Cirris 4200 Series User manual

Cirris 4200 Series
User Manual
for 4200 & 4250 Testers

Cirris 4200 Series User Manual
Table of Contents
1. Safety/Support................................ 4
1.1 Workplace Maintenance .......................4
1.2 Intended Use...................................4
1.3 Warnings and Precautions ......................4
1.3.1 High Voltage Warning ......................4
1.3.2 Warning Signs ..............................5
1.3.3 Medical Warning ...........................5
1.3.4 Manual Handling ...........................5
1.3.5 User Precautions ...........................5
1.3.6 Help/Support ..............................5
2. Testing Basics ................................. 6
2.1 Types of Tests ..................................6
2.2. Types of Errors .................................7
3. Hardware Setup............................... 8
3.1 You should have received.......................8
3.2 Front of Tester ..................................8
3.3. Top of Tester ...................................9
3.4 Setting up the Tester ...........................9
3.5 Install Expansion Boxes ....................... 10
4. Installing Adapters/Fixturing ................. 12
4.1 Installing Adapters ........................... 12
4.2 Fixturing ..................................... 12
4.3 Mating Cycles ................................ 12
5. Cirris Hub Software...........................13
6. Main Menu................................... 14
7. Create a New Test Program.................... 15
7.1 Create a New Test Program ................... 15
7.1.1 Edit Learn Settings ....................... 15
8. Test Preferences ..............................16
9. Low Voltage.................................. 18
10. High Voltage (Hipot) - 4250 only ............. 20
10.1 High Voltage Testing ........................ 20
10.2 Basic Settings ............................... 20
10.3 Advanced Settings .......................... 21
10.3.1 Dielectric Withstand Test ................ 21
10.3.2 Insulation Resistance Test................ 21
10.4 Options..................................... 22
11. Reports..................................... 23
11.1 Editing Report Templates.................. 24
12. Digital I/O .................................. 26
12.1 Inputs ...................................... 26
12.2 Outputs..................................... 27
13. Components (New test program)............. 28
14. Edit Data Collection Settings................. 29
15. Perform a Learn.............................30
15.1 Perform a Learn ............................. 30
15.2 Edit a Test Program .......................... 31
15.3 Edit Test Programs on a PC................... 31
15.3.1 Edit Point Labels ........................ 32
16. Run a Test .................................. 33
16.1 Perform a Test............................... 33
16.1.1 Low Voltage Test ........................ 34
16.1.2 High Voltage Test – 4250 only............ 34
16.1.3 Intermittents Test ....................... 34
16.1.4 Finishing a Test .......................... 35
16.2 Test Results ................................. 35
16.3 Printing Reports............................. 35
16.4 Using the Probe............................. 35
17. Interpreting Test Results .................... 36
18. Printing ....................................38

Table of Contents
18.1 Network Printing............................ 38
18.2 Label Printing ............................... 38
19. Manage Files. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
19.1 Test Program Backup via PC Connection ..... 39
19.2 Local Test Program Backup via USB Drive..... 40
20. System Settings............................. 41
21. Legacy Defaults ............................. 42
22. Network Settings ........................... 43
22.1 Ethernet .................................... 43
22.2 Wi-Fi ........................................ 44
22.2.1 Connecting to Cirris Hub... ............... 44
23. High Voltage Guidelines (4250 only).......... 45
24. Four-Wire Kelvin Testing .................... 47
25. Calibration ................................. 49
26. Connecting to Easy-Wire™ ...................50
27. Frequently Asked Questions ................. 51
27.1 Service and Maintenance.................... 51
27.2 Connector Maintenance..................... 51
27.3 Repair ...................................... 52
28. Factory Defaults ............................ 53
29. Troubleshooting ............................55
30. Glossary .................................... 56
31. Specications...............................57

