Cypress Semiconductor Perform CY62167E MoBL User manual

16-Mbit (1M x 16 / 2M x 8) Static RAM
CY62167E MoBL®
Cypress Semiconductor Corporation • 198 Champion Court • San Jose,CA 95134-1709 • 408-943-2600
Document #: 001-15607 Rev. *A Revised June 07, 2007
Features
• Configurable as 1M x 16 or as 2M x 8 SRAM
• Very high speed: 45 ns
• Wide voltage range: 4.5V–5.5V
• Ultra low standby power
— Typical standby current: 1.5 µA
— Maximum standby current: 12 µA
• Ultra low active power
— Typical active current: 2.2 mA @ f = 1 MHz
• Easy memory expansion with CE1, CE2, and OE features
• Automatic power down when deselected
• CMOS for optimum speed and power
• Offered in 48-pin TSOP I package
Functional Description[1]
The CY62167E is a high performance CMOS static RAM
organized as 1M words by 16 bits/2M words by 8 bits. This
device features advanced circuit design to provide an ultra low
active current. This is ideal for providing More Battery Life™
(MoBL®) in portable applications such as cellular telephones.
The device also has an automatic power down feature that
reduces power consumption by 99% when addresses are not
toggling. Place the device into standby mode when deselected
(CE1HIGH, or CE2 LOW, or both BHE and BLE are HIGH).
The input and output pins (IO0through IO15) are placed in a
high impedance state when:
• The device is deselected (CE1 HIGH or CE2LOW)
• Outputs are disabled (OE HIGH)
• Both Byte High Enable and Byte Low Enable are disabled
(BHE, BLE HIGH) or
• A write operation is in progress (CE1LOW, CE2HIGH, and
WE LOW)
To write to the device, take Chip Enables (CE1 LOW and CE2
HIGH) and Write Enable (WE) input LOW. If Byte Low Enable
(BLE) is LOW, then data from IO pins (IO0through IO7), is
written into the location specified on the address pins (A0
through A19). If Byte High Enable (BHE) is LOW, then data
from the IO pins (IO8through IO15) is written into the location
specified on the address pins (A0through A19).
To read from the device, take Chip Enables (CE1 LOW and
CE2HIGH) and Output Enable (OE) LOW while forcing the
Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW,
then data from the memory location specified by the address
pins appears on IO0to IO7. If Byte High Enable (BHE) is LOW,
then data from memory appears on IO8to IO15. See the “Truth
Table” on page 10 for a complete description of read and write
modes.
Logic Block Diagram
1M × 16 / 2M x 8
RAM ARRAY IO0–IO7
ROW DECODER
A 8
A 7
A 6
A 5
A 2
COLUMN DECODER
A11
A12 A13 A14 A15
SENSE AMPS
DATA IN DRIVERS
OE
A 4
A 3IO8–IO15
WE
BLE
BHE
A16
A 0
A 1
A17
A 9
A18
A10
POWER DOWN
CIRCUIT BHE
BLE
CE2
CE1CE2
CE1
BYTE
A19
Note
1. For best practice recommendations, refer to the Cypress application note AN1064, SRAM System Guidelines.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 2 of 12
Pin Configuration[2, 3]
48-Pin TSOP I Top View
Product Portfolio
Product VCC Range (V) Speed
(ns)
Power Dissipation
Operating ICC (mA) Standby ISB2 (µA)
f = 1 MHz f = fmax
Min Typ[4] Max Typ[4] Max Typ[4] Max Typ[4] Max
CY62167ELL 4.5 5.0 5.5 45 2.2 4.0 25 30 1.5 12
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A15
A14
A13
A12
A11
A10
A9
A8
A19
NC
WE
CE
2
NC
BHE
BLE
A18
A17
A7
A6
A5
A4
A3
A2
A1
A16
BYTE
Vss
IO15/A20
IO7
IO14
IO6
IO13
IO5
IO12
IO4
Vcc
IO11
IO3
IO10
IO2
IO9
IO1
IO8
IO0
OE
Vss
CE1
A0
Notes
2. NC pins are not connected on the die.
3. The BYTE pin in the 48-TSOPI package must be tied to VCC to use the device as a 1M X 16 SRAM. The 48-TSOPI package can also be used as a 2M X 8 SRAM
by tying the BYTE signal to VSS. In the 2M x 8 configuration, pin 45 is A20, while BHE, BLE and IO8to IO14 pins are not used.
4. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA= 25°C.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 3 of 12
Maximum Ratings
Exceeding the maximum ratings may shorten the battery life
of the device. User guidelines are not tested.
Storage Temperature ................................–65°C to + 150°C
Ambient Temperature with
Power Applied............................................–55°C to + 125°C
Supply Voltage to Ground
Potential........................................................... –0.5V to 6.0V
DC Voltage Applied to Outputs
in High-Z State[5, 6]........................................... –0.5V to 6.0V
DC Input Voltage[5, 6] ........................................–0.5V to 6.0V
Output Current into Outputs (LOW) ............................ 20 mA
Static Discharge Voltage........................................... >2001V
(MIL-STD-883, Method 3015)
Latch Up Current .....................................................>200 mA
Operating Range
Device Range Ambient
Temperature VCC[7]
CY62167ELL Industrial –40°C to +85°C 4.5V to 5.5V
Electrical Characteristics
Over the Operating Range
Parameter Description Test Conditions 45 ns Unit
Min Typ[4] Max
VOH Output HIGH Voltage IOH = –1.0 mA 2.4 V
VOL Output LOW Voltage IOL = 2.1mA 0.4 V
VIH Input HIGH Voltage VCC = 4.5V to 5.5V 2.2 VCC + 0.5V V
VIL Input LOW Voltage VCC = 4.5V to 5.5V –0.5 0.7[8] V
IIX Input Leakage Current GND < VI< VCC –1 +1 µA
IOZ Output Leakage Current GND < VO <VCC, Output Disabled –1 +1 µA
ICC VCC Operating Supply
Current
f = fMAX = 1/tRC VCC = VCC(max)
IOUT = 0 mA
CMOS levels
25 30 mA
f = 1 MHz 2.2 4.0 mA
ISB2[9] Automatic CE Power Down
Current—CMOS Inputs
CE1> VCC – 0.2V or CE2< 0.2V,
VIN > VCC – 0.2V or VIN < 0.2V,
f = 0, VCC = VCC(max)
1.5 12 µA
Capacitance[10]
Parameter Description Test Conditions Max Unit
CIN Input Capacitance TA= 25°C, f = 1 MHz,
VCC = VCC(typ)
10 pF
COUT Output Capacitance 10 pF
Thermal Resistance[10]
Parameter Description Test Conditions TSOP I Unit
ΘJA Thermal Resistance
(junction to ambient)
Still air, soldered on a 3 × 4.5 inch, two-layer printed circuit
board
60 °C/W
ΘJC Thermal Resistance
(junction to case)
4.3 °C/W
Notes
5. VIL(min) = –2.0V for pulse durations less than 20 ns.
6. VIH(max) = VCC + 0.75V for pulse durations less than 20 ns.
7. Full Device AC operation is based on a 100 µs ramp time from 0 to VCC (min) and 200 µs wait time after VCC stabilization.
8. Under DC conditions the device meets a VIL of 0.8V. However, in dynamic conditions Input LOW Voltage applied to the device must not be higher than 0.7V.
9. Only chip enables (CE1 and CE2), byte enables (BHE and BLE) and BYTE need to be tied to CMOS levels to meet the ISB2 / ICCDR spec. Other inputs can be
left floating.
