 1.5Kg )

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CONTROLS & INDICATORS
(1) Liquid Crystal Display…..…....16*1 character 9*7 dot matrix LCD display
(2) 28Pin Test IC Socket
(3) Keyboard
(4) Fuse …………………………...1A, protects tester from damage
(5) Power Switch …………………Power on or off
(6) AC Receptacle ….…………...Plug in power cord
(7) GND…………………………...Ground

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KEYS’ INSTRUCTION
KEYS INSTRUCTION
Numerical Keys
Input IC numbers for test.
Execution key
● Executes testing work as inputting a device
number.
● Repeats test.
IC series selection key
● Switches selection TTL74, CMOS40 or
CMOS45 IC series
Auto search & test key
● Auto detects IC number
● Auto test IC
● If change into new IC, the ''auto search &
test'' will auto detect the IC, and continue to
test.
Loop Test key
● Tests IC's stability
● Stop and show errors as defective IC is found
● Press any key to stop running
● If take the IC away, the LCD will show
''EMPTY''. Then, if put any IC into socket, the
''LOOP'' function will continue.
● Use numerical key of 0 to 9, key in the IC's
number , and press ''LOOP'' key to process
loop test.
Back space Key
● Erases wrong number in the left side of ←
BUZZERING switching key
● Switches BUZZER on/off
AUTO
09
GO
TTL/
CMOS
LOOP
BUZZER

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OPERATIONAL INSTRUCTIONS
1. OPERATIONAL PROCEDURES
STEP1. Plug in AC power cord, then switch power on.
The black light of LCD is on and presents software version.
It starts self-test.
STEP2. Auto search the IC number and test if an IC is on the socket.
STEP3. Use TTL/CMOS to switch the selection of ''TTL74'', ''CMOS40'' or
''CMOS45'' series ICs.
No system error found displays on the LCD
System error shows on the LCD if it is detected.

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2. TESTING PROCEDURES
STEP1. Put IC on the socket and IC’s bottom line up with socket. Pin 1 side
faces up.
STEP2. Input the IC number such as the TTL 74LS244, and user types in IC
number in order.
STEP4. Repeat test by replacing a new IC, then press .
STEP5. Re-type the IC’s numbers for other another test.
Note. ''Pass'' may also happen to some logic function compatible but
different number’s two ICs if their numbers are exchanged with each
other to test.
IC pin 1 side faces up
Pass test displays on the LCD
LCD display
Fail test displays on the LCD
Pull down pin-stabler.
324
STEP3. Press , then the test works. Follow-up test result is displayed
on the LCD.
GO
GO

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3. AUTO LOOP TEST
1. When an IC is tested, the test results appear unstable such as sometimes
good and sometimes not. The auto loop test is designed to detect this kind of
problem.
2. When a big quantity of same number of IC need to be test, the auto loop test
is speeding the process.
STEP1. Put IC into the socket and IC’s bottom line up with socket. Pin 1 side
faces up.
STEP2. Input the IC number such as the TTL 74LS244 device, and user
types in IC number in order.
STEP3. Press , then the test is running. Follow-up test result is
displayed on the LCD.
Error found was displayed on the LCD, ''Error in: nnnnn'', nnnnn means the
number of the error times.
STEP4. If take the IC away from the socket, the system will back to waiting
IC put in situation.
STEP5. Put IC into the socket, tight down the pin-stabler, the system will stat
the ''auto loop test''.
STEP6. Press any key to stop the ''auto loop test''.
IC pin 1 side faces up Pull down pin-stabler
244
LCD display
LCD display
LOOP