4Cirris 4200 Series User Manual
1. Safety/Support
Please make the following safety information available to any person who comes in contact with Cirris equipment.
Cirris Systems will not be held liable for injuries suered if the tester is not properly maintained or safety guidelines are not
followed.
1.1 Workplace Maintenance
There are several steps you can take to ensure your workplace is safe and maintained. The following suggestions can help
create a safe environment for employees.
●Set up your tester away from normal employee activity.
●If testing with high voltage, make sure high voltage warning signs are visible.
●Use a non-conductive workbench or table. A conductive mate or materials can create shorts in exposed connections.
●Keep the area around the tester clean and organized.
●Once a device is tested, be sure to place it in an appropriate area where it is obvious to the operator and any observers
which devices need to be tested, which devices have been tested, and if the device passed or failed the test.
1.2 Intended Use
Your 4200 Series tester is intended to be used indoors at a temperature of 50-104 degrees Fahrenheit (10-40 degrees Cel-
sius). Best performance can be obtained at a relative humidity of less than 70%. Insulation Resistance measurements will
degrade at over 70% relative humidity.
Never apply live voltages to the test points or probe input of your Cirris tester. Power supplies and other accessories not
approved by Cirris may cause damage or present a hazard.
Warning: If the equipment is used in a manner not specied by the manufacturer, built-in protections provided by the
equipment may be impaired.
1.3 Warnings and Precautions
Heed the following sections to ensure safety throughout your testing process.
1.3.1 High Voltage Warning
Cirris high voltage (hipot) testers are designed to be safe for operators. High voltage testing does not present a danger
to healthy individuals; however, occasional mild electric shock may be experienced. Small shocks only occur during a
high voltage test when someone touches an energized connection point. Any shock from the tester may result in a high
voltage test failure.
For ideas on improving high voltage safety, visit www.cirris.com/safety.

Safety/Support 5
1.3.2 Warning Signs
This symbol, found on the front of the tester, indicates that high voltage is involved and that there is a
risk of electric shock when using this tester. See cirris.com to learn about safety precautions you can
take to ensure employees are safe when testing with high voltage.
z
1.3.3 Medical Warning
A child or individual wearing a cardiac pacemaker, an insulin pump, or any electronic controlled medical device should
NOT perform high voltage testing.
1.3.4 Manual Handling
Before lifting or carrying the tester, Cirris recommends removing all wires and cables from the front connectors. Be sure
the power cord is unplugged when moving the tester. Handles are provided on the front of the tester to make lifting and
carrying the tester more convenient.
1.3.5 User Precautions
To help ensure safety during testing, Cirris oers dierent tools such as switches, mats, and light curtains that can help
create a safe testing environment. These tools are not necessary, but are recommended to ensure safety during testing.
See cirris.com/safety for more information on these safety products, or contact your Cirris representative.
1.3.6 Help/Support
The following resources are available in case your run into problems during testing.
●Visit www.cirris.com/learning-center to read articles on Cirris products and other testing subjects.
●Contact our technical support team: 800-441-9910, ext. 666
(or ask for Tech Support).
●Outside the USA, call 801-973-4600 or visit www.cirris.com to nd the
Cirris oce nearest to you.

6Cirris 4200 Series User Manual
2. Testing Basics
2.1 Types of Tests
The 4200 Series allows you to customize which tests you want to run on a cable. While the tester will always perform a
low voltage test, you can choose to include a high voltage or intermittents test.
■Low Voltage Test
Low voltage testing catches errors such as shorts and opens by applying current to a wire and measuring the voltage. The
wire will have a current aected by several factors including resistance and components. If the wire is connected correctly,
the test will read low resistance. That means current is owing through the wire as expected and reaching the required
connections. If the tester reads high resistance it means something is impeding the current from reaching its destination.
This could be caused by a number of errors:
●Open error: meaning the connection isn’t secure and the current can’t reach the destination.
●Miswire error: The wire is connected to the wrong point.
●Incorrect test setting: A test setting is set to an incorrect value or has another mistake.
■High Voltage Test
A high voltage or hipot test checks for good isolation. Having good isolation helps to guarantee the safety and quality of
electrical circuits. If the points are isolated, no current will ow between points where there should be no current. A hipot
test takes two conductors that should be isolated and applies a very high voltage between the conductors. If too much
current ows the points are not well isolated and they fail the test.
Hipot tests are helpful in nding:
●Nicked or crushed insulation.
●Stray wire strands or braided shielding.
●Conductive or corrosive contaminants around the conductors.
●Terminal spacing problems.
●Tolerance errors in IDC cables.
All of these conditions might cause a device to fail.
There are three common high voltage tests.
●Dielectric Withstand Test: Determines that a cable can withstand voltage for a certain amount of time.
●Insulation Resistance Test: Determines that cable’s insulation is sucient.
●Dielectric Breakdown Test: Determines how much voltage the cable can tolerate before it fails. Once the cable fails,
it is usually damaged or destroyed. Cirris testers do NOT perform this type of high voltage testing in any shape or
form.
■Intermittents Test
Since intermittent problems are just that--intermittent--they are much more dicult to nd than solid defects. Intermittent
errors are usually caused by a mechanical change: temperature, mechanical vibration, or physical exing, which changes
(temporarily) the electrical characteristics of the cable. The Intermittents Test allows the user to check for potential defects
by moving the cable while the tester continuously checks continuity. If any failure is detected—even momentarily, the test
will fail.