10. Tested initially and after any design or process changes that may affect these parameters.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 4 of 12
AC Test Loads and Waveforms
VCC
VCC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10% 90%
10%
RISE TIME= 1 V/ns FALL TIME= 1 V/ns
OUTPUT V
EQUIVALENT TO: THÉVENIN EQUIVALENT
ALL INPUT PULSES
RTH
R1
Parameters Values Unit
R1 1800 Ω
R2 990 Ω
RTH 639 Ω
VTH 1.77 V
Data Retention Characteristics
Over the Operating Range
Parameter Description Conditions Min Typ[4] Max Unit
VDR VCC for Data Retention 2.0 V
ICCDR[9] Data Retention Current VCC= VDR
CE1> VCC – 0.2V, CE2< 0.2V,
VIN > VCC – 0.2V or VIN < 0.2V
12 µA
tCDR[10] Chip Deselect to Data
Retention Time 0ns
tR[11] Operation Recovery
Time tRC ns
Data Retention Waveform[12]
VCC(min)
VCC(min)
tCDR
VDR >2.0 V
DATA RETENTION MODE
tR
CE1or
VCC
BHE. BLE
CE2
or
Notes
11. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 µs or stable at VCC(min) > 100 µs.
12. BHE. BLE is the AND of BHE and BLE. Deselect the chip by either disabling the chip enable signals or by disabling BHE and BLE.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 5 of 12
Switching Characteristics
Over the Operating Range[13, 14]
Parameter Description
45 ns
Unit
Min Max
READ CYCLE
tRC Read Cycle Time 45 ns
tAA Address to Data Valid 45 ns
tOHA Data Hold from Address Change 10 ns
tACE CE1LOW and CE2 HIGH to Data Valid 45 ns
tDOE OE LOW to Data Valid 22 ns
tLZOE OE LOW to LOW-Z[15] 5ns
tHZOE OE HIGH to High-Z[15, 16] 18 ns
tLZCE CE1LOW and CE2 HIGH to Low-Z[15] 10 ns
tHZCE CE1HIGH and CE2 LOW to High-Z[15, 16] 18 ns
tPU CE1LOW and CE2 HIGH to Power Up 0 ns
tPD CE1HIGH and CE2 LOW to Power Down 45 ns
tDBE BLE/BHE LOW to Data Valid 45 ns
tLZBE BLE/BHE LOW to Low-Z[15] 10 ns
tHZBE BLE/BHE HIGH to HIGH-Z[15, 16] 18 ns
WRITE CYCLE[17]
tWC Write Cycle Time 45 ns
tSCE CE1LOW and CE2 HIGH to Write End 35 ns
tAW Address Setup to Write End 35 ns
tHA Address Hold from Write End 0 ns
tSA Address Setup to Write Start 0 ns
tPWE WE Pulse Width 35 ns
tBW BLE/BHE LOW to Write End 35 ns
tSD Data Setup to Write End 25 ns
tHD Data Hold from Write End 0 ns
tHZWE WE LOW to High-Z[15, 16] 18 ns
tLZWE WE HIGH to Low-Z[15] 10 ns
Notes
13. Test conditions for all parameters other than tri-state parameters assume signal transition time of 1 V/ns, timing reference levels of VCC(typ)/2, input pulse levels
of 0 to VCC(typ), and output loading of the specified IOL/IOH as shown in “AC Test Loads and Waveforms” on page 4.
14. AC timing parameters are subject to byte enable signals (BHE or BLE) not switching when chip is disabled. See application note AN13842 for further clarification.
15. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
16. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high impedance state.
17. The internal write time of the memory is defined by the overlap of WE, CE1 = VIL, BHE or BLE or both = VIL, and CE2 = VIH. All signals must be active to initiate
a write and any of these signals can terminate a write by going inactive. The data input setup and hold timing should be referenced to the edge of the signal that
terminates the write.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 6 of 12
Switching Waveforms
Figure 1 shows address transition controlled read cycle waveforms.[18, 19]
Figure 1. Read Cycle No. 1
Figure 2 shows OE controlled read cycle waveforms.[19, 20]
