Tektronix TDS5000B Series Use and care manual

Technical Reference
TDS5000B Series
Digital Phosphor Oscilloscopes
Specifications and Performance Verification
071-1420-03
Revision A
This document applies to firmware version 1.00
and above.
Warning
The servicing instructions are for use by qualified
personnel only. To avoid personal injury, do not
perform any servicing unless you are qualified to
do so. Refer to all safety summaries prior to
performing service.
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TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

TDS5000B Series Specifications and Performance Verification i
Table of Contents
General Safety Summary v...................................
Specifications 1--1.............................................
Product and Feature Description 1--2....................................
Acquisition Features 1--2..........................................
Signal Processing Features 1--3.....................................
Display Features 1--3.............................................
Measurement Features 1--4.........................................
Trigger Features 1--4..............................................
Convenience Features 1--4.........................................
Specification Tables 1--6..............................................
Performance Verification
Conventions 2--2....................................................
Brief Procedures 2--5...........................................
Self Tests 2--5.......................................................
Verify Internal Adjustment, Self Compensation, and Diagnostics 2--5.......
Functional Tests 2--6.................................................
Verify All Input Channels 2--7......................................
Verify the Time Base 2--9..........................................
Verify the A (Main) and B (Delayed) Trigger Systems 2--11...............
Verify the File System 2--12.........................................
Verify the Internal Printer (Optional) 2--14.............................
Performance Tests 2--17.........................................
Prerequisites 2--17....................................................
Equipment Required 2--18..............................................
TDS5000B Series Test Record 2--20......................................
Signal Acquisition System Checks 2--24...................................
Check DC Voltage Measurement Accuracy 2--24........................
Check Analog Bandwidth 2--28......................................
Check Delay Between Channels 2--33.................................
Check Channel Isolation (Crosstalk) 2--37.............................
Time Base System Checks 2--39.........................................
Check Long-Term Sample Rate and Delay Time Accuracy 2--39...........
Check Delta Time Measurement Accuracy 2--41........................
Trigger System Checks 2--45............................................
Check Time Accuracy for Pulse, Glitch, Timeout, and Width Triggering 2--45.
Check Sensitivity, Edge Trigger, DC Coupled 2--48......................
Output Signal Checks 2--54.............................................
Check Outputs 2--54...............................................
Check Probe Compensation Output 2--57..............................
Sine Wave Generator Leveling Procedure 2--61.............................

Table of Contents
ii TDS5000B Series Specifications and Performance Verification
List of Figures
Figure 2--1: Toolbar and menu bar 2--3...........................
Figure 2--2: Universal test hookup for functional tests -- CH 1 shown 2--7
Figure 2--3: Channel button location 2--8..........................
Figure2--4:Setupfortimebasetest 2--9...........................
Figure 2--5: Setup for trigger test 2--11.............................
Figure 2--6: Setup for the file system test 2--13.......................
Figure 2--7: Example test page from the internal printer 2--15.........
Figure 2--8: Initial test hookup 2--25...............................
Figure 2--9: Measurement of DC accuracy at maximum offset
and position 2--27...........................................
Figure 2--10: Initial test hookup 2--29..............................
Figure 2--11: Optional initial test hookup 2--29......................
Figure 2--12: Measurement of analog bandwidth 2--32................
Figure 2--13: Initial test hookup 2--34..............................
Figure 2--14: Measurement of channel delay 2--36...................
Figure 2--15: Initial test hookup 2--37..............................
Figure 2--16: Initial test hookup 2--39..............................
Figure 2--17: Measurement of accuracy -- long-term and delay time 2--41
Figure 2--18: Delta time accuracy test hookup 2--42..................
Figure 2--18: Initial test hookup 2--45..............................
Figure 2--19: Measurement of time accuracy for pulse and
glitch triggering 2--47........................................
Figure 2--20: Initial test hookup 2--49..............................
Figure 2--21: Measurement of trigger sensitivity showing 50 MHz results . .
2--50
Figure 2--22: Initial test hookup 2--54..............................
Figure 2--23: Measurement of main trigger out limits 2--56............
Figure 2--24: Initial test hookup 2--57..............................
Figure 2--25: Measurement of probe compensator frequency 2--58......
Figure 2--26: Subsequent test hookup 2--59.........................
Figure 2--27: Measurement of probe compensator amplitude 2--60......
Figure 2--28: Sine wave generator leveling equipment setup
(Method A) 2--61...........................................
Figure 2--29: Sine wave generator leveling equipment setup
(Method B) 2--63............................................