Testing Basics 7
2.2. Types of Errors
Each of the tests performed by a Cirris tester will look for certain errors in the cable. Understanding the errors will help you
determine which tests you want to run as well as how to avoid creating these errors in your cable.
■Low Voltage Errors
Open Error: The intended electrical path contains a gap across which electric current cannot pass at the low voltage.
Short Error: An unintended connection between two or more points. This failure indicates insucient insulation between
unintended connections.
Miswire Error: An unintended connection which is the result of unexpected contact. This error is often referred to as an
open and a short combined.
■Component Errors
A new test program containing a component will measure the component value in the sample device and assign a default
tolerance range. During a test, if the tester measures a value outside of the tolerance range, the component instruction will
fail with an error message that indicates the measured value as well as the expected value.
■High Voltage Errors
Overcurrent Error: This error occurs because the tester expects to measure a certain amount of current, but a larger
amount of the current ows through the wire than the tester expects. The tester assumes the current is escaping and
reports an overcurrent error.
Often this error is attributed to capacitance. With wires acting as conductors and insulation acting as a barrier, cables can
build up high amounts of capacitance. The tester cannot tell the dierence between insucient insulation and capacitance.
Both causes will result in an overcurrent failure. If you know the wire is highly capacitive you can set the test program to
prepare for the error.
Had Leakage: This error occurs because too much current leaks between unconnected points. It is natural for some current
to leak through insulation or through contaminants such as ux residue. A Had Leakage error occurs because more current
leaks from the wire than is acceptable.
Dielectric Failure: A Dielectric Failure means voltage has arced from one of the wires. This normally occurs between two
exposed pieces of metal. The test will immediately abort and report a Dielectric Failure.
In rare instances, a dielectric failure will go away, such as when a dielectric failure caused by small solder slivers vaporizes
during the high voltage test.

8Cirris 4200 Series User Manual
3. Hardware Setup
3.1 You should have received
●Cirris 4200 Low Voltage or 4250 High Voltage Cable Tester
●Power cord
●PC (USB A to USB B) cable
●Probe
●Antenna
●USB ash drive containing software/documentation
●Optional: Adapters, expansion boxes, tilt stands, and other accessories.
●
3.2 Front of Tester
a. 7" full-color graphical display with capacitive touch screen (800 x 480 pixel resolution).
b. Cirris adapter system creates an easy xturing setup system.
c. High voltage warning symbol
d. Handles for portability
a b
c
d

Hardware Setup 9
3.3. Top of Tester
a. Digital I/O: Build automation into your test process.
b. Serial ports: Connect a PC and label printer directly to your tester.
c. Probe: Attach the probe for troublshooting and diagnosing failures.
d. PC (USB): Connect your tester to a computer to access test programs and other information.
e. USB port: Use a ash drive to back up test programs and other information.
f. Ethernet: Use an ethernet cable to connect your tester for network printing and back up.
g. Antenna: (Beta) Connect wirelessly to network printers and back up.
h. Power Cord: Attach the power cord.
i. Power button: Turns tester on and o.
3.4 Setting up the Tester
■Set Up Test Hardware
1. Connect the power cord to your tester.
2. Plug the power cord into a grounded outlet (surge protector recommended).
3. Connect the probe.
4. Press the power button to turn on the tester.
5. The tester will perform a system diagnostic (see page 41).
a b c d e f g h i

