HP 8510 User manual

Errata
Title & Document Type:
Manual Part Number:
Revision Date:
HP References in this Manual
This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-
Packard's former test and measurement, semiconductor products and chemical analysis
businesses are now part of Agilent Technologies. We have made no changes to this
manual copy. The HP XXXX referred to in this document is now the Agilent XXXX.
For example, model number HP8648A is now model number Agilent 8648A.
About this Manual
We’ve added this manual to the Agilent website in an effort to help you support your
product. This manual provides the best information we could find. It may be incomplete
or contain dated information, and the scan quality may not be ideal. If we find a better
copy in the future, we will add it to the Agilent website.
Support for Your Product
Agilent no longer sells or supports this product. You will find any other available
product information on the Agilent Test & Measurement website:
www.tm.agilent.com
Search for the model number of this product, and the resulting product page will guide
you to any available information. Our service centers may be able to perform calibration
if no repair parts are needed, but no other support from Agilent is available.

User's Guide
HP 8510 Pulsed-RF Network Analyzer
ABCDE
HP Part No. 08510{90505
Printed in USA March 1995

Notice
The information contained in this document is sub ject to change without notice.
Hewlett-Packard makes no warrantyof any kind with regard to this material, including,
but not limited to, the implied warranties of merchantability and tness for a particular
purpose. Hewlett-Packard shall not be liable for errors contained herein or for incidental or
consequential damages in connection with the furnishing, performance, or use of this material.
Restricted Rights Legend.
Use, duplication, or disclosure by the U.S. Government is sub ject to restrictions as set forth
in subparagraph (c) (1) (ii) of the Rights in Technical Data and Computer Software clause
at DFARS 252.227-7013 for DOD agencies, and subparagraphs (c) (1) and (c) (2) of the
Commercial Computer Software Restricted Rights clause at FAR 52.227-19 for other agencies.
c

Cop
yrigh
t1988 Hewlett-P
ack
ard Compan
y
.All Righ
ts Reserv
ed. Reproduction,
adaptation, or translation without prior written permission is prohibited, except as allow
ed
under the cop
yrigh
tla
ws.
San
ta Rosa Systems Division, 1400 F
oun
taingro
v
ePkwy, San
ta Rosa, CA 95403-1799

CERTIFICATION
Hew lett-Packard Company certies that this product met its publishedspecications at the
time of shipment from the factory. Hew lett-Packard further certies that its calibration
measurements aretraceable to the United States National Institue of Standards and Technology
(NIST, formerly NBS), to the extent al lowed by the institute's calibration facility, and to the
calibration facilities of other International Standards Organization members.
WARRANTY
This Hewlett-Packard instrument pro duct is warranted against defects in material and
workmanship for a perio d of one year from date of delivery. During the warranty p erio d,
Hewlett-Packard Company will, at its option, either repair or replace products whichproveto
be defective.
For warranty service or repair, this pro duct must b e returned to a service facilit y designated
byHP.Buyer shall prepay shipping charges to HP and HP shall payshippingcharges to
return the pro duct to Buyer. However, Buyer shall pay all shipping charges, duties, and taxes
for pro ducts returned to HP from another country.
HP warrants that its software and rmware designated by HP for use with an instrument
will execute its programming instructions when properly installed on that instrument. HP
does not w
arrant that the operation of the instrumen
t, or soft
w
are, or rm
w
are will be
unin
terrupted or error free.
LIMIT
ATIONS OF W
ARRANTY
The foregoing w
arrant
yshall not apply to defects resulting from improp er main
tenance b
y
Buy
er, Buy
er-supplied soft
w
are or in
terfacing, unauthorized mo dication or misuse, operation
outside of the en
vironmen
tal specications for the pro duct, or improp er site preparation or
main
tenance.
NO OTHER W
ARRANTY IS EXPRESSED OR IMPLIED. HP SPECIFICALLY
DISCLAIMS THE IMPLIED W
ARRANTIES OR MER
CHANT
ABILITY AND FITNESS
F
OR AP
AR
TICULAR PURPOSE.
EX
CLUSIVE REMEDIES
THE REMEDIES PROVIDED HEREIN ARE BUYER'S SOLE AND EXCLUSIVE
REMEDIES. HP SHALL NOT BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL,
INCIDENTAL, OR CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT,
TORT, OR ANY OTHER LEGAL THEORY.
ASSIST
ANCE
Pr
o
duct maintenanc
eagr
e
ements and other customer assistanc
e agr
e
ements ar
eavailable for
Hew lett-Packar
dPr
oducts.
For any assistanc
e, c
ontact your ne
arest Hew lett-Packar
d Sales and Servic
eOc
e. A
ddresses
ar
eprovided at the b
ack of this manual.
iii