Figure 2. Read Cycle No. 2
PREVIOUS DATA VALID DATA VALID
RC
tAA
tOHA
tRC
ADDRESS
DATA OUT
50%
50%
DATA VALID
tRC
tACE
tDOE
tLZOE
tLZCE
tPU
HIGH IMPEDANCE
tHZOE
tPD
tHZBE
tLZBE
t
HZCE
tDBE
OE
CE1
ADDRESS
CE2
BHE/BLE
DATA OUT
VCC
SUPPLY
CURRENT
HIGH
ICC
ISB
IMPEDANCE
Notes
18. The device is continuously selected. OE, CE1 = VIL, BHE, BLE or both = VIL, and CE2 = VIH.
19. WE is HIGH for read cycle.
20. Address valid before or similar to CE1, BHE, BLE transition LOW and CE2transition HIGH.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 7 of 12
Figure 3 shows WE controlled write cycle waveforms.[17, 21, 22]
Figure 3. Write Cycle No. 1
Switching Waveforms (continued)
tHD
tSD
tPWE tSA
tHA
tAW
tSCE
tWC
tHZOE
VALID DATA
tBW
NOTE 23
CE1
ADDRESS
CE2
WE
DATA IO
OE
BHE/BLE
Notes
21. Data IO is high impedance if OE = VIH.
22. If CE1goes HIGH and CE2goes LOW simultaneously with WE = VIH, the output remains in a high impedance state.
23. During this period the IOs are in output state and input signals must not be applied.
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 8 of 12
Figure 4 shows CE1or CE2controlled write cycle waveforms.[17, 21, 22]
Figure 4. Write Cycle No. 2
Figure 5 shows WE controlled, OE LOW write cycle waveforms.[22]
Figure 5. Write Cycle No. 3
Switching Waveforms (continued)
tHD
tSD
tPWE
tHA tAW
tSCE
tWC
tHZOE
VALID DATA
tBW
tSA
NOTE 23
CE1
ADDRESS
CE2
WE
DATA IO
OE
BHE/BLE
VALID DATA
tHD
tSD
tLZWE
tPWE
tSA
tHA tAW
tSCE
tWC
tHZWE
tBW
NOTE 23
CE
1
ADDRESS
CE
2
WE
DATA IO
BHE
/BLE
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 9 of 12
Figure 6 shows BHE/BLE controlled, OE LOW write cycle waveforms.[22]
Figure 6. Write Cycle No. 4
Switching Waveforms (continued)
tHD tSD
tSA
tHA tAW
tWC
VALID DATA
tBW
tSCE
tPWE
NOTE 23
CE
1
ADDRESS
CE
2
WE
DATA IO
BHE
/BLE
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CY62167E MoBL®
Document #: 001-15607 Rev. *A Page 10 of 12
Truth Table
CE1CE2WE OE BHE BLE Inputs Outputs Mode Power
H X X X X X High-Z Deselect/Power Down Standby (ISB)
X L X X X X High-Z Deselect/Power Down Standby (ISB)
X X X X H H High-Z Deselect/Power Down Standby (ISB)
L H H L L L Data Out (IO0–IO15) Read Active (ICC)
L H H L H L Data Out (IO0–IO7);
High-Z (IO8–IO15)
Read Active (ICC)
L H H L L H High-Z (IO0–IO7);
Data Out (IO8–IO15)
Read Active (ICC)
L H H H L H High-Z Output Disabled Active (ICC)
L H H H H L High-Z Output Disabled Active (ICC)
L H H H L L High-Z Output Disabled Active (ICC)
LHLXLLDataIn(IO
0–IO15) Write Active (ICC)
LHLXHLDataIn(IO
0–IO7);
High-Z (IO8–IO15)
Write Active (ICC)
LHLXLHHigh-Z(IO
0–IO7);
Data In (IO8–IO15)
Write Active (ICC)
Ordering Information
Speed
(ns) Ordering Code
Package
Diagram Package Type Operating Range
45 CY62167ELL-45ZXI 51-85183 48-pin TSOP I (Pb-free) Industrial
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