10 Cirris 4200 Series User Manual
6. After startup, the tester may require that you set the date and time for your area.
7. The Main Menu screen will open.
■Set Date and Time
Setting the date and time ensures the correct information will show on test reports.
1. From the Main Menu, press System Settings.
2. The date and time are displayed on the buttons so you will be able to see if they need correcting. Press the button to
change the information.
3. Press the button for the eld you wish to change. For example, if you wish to change the month, press the month
button and select the correct number.
4. You can also select how you want the date and time displayed by pressing the drop down inside the date or time menu
and selecting an option from the list.
5. Once nished, press the OK button to save the changes.
6. Press Done to return to the Main Menu.
■Set Mains Frequency
Also known as Power Line Frequency, you will want to set this value to 50 or 60 Hz depending on your country’s AC line
frequency. The correct selection will improve test measurement accuracy.
1. From the Main Menu, press System Settings.
2. Press the Mains Frequency button to switch it to either 50 or 60 Hz.
3. Press Done to return to the Main Menu.
Note: For more setup options, such as changing the language or volume, see System Settings onpage 41.
3.5 Install Expansion Boxes
Each expansion box adds an additional 128 test points. You can connect up to seven expansion boxes for a total of 1024 test
points.
1. Remove both cover plates by removing all four fasteners. Use either a screwdriver or a quarter to turn the fasteners to a
horizontal position.
2. Remove the scanner assembly and place it face down next to the tester.
3. Use a at object to press against the rivets on the inside of the chassis, detaching the plastic cover piece.
4. Replace the scanner assembly, ensuring the ribbon cable connector is accessible through the opening in the side of the
chassis.
5. Connect the ribbon cable connector from the expansion box to the main unit and push the two units together.
Note: Small posts on the expansion box will t into corresponding holes in the main unit.

Hardware Setup 11
6. Secure the expansion box to the main unit using the side latches on both sides of the tester and re-attach the cover
plates.
7. Space is available on the cover plate of each expansion box to write the adapter position. You may also consider using
removable stickers for this purpose. For example, you could continue the number system and label each adapter
position as J5, J6, J7, etc.
If you are attaching more than one expansion box, repeat the procedure. If your system uses all seven expansion boxes, you
will need to purchase a second cable. Contact your account manager at Cirris for more information and to purchase this
cable.

12 Cirris 4200 Series User Manual
4. Installing Adapters/Fixturing
4.1 Installing Adapters
The 420 Series uses interchangeable adapters that connect the DUT to the tester. Cirris sells a variety of adapters that mate
to standard connectors. We can also create custom adapters for less common connectors. Visit cirris.com to learn more.
1. Push the slidelocks to the outward positions.
2. Set an adapter in one or more of the J1-J4 slots. With a rm but gentle force, push the adapter forward (toward the
tester’s screen). You may have to use more pressure than expected to move the adapter completely into position. Be
careful not to bend any pins as you slide the adapter into place.
Note: Larger sized adapters can take one, two, or four positions at once. For example, a connector could use both the J-1
and J-2 positions. An adapter in this position will register in the software as a J1 adapter.
3. Once the adapter is rmly connected, move the slidelocks to the inward position to hold the adapter in place.
4.2 Fixturing
Sometimes cables are built with connectors that cannot attach directly to the tester. For this reason, xturing must be built
to provide a way to connect the device-under-test (DUT) to the adapters in the tester.
Fixturing refers to the interface between the DUT and the tester. Fixturing can be a signicant portion of the investment
in a test system. Good xturing is an essential part of ensuring the accuracy of test results and maximizes the test station’s
throughput. This means xturing needs to be at least as good, if not better than the quality of your DUT. Remember, you
want to test the DUT, not the xturing.
Cirris makes generic mating cables with one end that connects to the tester while the other end has unterminated wires.
These cables save time by completing part of the work of creating xturing cables. To learn more, visit cirris.com or contact
your account manager.
4.3 Mating Cycles
The quality of parts you use to build xturing will aect the life of your xturing. Each time a connector is attached and
removed from a xturing adapter is called a mating cycle. A connector can only take so many mating cycles before it no
longer functions like it is supposed to.
Lower quality connectors (typically with tin plating) may be rated for as few as 10 to 50 cycles, while more expensive
connectors (typically with gold plating) are often rated for 500 cycles. These ocial ratings, however, specify how many
mating cycles you can expect to endure while still maintaining the specied contact resistance in the connector datasheet.
In practice, these connectors can endure far more mating cycles and still perform adequately for test measurements.
If you are focused on having very precise resistance measurements in your testing, you will want to carefully consider the
materials you use for xturing, and maintain a maintenance schedule to ensure connectors are replaced before they cause
errors in your resistance measurements.

