Ge Microversatrip tvts1 User manual

For Field Testing

MicroVersaTrip"

Solid-state

Programmers

GEK·64464B

8;

MicroVersaTripe

Test Set

Type

TVTS1

J (

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GENERAL

(I

ELECTRIC

Table

of Contents

Contents

Page

INTRODUCTION.....

..

.............................

3

Testing

ttw

Solid-state

Prog

rammer

Only-Mode

"1"

..

. 3

Testing

the

Complete

Trip

System-Mode

"2"

.......

3

APPLICABLE

TIME-CURRENT

CURVES

.............

3

SPECiFiCATIONS

...................................

3

OPERATING

CONTROLS

............................

4

On-Off

Switch.

..

.

...

.

...

. .

...

. .

..

.

..

. .

..

.....

4

Trip

Breaker-Programmer

Only

Switch

..........

'"

4

Preset

Current

Button

...........................

'"

4

Start

Button

....................................

'"

4

Reset

Button

...................

'"

..............

" 4

Trip

Light.

...

. . .

....

.

..

........

.

...

. . .

....

........

4

Programmer

Type

Switch

..........

,

..

...

..

...

.....

4

Programmer

Current

Setting

Switch

................

4

Test

Selector

Switch

.............................

" 4

Component

Test

Selector

Switch

................

'"

5

Sequence

Switch

......

" .

...

.

........

......

.....

..

5

Push

to

Test

Button.....

. .

..

. . .

...

. . .

............

5

Elapsed

Time

Meter

.............

"

..

. . .

...

..

.....

5

Test

Current

Meter..

..

....

. . . .

....

......

.....

.

.....

5

Output

Jacks

J1

and

J2

............................

5

External

Monitor-Test

Set

Accuracy..

..

. .

..

.......

5

HOW

TO

REMOVE

THE

SOLID-STATE

PROGRAMMER

FOR

TESTING

..................................

5

CONNECTING

THE

TEST

SET.......................

6

Safety

Precautions

................................

. 6

Connections

......................................

6

Programmer

Only

Test-Mode

"1"

. .

..

.

...

.

.........

6

Complete

System

Test-Mode

"2"

..................

7

PRELIMINARY

TEST

PROCEDURE...................

8

FUNCTIONAL

TESTS

................................

8

Long

Time

Pickup

Test.............................

8

Long

Time

Delay

Test

...........................

'"

9

Short

Time

Delay

Test

.............................

10

Short

Time

Pickup

Test

............................

12

Instantaneous

Pickup

Test-Standard

...............

13

Instantaneous

Pickup

Test-High

Level

.............

14

Ground

Fault

Pickup

Test

..........................

15

Ground

Fault

Delay

Test

...........................

16

Ground

Fault

Continuity

Test

.....................

" 17

Converter

Check

Test

..............................

18

COMPONENT

TESTS

................................

19

Zone

Interlock

Transmit

Test.,

...

,

....

,

..

,

........

, 19

Short

Time

Transmit

Test

..

,.,

...

,',."

...

,

......

19

Ground

Fault

Transmit

Test

..............

,

.....

,.

19

Open

Diode

Test

.......

"

..

,

....

".,

..

,

..

"

..

,

...

, 19

Shorted

Diode

Test

...

,

....

"

..

,

..............

,

....

19

Sensor

Continuity

Test.,

....

,

..................

,

...

19

FAULT

TRIP

ANNUNCiATORS.,

....

,.,

............

,.

20

HOW

TO

USE

THE

"EXTERNAL

MONITOR"

..........

20

IF

RESULTS

DO

NOT

CONFORM

...........

,'

...

,'

,.21

COMPLETION

OF

TESTS

.................

,

...

"

.....

21

RECORD

OF

ORIGINAL

"IN

SERVICE"

PROGRAMMER

SETTINGS

AND

NOTES.,

....

,

,.

22

SCHEMATIC

DIAGRAM......

..

..................

23

2

These

instructions

do

not

purport

to

cover

all

details

or

variations

in equi

pment

nor

do

they

provide

for

every

possible

contingency

to be

met

in

connection

with

installation,

operation

or

maintenance.