Contents
1. Intro duction
Organization of This Document. . . . . . . . . . . . . . . . . . . . . 1-1
System Description . . . . . . . . . . . . . . . . . . . . . . . . . 1-1
Principles of Pulsed-RF Network Measurements . . . . . . . . . . . . . 1-1
Pulse Measurements Overview . . . . . . . . . . . . . . . . . . . . 1-1
Operating the HP 8510 for Pulsed-RF Measurements . . . . . . . . . . 1-1
Frequency Domain Point-in-Pulse Measurements . . . . . . . . . . . . 1-2
Pulse Prole Domain Measurements . . . . . . . . . . . . . . . . . . 1-2
General Timing Information . . . . . . . . . . . . . . . . . . . . . 1-2
Using External Triggering and Pulse Mo dulation . . . . . . . . . . . . 1-2
High P
ow
er Measuremen
ts . .................. . . . 1-2
Reference Data ................. . ... . . . ...1-2
2. System Description
Who Should Mak
ePulsed-RF Measuremen
ts? ..............2-1
Theory of Operation .............. . .........2-2
T
est Set Signal Flow........................2-3
3. Principles of Pulsed-RF Net
w
ork Measuremen
ts
Pulse Rep etition P
erio d, PRP .....................3-1
Pulse Rep etition F
requency
,PRF ................ . . . .3-1
Dut
yCycle ............. . . . ..............3-2
Pulse Width ..... . . . . . . . .................3-2
Rise/F
all Time . . . . .................. . . . . . . 3-2
Trigger Delay. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2
Pulse Prole Measurement Resolution Perio d . . . . . . . . . . . . . . . 3-3
4. Pulse Measurements Overview
Pulsed-RF S-parameters versus Frequency . . . . . . . . . . . . . . . . 4-1
Pulse Prole Domain .................. . ......4-3
5. Operating the HP 8510 for Pulsed-RF Measuremen
ts
System Connections . . . . . . . . . . . . . . . . . . . . . . . . . . 5-1
Turn On System P
ower . . . . . . . . . . . . . . . . . . . . . . . . 5-3
Load Pulse Hardware State and Instrumen
t State Files . . . . . . . . . 5-3
Operator's Chec
k . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5
Pulse Prole Domain Check . . . . . . . . . . . . . . . . . . . . . 5-5
Frequency Domain Check . . . . . . . . . . . . . . . . . . . . . . 5-7
External T
riggering Chec
k......... . ............5-9
Contents-1