Table of Contents
TDS5000B Series Specifications and Performance Verification iii
List of Tables
Table 1--1: TDS5000B Series models 1--2..........................
Table 1--2: Channel input and vertical specifications 1--6............
Table 1--3: Horizontal and acquisition system specifications 1--13......
Table 1--4: Trigger specifications 1--14.............................
Table 1--5: Display specifications 1--19.............................
Table 1--6: Input/output port specifications 1--19....................
Table 1--7: Data storage specifications 1--20........................
Table 1--8: Power source specifications 1--21........................
Table 1--9: Mechanical specifications 1--21.........................
Table 1--10: Environmental specifications 1--22.....................
Table 1--11: Certifications and compliances 1--23....................
Table 2--1: Test equipment 2--18..................................
Table 2--2: DC Voltage measurement accuracy 2--26.................
Table 2--3: Analog bandwidth 2--30...............................
Table 2--4: Delta time measurement 2--44..........................

Table of Contents
iv TDS5000B Series Specifications and Performance Verification

TDS5000B Series Specifications and Performance Verification v
General Safety Summary
Review the following safety precautions to avoid injury and prevent damage to
this product or any products connected to it. To avoid potential hazards, use this
product only as specified.
Only qualified personnel should perform service procedures.
While using this product, you may need to access other parts of the system. Read
the General Safety Summary in other system manuals for warnings and cautions
related to operating the system.
Use Proper Power Cord. Use only the power cord specified for this product and
certified for the country of use.
Connect and Disconnect Properly. Do not connect or disconnect probes or test
leads while they are connected to a voltage source.
Ground the Product. This product is grounded through the grounding conductor
of the power cord. To avoid electric shock, the grounding conductor must be
connected to earth ground. Before making connections to the input or output
terminals of the product, ensure that the product is properly grounded.
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information before making connections to the product.
Do Not Operate Without Covers. Do not operate this product with covers or panels
removed.
Use Proper Fuse. Use only the fuse type and rating specified for this product.
Avoid Exposed Circuitry. Do not touch exposed connections and components
when power is present.
Do Not Operate With Suspected Failures. If you suspect there is damage to this
product, have it inspected by qualified service personnel.
Do Not Operate in Wet/Damp Conditions.
Do Not Operate in an Explosive Atmosphere.
Keep Product Surfaces Clean and Dry.
Provide Proper Ventilation. Refer to the manual’s installation instructions for
details on installing the product so it has proper ventilation.
ToAvoidFireor
Personal Injury

General Safety Summary
vi TDS5000B Series Specifications and Performance Verification
Terms in this Manual. These terms may appear in this manual:
WARNING. Warning statements identify conditions or practices that could result
in injury or loss of life.
CAUTION. Caution statements identify conditions or practices that could result in
damage to this product or other property.
Terms on the Product. These terms may appear on the product:
DANGER indicates an injury hazard immediately accessible as you read the
marking.
WARNING indicates an injury hazard not immediately accessible as you read the
marking.
CAUTION indicates a hazard to property including the product.
Symbols on the Product. The following symbols may appear on the product:
CAUTION
Refer to Manual
WARNING
High Voltage
Protective Ground
(Earth) Terminal Standby
Symbols and Terms

TDS5000B Series Specifications and Performance Verification 1-1
Specifications
This chapter contains specifications for the TDS5000B Series Digital Phosphor
Oscilloscopes. All specifications are guaranteed unless labeled “typical.” Typical
specifications are provided for your convenience but are not guaranteed.
Specifications marked with the nsymbol are verified in the Performance
Verification section.
The specifications in this section apply to all TDS5000B Series models unless
noted otherwise. To meet specifications, the following conditions must be met:
HThe oscilloscope must have been calibrated in an ambient temperature
between 20 °C and 30 °C(68°F and 86 °F).
HThe oscilloscope must be operating within the environmental limits listed in
Table 1--10 on page 1--22.
HThe oscilloscope must be powered from a source that meets the specifica-
tions listed in Table 1--8 on page 1--21.
HThe oscilloscope must have been operating continuously for at least 20
minutes within the specified operating temperature range.
HYou must perform the Signal Path Compensation procedure after the
20-minute warm-up period and the ambient temperature must not change
more than 5 °C(9°F) without first repeating the procedure. See Run the
signal-path compensation routine on page 2--6 for instructions on how to
perform this procedure.
HYou must perform the Signal Path Compensation procedure after the
20-minute warm-up period, and the ambient temperature must not change
more than 5 °C without first repeating the procedure. See Optimizing
Measurement Accuracy on page 2--6 for instructions to perform this
procedure.