Should

further

information

be

desired,

or

should

particular

problems

arise

which

are

not

covered

sufficiently

for

the

purchaser's

purpose,

the

matter

should

be

referred

to

the

General

Electric

Company.

(

("

..

4,::'··::",

~.

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"

..

'

.-

';

~

Introduction

The Type TVTS1 Test Set is a portable

instrument

de-

signed for the field

testing

of MicroVersaTrip'" solid-state

programmers. The

complete

trip system is

comprised

of

the

following

components:

1

Solid-state

programmer

2.

Phase

Current

Sensors

3.

Flux

Shift

Magnetic

Trip

Device

4.

When

applicable,

a Neutral

Sensor

for

units

containing

a

Ground

Fault

trip

element.

All

components,

except

the Neutral Sensor, are

integrally

mounted

in the

circuit

breaker. When used, the Neutral Sen-

sor

is separately

mounted

in the bus

or

cable

compartment

of

the

switchgear.

In

drawout

construction,

it is

automati-

cally

connected

to

the

programmer

in the

breaker

via a

drawout

secondary

disconnect

block.

Two

basic types of

solid-state

programmers

will

be

tested. See Fig. 1.

The Test Set is used to

perform

various

programmer

tests

in

two

basic

modes:

Testing the

Solid-state

Programmer

Only-Mode

"1"

Testing

the

Complete

Trip

System-Mode

"2"

WARNING:

THESE TESTS

CAN

BE

CONDUCTED

ONL

Y

ON

A

DE-ENERGIZED

BREAKER-ONE

WHICH

IS

COMPLETEL

Y

DISCONNECTED

FROM

ITS

PRIMARY

AND

CONTROL

POWER

SOURCES.

-.~-

..

---.u

.-

:=.

-=

,~

e!!!!!!'=======

•

.•

~

-'-

.,,,

..

.,

-.

-""

--'

¢ •

-'

•

r;

MicroVersaTrip®

TP4VT, TP9VT,

TAVT programmers

Fig_

1

MicroVersaTrip®

T4VT

programmer

Testing the Solid-state Programmer

Only-Mode

"1"

A test

mode

is

used

where

only

the

solid-state

program-

mer is tested,

and

is

particularly

useful

in

testing

spare

or

alternate

programmers.

It

should

be

noted

however,

that

there

can be

no

substi-

tute

for

complete

testing

of

the

trip

system

per

Mode

"2".

See Fig.

5.

Since

the

programmer

is

only

a

part

of

the

com-

plete

trip

system,

the

PROGRAMMER

ONLY

tests

should

be

recognized

as

only

a

partial

system test.

Test

Scope

1.

Verify the

time-current

characteristics

and

pickup

cali-

bration

of

the

various

trip

elements.

Designations

for

the

trip

elements

are

abbreviated

as

fol-

lows:

LT

-LONG

TIME

INST.-INSTANTANEOUS

ST

-SHORT

TIME

GF-GROUND

FAULT

2.

Verify

performance

of

the ZONE SELECTIVE INTER-

LOCKING

functions

on

programmers

so

equipped.

3.

Verify the

integrity

of

key

electronic

components

in

the

solid-state

programmer.

4.

Verify

operation

of

the

Fault

Trip

annunciators

on

pro-

grammers

so

equipped.

Testing the

Complete

Trip

System-

Mode

"2"

For these tests,

the

programmer

is

connected

to

the

breaker

through

the test set.

Test

Scope

1.

All

programmer

tests

previously

described,

plus

the

provision

to

optionally

switch

the

programmer's

output

to

activate the

Flux

Shift

Magnetic

Trip

Device

to

verify its

op-

eration

by

physically

tripping

the

breaker.

2.

Check

continuity

of

the Phase

Sensors

.

Applicable Time-current

Curves

GES

6198-Four-function

(T4VT; TP4VT)

MicroVersaTrip'" :

LT;

ST; INST.