Cirris Hub Software 13
5. Cirris Hub Software
Before continuing with the tester setup, it is recommended that you install Cirris Hub Software onto a network PC.
Cirris Hub Software allows you to do the following:
●File Sharing: Share test programs among networked testers.
●File editing: Edit a test program in the software which allows networed testers to access these changes.
●Network Printing: Print all test reports from any printer connected to the network with Cirris Hub Software.
●Server Conguration: Select where you want your les stored and organized on your system.
●Tester Organization: Give names to testers and dene their printers.
A free version of the software is found on the USB ash drive that came with your tester. For installation instructions, see the
Cirris Hub Software Installation Guide.

14 Cirris 4200 Series User Manual
6. Main Menu
From the software’s Main Menu, you can access other areas of the
software such as the test screen, edit test screen, and other menus.
●Loaded Test: Displays the name of the currently loaded test
program.
●Signature: Displays the loaded test’s signature. Tests that
are imported from other Cirris testers will show the same
signature as displayed on those testers.
●Edit: Change settings for a loaded test program.
●View: View details of a loaded test program.
●Test: Perform a test using the loaded test program.
●Create New: Create a new test program.
●Load: Load an existing test program to edit, view, or test.
●Manage Files: Copy, move, or delete test programs and les.
●System Settings: Perform a variety of tasks related to the setup and maintenance of the tester software including
changing volume, date, time, etc.
Cirris Tester
Edit
View
Create
New
Manage Files
System Settings
Loaded Test: NewTest
Signature: XXXXXX-00000
Cirris 4250 Tester | SN: XXXXXXXX Cirris OS v 0.0.0.0 | Hardware v XXXXX.1.A
Load
Test

Create a New Test Program 15
7. Create a New Test Program
7.1 Create a New Test Program
A test program must be created before testing a cable. This is done by attaching a known-good sample cable to the
tester, adjusting the test settings, and performing a Learn. The tester will create a list of test instructions based on the
specied settings and the sample cable. Cables will then be tested using the instructions created during the learn.
1. Attach the xturing (page 12) and sample cable to the tester.
From the Main Menu, press Create New.
2. The summaries on the right side of the screen describe the
current test program settings. Press Edit Learn Settings to
adjust the settings per the sample cable specications (voltage,
components, etc.).
Note: Test settings for a new program are based on the settings of
the last test created.
7.1.1 Edit Learn Settings
Press Edit Learn Settings and use the options on the left to adjust the
settings for the new test program. These settings can be adjusted
later by selecting Edit from the Main Menu with the exception of
components.
●Test Preferences  page 16
●Low Voltage  page 18
●High Voltage (4250 only)  page 20
●Reports  page 23
●Digital I/O  page 26
●*Components (New test only)  page 28
●Data Collection  page 29
*Components can only be edited when creating a new test program and cannot be altered after a test program has been
Learned, except by using a text editor on a computer.
Note: The next time you open Edit Learn Settings for a new test program, the last input settings will be applied to the test
program.
When you have nished adjusting the required test settings, press Save to return to the Learn menu.
3.
Create New Test
Cancel
Edit Learn
Settings
Learn
Attached Device
Preferences
Low Voltage Start: Start Button
High Voltage Start: Start Button
Intermittents Test: For Duration
Intermittents Test Duration: 2 S
External Start Switch: OFF
External Safety Switch: OFF
Error Location: ON
Low Voltage
Connection Resistance: 5 ohm
LV Insulation Resistance: 100 k ohm
High Voltage (Hipot)
AC Frequency: 60 Hz
Cycles: 1 Cycle
Learn Settings
Edit Learn Settings
OK Cancel
Preferences
Low Voltage
High Voltage (Hipot)
Reports
Digital I/O
Components
Test Settings
Preferences
Low Voltage Start: Start Button
High Voltage Start: Start Button
Intermittents Test: For Duration
Intermittents Test Duration: 2 S
External Start Switch: OFF
External Safety Switch: OFF
Error Location: ON
Low Voltage
Connection Resistance: 5 ohm
LV Insulation Resistance: 100 k ohm

