2.1
Introduction
Renishaw’s second generation MP250 ultra
compact probe for tool and cutter grinding
machine sets new standards for reliability and
robustness,
Easily identified by the C marking on the probe
body (see figure below), the second generation
MP250 continues to successfully combine
minaturisation of the popular LP2 with high
accuracy of the RENGAGE™ technology, to
provide users with a simple upgrade to solid-state
strain gauge technology and all the associated
benefits this brings:
•excellent 3D performance to allow probing of
contoured surfaces;
•improved repeatability in all probing directions;
•low pre-travel variation to provide high
accuracy, even when used with long styli;
•a proven improvement in life;
•compact and robust design; ideal for grinding
machine applications;
•resistance to shock and false triggering
through the use of digital filtering.
MP250 basics
The second generation MP250 is compatible for
application with both HSI and HSI-C interfaces.
Full functional capability of second generation
MP250 is realised when it is used in conjunction
with the HSI-C interface. Application with HSI-C
enables the user to select a suitable level of
immunity to false triggers, caused by machine
vibrations or accelerations.
In addition to providing high accuracy
measurement on your grinding machine, the
MP250 also offers:
•A reduced need to calibrate:
Whilst pre-travel variation is not regarded as
a form of measurement error, since it can
be easily compensated for by calibrating the
probe, on complex parts it may be necessary
to probe in many different directions.
Calibrating the probe in each direction can be
extremely time consuming.
The MP250 has almost no pre-travel variation
(typically ±0.25 µm (10.00 µin) in the X, Y
plane and ±1.00 µm (40.00 µin) 3D). This
allows the machine to be programmed to
drive the stylus onto any part at any angle
such that it touches the component normal
to the surface. It is NOT NECESSARY to
re-calibrate the probe in each direction it is to
be used. Once calibrated, the probe can be
used in ANY direction. However, if the probe is
re-orientated between measuring points, some
form of calibration should be considered at
each orientation due to the effect of gravity on
the stylus.
For further information about calibration, refer
to page 3.6 “Calibrating the MP250”.
second generation MP250
with C identification
marking on probe body