GES

6199-Full-function

MicroVersaTrip'" :

LT;

ST;

INST,

GES

6195-Ground

Fault

Specifications

Input:

105-125 Vac, 50/60 Hz

Power

Consumption:

60

Watts

Weight:

30

Pounds

Overall

Dimensions

(Inches): 22% L x 12% W x 9'/8 H

3

Operating Controls (See Fig. 2)

ON-OFF

Switch

This

switch

applies

115-Vac

input

power

to

the

test

set

when

the

switch

is ON.

Protection

is

provided

by

a

one-

ampere

fuse

located

above

the

ON-OFF

switch.

TRIP

BREAKER-PROGRAMMER

ONLY

Switch

•

PROGRAMMER

ONLY

Position

The

programmer's

trip

signal

is

confined

to

the

test set

circuitry

and

cannot

trip

the

breaker

•

TRIP

BREAKER

Position

The

programmer's

trip

signal

is

directed

to

the

circuit

breaker's

magnetic

trip

device

to

physically

trip

the

breaker.

This

mode

establishes

the

integrity

of

the

magnetic

trip

de-

Vice

and

the

programmer's

ability

to

actuate

it.

PRESET

CURRENT

Button

This

button

enables

the

operator

to

pre-establish

(via

the

TEST

CURRENT

ADJUST

control)

the

desired

test

current

prior

to

initiating

a test.

START Button

Tills

button

Initiates

the

test

by

applying

current

to

the

programmer.

The

current

persists

until

the

unit

trips

or

the

RESET

button

IS

actuated

• _

•.

',"0

'.

RESET Button

This

button

resets

the test

set

logiC so

that

a

new

test

sequence

can be

initiated.

It

also

stops

a test In

progress.

TRIP Light

This

LED.

when

lit,

indicates

that

a

trip

signal

has

been

delivered

by the

programmer.

A

trip

indication

will

always

be

accompanied

by a

brief

audio

tone.

PROGRAMMER

TYPE Switch

This

switch

is

to

be

positioned

according

to

the

program-

mer

type

which

is

normally

determined

from

th()

program-

mer

Cat. No. If

there

is

any

question

as

to

whether

the

programmer

is

Type

A

or

B,

it

can

be

answered

by

running

the

CONVERTER

CHECK.

(See

page

18).

PROGRAMMER

CURRENT

SETTING

Switch

This

control

establishes

a

test

current

magnitude

consis-

tent

WI

til

and

specifically

for

each

CURRENT

SETTING

of

the

programmer.

The

position

of

this

control

must

match

the

setting

on

the

programmer

when

testing

the LT

and

ST

ele-

ments

TEST SELECTOR Switch

This

selector

is

to

be

positioned

according

to

the

type

of

test to be

run

Associated

with

the TEST

SELECTOR

is a

grouping

of

toggle

switches

and

a

rotary

switch

which

fur-

ther

break

down

the

major

tests

into

specific

test

options

.

"·:l

"_~'.!

-;,::~:-~

Fig.

2.

Front

panel

(

Operating Controls (See Fig. 2)

COMPONENT

TEST

SELECTOR

Switch

This

switch

becomes

active

when

the

TEST SELECTOR is

in

the

COMPONENT

TESTS

position.

The

switch

selects one

of

several

auxiliary

tests

that

are

necessary

for

complete

testtng

of

the

programmer.

SEQUENCE

Switch

This

switch

directs

the

test

signals

to

various

points

in

the

programmer

circuitry.

PUSH TO

TEST

Button

A

push

button

switch

which

initiates

each

of

the

compo-

nent

tests,

resulting

in

illumination

of

the

"OK"

LED

indica-

tor

when

a

satisfactory

test

result

is

achieved.

Failure

of

the

"OK"

indicator

to

light

signifies

an

unsatisfactory

test result.

ELAPSED

TIME

Meter

This

meter

is a

counter

which

records

the

programmer's

trip

time

in

seconds

and

tenths.

It

must

be

manually

reset

after

completion

of

each

test. The

accuracy

of

the

timer

is

one

digit:':

O.

t

second.

NOTE:

When

operating

the

test

set

from

a 50-Hz

supply,

readings

of

the

ELAPSED

TIME

meter

must

be

multiplied

by

1.2.