16 Cirris 4200 Series User Manual
8. Test Preferences
Specify which method you would like to use to begin each test.
■Low Voltage Start
●Start Button: The test begins when Start Test is pressed or an
external switch is triggered with Digital I/O.
●Cable Attached: Test will begin automatically when a device
is connected to the tester. This condition is generally used for
testing a high volume of simple cables because it eliminates
the time it takes to push buttons on the tester screen to start
each test. However, with this start condition one of the follow-
ing actions is required for a bad cable:
○Press Finish Test: If the device contains an error, the low
voltage test will not complete until you press the Finish Test
button. The screen will update the failed test tally.
○Remove cable: If the device contains an error and you remove the device before pressing the Finish Test button,
the test will be aborted with no record of the test.
■High Voltage Start – 4250 only:
●Start Button: The high voltage test will begin when the operator presses Start Test or when an external switch is
triggered with Digital I/O. This lets the operator choose when the high voltage test starts.
●Auto Start: The high voltage test will automatically start after a slight delay. The delay is used to allow operators
sucient time to ensure their hands are free of the tester before the high voltage test begins.
■Intermittents Test
An intermittents test repeatedly performs a low voltage test to give the operator time to catch problems that might only
occur intermittently. The operator can ex the cable to catch intermittent failures such as loose connections.
●OFF: No intermittents test is performed.
●Press to Stop: The intermittents test continues until the operator presses the End Test button.
●For Duration: The intermittent test continues for a predetermined amount of time. Test duration can last up to 120
seconds.
■Enter Lot ID:
A Lot ID is a unique ID of your choosing for a group or batch of cables. The ID can appear on reports to help you keep
track of dierent batches of cables.
●ON: When this setting is enabled, the user must enter a Lot ID before the test window will open.
●OFF: No Lot ID is required before testing and won’t appear on reports.
Preferences
OK Cancel
Start Button
Auto Start Delay:
1 S
Enter Lot ID: Off
Error Location:
ON
External Safety Switch:
OFF
External Start Switch:
OFF
High Voltage Start
For Duration
Intermittents Test Duration:
2 S
Intermittents Test
Cable Attached
Low Voltage Start:

Test Preferences 17
■External Start Switch:
External Switch allows the tester’s digital I/O port to receive an input signal from an external switch to start a test. Use Pin
1 on the digital I/O connector for the external start switch.The external switch can be a foot pedal or a button.
●ON: The tester starts a test from the external switch signal.
●OFF: The tester does not look for the external switch signal.
Note: Turning “External Switch” on does not inhibit your ability to press START TEST on the tester display.
■External Safety Swtich:
Safety Switch requires that the tester sees a high signal on pin 2 of the digital I/O connector before starting the hipot test.
Safety Switch can be used to help ensure an operator does not shock themselves during a hipot test. Safety Switches can
be dual palm switches wired in series, a foot pedal, or a sensor in automated test equipment.
●ON: The tester will look for a high signal on pin 2 of the digital I/O connector before starting a hipot test.
●OFF: The tester ignores the signal status of input pin 2 on the digital I/O connector.
Note: For more information on Digital I/O, see page 26.