Specifications
1-2 TDS5000B Series Specifications and Performance Verification
Product and Feature Description
The TDS5000B Series Digital Phosphor Oscilloscope family consists of the
models shown in Table 1--1.
Table 1- 1: TDS5000B Series models
Model
Number of
channels Bandwidth
Maximum sample
rate (real time)
TDS5032B 2350 MHz 5 GS/s
TDS5034B 4350 MHz 5 GS/s
TDS5052B 2500 MHz 5 GS/s
TDS5054B 4500 MHz 5 GS/s
TDS5054BE 4500 MHz 1 GS/s
TDS5104B 41GHz 5 GS/s
Separate Digitizers. Ensure accurate timing measurements with separate digitizers
for each channel. Acquisition on multiple channels is always concurrent and
supports full bandwidth for single-shot acquisitions on each channel. The
digitizers can also be combined to yield a higher sample rate on a single channel.
NOTE. Full bandwidth single-shot acquisition is not available for TDS5104B
Series oscilloscopes, except in one or two channel mode.
Digitizers cannot be combined to yield a higher sample rate for a single channel
when using TDS5054BE Series oscilloscopes.
Fast Acquisition. Acquire up to 100,000 waveforms per second to see rapidly
changing signals or intermittent signal irregularities.
Long Record Lengths. Choose record lengths from 500 points to up to 2,000,000
points per channel (up 8,000,000 points on a single channel). Extend the
maximum record length up to a maximum of 16,000,000 points with memory
options.
Peak Detect Acquisition Mode. See pulses as narrow as 400 ps, even at the slower
time base settings. Peak detect helps you see noise and glitches in your signal.
Acquisition Features

Specifications
TDS5000B Series Specifications and Performance Verification 1-3
Acquisition Control. Acquire continuously or set up to capture single shot
acquisitions. Enable or disable optional acquisition features such as equivalent
time or roll mode.
Horizontal Delay. Use delay when you want to acquire a signal at a significant
time interval after the trigger point. Toggle delay on and off to quickly compare
the signal at two different points in time.
Average, Envelope, and Hi Res Acquisition. Use Average acquisition mode to
remove uncorrelated noise from your signal. Use Envelope to capture and
display the maximum variation of the signal. Use Hi Res to increase vertical
resolution for lower bandwidth signals.
Waveform Math. Set up simple math waveforms using the basic arithmetic
functions including FFT, or create more advanced math waveforms using the
optional math expression editor. Waveform expressions can even contain
measurement results and other math waveforms.
Spectral Analysis. Display spectral magnitude and phase waveforms based on
your time-domain acquisitions. Control the oscilloscope using the traditional
spectrum analyzer controls such as span and center frequency.
Color LCD Display. Identify and differentiate waveforms easily with color coding.
Waveforms, readouts, and inputs are color matched to increase productivity and
reduce operating errors.
Digital Phosphor. A Digital Phosphor Oscilloscope can clearly display intensity
modulation in your signals. The oscilloscope automatically overlays subsequent
acquisitions and then decays them to simulate the writing and decay of the
phosphor in an analog oscilloscope CRT (cathode-ray tube). The feature results
in an intensity-graded or color-graded waveform display that shows the
information in the intensity modulation.
Fit to Screen. The Digital Phosphor technology performs the compression
required to represent all record points on the screen, even at the maximum record
length settings.
Zoom. To take advantage of the full resolution of the oscilloscope you can zoom
in on a waveform to see the fine details. Both vertical and horizontal zoom
functions are available.
Signal Processing
Features
Display Features