6. Frequency Domain Point-in-Pulse Measurements
Measurement Calibration for Point-in-Pulse . . . . . . . . . . . . . . . 6-1
Measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-1
Set Pulse Polarity . . . . . . . . . . . . . . . . . . . . . . . . . . 6-1
Set Pulse Width . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Set Duty Cycle Limit . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Set Trigger Delay. . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Connect the Device Under Test . . . . . . . . . . . . . . . . . . . . 6-2
7. Pulse Prole Domain Measurements
Measurement Calibration for Pulse Prole . . . . . . . . . . . . . . . . 7-1
Pulse Prole Domain . . . . . . . . . . . . . . . . . . . . . . . . 7-1
Frequency Domain Using Frequency List . . . . . . . . . . . . . . . . 7-2
Measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-4
Set Pulse Polarity . . . . . . . . . . . . . . . . . . . . . . . . . . 7-4
Set Pulse Width . . . . . . . . . . . . . . . . . . . . . . . . . . 7-5
Set Duty Cycle Limit . . . . . . . . . . . . . . . . . . . . . . . . 7-5
Set Measurement Time Span . . . . . . . . . . . . . . . . . . . . . 7-5
Set Measuremen
tResolution P
erio d......... . . . . . ....7-5
Connect the Device under T
est ... . . . . . . . ..........7-5
Switc
hing Bet
ween Frequency Domain and Pulse Prole Domain ......7-7
8. General Timing Information
Net
w
ork Analyzer Measuremen
tCycle .................. 8-1
Measuremen
tCycle Time .............. . .......8-3
Sw
eep Time ........ . .................8-3
Pulse Width .. . .......................8-3
Dut
yCycle Limit .................. . .....8-3
Pulse Prole Domain Stop Time .......... . . . ....8-3
F
requency Domain T
rigger Dela
y......... . . . .....8-3
Pulse Repetition P
erio dand Dut
y Cycle Considerations . .........8-4
External Trigger and Stop Sweep Signals ................. 8-5
9. Using External Triggering and Pulse Modulation
Connect the Pulse Generator . . . . . . . . . . . . . . . . . . . . . . 9-1
10. High Power Measurements
Signal Lev
el Characteristics ....... . ............ . .10-1
Connecting external signal conditioning . ................10-2
Example High P
o
w
er Measuremen
ts .. . ................10-3
Measure a30dBAmplier . . . . . . . . . . . . . . . . . . . . . .10-3
Measure an Amplier with High Input Lev
els . . . . . . . . . . . . . . 10-4
Using the P
ort 1 and P
ort 2 A
ttenuators . . . . . . . . . . . . . . . . . 10-5
Controlling the A
ttenuators . . . . . . . . . . . . . . . . . . . . . 10-5
Measure User Parameters and Set A
ttenuators . . . . . . . . . . . . . 10-5
Changing Signal Path After Calibration . . . . . . . . . . . . . . . . . 10-6
Set the Attenuators . . . . . . . . . . . . . . . . . . . . . . . . . 10-6
Store T
race Memories ........................10-6
View the Normalized P
arameters ............ . ......10-7
Selecting the Appropriate Measuremen
tCalibration ..... . ......10-7
General Calibration and Measurement Sequence .............10-9
Contents-2

General Calibration and Measurement Sequence Using Display Math . . . . 10-9
11. Reference Data
Creating Pulse Hardware State and Instrument State Files . . . . . . . . . 11-1
Pulse Menus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-2
Pulse Conguration Menu . . . . . . . . . . . . . . . . . . . . . . 11-2
DETECTOR: WIDE BW . . . . . . . . . . . . . . . . . . . . . 11-2
DETECTOR: NORMAL BW . . . . . . . . . . . . . . . . . . . 11-3
PULSE WIDTH . . . . . . . . . . . . . . . . . . . . . . . . . 11-3
DUTY CYCLE . . . . . . . . . . . . . . . . . . . . . . . . . . 11-3
PULSE OUT: HIGH . . . . . . . . . . . . . . . . . . . . . . . 11-3
PULSE OUT: LOW. . . . . . . . . . . . . . . . . . . . . . . . 11-3
TRIGGER DELAY . . . . . . . . . . . . . . . . . . . . . . . . 11-3
TRIG MODE: INTERNAL . . . . . . . . . . . . . . . . . . . . 11-3
TRIG MODE: EXTERNAL . . . . . . . . . . . . . . . . . . . . 11-3
HP 8510 Option 008 Added Programming Co des . . . . . . . . . . . . . 11-4
HP 8510 Option 008 Added Query Commands . . . . . . . . . . . . . . 11-4
Contents-3