TEST

CURRENT

Meter

This

meter

provides

digital

readout

of

the

magnitude

of

the test

current

be'tng

applied

to

the

programmer.

TEST

CURRENT

ADJUST

This

device

is a

high-resolution

ten-turn

potentiom-

eter used

to

vary

the

TEST

CURRENT

applied

to

the

programmer.

Output

Jacks

J1

& J2

Jack

J1

connects

to

the

circuit

breaker

via

the

circuit

breaker

INTERFACE

MODULE

A

or

B

which

is

provided.

Jack J2

connects

to

the

programmer

via

the

eight-foot

jumper

cable

provided.

EXTERNAL

MONITOR-Test

Set

Accuracy

The test

current

values

displayed

on

the

TEST CURRENT

meter

are

accurate

to

within:':

three

percent

of

the

meter

reading. These

limits

are

contingent

upon

a clean sine-wave

input

voltage

to

the

test set. Wave

form

distortion

can

cause

additional

errOr.

Should

greater

accuracy

be

desired,

provision

is

made

for

connecting

external

instruments

via

the

EXTERNAL MONI-

TOR

jacks

on

the

front

panel.

The

EXTERNAL

MONITOR

jacks

may

be used to

check

calibration

of

the

instrument

and

to

measure

trip

times

of

less

than

ten

seconds

more

accurately.

See Table

9,

Page 20

entitled,

"HOW

TO

USE THE EXTERNAL

MONITOR."

How

to~

Remove the Solid- state Programmer for Testing

MicroVersaTrip® Programmers

Cat. No. T4VT

1.

Push

the

"PUSH

TO

TRIP"

button

on

the

front

of

the

circuit

breaker.

2.

Remove

the

cover

protecting

the

Micro-VersaTrip'

programmer.

3.

Carefully

remove

the

two-pin

flux

shifter

trip

coil

connector.

4.

Loosen

completely

the

two

captive

screws

that

secure

the

programmer

to

the

sensor

package

The

programmer

may

now

be

removed

MicroVersaTrip® Programmers

Cat. No. T9VT

1 Push

the

"PUSH

TO

TRIP'

button

on

the

front

of

the

circuit

breaker.

2.

Remove

the

cover

protecting

the

Micro-VersaTrip!

programmer.

3.

Depress

the

locking

lever

on

the

side

of

the

program-

mer

plug-in

base

and

remove

the

programmer,

4.

Follow

the

instructions

on

the

back

of

the

programmer

to

complete

removal.

MicroVersaTrip® Programmers Used

with Type AKJAKRlAKD Circuit

Breakers

Simply

remove

the

programmer

by

gently

removing

it

from

its

plug-In

base. In

some

breakers,

this

will

require

the

re-

moval

of

two

mounting

screws:

In

others,

it

will

be neces-

sary to

depress

the

locking

lever

on

the side

of

the

programmer

plug-in

base.

5

How to

Remove

the Solid- state Programmer for Testing

MicroVersaTrip® Programmers Used

with Small Frame POWER

BREAK®

Circuit

Breakers-

Frame Size

2000 Amperes or Less

(Programmer Types TP4VT20 and

TP9VT20)

Breaker

Without the Electrical

Operator

Accessory

1.

Push

the

"OFF"

button

on

the

front of

the

circuit

breaker.

2.

Remove

the

four

top

cover

screws

and

remove

the

cover

from

the

breaker.

The

programmer

is

now

readily

accessible.

3.

To

remove

the

programmer,

release

the

cover

interlock

and

remove

the

programmer

from

its

plug-in

base

with

a

gentle

rocking

motion.

Breakers

with the Electrical

Operator

Accessory

1.

Push

the

"OFF"

Button

on

the

front of

the

circuit

breaker

Connecting the Test Set

Safety

Precautions

6

WARNING:

BEFORE

CONNECTING

THE TEST

SET

TO

THE

BREAKER,

ENSURE

THAT

THE

CIR-

CUIT

BREAKER

IS

COMPLETEL

Y

DISCON-

NECTED

FROM

ITS

POWER

SOURCE.

ON

DRAWOUT

EQUIPMENT,

RACK

THE

BREAKER

TO

ITS

DISCONNECTED

POSIT/ON.

