Agilent Technologies 93000 SOC Series Installation guide

Agilent 93000 SOC Series User Training Part 1
Training Manual
S1

2Agilent 93000 SOC Series User Training Part 1, October 2004
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Contents
Agilent 93000 SOC Series User Training Part 1, October 2004 3
Contents
1 TrainingOverview 9
1-1 The Training 12
1-2 Agenda 13
2 Test Engineer’s Responsibilities 17
2-1 Test Engineer’s Responsibilities 20
2-2 Creating a Test Plan 23
2-3 Designing the DUT Board 29
3 Hardware Overview 33
3-1 Major Components 36
4 Software Overview 51
4-1 SmarTest Test Development 54
4-2 Online Documentation 58
4-3 Running the Software 60
4-4 Start-up Screen 62
4-5 SmarTest Software Structure 64
4-6 The Data Manager 70
4-7 Set Concept 74
4-8 Testflow Editor 75
4-9 Device Files 77
4-10 Inside the Software 78
4-11 Review Test 80
5Calibration 81
5-1 Overview 84
5-2 Calibration 85
5-3 Performing the Auto Calibration 88
5-4 Fixture Delay 98

Contents
4Agilent 93000 SOC Series User Training Part 1, October 2004
5-5 Review Test 100
6 Main Test Setup Components 101
6-1 Basic Test Elements 104
6-2 Device Directory 108
7 Defining the Pins 117
7-1 Pin Configuration 120
7-2 Pin Configuration Download 121
7-3 Entering the Pin Configuration 123
7-4 Defining Pin Groups 129
7-5 Review Test 135
8 Defining the Levels 137
8-1 AC Levels 140
8-2 DPS (Device Power Supply) Pins 149
8-3 Overview of the Level Setup 152
8-4 Level Setup Steps 158
8-5 Using Formats 168
8-6 Converting Levels 170
8-7 Review Test 173
9 Timing Setup 175
9-1 Example, Timing for the Device 74ACT299 178
9-2 Timing Resources 180
9-3 Wavetable Setup 185
9-4 Equation Sets and Timing Sets 202
9-5 Specifications (Timing) 207
9-6 Timing Verification 211
9-7 Display Signals and Using Formats 217
9-8 Logical Waveforms 220
9-9 Fixed Timing 236
9-10 X-modes 245

Contents
Agilent 93000 SOC Series User Training Part 1, October 2004 5
9-11 Review Test 249
10 Vector and Pattern Management 253
10-1 Vector Setup 256
10-2 Vector Verification 259
10-3 Pattern Management 272
10-4 Debugging Vectors 278
10-5 Editing Vectors 279
10-6 Sequencer Instructions 288
10-7 Changing Timing and Level Sets 289
10-8 Repeating Vectors in Loops 291
10-9 Subroutines 293
10-10 Vector Generation 296
10-11 Memory Types and Structure 303
10-12 Review Test 307
11 Standard Test Functions 309
11-1 What is a Functional Test ? 312
11-2 Standard Test Function Groups 316
11-3 The Test Control Window 321
11-4 The Continuity Test Function 323
11-5 Functional Test 334
11-6 Review Test 337
12 Putting It All Together 339
12-1 Introducing the Testflow Editor 342
12-2 Assigning the Global Setup Files 345
12-3 Inserting Testsuites 351
12-4 Inserting Bins 357
12-5 Executing the Testflow 359
12-6 Saving Setup Files 361
12-7 Review Test 363

Contents
6Agilent 93000 SOC Series User Training Part 1, October 2004
13 Test Result Analysis 365
13-1 Using Result Tools 368
13-2 Identifying Failed Pins and Test Cycles (Error Map) 369
13-3 Analyzing Waveforms (Timing Diagram) 375
13-4 Performing a Data Analysis (State List) 380
13-5 Aligning the Result Displays 382
13-6 Review Test 383
14 Device Characterization - DC Tests 385
14-1 DC Test Functions 388
14-2 Per Pin PMU and High Precision PMU 390
14-3 Checking for Continuity and Short Circuits 397
14-4 Measuring DC Output Voltages 402
14-5 Measuring Input Leakage 410
14-6 Measuring Operating Current 412
14-7 Related Topics 414
14-8 Summary and Discussion 415
14-9 Review Test 417
15 Device Characterization - AC Tests 419
15-1 Operating Principles 422
15-2 AC Test Functions 426
15-3 Testing Output Voltage Sensitivity 428
15-4 Testing Propagation Delay 430
15-5 Testing Propagation Delay (Using Global Search) 432
15-6 Related Topics 434
15-7 Summary and Discussion 435
15-8 Review Test 436
16 Shmoo Tool 437
16-1 Introduction 440
16-2 Sweep Test Function Overview 441
16-3 Shmoo Plots 443

Contents
Agilent 93000 SOC Series User Training Part 1, October 2004 7
16-4 The Standalone Shmoo Tool 451
16-5 Launching the Shmoo Tool 452
16-6 Results Set -Up 459
16-7 To Retrieve and Store Set-Up Data 462
16-8 Shmoo Execution 464
16-9 Result Screen 466
16-10 Overlay Screen 468
17 Measuring Pin Margins 473
17-1 Measuring Pin Margins 476
17-2 Pin Margin Setup 478
17-3 Summary and Discussion 490
17-4 Review Test 491
18 Advanced Testflow Control 493
18-1 Testflow Variables 496
18-2 Built-In Functions 504
18-3 Special Test Elements 510
18-4 Using the Optimizer 513
18-5 Information and Flags 517
18-6 Other Test Functions 522
18-7 Executing Firmware Commands 524
18-8 Review Test 527
19 Histograms 529
19-1 Overview 532
19-2 Histogram Setup 534
19-3 Analyzing the Results 540
19-4 Summary and Discussion 548
19-5 Review Test 549

Contents
8Agilent 93000 SOC Series User Training Part 1, October 2004
A Appendices 551
B Spec Sheet 74ACT299 553
C UNIX Commands 565
D Linux Commands 573
EUsingvi 585
F Pin Margin Algorithm 589
G System File Examples 597
H List of Abbreviations 631
I Third Party Contact Information 635

Agilent 93000 SOC Series User Training Part 1, October 2004 9
1Training Overview

Training Overview
10 Agilent 93000 SOC Series User Training Part 1, October 2004