Figures
1-1. HP 8510 Pulsed-RF Network Analyzer System . . . . . . . . . . . . . 1-3
2-1. Simplied Pulsed-RF Network Analyzer Blo ck Diagram . . . . . . . . . 2-2
2-2. HP 85110A S-Parameter Test Set Signal Flow . . . . . . . . . . . . . 2-4
3-1. Pulse Terms and Denitions . . . . . . . . . . . . . . . . . . . . . 3-3
4-1. Pulsed-RF S-Parameters versus Frequency (Frequency Domain Point-in-Pulse) 4-2
4-2. Pulsed-RF S-Parameters versus Time (Pulse Prole Domain) Measurement
Internal Pulse Output and Internal MeasurementTrigger . . . . . . . 4-4
5-1. System Cable Connections . . . . . . . . . . . . . . . . . . . . . . 5-2
5-2. Typical Response After Recall, Inst. State 8, Frequency, Detector: WB, Mult.
Srce. On . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-4
5-3. Domain, Pulse Prole, Mark
er . . . . . . . . ............5-4
5-4. Pulse Prole, User1 a1, Marker .................. . 5-6
5-5. Pulse Prole, S
11
.................... . .....5-6
5-6. S
11
,F
requency Domain, Pulse Width 10

s,T
rigger Dela
y5

s . .....5-7
5-7. S
11
,F
requency Domain, Pulse Width 10

s,T
rigger Dela
y15
 s. . ....5-8
6-1. Amplier Gain, F
requency Domain P
oin
t-in-Pulse . ...........6-3
7-1. Frequency List Displa
yDuring Measuremen
tCalibration .........7-3
7-2. Pulse Prole, F
requency List Segmen
tNum
ber 1............7-3
7-3. S
21
,Pulse Prole, Thru ......... . .............7-4
7-4. Minimum Time Span, Resolution P
erio d=100 ns ............7-6
7-5. S
11
, Smith Chart ..................... . . . ..7-6
8-1. Net
w
ork Analyzer Measuremen
tCycle ......... . . . .....8-2
8-2. Example In
ternal Pulse Output PRP and Dut
y Cycle . . . . ......8-4
8-3. External Trigger and Stop Sweep Timing Diagram ...........8-5
9-1. External Control of PRP and Duty Cycle . . . . . . . . . . . . . . . 9-2
9-2. Using External Trigger and External Mo dulation PRP = 10 microseconds,
Duty Cycle = 50% . . . . . . . . . . . . . . . . . . . . . . . . 9-3
10-1. Test Set Maximum Signal Levels . . . . . . . . . . . . . . . . . . . 10-2
10-2. Measuring a 30 dB gain Amplier . . . . . . . . . . . . . . . . . . . 10-3
10-3. Measuring an Amplier with High Input Lev
els ........... . .10-4
11-1. Option 008 Domain, Stim
ulus, and System Men
us ... . ........11-5
Contents-4

1
Introduction
This documentis intended for use with the HP 8510B/C Option 008 Network Analyzer
and is a supplement to the HP 8510B/C Operating and Programming manual. It contains
descriptions of the pulsed-RF network analyzer system features for measurements in the
frequency domain and in the pulse prole domain. With resp ect to the standard, swept CW
system, op eration of the pulsed-RF system is identical except that the measurement is made
at a sp ecic, known time during each pulse. For information about network analysis, please
refer to HP Pro duct Note 8510-10, HP 8510B Intro ductory User's Guide, for an intro duction
to using the front panel for measurement setup, measurement calibration, and basic network
measurements.
Organization of This Document
This section con
tains alist of the c
hapters in this documen
tand abrief description of the
con
ten
ts of eac
hc
hapter.
System Description
In
tro duces the HP 8510B/C Option 008 Pulsed-RF measuremen
tcapabilit
y
.
Principles of Pulsed-RF Netw
ork Measurements
Alist of the terms and denitions used in pulsed-RF netw
ork measuremen
ts.
Pulse Measurements Overview
A description of how the network analyzer measures pulsed-RF S-parameters versus frequency
and versus time.
Operating the HP 8510 for Pulsed-RF Measurements
Describ es the setup, measuremen
t calibration, and measuremen
t process for setting up the
system and making pulsed-RF measuremen
ts.
Introduction 1-1