VERIFY

THAT THE

BREAKER

IS

OFF.

CAUTION:

NEVER

DISENGAGE

THE

PRO-

GRAMMER

ON

A

BREAKER

THAT IS

ENER-

GIZED

AND

CARRYING

LOAD

CURRENT.

THIS

WILL

OPEN-CIRCUIT

THE

CURRENT

SENSORS,

ALLOWING

DANGEROUS

AND

DAMAGING

VOLTAGES

TO

DEVELOP.

SEE

FIG.

3.

2.

Remove

the

four

top

cover

screws

and

remove

the

cover

from

the

circuit

breaker

3.

To

remove

the

programmer,

release

the

cover

interlock

and

remove

the

programmer

Irom

its

plug-in

base

with

a

gentle

rocking

motion.

MicroVersaTrip® Programmers Used

with Large Frame POWER BREAK®

Circuit

Breakers-

Frame Size 3000

Amperes or More. (Programmer

Types TP4VT25; TP4VT30; TP9VT25;

TP9VT30; TP9VT40)

With or Without the Electrical

Operator

Accessory

1.

Push

"OFF"

button.

2.

Remove

four

screws

holding

the

escutcheon

cover

over

the

programmer.

Remove

the

escutcheon

cover.

3.

Remove

the

four

remaining

screws

and

remove

the

cover

from

the

circuit

breaker

4.

To

remove

the

programmer,

release

the

cover

interlock

and

remove

the

programmer

from

its

plug-in

base

with

a

gentle

rocking

motion.

Connections

"PROGRAMMER

ONLY"

Test-Mode

"1"

(See

Fig, 4)

Remove

the

programmer

from

the

circuit

breaker.

2

Connect

the

test set

to

the

programmer

as

follows:

a.

For

the

four-function

Cat. NO.T4VT

programmer

housed

in a

plastic

shell,

plug

the

programmer

directly

into

the

space

provided

on

the

front

panel

of

the

test set.

b

For

all

other

programmers,

connect

one

end

of

the

eight-fool

female

(sockets)

connector

cable

to

the

programmer

and

the

other

end

10

connector

J2

of

the

test set.

3 It is

not

necessary

to

make

any

connection

to

the

cir-

cuit

breaker

for

"PROGRAMMER

ONLY"

testing.

The

Fig. 5

connection

must

be used

if

"COMPLETE

SYSTEM"

tests are

to be run.

~:.'

,

,0

Connecting the Test Set

c;::::;::J

y:y

~

I."

~I_J:

[[ 1

~~)J

Micro-VersaTrip"' T4VT

Programmer

and

Sensor

Package

FRONT VIEW

?===--

Breaker

Harness

to

Current

Sensors

and

Magnelic

Trip

Device

All

Other

Micro-VersaTrip'

Programmers

SIDE VIEW

Fig.

3.

Normal

in-service

breaker

connection

All

Other

Micro-VersaTrip'

Programmers

Micro-VersaTrip"

Test Set

b b 6 a

Micro-VersaTrip"

T4VT

Programmers

~

Plug

In

Here

Fig. 4.

Connection

for

"PROGRAMMER

ONLY"

test

"COMPLETE

SYSTEM"

Test-Mode

"2"

(See

'Fig.

5)

1,

Connect

the

test set

to

the

programmer

as

described

in

Step

2

of

Mode

"1"

("PROGRAMMER

ONLY"

Test)

discussed

previously,

2,

Connect

the

test

set

to

the

circuit

breaker

as

follows:

a

For

circuit

breakers

utilizing

the

four-function

Cat.