Specifications
1-4 TDS5000B Series Specifications and Performance Verification
Cursors. Use cursors to take simple voltage, time, and frequency measurements.
Automatic Measurements. Choose from a large palette of amplitude, time, and
histogram measurements. You can customize the measurements by changing
reference levels or by adding measurement gating.
Simple and Advanced Trigger Types. Choose simple edge trigger or choose from
many advanced trigger types to help you capture a specific signal fault or event.
Dual Triggers. Use the A (main) trigger system alone or add the B trigger to
capture more complex events. You can use the A and B triggers together to set
up a delay-by-time or delay-by-events trigger condition.
Autoset. Use Autoset to quickly set up the vertical, horizontal, and trigger
controls for a usable display.
Touch Screen Interface. (Optional) You can operate all oscilloscope functions
(except the power switch) from the touch screen interface. You can also install a
mouse and keyboard to use the interface.
Toolbar or Menu Bar. You can choose a toolbar operating mode that is optimized
for use with the touch screen, or a PC-style menu-bar operating mode that is
optimized for use with a mouse.
Open Desktop. The oscilloscope is built on a Microsoft Windows software
platform; the oscilloscope application program starts automatically when you
apply power to the instrument. You can minimize the oscilloscope application
and take full advantage of the built-in PC to run other applications. Moving
waveform images and data into other applications is as simple as a copy/paste
operation.
Dedicated Front Panel Controls. The front panel contains knobs and buttons to
provide immediate access to the most common oscilloscope controls. Separate
vertical controls are provided for each channel. The same functions are also
available through the screen interface.
Data Storage and I/O. The oscilloscope has a standard floppy disk drive and
CD-R/W drive or optional removable hard disk drive, that can be used for
storage and retrieval of data. The oscilloscope has GPIB, USB, Parallel, RS232,
and Ethernet ports for input and output to other devices.
Measurement Features
Trigger Features
Convenience Features

Specifications
TDS5000B Series Specifications and Performance Verification 1-5
Online Help. The oscilloscope has a complete online help system that covers all
its features. The help system is context sensitive; help for the displayed control
window is automatically shown if you touch the help button. Graphical aids in
the help windows assist you in getting to the information you need. You can also
access the help topics through a table of contents or index.

Specifications
1-6 TDS5000B Series Specifications and Performance Verification
Specification Tables
Table 1- 2: Channel input and vertical specifications
Characteristic Description
Input coupling AC, DC, and GND
Input channels
TDS5034B, TDS5054B, TDS5054BE,
TDS5104B
Four identical channels
TDS5032B, TDS5052B Two identical channels
Input impedance selection 50 Ωor 1 MΩ.
TDS5104B bandwidth limited to 500 MHz, 1 MΩselected
Input impedance,DC coupled Product Limits
50 Ω,typical TDS5032B, TDS5052B,
TDS5034B, TDS5054B,
TDS5054BE
±1.0%
TDS5104B ±2.5%
VSWR TDS5032B, TDS5034B ≤1.6:1 typical from DC to 350 MHz
TDS5052B, TDS5054B,
TDS5054BE
≤1.6:1 typical from DC to 500 MHz
TDS5104B ≤1.5:1 typical from DC to 1 GHz
1MΩTDS5032B, TDS5052B,
TDS5034B, TDS5054B,
TDS5054BE
±1.0% in parallel with 15.5 pF ±2pF
TDS5104B ±1.0% in parallel with 18 pF ±2pF
Maximum voltage at input BNC AC, DC, or GND coupled
1MΩ150 VRMS CAT I, and ≤400 peak
For steady state sinusoidal waveforms, derate at 20 dB/decade above 200
kHz to 9 VRMS at ≥3MHz
50 Ω TDS5032B, TDS5052B,
TDS5034B, TDS5054B,
TDS5054BE
5V
RMS with peaks less than ±30 V
TDS5104B <1 Vrms for settings below 100mV/div
<5 Vrms for 100 mV/div settings and above
nDifferential delay, DC 50 Ω input ≤100 ps between any two channels with DC input coupling and the same
V/div scale settings at or above 10 mV/div
Deskew range, typical ±75.0 ns
nChannel-to-channel crosstalk ≥100:1 at ≤100 MHz