Frequency Domain Point-in-Pulse Measurements
This chapter contains measurement calibration and measurement pro cedures to display the
pulsed-RF S-parameters versus frequency.
Pulse Profile Domain Measurements
This chapter contains measurement calibration and measurement pro cedures to display the
pulsed-RF S-parameters versus time.
General Timing Information
Descriptions of the internal timing to show the system's internal pulse rep etition perio d and
duty cycle capabilities.
Using External Triggering and Pulse Modulation
This section contains information to help you determine if your application requires external
pulse mo dulating equipmen
t, and instructions for connecting the external equipmen
t.
High P
o
w
er Measurements
Discusses the special considerations required to protect the test system and main
tain accuracy
when making measuremen
ts at high RF po
wer lev
els.
Reference Data
Sho
ws all option 008 men
ustructures and k
ey denitions, including programming co des.
1-2 Introduction

Figure 1-1. HP 8510 Pulsed-RF Netw
ork Analyzer System
Introduction 1-3

2
System Description
This chapter contains the following information.
A description of the HP 8510 Pulsed-RF Network Analyzer System.
A simplied blo ck diagram of the HP 8510 Pulsed-RF Network Analyzer System.
A signal ow diagram of the HP 85110-series S-parameter Test Set.
Who Should Make Pulsed-RF Measurements?
Pulsed-RF stim
ulus ma
yberequired in cases where con
tin
uous application of the test signal
could destro
ythe device, suc
has when testing occurs prior to pack
aging, or where the device
m
ust betested using aPRF and dutycycle that accurately represen
ts its nal application.
The HP 8510 pulsed-RF netw
ork analyzer conguration adds specialized hardw
are and an
optimized rm
w
are feature set to mak
efully error-corrected S-parameter measuremen
ts of
pulsed-RF responses. F
or the rst time, the com
bination of wideband IF and accurate timing
circuits pro
vides precise sync
hronization with the pulse, allowing S-parameters to bemeasured
at aprecisely kno
wn, repeatable time during the pulse. This extends the HP 8510 applications
in
to tw
oma jor areas: tests in whic
hthe stimulus signal to the device is pulsed, and tests of
devices whic
haccept aCW input and pro duce apulsed output.
The HP 8510 pulsed-RF net
w
ork analyzer system allows y
ou to calibrate in the same
en
vironmen
tas y
our measuremen
t. F
or example, if y
ou are making a high pow
er, pulsed-RF
measuremen
t, y
ou can calibrate in the same high po
wer, pulsed-RF mode. Calibration data is
taken only while the pulse is on. This type of calibration mayprevent damage to calibration
standards that would be damaged in high power, CW calibrations.
The recommended conguration of the HP 85108 Pulsed-RF Network Analyzer consists of the
following items.
HP 8510B/C net
work analyzer equipped with Option 008, Wideband IF, and HP 8510
rm
w
are revision B.05.11 or greater (for the HP 8510B), or revision C.06.54 or greater (for
HP 8510C).
HP 83622 syn
thesized sw
eeper with options 001, 003, 004, and 008.
HP 83624 synthesized sweeper with options 003, 004, and 008.
HP 85110-series pulsed-RF fundamen
tally mixed S-parameter test set
Also, other external equipmentsuchaspower ampliers, bias supplies and pulse generators
ma
ybeincluded in the system.
System Description 2-1