No,

T4VT

programmer,

plug

Micro-VersaTrip':

TEST

SET

INTERFACE

MODULE

B

into

the

sensor

pack-

age,

Make

sure

to

plug

the

two-pin

flux-shifter

trip

coil

connector

into

the

interface

module,

Tighten

the

two

captive

retaining

screws

and

plug

the

interface

module

cable

connector

into

test

set

connector

J1,

Circuit

Breaker

All

Other

Micro-VersaTrip'

Programmers

Micro-VersaTrip'

Trip

Test Set

b b 6 a

Mlcro-VersaTrip"

T4VT

Programmer

t

Plug

In

Here

Fig,

5,

Connection

for

"COMPLETE

SYSTEM"

Test

b,

For

all

other

circuit

breakers,

plug

Micro-VersaTrip'"

TEST

SET

INTERFACE

MODULE

A

into

the

circuit

breaker

base

plate,

Connect

the

cable

from

the-

in-

terface

module

to

test

set

connector

J1,

NOTE:

If

the

circuit

breaker

has

a

cover

interlock

mechanism

such

as

in

Power-Break"

circuit

breakers,

it

will

be

necessary

to

install

the

circuit

breaker

cover

to

close

the

breaker,

This

means

that

the

connector

cable

from

the

interface

mod-

ule

must

be

routed

through

the

programmer

win-

dow

in

the

cover

before

the

cover

is

applied,

7

Preliminary Test Procedure

The

following

procedure

should

be

followed

before

start-

ing

functional

tests.

1.

Position

the test set

controls

as

follows:

a.

TRIP

BREAKER-PROGRAMMER

ONLY

Swilch

as

desired.

b.

PROGRAMMER

TYPE

Switch-Position

per

pro-

grammer

type

(A

or

B).

c.

PROGRAMMER

CURRENT

SETTING-Must

match

the

programmer

current

satting.

Functional Tests

d. TEST

SELECTOR-Long

Time/Short

Time.

e.

TEST CURRENT ADJUST

-Completely

counter-

clockwise.

2.

Record

the

"IN

SERVICE"

settings

of

the

programmer

so

that

these set

poinls

can

be

restored

upon

completion

of

testing.

See page

22.

3.

Connect

the test set

power

cord

to the 105-125-Vac

power

source.

4.

Turn

power

switch

"ON".

NOTE:

In

using

the

test

set,

it

is

never

necessary

to

calculate

test

current

values.

If

the test

set

and

programmer

controls

are

set

as

described

for

each

of

the

functional

tests

on

the

following

pages,

the

TEST

CURRENT

value

will

correspond

to

programmer

face

plate

values. (e.g.

the

meter

will

read

1.50

for

a

SHORT

TIME

PICKUP

of

1.5C

or

for

an

INSTANTANEOUS

PICKUP

of

1.5X

etc.)

LONG

TIME

PICKUP

Test

Purpose

Verify

that

pickup

occurs

within

tolerance.

Each

program-

mer

is

equipped

with

a

convenient

LED LONG TIME PICKUP

light

permitting

a

straight

forward

visual

means

of

determin-

ing

when

the LONG

TIME

PICKUP

point

is reached.

Test

Procedure

1.

Programmer

Settings:

LONG TIME PICKUP (if

present)-1.1C

2.

Position

Test

Set

Controls:

PROGRAMMER

CURRENT

SETTING-Must

match

the

programmer's

CURRENT

SETTING

TEST

SELECTOR-Long

Time

3.

TEST CURRENT

-Preset

a TEST CURRENT of 0.95

4.

Push START

Table

1-Long

Time

Pickup

Long

Time

Pickup

Settings

Test

Current Limits

O.BC·

0.70-0.91

o

9C'

0.79-1.02

1.0C·

0.B7-1.13

1.1C

0.96-1.25

~----.

'These

values

applicable

only

to

programmers

with

the

adjustable

LONG

TIME PICKUP

option

5.

Slowly

increase the TEST CURRENT,

carefully

observ-

ing

the

LONG TIME PICKUP

light

on

the

programmer.

The

light

will

indicate

when

the

pickup

point

is reached.

6.

Read

the

TEST CURRENT value at

which

pickup

oc-

curs

and

compare

with

the

acceptable

limits

of

Table 1

(1.1

C

setting).

7.

If'the

programmer

is

equipped

with

an

adjustable

LONG TIME PICKUP, repeat

the

above test at 0.8C,

O.9C

and

1.0C.

IF TEST

RE5UL

T5

DO NOT

CONFORM,

SEE PAGE

21

8

,.