Specifications
TDS5000B Series Specifications and Performance Verification 1-7
Table 1- 2: Channel input and vertical specifications (Cont.)
Characteristic Description
≥30:1 at >100 MHz up to the rated bandwidth for any two channels with
equal V/div settings
Digitizers 8-bit resolution
TDS5032B, TDS5052B Two separate digitizers, each channel sampled
simultaneously
TDS5034B, TDS5054B,
TDS5054BE, TDS5104B
Four separate digitizers, each channel sampled
simultaneously
Sensitivity range Fine adjustment available with ≤1% resolution
1MΩ1 mV/div to 10 V/div, in a 1-2-5 sequence
50 Ω1 mV/div to 1 V/div, in a 1-2-5 sequence
nAnalog bandwidth SCALE range Bandwidth
TDS5032B, TDS5034B 1mV/divto1.99mV/div DC to 150 MHz
2mV/divto4.98mV/div DC to 250 MHz
5mV/divto1V/div DC to 350 MHz
DC 50 Ωcoupling; bandwidth limit set to Full; operating ambient ≤30 °C;
derated by 2.5 MHz/°C above 30 °C
TDS5052B, TDS5054B, TDS5054BE 1mV/divto1.99mV/div DC to 175 MHz
2mV/divto4.98mV/div DC to 300 MHz
5mV/divto1V/div DC to 500 MHz
DC 50 Ωcoupling; bandwidth limit set to Full; operating ambient ≤30 °C;
derated by 2.5 MHz/°C above 30 °C
TDS5104B 1mV/divto1.99mV/div DC to 175 MHz
2mV/divto1V/div DC to 1 GHz
DC 50 Ωcoupling; bandwidth limit set to Full; operating ambient ≤30 °C;
derated by 5 MHz/°C above 30 °C
Analog bandwidth selections 20 MHz, 150 MHz, or Full

Specifications
1-8 TDS5000B Series Specifications and Performance Verification
Table 1- 2: Channel input and vertical specifications (Cont.)
Characteristic Description
Analog Bandwidth Limit
Low frequency, AC coupled 50 Ω:<200 kHz
1MΩ:<10 Hz, reduced by a factor of ten when using a 10X probe
High frequency, typical 20 MHz: with 20 MHz bandwidth limit turned on
150 MHz: with 150 MHz bandwidth limit turned on
Calculated rise time, typical DC 50 Ωcoupling, bandwidth limit set to Full
SCALE range Rise time
TDS5032B, TDS5034B 1mV/divto1.99mV/div 2.67 ns
2mV/divto4.98mV/div 1.6 ns
5mV/divto1V/div 1.15 ns
TDS5052B, TDS5054B,
TDS5054BE
1mV/divto1.99mV/div 2.29 ns
2mV/divto4.98mV/div 1.33 ns
5mV/divto1V/div 800 ps
TDS5104B 1mV/divto1.99mV/div 2.29 ns
2mV/divto1V/div 300 ps
Step response settling errors, typical Bandwidth limit set to Full
SCALE range Settling error at time after step
≤2 V step amplitude 1 mV/div to 99.5 mV/div 20 ns: ≤0.5%
100 ns: ≤0.2%
20 ms: ≤0.1%
≤20 V step amplitude 100 mV/div to 1.0 V/div 20 ns: ≤1.0%
100 ns: ≤0.5%
20 ms: ≤0.2%
≤200 V step amplitude 1.01 V/div to 10 V/div 20 ns: ≤1.0%
100 ns: ≤0.5%
20 ms: ≤0.2%
Position range ±5 divisions
Peak Detect or Envelope Mode Pulse Response Capture of single event pulses
Number of channels Minimum pulse width
1or2 400 ps
3or4 800 ps
Offset range User-adjustable input offset voltages

Specifications
TDS5000B Series Specifications and Performance Verification 1-9
Table 1- 2: Channel input and vertical specifications (Cont.)
Characteristic Description
TDS5032B, TDS5034B, TDS5052B,
TDS5054B, TDS5054BE
SCALE range Offset range
1MΩcoupling 1 mV/div to 99.5 mV/div ±1V
100 mV/div to 1 V/div ±10 V
1.01 V/div to 10 V/div ±100 V
50 Ωcoupling 1 mV/div to 99.5 mV/div ±1V
100 mV/div to 1 V/div ±10 V
TDS5104B SCALE range Offset range
1MΩcoupling 1 mV/div to 99.5 mV/div ±1V
100 mV/div to 1 V/div ±10 V
1.01 V/div to 10 V/div ±100 V
50 Ωcoupling 1 mV/div to 50 mV/div ±0.5 V
50.5 mV/div to 99.5 mV/div ±0.25 V
100 mV/div to 500 mV/div ±5V
505 mV/div to 1 V/div ±2.5 V