18 Cirris 4200 Series User Manual
9. Low Voltage
A low voltage test checks for shorts, opens, and other basic errors.
The following settings control how the low voltage test is performed:
■Connection Resistance: This setting determines if the
device passes or fails based resistance settingsi.e. connections with
resistances measured above this value will fail.
●Range: 0.1 ohm – 5.0 M ohm
●As shown in the graphic below, expected connections—con-
nections measured below or equal to the connection resis-
tance value—will pass while any measurement above this
value will fail. A resistance measured above the connection
resistance value, but below the LV insulation resistance value,
will be reported as a high resistance error. A measurement above the LV Insulation Resistance Value will be reported
as an open error.
Connection
Resistance
0.0 Ω ∞Ω
High Resistance
Good Opens
LV Insulation
Resistance
■LV Insulation Resistance: Intended connections above the LV insulation resistance value are considered open
during a low-voltage test (and ignored during a Learn).
●Range: 0.1 ohm – 5.0 M ohm
●As shown in the graphic below, during a shorts test (checking for unintended connections), resistance measure-
ments above the LV insulation resistance value will pass. Any connections detected below this value will be reported
as a short error.
Connection
Resistance
0.0 Ω ∞Ω
Shorts Good
LV Insulation
Resistance
Edit Low Voltage Settings
Connection Resistance:
5 ohm
Measured connection resistance below this value passes
the low voltage test.
Measured insulation resistance above this value passes
the low voltage test.
LV Insulation Resistance:
100 k ohm
OK Cancel

Low Voltage 19
■Component Resistance: (This value is only used when there are components in the test.) This value is auto-set
during the Learn process, and should be 5-25% less than the lowest component found in the device being tested.
●Range: 0.1 ohm – 5.0 M ohm
●The following graphic shows how component LV settings dene errors for intended connections if there are com-
ponents in the test. This value has no impact on whether an intended connection passes or fails, but does inuence
whether a failing connection is labeled as High Resistance or Open.
Connection
Resistance
Component
Resistance
0.0 Ω ∞Ω
Opens
Good
LV Insulation
Resistance
High Resistance
●As shown in the graphic below, the Component Resistance value has no impact on the shorts test.
Connection
Resistance
Component
Resistance
0.0 Ω ∞Ω
Ignored
Shorts
LV Insulation
Resistance

20 Cirris 4200 Series User Manual
10. High Voltage (Hipot) - 4250 only
High voltage or “hipot” testing is used to nd defects and contaminants that could cause the cable to fail.
WARNING: Read the Safety/Support section of this manual (page 4) before performing high voltage testing. For more
ideas on high voltage safety, visit cirris.com/safety.
10.1 High Voltage Testing
High voltage settings can only be edited when high voltage is turned
ON.
●ON: The tester will perform a high voltage test after a success-
ful low voltage test.
●OFF: The tester will not perform a high voltage test.
●Basic Settings: Adjust the basic high voltage settings you
might nd in your test specications, such as voltage, insula-
tion resistance, and dwell time. Other settings are automati-
cally set accordingly.
●Advanced Settings: Adjust individual settings for the Dielec-
tric Withstand (DW) test and the Insulation Ressitance (IR) Test.
Note: Once Basic Settings or Advanced Settings have been changed, the button will turn green while the other button will
turn blue.
●Options: Adjust other settings having to do with the high voltage test such as selecting which pins will be included
in the test, whether a high-cap shield is present on the cable, and if you want to use high-speed mode.
10.2 Basic Settings
High Voltage: Set the voltage limits required for your cable’s
specications.
Insulation Resistance: Set the resistance limits in order to measure
your cable’s isolation. The measured insulation resistance must be
equal or greater to the insulation resistance setting for the test.
Dwell Time: Set the amount of time the IR value must remain good
to pass the test. The reported resistance value for the IR test is an
average of the measurements taken over this time.
Edit High Voltage Settings
OK Cancel
High Voltage: ON
Hipot Settings
Basic Settings
Advanced Settings
Options
AC Frequency: 60 Hz
Cycles: 1 Cycle
DW Voltage: 50 V
DW Max Current: 0.1 mA
DW Dwell Time: 10 mS
IR Voltage: 50 V
IR Minimum Resistance: 5 M ohm
IR Dwell Time: 2 mS
Soak Until GOod: ON
IR Max Soak Time: 0 S
Apply High Voltage To: All Adapter pins
Basic Settings
OK Cancel
High Voltage:
300V
Insulation Resistance:
10 M ohm
Dwell Time:
100 mS