~;_\

LONG

TIME

DELAY Test

Purpose

Verify

that

the

LT

characteristic

conforms

to

its

upper

and

lower

band

limits.

It is

recommended

that

measurements

be

taken at

three

different

values

of

TEST CURRENT

Test

Procedure

1.

Programmer

Settings:

SHORT

TIME

PICKUP

{If

present)-9C.

2.

Position

Test

Set

Controls:

PROGRAMMER

CURRENT

SETTING-Must

match

the

programmer's

CURRENT

SETTING.

TEST

SELECTOR-Long

Time.

TEST

CURRENT-From

Table

2

(using

proper

Table

2A

or

28),

select

three

test

current

values. Preset the first

value.

NOTE:

These

values

must

be

below

the

program-

mer's

SHORT

TIME

PICKUP

setting,

otherwise,

a

premature

trip

signal

will

be

received

from

that

function.

3.

Reset

timer

and

push

RESET

button.

4. Push START.

Allow

test

to

run

until

trip

occurs.

The

trip

time

should

conform

to

Table

2

limits.

For

50-Hz

opera-

tion,

multiply

timer

readings

by 1.2.

5.

Repeat

the

above

test

at

two

other

TEST CURRENT

values.

6.

If

the

programmer

is

equipped

with

adjustable

LONG

TIME

DELAY

bands,

repeat

the

above

test series on

the

other

delay

bands

(Table

28).

Table

2A-T4VT

and TP4VT (Four-

function) Programmers with Fixed

(Non-adjustable) Delay Band

Trip-Time

Test

Limits

(In

Seconds)

Current

Min

Max

1.50 209.7 353.7

2.00 117.6 198.2

3.00 51.8 87.3

4.00 29.0 48.8

5.00 18.3 30.8

6.00 12.7 21.4

7.00 9.3 15.7

8.00

7.1

12.0

Table

2B-Programmers

with Adjust-

able Long Time Delay Bands

Programmer

Trip-Time

"long

Time

limits

(In SecondsO)

Delay"

Test

Setting

Current

Min

Max

1.50 37.3 62.7

2.00 20.9 35.3

3.00 9.2 15.6

1 4.00

5.1

8.8

5.00 3.3 5.5

6.00 2.3 3.9

7.00 1.7 2.8

8.00 1.3 2.2

1.50 74.9 126.0

2.00 41.9 70.7

3.00 18.6 31.2

2 4.00 10,4 17.5

5.00 6.6

11.1

6.00 4.6 7.7

7.00 3,4 5.6

8.00 2.6 4.3

1.50 150,4 253.4

2.00 84.3 141.9

3.00 37.2 62.6

3 4.00 20.8

35.1

5.00 13.2 22.2

6.00

9.1

15.4

7.00 6.7 11.3

8.00

5.1

8.7

1.50 314.9 530.4

2.00 176.5 297.2

300

77.7

131.0

4 4.00 43.5 73.3

5.00 27.4 46.2

6.00

19.1

32.1

7.00 14.0

236

8.00 10.7

18.1

"Reflecting

the

-:-

3%

test set

accuracy.

allIes!

lim'lls are

extended

beyond

the

published

band

limits

of

the

lime-current

curves.

DUring

testing.