Specifications
1-10 TDS5000B Series Specifications and Performance Verification
Table 1- 2: Channel input and vertical specifications (Cont.)
Characteristic Description
Offset accuracy SCALE range Offset range
1mV/divto9.95mV/div ±[(0.2% ×| net offset |) + 1.5 mV + (0.1 div
×V/div setting)]
10 mV/div to 99.5 mV/div ±[(0.35% ×| net offset |) + 1.5 mV + (0.1 div
×V/div setting)]
100 mV/div to 1.0 V/div ±[(0.35% ×| net offset |) + 15 mV + (0.1 div
×V/div setting)]
1.01 V/div to 10 V/div ±[(0.25% ×| net offset |) + 150 mV + (0.1 div
×V/div setting]
Temperatures >40 °C±[(0.75% ×| net offset |) + 150 mV + (0.1 div
×V/div setting)]
where, net offset = offset -- (position ×volts/division)
DC gain accuracy, Sample or Average acquisition
mode ±1.5% + 1.0% ×|net offset /offset range|
TDS5104B: ±3% + 1.0% ×|net offset /offset range| for 2 mV/div --
3.98 mV/div
Refer to Offset Range specifications

Specifications
TDS5000B Series Specifications and Performance Verification 1-11
Table 1- 2: Channel input and vertical specifications (Cont.)
Characteristic Description
DC voltage measurement accuracy Measurement type DC accuracy (in volts)
Sample acquisition mode,
typical
Any sample ±[(1.5% + 1.0% ×|net offset /offset range|)×
|reading -- net offset| + offset accuracy + (0.13
div ×V/div setting) + 0.6 mV]
TDS5104B: 2 mV/div -- 3.98 mV/div
±[(1.5% + 3.0% ×|net offset /offset range|)×
|reading -- net offset| + offset accuracy + (0.13
div ×V/div setting) + 0.6 mV]
Delta voltage measurement
between any two points
acquired under the same
setup and ambient condi-
tions
±[(1.5% + 1.0% ×|net offset /offset range|)×
|reading -- net offset| + (0.26 div ×V/div
setting) + 1.2 mV]
TDS5104B: 2 mV/div -- 3.98 mV/div
±[(1.5% + 3.0% ×|net offset /offset range|)×
|reading -- net offset| + (0.26 div ×V/div
setting) + 1.2 mV]
where, net offset = offset -- (position ×volts/division)
nAverage acquisition mode Average of ≥16 waveforms ±[(1.5% + 1.0% ×|net offset /offset range|)×
|reading -- net offset| + offset accuracy
+0.06div×V/div]
TDS5104B: 2 mV/div -- 3.98 mV/div
±[(1.5% + 3.0% ×
|net offset /offset range|)×|reading -- net
offset| +
offset accuracy + (0.06 div ×V/div)]
Delta voltage measurement
between any two averages
of ≥16 waveforms acquired
under the same setup and
ambient conditions
±[(1.5% + 1.0% ×|net offset /offset range|)×
|reading -- net offset| + (0.1 div ×V/div setting)
+0.3mV]
TDS5104B: 2 mV/div -- 3.98 mV/div
±[(1.5% + 3.0% ×|net offset /offset range|)×
|reading -- net offset| + (0.1 div ×V/div
+0.3mV)]
Where, net offset = offset -- (position ×volts/division)
Nonlinearity, typical <1 LSB differential, <1 LSB integral, independently based

Specifications
1-12 TDS5000B Series Specifications and Performance Verification
Table 1- 2: Channel input and vertical specifications (Cont.)
Characteristic Description
Effective bits, typical Sine wave input at the indicated frequency and pk-pk amplitude, 50 mV/div
and 25 °C
Signal and input conditions Effective bits
TDS5032B, TDS5034B, TDS5052B,
TDS5054B, TDS5054BE
1MHz,9.2div,5GS/s
sample rate, Sample
acquisition mode
6.8 bits
1MHz,9.2div,10MS/s
sample rate, HiRes acquisi-
tion mode
9.1 bits
TDS5032B, TDS5034B 350 MHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
6.5 bits
TDS5052B, TDS5054B, TDS5054BE 500 MHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
6.5 bits
TDS5104B 1MHz,9.2div,5GS/s
sample rate, Sample
acquisition mode
6.6 bits
1MHz,9.2div,10MS/s
sample rate, HiRes acquisi-
tion mode
9.0 bits
1GHz,6.5div,5GS/s
sample rate, Sample
acquisition mode
4.7 bits