The pulsed-RF network analyzer system allo ws you to select either the normal precision 10
kHz IF bandwidth or the new wideband 3 MHz IF bandwidth. The wide IF and detection
bandwidth allows testing using pulses as short as 1 microsecond but with accuracy comparable
to traditional non-pulsed measurements.
These system comp onents may b e rack-mounted or arranged on a desktop.
Theory of Operation
A simplied blo ck diagram of the system is shown in Figure 2-1. One synthesizer provides
the test signal stimulus to the RF input of the test set and the other provides the LO signal
to the four frequency converters (only two are shown). The LO source is always tuned 20
MHz above the test signal source. The standard internal phaselo cktechnique is not used;
instead, a common 10 MHz frequency reference is used for both of these sources and the
internal sample selection and timing logic in the HP 8510. These sources are considered to b e
coherent, thus generating the correct 20 MHz rst IF and the correct clo ck frequency for the
reference and test synchronous detectors. This eliminates the need to use the reference signal
for receiver phaselo ck and allo ws all reference and test signals to be pulsed, therebymaking
fully error-corrected 2-p ort, pulsed-RF S-parameter measurements p ossible.
Figure 2-1. Simplified Pulsed-RF Network Analyzer Block Diagram
Using awider bandwidth in both the reference and the test IF, sync
hronous detectors that
operate at 20 MHz, and accurate measuremen
tsample timing circuits allow exible analysis
of device response during the pulse. With the sources and test set con
trolled b
y the HP 8510
over the 8510 system bus, and with all necessary pulse generation and measuremen
t timing
signals generated in
ternally from a common 10 MHz reference, the HP 85108 is a complete
pulsed-RF stimulus/response test system. One pulse of a user-sp ecied width is measured at
each data poin
t and the measuremen
t is sync
hronized so that it is made at a certain kno
wn
time in the pulse. The stimulus duty cycle can b e predicted for a given instrument state,
but the actual pulse rep etition p eriod depends upon the current domain, cal type, averaging,
sw
eep time, and pulse width selections. F
or this reason, if y
our device is sensitiv
eto dut
y
cycle, refer to General Timing Information.
2-2 System Description

Either the internal logic, the TTL Trigger Input, or the HP-IB Group Execute Trigger from
an external controller can initiate a measurement cycle. When control of the pulse rep etition
perio d and duty cycle is required, the HP 8510 can use the trigger input to synchronize with
the internal or an external pulse modulator. The HP 8510 Stop Sweep output can be used as
a gating signal to tell when the analyzer is ready for the next measurement. The measurement
is made with 100 nanosecond resolution and ab out 200 picosecond uncertainty with respect to
the internally- or externally-generated measurement trigger.
Test Set Signal Flow
Figure 2-2 shows a detailed diagram of the HP 85110-series test set signal separation, signal
routing, and frequency conversion. This is a fundamentally mixed test set, providing four 20
MHz outputs to the network analyzer. Placement of a 0 to 90 db (10 dB/step) attenuator
before each mixer provides control of the signal levels into the mixers while allowing operation
at high PORT 1 and PORT 2 signal levels necessary in many pulsed-RF applications.
The test set has rear panel access links to allo w integration of additional test and signal
conditioning equipment in the low-loss main signal paths to the test ports. If your device
exhibits more than about 20 dB of gain, or higher p ort signal levels are required, refer to the
High P
o
w
er Measuremen
ts chapter.
Hewlett-P
ac
k
ard harmonic mixing test sets are designed to work with the normal 10 kHz IF
and detectors. These include the HP 8514, 8515, and 8516 coaxial test sets; and the HP 85104
millimeter w
a
v
eguide test set. This HP 85110 fundamen
tal mixing test set is designed to w
ork
with the wideband IF and detectors. There are applications in whic
hthe HP 85110 can be
used with normal IF and detectors. The HP 85104 millimeter test sets can becongured to
operate with the wideband IF and perform the pulse measuremen
tfunctions described here.
All HP coaxial test sets can beequipped to include Option 001, IF Switc
hing for Multiple
Test Sets, so asystem can beequipped for awide range of applications b
yincluding up to
four coaxial test sets and amillimeter-wa
v
etest set.
System Description 2-3