the

test

cur-

rent

should

be

monitored

and

readjusted

If

necessary

~~~_I~

TEST

RESULTS

DO

NOT

CONFORM,

SEE

PAGE

21

9

SHORT

TIME

DELAY Tests

Purpose

To test the ST

delay

functions.

There

are

two

possible

ST

delay

tests Test

No.1,

for

full-function

programmers,

checks

the

three

fixed-time

delay

bands

(MIN, INT, MAX).

Test

No.2

checks

the

Short

Time

I't

functions

when

present

(standard

for

four

function

T4VT and TP4VT

programmers;

optional

for

all

other

programmers).

It

should

be

noted

that

the

accu

racy

of

the

test sets

in

SECONDS

is "'

the

last

digit

(:':

0.1

second).

If a

more

accurate

reading

is

desired,

the

EXTERNAL

MONITOR

jacks

may

be

used

to

determine

the

exact

programmer

trip

time.

See

page

20

Before

beginning

this

test, it is

necessary

to

determine

whether

the

programmer

being

tested

is

equipped

with

ZONE

SELECTIVE

INTERLOCKING.

This

can

be

determined

by

noting

whether

there

is a Z

suffix

in

the

programmer

cat-

alog

number.

Another

method

is

to

connect

the

programmer

to

the

test set

and

turn

the

TEST

SELECTOR

to

the

LONG

TIME/SHORT

TIME-ZONE

INTERLOCKED

position.

If

the

"ZONE

INTERLOCKED"

light

is lit.

the

function

is

present.

Test

Procedure

TEST

NO,

1-TESTING

THE

SHORT

TIME

DELAY-

FIXED

TIME

DELAY

BANDS

(NOT

APPLICABLE

TO FOUR-

FUNCTION

T4VT

AND

TP4VT

PROGRAMMERS).

1.

Programmer

Settings:

CURRENT

SETTING-l.0

SHORT

TIME

PICKUP-l.SC

SHORT

TIME

I't

Switch

(if

present)-"OUT"

2.

Position

Test

Set

Controls:

PROGRAMMER

CURRENT

SETTING-l.0

TEST

SELECTOR-LONG

TIME/SHORT

TIME-Stan-

dard

3.

TEST

CURRENT

-Preset

a value

of

3.00

4.

Reset

timer

and

push

RESET

button.

5.

Push

START

-A

TRIP

light

must

be

obtained.

Observe

trip

time.

NOTE:

It

is

important

to

observe

that

the

time

delay

will

be

dependent

on

whether

or

not

the

programmer

being

tested

is

equipped

with

ZONE

SELECTIVE

INTERLOCKING.

It is,

therefore,

im-

portant

to

select

the

proper

Table (3A

or

38).

Test all

three

delay

bands

(MIN, INT, MAX)

For

50-Hz

op-

eration,

multiply

the

timer

reading

by 1.2.

6.

If the

programmer

is

equipped

with

the

ZONE INTER-

LOCKED

Option,

continue

by

testing

as

follows:

10

a.

Position

the

TEST

SELECTOR

in the SHORT

TIME-

ZONE

INTERLOCKED

pOSition.

The

test

set SHORT

TIME-ZONE

INTERLOCKED

light

must

come

on.

b.

Repeat

Steps

3

through

5.

TEST

NO.

2-

TESTING

THE

SHORT

TIME

1'1

FUNCTION

(IF

PRESENT)

(STANDARD

FOR

FOUR-FUNCTION

T4VT

AND

TP4VT

PROGRAMMERS).

1.

Programmer

Settings:

CURRENT

SETTING-1.0

SHORT

TIME

PICKUP-l.SC

SHORT

TIME

I't

Switch

(if

present)-"IN"

2.

Position

Test Set

Controls:

Same

as Test

No.1

3.

TEST

CURRENT-Preset

one

of

the

TEST

CURRENT

values

shown

in

Table

3C.

4. Reset

the

timer

and

push

the

RESET

button.

5.

Push

START.

Observe

trip

time.

a.

Repeat

using

the

other

TEST

CURRENT

values in

Table

3C

6.

The

following

note

is

applicable

only

to

full-function

MicroVersaTrip®

programmers.

NOTE:

To

avoid

confusion,

the

TEST

CURRENT

is

limited

to

the

values

in Tabfe 3C.

If

it

is

desired

to

test

at

higher

levels,

it

shoufd

be

noted

that

the

I't

curve

is

valid

only

to

the

point

where

the

I't

curve

intersects

the

ST

fixed

delay

bands.

At

this

point,

the

fixed

curves

take

precedence.

Note

also

that

if

the

programmer

is a

ZONE

SE-

LECTiVE

INTERLOCK

model,

the

ST

delay

will

al-

ways

be

"MIN"

(regardless

of

the

programmer

ST

delay

setting)

until

a

zone

interlock

signal

is

received

at

which

time,

the

delay

band

becomes

the

programmer

ST

delay

setting.

This

will

shift

the

intersect

point

of

the

I't

and

fixed

delay

curves.

GE MicroVersaTrip TVTS1 User manual

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