Figure 2-2. HP 85110A S-P
arameter T
est Set Signal Flo
w
2-4 System Description

3
Principles of Pulsed-RF Network Measurements
This chapter contains a list of terms used to describe the pulsed-RF stimulus and response.
Figure 3-1 shows a typical envelope of the pulsed-RF waveform output by the RF signal
source. For internal measurement triggering, the RF frequency and the ON time of the pulse
is controlled by the HP 8510 so that there is one pulse per measurement.
Pulse Repetition Period, PRP
The time from the 50 percentpoint on the rising edge of one pulse to the 50 p ercentpointon
the rising edge of the next pulse.
F
or in
ternal triggering operation the system PRP dep ends up on the instrumen
t state.
T
ypically there is one pulse per measuremen
t. The pulse is turned ON for auser-sp ecied
time and the measuremen
tismade at some user-sp ecied time relativ
eto the start of the
pulse. The time un
til the next pulse consists rst of the time required for the analyzer to set
up for the next measuremen
tand second, if necessary
,w
aiting to satisfy the user-specied
pulse width and dut
ycycle limit.
In the frequency domain, when the analyzer is tuned to the next frequency, the maxim
um
PRP is about 30 milliseconds. In the Pulse Prole domain, the frequency do es not c
hange,
making the maxim
um PRP about 3milliseconds. With a
v
eraging, the PRP can beabout 1
millisecond during part of the measuremen
t. Other factors whic
haect the system PRP are
calibration t
ype, pulse width, dut
y cycle, and pulse prole domain stop time.
If the PRP is con
trolled externally
,the HP 8510 external trigger input is used to sync
hronize
the analyzer with the pulse.
Pulse Repetition Frequency, PRF
PRF
=
1
PRP
Principles of Pulsed-RF Netw
ork Measurements 3-1

Duty Cycle
The ratio of the time that the pulse is ON to the total Pulse Repetition Period. If the pulse
ON and OFF times are equal, the Duty Cycle is 50 percent.
For internal operation, the maximum duty cycle p ercent limit can b e specied, but the actual
duty cycle may be less, depending upon the user-specifed pulse width and the time it takes for
the analyzer to set up for the next measurement.
Pulse Width
The ON time from the 50 p ercent point on the rising edge to the 50 p ercentpointon the
falling edge.
The internally-generated Pulse Width can b e set from less than 100 nanoseconds to 40.88
milliseconds.
Rise/F
all Time
The pulse transition time:
tr =pulse rise time
The time it tak
es for the pulse to rise from the 10 percen
tON condition to the 90 p ercen
tON
condition.
tf =pulse fall time
The time it tak
es for the pulse to fall from the 90 percen
tON condition to the 10 percen
tON
condition.
The normal IF responds to rise/fall times of ab out 75 microseconds; the wideband IF resp onds
to rise/fall times of about 300 nanoseconds.
Trigger Dela
y
The time after pulse ON that the measuremen
tis actually made.
In the F
requency domain, the T
rigger Dela
y can be set from do
wn to -6 resolution perio ds
(internal) or +3 resolution p erio ds (external) and up to 40.88 milliseconds. In the Pulse
Prole domain the trigger dela
y is automatic dep ending up on the displa
y time span, pulse
width, and numb er of poin
ts.
3-2 Principles of Pulsed-RF Netw
ork Measurements

Pulse Profile Measurement Resolution Period
The time b etween adjacent Pulse Prole domain data p oints. The minimum is 100
nanoseconds. This is set by an algorithm depending upon the Pulse Prole stop time, pulse
width, and number of time points.
Figure 3-1. Pulse T
erms and Definitions
Principles of Pulsed-RF Netw
ork Measurements 3-3